JP2012505966A - 低温基板上の薄膜を還元する方法 - Google Patents
低温基板上の薄膜を還元する方法 Download PDFInfo
- Publication number
- JP2012505966A JP2012505966A JP2011532100A JP2011532100A JP2012505966A JP 2012505966 A JP2012505966 A JP 2012505966A JP 2011532100 A JP2011532100 A JP 2011532100A JP 2011532100 A JP2011532100 A JP 2011532100A JP 2012505966 A JP2012505966 A JP 2012505966A
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- Prior art keywords
- oxide
- substrate
- thin film
- copper
- reducing
- Prior art date
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- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 66
- 239000010409 thin film Substances 0.000 title claims abstract description 52
- 238000000034 method Methods 0.000 title claims abstract description 42
- 239000003638 chemical reducing agent Substances 0.000 claims abstract description 45
- 239000006185 dispersion Substances 0.000 claims abstract description 27
- 150000002736 metal compounds Chemical class 0.000 claims abstract description 14
- 238000006479 redox reaction Methods 0.000 claims abstract description 14
- 229910044991 metal oxide Inorganic materials 0.000 claims abstract description 13
- 150000004706 metal oxides Chemical class 0.000 claims abstract description 13
- 230000005670 electromagnetic radiation Effects 0.000 claims abstract description 10
- 239000007788 liquid Substances 0.000 claims abstract description 9
- 238000004519 manufacturing process Methods 0.000 claims abstract 3
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims description 61
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 claims description 45
- 239000005751 Copper oxide Substances 0.000 claims description 35
- 229910000431 copper oxide Inorganic materials 0.000 claims description 35
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 24
- 229920000036 polyvinylpyrrolidone Polymers 0.000 claims description 19
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 claims description 19
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 claims description 18
- 239000012298 atmosphere Substances 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- 229960005070 ascorbic acid Drugs 0.000 claims description 9
- 235000010323 ascorbic acid Nutrition 0.000 claims description 9
- 239000011668 ascorbic acid Substances 0.000 claims description 9
- 238000000151 deposition Methods 0.000 claims description 7
- 229920000642 polymer Polymers 0.000 claims description 5
- 238000007639 printing Methods 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- RTBFRGCFXZNCOE-UHFFFAOYSA-N 1-methylsulfonylpiperidin-4-one Chemical compound CS(=O)(=O)N1CCC(=O)CC1 RTBFRGCFXZNCOE-UHFFFAOYSA-N 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- JFCQEDHGNNZCLN-UHFFFAOYSA-N anhydrous glutaric acid Natural products OC(=O)CCCC(O)=O JFCQEDHGNNZCLN-UHFFFAOYSA-N 0.000 claims description 4
- NDVLTYZPCACLMA-UHFFFAOYSA-N silver oxide Chemical compound [O-2].[Ag+].[Ag+] NDVLTYZPCACLMA-UHFFFAOYSA-N 0.000 claims description 4
- 229940015975 1,2-hexanediol Drugs 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 239000006229 carbon black Substances 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 3
- 238000010894 electron beam technology Methods 0.000 claims description 3
- FHKSXSQHXQEMOK-UHFFFAOYSA-N hexane-1,2-diol Chemical compound CCCCC(O)CO FHKSXSQHXQEMOK-UHFFFAOYSA-N 0.000 claims description 3
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 2
- 150000001298 alcohols Chemical class 0.000 claims description 2
- 150000001299 aldehydes Chemical class 0.000 claims description 2
- 150000001735 carboxylic acids Chemical class 0.000 claims description 2
- 230000008021 deposition Effects 0.000 claims description 2
- 239000002270 dispersing agent Substances 0.000 claims description 2
- 229960005150 glycerol Drugs 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 239000010931 gold Substances 0.000 claims description 2
- 230000006698 induction Effects 0.000 claims description 2
- 229910052744 lithium Inorganic materials 0.000 claims description 2
- 229910052749 magnesium Inorganic materials 0.000 claims description 2
- 239000011777 magnesium Substances 0.000 claims description 2
- 229920005553 polystyrene-acrylate Polymers 0.000 claims description 2
- 239000001267 polyvinylpyrrolidone Substances 0.000 claims description 2
- 229910001923 silver oxide Inorganic materials 0.000 claims description 2
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 claims 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims 2
- 229910000410 antimony oxide Inorganic materials 0.000 claims 1
- 229910000416 bismuth oxide Inorganic materials 0.000 claims 1
- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 claims 1
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical compound [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 claims 1
- 229910000428 cobalt oxide Inorganic materials 0.000 claims 1
- IVMYJDGYRUAWML-UHFFFAOYSA-N cobalt(ii) oxide Chemical compound [Co]=O IVMYJDGYRUAWML-UHFFFAOYSA-N 0.000 claims 1
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 claims 1
- HTXDPTMKBJXEOW-UHFFFAOYSA-N dioxoiridium Chemical compound O=[Ir]=O HTXDPTMKBJXEOW-UHFFFAOYSA-N 0.000 claims 1
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 claims 1
- 229910003437 indium oxide Inorganic materials 0.000 claims 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims 1
- 229910000457 iridium oxide Inorganic materials 0.000 claims 1
- 229910000464 lead oxide Inorganic materials 0.000 claims 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 claims 1
- 229910000480 nickel oxide Inorganic materials 0.000 claims 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 claims 1
- 229910000487 osmium oxide Inorganic materials 0.000 claims 1
- VTRUBDSFZJNXHI-UHFFFAOYSA-N oxoantimony Chemical compound [Sb]=O VTRUBDSFZJNXHI-UHFFFAOYSA-N 0.000 claims 1
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 claims 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 claims 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 claims 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 claims 1
- JIWAALDUIFCBLV-UHFFFAOYSA-N oxoosmium Chemical compound [Os]=O JIWAALDUIFCBLV-UHFFFAOYSA-N 0.000 claims 1
- HBEQXAKJSGXAIQ-UHFFFAOYSA-N oxopalladium Chemical compound [Pd]=O HBEQXAKJSGXAIQ-UHFFFAOYSA-N 0.000 claims 1
- MUMZUERVLWJKNR-UHFFFAOYSA-N oxoplatinum Chemical compound [Pt]=O MUMZUERVLWJKNR-UHFFFAOYSA-N 0.000 claims 1
- DYIZHKNUQPHNJY-UHFFFAOYSA-N oxorhenium Chemical compound [Re]=O DYIZHKNUQPHNJY-UHFFFAOYSA-N 0.000 claims 1
- SJLOMQIUPFZJAN-UHFFFAOYSA-N oxorhodium Chemical compound [Rh]=O SJLOMQIUPFZJAN-UHFFFAOYSA-N 0.000 claims 1
- 229910003445 palladium oxide Inorganic materials 0.000 claims 1
- 229910003446 platinum oxide Inorganic materials 0.000 claims 1
- 229910003449 rhenium oxide Inorganic materials 0.000 claims 1
- 229910003450 rhodium oxide Inorganic materials 0.000 claims 1
- 229910001925 ruthenium oxide Inorganic materials 0.000 claims 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 claims 1
- 150000003839 salts Chemical class 0.000 claims 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims 1
- 229910001887 tin oxide Inorganic materials 0.000 claims 1
- 229910001930 tungsten oxide Inorganic materials 0.000 claims 1
- 239000011787 zinc oxide Substances 0.000 claims 1
- 230000009467 reduction Effects 0.000 abstract description 11
- 230000004913 activation Effects 0.000 abstract description 4
- 150000002894 organic compounds Chemical class 0.000 abstract description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 63
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 58
- 229910052802 copper Inorganic materials 0.000 description 56
- 239000010949 copper Substances 0.000 description 56
- 239000010408 film Substances 0.000 description 31
- 239000012528 membrane Substances 0.000 description 26
- 229920000139 polyethylene terephthalate Polymers 0.000 description 23
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- 238000006243 chemical reaction Methods 0.000 description 22
- 238000001723 curing Methods 0.000 description 19
- 239000008367 deionised water Substances 0.000 description 18
- 229910021641 deionized water Inorganic materials 0.000 description 18
- 238000000227 grinding Methods 0.000 description 13
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 13
- 229910001928 zirconium oxide Inorganic materials 0.000 description 13
- 239000002245 particle Substances 0.000 description 11
- 229910052724 xenon Inorganic materials 0.000 description 11
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 11
- 239000000976 ink Substances 0.000 description 10
- 238000006722 reduction reaction Methods 0.000 description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 9
- 229910052709 silver Inorganic materials 0.000 description 8
- 239000004332 silver Substances 0.000 description 8
- 230000008901 benefit Effects 0.000 description 7
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- 239000004020 conductor Substances 0.000 description 3
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- LEHOTFFKMJEONL-UHFFFAOYSA-N Uric Acid Chemical compound N1C(=O)NC(=O)C2=C1NC(=O)N2 LEHOTFFKMJEONL-UHFFFAOYSA-N 0.000 description 2
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
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- 239000011230 binding agent Substances 0.000 description 1
- LDVVMCZRFWMZSG-UHFFFAOYSA-N captan Chemical compound C1C=CCC2C(=O)N(SC(Cl)(Cl)Cl)C(=O)C21 LDVVMCZRFWMZSG-UHFFFAOYSA-N 0.000 description 1
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- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
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- ACCCMOQWYVYDOT-UHFFFAOYSA-N hexane-1,1-diol Chemical compound CCCCCC(O)O ACCCMOQWYVYDOT-UHFFFAOYSA-N 0.000 description 1
- 239000003906 humectant Substances 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
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- 238000007641 inkjet printing Methods 0.000 description 1
- 238000007648 laser printing Methods 0.000 description 1
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- 229920005989 resin Polymers 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/105—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by conversion of non-conductive material on or in the support into conductive material, e.g. by using an energy beam
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1655—Process features
- C23C18/1658—Process features with two steps starting with metal deposition followed by addition of reducing agent
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1655—Process features
- C23C18/1664—Process features with additional means during the plating process
- C23C18/1667—Radiant energy, e.g. laser
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0393—Flexible materials
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- H—ELECTRICITY
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Abstract
Description
本発明は、2008年10月17日に出願された米国特許出願第61/196,531号(発明の名称「Method and Apparatus for Reacting Thin Films on Low Temperature Substrates at High Speeds」)に関し、この出願は本明細書において参照として援用される。
1.技術分野
本発明は、一般に、硬化法に関し、特に、低温基板上の薄膜を還元する方法に関する。
電子回路を作製するための1つのアプローチは、金属インクを用いて導電体を基板上に印刷した後、その基板を加熱して金属インクの粒子を焼結させ、導電線(trace)を形成することである。一般に、電気伝導(electrically conduction)に適した印刷される金属の多くは、焼結させて導電性になるために、多くの場合、それらの融点から200℃以内までの非常に高い温度まで加熱することを必要とする。
intense pulsed light)を用いて提供する方法である。このレドックス反応は、有機化合物による金属酸化物の還元であってもよく、低温基板上で行ってもよい。
f=0.2*s*o/w
ここで、s=ウェブ速度[フィート/分]
o=重複係数
w=硬化ヘッド幅[インチ]
重複係数は、基板が任意の1ヶ所で受ける平均ストロボパルス数である。例えば、ウェブ速度200フィート/分、重複係数5、硬化ヘッド幅2.75インチの場合、ストロボのパルス率は72.7Hzである。
アルコルビン酸リデューサー
3.0gの<50nm酸化銅(II)、3.6gの脱イオン水、0.15gのPVP K−30、0.3gのエチレングリコール、0.04gのTergitol(登録商標)TMN−6、0.02gのDynol(登録商標)604、0.02gのBYK(登録商標)−020、および0.66gのアスコルビン酸を20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
エチレングリコール/グリセロールリデューサー
2.0gのNanoArc(登録商標)酸化銅、5.7gの脱イオン水、0.10gのPVP K−30、0.6gのエチレングリコール、0.03gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.32gのグリセロールを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
エチレングリコール/グリセロールリデューサー
2.0gのNanoArc(登録商標)酸化銅、5.4gの脱イオン水、0.10gのPVP K−30、0.6gのエチレングリコール、0.03gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.67gのグリセロールを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
エチレングリコール/グリセロールリデューサー
2.0gのNanoArc(登録商標)酸化銅、4.9gの脱イオン水、0.10gのPVP K−30、0.5gのエチレングリコール、0.03gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および1.32gのグリセロールを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
グルコースリデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.79gのグルコースを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
グルコースリデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および1.59gのグルコースを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
ヘキサンジオールリデューサー
1.5gのNanoArc(登録商標)酸化銅、7.5gの脱イオン水、0.08gのPVP K−30、0.8gのエチレングリコール、0.03gのTergitol(登録商標)TMN−6、0.02gのDynol(登録商標)604、および0.47gの1,2−ヘキサンジオールを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
グルタル酸リデューサー
1.5gの<50nm酸化銅(II)、6.8gの脱イオン水、0.08gのPVP K−30、0.8gのエチレングリコール、0.03gのTergitol(登録商標)TMN−6、0.02gのDynol(登録商標)604、および0.47gのグルタル酸を20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
ポリアクリルアミドリデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および1.25gのポリアクリルアミドを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
ペンタエリスリトールリデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.90gのペンタエリスリトールを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
コハク酸リデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.71gのコハク酸(ナトリウム塩)を20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
炭素リデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.32gのカーボンブラックを20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
尿酸リデューサー
1.75gのNanoArc(登録商標)酸化銅、5.3gの脱イオン水、0.09gのPVP K−30、0.6gのエチレングリコール、0.02gのTergitol(登録商標)TMN−6、0.01gのDynol(登録商標)604、および0.89の尿酸を20mLバイアル内で混合して酸化銅分散液を作製した。5gの酸化ジルコニウム粉砕媒体を加え、バイアルを60分間撹拌した。
グリセロールリデューサーを加えたインクジェット
まず、52.5gのNanoArc(登録商標)酸化銅、2.6gのPVP K−30、および294.9gの脱イオン水の混合物を粉砕して酸化銅分散液を作製した。その結果得られた平均粒径は115nmであった。8.4gの粉砕酸化銅分散液、1.0gのグリセロール、0.5gのエチレングリコール、0.04gのTriton(登録商標)X−100、および0.03gのBYK(登録商標)−020を混合してインクジェット用インクを作製した。
アスコルビン酸およびグリセロールリデューサーを加えた銅粉
2.5gの三井製銅粉、0.04gのBYK(登録商標)−020、0.04gのTergitol(登録商標)TMN−6、0.25gのPVP K−30、0.89gのグリセロール、0.45gのエチレングリコール、0.76gのアスコルビン酸を7.57gの脱イオン水中で混合して銅分散液を作製した。
アスコルビン酸リデューサーを加えたインクジェット
まず、52.5gのNanoArc(登録商標)酸化銅、2.6gのPVP K−30、および294.9gの脱イオン水の混合物を粉砕して酸化銅分散液を作製した。その結果得られた平均粒径は115nmであった。8.4gの粉砕酸化銅分散液、1.0gのグリセロール、0.5gのエチレングリコール、0.04gのTriton(登録商標)X−100、および0.03gのBYK(登録商標)−020を混合して第1のインクジェット用インクを作製した。0.1gのBYK(登録商標)−020、0.2gのTriton(登録商標)X−100、10.0gのアスコルビン酸、3.0gのエチレングリコール、4.5gのグリセロールを42.5gの脱イオン水中で混合して第2のインクジェット用インクを作製した。
アスコルビン酸リデューサーを加えた硫酸銅
脱イオン水中に20wt%のCuSO4・5H2Oを入れて第1の溶液を作製した。0.1gのBYK(登録商標)−020、0.2gのTriton(登録商標)X−100、10.0gのアスコルビン酸、3.0gのエチレングリコール、4.5gのグリセロールを42.5gの脱イオン水中で混合して第2の溶液を作製した。
アルミニウムリデューサー
0.29gのValimet−H2アルミニウム粉、0.77gのSigma−Aldrich製<5ミクロン酸化銅(II)、0.11gのPVP K−30を6.0gの脱イオン水に入れて分散液を作製した。
Claims (20)
- 基板上に導電性薄膜を作製する方法であって、
還元性金属化合物および還元剤を液体中に分散させる工程と、
該分散液を薄膜として基板上に堆積させる工程と、
周囲雰囲気中において、該薄膜を該基板とともにパルス電磁放射線に曝露し、該還元性金属化合物と該還元剤とを化学的に反応させて該薄膜を導電性にする工程と、
を包含する、方法。 - 前記基板は紙である、請求項1に記載の方法。
- 前記紙はインク受容層でコーティングされる、請求項2に記載の方法。
- 前記基板はポリマーである、請求項1に記載の方法。
- 前記ポリマーはインク受容層でコーティングされる、請求項4に記載の方法。
- 前記パルス電磁放射線は、レーザー、閃光ランプ、指向性プラズマアークランプ、マイクロ波、高周波誘導加熱器、電子ビーム、およびアークランプのいずれか1つにより発生される、請求項1に記載の方法。
- 前記液体は水である、請求項1に記載の方法。
- 前記曝露する工程は、前記基材が硬化する間に、前記パルス電磁放射線源を通過するように該基板を搬送する工程をさらに含む、請求項1に記載の方法。
- 前記還元性金属化合物は金属酸化物である、請求項1に記載の方法。
- 前記還元性金属化合物は、酸化モリブデン、酸化タングステン、酸化レニウム、酸化鉄、酸化ルテニウム、酸化オスミウム、酸化コバルト、酸化ロジウム、酸化イリジウム、酸化ニッケル、酸化パラジウム、酸化白金、酸化銅、酸化銀、酸化金、酸化亜鉛、酸化カドミウム、酸化インジウム、酸化ゲルマニウム、酸化スズ、酸化鉛、酸化アンチモン、および酸化ビスマスからなる群から選択される化合物である、請求項1に記載の方法。
- 前記還元性金属化合物は金属塩である、請求項1に記載の方法。
- 前記還元剤は、アルコール類、アルデヒド類、カルボン酸類、およびカーボンブラックからなる群から選択される化合物である、請求項1に記載の方法。
- 前記還元剤は、アルミニウム、マグネシウム、およびリチウムの群から選択される、請求項1に記載の方法。
- 前記還元剤は、グリセロール、アスコルビン酸、1,2−ヘキサンジオール、およびグルタル酸をさらに含む、請求項1に記載の方法。
- 前記分散させる工程は、ポリビニルピロリドンまたはポリスチレン−アクリレート共重合体を含む任意の数の分散剤を用いて前記還元性金属化合物および前記還元剤を分散させる工程をさらに含む、請求項1に記載の方法。
- 前記堆積は印刷により行われる、請求項1に記載の方法。
- 前記パルス電磁放射線は20ms未満のパルス長を有する、請求項1に記載の方法。
- 前記パルス電磁放射線は500W/cm2よりも強い、請求項1に記載の方法。
- 基板上に導電性薄膜を作製する方法であって、
金属および還元剤を液体中に分散させる工程と、
該分散液を薄膜として基板上に堆積させる工程と、
周囲雰囲気中において、該薄膜を該基板とともにパルス電磁放射線に曝露し、該還元性金属化合物と、形成し得る金属酸化物および該還元剤とを化学的に反応させて該薄膜を導電性にする工程と、
を包含する、方法。 - 低温基板上の薄膜を還元する方法であって、
還元性金属化合物を第1の液体中に分散させる工程と、
還元剤を第2の液体中に分散させる工程と、
該第1の分散液および該第2の分散液を薄膜として基板上に堆積させる工程と、
周囲雰囲気中において、該薄膜を該基板とともにパルス電磁放射線に曝露し、該基板上で該還元性金属化合物と該還元剤とのレドックス反応を開始する工程と、
を包含する、方法。
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US19653108P | 2008-10-17 | 2008-10-17 | |
US61/196,531 | 2008-10-17 | ||
PCT/US2009/038289 WO2010044904A1 (en) | 2008-10-17 | 2009-03-25 | Method for reducing thin films on low temperature substrates |
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JP2019147583A Withdrawn JP2019189947A (ja) | 2008-10-17 | 2019-08-09 | 低温基板上の薄膜を還元する方法 |
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EP (2) | EP2347032B1 (ja) |
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US8834957B2 (en) * | 2008-11-05 | 2014-09-16 | Lg Chem, Ltd. | Preparation method for an electroconductive patterned copper layer |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3239373A (en) * | 1962-04-24 | 1966-03-08 | Louis S Hoodwin | Printed circuit process |
US4526807A (en) * | 1984-04-27 | 1985-07-02 | General Electric Company | Method for deposition of elemental metals and metalloids on substrates |
US4668533A (en) * | 1985-05-10 | 1987-05-26 | E. I. Du Pont De Nemours And Company | Ink jet printing of printed circuit boards |
JPH0537126A (ja) * | 1991-07-30 | 1993-02-12 | Toshiba Corp | 金属酸化物を用いた配線基板および情報記録媒体 |
JPH0852933A (ja) * | 1994-07-11 | 1996-02-27 | Agfa Gevaert Nv | インクジェットによる印刷版の製造方法 |
JP2008522369A (ja) * | 2004-11-24 | 2008-06-26 | ノバセントリックス コーポレイション | ナノ材料組成物の電気的使用、めっき的使用および触媒的使用 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1427315A (fr) * | 1964-02-24 | 1966-02-04 | Yawata Iron & Steel Co | Procédé pour la formation de revêtements isolants électriques sur les tôles électriques |
US4159414A (en) * | 1978-04-25 | 1979-06-26 | Massachusetts Institute Of Technology | Method for forming electrically conductive paths |
FR2537898A1 (fr) * | 1982-12-21 | 1984-06-22 | Univ Paris | Procede de reduction de composes metalliques par les polyols, et poudres metalliques obtenues par ce procede |
US4592929A (en) * | 1984-02-01 | 1986-06-03 | Shipley Company Inc. | Process for metallizing plastics |
US6326130B1 (en) * | 1993-10-07 | 2001-12-04 | Mallinckrodt Baker, Inc. | Photoresist strippers containing reducing agents to reduce metal corrosion |
US5938848A (en) * | 1996-06-27 | 1999-08-17 | Nordson Corporation | Method and control system for applying solder flux to a printed circuit |
US7252699B2 (en) * | 2000-12-15 | 2007-08-07 | The Arizona Board Of Regents | Method for patterning metal using nanoparticle containing precursors |
CN1297398C (zh) * | 2001-07-06 | 2007-01-31 | 钟渊化学工业株式会社 | 层压体及其制造方法 |
US20060159838A1 (en) * | 2005-01-14 | 2006-07-20 | Cabot Corporation | Controlling ink migration during the formation of printable electronic features |
US20040185388A1 (en) * | 2003-01-29 | 2004-09-23 | Hiroyuki Hirai | Printed circuit board, method for producing same, and ink therefor |
JP4416080B2 (ja) * | 2003-01-29 | 2010-02-17 | 富士フイルム株式会社 | プリント配線基板形成用インク、プリント配線基板の形成方法及びプリント配線基板 |
JP2004277627A (ja) | 2003-03-18 | 2004-10-07 | Asahi Kasei Corp | インクジェット用インクおよびこれを用いた金属含有薄膜の形成方法 |
JP2004277868A (ja) * | 2003-03-19 | 2004-10-07 | Mitsubishi Paper Mills Ltd | 導電性組成物の作製方法 |
EP1625336B9 (en) * | 2003-05-21 | 2012-03-21 | Alexza Pharmaceuticals, Inc. | Use of a layer of solid fuel, method for producing such a layer and associated heating unit |
JP2005071805A (ja) * | 2003-08-25 | 2005-03-17 | Fuji Photo Film Co Ltd | 金属酸化物及び/又は金属水酸化物の粒子と金属の粒子を含む組成物、組成物を用いたプリント配線基板、その製造方法及びそれに用いるインク |
US7547647B2 (en) * | 2004-07-06 | 2009-06-16 | Hewlett-Packard Development Company, L.P. | Method of making a structure |
US8227022B2 (en) * | 2005-01-10 | 2012-07-24 | Yissum Research Development Company Of The Hebrew University Of Jerusalem | Method of forming aqueous-based dispersions of metal nanoparticles |
US20060258136A1 (en) * | 2005-05-11 | 2006-11-16 | Guangjin Li | Method of forming a metal trace |
US20070193026A1 (en) | 2006-02-23 | 2007-08-23 | Chun Christine Dong | Electron attachment assisted formation of electrical conductors |
US8764960B2 (en) * | 2006-08-07 | 2014-07-01 | Inktec Co., Ltd. | Manufacturing methods for metal clad laminates |
US10231344B2 (en) * | 2007-05-18 | 2019-03-12 | Applied Nanotech Holdings, Inc. | Metallic ink |
-
2009
- 2009-03-25 CN CN201510329127.2A patent/CN104894538A/zh active Pending
- 2009-03-25 EP EP09820923.2A patent/EP2347032B1/en active Active
- 2009-03-25 CA CA2910493A patent/CA2910493C/en active Active
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-
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3239373A (en) * | 1962-04-24 | 1966-03-08 | Louis S Hoodwin | Printed circuit process |
US4526807A (en) * | 1984-04-27 | 1985-07-02 | General Electric Company | Method for deposition of elemental metals and metalloids on substrates |
US4668533A (en) * | 1985-05-10 | 1987-05-26 | E. I. Du Pont De Nemours And Company | Ink jet printing of printed circuit boards |
JPH0537126A (ja) * | 1991-07-30 | 1993-02-12 | Toshiba Corp | 金属酸化物を用いた配線基板および情報記録媒体 |
JPH0852933A (ja) * | 1994-07-11 | 1996-02-27 | Agfa Gevaert Nv | インクジェットによる印刷版の製造方法 |
JP2008522369A (ja) * | 2004-11-24 | 2008-06-26 | ノバセントリックス コーポレイション | ナノ材料組成物の電気的使用、めっき的使用および触媒的使用 |
Cited By (9)
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JP2013196881A (ja) * | 2012-03-19 | 2013-09-30 | Osaka Univ | 導電パターン形成方法及び光照射またはマイクロ波加熱による導電パターン形成用組成物 |
JP2016541121A (ja) * | 2013-12-04 | 2016-12-28 | フラウンホーファー−ゲゼルシャフト ツル フェルデルング デル アンゲヴァンテン フォルシュング エー ファウFraunhofer−Gesellschaft zur Foerderung der angewandten Forschung e.V. | プラスチック基板上に導電性構造体を形成する方法 |
JPWO2016111133A1 (ja) * | 2015-01-06 | 2017-08-17 | 株式会社フジクラ | 導体層の製造方法及び配線基板 |
KR20170101249A (ko) | 2015-01-06 | 2017-09-05 | 가부시키가이샤후지쿠라 | 도체층의 제조 방법 및 배선 기판 |
US10015890B2 (en) | 2015-01-06 | 2018-07-03 | Fujikura Ltd. | Method of manufacturing conductive layer and wiring board |
WO2016152722A1 (ja) * | 2015-03-24 | 2016-09-29 | 昭和電工株式会社 | 導電パターン形成用組成物及び導電パターン形成方法 |
KR20170088955A (ko) * | 2015-03-24 | 2017-08-02 | 쇼와 덴코 가부시키가이샤 | 도전 패턴 형성용 조성물 및 도전 패턴 형성 방법 |
JPWO2016152722A1 (ja) * | 2015-03-24 | 2018-01-18 | 昭和電工株式会社 | 導電パターン形成用組成物及び導電パターン形成方法 |
KR102096826B1 (ko) * | 2015-03-24 | 2020-04-03 | 쇼와 덴코 가부시키가이샤 | 도전 패턴 형성용 조성물 및 도전 패턴 형성 방법 |
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