JP2012138542A - 真空処理装置 - Google Patents
真空処理装置 Download PDFInfo
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- JP2012138542A JP2012138542A JP2010291542A JP2010291542A JP2012138542A JP 2012138542 A JP2012138542 A JP 2012138542A JP 2010291542 A JP2010291542 A JP 2010291542A JP 2010291542 A JP2010291542 A JP 2010291542A JP 2012138542 A JP2012138542 A JP 2012138542A
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- 238000012545 processing Methods 0.000 title claims abstract description 320
- 238000012546 transfer Methods 0.000 claims abstract description 383
- 235000012431 wafers Nutrition 0.000 claims description 206
- 238000000034 method Methods 0.000 claims description 16
- 230000008569 process Effects 0.000 claims description 15
- 238000004891 communication Methods 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 6
- 230000032258 transport Effects 0.000 description 13
- 238000011109 contamination Methods 0.000 description 7
- 238000012423 maintenance Methods 0.000 description 6
- 230000004044 response Effects 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 230000005684 electric field Effects 0.000 description 5
- 230000008602 contraction Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 230000001771 impaired effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000012864 cross contamination Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16K—VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
- F16K51/00—Other details not peculiar to particular types of valves or cut-off apparatus
- F16K51/02—Other details not peculiar to particular types of valves or cut-off apparatus specially adapted for high-vacuum installations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
【解決手段】真空搬送室内をウエハが搬送される第一及び第二の真空搬送容器と、これらの真空搬送容器各々に連結され処理室と前記真空搬送室とが連通された第一及び第二の真空処理容器と、前記第一及び第二の真空搬送容器の間で連結して内部に前記ウエハを収納可能な中間室容器と、前記第一の真空搬送容器に連結され内部が連通されたロック室と、前記第一及び第二の真空搬送容器と前記第一,第二の真空処理容器、前記中間室容器及び前記ロック室の各々との間に配置されて気密に開閉する複数のバルブとを備え、前記第一の真空処理容器の処理室と前記第一の真空搬送容器の真空搬送室との間または第二の真空処理容器の処理室と前記第二の真空搬送容器の真空搬送室との間のバルブを開放する前に前記第一及び第二の真空搬送容器の間に配置された前記バルブのいずれかを閉塞する。
【選択図】 図1
Description
本発明の実施例を図1乃至4を用いて説明する。図1は本発明の実施例に係る真空処理装置の全体の構成の概略を説明する上面図である。
102 真空側ブロック
103 真空処理ユニット
104 第一の真空搬送室
105 ロック室
106 筐体
107 カセット台
108 第一の真空搬送ロボット
109 第二の真空搬送ロボット
110 大気搬送ロボット
111 第二の真空搬送室
112 真空搬送中間室
120a,120b,120c,120d,120e,120f,120g ゲートバルブ
121 制御部
201,203 第一アーム
202,204 第二アーム
Claims (7)
- 減圧された内部の真空搬送室内をウエハが搬送される第一及び第二の真空搬送容器と、これらの真空搬送容器各々に連結され前記ウエハが内部で処理される処理室と前記真空搬送室とが連通された第一及び第二の真空処理容器と、前記第一及び第二の真空搬送容器の間でこれらを連結して配置され内部に前記ウエハを収納可能な中間室容器と、前記第一の真空搬送容器に連結され内部が連通されたロック室と、前記第一及び第二の真空搬送容器と前記第一,第二の真空処理容器、前記中間室容器及び前記ロック室の各々との間に配置されてこれらの間の連通を開放または気密に封止して閉塞する複数のバルブとを備え、
前記第一の真空処理容器の処理室と前記第一の真空搬送容器の真空搬送室との間または第二の真空処理容器の処理室と前記第二の真空搬送容器の真空搬送室との間のバルブを開放する前に前記第一及び第二の真空搬送容器の間に配置された前記バルブのいずれかを閉塞する真空処理装置。 - 請求項1に記載の真空処理装置であって、
前記中間室容器内部の前記ウエハの収納室と前記第一及び第二の真空搬送容器各々の真空搬送室と間に各々を開放または閉塞する前記バルブを備え、前記第一の真空処理容器と前記第一の真空搬送容器または第二の真空処理容器と前記第二の真空搬送容器との間の前記バルブを開放する前に前記中間室容器の前記2つのバルブのいずれかを閉塞する真空処理装置。 - 請求項1または2に記載の真空処理装置であって、
前記第一の真空処理容器と前記第一の真空搬送容器または第二の真空処理容器と前記第二の真空搬送容器との間の前記バルブが気密に閉塞された後に閉じられていた前記第一または第二の真空搬送容器との間の前記バルブを開放する真空処理装置。 - 減圧された内部をウエハが搬送される搬送通路と、この搬送通路内と連結されて連通され減圧された内部で前記ウエハが処理される第一及び第二の真空処理室と、これらの真空処理室と前記搬送通路との間の連通を開放または気密に封止して閉塞する第一及び第二のバルブと、前記搬送通路上の第一及び第二のバルブの間に配置されてこの搬送通路を開放または気密に封止して閉塞する第三のバルブと、前記第一または第二のバルブの開放する前に前記第三のバルブを気密に閉塞するよう指令する制御部とを備えた真空処理装置。
- 請求項4に記載の真空処理装置であって、
前記搬送通路上の前記第三のバルブと前記第二のバルブとの間に配置されてこの搬送通路を開放または気密に封止して閉塞する第四のバルブとを備え、前記制御器は前記第一または第二のバルブの開放する前に前記第三または第四のいずれかのバルブを気密に閉塞するよう指令する真空処理装置。 - 請求項5に記載の真空処理装置であって、
前記制御器が前記第一または第二バルブが気密に閉塞された後に閉じられていた前記第三または第四のバルブを開放するように指令する真空処理装置。 - 請求項5または6の真空処理装置であって、
前記第三および第四のバルブの間に前記ウエハを収納可能な真空処理装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010291542A JP5785712B2 (ja) | 2010-12-28 | 2010-12-28 | 真空処理装置 |
TW100101804A TWI445121B (zh) | 2010-12-28 | 2011-01-18 | Vacuum processing device |
US13/022,313 US8747046B2 (en) | 2010-12-28 | 2011-02-07 | Vacuum processing apparatus |
KR1020110011081A KR101238768B1 (ko) | 2010-12-28 | 2011-02-08 | 진공처리장치 |
CN201110036139.8A CN102569016B (zh) | 2010-12-28 | 2011-02-09 | 真空处理装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010291542A JP5785712B2 (ja) | 2010-12-28 | 2010-12-28 | 真空処理装置 |
Publications (3)
Publication Number | Publication Date |
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JP2012138542A true JP2012138542A (ja) | 2012-07-19 |
JP2012138542A5 JP2012138542A5 (ja) | 2014-02-13 |
JP5785712B2 JP5785712B2 (ja) | 2015-09-30 |
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JP2010291542A Active JP5785712B2 (ja) | 2010-12-28 | 2010-12-28 | 真空処理装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8747046B2 (ja) |
JP (1) | JP5785712B2 (ja) |
KR (1) | KR101238768B1 (ja) |
CN (1) | CN102569016B (ja) |
TW (1) | TWI445121B (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014036025A (ja) * | 2012-08-07 | 2014-02-24 | Hitachi High-Technologies Corp | 真空処理装置または真空処理装置の運転方法 |
JP2014072263A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi High-Technologies Corp | 試料搬送装置のティーチング方法 |
US20140271049A1 (en) * | 2013-03-14 | 2014-09-18 | Hitachi High-Technologies Corporation | Vacuum processing apparatus and operating method thereof |
WO2020055942A1 (en) * | 2018-09-14 | 2020-03-19 | Lam Research Corporation | Vacuum robot positioning system with reduced sensitivity to chamber pressure |
US11195733B2 (en) | 2018-03-23 | 2021-12-07 | Hitachi High-Tech Corporation | Operation method of vacuum processing device |
US12014908B2 (en) | 2020-03-24 | 2024-06-18 | Hitachi High-Tech Corporation | Vacuum processing apparatus |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101685752B1 (ko) * | 2011-02-08 | 2016-12-12 | 도쿄엘렉트론가부시키가이샤 | 기판 중계 장치, 기판 중계 방법, 기판 처리 장치 |
JP6293499B2 (ja) * | 2014-01-27 | 2018-03-14 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
CN106449466A (zh) * | 2015-08-11 | 2017-02-22 | 中微半导体设备(上海)有限公司 | 一种基片处理系统 |
JP6625098B2 (ja) * | 2017-07-20 | 2019-12-25 | 株式会社Kokusai Electric | 基板処理システム、半導体装置の製造方法およびプログラム |
US11769682B2 (en) | 2017-08-09 | 2023-09-26 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
TWI778102B (zh) * | 2017-08-09 | 2022-09-21 | 荷蘭商Asm智慧財產控股公司 | 用於儲存基板用之卡匣的儲存設備及備有其之處理設備 |
CN110467151A (zh) * | 2019-09-04 | 2019-11-19 | 烟台睿创微纳技术股份有限公司 | 一种mems晶圆封装设备及方法 |
CN115910886B (zh) * | 2022-12-28 | 2024-04-16 | 深圳市纳设智能装备股份有限公司 | 传输腔、半导体设备及晶圆传输方法 |
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- 2010-12-28 JP JP2010291542A patent/JP5785712B2/ja active Active
-
2011
- 2011-01-18 TW TW100101804A patent/TWI445121B/zh active
- 2011-02-07 US US13/022,313 patent/US8747046B2/en active Active
- 2011-02-08 KR KR1020110011081A patent/KR101238768B1/ko active IP Right Grant
- 2011-02-09 CN CN201110036139.8A patent/CN102569016B/zh active Active
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Cited By (9)
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JP2014036025A (ja) * | 2012-08-07 | 2014-02-24 | Hitachi High-Technologies Corp | 真空処理装置または真空処理装置の運転方法 |
JP2014072263A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi High-Technologies Corp | 試料搬送装置のティーチング方法 |
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US12014908B2 (en) | 2020-03-24 | 2024-06-18 | Hitachi High-Tech Corporation | Vacuum processing apparatus |
Also Published As
Publication number | Publication date |
---|---|
CN102569016B (zh) | 2015-04-15 |
TWI445121B (zh) | 2014-07-11 |
KR101238768B1 (ko) | 2013-03-04 |
TW201227864A (en) | 2012-07-01 |
CN102569016A (zh) | 2012-07-11 |
US20120163943A1 (en) | 2012-06-28 |
JP5785712B2 (ja) | 2015-09-30 |
US8747046B2 (en) | 2014-06-10 |
KR20120075313A (ko) | 2012-07-06 |
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