JP2015215704A - Analyzer, analyzing program and analyzing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an analyzer capable of estimating termination time of an analysis before starting the analysis.SOLUTION: An analyzer 100 acquires a computation time required for calculating the physical quantity. The computation time required for calculating the physical quantity is, for example, the time which is calculated based on previous result of analysis which was made under the identical conditions, i.e., ctime as computation time of a physical quantity measured by cell C unit. The analyzer 100 estimates the time to acquire a result based on ccnt as a calculation frequency of physical quantity and ctime as the acquired computation time. The time required for acquiring the result is atime as total computation time.

Description

  The present invention relates to an analysis apparatus, an analysis program, and an analysis method.

  Conventionally, a simulation technique of electromagnetic field analysis for analyzing transient characteristics of an electric field and a magnetic field in an analysis region is known (for example, refer to Patent Documents 1 to 3 below).

  For example, an FDTD (Finite Difference Time Domain) method is used in the electromagnetic field analysis. In the simulation of the electromagnetic field analysis by the FDTD method, the state of the electromagnetic field in the space inside the physical structure or outside the structure is reproduced on the computer. In the electromagnetic field analysis simulation using the FDTD method, a plurality of cells obtained by dividing the analysis region are set. Each cell is given an electrical constant such as a dielectric constant, a magnetic permeability, or a conductivity according to the medium contained in the cell.

JP 2010-204859 A JP 2005-292950 A JP 2003-6181 A

  However, for example, in the case of an analysis that calculates a physical quantity for each cell as in an electromagnetic field analysis, the time required for the analysis differs depending on the number of cells, so the analyst cannot know the end time of the analysis before starting the analysis. There is a point.

  In one aspect, an object of the present invention is to provide an analysis apparatus, an analysis program, and an analysis method capable of estimating an analysis end time before starting an analysis.

  According to one aspect of the present invention, a physical quantity is calculated for each of a plurality of partial areas obtained by dividing an analysis area, and an analysis apparatus, an analysis method, and an analysis program for obtaining an analysis result of the analysis area based on the physical quantity, Proposed analysis device, analysis program, and analysis method for acquiring calculation time required for calculation of physical quantity and estimating time until acquisition of analysis result based on calculation number of physical quantity and acquired calculation time Is done.

  According to one embodiment of the present invention, the analysis end time can be estimated before the analysis is started.

FIG. 1 is an explanatory diagram showing an example of the operation of the analysis apparatus according to the present invention. FIG. 2 is a block diagram illustrating a hardware configuration example of the analysis apparatus. FIG. 3 is a block diagram illustrating a functional configuration example of the analysis apparatus. FIG. 4 is an explanatory diagram illustrating a calculation example of the calculation time per cell. FIG. 5 is an explanatory diagram showing an example of a printed circuit board. FIG. 6 is an explanatory diagram showing an example of CAD data. FIG. 7 is an explanatory diagram illustrating an example in which the inclination of the wiring is 45 degrees. FIG. 8 is an explanatory diagram showing a point contact example. FIG. 9 is an explanatory diagram showing a plurality of cell examples in which the analysis region is divided by the initial lattice point interval. FIG. 10 is an explanatory diagram showing an example of cell data. FIG. 11 is an explanatory diagram showing an example of a correspondence table between grid point numbers and coordinates. FIG. 12 is an explanatory diagram illustrating an example in which lattice points are removed. FIG. 13 is an explanatory diagram showing an example of cell data after removing a grid point. FIG. 14 is a flowchart (part 1) illustrating an example of a control processing procedure performed by the analysis apparatus. FIG. 15 is a flowchart (part 2) illustrating an example of a control processing procedure performed by the analysis apparatus.

  Exemplary embodiments of an analysis apparatus, an analysis program, and an analysis method according to the present invention will be described below in detail with reference to the accompanying drawings.

  FIG. 1 is an explanatory diagram showing an example of the operation of the analysis apparatus according to the present invention. The analysis apparatus 100 is a computer that calculates a physical quantity for each of a plurality of partial areas obtained by dividing the analysis area area, and acquires the analysis result of the analysis area area based on the physical quantity. The analysis apparatus 100 is a computer that estimates the calculation time required for analysis calculation before performing analysis. For example, in a simulation based on the FDTD method, which is a kind of electromagnetic field analysis, an electric field and a magnetic field are calculated for each of the partial areas obtained by dividing the analysis area area into a grid, thereby analyzing the electromagnetic field distribution in the analysis area area. Is done. Specifically, the partial region is a region obtained by dividing the analysis region area by lattice points arranged in a lattice pattern on the simulation space. The simulation space is a space set to represent on the computer an analysis area area including the inside of the physical structure to be analyzed and the space outside the structure. For example, in the simulation space, a three-dimensional orthogonal coordinate system including, for example, an X axis, a Y axis, and a Z axis is defined. A partial region obtained by dividing the analysis region area is also referred to as a cell C. The cell C has a rectangular shape, for example, a square or a cube. In the cell C, for example, a medium medium and an electric constant corresponding to the medium can be set. Examples of the electrical constant include dielectric constant, magnetic permeability, and electrical conductivity.

  Conventionally, in the case of analysis in which a physical quantity is calculated for each cell C as in electromagnetic field analysis, since the time required for analysis differs depending on the number of cells C, there is a problem in that the end time of analysis is not known before the start of analysis. For example, even if the designer wants to finish the analysis within a desired time, since the time taken for the analysis is unknown, the modeling is performed without an index of the time taken for the analysis. The modeling is to give an electric constant such as a dielectric constant, a magnetic permeability, or an electric conductivity to the cell C according to a medium contained in the cell or a medium such as air.

  Therefore, in the present embodiment, in the case where the physical quantity is calculated and analyzed for each cell C obtained by dividing the analysis area area, the analysis is completed based on the calculation time ctime of the physical quantity in units of cell C and the number of physical quantity calculations ccnt. Estimate time. Thereby, the end time of the analysis can be estimated before the analysis is started.

  First, the analysis apparatus 100 acquires a calculation time required for calculating a physical quantity. The calculation time required for the calculation of the physical quantity is, for example, a predetermined calculation time, a time calculated based on past analysis results performed in the same environment, and the calculation time ctime of the physical quantity in units of cell C. A detailed calculation example will be described later. For example, in the development of a printed circuit board, an electromagnetic field analysis is performed with a change in the wiring position and the like, and therefore, a similar printed circuit board may be analyzed in a similar environment such as temperature. In such a case, it is possible to divert the calculation time ctime of the physical quantity in units of cell C when the electromagnetic field analysis was performed in the past.

  The analysis apparatus 100 estimates the time until the result is acquired based on the physical quantity calculation count ccnt and the acquired calculation time ctime. The time until the result is acquired is the entire calculation time attime. The total calculation time “time” is the time required for simulating the change of the electromagnetic field within the analysis time at every time step ts. The physical quantity calculation count ccnt is, for example, a count based on the number of cells C included in the analysis area area.

  Conventionally, if the structure to be analyzed is modeled without lowering the analysis accuracy, the number of cells C increases, so the time required for analysis increases. Further, since the number of cells C is reduced in order to shorten the time required for analysis, the analysis accuracy is lowered. For example, when the mesh size is about 1 billion mesh, the analysis may take several weeks or more when the analysis is executed by one PC. Therefore, in the present embodiment, the analysis device 100 divides the cell C into units based on the wiring width of the wiring, the cell C representing the wiring included in the structure is in line contact, and the size of the cell C is maximum. Thus, cell data indicating the cell C is generated. When the wiring is represented by the cell C, the shape of the wiring is not divided. The line contact between the cells C indicates that the sides of the cells C are in contact. Thereby, it is possible to shorten the time required for the analysis without degrading the analysis accuracy.

(Hardware configuration example of analysis apparatus 100)
FIG. 2 is a block diagram illustrating a hardware configuration example of the analysis apparatus. In FIG. 2, the analysis device 100 includes a CPU (Central Processing Unit) 201, a ROM (Read Only Memory) 202, a RAM (Random Access Memory) 203, a disk drive 204, and a disk 205. The analysis apparatus 100 includes an interface (I / F) 206, a keyboard 207, a mouse 208, and a display 209. Each unit is connected by a bus 200.

  Here, the CPU 201 governs overall control of the analysis apparatus 100. The ROM 202 stores a program such as a boot program. The RAM 203 is used as a work area for the CPU 201. The disk drive 204 controls reading / writing of data with respect to the disk 205 according to the control of the CPU 201. The disk 205 stores data written under the control of the disk drive 204. Examples of the disk 205 include a magnetic disk and an optical disk.

  The I / F 206 is connected to a network NET such as a LAN (Local Area Network), a WAN (Wide Area Network), and the Internet through a communication line, and is connected to other devices via the network NET. The I / F 206 controls a network NET and an internal interface, and controls data input / output from an external device. For example, a modem or a LAN adapter may be employed as the I / F 206.

  The keyboard 207 includes keys for inputting characters, numbers, various instructions, and the like, and inputs data. Moreover, a touch panel type input pad or a numeric keypad may be used. The mouse 208 performs cursor movement, range selection, window movement, size change, and the like. A trackball or a joystick may be used as long as they have the same function as a pointing device. A display 209 displays data such as a document, an image, and function information as well as a cursor, an icon, or a tool box. As this display 209, for example, a TFT (Thin Film Transistor) liquid crystal display, a plasma display, or the like can be adopted.

(Functional configuration example of the analysis apparatus 100)
FIG. 3 is a block diagram illustrating a functional configuration example of the analysis apparatus. The analysis apparatus 100 includes a control unit 301 and a storage unit 302. The storage unit 302 is realized by a storage device such as a ROM 202, a RAM 203, and a disk 205 accessible by the CPU 201 shown in FIG. The processing of the control unit 301 is coded in a program stored in the storage unit 302, for example. Then, the CPU 201 reads the program from the storage device and executes the process coded in the program. Thereby, the process of the control part 301 is implement | achieved. Moreover, the processing result of the control part 301 is memorize | stored in the memory | storage part 302, for example. The storage unit 302 stores, for example, past analysis record information 311, CAD data 312, cell data 313, and the like.

  First, the control unit 301 acquires the calculation time required for calculating the physical quantity of the cell C. For example, the control unit 301 may acquire the calculation time of the cell C from the storage unit 302, may be acquired from another device via the network NET, or may be calculated based on past analysis results. Also good. Here, an example will be described in which the control unit 301 calculates the calculation time per cell C based on past analysis results.

  FIG. 4 is an explanatory diagram illustrating a calculation example of the calculation time per cell. In the electromagnetic field analysis using the FDTD method, the change in the electromagnetic field at the specified analysis time at is analyzed for each cell C into which the analysis area area is divided. Further, in the electromagnetic field analysis, the analysis is performed at each time step ts. Therefore, the number of calculation ccnt can be expressed by the following formula (1).

  Number of calculations ccnt = number of cells C × (analysis time at / time step ts) (1)

  And the calculation time ctime of the physical quantity per cell C can be expressed by equation (2).

  Calculation time ctime of physical quantity per cell C = calculation time actual required for calculation / number of calculations ccnt (2)

  Therefore, the control unit 301 illustrated in FIG. 3 calculates the past calculation count ccnt by giving the number of cells C, the analysis time at, and the time step ts included in the past analysis result information 311 to the equation (1). . Then, the control unit 301 gives the physical amount per cell C by giving the calculation time attime actually required for calculation included in the past analysis result information 311 and the past calculation count ccnt to equation (2). Get the calculation time ctime. For example, the number of cells C is 100 [pieces], the analysis time at is 100 [msec], one time step ts is 10 [msec], and the calculation time “atime” actually required for calculation is one hour. The calculation time ctime for the physical quantity per cell C is as follows.

Calculation time of physical quantity per cell C ctime = 3600 [sec] / (100 [pieces] × (100 [msec] / 10 [msec]))
= 3.6 [sec]

  Next, the control unit 301 generates area information indicating a plurality of cells C. The plurality of cells C are a plurality of partial areas obtained by dividing the analysis area area in units based on the minimum width of a specific wiring included in the analysis area area. In addition, the plurality of cells C divide the analysis area area so that the sides of the cells C including the specific wiring among the plurality of cells C are in contact with each other, and the lengths of the sides of the plurality of cells C are maximized. A plurality of partial regions. Here, for example, the analysis area area includes a printed circuit board as a structure to be analyzed. The area information is also referred to as cell data 313, for example.

  FIG. 5 is an explanatory diagram showing an example of a printed circuit board. The printed circuit board has, for example, a plurality of constituents, and is a constituent having particularly the smallest wiring. Therefore, in the present embodiment, the control unit 301 is based on the wiring width of the wiring mp in order to reproduce the shape of each component included in the printed circuit board more accurately by modeling the analysis area area including the printed circuit board. To determine the interval between grid points for electromagnetic analysis.

  The generation process of the cell data 313 will be described in more detail. For example, the control unit 301 acquires CAD data 312 indicating a structure to be analyzed included in the analysis area area. The control unit 301 specifies the minimum wiring width among the wiring widths of the wirings included in the printed board indicated by the CAD data 312.

  FIG. 6 is an explanatory diagram showing an example of CAD data. For example, the CAD data 312 is data indicating each element such as a part included in a structure to be analyzed. For example, the CAD data 312 includes fields of element, layer number, start point (X), start point (Y), end point (X), end point (Y), line length, and line width. By setting information in each field, it is stored as a record (for example, records 600-1, 600-2, etc.).

  In the element field, identification information indicating the type of element is set. In the layer number field, identification information indicating a layer in which an element is formed among the layers included in the printed board is set. In the field of the starting point (X), the X coordinate value of the starting point where the element is arranged is set. In the field of the starting point (Y), the Y coordinate value of the starting point where the element is arranged is set. In the field of the end point (X), the X coordinate value of the end point where the element is arranged is set. In the end point (Y) field, the Y coordinate value of the end point at which the element is arranged is set. In the line length field, when the element is a wiring, the length of the wiring is set. In the line width field, when the element is a wiring, the width of the wiring is set.

  Taking record 600-1 as an example, the element is wiring, the layer number is 1, the start point (X) is 10, the start point (Y) is 10, and the end point (X) is 15. The end point (Y) is 15.

  The control unit 301 illustrated in FIG. 3 specifies the smallest value among the line widths set in the record 600 whose element is a wiring, for example. In the example of FIG. 5, the wiring width of the wiring mp surrounded by a broken-line circle is specified.

  Then, the control unit 301 sets a value of 1/3 of the specified wiring width as a unit for dividing the analysis area area. For example, the control unit 301 sets a value of 1/3 of the specified wiring width as an initial lattice point interval that is the length of the side of the cell C. Here, the reason why the value of 1/3 of the wiring width is set as the interval between the lattice points will be described with reference to FIGS.

  FIG. 7 is an explanatory diagram illustrating an example in which the inclination of the wiring is 45 degrees. FIG. 8 is an explanatory diagram showing a point contact example. In the simulation by the FDTD method, when analyzing the physical quantity of the cell C, the physical quantity or medium of the cell C adjacent to the cell C is used. Since the cell C adjacent to the target cell C is a cell C that is in line contact with the target cell C, the cell C is in contact with the side of the target cell C. A physical quantity, a medium, or the like of the cell C in contact with the side of the cell C is used. In the simulation by the FDTD method, it is not determined which element each cell C represents in the structure. When the cells C representing the shape of the same element are in point contact with each other like the portion surrounded by a circle in FIG. 8, the shape of the element is represented as broken. Therefore, in the simulation by the FDTD method, a physical quantity or the like for the cell C representing the same element is not referred to. Here, contact of the sides is also referred to as line contact.

  Thus, by generating grid points so that the cells C representing the same element are in line contact with each other, each element can be accurately represented by the cell C. When generating lattice points so that the shape of the element does not break, the generation conditions are most severe when the inclination of the wiring mp as shown in FIG. 7 is 45 degrees. Note that the wiring mp need not be divided when the inclination of the wiring mp is 0 degree or 90 degrees.

  As shown in FIG. 7, when the wiring width w is divided into three, “3 × √2 = 4.224” is obtained. When the wiring mp is divided in the X-axis direction, 4.2 lattice points are included in the wiring mp. There will be. As shown in FIG. 7, two grid points are secured in the X-axis direction even when the number is 0.6 at both ends. Thus, although depending on the modeling method, the shape of the wiring mp can be expressed so that the cells C are in line contact with each other in a staircase pattern.

  For example, when the wiring width w is divided into two, when the wiring mp is divided in the X-axis direction, there are 2.8 lattice points, and only one lattice point is included in the wiring mp in the X-axis direction. It may become. Therefore, as shown in FIG. 8, there is a possibility that the cells C representing the same structure are in contact with each other at one point, and the shape of the structure represented by the cell C is likely to be broken.

  For this reason, it is possible to prevent the shape of the wiring mp from breaking by setting the value of 1/3 of the wiring width to the initial lattice point interval. Also, if the initial grid point interval is set to a value smaller than 1/3 of the line width, the analysis accuracy increases, but it takes a calculation time time until the analysis result is obtained. By setting the value of 1/3 of the line width to the initial grid point interval, the sides of the cells C including the wiring mp among the plurality of cells C are in contact with each other, and the lengths of the sides of the plurality of cells C are included. It is possible to divide the analysis area area so that is maximized. Therefore, analysis of the analysis area area including the printed circuit board can be performed with higher accuracy.

  FIG. 9 is an explanatory diagram showing a plurality of cell examples in which the analysis region is divided by the initial lattice point interval. As shown in FIG. 9, the analysis area area is divided into a plurality of cells C at intervals of lattice points. Each cell C is attached with identification information that can identify the cell C, such as the cells C1 and C2. Further, in order to represent the position of each cell C, a number is assigned to each of the lattice point in the X-axis direction and the lattice point in the Y-axis direction as identification information that can identify the lattice point. Here, the lattice points in the Z-axis direction are omitted.

  FIG. 10 is an explanatory diagram showing an example of cell data. The cell data 313 is information indicating the position and medium for each of the plurality of cells C. For example, the cell data 313 includes a cell, an upper left (X) lattice point number, an upper left (Y) lattice point number, a lower right (X) lattice point number, a lower right (Y) lattice point number, and a medium field. By setting information in each field, the record 1000 (for example, records 1000-1 to 1000-4) is stored. Here, the lattice point numbers in the Z-axis direction are omitted.

  Identification information that can uniquely identify the cell C is set in the cell field. In the upper left (X) lattice point number field, among the lattice point numbers of the four vertices of the cell C, the lattice point number in the upper left X-axis direction is set. In the upper left (Y) lattice point number field, among the lattice point numbers of the four vertices of the cell C, the lattice point number in the upper left Y-axis direction is set. In the lower right (X) lattice point number field, among the lattice point numbers of the four vertices of the cell C, the lower right lattice point number in the X-axis direction is set. In the lower right (Y) lattice point number field, among the lattice point numbers of the four vertices of the cell C, the lower right lattice point number in the Y-axis direction is set. Here, the position of the cell C is represented by the upper left (X) lattice point number, the upper left (Y) lattice point number, the lower right (X) lattice point number, and the lower right (Y) lattice point number. . In the medium field, a medium when the analysis area area including the structure to be analyzed is modeled is set. For example, examples of the medium include air and metal.

  Taking record 1000-2 as an example, the upper left (X) lattice point number of cell C2 is 1, the upper left (Y) lattice point number of cell C2 is 0, and the lower right (X) lattice point of cell C2 The number is 2, the lower right (Y) lattice point number of the cell C2 is 1, and the medium is air.

  FIG. 11 is an explanatory diagram showing an example of a correspondence table between grid point numbers and coordinates. The correspondence table 1100-X shows the correspondence between the grid point number (X) and the coordinates in the X-axis direction. For example, when the grid point number (X) is 1, the X-axis coordinate is 0.1. The correspondence table 1100-Y shows the correspondence between the grid point number (Y) and the coordinates in the Y-axis direction. For example, when the grid point number (Y) is 1, the Y-axis coordinate is 0.1. The grid point number (Y) and the Y-axis coordinates are determined by the initial grid point interval d described above. When generating the cell data 313, the control unit 301 generates each correspondence table 1100 based on the determined grid point interval d.

  Next, an example of estimating the calculation time “time” will be described. The control unit 301 estimates a time “time” until the analysis result is acquired based on the physical quantity calculation count ccnt and the acquired calculation time. The control unit 301 calculates the time step ts based on the initial interval d between lattice points. In the electromagnetic analysis based on the FDTD method, one time step ts has a restriction that must not exceed the CFL condition. Therefore, here, the control unit 301 uses the value of the CFL condition as it is as the time step ts. CFL conditions are determined by the speed of light and the minimum lattice spacing. The CFL condition is, for example, when dealing with a wave such as an electromagnetic field in a discrete lattice system, the time step ts used when obtaining a numerical solution of the wave motion equation is until the actual wave is transmitted to an adjacent lattice point. It is a condition that it must be smaller than the time. Also, according to the CFL condition, if the time step ts exceeds the upper limit of the time, the calculated information transmission speed cannot follow the speed of the actual phenomenon, resulting in numerical divergence, which is physically meaningless. You will get a solution. When the interval d between the lattice points decreases, the upper limit value of the time step ts also decreases. For example, the control unit 301 calculates the time step ts by the following equation (3).

  Time step ts = v × √ (1 / (sx × sx) + 1 / (sy × sy) + 1 / (sz × sz)) (3)

  v is the speed of light and is a constant. sx is an interval d between the minimum lattice points in the X-axis direction. sy is the interval d between the minimum lattice points in the Y-axis direction. sz is the interval d between the minimum lattice points in the Z-axis direction.

  Next, the control unit 301 analyzes the number of cells C indicated by the generated cell data 313, the analysis time at, the calculated time step ts, and the calculation time ctime of the physical quantity per cell C. The calculation time “time” for the area “area” is calculated. The analysis time at is a specified value. Specifically, for example, the control unit 301 calculates a calculation time “time” for the analysis area area by the following equation (4). In the following formula (4), “the number of cells C × (analysis time at / time step ts)” is the number of calculations ccnt.

  Calculation time attime = (number of cells C × (analysis time at / time step ts)) × calculation time per cell ctime (4)

  The control unit 301 determines whether or not the calculated calculation time “time” is shorter than the specified calculation time specified by the designer. When it is determined that the calculated calculation time “time” is shorter than the specified calculation time, the control unit 301 performs modeling on the structure to be analyzed. When the calculated calculation time “atime” is equal to or longer than the specified calculation time, the control unit 301 indicates a plurality of cells C1 after extracting the lattice points so that the shape of each element included in the structure to be analyzed does not change. Cell data 313 is generated. To remove a lattice point is, for example, to merge a part of continuous cells C having the same medium into one cell C. For example, the control unit 301 may merge continuous cells C having the same medium into one cell, with the cell C on the extension of the X axis and the Y axis of the cell C representing the outer shape of the object as a boundary.

  FIG. 12 is an explanatory diagram illustrating an example in which lattice points are removed. For example, as shown in FIG. 12, the number of cells C is reduced by removing lattice points where the shape does not change. In the example of FIG. 12, the cells C2 to C4 become one cell C2.

  FIG. 13 is an explanatory diagram showing an example of cell data after removing a grid point. As shown in FIG. 13, in the example of the record 1000-2 for the cell C2, the upper left (X) lattice point number of the cell C2 is 1, and the upper left (Y) lattice point number of the cell C2 is 0. The grid point number in the lower right (X) of the cell C2 is 4, the grid point number in the lower right (Y) of the cell C2 is 1, and the medium is air.

  The control unit 301 calculates the number of cells C indicated by the cell data 313 generated to reduce the number of cells C, the analysis time at, the calculated time step ts, and the calculation time ctime of the physical quantity per cell C. Is given by the above equation (4). Thereby, the control part 301 calculates the calculation time time about the analysis area | region area. Then, again, the control unit 301 determines whether or not the calculated calculation time “atime” is shorter than the specified calculation time specified by the designer. When it is determined that the calculated calculation time “time” is shorter than the designated calculation time, the control unit 301 performs modeling.

  On the other hand, when the calculated calculation time time is equal to or longer than the specified calculation time, the control unit 301 changes the initial grid point interval d to be larger than the previous grid point interval d. For example, the control unit 301 may set a value of 1/3 of the wiring width w of the narrower wiring next to the wiring at the time of determining the previous grid point spacing d as the new grid point spacing d. Alternatively, for example, the control unit 301 may set a value obtained by adding a value of 1/3 of the minimum wiring width w to the current grid point interval d as a new grid point interval d. Further, for example, the control unit 301 adds the value of 1/3 of the wiring width w of the next narrow wiring and the value of 1/3 of the minimum wiring width w to the current spacing d of the grid points. The value may be compared with the smaller value, and the smaller value may be used as the new initial lattice point interval d. Further, for example, when the thinnest wiring width w is 0.09 [mm], the current interval d between lattice points is 0.03 [mm]. For example, the narrowest wiring width w is 0.1 [mm] next to the narrowest wiring width w. If 0.06 [mm], which is obtained by adding 1/3 of the narrowest wiring width w to the current grid point interval d, is the next grid point interval d, it is difficult to maintain the shape of the wiring. . Therefore, the control unit 301 sets 0.33 [mm], which is a value of 1/3 of the next thin wiring width w, as a new lattice point interval d.

  In addition, for example, the control unit 301 generates cell data 313 indicating a plurality of cells C obtained by dividing the analysis area area based on the interval d between the lattice points after the change. Then, again, the control unit 301 repeats the process of calculating the time step ts, the process of calculating the calculation time, and the process of whether it falls within the specified calculation time. As a result, it is possible to generate cell data 313 such that the estimated calculation time is shorter than the specified calculation time.

(Example of control processing procedure by analysis apparatus 100)
14 and 15 are flowcharts showing an example of a control processing procedure by the analysis apparatus. The analysis apparatus 100 acquires the designated calculation time (step S1401). Then, the analysis apparatus 100 acquires a calculation time time at the time of past analysis performed in the same environment (step S1402). Next, the analysis apparatus 100 acquires the number of cells C at the time of the past analysis performed in the same environment (step S1403). The analysis apparatus 100 acquires an analysis time at at the time of past analysis (step S1404). The analysis apparatus 100 acquires a time step ts at the time of past analysis (step S1405). The analysis apparatus 100 calculates the calculation time ctime per cell C at the time of past analysis (step S1406).

  Next, the analysis apparatus 100 acquires CAD data 312 (step S1407). Then, the analysis apparatus 100 specifies the minimum wiring width w (step S1408). Next, the analysis apparatus 100 performs the lattice point interval d = specified minimum wiring width w / 3 (step S1409).

  The analysis apparatus 100 arranges grids at equal intervals in the analysis area area based on the grid point interval d and the CAD data 312 and generates cell data 313 indicating a plurality of cells C obtained by dividing the analysis area area (step S1501). ). Then, the analysis apparatus 100 calculates the time step ts based on the lattice point interval d and the speed of light (step S1502). About step S1502, calculation is performed by Formula (3). Next, the analysis apparatus 100 estimates the calculation time time based on the number of calculations ccnt based on the number of cells C indicated by the cell data 313, the time step ts, and the analysis time at, and the calculation time ctime per cell C. (Step S1503). About step S1503, calculation is performed by Formula (4).

  Next, the analysis apparatus 100 determines whether or not the specified calculation time> the estimated calculation time time is satisfied (step S1504). If it is determined that the specified calculation time> the estimated calculation time time is satisfied (step S1504: Yes), the analysis apparatus 100 ends the series of processes. If it is determined that the specified calculation time is not greater than the estimated calculation time (step S1504: No), the analysis apparatus 100 extracts cell data that excludes grid points that do not affect the shape of the wiring based on the CAD data 312 and the cell data 313. 313 is generated (step S1505).

  The analyzing apparatus 100 estimates the calculation time time based on the number of calculations ccnt based on the number of cells C indicated by the cell data 313, the time step ts, and the analysis time at, and the calculation time ctime per cell C (step). S1506). Then, the analysis apparatus 100 determines whether or not the specified calculation time> the estimated calculation time time is satisfied (step S1507). When it is determined that the specified calculation time> the estimated calculation time is not satisfied (step S1507: No), the analysis apparatus 100 changes the lattice point interval d (step S1508), and returns to step S1501. If it is determined that the specified calculation time> the estimated calculation time time is satisfied (step S1507: Yes), the analysis apparatus 100 ends the series of processes.

  As described above, when the analysis apparatus calculates and analyzes physical quantities for each cell into which the analysis area is divided, the analysis apparatus estimates the analysis end time based on the calculation time of the physical quantities in units of cells and the number of times the physical quantities are calculated. To do. Thereby, the end time of the analysis can be estimated before the analysis is started.

  Further, the number of physical quantity calculations is a value based on the number of cells. This makes it possible to estimate the analysis end time by a simple calculation.

  Further, the analysis device is based on the minimum width of the wiring included in the analysis region so that the sides of the cells including the wiring in the plurality of partial regions are in contact with each other and the side length of the plurality of cells is maximized. Cell data 313 indicating a cell obtained by dividing the analysis region in units is generated. Thereby, modeling can be performed without breaking the shape of each element included in the structure to be analyzed. Therefore, the increase in the number of cells can be suppressed while improving the analysis accuracy.

  Note that the analysis method described in the present embodiment can be realized by executing a prepared analysis program on a computer such as a personal computer or a workstation. This analysis program is recorded on a computer-readable recording medium such as a magnetic disk, an optical disk, or a USB (Universal Serial Bus) flash memory, and is executed by being read from the recording medium by the computer. The analysis program may be distributed via a network NET such as the Internet.

  The following additional notes are disclosed with respect to the embodiment described above.

(Additional remark 1) In the analyzer which calculates a physical quantity about each of a plurality of partial fields which divided an analysis field, and acquires an analysis result of the analysis field based on the physical quantity,
Obtain the calculation time required to calculate the physical quantity,
A control unit that estimates the time until the analysis result is acquired based on the number of calculations of the physical quantity and the acquired calculation time,
The analysis apparatus characterized by having.

(Supplementary note 2) The analysis apparatus according to supplementary note 1, wherein the number of times the physical quantity is calculated is a number based on the number of the plurality of partial areas.

(Appendix 3) The control unit
The plurality of partial areas obtained by dividing the analysis area in units based on the minimum width of the wiring included in the analysis area, and the sides of the partial areas including the wiring in the plurality of partial areas are in contact with each other, And generating region information indicating the plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized,
The analysis apparatus according to appendix 2, wherein the number of times of calculation of the physical quantity is a number based on the number of the plurality of partial areas indicated by the generated area information.

(Supplementary Note 4) A plurality of partial areas obtained by dividing the analysis area in units based on the minimum width of the wiring included in the analysis area, and the sides of the partial areas including the wiring in the plurality of partial areas are in contact with each other And a control unit for generating region information indicating a plurality of partial regions obtained by dividing the analysis region so that the side length of the plurality of partial regions is maximized,
The analysis apparatus characterized by having.

(Additional remark 5) In the analysis program which calculates a physical quantity about each of a plurality of partial fields which divided an analysis field, and acquires an analysis result of the analysis field based on the physical quantity,
On the computer,
Obtain the calculation time required to calculate the physical quantity,
Based on the number of calculations of the physical quantity and the acquired calculation time, estimate the time to acquire the analysis result,
An analysis program characterized by causing processing to be executed.

(Appendix 6)
A plurality of partial regions obtained by dividing the analysis region by a unit based on a minimum width of a wiring included in the analysis region, and the sides of the partial regions including the wiring in the plurality of partial regions are in contact with each other; and Generating region information indicating a plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized;
An analysis program characterized by causing processing to be executed.

(Appendix 7) In an analysis method for calculating a physical quantity for each of a plurality of partial areas obtained by dividing an analysis area, and obtaining an analysis result of the analysis area based on the physical quantity,
Computer
Obtain the calculation time required to calculate the physical quantity,
Based on the number of calculations of the physical quantity and the acquired calculation time, estimate the time to acquire the analysis result,
An analysis method characterized by executing processing.

(Appendix 8) The computer
A plurality of partial regions obtained by dividing the analysis region by a unit based on a minimum width of a wiring included in the analysis region, and the sides of the partial regions including the wiring in the plurality of partial regions are in contact with each other; and Generating region information indicating a plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized;
An analysis method characterized by executing processing.

(Supplementary note 9) In an analysis program for calculating a physical quantity for each of a plurality of partial areas obtained by dividing an analysis area, and obtaining an analysis result of the analysis area based on the physical quantity,
Obtain the calculation time required to calculate the physical quantity,
Based on the number of calculations of the physical quantity and the acquired calculation time, estimate the time to acquire the analysis result,
A recording medium on which an analysis program for causing a computer to execute processing is recorded.

(Supplementary Note 10) A plurality of partial areas obtained by dividing the analysis area in units based on a minimum width of wiring included in the analysis area, and the sides of the partial areas including the wiring in the plurality of partial areas are in contact with each other And generating region information indicating a plurality of partial regions obtained by dividing the analysis region so that the side length of the plurality of partial regions is maximized.
A recording medium on which an analysis program for causing a computer to execute processing is recorded.

DESCRIPTION OF SYMBOLS 100 Analysis apparatus 301 Control part 302 Memory | storage part 313 Cell data area Analysis area atime Calculation time C Cell ccnt Calculation frequency ctime Calculation time ts Time step mp Wiring w Wiring width

Claims (8)

In an analysis device that calculates a physical quantity for each of a plurality of partial areas obtained by dividing an analysis area, and obtains an analysis result of the analysis area based on the physical quantity,
Obtain the calculation time required to calculate the physical quantity,
A control unit that estimates the time until the analysis result is acquired based on the number of calculations of the physical quantity and the acquired calculation time,
The analysis apparatus characterized by having.   The analysis apparatus according to claim 1, wherein the number of calculations of the physical quantity is a number based on the number of the plurality of partial areas. The controller is
The plurality of partial areas obtained by dividing the analysis area in units based on the minimum width of the wiring included in the analysis area, and the sides of the partial areas including the wiring in the plurality of partial areas are in contact with each other, And generating region information indicating the plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized,
The analysis apparatus according to claim 2, wherein the physical quantity calculation count is a count based on the number of the plurality of partial areas indicated by the generated area information. A plurality of partial regions obtained by dividing the analysis region by a unit based on a minimum width of a wiring included in the analysis region, and the sides of the partial regions including the wiring in the plurality of partial regions are in contact with each other; and A control unit that generates region information indicating a plurality of partial regions obtained by dividing the analysis region so that the side length of the plurality of partial regions is maximized;
The analysis apparatus characterized by having. In an analysis program for calculating a physical quantity for each of a plurality of partial areas obtained by dividing an analysis area, and obtaining an analysis result of the analysis area based on the physical quantity,
On the computer,
Obtain the calculation time required to calculate the physical quantity,
Based on the number of calculations of the physical quantity and the acquired calculation time, estimate the time to acquire the analysis result,
An analysis program characterized by causing processing to be executed. On the computer,
A plurality of partial regions obtained by dividing the analysis region by a unit based on a minimum width of a wiring included in the analysis region, and the sides of the partial regions including the wiring in the plurality of partial regions are in contact with each other; and Generating region information indicating a plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized;
An analysis program characterized by causing processing to be executed. In an analysis method for calculating a physical quantity for each of a plurality of partial areas obtained by dividing an analysis area, and obtaining an analysis result of the analysis area based on the physical quantity,
Computer
Obtain the calculation time required to calculate the physical quantity,
Based on the number of calculations of the physical quantity and the acquired calculation time, estimate the time to acquire the analysis result,
An analysis method characterized by executing processing. Computer
A plurality of partial regions obtained by dividing the analysis region by a unit based on a minimum width of a wiring included in the analysis region, and the sides of the partial regions including the wiring in the plurality of partial regions are in contact with each other; and Generating region information indicating a plurality of partial regions obtained by dividing the analysis region such that the side length of the plurality of partial regions is maximized;
An analysis method characterized by executing processing.

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