JP2015141151A - Measurement apparatus and bridge inspection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a measurement apparatus for easily measuring motion of a measurement object, such as a bridge girder, and a bridge inspection method.SOLUTION: A measurement apparatus 1 includes an imaging section 11, and a processing section 12 which processes image data output by the imaging section 11. The imaging section 11 images a plurality of grid patterns 2 arranged on the measurement object at predetermined time intervals, and output image data. The processing section 12 calculates displacement of the grid patterns 2 between two points of time with respect to each of image data in a plurality of image processing areas 21 including the grid patterns 2. The displacement of the plurality of grid patterns 2 are calculated at a time.

Description

  The present invention relates to a measurement device that measures the movement of a measurement object using a sampling moire method, and a bridge inspection method using the measurement device.

  Civil engineering structures in railways and roads include bridges. The bridge has a bridge girder on which vehicles and the like are directly mounted. When an abnormality is detected in a bridge girder, the amount of deflection of the bridge girder is usually measured. When the measured amount of deflection greatly exceeds the planned value, a detailed inspection is performed to determine the cause of the abnormality such as a reduction in the cross section of the bridge girder and breakage of the member joint, and appropriate measures are taken.

  When obvious changes in the bridge girder are detected, the bridge is often damaged to the extent that it threatens the basic performance of the bridge girder. Become. For this reason, it is desirable to capture damage to bridge girders as early as possible in terms of basic performance degradation.

  In order to catch bridge girder damage at an early stage, not only the deflection amount, but also multiple types of physical quantities that represent the movement of the bridge girder, such as the deflection angle and natural frequency, are measured with high accuracy. The inventor of the present invention thought that the overall judgment should be made based on the above.

  Conventionally, a mechanical measurement method combining a wire and a displacement meter is known as a method for measuring the deflection amount of a bridge girder. In this measurement method, a wire is stretched between a measurement point and a reference point, and the movement of the wire accompanying the deflection is measured with a displacement meter. However, such a measurement method requires an environment in which a wire is stretched between the measurement point and the reference point. For example, when the wire is located above the water surface, a temporary scaffold or the like is necessary on the water surface. It's not easy. As another method for measuring the deflection amount of the bridge girder, an optical measurement method using a laser distance meter is known. However, even in this measurement method, when the measurement point and the reference point are located above the water surface, a temporary scaffold or the like is necessary on the water surface, and measurement is not easy.

  Conventionally, as a method of measuring a deflection angle of a bridge girder, there is a method of calculating by dividing a difference in deflection amount between two points in a bridge girder by a distance between the two points. However, when it is not easy to measure the deflection amount of the bridge girder, it is not easy to measure the deflection angle. In addition, the measurement of the deflection angle requires two devices for measuring the amount of deflection, resulting in high cost.

  Conventionally, as a method of measuring the natural frequency of a bridge girder, there is a method of installing an acceleration sensor at a measurement point of a bridge pier and measuring it at an observation point. However, this measurement method requires installation of an acceleration sensor and wiring for measurement from the acceleration sensor to the observation point, which makes measurement difficult and expensive.

  As a device for measuring the displacement, a device using a sampling moire method has been proposed (see, for example, Patent Document 1 and Patent Document 2). Such a measuring apparatus images a grid pattern provided on a measurement object and measures the displacement of the grid pattern by image processing. If this measuring device can be used to measure the deflection amount of the bridge girder, even if the measuring point is located above the water surface, there is no need to temporarily install a scaffold on which the measuring device is placed on the water surface. The inventor of the invention thought. The inventor of the present invention has also studied measuring the movement of a bridge girder other than the amount of deflection with a measuring device using the sampling moire method. However, in order to catch the damage of the bridge girder at an early stage, it is not sufficient to measure at one measurement point. Since there are multiple measurement points, it is necessary to increase the number of measurements and use multiple measurement devices. Measurement is not easy and costly.

  The various problems described above also occur when trying to grasp the degree of deterioration of structures other than bridge girders at an early stage.

JP 2011-174874 A JP 2009-264852 A

  This invention solves the said problem, and aims at providing the measuring apparatus and bridge inspection method which measure easily the motion of measurement objects, such as a bridge girder.

  The measurement apparatus of the present invention is for measuring the movement of a measurement object, and an imaging unit that images a plurality of lattice patterns provided on the measurement object at predetermined time intervals and outputs image data; A processing unit that processes the image data output by the imaging unit, and the processing unit includes image data in a plurality of image processing regions in which the lattice pattern is reflected in the image data output by the imaging unit. On the other hand, the displacement of the lattice pattern between two time points is calculated.

  In the measurement apparatus, the processing unit generates a plurality of thinned images by sampling pixels at equal intervals in a predetermined direction for each image data in a plurality of image processing regions in which the lattice pattern is reflected. A step of generating a plurality of moire images by complementing the data of the plurality of thinned images, a step of calculating a phase value of moire fringes from the plurality of moire images, and a phase value of the moire fringes at two time points Preferably, the step of calculating the displacement of the lattice pattern between the two time points is executed.

  In this measurement apparatus, it is preferable that the imaging unit outputs image data in which a plurality of the lattice patterns are included in one imaging range.

  In this measurement apparatus, the imaging unit includes a plurality of imaging units, and the plurality of imaging units can be set so that imaging ranges or focal points are different from each other, and the imaging range of each imaging unit includes at least one grid A pattern may be included, and the plurality of imaging units may capture images in synchronization.

  In this measurement apparatus, the processing unit may further calculate a frequency at which the lattice pattern is displaced based on displacement of the lattice pattern at a plurality of points in time.

  In this measurement apparatus, the lattice pattern is a two-dimensional lattice pattern, and the processing unit calculates a phase value of moire fringes at two points in the lattice pattern, and based on the calculated phase value of the moire fringes. Then, the rotation angle of the lattice pattern may be further calculated.

  The bridge inspection method of the present invention is a bridge inspection method using the measuring device, wherein the lattice pattern is provided at a plurality of positions in the bridge, and the imaging unit images a plurality of the lattice patterns, The processing unit calculates a displacement of each of the lattice patterns.

  In this bridge inspection method, the lattice patterns are provided at a plurality of positions on the bridge, the imaging unit images the plurality of lattice patterns, and the processing unit calculates the frequency of displacement of each lattice pattern. It may be calculated.

  In this bridge inspection method, the lattice pattern is provided at a plurality of positions on the bridge, the imaging unit images the plurality of lattice patterns, and the processing unit calculates a rotation angle of each lattice pattern. May be.

  In this bridge inspection method, it is preferable that the lattice pattern is provided on a bridge girder of the bridge.

  In this bridge inspection method, the lattice pattern may be provided on a pier of the bridge.

  In this bridge inspection method, the lattice pattern may be further provided on an object that does not receive a load applied to the bridge.

  According to the present invention, since the lattice pattern provided on the measurement object is imaged and measured, the movement of the measurement object can be easily measured from a position away from the measurement object. In addition, since the measurement device captures and measures a plurality of lattice patterns, it can measure a plurality of measurement points at once with a single measurement device, facilitating measurement and reducing measurement costs. Comparison of measurement values at a plurality of measurement points is facilitated. Furthermore, it is possible to measure a plurality of measurement points at the same time, and measurement that cannot be performed by measurement of only one measurement point or individual measurement at a plurality of measurement points becomes possible.

The block block diagram of the measuring device which concerns on the 1st Embodiment of this invention. The front view of the lattice pattern in the measuring device. The figure explaining the image data which the imaging part of the measuring device images. (A)-(e) is a figure which shows the principle of the phase calculation by the sampling moire method in the measuring device. The figure which shows the calculation method of the rotation angle of the lattice pattern in the measuring device. The block block diagram of the measuring device which concerns on the 2nd Embodiment of this invention. The figure explaining the image data which the imaging part of the measuring device images. The perspective view which shows the displacement measurement of the bridge girder in the bridge inspection method of this invention. The figure which shows the calculation method of the deflection angle based on the measurement of a displacement. The figure which shows the calculation method of the deflection angle based on the measurement of a rotation angle. The side view which shows the rotation angle measurement of the bridge girder in the bridge inspection method. The perspective view which shows the vibration measurement of the pier in the bridge inspection method. The figure which shows the rolling measurement of the bridge girder in the bridge inspection method. The figure which shows the rotation angle difference vibration measurement of the member of the bridge in the bridge inspection method.

(First embodiment)
A measuring apparatus according to a first embodiment of the present invention will be described with reference to FIGS. As shown in FIG. 1, the measuring device 1 is for measuring the movement of a measurement object. A plurality of lattice patterns 2 are provided on the measurement object.

  The measurement apparatus 1 includes an imaging unit 11, a processing unit 12, an input unit 13, and a display unit 14. The imaging unit 11 captures a plurality of grid patterns 2 provided on the measurement object at predetermined time intervals and outputs image data. The processing unit 12 processes the image data output from the imaging unit 11. The input unit 13 receives an input operation to the measurement device 1. The display unit 14 displays the output of the processing unit 12. Note that the measuring system 1 and the lattice pattern 2 constitute a measuring system.

  The imaging unit 11 is a CCD camera having a CCD as an imaging element, for example, and outputs digital image data. The imaging unit 11 may be a CMOS camera. The processing unit 12, the input unit 13, and the display unit 14 are configured using a computer, for example. The processing unit 12 includes a CPU, a memory, and the like, and operates by executing a processing program. The input unit 13 is, for example, a keyboard and a mouse. The display unit 14 is a visual display device such as a liquid crystal display, for example. A touch panel may also be used as the input unit 13 and the display unit 14.

  The lattice pattern 2 is a pattern having periodicity in at least one direction on the plane, that is, a one-dimensional lattice pattern having periodicity in one direction, or a two-dimensional lattice pattern having periodicity in two directions. As shown in FIG. 2, in this embodiment, the lattice pattern 2 is a two-dimensional lattice pattern, and is a rectangle having the same constant pitch p in two directions (x direction and y direction) orthogonal to each other on the plane. It is a lattice. Note that the two directions having periodicity in the two-dimensional lattice pattern 2 need only have known angles, and may not be orthogonal to each other. The pitch in the two-dimensional lattice pattern 2 may not be the same in the two directions. For example, in the case where the position of the imaging unit 11 is imaged obliquely rather than in front of the two-dimensional lattice pattern 2, the pitch in one direction in the lattice pattern 2 is set larger than the pitch in the other direction, so The pitch may be the same in the two directions. Moreover, the shape of the lattice is not limited to a rectangular shape, and for example, the lattice pattern 2 may be one in which round dots are arranged two-dimensionally.

  The lattice pattern 2 is formed on the surface of a flat plate using printing or the like, for example, and the flat plate is attached to the measurement object by a magnet, screwing, or the like. The lattice pattern 2 may be provided directly on the measurement object by paint color or the like.

  As shown in FIG. 3, in the present embodiment, the imaging unit 11 outputs image data in which a plurality of grid patterns 2 are included in one imaging range 3. In FIG. 3, illustration of images other than the lattice pattern 2 such as the measurement object is omitted.

  The image data output by the imaging unit 11 is displayed on the display unit 14. The user of the measuring apparatus 1 operates the input unit 13 while viewing the image data displayed on the display unit 14 to specify the image processing area 21 in which the lattice pattern 2 is reflected. The processing unit 12 may be configured to automatically recognize the lattice pattern 2 and extract the image processing area 21 by image processing.

  The number of pixels in the imaging range 3 is, for example, horizontal 640 pixels and vertical 480 pixels. The number of pixels in each image processing area 21 is, for example, 128 × 128 pixels. The number of pixels in the imaging range 3, the number of pixels in the image processing area 21, and the number of image processing areas 21 are not limited thereto.

  The processing unit 12 performs image processing on each image data in the plurality of image processing regions 21 in which the lattice pattern 2 is captured among the image data output from the imaging unit 11.

  As image processing performed by the processing unit 12, image processing by the sampling moire method will be described with reference to FIGS. When the lattice pattern 2 is a two-dimensional lattice pattern, the image data in the image processing area 21 has a periodic luminance value in two directions, and is orthogonalized by performing smoothing processing in one direction. Image data having periodicity in one direction is generated. When the grid pattern 2 is a one-dimensional grid pattern, the image data in the image processing area 21 has a periodic luminance value in one direction. Hereinafter, processing of image data in one direction will be described by taking as an example a case where imaging is performed so that one pitch p (reference pitch) of the lattice pattern 2 is about N pixels (N = 4). When the lattice pattern 2 is a two-dimensional lattice pattern, the same processing is performed in two directions orthogonal to each other.

  A lattice pattern 2 as shown in FIG. 4A is picked up by the image pickup unit 11, and image data having a periodic luminance value as shown in FIG. 4B is generated. This image data has four types of data of white, light gray, dark gray, and black in a pixel.

  The processing unit 12 samples the image data at equal intervals for every N pixels (N = 4) close to the reference pitch, and a plurality (N = 4) as shown in FIG. Thinned-out images are generated (n = 0, 1, 2, 3). At this time, the thinning position (phase) is shifted for each pixel.

  Each thinned image has no data in three pixels (N−1 = 3) thinned out during one cycle. Therefore, the processing unit 12 complements the data of the thinned image and generates a moiré image as shown in FIG. The complement is, for example, linear complement. Data of coordinates (x, y) in a moire image is generally represented by the following equation.

Here, I _a (x, y) is the amplitude of moire fringes, and I _b (x, y) is the background luminance. In this way, a plurality of moire images with phase shifted are obtained from one piece of image data (see FIG. 4B).

  The processing unit 12 calculates the phase value θ of moire fringes from a plurality of moire images (n = 0, 1, 2, 3). The phase value θ of the moire fringes is calculated by the following equation.

  FIG. 4E is a phase distribution image representing the distribution of the phase values θ of moire fringes. Black represents −π [rad], white represents π [rad], and intermediate colors represent phase values between −π [rad] and π [rad].

The processing unit 12 calculates the displacement d of the lattice pattern 2 between the two time points based on the moire fringe phase values θ (θ1, θ2) at the two time points (t = t1, t2). When the difference between the phase value theta between two time points (θ2-θ1) and theta _12, the displacement d is represented by the following equation.

d = (θ ₁₂ / 2π) × p

  Thereby, the amount of displacement before and after displacement is calculated. Moreover, the displacement for every predetermined time interval with respect to the reference time can be calculated.

  By using the phase value θ of the moire fringes calculated by Equation 2, the measuring device 1 can practically measure minute displacements up to one hundredth of the pitch p of the lattice pattern 2.

  Next, the measurement of the vibration frequency by the measuring device 1 will be described. The imaging unit 11 images the lattice pattern 2 at predetermined time intervals. The processing unit 12 calculates the displacement of the lattice pattern 2 at predetermined time intervals. The processing unit 12 calculates the frequency at which the lattice pattern 2 is displaced by Fourier transforming the displacement of the lattice pattern 2 that changes over time. That is, the processing unit 12 calculates the frequency at which the lattice pattern 2 is displaced based on the displacement of the lattice pattern 2 at a plurality of times.

Next, the measurement of the rotation angle by the measuring device 1 will be described (see Japanese Patent Application No. 2013-150883). As shown in FIG. 5, it is assumed that point A and point B are displaced to point A ′ and point B ′ by the rotation of the grid pattern 2, respectively. The coordinates of point A, point B, point A ′, and point B ′ are (x _A , y _A ), (x _B , y _B ), (x _A ′, y _A ′), and (x _B ′, y _B ), respectively. '). In the initial state, it is assumed that the points A and B are on the x axis (y _A = y _B = 0), and the angle (rotation) formed by the line segment AB connecting the points A and B and the line segment parallel to the x axis The initial value of the corner is set to zero. The rotation angle Δθ is calculated by the following equation.

_{Δθ = arctan ((y B '} -y A') / (x B '-x A'))

When _{(y B} '-y _A') is very small relative to the _{(x B '-x A')} , the rotation angle Δθ is approximated by the following equation.

_{Δθ = (y B '-y A} ') / (x B '-x A')

Since the coordinate values x _A ′, x _B ′, y _A ′, and y _B ′ after displacement are calculated from the phase value of the moire fringe, the phase value of the lattice, and the pitch p of the lattice pattern 2, A rotation angle Δθ is calculated. The pitch p of the lattice pattern is eliminated because it exists in the denominator and numerator of the equation for calculating the rotation angle Δθ. That is, the processing unit 12 calculates the phase value of the moire fringes at the two points A and B in the grid pattern 2 and calculates the rotation angle Δθ of the grid pattern 2 based on the calculated phase values of the moire fringes. When the initial value of the rotation angle is not 0, the initial value (y _B −y _A ) / (x _B −x _A ) of the rotation angle may be subtracted from Δθ.

  The processing unit 12 may calculate the rotation angle Δθ of the lattice pattern 2 by calculating the rotation angle for a plurality of or all the pixels in the image processing area 21 and calculating the average value of the rotation angles. Thereby, the measurement accuracy of the rotation angle Δθ of the lattice pattern 2 is improved.

  As described above, according to the measurement apparatus 1 according to the present embodiment, since the lattice pattern 2 provided on the measurement object is imaged and measured, the displacement that is the movement of the measurement object easily from a position away from the measurement object. Can be measured. In addition, since the measuring device 1 captures and measures a plurality of grid patterns 2 provided, the measuring device 1 can measure a plurality of measurement points at a time with a single measuring device, facilitating measurement and reducing the measurement cost. The measurement values at a plurality of measurement points are easily compared. Furthermore, it is possible to measure a plurality of measurement points at the same time, and measurement that cannot be performed by measurement of only one measurement point or individual measurement at a plurality of measurement points becomes possible.

  Since the processing unit 12 performs image processing by the sampling moire method and measures the displacement of the lattice pattern 2, it can measure a minute displacement. For this reason, the measuring device 1 can perform highly accurate measurement from a point away from the measurement point.

  Since the imaging unit 11 outputs image data in which the plurality of grid patterns 2 are included in one imaging range 3, the movement of the plurality of grid patterns 2 can be measured at one time with one measuring device.

  Since the processing unit 12 calculates the vibration frequency at which the lattice pattern 2 is displaced, the displacement and the vibration frequency of the measurement object can be measured with a single measuring device, which facilitates measurement and reduces measurement cost. The

  Since the processing unit 12 calculates the rotation angle of the lattice pattern 2, it is possible to measure the displacement and the rotation angle of the measurement object with a single measurement device, which facilitates measurement and reduces measurement cost.

(Second Embodiment)
A measuring apparatus 1 according to a second embodiment of the present invention will be described with reference to FIGS. The measuring device 1 of this embodiment has the same configuration as that of the first embodiment, and the number of imaging units is different. In the following description, portions equivalent to those in the first embodiment are denoted by the same reference numerals, and detailed description thereof is omitted.

  As illustrated in FIG. 6, the measurement apparatus 1 according to the present embodiment includes an imaging unit 11, a processing unit 12, an input unit 13, and a display unit 14. The measuring device 1 has a plurality of imaging units 11. The plurality of imaging units 11 can be set so that the imaging ranges or focal points are different from each other. As shown in FIG. 7, at least one lattice pattern 2 is included in the imaging range of each imaging unit 11. The plurality of imaging units 11 capture the lattice pattern 2 in synchronization.

  For example, when the processing unit 12 simultaneously sends control signals for instructing imaging to the plurality of imaging units 11, the plurality of imaging units 11 capture images in synchronization (see FIG. 6).

  As described above, according to the measurement apparatus 1 according to the present embodiment, since the plurality of imaging units 11 capture images synchronously, the movement of the plurality of grid patterns 2 can be measured at one time with one measurement apparatus. The same effect as that of the first embodiment can be obtained. Furthermore, the measuring apparatus 1 can measure the movement of the plurality of grid patterns 2 arranged in a range that cannot be captured by one imaging unit 11 by changing the imaging range or focus of the imaging unit 11.

(Bridge inspection method)
An example of a bridge inspection method using the measuring apparatus 1 of the present invention will be described with reference to FIGS. The measuring device 1 has a function of measuring the displacement of the plurality of lattice patterns 2. The measuring device 1 preferably further has at least one of a function of measuring the rotation angle of the lattice pattern 2 and a function of measuring the frequency at which the lattice pattern 2 is displaced. Of these functions, one or more functions are used to inspect the bridge. The lattice pattern 2 is provided at a plurality of positions on the bridge. The imaging unit 11 of the measuring device 1 captures the plurality of lattice patterns 2. The processing unit 12 calculates a physical quantity selected from the displacement, the rotation angle, and the vibration frequency of each lattice pattern 2.

  The displacement measurement of the bridge girder in the bridge inspection method of the present invention will be described. As shown in FIG. 8, a lattice pattern 2 is provided on a bridge girder 4 of the bridge. The measuring device 1 measures the displacement d of the lattice pattern 2. By this measurement, the displacement d (deflection amount) of the portion where the lattice pattern 2 is provided is measured.

  Since the grid pattern 2 provided on the bridge girder 4 is imaged and measured by using the measuring device 1, the displacement d of the location where the grid pattern 2 is provided can be easily measured on the pier or the riverbank. . Since the measuring apparatus 1 captures and measures a plurality of grid patterns 2 provided, the displacement d of the fulcrum part 41 and the center part 42 of the bridge girder 4 can be measured simultaneously. Thus, by subtracting the average value of the displacement d of both fulcrum portions 41 from the displacement d of the central portion 42, the original deflection value (deflection amount) of the central portion 42 of the bridge girder 4 is obtained. Conventionally, it has been necessary to arrange a total of three displacement meters, etc., at each of the fulcrum part 41 and the central part 42, connect each with a cable, synchronize, and perform the above calculation. . According to this method, the number of machines and wiring man-hours can be reduced. Such measurement is utilized for bridge girder performance verification and soundness diagnosis.

  The measurement of the deflection angle (displacement angle) of the bridge girder will be described. A beam structure such as a bridge girder bends when it receives a load and produces a deflection angle. As shown in FIG. 9, in the conventional deflection angle measuring method, displacements Y1 and Y2 at two points P1 and P2 whose horizontal distances are X ′ apart are measured, and the deflection angle θ1 is calculated by the following equation. . In the past, the displacements Y1 and Y2 of the two points P1 and P2 were measured using two measuring devices (laser distance meters or the like).

  θ1 = Y ′ / X ′ = (Y2−Y1) / X ′

  If the lattice pattern 2 is provided at two points P1 and P2 of the bridge girder 4 and the displacement of the lattice pattern 2 is measured by the measuring device 1, the deflection angle θ1 is measured by one measuring device 1. However, since the deflection angle is the inclination of the tangent at one point on the deflection curve 4B, the method of calculating from the displacement at two points does not mean that the deflection angle is measured as defined, and the measurement error increases. .

  The measurement of the deflection angle at one point of the bridge girder 4 using the measuring device 1 will be described. As shown in FIG. 10, by measuring the rotation angle θ3 of the two-dimensional lattice pattern 2 provided at an arbitrary point P3 of the bridge girder 4 with the measuring device 1, the bridge girder 4 at one point is defined as defined by the deflection angle. The deflection angle θ3 is measured. Further, by using the measuring device 1, the displacement Y3 of the bridge beam 4 at the same point P3 can be measured simultaneously.

  The rotation angle measurement of the bridge girder in the bridge inspection method of the present invention will be described. As shown in FIG. 11, a two-dimensional lattice pattern 2 is provided on both abutments 5 and on both fulcrum portions 41 of the bridge girder 4. The measuring device 1 measures the rotation of these lattice patterns 2. By this measurement, the displacements of both the abutments 5 and the fulcrum portions 41 of the bridge girder 4 are measured at a time from a distant position. By this measurement, the shoe function of the bridge and the soundness of the bridge girder can be confirmed, and the measurement result is used for diagnosis of the performance of the bridge girder 4 and the solid state of the fulcrum.

  The vibration measurement of the pier in the bridge inspection method of this invention is demonstrated. As shown in FIG. 12, the lattice pattern 2 is provided on the bridge pier 6 of the bridge. The measuring device 1 measures the frequency at which the lattice pattern 2 is displaced. By this measurement, the frequency of the place where the lattice pattern 2 is provided is measured. For example, the primary natural frequency of the pier 6 is measured by measuring the frequency of the lattice pattern 2 provided on the pier 6 at a sufficiently high sampling frequency using the measuring device 1. This measurement will be used for judgment of pier soundness after flooding and safe opening judgment.

  The rolling measurement of the bridge girder in this bridge inspection method will be described. FIG. 13 is a view of the bridge girder 4 as seen from a plane orthogonal to the longitudinal direction. The lattice pattern 2 is provided on the bridge girder 4 so that the normal line thereof faces the longitudinal direction of the bridge girder 4. The measuring device 1 measures rolling by measuring the rotation angle of the lattice pattern 2 at the same time as the displacement of the two-dimensional lattice pattern 2 in the horizontal and vertical directions (x and y directions). By using the measuring device 1, the grid pattern 2 provided on the bridge girder 4 is imaged and measured, so that the rolling of the bridge girder 4 can be easily measured from the pier or the riverbank. This measurement is used to determine the soundness threshold of the bridge girder 4 and to verify the effectiveness of measures taken on the bridge girder 4.

  The rotation angular vibration measurement between members in the bridge inspection method of the present invention will be described. As shown in FIG. 14, each of the plurality of lattice patterns 2A, 2B, 2C (2) is provided on a separate member 7A, 7B, 7C in the bridge. Due to the load applied to the bridge, the members 7A, 7B, and 7C rotate so as to vibrate. The measuring device 1 measures a rotation angle at which the lattice pattern 2 rotates at a predetermined time interval. The processing unit 12 measures the rotation angle difference vibration between the members by calculating the difference between the rotation angles of the two lattice patterns 2. For example, the rotation angle difference vibration of the flange 7B is measured by calculating the difference in rotation angle between the lattice pattern 2B and the lattice pattern 2A at a predetermined time interval. By calculating the difference in rotation angle between the lattice pattern 2C and the lattice pattern 2B at a predetermined time interval, the rotation angle difference vibration of the gusset 7C is measured. The measurement of the rotation angle difference vibration at the time of loading near the joint such as the web, the flange, and the secondary member is utilized for determining the threshold value of the soundness evaluation of the welded portion and for verifying the effect of the measures taken on the bridge girder 4. As described above, by simultaneously measuring a plurality of measurement points using the measurement apparatus 1, it is possible to perform measurement that cannot be performed by measurement of only one measurement point or individual measurement at a plurality of measurement points.

  In the bridge inspection method using the measuring device 1, it is preferable to install the measuring device 1 in a place where it does not move due to a load applied to the bridge. However, there are cases where the measuring device 1 has to be installed in a place where there is a possibility of movement due to restrictions on the installation location. For example, since the pier indirectly receives a load applied to the bridge girder, the measurement device 1 may move when the measurement device 1 is installed on the pier. In such a case, the lattice pattern 2 may be further provided on an object that does not receive a load applied to the bridge. The measuring device 1 simultaneously measures the lattice pattern 2 of the measurement object provided on the bridge and the movement of the reference lattice pattern 2 provided on the object that does not receive the load applied to the bridge. The processing unit 12 calculates a difference in measurement values between the lattice pattern 2 of the measurement object and the reference lattice pattern 2. Thereby, irrespective of the movement of the measuring apparatus 1, the absolute movement of the location where the lattice pattern 2 is provided in the bridge is measured. In addition, it is easy to increase the distance between the lattice pattern 2 of the measurement object and the reference lattice pattern 2 by using the measurement apparatus 1 according to the second embodiment of the present invention for such measurement. become. As described above, by simultaneously measuring a plurality of measurement points using the measurement apparatus 1, it is possible to perform measurement that cannot be performed by measurement of only one measurement point or individual measurement at a plurality of measurement points.

  In addition, this invention is not restricted to the structure of said embodiment, A various deformation | transformation is possible in the range which does not change the summary of invention. For example, the image processing performed by the processing unit 12 is not limited to the image processing based on the sampling moire method, and may be image processing based on a phase analysis method using Fourier transform or another phase analysis method, for example. The measurement object is not limited to a bridge, and may be a structure or a machine other than a bridge.

DESCRIPTION OF SYMBOLS 1 Measurement apparatus 11 Imaging part 12 Processing part 2 Grid pattern 21 Image processing area 3 Imaging range 4 Bridge girder 6 Bridge pier

Claims (12)

A measuring device for measuring the movement of a measurement object,
An imaging unit that captures a plurality of grid patterns provided on the measurement object at predetermined time intervals and outputs image data;
A processing unit that processes the image data output by the imaging unit,
The processing unit calculates a displacement of the grid pattern between two time points for each image data in a plurality of image processing regions in which the grid pattern is captured among the image data output from the imaging unit. A measuring device characterized by that.   The processing unit generates a plurality of thinned images by sampling pixels at equal intervals in a predetermined direction for each image data in a plurality of image processing regions in which the lattice pattern is reflected; and Based on the phase value of the moire fringes at two points in time, the step of generating a plurality of moire images by complementing the data of the thinned image, the step of calculating the phase value of moire fringes from the plurality of moire images, The measuring device according to claim 1, wherein the step of calculating a displacement of the lattice pattern between two time points is executed.   The measurement apparatus according to claim 1, wherein the imaging unit outputs image data in which a plurality of the lattice patterns are included in one imaging range. A plurality of the imaging units;
The plurality of imaging units can be set so that imaging ranges or focal points are different from each other,
The imaging range of each imaging unit includes at least one grid pattern,
The measuring apparatus according to any one of claims 1 to 3, wherein the plurality of imaging units capture images synchronously.   The said process part further calculates the frequency which the said lattice pattern displaces based on the displacement of the said lattice pattern in several time points, The Claim 1 thru | or 4 characterized by the above-mentioned. Measuring device. The lattice pattern is a two-dimensional lattice pattern;
The processing unit calculates a phase value of moire fringes at two points in the lattice pattern, and further calculates a rotation angle of the lattice pattern based on the calculated phase value of the moire fringes. The measuring device according to any one of claims 1 to 5. A bridge inspection method using the measuring device according to any one of claims 1 to 4,
The lattice pattern is provided at a plurality of positions in the bridge,
The imaging unit images a plurality of the lattice patterns,
The bridge inspection method, wherein the processing unit calculates a displacement of each of the lattice patterns. A bridge inspection method using the measuring device according to claim 5,
The lattice pattern is provided at a plurality of positions in the bridge,
The imaging unit images a plurality of the lattice patterns,
The bridge inspection method, wherein the processing unit calculates a displacement frequency of each of the lattice patterns. A bridge inspection method using the measuring device according to claim 6,
The lattice pattern is provided at a plurality of positions in the bridge,
The imaging unit images a plurality of the lattice patterns,
The bridge inspection method, wherein the processing unit calculates a rotation angle of each of the lattice patterns.   The bridge inspection method according to claim 7, wherein the lattice pattern is provided on a bridge girder of the bridge.   The bridge inspection method according to claim 7, wherein the lattice pattern is provided on a pier of the bridge.   The bridge inspection method according to claim 10 or 11, wherein the lattice pattern is further provided on an object that does not receive a load applied to the bridge.

Images