JP2022109773A - Measuring device and method for interpolating the same - Google Patents

Abstract

To provide a measuring device that, even when performing measurement while switching a hardware configuration, can accurately interpolate a correction value immediately before and immediately after the switching of the hardware configuration.SOLUTION: A measuring device comprises: a plurality of voltage control oscillators 12a, 12b, 12c that generate signals at a frequency in a predetermined frequency band; a sweep control unit 18 that sweeps a local signal L output from a local signal generation unit 12 in a predetermined frequency band, while switching between the plurality of voltage control oscillators 12a, 12b, 12c; and a signal analysis unit 19 that takes a frequency at which the plurality of voltage control oscillators 12a, 12b, 12c are switched as a special point, and takes an inclination obtained by averaging the inclination of a correction value of a point lower by one point and a point lower by two points than the special point and the inclination of a correction value of the special point and a point higher by one point than the special point as the inclination of a correction value between the point lower by one point than the special point and the special point.SELECTED DRAWING: Figure 1

Description

The present invention relates to a measuring device with multiple oscillators for generating local signals.

A spectrum analyzer is conventionally known as a measuring device having an oscillator that generates a local signal. A spectrum analyzer is a device that displays a spectrum waveform that indicates what level of signal exists at which frequency in a desired observation frequency band.

Such a spectrum analyzer sweeps a local signal generated by an oscillator over a desired frequency band, analyzes a signal frequency-converted by the local signal, and creates a spectrum waveform.

By the way, in such a spectrum analyzer, the maximum observation frequency band required may be wider than the frequency band that can be generated by one oscillator. In such a case, divide the required maximum observation frequency band into multiple parts, prepare oscillators corresponding to each divided frequency band, and sweep the frequency while switching the oscillators to support a wide range of frequencies. was

Patent Document 1 describes that three voltage-controlled oscillators and a switch for selecting one of them are provided, and the frequency is swept while switching between the three voltage-controlled oscillators.

Japanese Patent No. 5186474

In the adjustment stage of such a measuring device, a signal of a predetermined level for adjustment is input, the error from the signal level actually measured is measured, and a correction value is obtained.

When the hardware configuration such as the oscillator is switched, the characteristics of such a correction value change due to the hardware, so there is a difference in the correction value immediately before and after the oscillator is switched, and it is necessary to interpolate the correction value in between. be.

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a measuring apparatus capable of accurately interpolating correction values between immediately before and after switching the hardware configuration even when the hardware configuration is switched for measurement.

A measuring apparatus according to the present invention is a measuring apparatus for measuring the level of an input signal for each frequency, and has a correction value for the measured level, and the correction value is a correction obtained for each point in a predetermined frequency interval. The frequency at which the hardware configuration of the measuring device is switched is defined as a special point, and the slope of the correction value between the point one lower than the special point and the point two lower than the special point, and the special point and the frequency 1 below the special point. The gradient obtained by averaging the slope of the correction value with the highest point is taken as the slope of the correction value between the special point and the point one lower than the special point.

With this configuration, the frequency at which the hardware configuration is switched is set as a special point, the slope of the correction value between the point one level lower than the special point and the point two levels lower than the special point, and the correction value between the special point and the point one level higher than the special point. and the slope obtained by averaging the slope of and is the slope of the correction value between the special point and the point one lower than the special point. Therefore, even when the hardware configuration is switched for measurement, it is possible to accurately interpolate the correction values between immediately before and after the hardware configuration is switched.

Further, in the measuring apparatus of the present invention, a plurality of oscillators that generate signals of frequencies in a predetermined frequency band are provided, and the level at each frequency is measured by switching the plurality of oscillators, and the frequency at which the oscillator is switched is determined as the above-mentioned frequency. This is a special point.

With this configuration, the frequency at which the oscillator switches is set as a special point, and the slope of the correction value between the point one level lower than the special point and the point two levels lower than the special point, and the slope of the correction value between the special point and the point one level higher than the special point. , is the slope of the correction value between the point one lower than the special point and the special point. Therefore, even when the oscillator is switched for measurement, it is possible to accurately interpolate the correction values between immediately before and after the oscillator is switched.

Further, an interpolation method of the present invention is an interpolation method for a measuring device that acquires a value at each point at a predetermined interval and performs measurement by switching a hardware configuration, wherein the point at which the hardware configuration is switched as a special point, calculating the slope of the value between a point one lower than the special point and the point two lower than the special point, and calculating the slope of the value between the special point and the point one higher than the special point and interpolating a value from a point one lower than the special point to the special point with a slope of an average value of the two slopes.

With this configuration, the point at which the hardware configuration is switched is a special point, and the slope of the value between the point one level lower than the special point and the point two levels lower than the special point and the value slope between the special point and the point one level higher than the special point. , is the slope of the value between the point one lower than the special point and the special point. Therefore, even when the hardware configuration is switched and measurements are performed, it is possible to accurately interpolate the values between immediately before and after the hardware configuration is switched.

INDUSTRIAL APPLICABILITY The present invention can provide a measurement apparatus capable of accurately interpolating correction values between immediately before and after switching the hardware configuration even when performing measurement by switching the hardware configuration.

FIG. 1 is a block diagram of a measuring device according to one embodiment of the present invention. FIG. 2 is a diagram for explaining a correction value interpolation method of the measuring device according to one embodiment of the present invention. FIG. 3 is a flowchart for explaining the procedure of correction value interpolation processing of the measuring device according to one embodiment of the present invention.

A measuring device according to an embodiment of the present invention will be described in detail below with reference to the drawings.

In FIG. 1, a measuring apparatus 1 according to an embodiment of the present invention includes an attenuator 11, a local signal generator 12, a mixer 13, a filter 14, an A/D converter 15, a display 16, an operation It includes a section 17 , a sweep control section 18 and a signal analysis section 19 .

Attenuator 11 attenuates the level of input signal S _IN to a predetermined value and outputs it to mixer 13 . The attenuator 11 is composed of a variable attenuator capable of changing the amount of attenuation. The attenuator 11 changes the amount of attenuation under the control of the sweep control section 18 .

The local signal generator 12 includes three voltage controlled oscillators 12 a , 12 b , 12 c and switches 12 d , 12 e for selecting one of them, and outputs a local signal L to the mixer 13 . Note that the number of voltage-controlled oscillators does not have to be three, and it is sufficient if a plurality of voltage-controlled oscillators are provided.

The voltage controlled oscillators 12 a , 12 b , 12 c output signals La, Lb, Lc of frequencies corresponding to the control voltages input from the sweep control section 18 . The voltage controlled oscillators 12a, 12b and 12c output signals in different frequency bands. The voltage-controlled oscillators 12a, 12b, and 12c may output signals having partially overlapping frequency bands.

The mixer 13 mixes the output signal of the attenuator 11 and the local signal L, and outputs the mixed signal to the filter 14 .

The filter 14 passes a signal component M of a preset frequency of the signal input from the mixer 13 and outputs it to the A/D converter 15 .

The A/D converter 15 samples the analog signal component M passed by the filter 14 at a predetermined sampling period and outputs a digital signal string Dm to the signal analysis unit 19 .

The display unit 16 is composed of, for example, a liquid crystal display, and displays the waveform of the spectrum characteristics obtained by the signal analysis unit 19 .

The operation unit 17 is composed of input devices such as a keyboard, a mouse, and a touch panel, and outputs information and the like input by operation to the sweep control unit 18 and the signal analysis unit 19 .

The sweep control unit 18 selects one of the voltage-controlled oscillators 12a, 12b, and 12c using the switches 12d and 12e of the local signal generation unit 12 while controlling the control voltage to be output to the local signal generation unit 12. The frequency of the local signal L to be output to 13 is swept in predetermined steps, and frequency information f indicating each frequency is output to the signal analysis unit 19 .

The signal analysis unit 19 associates the digital signal sequence Dm obtained by the sweep with the frequency information f input from the sweep control unit 18, stores them in a memory (not shown), and performs correction processing and specified band limitation processing. etc. to obtain the spectrum characteristics of the observation band.

In such a measuring apparatus 1, a signal of a predetermined level is input, and an adjustment is performed to obtain a signal level correction value based on an error from the actually measured signal level.

Acquisition of the correction value is performed, for example, in units of 10 MHz (points at intervals of 10 MHz). The signal analysis unit 19 stores frequencies at which the voltage controlled oscillators 12a, 12b, and 12c are switched as special points.

For example, when the voltage controlled oscillators 12a, 12b, and 12c switch from 5.0 GHz, the signal analysis unit 19 stores that 5.0 GHz as a special point.

The signal analysis unit 19 interpolates the correction value between the point immediately before the special point and the special point.

The signal analysis unit 19 averages the slope of the correction values between the point one level lower than the special point and the point two levels lower than the special point and the slope of the correction value between the special point and the point one level higher than the special point, The slope of the correction value between the special point and the point one lower than the special point.

For example, as shown in FIG. 2, when 5.0 GHz is a special point, the correction value of 4.99 GHz, which is one point lower than the special point 5.0 GHz, and the point two points lower than the special point 5.0 GHz Let A be the slope of the 4.98 GHz correction value, and B be the slope of the 5.0 GHz correction value of the special point and the 5.01 GHz correction value of the point one higher than the special point 5.0 GHz, Let its average, (A+B)/2, be the slope C of the correction value between 4.99 GHz, which is one lower point than the special point of 5.0 GHz, and 5.0 GHz, the special point.

Correction value interpolation processing by the measuring apparatus according to the present embodiment configured as described above will be described with reference to FIG. Note that the correction value interpolation processing described below is executed for each special point after the acquisition of the correction value is completed.

In step S<b>1 , the signal analysis unit 19 calculates the slope A of the correction values of the point one level lower than the special point and the point two levels lower than the special point. After executing the process of step S1, the signal analysis unit 19 executes the process of step S2.

In step S2, the signal analysis unit 19 calculates the slope B of the correction value between the special point and the point one higher than the special point. After executing the process of step S2, the signal analysis unit 19 executes the process of step S3.

In step S3, the signal analysis unit 19 calculates an average C of A and B. After executing the process of step S3, the signal analysis unit 19 executes the process of step S4.

In step S<b>4 , the signal analysis unit 19 interpolates correction values from the correction value of the point one level lower than the special point to the special point with the slope C. FIG. After executing the process of step S4, the signal analysis unit 19 ends the correction value interpolation process.

Thus, in the above-described embodiment, the frequencies at which the voltage-controlled oscillators 12a, 12b, and 12c are switched are set as special points, and the slope of the correction value between the points one level lower than the special point and the point two points lower than the special point. The slope obtained by averaging the slope of the correction value between the point one level higher than the point and the slope of the correction value between the special point and the point one level lower than the special point is used as the slope of the correction value.

As a result, even when the hardware configuration is switched for measurement, it is possible to accurately interpolate the correction values between immediately before and after the hardware configuration is switched.

In the present embodiment, the switching of the voltage-controlled oscillators 12a, 12b, and 12c is shown, but the present invention is not limited to this, and can be applied to the switching of the attenuation of the attenuator 11, for example. .

Although embodiments of the invention have been disclosed, it will be apparent that modifications may be made by those skilled in the art without departing from the scope of the invention. All such modifications and equivalents are intended to be included in the following claims.

Reference Signs List 1 measuring device 11 attenuator 12 local signal generator 12a, 12b, 12c voltage controlled oscillator (oscillator)
12d, 12e switch 13 mixer 14 filter 15 A/D converter 18 sweep controller 19 signal analyzer

Claims (3)

A measuring device (1) for measuring the level of each frequency of an input signal,
having a correction value for the measured level,
The correction value is created by a correction value obtained for each point of a predetermined frequency interval,
The frequency at which the hardware configuration of the measuring device is switched is defined as a special point, and the slope of the correction value between the point one lower than the special point and the point two lower than the special point, and the slope of the correction value between the special point and the point one higher than the special point. A measuring device that averages the slope of the correction value and the slope of the correction value between the special point and the point one lower than the special point. comprising a plurality of oscillators (12a, 12b, 12c) that generate signals of frequencies in a predetermined frequency band, measuring the level of each frequency by switching the plurality of oscillators;
2. The measuring device according to claim 1, wherein the frequency at which the oscillator switches is the special point. An interpolation method for a measuring device (1) that acquires a value at each point at a predetermined interval and performs measurement by switching the hardware configuration,
setting the point at which the hardware configuration is switched as a special point;
calculating a slope of a value between a point one lower than the special point and a point two lower than the special point;
a step of calculating a slope of a value between the special point and a point one higher than the special point;
and interpolating a value from a point one lower than the special point to the special point with a slope of an average value of two of the slopes.

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