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JP2009000804A - Absorption table - Google Patents

Absorption table Download PDF

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Publication number
JP2009000804A
JP2009000804A JP2007287159A JP2007287159A JP2009000804A JP 2009000804 A JP2009000804 A JP 2009000804A JP 2007287159 A JP2007287159 A JP 2007287159A JP 2007287159 A JP2007287159 A JP 2007287159A JP 2009000804 A JP2009000804 A JP 2009000804A
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Japan
Prior art keywords
vibration
vacuum suction
air passage
sheet
suction means
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JP2007287159A
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Japanese (ja)
Inventor
Kazutaka Kitazawa
一孝 北澤
Ryota Seitai
良太 西躰
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Nidec Advance Technology Corp
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Nidec Read Corp
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Priority to JP2007287159A priority Critical patent/JP2009000804A/en
Priority to KR1020080045930A priority patent/KR20080102970A/en
Priority to TW97118744A priority patent/TW200911450A/en
Publication of JP2009000804A publication Critical patent/JP2009000804A/en
Pending legal-status Critical Current

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  • Jigs For Machine Tools (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a vibration absorption device preventing vibrations from transmitting to a plate-shaped member such as an inspection substrate by absorbing vibrations with various frequencies. <P>SOLUTION: The vibration absorption device is a plate-shaped structure connected with a vacuum adsorbing means and used for an absorption table retaining a member as a mounting object. A mounting member is mounted on one side of the vibration absorption device, the vacuum adsorbing means is connected with the other side of the vibration absorption device, and a ventilation passage is provided to connect a connecting section of the vacuum absorbing means and one side of the vibration absorption device. The ventilation passage is formed with numerous small holes with various sizes which are made of wall surfaces consisting of metallic splinters combined with each other in point contacts, and prevents the vibration from transmitting to the mounted member by adsorbing the vibration caused by the vacuum adsorbing means. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は吸着テーブルに関し、特に、例えば基板等の板状部材を吸引して保持する吸着テーブルに用いられる振動吸収装置に関する。   The present invention relates to a suction table, and more particularly to a vibration absorber used in a suction table that sucks and holds a plate-like member such as a substrate.

尚、基板は、プリント配線基板に限定されず、例えば、フレキシブル基板、多層配線基板、液晶ディスプレイやプラズマディスプレイ用の電極板、及び半導体パッケージ用のパッケージ基板やフィルムキャリア、また、半導体ウェハや検査対象となるシート状部材種々の基板を総称する。   The substrate is not limited to a printed wiring board, but is, for example, a flexible board, a multilayer wiring board, an electrode plate for a liquid crystal display or a plasma display, a package board or film carrier for a semiconductor package, a semiconductor wafer, or an inspection object. The sheet-like member is a generic name for various substrates.

プリント配線基板に回路パターンを形成する際に、回路パターンに短絡や断線等の欠陥が生じてしまうことがある。そのような基板の欠陥を発見するために、例えば、光学検査装置が用いられている。このような光学検査装置は、検査基板を保持するテーブルと、検査基板の回路パターンに向けて検査用の光を出力する光照射装置と、回路パターンから反射された光を受光する光検出装置と、検出した光から回路パターンを解析して欠陥の状況を調べる制御装置とを備えている。
特開2004−90137 特許文献1は、多孔質体の吸着部材を有する基板ホルダーを開示する。その吸着部材はセラミック系であり、その孔は平均空孔径が30μmから50μmである。この基板ホルダーは基板の貫通孔を塞ぐ吸着部位を有することによって安定した吸着を提供するものである。
When a circuit pattern is formed on a printed wiring board, a defect such as a short circuit or disconnection may occur in the circuit pattern. In order to find such a substrate defect, for example, an optical inspection apparatus is used. Such an optical inspection apparatus includes a table that holds an inspection substrate, a light irradiation device that outputs inspection light toward a circuit pattern on the inspection substrate, and a light detection device that receives light reflected from the circuit pattern. And a control device for analyzing the circuit pattern from the detected light and checking the state of the defect.
JP 2004-90137 A discloses a substrate holder having a porous adsorbing member. The adsorbing member is ceramic, and the pores have an average pore diameter of 30 μm to 50 μm. This substrate holder provides a stable suction by having a suction portion that closes the through hole of the substrate.

吸着部材としては、その他にも、一定の大きさの径の小孔を有する発泡性の樹脂が用いられている。   In addition, as the adsorbing member, a foamable resin having a small hole having a certain diameter is used.

吸着テーブルには、ホースを介して真空ポンプ等の吸引装置が接続されており、その吸引装置による吸引力によって、吸着テーブル上の基板等の板状部材を吸着テーブルの載置面に固定している。その吸引のために吸引装置が作動すると、吸引装置と吸着テーブルとを接続するホース内に周期的な圧力の変動が生じ、真空圧にばらつきが生じてしまうことになる。このような周期的な圧力のばらつきがそのまま吸着テーブル上の板状部材まで伝達されると、そのばらつきが板状部材に伝わり振動してしまうことになる。その結果、その振動に応答して板状部材の高さ方向の位置ずれが生じ、予め設定されている光学式検査装置の光ビームの到達距離や電気式検査装置の高さ方向(z方向)の移動にずれが生じることになる。このため、このずれにより、撮像した画像が乱れたり、電気的接続を可能にする治具と板状部材が安定して接触しない状況が生じていた。   A suction device such as a vacuum pump is connected to the suction table via a hose, and a plate-like member such as a substrate on the suction table is fixed to the placement surface of the suction table by the suction force of the suction device. Yes. When the suction device is operated for the suction, periodic pressure fluctuations occur in the hose connecting the suction device and the suction table, and the vacuum pressure varies. If such a periodic pressure variation is transmitted as it is to the plate-like member on the suction table, the variation is transmitted to the plate-like member and vibrates. As a result, the displacement of the plate member in the height direction occurs in response to the vibration, and the optical beam arrival distance of the optical inspection apparatus set in advance or the height direction of the electric inspection apparatus (z direction) There will be a shift in the movement. For this reason, due to this shift, a situation has occurred in which the captured image is disturbed or the jig that enables electrical connection and the plate-like member do not come into stable contact.

また、検査を実施するための光学検査装置に限定されず、基板のような板状部材を載置して、所定の処理を行うための加工装置や処理装置においても、載置される板状部材に振動が伝達されない吸着テーブルの提供が要求されている。   Further, the present invention is not limited to the optical inspection apparatus for carrying out the inspection, and a plate-like member placed on a processing apparatus or a processing apparatus for carrying out a predetermined process by placing a plate-like member such as a substrate. There is a demand for providing a suction table in which vibration is not transmitted to a member.

本発明は、上記の課題に鑑み、さまざまな振動数の振動を吸収して検査や加工などの所定の処理を行う基板等の板状部材への振動の伝達を防ぐことのできる吸着テーブルを提供することを目的とする。   In view of the above problems, the present invention provides a suction table capable of absorbing vibrations of various frequencies and preventing transmission of vibrations to a plate-like member such as a substrate that performs predetermined processing such as inspection and processing. The purpose is to do.

そこで、本発明に係る振動吸収装置は、真空吸引手段に接続されて、被載置対象となる部材を保持する吸着テーブルに用いる板状のもので、一方側に被載置部材を載せ、他方側が真空吸引手段に接続され、真空吸引手段との接続部位と一方側を連通連結する通気路を備え、通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、真空吸引手段に起因する振動を吸収して被載置部材に振動が伝わることを防ぐことを特徴とする。   Therefore, the vibration absorbing device according to the present invention is a plate-like device that is connected to a vacuum suction unit and is used for a suction table that holds a member to be placed, and places the placed member on one side, The side is connected to the vacuum suction means, and includes a ventilation path that communicates and connects one side of the connection portion with the vacuum suction means, and the ventilation path is formed by a wall formed of metal strips joined by point contact. It is composed of a large number of small holes, and is characterized by absorbing vibration caused by the vacuum suction means and preventing the vibration from being transmitted to the placement member.

そこで、本発明に係る検査基板保持装置は、真空吸引手段に接続されて、被検査基板を保持する吸着テーブルに用いる板状の振動吸収装置であって、一方側に被検査基板を載せ、他方側が真空吸引手段に接続され、真空吸引手段との接続部位と一方側を連通連結する通気路を備え、通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、真空吸引手段に起因する振動を吸収して被検査基板に振動が伝わることを防ぐ、振動吸収装置と、振動吸収装置の一方側に載せられたシート状部材であってシート状部材の上に被検査基板が載せられるシート状部材とを備え、シート状部材が、振動吸収装置の通気路とシート状部材の被検査基板が載せられる面とを連通する通気路を備え、通気路が、振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引されることを特徴とする。   Therefore, the inspection substrate holding device according to the present invention is a plate-like vibration absorber that is connected to a vacuum suction means and is used for a suction table that holds a substrate to be inspected. The side is connected to the vacuum suction means, and includes a ventilation path that communicates and connects one side of the connection portion with the vacuum suction means, and the ventilation path is formed by a wall formed of metal strips joined by point contact. It is composed of a large number of small holes and is placed on one side of the vibration absorbing device and the vibration absorbing device, which absorbs the vibration caused by the vacuum suction means and prevents the vibration from being transmitted to the substrate to be inspected A sheet-like member, on which the board to be inspected is placed, and the sheet-like member has a ventilation path of the vibration absorbing device and a surface on which the board to be inspected of the sheet-like member is placed. A communicating vent For example, the vent path, be formed to a uniform size smaller than the pores of the vibration absorber, thereby characterized in that the air is sucked evenly distributed.

多数の小孔は、開口径に応じて少なくとも3つにグループ化され、3つのグループが積層構造に配置されていてもよい。   A large number of small holes may be grouped into at least three according to the opening diameter, and the three groups may be arranged in a laminated structure.

金属細片は、鋳鉄の切削細片でもよい。   The metal strip may be a cast iron cutting strip.

シート状部材は、無塵紙であってもよい。   The sheet-like member may be dustless paper.

多数の小孔の径は、100μm以内であることが望ましい。   The diameter of the large number of small holes is preferably within 100 μm.

本発明に係る光学検査装置は、真空吸引手段に接続されて、被検査基板を保持する吸着テーブルと、吸着テーブルに設けられた板状の振動吸収装置であって、一方側に被検査基板を載せ、他方側が真空吸引手段に接続され、真空吸引手段との接続部位と一方側を連通連結する通気路を備え、通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、真空吸引手段に起因する振動を吸収して被検査基板に振動が伝わることを防ぐ、振動吸収装置と、振動吸収装置の一方側に載せられたシート状部材であってシート状部材の上に被検査基板が載せられるシート状部材とを備え、シート状部材が、振動吸収装置の通気路とシート状部材の被検査基板が載せられる面とを連通する通気路を備え、通気路が、振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引され、さらに、シート状部材に載せられた被検査基板に検査用の光を照射するとともに被検査基板から反射した光を受け取る光学装置と、吸着テーブル若しくは光学装置の一方、又は吸着テーブル及び光学装置の両方をX−Y面上で移動させる駆動装置と、光学装置及び駆動装置の動作を制御するとともに光学装置が受け取った光を解析する制御装置とを備えることを特徴とする。   An optical inspection apparatus according to the present invention is a suction table that is connected to a vacuum suction means and holds a substrate to be inspected, and a plate-like vibration absorber provided on the suction table, and the substrate to be inspected is provided on one side. The other side is connected to the vacuum suction means, and has a ventilation path that connects and connects the connection portion with the vacuum suction means, and the ventilation path is formed by a wall surface composed of metal strips joined by point contact. The vibration absorbing device, which is composed of a large number of small holes of different sizes, absorbs the vibration caused by the vacuum suction means and prevents the vibration from being transmitted to the substrate to be inspected, and on one side of the vibration absorbing device. A sheet-like member placed on the sheet-like member on which the board to be inspected is placed, and the sheet-like member on which the ventilation path of the vibration absorbing device and the board to be inspected of the sheet-like member are placed Communicate with the surface An air passage is provided, and the air passage is smaller than the small hole of the vibration absorbing device and is formed to have a uniform size, whereby air is evenly dispersed and sucked and further placed on the sheet-like member. The optical device that irradiates the inspection substrate with the inspection light and receives the light reflected from the inspection substrate and either the suction table or the optical device, or both the suction table and the optical device are moved on the XY plane. And a control device for controlling the operation of the optical device and the drive device and analyzing the light received by the optical device.

本発明に係る加工装置は、真空吸引手段に接続されて、被加工部材を保持する吸着テーブルと、吸着テーブルに設けられた板状の振動吸収装置であって、一方側に被加工部材を載せ、他方側が真空吸引手段に接続され、真空吸引手段との接続部位と一方側を連通連結する通気路を備え、通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、真空吸引手段に起因する振動を吸収して被加工部材に振動が伝わることを防ぐ、振動吸収装置と、振動吸収装置の一方側に載せられたシート状部材であってシート状部材の上に被加工部材が載せられるシート状部材とを備え、シート状部材が、振動吸収装置の通気路とシート状部材の被加工部材が載せられる面とを連通する通気路を備え、通気路が、振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引され、さらに、吸着テーブルに載置された被加工部材の表面に、所定処理を施すための処理手段と、所定処理を施すために、吸着テーブルと処理手段を相対的に移動させる移動手段とを備えることを特徴とする。   A processing apparatus according to the present invention is a suction table that is connected to a vacuum suction means and holds a workpiece, and a plate-like vibration absorber provided on the suction table, the workpiece being placed on one side. The other side is connected to the vacuum suction means, and has a ventilation path that connects and communicates with the connection portion with the vacuum suction means, and the ventilation path is formed by a wall surface composed of metal strips joined by point contact. It is composed of a large number of small holes of different sizes and is placed on one side of the vibration absorbing device and the vibration absorbing device, which absorbs the vibration caused by the vacuum suction means and prevents the vibration from being transmitted to the workpiece. The sheet-like member is a sheet-like member on which the workpiece is placed on the sheet-like member, and the sheet-like member is a surface on which the ventilation path of the vibration absorber and the workpiece of the sheet-like member are placed Ventilation that communicates with And the air passage is smaller than the small hole of the vibration absorbing device and has a uniform size, whereby air is evenly dispersed and sucked, and further, the object placed on the suction table. A processing means for performing a predetermined process on the surface of the processing member and a moving means for relatively moving the suction table and the processing means to perform the predetermined process are provided.

また、本発明に係る振動吸収装置は、真空吸引手段に接続されて、被載置対象となる部材を保持する吸着テーブルに用いる板状のものであって、一方側に前記被載置部材を載せ、他方側が真空吸引手段に接続され、真空吸引手段との接続部位と一方側を連通連結する通気路を備え、通気路が、点接触で金属細片を結合させて立体架橋構造を形成することにより異なる大きさの多数の小孔から構成されていて、真空吸引手段に起因する振動を吸収して被載置部材に振動が伝わることを防ぐことを特徴とする。   Further, the vibration absorbing device according to the present invention is a plate-like device that is connected to a vacuum suction unit and used for a suction table that holds a member to be placed, and the placed member is placed on one side. The other side is connected to the vacuum suction means, and has a ventilation path that connects and connects one side of the connection with the vacuum suction means, and the ventilation path joins the metal strips by point contact to form a three-dimensional cross-linking structure. Thus, it is composed of a large number of small holes of different sizes, and is characterized by absorbing vibration caused by the vacuum suction means and preventing the vibration from being transmitted to the placement member.

本発明によれば、吸引装置等からのさまざまな振動数の振動を吸収して検査基板等の被載置対象物への振動の伝達を防ぐことができる吸着テーブル用の振動吸収装置を提供することができる。それにより、被載置対象物が振動することを防止することができ、被載置対象物に対して正確な処理が行えるようになる。   According to the present invention, there is provided a vibration absorbing device for a suction table that can absorb vibrations of various frequencies from a suction device or the like and prevent transmission of vibrations to an object to be placed such as an inspection substrate. be able to. Thereby, it can prevent that a mounting target object vibrates and can perform an exact process with respect to a mounting target object.

また、金属細片が点接触で結合したことによってさまざまな大きさの小孔を備える振動吸収装置を用いることによって、従来のものよりも廉価に大きな寸法の振動吸収装置を製造することができる。   Further, by using a vibration absorbing device having small holes of various sizes by connecting metal strips by point contact, it is possible to manufacture a vibration absorbing device having a size larger than that of the conventional one.

以下、添付の図面を参照しながら本発明に係る吸着テーブルについて詳細に説明する。図中、同じ要素に対しては、同じ符号を付して重複した説明を省略してある。   Hereinafter, a suction table according to the present invention will be described in detail with reference to the accompanying drawings. In the figure, the same elements are denoted by the same reference numerals, and redundant description is omitted.

尚、下記の吸着テーブルの説明では、光学検査装置10に設けられる場合を説明しているが、特にこれに限定されるものではなく、他の処理装置の吸着テーブルとしても利用することができる。   In the following description of the suction table, the case where it is provided in the optical inspection apparatus 10 is described. However, the present invention is not particularly limited to this, and the suction table can also be used as a suction table for other processing apparatuses.

[吸着テーブルの概要]
吸着テーブル22は、例えば、後述する図4に示すように、例えば基板検査用の光学検査装置10の検査基板保持装置20に設けることができ、その吸着テーブル22の上には検査基板28が載置される。この図の実施例では検査基板を検査対象とするが、検査内容に応じてその他の板状部材を検査対象とすることができる。
[Outline of vacuum table]
For example, as shown in FIG. 4 to be described later, the suction table 22 can be provided, for example, in the inspection substrate holding device 20 of the optical inspection device 10 for substrate inspection. Placed. In the embodiment of this figure, the inspection board is the inspection object, but other plate-like members can be the inspection object according to the inspection contents.

図1及び図2は、それぞれ吸着テーブル22の構成の概要を説明するための側面断面図及び斜視図である。   FIGS. 1 and 2 are a side sectional view and a perspective view, respectively, for explaining the outline of the configuration of the suction table 22.

図1に示すように、吸着テーブル22には凹部が形成されていて、その凹部には板状の振動吸収装置24が配置されている。また、その振動吸収装置24の上面には、シート状部材の無塵紙26が配置されている。振動吸収装置24は、詳しくは後述するように、多孔質金属部材からなり、その多孔質金属部材は上面と下面とを連通連結する通気路を備える。その通気路は、大小さまざまな開口径の多数の小孔を有していて、その小孔を通じてエアの吸引がおこなわれる。無塵紙26は、振動吸収装置24の小孔よりも細かな目を有していて、検査基板に対するエアの吸引が均等に行われるようにする。   As shown in FIG. 1, the suction table 22 has a recess, and a plate-like vibration absorber 24 is disposed in the recess. Further, a dust-free paper 26 as a sheet-like member is disposed on the upper surface of the vibration absorbing device 24. As will be described in detail later, the vibration absorbing device 24 is made of a porous metal member, and the porous metal member includes a ventilation path that connects the upper surface and the lower surface. The air passage has a large number of small holes of various opening diameters, and air is sucked through the small holes. The dust-free paper 26 has finer eyes than the small holes of the vibration absorbing device 24 so that air is sucked evenly onto the inspection substrate.

図示せぬ真空吸引装置に接続された吸引パイプ35を経由してエアが吸引されると、エアは、無塵紙26の上面からほぼ均一に吸引され、さらに、図1で矢印で示すように振動吸収装置24内の多数の小孔を通過して吸引パイプ35から吸引される。そのため、図1において、検査基板28を無塵紙26の上に載せて、吸引を開始すると、検査基板28が均等の圧力で無塵紙26上に吸着されて吸着テーブル22に位置的に固定されることになる。   When air is sucked through a suction pipe 35 connected to a vacuum suction device (not shown), the air is sucked almost uniformly from the upper surface of the dust-free paper 26 and further vibrates as indicated by an arrow in FIG. The suction pipe 35 is sucked through a large number of small holes in the absorption device 24. Therefore, in FIG. 1, when the inspection substrate 28 is placed on the dust-free paper 26 and suction is started, the inspection substrate 28 is sucked onto the dust-free paper 26 with equal pressure and is fixed to the suction table 22 in position. It will be.

詳しくは後述するが、吸着テーブル22は、図2に示すように、光学検査装置の光学装置に対し、相対的に、X−Y面上で移動することができる。   As will be described in detail later, as shown in FIG. 2, the suction table 22 can move on the XY plane relative to the optical device of the optical inspection device.

[振動吸収装置の構造]
図3Aから図3Cは、それぞれ、図1及び図2の振動吸収装置24の第1から第3の実施形態を示す。それらの図に示すように、振動吸収装置24a、24b及び24cは、さまざまな大きさの開口を持つ多数の小孔を持つ多孔質金属部材からなる。それらの多数の小孔は振動吸収装置24の上面から下面に連通する通気路として機能する。
[Structure of vibration absorber]
3A to 3C show first to third embodiments of the vibration absorbing device 24 of FIGS. 1 and 2, respectively. As shown in these drawings, the vibration absorbing devices 24a, 24b and 24c are made of a porous metal member having a large number of small holes having openings of various sizes. The large number of small holes function as an air passage communicating from the upper surface to the lower surface of the vibration absorbing device 24.

多孔質金属部材はスポンジのように中に無数の小孔のあいた構造の金属で、金属的性質と気孔特有の性質とを備える複合材料からなる。多孔質金属部材の中でも、例えば、複雑で鋭利な形状を持つ切削細片を集めて特殊な圧搾成形によって製造した板状の多孔質鋳鉄は、一般的な多孔質金属と異なり、切削細片(又は金属細片)の形状が損なわれないように、切削細片が互いに点接触で結合された立体架橋構造を形成する。それにより、異なる大きさの多数の小孔を形成する壁面が構成され、表面にはそれらの小孔と連通する不規則なスリットが形成され、内部では、その壁面によって大きさと傾斜角とが異なる無数のパンタグラフが乱立している。それらの異なる大きさの多数の小孔によって通気路が構成されている。   The porous metal member is a metal having a structure with innumerable small pores, such as a sponge, and is made of a composite material having metallic properties and properties unique to pores. Among porous metal members, for example, plate-like porous cast iron produced by special compression molding by collecting cutting strips having a complicated and sharp shape is different from general porous metals in that cutting strips ( Alternatively, a three-dimensionally cross-linked structure is formed in which the cutting strips are bonded to each other by point contact so that the shape of the metal strips) is not impaired. As a result, a wall surface forming a large number of small holes of different sizes is formed, and irregular slits communicating with the small holes are formed on the surface, and the size and the inclination angle differ depending on the wall surface inside. Countless pantographs are raging. The air passage is constituted by a large number of small holes having different sizes.

言い換えると、通気路は、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の連通する小孔から構成されている。すなわち、切削細片である金属細片は、大きさが不揃いで、形状も一定ではなく、また、平坦な形状でもないため、金属細片同士が接触しても、広い面で接触するのではなく、非常に狭い面(点)で接触することになる。そのため、多数の金属細片が互いに点接触で結合されると、金属細片同士の間に多数の空間が形成されることになる。また、金属細片同士の点接触の位置は規則的な位置にはなく、さまざまな不定の位置にあるため、その空間の大きさも均一ではなく不揃いであり、さらに、それらの空間は互いに連通することになる。そのため、点接触で結合された多数の金属細片から構成された壁面によって形成された小孔は、異なる大きさの多数のもので、それらは連通したものである。   In other words, the air passage is composed of a number of communicating small holes of different sizes formed by wall surfaces composed of metal strips joined by point contact. That is, the metal strips that are cutting strips are uneven in size, the shape is not constant, and it is not a flat shape, so even if the metal strips contact each other, they do not come in contact on a wide surface However, the contact is made on a very narrow surface (point). Therefore, when a large number of metal strips are connected to each other by point contact, a large number of spaces are formed between the metal strips. In addition, the position of the point contact between the metal strips is not a regular position, but is in various indefinite positions, so the sizes of the spaces are not uniform and uneven, and the spaces communicate with each other. It will be. For this reason, the small holes formed by the wall surfaces composed of a large number of metal strips joined by point contact are a large number of different sizes, which are in communication.

多孔質鋳鉄は、そのような多孔質構造と立体架橋構造からきわめて大きな制振性を発揮することができる。また、板状の多孔質鋳鉄は、そのような構造のため、さまざまな大きさの圧縮力に対してさまざまなばね定数を示すように、広範囲にわたるばね定数を有する。そのような幅広いばね定数により、さまざまな大きさと方向の異なる振動が加わっても縦横方向に変位を吸収し、共振現象を起こさないという特性を備える。多孔質金属部材の他の製造方法としては、例えば、金属粉末射出成形、粉末焼結、鍍金、発泡、中空球、ガス注入、繊維焼結等があるが、不揃いの大きさの多数の小孔を形成できるものであればどのような方法であってもよい。   Porous cast iron can exhibit extremely great vibration damping properties due to such a porous structure and a three-dimensionally crosslinked structure. Further, plate-like porous cast iron has a wide range of spring constants due to such a structure so as to exhibit various spring constants for various magnitudes of compressive force. With such a wide spring constant, even when vibrations of various sizes and directions are applied, the displacement is absorbed in the vertical and horizontal directions, and the resonance phenomenon does not occur. Other methods for producing a porous metal member include, for example, metal powder injection molding, powder sintering, plating, foaming, hollow sphere, gas injection, fiber sintering, etc., but a large number of irregularly sized small holes Any method may be used as long as it can be formed.

図3Aは、例えば、上向き、下向き、斜め方向等さまざまな方向を向く多数の切削細片が点接触により結合することにより、多数の小孔を形成する構造を概念的に示す。図中、振動吸収装置24aの内部の曲線の実線は、点接触で結合し合っている切削細片を簡略化して示すもので、小孔の壁面を構成する状態を示す。図中において、実線で表した壁面同士が交わっている個所が点接触する個所である。図3Aに、代表的に、小孔40と小孔41として示すように、振動吸収装置24a内には、異なる大きさの多数の小孔が任意の位置に配置されている。その図では、すべての小孔の大きさが異なっている。ただし、それに代えて、複数の同じ大きさの小孔のグループが任意に混在するように構成してもよい。多数の小孔の径は100μm以内であることが望ましい。   FIG. 3A conceptually shows a structure in which a large number of small holes are formed by joining a large number of cutting strips facing various directions such as upward, downward, and oblique directions by point contact. In the figure, the solid line of the curve inside the vibration absorbing device 24a is a simplified illustration of the cutting strips joined together by point contact, and shows the state of constituting the wall surface of the small hole. In the figure, the point where the wall surfaces represented by solid lines intersect is a point contact. As shown typically in FIG. 3A as small holes 40 and small holes 41, a large number of small holes of different sizes are arranged at arbitrary positions in the vibration absorbing device 24a. In the figure, all the small holes have different sizes. However, instead, a plurality of small hole groups having the same size may be arbitrarily mixed. The diameter of the large number of small holes is preferably within 100 μm.

振動吸収装置24aを形成する小孔の壁面は、切削細片の点接触によって形成されているため、広さや大きさや傾斜方向がさまざまである。そのため、振動吸収装置24aにさまざまな大きさや方向の振動が加えられても、切削細片がさまざまな方向へ変位することによって、そのようなさまざまな振動を吸収することができる。そのため、共振現象を起こすことがない。そのようにさまざまの大きさの小孔を有するため、振動吸収装置24aは、どのような周波数の振動であっても吸収することができる。また、例えば、約2kgf/mmから150kgf/mmまでというように広範囲のばね定数を有しており、それにより広範囲の圧縮力に対してさまざまなばね定数を示すため、弾力性に富む構造が達成されている。また、振動吸収装置24a内の多数の小孔は、その内部に向かって中くらいの疎、大きな密、中くらいの密、大きな疎、小さな密というように、密度が不規則に変化しているため、それらの小孔を形成する切削細片によって構成された壁面による制振の効果は高い。   Since the wall surface of the small hole forming the vibration absorbing device 24a is formed by point contact of the cutting strip, the width, size, and inclination direction are various. Therefore, even if vibrations of various sizes and directions are applied to the vibration absorbing device 24a, such various vibrations can be absorbed by the cutting strips being displaced in various directions. Therefore, no resonance phenomenon occurs. As such, the vibration absorbing device 24a can absorb vibrations of any frequency because it has small holes of various sizes. In addition, for example, it has a wide range of spring constants, for example, from about 2 kgf / mm to 150 kgf / mm, thereby showing various spring constants for a wide range of compressive forces, thus achieving a highly elastic structure. Has been. In addition, a large number of small holes in the vibration absorbing device 24a are irregularly changed toward the inside, such as medium sparse, large dense, medium dense, large sparse, and small dense. For this reason, the effect of vibration suppression by the wall surface constituted by the cutting strips forming these small holes is high.

また、吸引パイプ35内の圧力の変動が振動的であるため、その振動的な圧力の変動が振動吸収装置24aの小孔内にも伝わる。その際、小孔の大きさが異なっているため、その小孔内の空間を伝わる圧力の振動同士が干渉して相殺し合うことになる。その結果、振動吸収装置24aに載置される検査基板等には、そのような振動的な圧力の変動が伝わらなくなる。このような小孔の機能は、以下に詳説する図3B及び図3Cの構造の振動吸収装置24b、24cにおいても発揮される。   Further, since the pressure fluctuation in the suction pipe 35 is vibrational, the vibrational pressure fluctuation is also transmitted to the small hole of the vibration absorbing device 24a. At this time, since the sizes of the small holes are different, vibrations of pressure transmitted through the space in the small holes interfere with each other and cancel each other. As a result, such an oscillating pressure fluctuation is not transmitted to the inspection substrate or the like placed on the vibration absorbing device 24a. Such a small hole function is also exhibited in the vibration absorbing devices 24b and 24c having the structure shown in FIGS. 3B and 3C described in detail below.

図3Bは、概略、層LAと層LBとの2層から構成された振動吸収装置24bを示す。層LAの小孔42の大きさは、相対的に、層LBの小孔43よりも小さい。この場合、各層内においては、図3Aに示す振動吸収装置24aの場合と同様に、すべての小孔42,43の大きさが異なっている。ただし、それに代えて、各層内において、複数の同じ大きさの小孔のグループが任意に混在したものでもあってもよい。また、層LAの小孔42と層LBの小孔43との大きさが異なるが、各層内においてはすべての小孔が同じ大きさであるようにしてもよい。またさらに、図3Bに示す振動吸収装置24bでは、層LAの小孔42の大きさが層LBの小孔43よりも小さいが、逆に、層LBの小孔43の大きさが層LAの小孔42よりも小さくなるようにしてもよい。   FIG. 3B schematically shows a vibration absorber 24b composed of two layers of a layer LA and a layer LB. The size of the small holes 42 in the layer LA is relatively smaller than the small holes 43 in the layer LB. In this case, in each layer, the sizes of all the small holes 42 and 43 are different as in the case of the vibration absorbing device 24a shown in FIG. 3A. However, instead of this, a plurality of groups of small holes having the same size may be arbitrarily mixed in each layer. Further, although the sizes of the small holes 42 of the layer LA and the small holes 43 of the layer LB are different, all the small holes may be the same size in each layer. Furthermore, in the vibration absorber 24b shown in FIG. 3B, the size of the small hole 42 in the layer LA is smaller than the small hole 43 in the layer LB, but conversely, the size of the small hole 43 in the layer LB is smaller than that of the layer LA. It may be made smaller than the small hole 42.

図3Cは、概略、その図に向かって上から、層LB、層LA及び層LBというように3層から構成された振動吸収装置24cを示す。層LAの小孔45の大きさは、層LB44,46の小孔よりも小さい。各層内においては、図3Aに示す振動吸収装置24aの場合と同様に、すべての小孔の大きさは異なっている。ただし、それに代えて、各層内において、複数の同じ大きさの小孔のグループが任意に混在したものでもあってもよい。また、それに代えて、図3Bに示す振動吸収装置24bと同様に、層LAの小孔45と層LBの小孔44,46との大きさは異なるが、各層内においてはすべての小孔が同じ大きさであるようにしてもよい。図3Cに示す振動吸収装置24cでは、層LAの小孔45の大きさが層LBの小孔44,46よりも小さいが、逆に、層LBの小孔44,46の大きさが層LAの小孔45よりも小さくなるようにしてもよい。さらに、振動吸収装置24cの3層の間で小孔の大きさが異なるようにしてもよい。この実施例のように、2つの疎の層LBの間に、密の層LAが配置されるような構成では、層LAの小孔を形成する切削細片の密度が高いため、その層LAによって、振動吸収装置24cの強度を高めることができる。   FIG. 3C schematically shows a vibration absorbing device 24c composed of three layers such as a layer LB, a layer LA, and a layer LB from the top toward the figure. The size of the small holes 45 in the layer LA is smaller than the small holes in the layers LB44 and 46. In each layer, as in the case of the vibration absorber 24a shown in FIG. 3A, the sizes of all the small holes are different. However, instead, a plurality of small hole groups having the same size may be arbitrarily mixed in each layer. In place of this, similarly to the vibration absorber 24b shown in FIG. 3B, the small holes 45 of the layer LA and the small holes 44 and 46 of the layer LB are different in size, but all the small holes are formed in each layer. You may make it the same magnitude | size. In the vibration absorber 24c shown in FIG. 3C, the size of the small holes 45 in the layer LA is smaller than the small holes 44 and 46 in the layer LB, but conversely, the size of the small holes 44 and 46 in the layer LB is smaller than the layer LA. It may be made smaller than the small hole 45. Further, the size of the small holes may be different among the three layers of the vibration absorbing device 24c. In the configuration in which the dense layer LA is disposed between the two sparse layers LB as in this embodiment, since the density of the cutting strips forming the small holes of the layer LA is high, the layer LA Thus, the strength of the vibration absorbing device 24c can be increased.

[吸着テーブルの使用例]
図4は、基板検査用の光学検査装置10の一例を示す概略斜視図である。光学検査装置10は、板状部材の検査基板28が載せられた検査基板保持装置20と、光学装置14と、制御装置16とを備える。検査基板保持装置20は駆動モータ22a及び22bを備えており、それらによって、吸着テーブル22をX−Y方向の任意の位置に移動することができる。
[Usage table usage example]
FIG. 4 is a schematic perspective view showing an example of the optical inspection apparatus 10 for substrate inspection. The optical inspection device 10 includes an inspection substrate holding device 20 on which a plate-shaped inspection substrate 28 is mounted, an optical device 14, and a control device 16. The inspection board holding device 20 includes drive motors 22a and 22b, which can move the suction table 22 to an arbitrary position in the XY direction.

光学装置14は、光照射装置15と受光系17とを備える。光照射装置15は所定のピッチごとに位相変化する光を基板28に向けて照射するもので、受光系17は光照射装置15から出力された光を基板28まで導くとともに、それから反射した光を捕捉するものである。そのため、受光系17は、分光器18aと反射ミラー18b、18cと検査基板28から反射した光を捕捉するCCDカメラ19とを備える。また、図示していないが、分光器18aと反射ミラー18b、18cとのそれぞれの間に光を遮断する装置を備える。   The optical device 14 includes a light irradiation device 15 and a light receiving system 17. The light irradiation device 15 irradiates the substrate 28 with light that changes in phase at a predetermined pitch. The light receiving system 17 guides the light output from the light irradiation device 15 to the substrate 28 and reflects the light reflected therefrom. To capture. Therefore, the light receiving system 17 includes a spectroscope 18a, reflection mirrors 18b and 18c, and a CCD camera 19 that captures light reflected from the inspection substrate 28. Although not shown, a device for blocking light is provided between the spectroscope 18a and the reflection mirrors 18b and 18c.

制御装置16は、駆動モータ22a及び22bの動きの制御を行うとともに、光照射装
置15の光照射を制御し、また受光系17のCCDカメラ19によって受光した光を解析することによって検査基板28の状況を診断する。
The control device 16 controls the movement of the drive motors 22a and 22b, controls the light irradiation of the light irradiation device 15, and analyzes the light received by the CCD camera 19 of the light receiving system 17 to thereby analyze the inspection substrate 28. Diagnose the situation.

検査基板保持装置20の吸着テーブル22は、吸引パイプ35を経由して真空ポンプ等の吸引装置(図示せず)に接続されている。   The suction table 22 of the inspection substrate holding device 20 is connected to a suction device (not shown) such as a vacuum pump via a suction pipe 35.

図5は、吸着テーブル22上に検査基板28を載せた状態を示す側面図である。検査基板28の検査を行う場合、その図に示すように、吸着テーブル22の振動吸収装置24の上の無塵紙26の上に検査対象の検査基板28を載せる。この場合、図示していないが、振動吸収装置24から2本の位置決めピンが突出しており、また、その2本の位置決めピンが貫通する孔が無塵紙26及び検査基板28に設けられている。そのため、それらの孔にその2本の位置決めピンを挿通することによって、無塵紙26及び検査基板28の位置決めが行われる。   FIG. 5 is a side view showing a state where the inspection substrate 28 is placed on the suction table 22. When the inspection substrate 28 is inspected, as shown in the figure, the inspection substrate 28 to be inspected is placed on the dust-free paper 26 on the vibration absorbing device 24 of the suction table 22. In this case, although not shown, two positioning pins protrude from the vibration absorbing device 24, and holes through which the two positioning pins pass are provided in the dust-free paper 26 and the inspection substrate 28. Therefore, the dust-free paper 26 and the inspection substrate 28 are positioned by inserting the two positioning pins into the holes.

その状態で、吸引パイプ35に接続された図示せぬ真空吸引装置によってエアを吸引すると、振動吸収装置24a内では多数の小孔を通じて概略矢印で示すようなエアの流れが生じる。さらに、そのエアは無塵紙26の多数のエア通過経路を経由して吸引されるため、検査基板28がその無塵紙26に吸着されて位置的に固定されることになる。   In this state, when air is sucked by a vacuum suction device (not shown) connected to the suction pipe 35, an air flow as indicated by an arrow is generated in the vibration absorbing device 24a through a large number of small holes. Further, since the air is sucked through a large number of air passages of the dust-free paper 26, the inspection substrate 28 is attracted to the dust-free paper 26 and fixed in position.

無塵紙26のエア通過経路の大きさは、振動吸収装置24a内の多数の小孔よりも小さく、また、比較的均一の大きさなので、それを通過するエアが比較的均等に分散される。そのため、検査基板28は無塵紙26の全面で均等に吸引されることになる。   The size of the air passage path of the dust-free paper 26 is smaller than the large number of small holes in the vibration absorber 24a and is relatively uniform in size, so that the air passing therethrough is relatively evenly distributed. Therefore, the inspection substrate 28 is sucked evenly over the entire surface of the dust-free paper 26.

その状態で、図4に示すように、制御装置16によって駆動モータ22a及び22bを制御して吸着テーブル22をX及びY方向に移動して、基板上の所定の個所に検査用の光がその所定の個所に収束するようにする。   In this state, as shown in FIG. 4, the drive motors 22a and 22b are controlled by the control device 16 to move the suction table 22 in the X and Y directions, so that the inspection light is applied to predetermined locations on the substrate. It converges at a predetermined location.

次に、光照射装置15から光ビームを出力する。そのビームは分光器18aで直交する2方向に分光され、反射ミラー18b、18cで反射されて検査基板28上の所定の位置に集光される。その際、図示せぬ光経路の遮断装置によって、経路l1またはl2の一方の経路の光が検査基板28に到達するようにする。検査基板28の所定の位置から反射した光はCCD19で撮像され、制御装置16がその撮像信号に基づいて基板の状態を判定しそれを出力する。   Next, a light beam is output from the light irradiation device 15. The beam is split in two directions orthogonal to each other by the spectroscope 18a, reflected by the reflection mirrors 18b and 18c, and condensed at a predetermined position on the inspection substrate 28. At this time, the light of one of the paths 11 and 12 is made to reach the inspection substrate 28 by a light path blocking device (not shown). The light reflected from a predetermined position on the inspection board 28 is imaged by the CCD 19, and the control device 16 determines the state of the board based on the imaging signal and outputs it.

[その他]
以上、本発明に係る吸着テーブルの実施形態に関して説明したが、それらは例示であって、本発明はこれらに限定されるものではない。また、上記の実施例では、吸着テーブルを光学検査装置に用いた例を示したが、光学検査装置以外の例えばプローブを使用する基板検査装置等に用いることができる。また、本発明に係る吸着テーブルは、板状部材加工装置にも用いることができる。
[Others]
As mentioned above, although embodiment of the suction table concerning the present invention was described, they are illustrations and the present invention is not limited to these. In the above embodiment, an example in which the suction table is used in the optical inspection apparatus has been described. However, the suction table can be used in, for example, a substrate inspection apparatus using a probe other than the optical inspection apparatus. The suction table according to the present invention can also be used for a plate-shaped member processing apparatus.

また、この吸着テーブルは、載置された板状部材に振動を与えることなく、所定処理を行うことができるため、高い位置精度を提供する処理装置を提供することができる。   Moreover, since this adsorption | suction table can perform a predetermined process, without giving a vibration to the mounted plate-shaped member, it can provide the processing apparatus which provides a high positional accuracy.

当業者が、これら実施形態に対して容易になしえる追加・削除・変更・改良等は、本発明に含まれる。本発明の技術的範囲は、添付の特許請求の範囲の記載によって定められる。   Additions, deletions, changes, improvements, and the like that can be easily made by those skilled in the art to these embodiments are included in the present invention. The technical scope of the present invention is defined by the description of the appended claims.

図1は、本発明に係る吸着テーブルの構成の概要を説明するための側面断面図である。FIG. 1 is a side sectional view for explaining an outline of a configuration of a suction table according to the present invention. 図2は、本発明に係る吸着テーブルの構成の概要を説明するための斜視図である。FIG. 2 is a perspective view for explaining the outline of the configuration of the suction table according to the present invention. 図3Aは、本発明に係る吸着テーブルの第1の実施形態の一部断面図である。FIG. 3A is a partial cross-sectional view of the first embodiment of the suction table according to the present invention. 図3Bは、本発明に係る吸着テーブルの第2の実施形態の一部断面図である。FIG. 3B is a partial cross-sectional view of the second embodiment of the suction table according to the present invention. 図3Cは、本発明に係る吸着テーブルの第3の実施形態の一部断面図である。FIG. 3C is a partial cross-sectional view of a third embodiment of the suction table according to the present invention. 図4は、本発明に係る吸着テーブルを備える基板検査用の光学検査装置の一実施形態を示す概略斜視図である。FIG. 4 is a schematic perspective view showing an embodiment of an optical inspection apparatus for substrate inspection provided with a suction table according to the present invention. 図5は、本発明に係る吸着テーブルの使用例を示す側面断面図である。FIG. 5 is a side sectional view showing an example of use of the suction table according to the present invention.

符号の説明Explanation of symbols

10・・・基板検査用の光学検査装置
14・・・光学装置
17・・・受光系
20・・・検査基板保持装置
22・・・吸着テーブル
22a,22b・・・駆動モータ
24・・・振動吸収装置
26・・・無塵紙
28・・・検査基板
35・・・吸引パイプ
40,41,42,43,44,45,46・・・小孔
DESCRIPTION OF SYMBOLS 10 ... Optical inspection apparatus 14 for board | substrate inspection ... Optical apparatus 17 ... Light receiving system 20 ... Inspection board holding device 22 ... Suction table 22a, 22b ... Drive motor 24 ... Vibration Absorber 26 ... dustless paper 28 ... inspection substrate 35 ... suction pipes 40, 41, 42, 43, 44, 45, 46 ... small holes

Claims (9)

真空吸引手段に接続されて、被載置対象となる部材を保持する吸着テーブルに用いる板状の振動吸収装置であって、
一方側に前記被載置部材を載せ、他方側が前記真空吸引手段に接続され、
前記真空吸引手段との接続部位と前記一方側を連通連結する通気路を備え、
前記通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、前記真空吸引手段に起因する振動を吸収して前記被載置部材に振動が伝わることを防ぐ、振動吸収装置。
A plate-like vibration absorber that is connected to a vacuum suction means and is used for a suction table that holds a member to be placed.
Place the mounting member on one side, the other side is connected to the vacuum suction means,
An air passage that communicates and connects the connecting portion with the vacuum suction means and the one side;
The air passage is composed of a large number of small holes of different sizes formed by wall surfaces composed of metal strips joined by point contact, and absorbs vibration caused by the vacuum suction means to A vibration absorbing device that prevents vibration from being transmitted to the mounting member.
真空吸引手段に接続されて、被検査基板を保持する吸着テーブルに用いる板状の振動吸収装置であって、
一方側に前記被検査基板を載せ、他方側が前記真空吸引手段に接続され、
前記真空吸引手段との接続部位と前記一方側を連通連結する通気路を備え、
前記通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、前記真空吸引手段に起因する振動を吸収して前記被検査基板に振動が伝わることを防ぐ、振動吸収装置と、
該振動吸収装置の一方側に載せられたシート状部材であって該シート状部材の上に前記被検査基板が載せられるシート状部材とを備え、
前記シート状部材が、前記振動吸収装置の前記通気路と前記シート状部材の前記被検査基板が載せられる面とを連通する通気路を備え、該通気路が、前記振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引される、検査基板保持装置。
A plate-like vibration absorbing device connected to a vacuum suction means and used for a suction table that holds a substrate to be inspected,
Place the substrate to be inspected on one side, the other side is connected to the vacuum suction means,
An air passage that communicates and connects the connecting portion with the vacuum suction means and the one side;
The air passage is composed of a large number of small holes of different sizes formed by wall surfaces composed of metal strips joined by point contact, and absorbs vibration caused by the vacuum suction means to A vibration absorber that prevents vibration from being transmitted to the substrate to be inspected;
A sheet-like member placed on one side of the vibration-absorbing device, and the sheet-like member on which the substrate to be inspected is placed on the sheet-like member,
The sheet-like member includes an air passage that communicates the air passage of the vibration absorbing device and a surface of the sheet-like member on which the substrate to be inspected is placed, and the air passage passes through a small hole of the vibration absorbing device. The inspection substrate holding device is also formed in a small and uniform size, whereby air is evenly dispersed and sucked.
請求項1の振動吸収装置において、
前記多数の小孔は、開口径に応じて少なくとも3つにグループ化され、前記3つのグループが積層構造に配置されていることを特徴とする、振動吸収装置。
The vibration absorber according to claim 1.
The large number of small holes are grouped into at least three according to the opening diameter, and the three groups are arranged in a laminated structure.
請求項1の振動吸収装置において、
前記金属細片は、鋳鉄の切削細片であることを特徴とする、振動吸収装置。
The vibration absorber according to claim 1.
The vibration absorbing device, wherein the metal strip is a cut strip of cast iron.
請求項2の検査基板保持装置において、
前記シート状部材が、無塵紙であることを特徴とする、検査基板保持装置。
The inspection substrate holding apparatus according to claim 2,
The inspection substrate holding apparatus, wherein the sheet-like member is dust-free paper.
請求項1の振動吸収装置において、
前記多数の小孔の径が100μm以内である、振動吸収装置。
The vibration absorber according to claim 1.
The vibration absorbing device, wherein the diameter of the plurality of small holes is within 100 μm.
真空吸引手段に接続されて、被検査基板を保持する吸着テーブルと、
該吸着テーブルに設けられた板状の振動吸収装置であって、一方側に前記被検査基板を載せ、他方側が前記真空吸引手段に接続され、前記真空吸引手段との接続部位と前記一方側を連通連結する通気路を備え、前記通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、前記真空吸引手段に起因する振動を吸収して前記被検査基板に振動が伝わることを防ぐ、振動吸収装置と、
該振動吸収装置の一方側に載せられたシート状部材であって該シート状部材の上に前記被検査基板が載せられるシート状部材とを備え、
前記シート状部材が、前記振動吸収装置の前記通気路と前記シート状部材の前記被検査基板が載せられる面とを連通する通気路を備え、該通気路が、前記振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引され、さらに、
前記シート状部材に載せられた前記被検査基板に検査用の光を照射するとともに該被検査基板から反射した光を受け取る光学装置と、
前記吸着テーブル若しくは前記光学装置の一方、又は前記吸着テーブル及び前記光学装置の両方をX−Y面上で移動させる駆動装置と、
前記光学装置及び前記駆動装置の動作を制御するとともに前記光学装置が受け取った光を解析する制御装置とを備える、光学検査装置。
A suction table connected to a vacuum suction means and holding a substrate to be inspected;
A plate-like vibration absorber provided on the suction table, wherein the substrate to be inspected is placed on one side, the other side is connected to the vacuum suction means, and a connection site with the vacuum suction means and the one side are An air passage that communicates and connects, and the air passage is composed of a large number of small holes of different sizes formed by wall surfaces made of metal strips joined by point contact, and is connected to the vacuum suction means. A vibration absorbing device that absorbs the vibration caused and prevents the vibration from being transmitted to the substrate to be inspected;
A sheet-like member placed on one side of the vibration-absorbing device, and the sheet-like member on which the substrate to be inspected is placed on the sheet-like member,
The sheet-like member includes an air passage that communicates the air passage of the vibration absorbing device and a surface of the sheet-like member on which the substrate to be inspected is placed, and the air passage passes through a small hole of the vibration absorbing device. Is also formed in a small and uniform size, so that the air is evenly distributed and sucked,
An optical device that irradiates the inspection substrate placed on the sheet-like member with inspection light and receives light reflected from the inspection substrate;
A driving device for moving one of the suction table or the optical device, or both the suction table and the optical device on an XY plane;
An optical inspection apparatus comprising: a control device that controls operations of the optical device and the driving device and analyzes light received by the optical device.
真空吸引手段に接続されて、被加工部材を保持する吸着テーブルと、
該吸着テーブルに設けられた板状の振動吸収装置であって、一方側に前記被加工部材を載せ、他方側が前記真空吸引手段に接続され、前記真空吸引手段との接続部位と前記一方側を連通連結する通気路を備え、前記通気路が、点接触で結合された金属細片から構成された壁面によって形成された異なる大きさの多数の小孔から構成されていて、前記真空吸引手段に起因する振動を吸収して前記被加工部材に振動が伝わることを防ぐ、振動吸収装置と、
該振動吸収装置の一方側に載せられたシート状部材であって該シート状部材の上に前記被加工部材が載せられるシート状部材とを備え、
前記シート状部材が、前記振動吸収装置の前記通気路と前記シート状部材の前記被加工部材が載せられる面とを連通する通気路を備え、該通気路が、前記振動吸収装置の小孔よりも小さくて均一の大きさに形成されていて、それにより、空気が均等に分散されて吸引され、さらに、
該吸着テーブルに載置された前記被加工部材の表面に、所定処理を施すための処理手段と、
前記所定処理を施すために、前記吸着テーブルと前記処理手段を相対的に移動させる移動手段とを備える、加工装置。
A suction table connected to a vacuum suction means and holding a workpiece;
A plate-like vibration absorber provided on the suction table, wherein the workpiece is placed on one side, the other side is connected to the vacuum suction means, and a connection site with the vacuum suction means and the one side are An air passage that communicates and connects, and the air passage is composed of a large number of small holes of different sizes formed by wall surfaces made of metal strips joined by point contact, and is connected to the vacuum suction means. A vibration absorbing device that absorbs vibration caused by the vibration and prevents the vibration from being transmitted to the workpiece;
A sheet-like member placed on one side of the vibration absorbing device, the sheet-like member on which the workpiece is placed,
The sheet-like member includes an air passage that communicates the air passage of the vibration absorbing device and a surface of the sheet-like member on which the workpiece is placed, and the air passage is formed from a small hole of the vibration absorbing device. Is also formed in a small and uniform size, so that the air is evenly distributed and sucked,
Processing means for applying a predetermined process to the surface of the workpiece to be mounted on the suction table;
In order to perform the said predetermined process, the processing apparatus provided with the moving means which moves the said adsorption | suction table and the said process means relatively.
真空吸引手段に接続されて、被載置対象となる部材を保持する吸着テーブルに用いる板状の振動吸収装置であって、
一方側に前記被載置部材を載せ、他方側が前記真空吸引手段に接続され、
前記真空吸引手段との接続部位と前記一方側を連通連結する通気路を備え、
前記通気路が、点接触で金属細片を結合させて立体架橋構造を形成することにより異なる大きさの多数の小孔から構成されていて、前記真空吸引手段に起因する振動を吸収して前記被載置部材に振動が伝わることを防ぐ、振動吸収装置。
A plate-like vibration absorber that is connected to a vacuum suction means and is used for a suction table that holds a member to be placed.
Place the mounting member on one side, the other side is connected to the vacuum suction means,
An air passage that communicates and connects the connecting portion with the vacuum suction means and the one side;
The air passage is composed of a large number of small holes of different sizes by bonding metal strips by point contact to form a three-dimensionally cross-linked structure, and absorbs vibration caused by the vacuum suction means to A vibration absorbing device that prevents vibration from being transmitted to the mounting member.
JP2007287159A 2007-05-22 2007-11-05 Absorption table Pending JP2009000804A (en)

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US8409973B2 (en) 2010-06-25 2013-04-02 Semiconductor Energy Laboratory Co., Ltd. Separation apparatus, separation method, and method for manufacturing semiconductor element
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CN107598959A (en) * 2017-11-04 2018-01-19 无锡山秀科技有限公司 A kind of ultra-thin based plate vacuumizing and adsorbing device

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Publication number Priority date Publication date Assignee Title
US8409973B2 (en) 2010-06-25 2013-04-02 Semiconductor Energy Laboratory Co., Ltd. Separation apparatus, separation method, and method for manufacturing semiconductor element
CN111487110A (en) * 2020-04-28 2020-08-04 太原市罗塞塔石生物技术有限公司 Gas circuit and liquid circuit integrated module for attaching glass slide
CN111487110B (en) * 2020-04-28 2023-01-31 太原市罗塞塔石生物技术有限公司 Gas circuit and liquid circuit integrated module for attaching glass slide

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