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JP2008191060A - Device test data display - Google Patents

Device test data display Download PDF

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Publication number
JP2008191060A
JP2008191060A JP2007027429A JP2007027429A JP2008191060A JP 2008191060 A JP2008191060 A JP 2008191060A JP 2007027429 A JP2007027429 A JP 2007027429A JP 2007027429 A JP2007027429 A JP 2007027429A JP 2008191060 A JP2008191060 A JP 2008191060A
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test data
waveforms
calculation
display device
device test
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JP2007027429A
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JP4893946B2 (en
Inventor
Hironao Hatsutori
浩直 服部
Yoichiro Taguchi
陽一郎 田口
Kiyomi Muraoka
喜代美 村岡
Nobuhiro Kudo
信博 工藤
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Yokogawa Electric Corp
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Yokogawa Electric Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a device test data display capable of selection-assigning visually computation desired to be executed, and capable of improving operability so as to execute it easily with reduced procedures. <P>SOLUTION: This device test data display displays a plurality of data measured by an IC tester as a plurality of waveforms, computes the plurality of displayed waveforms to be displayed as another waveforms, and includes a computation expression display area for function-computing the plurality of waveforms. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、デバイステストデータ表示装置に関し、詳しくは測定データが波形として表示された少なくとも2つの波形について関数演算を行うに際し、操作の容易化をはかったデバイステストデータ表示装置に関するものである。   The present invention relates to a device test data display device, and more particularly to a device test data display device that facilitates operation when performing a function operation on at least two waveforms in which measurement data is displayed as waveforms.

液晶駆動ドライバ等のIC,LSI等のデバイスの特性測定に際しては、ICテスタ用解析ソフトウエアを使用して、ICテスタにおける測定データの解析を行っている。
その場合、例えばICテスタでICの特性を測定し、その測定データを表示装置に波形として表示している。
When measuring characteristics of devices such as ICs and LSIs such as liquid crystal drive drivers, analysis data of the IC tester is analyzed using IC tester analysis software.
In this case, for example, IC characteristics are measured by an IC tester, and the measurement data is displayed as a waveform on a display device.

図3(a)はそのような波形の一例を示す表示装置の正面図である。この例においては#1〜#4の4種類の波形データが一つの表示装置1に別々に表示された例を示している。
なお、テストデータは一つのICから複数のデータを得る場合の外に複数のICから得たデータを表示する場合もある。図2(b)は3つの測定データを一つの表示装置1aに表示した例を示すものである。
FIG. 3A is a front view of a display device showing an example of such a waveform. In this example, four types of waveform data # 1 to # 4 are separately displayed on one display device 1.
Note that the test data may display data obtained from a plurality of ICs in addition to obtaining a plurality of data from one IC. FIG. 2B shows an example in which three measurement data are displayed on one display device 1a.

図2(a,b)において、オペレータは波形表示後、演算を行いたいデータ波形を選択する。次に、解析ソフトウェアを用いて解析したい測定データの波形を指定する(図2の例では矢印Y、Y’で指定された#2と#3およびW2とW3)。   2A and 2B, the operator selects a data waveform to be calculated after displaying the waveform. Next, the waveform of the measurement data to be analyzed is specified using analysis software (# 2 and # 3 and W2 and W3 specified by arrows Y and Y 'in the example of FIG. 2).

次に、図では省略するが、演算内容が記載された別の画面を呼び出し、その中から実行したい演算を選択する。その結果、表示装置1に内蔵(または別に用意)された演算手段により選択した2つの波形の演算が実行される。その演算結果は別のデータとして生成され、結果のデータ波形が表示装置に追加表示される(演算結果の波形は省略している)。   Next, although omitted in the figure, another screen on which the content of the calculation is described is called, and an operation to be executed is selected from the screen. As a result, the calculation of the two waveforms selected by the calculation means built in (or prepared separately) in the display device 1 is executed. The calculation result is generated as other data, and the resulting data waveform is additionally displayed on the display device (the calculation result waveform is omitted).

ところで、上述の従来例においては、別画面に表示した実行したい演算の選択については、文字列によるリスト形式や演算の機能を意味する文字列の表示されたボタンアイコン等を選択することにより行っていた。そのため実行する演算を感覚的に指定することが難かしいという問題があった。   By the way, in the above-mentioned conventional example, selection of an operation to be executed displayed on a separate screen is performed by selecting a list format by character string or a button icon displaying a character string indicating a function of the operation. It was. Therefore, there is a problem that it is difficult to specify the operation to be executed sensuously.

また演算対象のデータ波形選択、実行する演算の選択、演算実行という手続きを経る必要があり、操作が煩雑になるという問題があった。
従って本発明は、実行したい演算を視覚的に選択、指定できるようにし、少ない手順で容易に実行できるよう操作性の改善をはかったデバイステストデータ表示装置を実現することを目標としている。
Further, it is necessary to go through procedures such as selection of a data waveform to be calculated, selection of an operation to be executed, and execution of the operation, resulting in a problem that the operation becomes complicated.
Accordingly, an object of the present invention is to realize a device test data display device that allows visual selection and designation of an operation to be executed and that is improved in operability so that it can be easily executed with few procedures.

このようなデバイステストデータ表示装置の先行技術としては例えば、下記の先行技術文献が知られている。   For example, the following prior art documents are known as prior arts of such a device test data display device.

特開2001−337133号公報JP 2001-337133 A 特開2002−221553号公報JP 2002-221553 A

本発明は上記問題点を解決するためになされたもので、請求項1記載のデバイステストデータ表示装置の発明においては、
ICテスタで測定した複数のデータを複数の波形として表示し、表示した複数の波形を演算して別の波形として表示するデバイステストデータ表示装置において、この表示装置に前記複数の波形の関数演算を行うための演算式表示エリアを設けたことを特徴とする。
The present invention was made to solve the above problems, and in the invention of the device test data display device according to claim 1,
In a device test data display device that displays a plurality of data measured by an IC tester as a plurality of waveforms, and calculates the displayed plurality of waveforms as a separate waveform, the function calculation of the plurality of waveforms is performed on the display device. An arithmetic expression display area for performing this is provided.

請求項2においては請求項1に記載のデバイステストデータ表示装置において、
前記演算式表示エリアには、標準装備として用意された演算ボタンの他に任意の関数演算を行うための演算ボタンを設けたことを特徴とする。
In claim 2, in the device test data display device according to claim 1,
The calculation expression display area is provided with a calculation button for performing arbitrary function calculation in addition to the calculation button prepared as standard equipment.

以上説明したことから明らかなように本発明の請求項1によれば、次のような効果がある。
表示装置に前記複数の波形の関数演算を行うための演算式表示エリアを設けたので、実行したい演算を視覚的に選択、指定できるようになり操作性が向上する
また、演算式を選択後、演算を実行するという手順が1つの操作で実行できるようになり操作性が向上する
As is apparent from the above description, according to claim 1 of the present invention, the following effects can be obtained.
Since the calculation device display area for performing the function calculation of the plurality of waveforms is provided on the display device, it becomes possible to visually select and specify the operation to be executed and the operability is improved. The procedure of executing calculations can be executed with a single operation, improving operability.

請求項2によれば、演算式表示エリアには、標準装備として用意された演算ボタンの他に任意の関数演算を行うための演算ボタンを設けたので、ユーザが独自の式に基づいて解析したい場合も容易に操作することができる。   According to claim 2, since the calculation expression display area is provided with calculation buttons for performing arbitrary function calculations in addition to the calculation buttons prepared as standard equipment, the user wants to analyze based on a unique expression. In some cases, it can be easily operated.

図1(a,b)は本発明の一実施例を示すもので、図3に示す従来例とは表示装置1,1aの画面の下方に演算式表示エリア2,2aを設けた点のみが異なっている。
この演算式表示エリア2,2aには選択した波形番号(#2と#3およびW2とW3)と演算式を示した複数のボタン(アイコン)3,3aが表示され、所望のボタン(アイコン)を押圧することにより、そのボタンに示された演算が行われる。
1 (a) and 1 (b) show an embodiment of the present invention. The conventional example shown in FIG. 3 is different from the conventional example in that arithmetic expression display areas 2 and 2a are provided below the screens of the display devices 1 and 1a. Is different.
A plurality of buttons (icons) 3 and 3a indicating the selected waveform number (# 2 and # 3 and W2 and W3) and the arithmetic expression are displayed in the arithmetic expression display areas 2 and 2a, and a desired button (icon) is displayed. Is pressed, the calculation indicated by the button is performed.

なお、図では簡略のために四則演算の式のみのボタンを示しているが、実際にはここに示したほかに多数の関数式からなるボタンが表示されている。   In the figure, for the sake of simplicity, only the buttons for the four arithmetic expressions are shown, but actually buttons other than those shown here are displayed.

図2は他の実施例を示すもので、この例においては演算式表示エリアの演算ボタンの中に標準仕様とは異なるユーザ独自の演算ボタンAを表示したものである。
なお、演算結果は別のデータとして生成され、結果のデータ波形が表示装置に追加表示される(演算結果の波形は省略している)。
FIG. 2 shows another embodiment. In this example, a user-specific calculation button A different from the standard specification is displayed in the calculation buttons in the calculation formula display area.
The calculation result is generated as separate data, and the resulting data waveform is additionally displayed on the display device (the calculation result waveform is omitted).

上述の構成によれば、実行したい演算を視覚的に選択、指定できるようにしたので、選択した波形の演算を少ない手順で容易に実行でき、操作性の改善をはかことができる。   According to the above-described configuration, since the operation to be executed can be visually selected and designated, the operation of the selected waveform can be easily executed with few procedures, and the operability can be improved.

なお、以上の説明は、本発明の説明および例示を目的として特定の好適な実施例を示したに過ぎない。例えば、演算式表示エリアは画面内であればどこにあってもよい。また、実施例では表示波形を4つ、または3つとしたが、この数よりも多くても少なくても良い。従って本発明は、上記実施例に限定されることなく、その本質から逸脱しない範囲で更に多くの変更、変形を含むものである。   The above description merely shows a specific preferred embodiment for the purpose of explanation and illustration of the present invention. For example, the arithmetic expression display area may be anywhere within the screen. In the embodiment, the number of display waveforms is four or three. However, the number may be larger or smaller than this number. Therefore, the present invention is not limited to the above-described embodiments, and includes many changes and modifications without departing from the essence thereof.

本発明のデバイステストデータ表示装置の一実施例を示す正面図である。It is a front view which shows one Example of the device test data display apparatus of this invention. 本発明のデバイステストデータ表示装置の他の実施例を示す正面図である。It is a front view which shows the other Example of the device test data display apparatus of this invention. 従来のデバイステストデータ表示装置の一例を示す正面図である。It is a front view which shows an example of the conventional device test data display apparatus.

符号の説明Explanation of symbols

1 表示装置
2 演算式表示エリア
3 演算ボタン
1 Display device 2 Calculation formula display area 3 Calculation button

Claims (2)

ICテスタで測定した複数のデータを複数の波形として表示し、表示した複数の波形を演算して別の波形として表示するデバイステストデータ表示装置において、この表示装置に前記複数の波形の関数演算を行うための演算式表示エリアを設けたことを特徴とするデバイステストデータ表示装置。   In a device test data display device that displays a plurality of data measured by an IC tester as a plurality of waveforms, and calculates the displayed plurality of waveforms as a separate waveform, the function calculation of the plurality of waveforms is performed on the display device. A device test data display device provided with an arithmetic expression display area for performing the operation. 前記演算式表示エリアには、標準装備として用意された演算ボタンの他に任意の関数演算を行うための演算ボタンを設けたことを特徴とする請求項1に記載のデバイステストデータ表示装置。   2. The device test data display device according to claim 1, wherein a calculation button for performing an arbitrary function calculation is provided in the calculation formula display area in addition to a calculation button prepared as standard equipment.
JP2007027429A 2007-02-07 2007-02-07 Device test data display device Expired - Fee Related JP4893946B2 (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58213257A (en) * 1983-05-19 1983-12-12 Sony Tektronix Corp Logic analyzer
JPS6158024A (en) * 1984-08-29 1986-03-25 Kawaguchiko Seimitsu Kk Computer system
JPS63108270A (en) * 1986-10-14 1988-05-13 テクトロニックス・インコーポレイテッド Selector for state of operation
JPH08335610A (en) * 1995-06-08 1996-12-17 Advantest Corp Semiconductor device analyzer
JPH0933571A (en) * 1995-07-24 1997-02-07 Advantest Corp Waveform observation device of trigger generation circuit of ic tester
JP2002221537A (en) * 2000-11-09 2002-08-09 Tektronix Inc Test measuring apparatus and test measuring method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58213257A (en) * 1983-05-19 1983-12-12 Sony Tektronix Corp Logic analyzer
JPS6158024A (en) * 1984-08-29 1986-03-25 Kawaguchiko Seimitsu Kk Computer system
JPS63108270A (en) * 1986-10-14 1988-05-13 テクトロニックス・インコーポレイテッド Selector for state of operation
JPH08335610A (en) * 1995-06-08 1996-12-17 Advantest Corp Semiconductor device analyzer
JPH0933571A (en) * 1995-07-24 1997-02-07 Advantest Corp Waveform observation device of trigger generation circuit of ic tester
JP2002221537A (en) * 2000-11-09 2002-08-09 Tektronix Inc Test measuring apparatus and test measuring method

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