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JP2014224726A - Optical distance measuring device - Google Patents

Optical distance measuring device Download PDF

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JP2014224726A
JP2014224726A JP2013103447A JP2013103447A JP2014224726A JP 2014224726 A JP2014224726 A JP 2014224726A JP 2013103447 A JP2013103447 A JP 2013103447A JP 2013103447 A JP2013103447 A JP 2013103447A JP 2014224726 A JP2014224726 A JP 2014224726A
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JP6101561B2 (en
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和田 秀夫
Hideo Wada
秀夫 和田
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Abstract

PROBLEM TO BE SOLVED: To provide a high-precision optical distance measuring device capable of easily correcting a signal (noise) reflected by a protective cover and detected by a light receiving element, without requiring a special measurement environment, when the protective cover is provided in front of the distance measuring device.SOLUTION: In an optical distance measuring device, a correction operation part computes a correction coefficient corresponding to the intensity distribution of cover reflected light from intensity distributions SA, SB of partial regions 8a, 8b at least on one side of both ends of a light receiving element, and corrects the intensity distribution S0 of spot light, and a distance computing part computes the distance to a measuring object based on the output from the correction operation part.

Description

本発明は、測定対象物までの距離を光学的に検出する光学式測距装置およびそれを搭載した電子機器に関し、特に本光学式測距装置の前面に保護カバーが設置された場合において、保護カバーで反射して受光素子で検出される反射光を補正することにより測距精度の低下を防止する光学式測距装置に関する。   The present invention relates to an optical distance measuring device that optically detects a distance to an object to be measured and an electronic device equipped with the same, and particularly when a protective cover is installed on the front surface of the optical distance measuring device. The present invention relates to an optical distance measuring device that prevents a decrease in distance measuring accuracy by correcting reflected light reflected by a cover and detected by a light receiving element.

従来、図101に示すように測定対象物110にスポット光を照射して、その反射光を受光して三角測距により測定対象物110までの距離を測定する測距装置150は多数提案されている。A点(0,−d)に配置された発光素子101より出射された光束は原点O(0,0)に配置された発光レンズ102により略平行光束となり、測定対象物上のB点(0,Y)に光スポットを照射する。測定対象物110で反射した光束はC点(L,0)に配置された受光レンズ103により集光され、x軸上に配置された受光素子104上のD点(L+l,−d)に結像されて受光スポットを形成する。発光軸A100は、原点O(0,0)、B点(0,Y)、およびC点(L,0)を通過する直線を示している。受光軸A101は、B点(0,Y)、C点(L,0)、およびD点(L+l,−d)を通過する直線を示している。ここで、E点(L,−D)を、C点を通過するy軸に平行な線がx軸と交差する点とするとき、三角形OBCと三角形ECDは相似形である。受光素子104により受光スポットの位置を検出して辺ED(=l)を測定することにより、式(1)に基づいて、測定対象物110までの距離Yを検出できる。   Conventionally, as shown in FIG. 101, many distance measuring apparatuses 150 for irradiating a measurement object 110 with spot light, receiving the reflected light, and measuring the distance to the measurement object 110 by triangulation have been proposed. Yes. The light beam emitted from the light emitting element 101 arranged at the point A (0, −d) becomes a substantially parallel light beam by the light emitting lens 102 arranged at the origin O (0, 0), and becomes a point B (0 on the measurement object). , Y) is irradiated with a light spot. The light beam reflected by the measurement object 110 is collected by the light receiving lens 103 disposed at the point C (L, 0) and is connected to the point D (L + l, -d) on the light receiving element 104 disposed on the x axis. It is imaged to form a light receiving spot. The light emission axis A100 indicates a straight line passing through the origin O (0, 0), the point B (0, Y), and the point C (L, 0). The light receiving axis A101 indicates a straight line passing through the point B (0, Y), the point C (L, 0), and the point D (L + l, -d). Here, when the point E (L, -D) is a point where a line parallel to the y-axis passing through the point C intersects the x-axis, the triangle OBC and the triangle ECD are similar. By detecting the position of the light receiving spot by the light receiving element 104 and measuring the side ED (= l), the distance Y to the measurement object 110 can be detected based on the equation (1).

Figure 2014224726
Figure 2014224726

これが一般的な三角測距の原理である。受光素子にはPSD(位置検出素子)や複数のPDが配置されたリニアセンサ、イメージセンサなどが用いられる。受光素子は、受光素子上に照射された受光スポットの光重心位置を検出する。   This is the general principle of triangulation. As the light receiving element, a PSD (position detecting element), a linear sensor in which a plurality of PDs are arranged, an image sensor, or the like is used. The light receiving element detects the light barycenter position of the light receiving spot irradiated on the light receiving element.

このような原理で動作する光学式の測距装置150が使用される場合、図102に示すようにその前面に発光素子から出射される光束に対して十分高い透過率を有する保護カバー120が設置される。発光レンズ103を介して略平行光に整えられた発光光束F0の大部分は、高い透過率を有する保護カバー120を透過して測定対象物110を照射する。その反射光F1は、再び保護カバー120を透過して受光レンズ103を介して受光素子104に入射する。この結果、測定対象物110までの距離Yに対応した光スポット位置が検出される。しかし、発光光束F0の一部は保護カバー120の表面で反射し、カバー反射光F2になる。カバー反射光F2は、直接もしくは回り込みながら受光レンズ103へと入射し受光素子104で検出される。このように測距装置150の前面に保護カバー120が設置された状態では、測定対象物110で反射した反射光F1により受光素子104上に集光される光スポットに加えて、保護カバー120で反射した光が受光素子104で検出される。この結果、測定対象物110までの距離Yを正確に測定できないという問題があった。   When the optical distance measuring device 150 operating on such a principle is used, a protective cover 120 having a sufficiently high transmittance for the light beam emitted from the light emitting element is installed on the front surface thereof as shown in FIG. Is done. Most of the emitted light beam F0 adjusted to substantially parallel light through the light emitting lens 103 passes through the protective cover 120 having a high transmittance and irradiates the measurement object 110. The reflected light F 1 passes through the protective cover 120 again and enters the light receiving element 104 through the light receiving lens 103. As a result, the light spot position corresponding to the distance Y to the measurement object 110 is detected. However, a part of the luminous flux F0 is reflected by the surface of the protective cover 120 and becomes cover reflected light F2. The cover reflected light F <b> 2 enters the light receiving lens 103 while being directly or sneak around and is detected by the light receiving element 104. When the protective cover 120 is installed on the front surface of the distance measuring device 150 in this way, in addition to the light spot collected on the light receiving element 104 by the reflected light F1 reflected by the measurement object 110, the protective cover 120 is used. The reflected light is detected by the light receiving element 104. As a result, there is a problem that the distance Y to the measurement object 110 cannot be measured accurately.

このような課題に対し、特許文献1は、測距装置の前面に窓ガラスが設置された場合において、検出された受光信号量が所定の受光量よりも小さいにも関わらず、測定された距離が近距離である場合、測距が誤っているとみなし、出力を無限遠に訂正するかパッシブ測距に切り替えることを、提案している。   In response to such a problem, Patent Document 1 discloses that when a window glass is installed on the front surface of the distance measuring device, the measured distance is measured even though the amount of received light signal is smaller than a predetermined amount of received light. If is a short distance, it is considered that the distance measurement is wrong and the output is corrected to infinity or switched to passive distance measurement.

また、特許文献2は、保護カバーで反射された光が回り込み光であって、受光素子上で集光されずに受光素子を一様に照射するだけであり、保護カバーの反射光がもつ情報が均一強度の光量情報のみであることを考慮して、保護カバーからの反射光量を受光信号から減算して距離演算を行うことを提案している。ここで、保護カバーからの反射光量は、無限遠状態で測距動作を行うことにより保護カバーからのみの信号を検出することによって予め得られており、メモリに記憶されている。   Further, in Patent Document 2, the light reflected by the protective cover is a sneak path light, and is only irradiated uniformly on the light receiving element without being condensed on the light receiving element. In consideration of the fact that only the light intensity information with uniform intensity is present, it has been proposed to perform distance calculation by subtracting the light intensity reflected from the protective cover from the received light signal. Here, the amount of light reflected from the protective cover is obtained in advance by detecting a signal only from the protective cover by performing a distance measuring operation at infinity, and is stored in the memory.

しかし、受光素子上で保護カバーからの反射光が強度分布を有する場合は、特許文献1や特許文献2では正確な距離測定が行えない。このため、本発明者らは、特許文献3において、保護カバーからの反射光が受光素子上で作る強度分布をメモリに記憶し、距離演算の際に受光スポット信号からカバー反射光の強度分布を減算し、減算後の受光スポット信号に基づいて測定対象物までの距離を検出することを提案している。さらに、本発明者らは、メモリの搭載量を低減するために保護カバーの反射光の強度分布を近似(数値化)し、その近似式から得られる強度分布を用いて受光スポットを補正することも提案している。また、この2者の強度分布を求める方法は特許文献2と同様に、無限遠の状態で保護カバーからの反射光のみの受光信号を検出する必要があった。   However, when the reflected light from the protective cover has an intensity distribution on the light receiving element, Patent Document 1 and Patent Document 2 cannot perform accurate distance measurement. For this reason, in the patent document 3, the present inventors memorize | stored the intensity distribution which reflected light from a protective cover produces on a light receiving element in a memory, and calculated intensity distribution of cover reflected light from a received light spot signal in the case of distance calculation. It has been proposed to subtract and detect the distance to the measurement object based on the received light spot signal after subtraction. Furthermore, the present inventors approximate (numerize) the intensity distribution of the reflected light of the protective cover in order to reduce the amount of memory mounted, and correct the light reception spot using the intensity distribution obtained from the approximate expression. Has also proposed. In addition, the method for obtaining the intensity distribution of the two parties needs to detect the light reception signal of only the reflected light from the protective cover in the state of infinity, as in Patent Document 2.

特開平9−229671号公報JP-A-9-229671 特開2000−314835号公報JP 2000-314835 A 特開2011−117940号公報JP 2011-117940 A

しかしながら、特許文献1および特許文献2の光学式測距装置は、受光素子で検出される受光強度で用いるため、保護カバーによる反射光が受光素子上で一様な強度で分布する場合にのみ限られる。さらに、特許文献1は、保護カバーによる反射受光量が大きいときは無限遠に出力を訂正するかパッシブ測距に切り替える処理を行っており、アクティブ型の測距装置単体で保護カバーがある場合の高精度は距離測定を行うことはできない。特許文献2、3は、それぞれ、保護カバーによる反射光量および保護カバーによる反射光の強度分布をメモリに記憶させて、記憶された情報を受光信号から減算することにより、測距装置前面に保護カバーがある場合でも高精度の距離測定ができる技術である。どちらの技術も、減算する情報(反射光量、反射光の強度分布)を予め無限遠等の状態で保護カバーを透過した光が受光部に入射しない環境で測定し、メモリへ記憶させるステップを必要とする。このため、特許文献2、3では、測距装置の使いやすさの点で問題があった。   However, since the optical distance measuring devices of Patent Document 1 and Patent Document 2 are used with the received light intensity detected by the light receiving element, they are limited only when the reflected light from the protective cover is distributed with a uniform intensity on the light receiving element. It is done. Furthermore, Patent Document 1 performs a process of correcting the output to infinity or switching to passive distance measurement when the amount of reflected light received by the protective cover is large, and when the active type distance measuring device has a protective cover alone. High accuracy cannot measure distance. In Patent Documents 2 and 3, the amount of light reflected by the protective cover and the intensity distribution of the reflected light by the protective cover are stored in a memory, and the stored information is subtracted from the received light signal, thereby providing a protective cover on the front surface of the distance measuring device. This is a technology that can measure the distance with high accuracy even when Both technologies require a step of measuring the information to be subtracted (the amount of reflected light and the intensity distribution of the reflected light) in an environment where the light that has passed through the protective cover in advance is not incident on the light receiving part and stored in the memory. And For this reason, Patent Documents 2 and 3 have a problem in terms of ease of use of the distance measuring device.

本発明は、上記のような課題をかんがみてなされたものであり、測距装置前面に保護カバーが設置された場合において特別な測定環境を必要とせず簡便に保護カバーで反射し、受光素子で検出される信号(ノイズ)を補正することができる高精度の光学式測距装置を提供するものである。   The present invention has been made in view of the above problems, and when a protective cover is installed on the front surface of the distance measuring device, it is easily reflected by the protective cover without requiring a special measurement environment. It is an object of the present invention to provide a highly accurate optical distance measuring device that can correct a detected signal (noise).

本発明の光学式測距装置は、発光素子と、該発光素子から発光される光束を集束して、測定対象物にスポット光を照射する発光光学系と、上記測定対象物からの反射光を集光する受光光学系と、上記受光光学系により集光された上記測定対象物からのスポット光を検出する受光素子と、上記受光素子からの受光信号を処理する信号処理部とを備え、上記受光素子は、上記測定対象物からの反射光の強度分布を検出するラインセンサまたはエリアセンサであり、上記信号処理部は、上記受光光学系により集光されたスポット光の上記受光素子上のスポット位置を演算し、該スポット位置から上記測定対象物までの距離を検出する距離演算部と、上記発光光学系および上記受光光学系と、上記測定対象物との間に配置された透光性の保護カバーにより反射された光が上記受光光学系を介して上記受光素子で検出されるカバー反射光の強度分布を検出して上記距離の演算を補正する補正演算部とを有し、上記補正演算部は、上記受光素子の両端の少なくとも一方の一部領域の強度分布から上記カバー反射光の強度分布に対応する補正係数を演算して、上記スポット光の強度分布を補正し、上記補正演算部の出力に基づいて上記距離演算部は上記測定対象物までの上記距離を演算することを特徴としている。   The optical distance measuring device of the present invention includes a light emitting element, a light emitting optical system that focuses a light beam emitted from the light emitting element, and irradiates a measuring object with spot light, and a reflected light from the measuring object. A light receiving optical system for condensing, a light receiving element for detecting spot light from the measurement object collected by the light receiving optical system, and a signal processing unit for processing a light reception signal from the light receiving element, The light receiving element is a line sensor or an area sensor that detects an intensity distribution of reflected light from the measurement object, and the signal processing unit is configured to spot the spot light collected by the light receiving optical system on the light receiving element. A distance calculating unit that calculates a position and detects a distance from the spot position to the measurement target, the light emitting optical system, the light receiving optical system, and a translucent element disposed between the measurement target. Protective cover And a correction calculation unit that corrects the calculation of the distance by detecting the intensity distribution of the cover reflected light detected by the light receiving element via the light receiving optical system, and the correction calculation unit includes: The correction coefficient corresponding to the intensity distribution of the cover reflected light is calculated from the intensity distribution of at least one partial region at both ends of the light receiving element, the intensity distribution of the spot light is corrected, and the output of the correction calculation unit Based on the above, the distance calculation unit calculates the distance to the measurement object.

また、一実施形態の測距装置では、上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布から上記カバー反射光の強度分布を直線近似して上記補正係数を演算することを特徴とする。   In one embodiment, the correction calculation unit calculates the correction coefficient by linearly approximating the intensity distribution of the cover reflected light from the intensity distribution of the partial area at both ends of the light receiving element. It is characterized by.

また、一実施形態の測距装置では、上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布を用いて最小二乗法により直線近似を行うことを特徴とする。   In the distance measuring apparatus according to an embodiment, the correction calculation unit performs linear approximation by a least square method using intensity distributions of the partial regions at both ends of the light receiving element.

また、一実施形態の測距装置では、上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布を用いて、一端の強度分布の平均値ともう一端の強度分布の平均値から直線近似を行うことを特徴とする。   Further, in the distance measuring apparatus according to one embodiment, the correction calculation unit uses the intensity distribution of the partial area at both ends of the light receiving element to calculate the average value of the intensity distribution at one end and the average value of the intensity distribution at the other end. A linear approximation is performed from the above.

また、一実施形態の測距装置では、上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布についてそれぞれ最小二乗法による直線近似を行い、上記両端の傾きの差が予め定められた閾値より大きい場合、上記受光素子のいずれか一端の強度分布で補正係数を演算し、いずれか一端の相関係数が予め定められた閾値より大きい場合は、もう一端の強度分布で補正係数を演算する、ことを特徴とする。   Further, in the distance measuring apparatus according to an embodiment, the correction calculation unit performs linear approximation by least square method for the intensity distribution of the partial region at both ends of the light receiving element, and a difference in inclination between the both ends is determined in advance. If the correlation coefficient at one end of the light receiving element is greater than a predetermined threshold, the correction coefficient is calculated with the intensity distribution at the other end. Is calculated.

本発明の光学式測距装置は、測定対象物と保護カバーの両者から反射し受光素子で検出されるスポット光の強度分布を検出し、受光素子の少なくとも一方の端部の強度分布から補正係数を演算して上記保護カバーの反射による強度分布を補正する。このため、上記測距装置は、保護カバーの反射光の補正に必要な情報を測定対象物までの距離測定を行いながら行うことができ、無限遠等の特別な測定環境で上記情報をメモリに記憶させる必要がない。このため、上記測距装置は、簡便に測定対象物までの距離測定を行うことができる。また、上記測距装置は、補正する保護カバーの反射光の情報を記憶するメモリも必要としないため、信号処理回路(信号処理部)を小規模にできる上、予めその情報を記憶させる工程も必要としない。このため、安価な光学式測距装置を提供することができる。   The optical distance measuring device of the present invention detects the intensity distribution of the spot light reflected from both the measurement object and the protective cover and detected by the light receiving element, and corrects the correction coefficient from the intensity distribution of at least one end of the light receiving element. Is calculated to correct the intensity distribution due to the reflection of the protective cover. Therefore, the distance measuring device can perform information necessary for correcting the reflected light of the protective cover while measuring the distance to the measurement object, and stores the information in a memory in a special measurement environment such as infinity. There is no need to remember. Therefore, the distance measuring device can easily measure the distance to the measurement object. Further, since the distance measuring device does not require a memory for storing the information of the reflected light of the protective cover to be corrected, the signal processing circuit (signal processing unit) can be reduced in scale, and the step of storing the information in advance is also possible. do not need. For this reason, an inexpensive optical distance measuring device can be provided.

測定対象物と保護カバーの反射光が受光素子に入射する様子を説明する図である。It is a figure explaining a mode that the reflected light of a measuring object and a protective cover injects into a light receiving element. 測定対象物と保護カバーの両反射光により受光素子で検出される強度分布を示す図である。It is a figure which shows intensity distribution detected with a light receiving element by both the reflected light of a measurement object and a protective cover. 保護カバーのみの反射光の強度分布とその直線近似を示す図である。It is a figure which shows intensity distribution of the reflected light of a protective cover only, and its linear approximation. 図2から図3を減算して得られる測定対象物のみの反射光による強度分布演算結果である。It is the intensity distribution calculation result by the reflected light of only the measuring object obtained by subtracting FIG. 3 from FIG. 光学式測距装置およびその組み付けばらつきによる補正係数のばらつきを示す図である。It is a figure which shows the dispersion | variation in the correction coefficient by an optical distance measuring device and its assembly | attachment dispersion | variation. 本発明の光学式測距装置のブロック図を示す図である。It is a figure which shows the block diagram of the optical distance measuring device of this invention. 本発明の光学式測距装置の保護カバー反射光の補正方法を示す図である。It is a figure which shows the correction method of the protective cover reflected light of the optical distance measuring device of this invention. 本発明の光学式測距装置の実施例1の補正方法を説明する図である。It is a figure explaining the correction method of Example 1 of the optical distance measuring device of the present invention. 本発明の光学式測距装置の実施例2の補正方法を説明する図である。It is a figure explaining the correction method of Example 2 of the optical distance measuring device of this invention. 本発明の光学式測距装置の実施例1の補正不具合を説明する図である。It is a figure explaining the correction malfunction of Example 1 of the optical distance measuring device of the present invention. 本発明の光学式測距装置の実施例3の補正不具合を回避する方法を説明する図である。It is a figure explaining the method of avoiding the correction malfunction of Example 3 of the optical ranging apparatus of this invention. 本発明の光学式測距装置の実施例3の補正不具合を回避する方法を説明する図である。It is a figure explaining the method of avoiding the correction malfunction of Example 3 of the optical ranging apparatus of this invention. 本発明の光学式測距装置の最適な受光領域を説明する図である。It is a figure explaining the optimal light-receiving area | region of the optical distance measuring device of this invention. 本発明の光学式測距装置を搭載する電子機器の一例を示す図である。It is a figure which shows an example of the electronic device carrying the optical distance measuring device of this invention. 光学式測距装置の原理を示す図である。It is a figure which shows the principle of an optical distance measuring device. 光学式測距装置に保護カバーが設置された状態の反射光を説明する図である。It is a figure explaining the reflected light of the state by which the protective cover was installed in the optical distance measuring device.

以下、本発明を図示の実施の形態により詳細に説明する。   Hereinafter, the present invention will be described in detail with reference to the illustrated embodiments.

図1は、光学式測距装置50の前面に保護カバー20が設置された状態で、測定対象物10からの反射光と保護カバー20からの反射光とが受光素子4へ入射する様子を説明する図である。破線は、測定対象物10からの反射光軸A1を示しており、実線は、保護カバー20からの反射光軸A2を示している。ここで、保護カバー20からの反射光軸は、実際には保護カバー20内部や測距装置50との多重反射(散乱)により複雑な軌跡を描く。図示される反射光軸A1は、多重反射の結果として受光素子4で検出される光軸を代表して示している。   FIG. 1 illustrates how reflected light from the measurement object 10 and reflected light from the protective cover 20 enter the light receiving element 4 with the protective cover 20 installed on the front surface of the optical distance measuring device 50. It is a figure to do. The broken line indicates the reflected optical axis A1 from the measurement object 10, and the solid line indicates the reflected optical axis A2 from the protective cover 20. Here, the reflected optical axis from the protective cover 20 actually draws a complicated locus due to multiple reflection (scattering) inside the protective cover 20 and the distance measuring device 50. The illustrated reflected optical axis A1 represents the optical axis detected by the light receiving element 4 as a result of multiple reflection.

測距装置50は、発光素子1、発光レンズ2、受光レンズ3、および受光素子4を備えている。発光素子1から出射された光は発光レンズ2により略平行光となり放出される。測距装置50の近くに配置された保護カバー20は、発光光束の波長に対して十分高い透過率を有している。発光光束の大部分は測定対象物10を照射する一方、保護カバー20の両面20a、20bでわずかに反射する。十分離れた位置にある測定対象物10からの反射光は、保護カバー20を透過して受光レンズ3により集光されて受光素子4上に光スポットを形成する。保護カバー20で反射した光は、受光レンズ3で集光されて非常に大きい入射角を有して、受光素子4へと向かう。受光素子4の受光エリア8は測定対象物10の強度分布S10(図4、図13)を検出するために必要なサイズを有している。一方、図1に示すように、保護カバー20からの反射光は、その光スポットSの左側の裾部分のみが検出される。図1には理解の簡単のために、測距装置50の右側側壁がない状態で測距装置50の右外側に光スポットSが形成されている図を示している。実際は、測距装置50の側壁内部は十分低い反射率を有する樹脂等で形成されているため、散乱された光が受光素子4で検出される量は、極微小である。つまり、散乱された光の影響は無視できる。このため、保護カバー20による反射光の強度分布は、図1に示したものと同等である。   The distance measuring device 50 includes a light emitting element 1, a light emitting lens 2, a light receiving lens 3, and a light receiving element 4. The light emitted from the light emitting element 1 is emitted as substantially parallel light by the light emitting lens 2. The protective cover 20 disposed near the distance measuring device 50 has a sufficiently high transmittance with respect to the wavelength of the luminous flux. While most of the emitted light beam irradiates the measurement object 10, it is slightly reflected on both surfaces 20a and 20b of the protective cover 20. Reflected light from the measurement object 10 at a sufficiently distant position passes through the protective cover 20 and is collected by the light receiving lens 3 to form a light spot on the light receiving element 4. The light reflected by the protective cover 20 is collected by the light receiving lens 3 and travels toward the light receiving element 4 with a very large incident angle. The light receiving area 8 of the light receiving element 4 has a size necessary for detecting the intensity distribution S10 (FIGS. 4 and 13) of the measurement object 10. On the other hand, as shown in FIG. 1, the reflected light from the protective cover 20 is detected only at the skirt on the left side of the light spot S. For easy understanding, FIG. 1 shows a diagram in which a light spot S is formed on the right outer side of the distance measuring device 50 without the right side wall of the distance measuring device 50. Actually, since the inside of the side wall of the distance measuring device 50 is formed of a resin having a sufficiently low reflectance, the amount of scattered light detected by the light receiving element 4 is extremely small. That is, the influence of scattered light can be ignored. For this reason, the intensity distribution of the reflected light by the protective cover 20 is equivalent to that shown in FIG.

図2は、このような状態において、受光素子4で検出される光スポットの強度分布(反射光プロファイル)S0を示している。図2のx軸は受光素子4の座標であり、図1で発光素子1と受光素子4が並ぶ方向と同じ方向である。x軸項目にイメージセンサの画素座標と記載されている。受光素子4は、2次元の画素を有するイメージセンサに限定されるものではなく、x軸のみに複数の画素が配列されたラインセンサであっても問題ない。以降、この説明は省略する。y軸は各画素に入射する光強度を表しており、受光素子4で検出される受光強度に相当する。図2に示すように、測定対象物10の反射光F1と保護カバー20からの反射光(カバー反射光F2)との両方の強度分布S0は、一様な右上がりの形状を有するカバー反射光F2の強度分布S20に、ガウス形状を有する測定対象物10の強度分布S10(図4)が加算された形状となる。ここで、保護カバー20の反射光による一様な右上がりの強度分布S20とは、図1で説明したように、光スポットSの裾部を示している。このような強度分布S0から光スポット位置(重心)を求めると、保護カバー20の反射光による右上がりの強度分布S20が加算されているので、光スポット位置は、測定対象物10の強度分布S10による重心位置より右側(+x側)にシフトされて検出されてしまう。したがってこのシフト量に相当する分だけ、測距精度が低下してしまう。   FIG. 2 shows the intensity distribution (reflected light profile) S0 of the light spot detected by the light receiving element 4 in such a state. The x-axis in FIG. 2 is the coordinates of the light receiving element 4, and is the same direction as the direction in which the light emitting element 1 and the light receiving element 4 are arranged in FIG. The pixel coordinate of the image sensor is described in the x-axis item. The light receiving element 4 is not limited to an image sensor having a two-dimensional pixel, and there is no problem even if it is a line sensor in which a plurality of pixels are arranged only on the x axis. Hereinafter, this description is omitted. The y-axis represents the light intensity incident on each pixel, and corresponds to the received light intensity detected by the light receiving element 4. As shown in FIG. 2, the intensity distribution S0 of both the reflected light F1 of the measurement object 10 and the reflected light from the protective cover 20 (cover reflected light F2) is a cover reflected light having a uniform right-up shape. The intensity distribution S20 of F2 is added to the intensity distribution S10 (FIG. 4) of the measurement object 10 having a Gaussian shape. Here, the uniform right-upward intensity distribution S20 due to the reflected light of the protective cover 20 indicates the skirt of the light spot S as described in FIG. When the light spot position (center of gravity) is obtained from such an intensity distribution S0, the intensity distribution S20 that rises to the right due to the reflected light of the protective cover 20 is added, so the light spot position is the intensity distribution S10 of the measurement object 10. Will be detected by shifting to the right side (+ x side) from the center of gravity position. Therefore, the distance measurement accuracy is reduced by an amount corresponding to the shift amount.

本発明者らは特許文献3で保護カバーの反射の影響を低減する方法について提案しているが、この方法を簡単に説明する。図3は、保護カバー20のみの強度分布S20とそれを直線近似した図である。この直線近似の傾きkを補正係数とすると、この補正係数は、保護カバー20の強度分布S20に対応している。補正係数を予め測定対象物10がない(無限縁)状態で測定し、図2の強度分布S0から、直線近似された保護カバー20の強度分布S20を減算することによって、図4に示すような測定対象物10の反射光F1の強度分布S10が得られる。このため、特許文献3の方法は、測距精度の低下を防止できる。光学式測距装置の製造過程において、発光素子、受光素子、発光レンズ、受光素子の位置関係には多少のばらつきが含まれている。さらに光学式測距装置と保護カバーの位置関係、例えばカバーまでの距離やカバーの傾きなどにも、ばらつきが含まれている。このため、図5に示すように実際には、補正係数は、個体ばらつきを有する。固定値:kを用いて補正を行った場合、測距精度は補正係数のばらつきに相当する量だけ低下する。測距装置50の個々に補正係数を設定するには、その測定に時間を要する上、それを記憶するメモリが必要となる。   The present inventors have proposed a method for reducing the influence of reflection of the protective cover in Patent Document 3, and this method will be briefly described. FIG. 3 is a diagram showing the intensity distribution S20 of only the protective cover 20 and a linear approximation thereof. If the slope k of this linear approximation is a correction coefficient, this correction coefficient corresponds to the intensity distribution S20 of the protective cover 20. The correction coefficient is measured in advance in the absence of the measurement object 10 (infinite edge), and the intensity distribution S20 of the protective cover 20 that is linearly approximated is subtracted from the intensity distribution S0 in FIG. An intensity distribution S10 of the reflected light F1 of the measurement object 10 is obtained. For this reason, the method of patent document 3 can prevent the fall of ranging accuracy. In the manufacturing process of the optical distance measuring device, the positional relationship among the light emitting element, the light receiving element, the light emitting lens, and the light receiving element includes some variation. Further, the positional relationship between the optical distance measuring device and the protective cover, for example, the distance to the cover and the inclination of the cover also includes variations. For this reason, as shown in FIG. 5, the correction coefficient actually has individual variations. When correction is performed using a fixed value: k, the distance measurement accuracy decreases by an amount corresponding to the variation of the correction coefficient. In order to set the correction coefficient for each distance measuring device 50, it takes time for the measurement, and a memory for storing it is required.

図6は、本発明の実施例1−3の構成を説明するブロック図である。測距装置50は、受光素子4からの受光信号を処理する信号処理部5を備えている。信号処理部5は、補正演算部6および距離演算部7を備えている。発光素子1から出射した発光光束F0は、測定対象物10および保護カバー20でそれぞれ反射して、測定対象物10の反射光F1および保護カバー20からの反射光(カバー反射光F2)となり、反射光F1およびカバー反射光F2は受光素子4に入射する。受光素子4で検出される強度分布S0は、信号処理部5の補正演算部6で補正係数が求められた後に、測定対象物10の強度分布S10に補正される。補正された強度分布S10から光スポット位置が算出されて、原点(発光レンズ2の位置)から測定対象物10までの距離Yが検出される。ここで、特許文献3の信号処理部に搭載されている補正係数を記憶するメモリは、本実施例では搭載されていない。図7は、図6の構成により受光素子4で検出される強度分布を示している。A部8aおよびB部8bは、受光素子4(受光エリア8)の両端の2つの一部領域を示している。A部8aは、x軸値の小さい発光素子1側の受光素子4の一部領域であり、B部8bは、x軸値の大きい側の受光素子4の一部領域である。A部8aおよびB部8bには測定対象物10の反射光F1はほとんど入射しないため、A部8aおよびB部8bの強度分布において、カバー反射光F2が支配的になる。このA部8aとB部8bの強度分布SA、SBを用いて、補正演算部6にて、カバー反射光F2の強度分布に対応する補正係数が求められる。この補正係数に基づいて、保護カバー20の強度分布S20を含む強度分布S0を補正することにより、測定対象物10の反射光F1の強度分布S10が得られる。距離演算部7は、補正演算部6の出力(補正係数)に基づいて、常にカバー反射光F2をリアルタイムで検出、補正しながら、光スポット位置を演算し、測定対象物までの距離Yを演算する。このため、測距装置50は、補正係数を記憶するメモリも必要とせず、さらに製品個々のばらつきや保護カバー20の組み立てばらつきにも対応した距離測定を行うことができる。   FIG. 6 is a block diagram illustrating the configuration of the embodiment 1-3 of the present invention. The distance measuring device 50 includes a signal processing unit 5 that processes a light reception signal from the light receiving element 4. The signal processing unit 5 includes a correction calculation unit 6 and a distance calculation unit 7. The luminous flux F0 emitted from the light emitting element 1 is reflected by the measurement object 10 and the protective cover 20, respectively, and becomes reflected light F1 of the measurement object 10 and reflected light from the protective cover 20 (cover reflected light F2). The light F1 and the cover reflected light F2 enter the light receiving element 4. The intensity distribution S0 detected by the light receiving element 4 is corrected to the intensity distribution S10 of the measurement object 10 after the correction coefficient is obtained by the correction calculation unit 6 of the signal processing unit 5. The light spot position is calculated from the corrected intensity distribution S10, and the distance Y from the origin (position of the light emitting lens 2) to the measurement object 10 is detected. Here, the memory for storing the correction coefficient mounted in the signal processing unit of Patent Document 3 is not mounted in this embodiment. FIG. 7 shows an intensity distribution detected by the light receiving element 4 with the configuration of FIG. A part 8a and B part 8b show two partial regions at both ends of the light receiving element 4 (light receiving area 8). The A portion 8a is a partial region of the light receiving element 4 on the light emitting element 1 side having a small x-axis value, and the B portion 8b is a partial region of the light receiving element 4 on the side having a large x-axis value. Since the reflected light F1 of the measurement object 10 hardly enters the A part 8a and the B part 8b, the cover reflected light F2 becomes dominant in the intensity distribution of the A part 8a and the B part 8b. Using the intensity distributions SA and SB of the A portion 8a and the B portion 8b, the correction calculation unit 6 obtains a correction coefficient corresponding to the intensity distribution of the cover reflected light F2. By correcting the intensity distribution S0 including the intensity distribution S20 of the protective cover 20 based on this correction coefficient, the intensity distribution S10 of the reflected light F1 of the measurement object 10 is obtained. The distance calculation unit 7 calculates the light spot position and calculates the distance Y to the measurement object while always detecting and correcting the cover reflected light F2 in real time based on the output (correction coefficient) of the correction calculation unit 6. To do. For this reason, the distance measuring device 50 does not require a memory for storing the correction coefficient, and can perform distance measurement corresponding to variations among products and assembly variations of the protective cover 20.

図8は、実施例1の補正係数の最適な演算方法を説明する図である。実線(細)は、A部8aおよびB部8bのカバー反射光F2の強度分布SA、SBを示しており、破線は、測定対象物10および保護カバー20の強度分布S0を示している。実線(太)は、A部8aとB部8bの間の中央部における強度分布を除いて、受光素子4の一端のA部8aともう一端のB部8bの強度分布SA、SBを用いて、直線近似を行った直線C1を示している。補正係数は、この直線C1の傾きとして与えられる。この方法により、保護カバー20による反射光F2の強度分布S20を精度よく近似することができる。また、直線近似は、近似の精度の観点からA部8aとB部8bの強度分布SA、SBを用いて、最小二乗法を用いるのが好適である。   FIG. 8 is a diagram for explaining an optimal calculation method of the correction coefficient according to the first embodiment. Solid lines (thin lines) indicate the intensity distributions SA and SB of the cover reflected light F2 of the A part 8a and the B part 8b, and broken lines indicate the intensity distributions S0 of the measurement object 10 and the protective cover 20. Solid lines (thick lines) use the intensity distributions SA and SB of the A part 8a at one end of the light receiving element 4 and the B part 8b at the other end, excluding the intensity distribution in the central part between the A part 8a and the B part 8b. The straight line C1 which performed the linear approximation is shown. The correction coefficient is given as the slope of this straight line C1. By this method, the intensity distribution S20 of the reflected light F2 from the protective cover 20 can be accurately approximated. Further, in the linear approximation, it is preferable to use the least square method by using the intensity distributions SA and SB of the A part 8a and the B part 8b from the viewpoint of accuracy of approximation.

図9は、実施例2の補正係数の演算方法を説明する図である。A部8aの全強度分布SAの平均点をA点Paとし、B部8bの全強度分布の平均点をB点Pbとして、AB点を結ぶ直線C2から補正係数を求めることもできる。この場合、上記の最小二乗法に比べて計算を簡略化することができるため、補正演算部6の回路規模を小さくすることができる。   FIG. 9 is a diagram illustrating a correction coefficient calculation method according to the second embodiment. It is also possible to obtain a correction coefficient from a straight line C2 connecting the AB points, where the average point of the total intensity distribution SA of the A portion 8a is A point Pa and the average point of the total intensity distribution of the B portion 8b is B point Pb. In this case, since the calculation can be simplified as compared with the above least square method, the circuit scale of the correction calculation unit 6 can be reduced.

直線近似に最小二乗法を用いる場合、補正演算における不具合の有無を検証し、不具合がある場合はエラー判定により距離出力を調整することができる。図10は、保護カバー20が測距装置50から離れた距離に配置された場合の測定対象物10の反射光F1およびカバー反射光F2を合わせた強度分布S0を示す図である。図10の強度分布S0は、B部8bの右端が持ち上がった形状を有している。これは、保護カバー20が測距装置50から離れた位置に配置されることによる。保護カバー20が離れるにつれて、カバー反射光F2の入射角が小さくなる。それに伴って、図1で示した保護カバー20の反射による受光スポット(強度分布S0の範囲)が、相対的に左側にシフトし、B部8bの右端が持ち上がる。また、保護カバー20の厚さが大きい場合も同様にカバー反射光F2の入射角が小さくなるので、同様にB部8bの右端が持ち上がる。このような場合、図10の実線(太)で示すように、最小二乗法で検出される直線C2は実際の強度分布を反映しておらず、破線で示した本来の直線近似されるべき直線C21から、ズレを生じてしまう。このような補正状態から検出される測距値は大きな誤差を含む可能性がある。このため、最小二乗法の演算で求められる相関係数Rが予め定められた閾値以下の時は、補正不具合状態として測距値の出力をエラー信号(例えば距離出力値の最大値)に固定することにより、測距精度の低下を防止することができる。 When the least square method is used for the linear approximation, it is possible to verify whether there is a defect in the correction calculation, and if there is a defect, the distance output can be adjusted by error determination. FIG. 10 is a diagram illustrating an intensity distribution S0 obtained by combining the reflected light F1 and the cover reflected light F2 of the measurement object 10 when the protective cover 20 is disposed at a distance away from the distance measuring device 50. The intensity distribution S0 in FIG. 10 has a shape in which the right end of the B portion 8b is raised. This is because the protective cover 20 is disposed at a position away from the distance measuring device 50. As the protective cover 20 moves away, the incident angle of the cover reflected light F2 decreases. Along with this, the light receiving spot (range of intensity distribution S0) due to the reflection of the protective cover 20 shown in FIG. 1 is relatively shifted to the left side, and the right end of the B portion 8b is lifted. In addition, when the thickness of the protective cover 20 is large, the incident angle of the cover reflected light F2 is similarly reduced, so that the right end of the B portion 8b is similarly lifted. In such a case, as indicated by the solid line (thick line) in FIG. 10, the straight line C2 detected by the least square method does not reflect the actual intensity distribution, and is a straight line that should be approximated by the original straight line indicated by the broken line. Deviation occurs from C21. A distance measurement value detected from such a correction state may include a large error. Therefore, the minimum time correlation coefficient R 2 obtained by the calculation of squares is less than or equal to the threshold which is determined in advance, fixed to the error signal output of the distance measurement value as a correction failure state (for example, the maximum value of the distance output value) By doing so, it is possible to prevent a decrease in distance measurement accuracy.

図11および図12は、実施例3の補正係数の演算方法を説明する図である。図11は、B部8bの強度分布SBが一様でない場合を示す図である。図12は、測定対象物10が至近距離にある時の強度分布を示す図である。図11の強度分布S0は、例えば、測定対象物10上に反射率の異なる領域が存在する場合などにおいて得られる可能性がある。図12に示すように、測定対象物10が測距装置50の至近距離にある場合はその反射光F1の入射角が大きくなるため、その光スポットSの右側の裾はB部8bに侵入するようになる。図11および図12の両方とも、A部8aのみの強度分布SAの直線近似の傾きk(A)は、B部8bのみの強度分布SAの直線近似の傾きk(B)と異なっている。このような場合はA部8aとB部8bの両者を用いて補正係数を演算すると、距離測定値の誤差が大きくなる。A部8aとB部8bのそれぞれにおいて直線近似を行うことにより、A部8aとB部8bの傾きk(A)、k(B)が得られる。測距精度の低下を防止するために、次のような補正が行われる。A部8aとB部8bの傾きk(A)、k(B)の差が予め定められた閾値以上の時には、A部8aのみの直線CAの傾きで補正が実行される。A部8aとB部8bの相関係数R(A)、R(B)を計算して一端(例えばA部8a)の相関係数が予め定められた閾値以上であった場合は、もう一端(例えばB部8b)の直線近似の傾きを用いて補正が実行される。当然、傾きと相関係数の両者を用いて、演算が行われてもよい。 11 and 12 are diagrams for explaining a correction coefficient calculation method according to the third embodiment. FIG. 11 is a diagram illustrating a case where the intensity distribution SB of the B portion 8b is not uniform. FIG. 12 is a diagram showing an intensity distribution when the measurement object 10 is at a close distance. The intensity distribution S0 in FIG. 11 may be obtained, for example, when there are regions with different reflectivities on the measurement object 10. As shown in FIG. 12, when the measurement object 10 is at a close distance of the distance measuring device 50, the incident angle of the reflected light F1 becomes large, so that the right hem of the light spot S enters the B portion 8b. It becomes like this. In both FIGS. 11 and 12, the slope k (A) of the linear approximation of the intensity distribution SA of only the A portion 8a is different from the slope k (B) of the linear approximation of the intensity distribution SA of only the B portion 8b. In such a case, if the correction coefficient is calculated using both the A portion 8a and the B portion 8b, the error of the distance measurement value increases. By performing linear approximation in each of the A portion 8a and the B portion 8b, the slopes k (A) and k (B) of the A portion 8a and the B portion 8b are obtained. In order to prevent a decrease in distance measurement accuracy, the following correction is performed. When the difference between the slopes k (A) and k (B) of the A portion 8a and the B portion 8b is equal to or greater than a predetermined threshold value, correction is executed with the slope of the straight line CA of only the A portion 8a. When the correlation coefficients R 2 (A) and R 2 (B) of the A part 8a and the B part 8b are calculated and the correlation coefficient at one end (for example, the A part 8a) is equal to or greater than a predetermined threshold, Correction is executed using the linear approximation slope of the other end (for example, the B portion 8b). Naturally, the calculation may be performed using both the slope and the correlation coefficient.

図13は、上記実施例1から実施例3に記載の各補正方法における受光素子4のサイズを説明する図である。図13は、光学式測距装置50の測距範囲の最小値と最大値における測定対象物10の反射光F1の強度分布S10S、S10Lを示している。白抜き領域の強度分布S10Lが測距範囲の最大値の測定対象物10からの反射光である。ハッチング領域の強度分布S10Sが測距範囲の最小値の測定対象物10からの反射光である。受光素子4の受光領域4aの幅は図13のように、測距範囲の最大値の測定対象物10が形成する強度分布S10Lより左端にA部8aとなる領域が十分あり、測距範囲の最小値の測定対象物10が形成する強度分布S10Sより右端にB部8bとなる領域が十分あることが、好ましい。これらの領域を十分確保することにより、精度よく距離演算の補正を行うことができる。   FIG. 13 is a diagram for explaining the size of the light receiving element 4 in each correction method described in the first to third embodiments. FIG. 13 shows intensity distributions S10S and S10L of the reflected light F1 of the measurement object 10 at the minimum value and the maximum value of the distance measurement range of the optical distance measuring device 50. The intensity distribution S10L in the white area is the reflected light from the measurement object 10 having the maximum value in the distance measurement range. The intensity distribution S10S in the hatching area is reflected light from the measurement object 10 having the minimum value in the distance measurement range. As shown in FIG. 13, the width of the light receiving area 4a of the light receiving element 4 has a sufficient area to be the A portion 8a at the left end of the intensity distribution S10L formed by the measurement object 10 having the maximum value in the distance measuring range. It is preferable that there is a sufficient area to be the B portion 8b at the right end from the intensity distribution S10S formed by the measurement object 10 having the minimum value. By securing these areas sufficiently, the distance calculation can be corrected with high accuracy.

図14は、測距装置50が搭載されたパソコン200を示す図である。パソコン(電子機器)200は、カバー反射光F2をリアルタイムに補正する補正機能を搭載し、個々のばらつきを含めて補正することができる。このため、パソコン200は、パソコン200の前に人300がいるかいないかを正確に検知して、人300がいなくなるとパソコン200をスリープモードにすることができる。これによって、省エネルギー化を効率よく行うことが可能となる。また、光学式測距装置50が自走式掃除機に搭載されれば、障害物や段差を検知できる。光学式測距装置50がキッチン家電に搭載されれば、非接触で動作をON/OFFさせる非接触スイッチとして利用できる。また、光学式測距装置50は、手までの距離を検知してアミューズメント機器など様々なボリュームコントロールを行うなど、電子機器の操作に好適である。   FIG. 14 is a diagram showing a personal computer 200 on which the distance measuring device 50 is mounted. The personal computer (electronic device) 200 is equipped with a correction function for correcting the cover reflected light F2 in real time, and can be corrected including individual variations. For this reason, the personal computer 200 can accurately detect whether or not the person 300 is present in front of the personal computer 200, and can put the personal computer 200 in the sleep mode when the person 300 disappears. This makes it possible to save energy efficiently. Further, if the optical distance measuring device 50 is mounted on a self-propelled cleaner, obstacles and steps can be detected. If the optical distance measuring device 50 is mounted on a kitchen appliance, it can be used as a non-contact switch that turns the operation on and off in a non-contact manner. In addition, the optical distance measuring device 50 is suitable for the operation of electronic devices such as detecting the distance to the hand and performing various volume controls such as an amusement device.

本発明の光学式測距装置50は、発光素子1と、該発光素子1から発光される光束を集束して、測定対象物10にスポット光を照射する発光光学系(発光レンズ2)と、上記測定対象物10からの反射光を集光する受光光学系(受光レンズ3)と、上記受光光学系により集光された上記測定対象物10からのスポット光を検出する受光素子4と、上記受光素子4からの受光信号を処理する信号処理部5とを備え、上記受光素子4は、上記測定対象物10からの反射光の強度分布S0を検出するラインセンサまたはエリアセンサであり、上記信号処理部は、上記受光光学系により集光された上記スポット光の上記受光素子4上のスポット位置を演算し、該スポット位置から上記測定対象物10までの距離Yを検出する距離演算部7と、上記発光光学系および上記受光光学系と、上記測定対象物10との間に配置された透光性の保護カバー20により反射された光が上記受光光学系を介して上記受光素子4で検出されるカバー反射光F2の強度分布を検出して上記距離Yの演算を補正する補正演算部6とを有し、上記補正演算部6は、上記受光素子4の両端の少なくとも一方の一部領域の強度分布SA(SB)から上記カバー反射光F2の強度分布S20に対応する補正係数を演算して、上記スポット光の強度分布S0を補正し、上記補正演算部6の出力に基づいて上記距離演算部7は上記測定対象物10までの上記距離Yを演算することを特徴とする。   The optical distance measuring device 50 according to the present invention includes a light emitting element 1, a light emitting optical system (light emitting lens 2) that focuses a light beam emitted from the light emitting element 1 and irradiates spot light on the measurement target 10. A light receiving optical system (light receiving lens 3) that collects reflected light from the measurement object 10, a light receiving element 4 that detects spot light from the measurement object 10 collected by the light receiving optical system, and the above A signal processing unit 5 that processes a light reception signal from the light receiving element 4, and the light receiving element 4 is a line sensor or an area sensor that detects an intensity distribution S0 of reflected light from the measurement object 10, and the signal The processing unit calculates a spot position on the light receiving element 4 of the spot light collected by the light receiving optical system, and detects a distance Y from the spot position to the measurement object 10; , Above luminescence Cover in which the light reflected by the translucent protective cover 20 disposed between the optical system and the light receiving optical system and the measurement object 10 is detected by the light receiving element 4 through the light receiving optical system. A correction calculation unit 6 that detects the intensity distribution of the reflected light F2 and corrects the calculation of the distance Y. The correction calculation unit 6 is an intensity distribution of at least one partial region at both ends of the light receiving element 4. A correction coefficient corresponding to the intensity distribution S20 of the cover reflected light F2 is calculated from SA (SB) to correct the intensity distribution S0 of the spot light, and the distance calculation unit 7 is based on the output of the correction calculation unit 6. Calculates the distance Y to the measurement object 10.

上記構成の光学式測距装置50は、測定対象物10と保護カバー20の両者から反射し受光素子4で検出されるスポット光の強度分布S0を検出し、受光素子4の少なくとも一方の端部の強度分布SA(SB)から補正係数を演算して上記保護カバー20の反射による強度分布S20を補正する。このため、上記測距装置50は、カバー反射光F2の補正に必要な情報を測定対象物10までの距離測定を行いながら行うことができ、無限遠等の特別な測定環境で上記情報をメモリに記憶させる必要がない。このため、上記測距装置50は、簡便に測定対象物10までの距離測定を行うことができる。また、上記測距装置50は、補正するカバー反射光F2の情報を記憶するメモリも必要としないため、信号処理回路(信号処理部5)を小規模にできる上、予めその情報を記憶させる工程も必要としない。このため、安価な光学式測距装置50を提供することができる。   The optical distance measuring device 50 configured as described above detects the intensity distribution S0 of the spot light reflected from both the measurement object 10 and the protective cover 20 and detected by the light receiving element 4, and at least one end of the light receiving element 4. The correction coefficient is calculated from the intensity distribution SA (SB) of the above, and the intensity distribution S20 due to the reflection of the protective cover 20 is corrected. Therefore, the distance measuring device 50 can perform information necessary for correcting the cover reflected light F2 while measuring the distance to the measurement object 10, and stores the information in a special measurement environment such as infinity. There is no need to memorize. For this reason, the distance measuring apparatus 50 can easily measure the distance to the measurement object 10. Further, since the distance measuring device 50 does not require a memory for storing information of the cover reflected light F2 to be corrected, the signal processing circuit (signal processing unit 5) can be reduced in scale and the information is stored in advance. It is not necessary. Therefore, an inexpensive optical distance measuring device 50 can be provided.

また、一実施形態の測距装置50では、上記補正演算部6は、上記受光素子4の両端の上記一部領域の強度分布から上記カバー反射光の強度分布を直線近似して上記補正係数を演算することを特徴とする。   In the distance measuring device 50 according to an embodiment, the correction calculation unit 6 linearly approximates the intensity distribution of the cover reflected light from the intensity distribution of the partial area at both ends of the light receiving element 4 to obtain the correction coefficient. It is characterized by calculating.

上記構成の光学式測距装置50は、受光素子4の両端の一部領域8a、8bの強度分布SA、SBからカバー反射光F2の強度分布S20を直線近似して補正係数を演算する。このため、測定対象物10の反射光F1とカバー反射光F2を分離することなく、カバー反射光F2の強度分布S20を正確に近似することができる。このため、上記測距装置50は、簡便にカバー反射光F2を補正することが可能となる。   The optical distance measuring device 50 having the above configuration calculates a correction coefficient by linearly approximating the intensity distribution S20 of the cover reflected light F2 from the intensity distributions SA and SB of the partial areas 8a and 8b at both ends of the light receiving element 4. For this reason, the intensity distribution S20 of the cover reflected light F2 can be accurately approximated without separating the reflected light F1 and the cover reflected light F2 of the measurement object 10. For this reason, the distance measuring device 50 can easily correct the cover reflected light F2.

また、一実施形態の測距装置50では、上記補正演算部6は、上記受光素子4の両端の上記一部領域8a、8bの強度分布SA、SBを用いて最小二乗法により直線近似を行うことを特徴とする。   In the distance measuring device 50 according to an embodiment, the correction calculation unit 6 performs linear approximation by the least square method using the intensity distributions SA and SB of the partial regions 8a and 8b at both ends of the light receiving element 4. It is characterized by that.

上記構成の光学式測距装置50は、受光素子4の両端の一部領域8a、8Bの強度分布SA、SBを用いて最小二乗法により直線近似を行うので、カバー反射光F2の強度分布S20を最も正確に近似することができる。   The optical distance measuring device 50 configured as described above performs linear approximation by the least square method using the intensity distributions SA and SB of the partial regions 8a and 8B at both ends of the light receiving element 4, and thus the intensity distribution S20 of the cover reflected light F2 Can be approximated most accurately.

また、一実施形態の測距装置50では、上記最小二乗法による直線近似において相関係数が予め定められた閾値以下の時は、測定エラーが判定されることを特徴とする。   Further, the distance measuring device 50 according to an embodiment is characterized in that a measurement error is determined when the correlation coefficient is equal to or less than a predetermined threshold in the linear approximation by the least square method.

上記構成の光学式測距装置50では、上記最小二乗法による直線近似において相関係数が閾値以下の時は測定エラー判定とする機能を備えている。このため、上記測距装置50は、外乱光の影響や保護カバー20の汚れ、キズ等により受光素子4の端部に想定しない光が入射して誤った補正係数を算出することによる測距精度の低下を、防止することができる。また、保護カバー20と測距装置50の位置関係(例えば角度など)が振動や衝撃などにより変化して保護カバー20からの反射の状態が変化することにより、受光素子4の端部に想定しない光が入射するようになる場合も考えられる。上記測距装置50は、このようなケースの測距精度の低下も防止することが可能となる。   The optical distance measuring device 50 configured as described above has a function of determining a measurement error when the correlation coefficient is equal to or less than a threshold in the linear approximation by the least square method. For this reason, the distance measuring device 50 calculates distance correction accuracy by calculating an incorrect correction coefficient due to the incident of unintended light on the edge of the light receiving element 4 due to the influence of ambient light, dirt, scratches, etc. of the protective cover 20. Can be prevented. Further, the positional relationship (for example, an angle) between the protective cover 20 and the distance measuring device 50 changes due to vibration, impact, etc., and the state of reflection from the protective cover 20 changes, so that it is not assumed at the end of the light receiving element 4. There may be a case where light enters. The distance measuring device 50 can prevent such a decrease in distance measurement accuracy in the case.

また、一実施形態の測距装置50では、上記補正演算部6は、上記受光素子4の両端の上記一部領域8a、8bの強度分布SA、SBを用いて、一端の強度分布SA(SB)の平均値ともう一端の強度分布SB(SA)の平均値から直線近似を行うことを特徴とする。   In the distance measuring device 50 according to an embodiment, the correction calculation unit 6 uses the intensity distributions SA and SB of the partial regions 8a and 8b at both ends of the light receiving element 4 to use the intensity distribution SA (SB) at one end. ) And the average value of the intensity distribution SB (SA) at the other end are linearly approximated.

上記構成の光学式測距装置50は、受光素子4の一端の強度分布SA(SB)の平均値ともう一端の強度分布SB(SA)の平均値から直線近似を行うことにより補正係数を算出することも可能である。このため、上記測距装置50は、最小二乗法に比べて計算が簡便であるため信号処理回路(信号処理部5)の規模を小さくすることが可能である。   The optical distance measuring device 50 configured as described above calculates a correction coefficient by performing linear approximation from the average value of the intensity distribution SA (SB) at one end of the light receiving element 4 and the average value of the intensity distribution SB (SA) at the other end. It is also possible to do. For this reason, since the distance measuring device 50 is simpler to calculate than the least square method, the scale of the signal processing circuit (signal processing unit 5) can be reduced.

また、一実施形態の測距装置50では、上記受光素子4の受光エリア8は上記測定対象物10の反射光F1の強度分布S10より大きいことを特徴とする。   In the distance measuring device 50 according to an embodiment, the light receiving area 8 of the light receiving element 4 is larger than the intensity distribution S10 of the reflected light F1 of the measurement object 10.

上記構成の光学式測距装置50では、上記受光素子4の受光エリア8は測定対象物10の光スポット光サイズ(強度分布S10の範囲)よりも大きく、受光エリア8の両端が測定対象物10の光スポット光サイズの外側に位置している。このため、上記測距装置50は、カバー反射光F2の強度分布S20を精度よく近似することができる。   In the optical distance measuring device 50 having the above configuration, the light receiving area 8 of the light receiving element 4 is larger than the light spot light size (range of the intensity distribution S10) of the measurement object 10, and both ends of the light reception area 8 are at the measurement object 10. It is located outside the light spot size. For this reason, the distance measuring device 50 can accurately approximate the intensity distribution S20 of the cover reflected light F2.

また、一実施形態の測距装置50では、上記補正演算部6は、上記受光素子4の両端の上記一部領域8a、8bの強度分布SA、SBについてそれぞれ最小二乗法による直線近似を行い、上記両端の傾きk(A)、k(B)の差が予め定められた閾値より大きい場合、上記受光素子4のいずれか一端の強度分布SA(SB)で補正係数を演算し、いずれか一端の相関係数R(A)(R(B))が予め定められた閾値より大きい場合は、もう一端の強度分布SB(SA)で補正係数を演算する、ことを特徴とする。 In the distance measuring apparatus 50 according to an embodiment, the correction calculation unit 6 performs linear approximation by least square method for the intensity distributions SA and SB of the partial regions 8a and 8b at both ends of the light receiving element 4, When the difference between the inclinations k (A) and k (B) at both ends is larger than a predetermined threshold value, a correction coefficient is calculated from the intensity distribution SA (SB) at one end of the light receiving element 4, and either end When the correlation coefficient R 2 (A) (R 2 (B)) is greater than a predetermined threshold value, the correction coefficient is calculated from the intensity distribution SB (SA) at the other end.

上記構成の光学式測距装置50では、測定対象物10が至近距離にある場合は測定対象物10の反射光F1の強度分布S0は受光素子4の一端側に偏って分布する。測定対象物10の反射光F1のスポット光のテイル(裾)部の影響のため、強度分布S0は、曲線になる傾向にある。受光素子4の一端側の強度分布SB(SA)の最小二乗法による直線近似の相関係数が予め定められた閾値より差が大きい場合は、もう一方側の端部の強度分布SA(SB)のみで補正係数を算出する。カバー反射光F2による強度分布S20のみで補正を行うことができるため、上記測距装置50は、測距精度の低下を防止することができる。   In the optical distance measuring device 50 having the above configuration, when the measurement object 10 is at a close distance, the intensity distribution S0 of the reflected light F1 of the measurement object 10 is distributed to one end side of the light receiving element 4. The intensity distribution S0 tends to be a curve due to the influence of the tail portion of the spot light of the reflected light F1 of the measurement object 10. When the correlation coefficient of linear approximation by the least square method of the intensity distribution SB (SA) on one end side of the light receiving element 4 is larger than a predetermined threshold value, the intensity distribution SA (SB) on the other end side Only with this, the correction coefficient is calculated. Since the correction can be performed only with the intensity distribution S20 by the cover reflected light F2, the distance measuring device 50 can prevent a decrease in distance measurement accuracy.

また、一実施形態の電子機器(パソコン200)は、上記光学式測距装置50が搭載されたことを特徴とする。   Also, an electronic device (personal computer 200) according to an embodiment is characterized in that the optical distance measuring device 50 is mounted.

これらの保護カバーによる反射光の補正機能を有する光学式測距装置が、パソコンやサニタリ機器等に搭載されると、これらの電子機器は、人までの距離を検出して機器を制御できる。測距装置が自走式掃除機に搭載されると、電子機器は、障害物を検知したり段差を検知できる。また、測距装置は、非接触スイッチ、非接触コントローラとして、電子機器を制御するセンサとして使用されるのに好適である。   When an optical distance measuring device having a function of correcting reflected light by these protective covers is mounted on a personal computer or a sanitary device, these electronic devices can detect the distance to a person and control the device. When the distance measuring device is mounted on a self-propelled cleaner, the electronic device can detect an obstacle or a step. The distance measuring apparatus is suitable for use as a sensor for controlling an electronic device as a non-contact switch or a non-contact controller.

1 発光素子
2 発光光学系(発光レンズ)
3 受光光学系(受光レンズ)
4 受光素子
5 信号処理部
6 補正演算部
7 距離演算部
8 受光エリア
8a A部(一方の一部領域)
8b B部(他方の一部領域)
10 測定対象物
50 光学式測距装置
200 パソコン(電子機器)
F1 測定対象物からの反射光
F2 保護カバーからの反射光
S0 測定対象物の強度分布
S10 測定対象物の強度分布
S20 保護カバーの強度分布
SA A部の強度分布
SB B部の強度分布
DESCRIPTION OF SYMBOLS 1 Light emitting element 2 Light emission optical system (light emitting lens)
3 Light receiving optical system (light receiving lens)
4 Light Receiving Element 5 Signal Processing Unit 6 Correction Calculation Unit 7 Distance Calculation Unit 8 Light Receiving Area 8a A Part (One Partial Area)
8b B part (the other partial area)
10 Measurement object 50 Optical distance measuring device 200 Personal computer (electronic equipment)
F1 Reflected light from measurement object F2 Reflected light from protective cover S0 Measurement object intensity distribution S10 Measurement object intensity distribution S20 Protection cover intensity distribution SA A part intensity distribution SB B part intensity distribution

Claims (5)

発光素子と、
該発光素子から発光される光束を集束して、測定対象物にスポット光を照射する発光光学系と、
上記測定対象物からの反射光を集光する受光光学系と、
上記受光光学系により集光された上記測定対象物からのスポット光を検出する受光素子と、
上記受光素子からの受光信号を処理する信号処理部とを備え、
上記受光素子は、上記測定対象物からの反射光の強度分布を検出するラインセンサまたはエリアセンサであり、
上記信号処理部は、
上記受光光学系により集光されたスポット光の上記受光素子上のスポット位置を演算し、該スポット位置から上記測定対象物までの距離を検出する距離演算部と、
上記発光光学系および上記受光光学系と、上記測定対象物との間に配置された透光性の保護カバーにより反射された光が上記受光光学系を介して上記受光素子で検出されるカバー反射光の強度分布を検出して上記距離の演算を補正する補正演算部とを有し、
上記補正演算部は、上記受光素子の両端の少なくとも一方の一部領域の強度分布から上記カバー反射光の強度分布に対応する補正係数を演算して、上記スポット光の強度分布を補正し、
上記補正演算部の出力に基づいて上記距離演算部は上記測定対象物までの上記距離を演算することを特徴とする光学式測距装置。
A light emitting element;
A light-emitting optical system that focuses a light beam emitted from the light-emitting element and irradiates the measurement object with spot light; and
A light receiving optical system for collecting the reflected light from the measurement object;
A light receiving element for detecting spot light from the measurement object collected by the light receiving optical system;
A signal processing unit for processing a light reception signal from the light receiving element,
The light receiving element is a line sensor or an area sensor that detects an intensity distribution of reflected light from the measurement object,
The signal processor is
Calculating a spot position on the light receiving element of the spot light collected by the light receiving optical system, and detecting a distance from the spot position to the measurement object; and
Cover reflection in which light reflected by a translucent protective cover disposed between the light emitting optical system and the light receiving optical system and the measurement object is detected by the light receiving element via the light receiving optical system A correction calculation unit that detects the light intensity distribution and corrects the calculation of the distance,
The correction calculation unit calculates a correction coefficient corresponding to the intensity distribution of the cover reflected light from the intensity distribution of at least one partial region of both ends of the light receiving element to correct the intensity distribution of the spot light,
The optical distance measuring device, wherein the distance calculation unit calculates the distance to the measurement object based on an output of the correction calculation unit.
上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布から上記カバー反射光の強度分布を直線近似して上記補正係数を演算することを特徴とする請求項1に記載の光学式測距装置。   2. The optical according to claim 1, wherein the correction calculation unit calculates the correction coefficient by linearly approximating the intensity distribution of the cover reflected light from the intensity distribution of the partial region at both ends of the light receiving element. Type distance measuring device. 上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布を用いて最小二乗法により直線近似を行うことを特徴とする請求項2に記載の光学式測距装置。   The optical distance measuring device according to claim 2, wherein the correction calculation unit performs linear approximation by a least square method using intensity distributions of the partial regions at both ends of the light receiving element. 上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布を用いて、一端の強度分布の平均値ともう一端の強度分布の平均値から直線近似を行うことを特徴とする請求項2に記載の光学式測距装置。   The correction calculation unit performs linear approximation from the average value of the intensity distribution at one end and the average value of the intensity distribution at the other end using the intensity distribution of the partial region at both ends of the light receiving element. Item 3. The optical distance measuring device according to Item 2. 上記補正演算部は、上記受光素子の両端の上記一部領域の強度分布についてそれぞれ最小二乗法による直線近似を行い、
上記両端の傾きの差が予め定められた閾値より大きい場合、上記受光素子のいずれか一端の強度分布で補正係数を演算し、
いずれか一端の相関係数が予め定められた閾値より大きい場合は、もう一端の強度分布で補正係数を演算する、ことを特徴とする請求項3に記載の光学式測距装置。
The correction calculation unit performs linear approximation by least square method for the intensity distribution of the partial region at both ends of the light receiving element,
When the difference in inclination between the both ends is larger than a predetermined threshold value, a correction coefficient is calculated from the intensity distribution at one end of the light receiving element,
4. The optical distance measuring device according to claim 3, wherein when one of the correlation coefficients is larger than a predetermined threshold, the correction coefficient is calculated from the intensity distribution at the other end.
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EP4215870A1 (en) 2022-01-21 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. Measurement device and measurement method

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CN110622038A (en) * 2017-05-15 2019-12-27 夏普株式会社 Optical sensor, electronic device, arithmetic device, and method for measuring distance between optical sensor and detection object
CN110622038B (en) * 2017-05-15 2023-04-21 夏普株式会社 Optical sensor, electronic device, computing device, and method for measuring distance between optical sensor and detection object
EP4215870A1 (en) 2022-01-21 2023-07-26 Panasonic Intellectual Property Management Co., Ltd. Measurement device and measurement method
KR20230113154A (en) 2022-01-21 2023-07-28 파나소닉 아이피 매니지먼트 가부시키가이샤 Measurement device and measurement method

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