JP2008151593A - Testing apparatus - Google Patents
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- JP2008151593A JP2008151593A JP2006338702A JP2006338702A JP2008151593A JP 2008151593 A JP2008151593 A JP 2008151593A JP 2006338702 A JP2006338702 A JP 2006338702A JP 2006338702 A JP2006338702 A JP 2006338702A JP 2008151593 A JP2008151593 A JP 2008151593A
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- cooling
- circuit board
- circuit boards
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Abstract
Description
æ¬çºæã¯ã被詊éšããã€ã¹ãè©Šéšããè©Šéšè£ 眮ã«é¢ãããç¹ã«æ¬çºæã¯ãè©Šéšè£ 眮ã®åè·¯åºæ¿ãå·åŽããå·åŽéšãåããè©Šéšè£ 眮ã«é¢ããã   The present invention relates to a test apparatus for testing a device under test. In particular, the present invention relates to a test apparatus including a cooling unit that cools a circuit board of the test apparatus.
被詊éšããã€ã¹ãè©Šéšããè©Šéšè£ 眮ã«ãããŠãè©Šéšè£ 眮ã®åè·¯åºæ¿ãå·åŽããå·åŽè£ 眮ãç¥ãããŠããïŒäŸãã°ç¹èš±æç®ïŒåç §ïŒãè©Šéšè£ 眮ã¯ãè€æ°ã®åè·¯åºæ¿ãæããå Žåãããããã®å Žåãããããã®åè·¯åºæ¿ãåå¥ã«éå±ã®ã·ãŒã«ãã±ãŒã¹ã«æ ŒçŽããŠãå·åŽããããšãèããããããã®å Žåãåè·¯åºæ¿ãšã被詊éšããã€ã¹çãšãæ¥ç¶ããã¹ããåè·¯åºæ¿ã®ã³ãã¯ã¿çããã·ãŒã«ãã±ãŒã¹ã®å€éšã«è¡šåºããããäŸãã°ãã³ãã¯ã¿ãåè·¯åºæ¿ã®ç«¯éšã«èšããããåè·¯éšåãåè·¯åºæ¿ã®å åŽã«èšããããŠããå Žåãã·ãŒã«ãã±ãŒã¹ã¯ãåè·¯åºæ¿ã®åè·¯éšåãèŠãããã«èšããããããŸããããããã®åè·¯åºæ¿ãåå¥ã«ã·ãŒã«ãã±ãŒã¹ã«æ ŒçŽããŠãå·åªã埪ç°ãããéå£ãåè·¯åºæ¿äžã«èšããŠå·åªã®æµè·¯ãçæããããšã«ãããåè·¯åºæ¿ã®å šäœãå¹çããå·åŽããããšãèããããã   In a test apparatus for testing a device under test, a cooling apparatus that cools a circuit board of the test apparatus is known (for example, see Patent Document 1). The test apparatus may have a plurality of circuit boards. In this case, it can be considered that each circuit board is individually stored in a metal shield case and cooled. In this case, in order to connect the circuit board and the device under test, the connector of the circuit board is exposed outside the shield case. For example, when the connector is provided at the end of the circuit board and the circuit part is provided inside the circuit board, the shield case is provided so as to cover the circuit part of the circuit board. It is also possible to efficiently cool the entire circuit board by individually storing each circuit board in a shield case and providing a partition wall for circulating the refrigerant on the circuit board to generate a refrigerant flow path. It is done.
ããããããããã®åè·¯åºæ¿ãåå¥ã«å·åŽããããšãã奜ãŸãããªãå ŽåãèãããããäŸãã°ãåè·¯åºæ¿ãåå¥ã«ã·ãŒã«ãã±ãŒã¹ã«æ ŒçŽããã®ã§ãå€æ°ã®åè·¯åºæ¿ãå·åŽããå Žåã«ãã·ãŒã«ãã±ãŒã¹ã®åã¿ã«ãããåè·¯åºæ¿ãèŒçœ®ããããã®ã¹ããŒã¹ã倧ãããªã£ãŠããŸãå Žåãèããããããã®ãããåè·¯åºæ¿ãèŒçœ®ããããã®ã¹ããŒã¹ãéãããŠããå Žåã«ãå€æ°ã®åè·¯åºæ¿ãåå¥ã«å·åŽããããšã¯ãå¿ ããã奜ãŸãããªãããŸããã·ãŒã«ãã±ãŒã¹ã¯ãåè·¯åºæ¿ã®äžéšãèŠãããã«èšããããã³ãã¯ã¿çãå€éšã«è¡šåºãããã®ã§ãè€æ°ã®åè·¯åºæ¿ãäžã€ã®ã·ãŒã«ãã±ãŒã¹ã§å·åŽããããšã¯å°é£ã§ããã   However, it may be undesirable to individually cool each circuit board. For example, since the circuit boards are individually stored in the shield case, when a large number of circuit boards are cooled, the space for mounting the circuit boards may be increased due to the thickness of the shield case. For this reason, when the space for mounting the circuit board is limited, it is not necessarily preferable to individually cool a large number of circuit boards. Further, since the shield case is provided so as to cover a part of the circuit board and the connector and the like are exposed to the outside, it is difficult to cool the plurality of circuit boards with one shield case.
ãŸããåè·¯åºæ¿äžã«éå£ãèšããããšãã奜ãŸãããªãå ŽåãèãããããäŸãã°ãåè·¯åºæ¿äžã«éå£ãèšããã®ã§ãåè·¯çŽ åãé 眮ããã¹ããŒã¹ãå§è¿«ãããŠããŸãããã®ãããå€æ°ã®åè·¯çŽ åãåè·¯åºæ¿ã«é 眮ããå Žåã«ãåè·¯åºæ¿äžã«éå£ãèšããããšã¯ãå¿ ããã奜ãŸãããªãã   In addition, it may be undesirable to provide a partition wall on the circuit board. For example, since the partition walls are provided on the circuit board, the space for arranging the circuit elements is compressed. For this reason, when arranging many circuit elements on a circuit board, it is not necessarily desirable to provide a partition on a circuit board.
ãã®ãããæ¬çºæã®äžã€ã®åŽé¢ã«ãããŠã¯ãäžèšã®èª²é¡ã解決ããè©Šéšè£ 眮ãæäŸããããšãç®çãšããããã®ç®çã¯ãè«æ±ã®ç¯å²ã«ãããç¬ç«é ã«èšèŒã®ç¹åŸŽã®çµã¿åããã«ããéæãããããŸãåŸå±é ã¯æ¬çºæã®æŽãªãæå©ãªå ·äœäŸãèŠå®ããã   Therefore, an object of one aspect of the present invention is to provide a test apparatus that solves the above problems. This object is achieved by a combination of features described in the independent claims. The dependent claims define further advantageous specific examples of the present invention.
äžèšèª²é¡ã解決ããããã«ãæ¬çºæã®ç¬¬ïŒã®åœ¢æ ã«ãããŠã¯ã被詊éšããã€ã¹ãè©Šéšããè©Šéšè£ 眮ã§ãã£ãŠãäžããããå¶åŸ¡ä¿¡å·ã«å¿ããŠè¢«è©Šéšããã€ã¹ã«äŸçµŠããè©Šéšä¿¡å·ãçæãã被詊éšããã€ã¹ã®åºåä¿¡å·ãåãåãè€æ°ã®åè·¯åºæ¿ãæãããã¹ãããããšãè€æ°ã®åè·¯åºæ¿ãæ ŒçŽããŠå·åŽããå·åŽéšãšã被詊éšããã€ã¹ãèŒçœ®ãã被詊éšããã€ã¹ãšåè·¯åºæ¿ãšã®éã§ä¿¡å·ãåãæž¡ãæ¥ç¶éšãšãåããå·åŽéšã¯ãè€æ°ã®åè·¯åºæ¿ãå éšã«æ ŒçŽããäžé¢åã³äžé¢ã«éå£ãæããå·åŽçäœãšãå·åŽçäœã®äžæ¹ã®éå£ãå°æ¢ããè€æ°ã®åè·¯åºæ¿ãšæ¥ç¶éšãšã®éã§ä¿¡å·ãåãæž¡ãè¡šé¢åŽããªã³ãåºæ¿ãšãå·åŽçäœã®ä»æ¹ã®éå£ãå°æ¢ããè€æ°ã®åè·¯åºæ¿ã«å¶åŸ¡ä¿¡å·ãäŸçµŠããè£é¢åŽããªã³ãåºæ¿ãšãå·åŽçäœã®å éšã«å·åŽæ¶²äœã埪ç°ãããå·åªäŸçµŠéšãšãæããè©Šéšè£ 眮ãæäŸããã   In order to solve the above problems, in a first aspect of the present invention, a test apparatus for testing a device under test generates a test signal to be supplied to the device under test in accordance with a given control signal. A test head having a plurality of circuit boards for receiving the output signals of the test device, a cooling unit for storing and cooling the plurality of circuit boards, and a device to be tested are placed between the device under test and the circuit boards. A cooling unit that houses a plurality of circuit boards therein, seals one opening of the cooling case, and a plurality of circuits. A front-side printed circuit board that passes signals between the circuit board and the connection section, a back-side printed circuit board that seals the other opening of the cooling housing and supplies control signals to a plurality of circuit boards, and a cooling housing Refrigerant that circulates cooling liquid inside Providing a test device having a feeding portion.
æ¬çºæã®ç¬¬ïŒã®åœ¢æ ã«ãããŠã¯ã被詊éšããã€ã¹ãè©Šéšããè©Šéšè£ 眮ã§ãã£ãŠãäžããããå¶åŸ¡ä¿¡å·ã«å¿ããŠè¢«è©Šéšããã€ã¹ã«äŸçµŠããè©Šéšä¿¡å·ãçæãã被詊éšããã€ã¹ã®åºåä¿¡å·ãåãåãè€æ°ã®åè·¯åºæ¿ãæãããã¹ãããããšãè€æ°ã®åè·¯åºæ¿ãæ ŒçŽããŠå·åŽããå·åŽéšãšã被詊éšããã€ã¹ãèŒçœ®ãã被詊éšããã€ã¹ãšåè·¯åºæ¿ãšã®éã§ä¿¡å·ãåãæž¡ãæ¥ç¶éšãšãåããå·åŽéšã¯ãè€æ°ã®åè·¯åºæ¿ãå éšã«æ ŒçŽããå·åŽçäœãšãå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåè·¯åºæ¿ã®é¢ã察åããããã«ä¿æããä¿æéšãšãå·åŽçäœã®å éšã«å·åŽæ¶²äœã埪ç°ãããå·åªäŸçµŠéšãšãå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåè·¯åºæ¿ã«ãã圢æãããããããã®åºæ¿éæµè·¯æ¯ã«èšãããã察å¿ããåºæ¿éæµè·¯ã«æµããå·åŽæ¶²äœã®æµéã調æŽããéå£ãšãæããè©Šéšè£ 眮ãæäŸããã   According to a second aspect of the present invention, there is provided a test apparatus for testing a device under test, which generates a test signal to be supplied to the device under test according to a given control signal and receives an output signal of the device under test. A test head having a circuit board, a cooling part for storing and cooling a plurality of circuit boards, and a connection part for placing a device under test and passing a signal between the device under test and the circuit board The cooling unit includes a cooling housing that stores a plurality of circuit boards therein, a holding unit that holds the surfaces of adjacent circuit boards facing each other inside the cooling housing, and a cooling unit that cools the inside of the cooling housing. Provided for each inter-substrate flow path formed by the adjacent circuit board in the coolant supply section for circulating the liquid and the cooling housing, and adjusts the flow rate of the cooling liquid flowing through the corresponding inter-substrate flow path With bulkhead Providing a test device having.
ãªããäžèšã®çºæã®æŠèŠã¯ãæ¬çºæã®å¿ èŠãªç¹åŸŽã®å šãŠãåæãããã®ã§ã¯ãªãããããã®ç¹åŸŽçŸ€ã®ãµãã³ã³ãããŒã·ã§ã³ããŸããçºæãšãªãããã   The above summary of the invention does not enumerate all the necessary features of the present invention, and sub-combinations of these feature groups can also be the invention.
以äžãçºæã®å®æœã®åœ¢æ ãéããŠæ¬çºæã説æãããã以äžã®å®æœåœ¢æ ã¯ç¹èš±è«æ±ã®ç¯å²ã«ãããçºæãéå®ãããã®ã§ã¯ãªãããŸãå®æœåœ¢æ ã®äžã§èª¬æãããŠããç¹åŸŽã®çµã¿åããã®å šãŠãçºæã®è§£æ±ºæ段ã«å¿ é ã§ãããšã¯éããªãã   Hereinafter, the present invention will be described through embodiments of the invention. However, the following embodiments do not limit the invention according to the scope of claims, and all combinations of features described in the embodiments are included. It is not necessarily essential for the solution of the invention.
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  FIG. 3 is a diagram illustrating an example of the AA Ⲡcross section illustrated in FIG. 2 in the
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  FIG. 6 shows an example of the reinforcing
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  The
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  FIG. 7 shows another example of a perspective view of the cooling
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  FIG. 8 is a diagram illustrating an example of the internal structure of the cooling
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éšã«ãããŠãé£æ¥ããåè·¯åºæ¿ïŒïŒã®é¢ã察åããããã«ãä¿æéšã«ããç¥å¹³è¡ã«ä¿æãããããŸããä¿æéšã¯ãåè·¯åºæ¿ïŒïŒã®é¢ãšãäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒãèšããããå·åŽçäœïŒïŒã®é¢ãšãç¥å¹³è¡ã«å¯Ÿåããããã«ãããããã®åè·¯åºæ¿ïŒïŒãä¿æãããããã«ãããé£æ¥ããåè·¯åºæ¿ïŒïŒã®éã«ãå·åŽæ¶²äœãæµããåºæ¿éæµè·¯ã圢æãããããŸããè€æ°ã®åè·¯åºæ¿ïŒïŒã®ãã¡ã䞡端ã«èšããããåè·¯åºæ¿ïŒïŒãšãå·åŽçäœïŒïŒã®æ£é¢åã³èé¢ãšã®éã«ããåæ§ã«å·åŽæ¶²äœãæµããåºæ¿éæµè·¯ã圢æãããã
  As described above, the
ãŸããä¿æéšã¯ãããããã®åè·¯åºæ¿ïŒïŒããå·åŽçäœïŒïŒã®äžé¢ïŒæ¬äŸã§ã¯ãè¡šé¢åŽããªã³ãåºæ¿ïŒïŒïŒåã³å·åŽçäœïŒïŒã®äžé¢ïŒæ¬äŸã§ã¯ãè£é¢åŽããªã³ãåºæ¿ïŒïŒïŒã«æ¥è§ŠãããŠä¿æãããäŸãã°ãããããã®åè·¯åºæ¿ïŒïŒã®ã¹ããªã³ã°ãã³ïŒïŒããå·åŽçäœïŒïŒã®äžé¢ã«æ¥è§ŠããããŸããããããã®åè·¯åºæ¿ïŒïŒã®ã³ãã¯ã¿ïŒïŒããå·åŽçäœïŒïŒã®äžé¢ã«æ¥è§Šããã
  In addition, the holding unit contacts each
ãŸããä¿æéšã¯ãããããã®åè·¯åºæ¿ïŒïŒããå·åŽçäœïŒïŒã®äžé¢åã³äžé¢ä»¥å€ã®é¢ãšæ¥è§Šãããã«ä¿æãããããã«ãããå·åŽçäœïŒïŒã®åŽé¢ïŒæ¬äŸã§ã¯ãå·åŽçäœïŒïŒã®ïŒé¢ã®ãã¡ãäžé¢ãäžé¢ãæ£é¢ãåã³èé¢ä»¥å€ã®ïŒã€ã®é¢ïŒãšãåè·¯åºæ¿ïŒïŒãšã®éã«ãå·åŽæ¶²äœãæµããå€åŽæµè·¯ã圢æãããã
  The holding unit holds each
ãã®ãããªæ§æã«ãããå·åŽçäœïŒïŒã®å
éšã«ãããŠãäŸçµŠãã€ãïŒïŒããäŸçµŠãããå·åŽæ¶²äœããå·åŽçäœïŒïŒã®åŽé¢ã«æ²¿ã£ã第ïŒå€åŽæµè·¯ïŒïŒïŒã«æµããããŸãã第ïŒå€åŽæµè·¯ïŒïŒïŒãããç¥çŽäº€ããããããã®åºæ¿éæµè·¯ïŒïŒïŒã«å·åŽæ¶²äœãæµããããããŠãããããã®åºæ¿éæµè·¯ïŒïŒïŒãééããå·åŽæ¶²äœããå·åŽçäœïŒïŒã®åŽé¢ã«æ²¿ã£ã第ïŒå€åŽæµè·¯ïŒïŒïŒã«æµããæåºãã€ãïŒïŒããæåºãããããã®ãããªæ§æã«ãããå·åŽçäœïŒïŒã®å
éšã«å·åŽæ¶²äœã埪ç°ãããããããã®åè·¯åºæ¿ïŒïŒãå·åŽããããšãã§ããã
  With such a configuration, the cooling liquid supplied from the
äœããäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒãèšããããå·åŽçäœïŒïŒã®é¢ããã®è·é¢ã倧ããåºæ¿éæµè·¯ïŒïŒïŒã¯ãåœè©²è·é¢ãããå°ããåºæ¿éæµè·¯ïŒïŒïŒã«æ¯ã¹ãå·åŽæ¶²äœã®æµéãå°ãããªãããšãèããããããã®ãããå·åŽéšïŒïŒã¯ãåºæ¿éæµè·¯ïŒïŒïŒæ¯ã«éå£ãèšãã察å¿ããåºæ¿éæµè·¯ïŒïŒïŒã«æµããå·åŽæ¶²äœã®æµéãç¥åçãšãªãããã«èª¿æŽããã
  However, the
ããããã®éå£ïŒïŒã¯ãå·åŽçäœïŒïŒã®åŽé¢ãšãåè·¯åºæ¿ïŒïŒãšã®éã«ãããããã®åºæ¿éæµè·¯ïŒïŒïŒã«å¯Ÿå¿ããŠèšãããããäŸãã°ãããããã®éå£ïŒïŒã¯ã第ïŒå€åŽæµè·¯ïŒïŒïŒããã察å¿ããåºæ¿éæµè·¯ïŒïŒïŒã«ãå·åŽæ¶²äœãééãããéå£éšïŒïŒã圢æããããã«èšããããŠããããŸããããããã®éå£ïŒïŒã¯ã察å¿ããåºæ¿éæµè·¯ïŒïŒïŒããã第ïŒå€åŽæµè·¯ïŒïŒïŒã«ãå·åŽæ¶²äœãééãããéå£éšïŒïŒã圢æããããã«èšããããŠããã
  Each
äŸãã°éå£ïŒïŒã¯ãå·åŽçäœïŒïŒã®äžé¢ããäžé¢ã«æž¡ã£ãŠåœ¢æããããæ¬äŸã§ã¯ãéå£ïŒïŒã¯ãè£é¢åŽããªã³ãåºæ¿ïŒïŒã®ãå·åŽçäœïŒïŒã®å
åŽã«è¡šåºããé¢ã«åºå®ãããäžã€è¡šé¢åŽããªã³ãåºæ¿ïŒïŒã®ãå·åŽçäœïŒïŒã®å
åŽã«è¡šåºããé¢ã«æ¥è§ŠããŠèšããããããŸããéå£ïŒïŒã¯ãå·åŽçäœïŒïŒã®åŽé¢ãšç¥å¹³è¡ã«å»¶äŒžããŠèšããããŠããã
  For example, the
ãŸããéå£ïŒïŒã¯ãããããã®åè·¯åºæ¿ïŒïŒã®ç«¯éšã®è¿åã«ãåè·¯åºæ¿ïŒïŒãšç¥çŽè¡ããŠèšããããŠãããããããã®éå£ïŒïŒã¯ãäžäœã«åœ¢æãããŠããããŸãåé¢ããŠåœ¢æãããŠããããåé¢ããŠåœ¢æãããå Žåãããããã®éå£ïŒïŒã®ééã«ããéå£éšïŒïŒããå·åŽæ¶²äœãééããã
  Further, the
ãŸããéå£ïŒïŒã¯ãããããã®éå£éšïŒïŒã®é¢ç©ããäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒããã®è·é¢ã«å¿ããé¢ç©ãšãªãããã«ãèšããããŠãããäŸãã°ããããã®éå£ïŒïŒã®é¢ç©ããäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒããã®è·é¢ã«å¿ããŠå°ããããããšã«ãããããããã®éå£éšïŒïŒã®é¢ç©ããäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒããã®è·é¢ã«ç¥æ¯äŸããŠå€§ããããŠããã
  The
ãŸããéå£ïŒïŒã¯ã察å¿ããåè·¯åºæ¿ïŒïŒã®æ¶è²»é»åã«å¿ããŠãéå£éšïŒïŒã®é¢ç©ã調æŽããããã«èšããããŠããããäŸãã°ã察å¿ããåè·¯åºæ¿ïŒïŒã®æ¶è²»é»åããã倧ããéå£éšïŒïŒã®é¢ç©ãããã倧ããããŠãããéå£ïŒïŒã¯ãåè·¯åºæ¿ïŒïŒã®æ¶è²»é»åã«å¿ããŠäº€æå¯èœã«èšããããŠãããäŸãã°ããããã®éå£ïŒïŒã¯ãè£é¢åŽããªã³ãåºæ¿ïŒïŒã«ãé¢ç©ãç°ãªãä»ã®éå£ïŒïŒãšäº€æå¯èœã«åºå®ãããŠããã
  The
ãŸããå·åŽéšïŒïŒã¯ãããããã®éå£éšïŒïŒã®é¢ç©ãã察å¿ããåè·¯åºæ¿ïŒïŒã®æ¶è²»é»åã«å¿ããŠå¶åŸ¡ããéå£å¶åŸ¡éšãæŽã«åããŠãããäŸãã°ããããã®éå£ïŒïŒã¯ãè£é¢åŽããªã³ãåºæ¿ïŒïŒã«åºå®ãããåºå®éšãšãåœè©²åºå®éšã«å¯ŸããŠã¹ã©ã€ãå¯èœã«èšããããã¹ã©ã€ãéšãšãæããŠãããéå£å¶åŸ¡éšã¯ãåœè©²ã¹ã©ã€ãéšãã¹ã©ã€ããããããšã«ãããéå£éšïŒïŒã®é¢ç©ã調æŽããŠããããã®ãããªæ§æã«ãããããããã®åºæ¿éæµè·¯ã«æµããå·åŽæ¶²äœã®æµéã調æŽããããšãã§ããããã®ãããããããã®åè·¯åºæ¿ïŒïŒãå¹çããå·åŽããããšãã§ããã
  The cooling
å³ïŒã¯ããã¹ããããïŒïŒã®æ§æã®ä»ã®äŸã瀺ãå³ã§ãããæ¬äŸã«ããããã¹ããããïŒïŒã¯ãè€æ°ã®å·åŽéšïŒïŒãåãããå³ïŒã«ç€ºããããã«ãäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒããå·åŽçäœïŒïŒã«ãããåäžã®é¢ã«èšããããšã«ãããè€æ°ã®å·åŽéšïŒïŒã䞊ã¹ãŠèŒçœ®ããããšãã§ãããã€ãŸããããããã®å·åŽéšïŒïŒã®ãäŸçµŠãã€ãïŒïŒåã³æåºãã€ãïŒïŒãèšããããŠããªãé¢ãé£ãåãããããšã«ãããè€æ°ã®å·åŽéšïŒïŒã䞊ã¹ãŠèŒçœ®ããããšãã§ããããã®ãããå·åŽéšïŒïŒãèšçœ®ãããã¹ããŒã¹ãäœæžããããšãã§ããã
  FIG. 9 is a diagram illustrating another example of the configuration of the
å³ïŒïŒã¯ãåè·¯åºæ¿ïŒïŒã®æ§æã®äžäŸã瀺ãå³ã§ãããåè·¯åºæ¿ïŒïŒã¯ãåè·¯çŽ åïŒïŒããã«ãã§çŽ åïŒïŒã枩床æ€åºéšïŒïŒãåã³åå¥æž©åºŠå¶åŸ¡éšïŒïŒãåããããã«ãã§çŽ åïŒïŒã¯ãåè·¯åºæ¿ïŒïŒã«èšããããåè·¯ã®ãã¡ãäºãå®ããããåè·¯çŽ åïŒïŒã®è¡šé¢ã«èšãããããäŸãã°ãã«ãã§çŽ åïŒïŒã¯ãé
å»¶çŽ åçã®ã枩床å€åã«å¯Ÿããç¹æ§å€åã倧ããåè·¯çŽ åïŒïŒã«èšããããŠããããã«ãã§çŽ åïŒïŒã¯ãé»å§ãå°å ãããããšã«ãããäžæ¹ã®é¢ã®ç±éãä»æ¹ã®é¢ã«ç§»åãããçŽ åã§ããã
  FIG. 10 is a diagram illustrating an example of the configuration of the
枩床æ€åºéšïŒïŒã¯ããã«ãã§çŽ åïŒïŒãèšããããåè·¯çŽ åïŒïŒã®æž©åºŠãæ€åºãããäŸãã°æž©åºŠæ€åºéšïŒïŒã¯ãåè·¯çŽ åïŒïŒã«èšããããç±é»å¯ŸããµãŒãã¹ã¿çã®æµæãæ€åºããããšã«ãããåè·¯çŽ åïŒïŒã®æž©åºŠãæ€åºããŠããã
  The
åå¥æž©åºŠå¶åŸ¡éšïŒïŒã¯ã枩床æ€åºéšïŒïŒãæ€åºããåè·¯çŽ åïŒïŒã®æž©åºŠã«åºã¥ããŠã察å¿ãããã«ãã§çŽ åïŒïŒãå¶åŸ¡ãããäŸãã°åå¥æž©åºŠå¶åŸ¡éšïŒïŒã¯ãåè·¯çŽ åïŒïŒããäºãå®ãããã枩床ãç¶æããããã«ããã«ãã§çŽ åïŒïŒã«äžããé»å§ã調æŽããããã®ãããªæ§æã«ãããå·åŽæ¶²äœã«ããå·åŽã«ã°ãã€ããæãå Žåã§ãã£ãŠããåè·¯åºæ¿ïŒïŒã粟床ããåäœãããããšãã§ããã
  The individual
以äžãæ¬çºæãå®æœã®åœ¢æ ãçšããŠèª¬æããããæ¬çºæã®æè¡çç¯å²ã¯äžèšå®æœã®åœ¢æ ã«èšèŒã®ç¯å²ã«ã¯éå®ãããªããäžèšå®æœã®åœ¢æ ã«ãå€æ§ãªå€æŽãŸãã¯æ¹è¯ãå ããããšãå¯èœã§ããããšãåœæ¥è ã«æããã§ããããã®æ§ãªå€æŽãŸãã¯æ¹è¯ãå ãã圢æ ãæ¬çºæã®æè¡çç¯å²ã«å«ãŸãåŸãããšããç¹èš±è«æ±ã®ç¯å²ã®èšèŒããæããã§ããã   As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above-described embodiment. It is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.
ïŒïŒã»ã»ã»æ¥ç¶éšãïŒïŒã»ã»ã»ã¡ã€ã³ãã¬ãŒã ãïŒïŒã»ã»ã»ãã¹ãããããïŒïŒã»ã»ã»å·åŽéšãïŒïŒã»ã»ã»å·åŽçäœãïŒïŒã»ã»ã»äŸçµŠãã€ããïŒïŒã»ã»ã»æåºãã€ããïŒïŒã»ã»ã»å·åªäŸçµŠéšãïŒïŒã»ã»ã»è¡šé¢åŽããªã³ãåºæ¿ãïŒïŒã»ã»ã»ã³ãã¯ã¿ãïŒïŒã»ã»ã»ããŒã«é
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ç·ãïŒïŒã»ã»ã»ç¬¬ïŒãã¢ããŒã«ãïŒïŒã»ã»ã»ç¬¬ïŒãã¢ããŒã«ãïŒïŒã»ã»ã»é
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DESCRIPTION OF
Claims (19)
äžããããå¶åŸ¡ä¿¡å·ã«å¿ããŠåèšè¢«è©Šéšããã€ã¹ã«äŸçµŠããè©Šéšä¿¡å·ãçæããåèšè¢«è©Šéšããã€ã¹ã®åºåä¿¡å·ãåãåãè€æ°ã®åè·¯åºæ¿ãæãããã¹ãããããšã
åèšè€æ°ã®åè·¯åºæ¿ãæ ŒçŽããŠå·åŽããå·åŽéšãšã
åèšè¢«è©Šéšããã€ã¹ãèŒçœ®ããåèšè¢«è©Šéšããã€ã¹ãšåèšåè·¯åºæ¿ãšã®éã§ä¿¡å·ãåãæž¡ãæ¥ç¶éšãš
ãåãã
åèšå·åŽéšã¯ã
åèšè€æ°ã®åè·¯åºæ¿ãå éšã«æ ŒçŽããäžé¢åã³äžé¢ã«éå£ãæããå·åŽçäœãšã
åèšå·åŽçäœã®äžæ¹ã®éå£ãå°æ¢ããåèšè€æ°ã®åè·¯åºæ¿ãšåèšæ¥ç¶éšãšã®éã§ä¿¡å·ãåãæž¡ãè¡šé¢åŽããªã³ãåºæ¿ãšã
åèšå·åŽçäœã®ä»æ¹ã®éå£ãå°æ¢ããåèšè€æ°ã®åè·¯åºæ¿ã«åèšå¶åŸ¡ä¿¡å·ãäŸçµŠããè£é¢åŽããªã³ãåºæ¿ãšã
åèšå·åŽçäœã®å éšã«å·åŽæ¶²äœã埪ç°ãããå·åªäŸçµŠéšãš
ãæããè©Šéšè£ 眮ã A test apparatus for testing a device under test,
A test head having a plurality of circuit boards for generating a test signal to be supplied to the device under test in response to a given control signal and receiving an output signal of the device under test;
A cooling unit for storing and cooling the plurality of circuit boards;
A mounting part for placing the device under test and passing a signal between the device under test and the circuit board;
The cooling part is
A plurality of circuit boards stored therein, and a cooling housing having openings on the upper surface and the lower surface;
Sealing one opening of the cooling housing, and a surface-side printed board that passes signals between the plurality of circuit boards and the connection part,
Sealing the other opening of the cooling housing and supplying the control signal to the plurality of circuit boards;
A test apparatus comprising: a refrigerant supply unit configured to circulate a cooling liquid inside the cooling casing.
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 1, wherein a hole wiring for transmitting a signal between the inside and the outside of the cooling housing is provided on the front surface side printed board and the back surface side printed board.
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 2, wherein the opening of the hole wiring is sealed with a conductive material.
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 2, wherein at least one hole wiring is provided for each circuit board.
ããããã®åèšåè·¯åºæ¿ã¯ãããããã®åèšäžç«¯ããåèšè¡šé¢åŽããªã³ãåºæ¿ã«åãã£ãŠãåèšåè·¯åºæ¿ã®ç«¯é¢ããçªåºããŠèšããããã¹ããªã³ã°ãã³ãæãã
åèšè¡šé¢åŽããªã³ãåºæ¿ã¯ãããããã®åèšã¹ããªã³ã°ãã³ã«å¯Ÿå¿ããäœçœ®ã«ãåèšããŒã«é ç·ãæãã
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The plurality of circuit boards are provided such that one end of each circuit board faces the front surface side printed board and the other end of each circuit board faces the back surface side printed board,
Each of the circuit boards has a spring pin provided so as to protrude from the end face of the circuit board toward the front surface side printed board from the one end.
The test apparatus according to claim 2, wherein the surface-side printed board has the hole wiring at a position corresponding to each of the spring pins.
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 5, wherein each of the circuit boards has a connector connected to the hole wiring of the back printed circuit board at the other end.
åºæ¿ã®å éšã«èšããããé ç·å±€ãšã
åèšåºæ¿ã®è¡šé¢ããåèšé ç·å±€ãŸã§èšãããã第ïŒãã¢ããŒã«ãšã
åèšåºæ¿ã®è£é¢ããåèšé ç·å±€ãŸã§èšãããã第ïŒãã¢ããŒã«ãš
ãæããè«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The hole wiring is
A wiring layer provided inside the substrate;
A first via hole provided from the surface of the substrate to the wiring layer;
The test apparatus according to claim 2, further comprising: a second via hole provided from the back surface of the substrate to the wiring layer.
è«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 1, wherein the front surface side printed board and the back surface side printed board are provided with a reinforcing material for each predetermined board area.
åèšå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåèšåè·¯åºæ¿ã®é¢ã察åããããã«ä¿æããä¿æéšãšã
åèšå·åŽçäœã®å éšã«å·åŽæ¶²äœã埪ç°ãããå·åªäŸçµŠéšãšã
åèšå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåèšåè·¯åºæ¿ã«ãã圢æãããããããã®åºæ¿éæµè·¯æ¯ã«èšãããã察å¿ããåèšåºæ¿éæµè·¯ã«æµããåèšå·åŽæ¶²äœã®æµéã調æŽããéå£ãš
ãæŽã«æããè«æ±é ïŒã«èšèŒã®è©Šéšè£ 眮ã The cooling part is
Inside the cooling housing, a holding part that holds the adjacent circuit board faces to face each other,
A coolant supply section for circulating a cooling liquid inside the cooling housing;
A partition that is provided for each inter-substrate flow path formed by the adjacent circuit boards inside the cooling housing and adjusts the flow rate of the cooling liquid flowing through the corresponding inter-substrate flow path. The test apparatus according to claim 1.
äžããããå¶åŸ¡ä¿¡å·ã«å¿ããŠåèšè¢«è©Šéšããã€ã¹ã«äŸçµŠããè©Šéšä¿¡å·ãçæããåèšè¢«è©Šéšããã€ã¹ã®åºåä¿¡å·ãåãåãè€æ°ã®åè·¯åºæ¿ãæãããã¹ãããããšã
åèšè€æ°ã®åè·¯åºæ¿ãæ ŒçŽããŠå·åŽããå·åŽéšãšã
åèšè¢«è©Šéšããã€ã¹ãèŒçœ®ããåèšè¢«è©Šéšããã€ã¹ãšåèšåè·¯åºæ¿ãšã®éã§ä¿¡å·ãåãæž¡ãæ¥ç¶éšãš
ãåãã
åèšå·åŽéšã¯ã
åèšè€æ°ã®åè·¯åºæ¿ãå éšã«æ ŒçŽããå·åŽçäœãšã
åèšå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåèšåè·¯åºæ¿ã®é¢ã察åããããã«ä¿æããä¿æéšãšã
åèšå·åŽçäœã®å éšã«å·åŽæ¶²äœã埪ç°ãããå·åªäŸçµŠéšãšã
åèšå·åŽçäœã®å éšã«ãããŠãé£æ¥ããåèšåè·¯åºæ¿ã«ãã圢æãããããããã®åºæ¿éæµè·¯æ¯ã«èšãããã察å¿ããåèšåºæ¿éæµè·¯ã«æµããåèšå·åŽæ¶²äœã®æµéã調æŽããéå£ãš
ãæããè©Šéšè£ 眮ã A test apparatus for testing a device under test,
A test head having a plurality of circuit boards for generating a test signal to be supplied to the device under test in response to a given control signal and receiving an output signal of the device under test;
A cooling unit for storing and cooling the plurality of circuit boards;
A mounting part for placing the device under test and passing a signal between the device under test and the circuit board;
The cooling part is
A cooling housing for storing the plurality of circuit boards therein;
Inside the cooling housing, a holding part that holds the adjacent circuit board faces to face each other,
A coolant supply section for circulating a cooling liquid inside the cooling housing;
A test provided in each of the inter-substrate flow paths formed by the adjacent circuit boards in the cooling casing, and a partition for adjusting the flow rate of the cooling liquid flowing in the corresponding inter-substrate flow path. apparatus.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 10, wherein the holding unit holds the circuit boards substantially in parallel.
åèšéå£ã¯ãåèšå·åŽçäœã®åèšä»ã®é¢ã®ãã¡ã®åèšåè·¯åºæ¿ãšç¥åçŽãªåŽé¢ãšãåèšåè·¯åºæ¿ãšã®éã«ãåèšå·åŽçäœã®åèšäžé¢ããåèšäžé¢ã«æž¡ã£ãŠåœ¢æããã
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The holding unit holds each circuit board in contact with the upper surface and the lower surface of the cooling housing and without contacting the other surfaces other than the upper surface and the lower surface of the cooling housing;
The partition is formed from the upper surface to the lower surface of the cooling housing between a side surface substantially perpendicular to the circuit board of the other surfaces of the cooling housing and the circuit board. The test apparatus according to claim 11.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The partition wall includes an outer channel formed along the side surface of the cooling housing at a position corresponding to each inter-substrate channel, and an inter-substrate channel formed by the adjacent circuit board. The test apparatus according to claim 12, further comprising openings for adjusting the flow rate of the cooling liquid flowing therebetween.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 13, further comprising an opening control unit that controls an area of each opening according to power consumption of the corresponding circuit board.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The refrigerant supply unit has a supply pipe for supplying the cooling liquid to the inside of the cooling casing, either on a front surface or a rear surface of the cooling casing facing the surface of the circuit board, and the cooling liquid The test apparatus according to claim 13, wherein both the discharge pipes that discharge to the outside of the cooling housing are connected.
åèšæåºãã€ãã¯ãåèšå·åŽçäœã®åèšæ£é¢åã¯èé¢ã®ããããäžæ¹ã®ãåèšäŸçµŠãã€ããšå¯Ÿè§ã®äœçœ®ã«æ¥ç¶ããã
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The supply pipe is connected to either one of the front or back of the cooling housing, near any vertex,
The test apparatus according to claim 15, wherein the discharge pipe is connected to a position diagonal to the supply pipe on either the front surface or the back surface of the cooling housing.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã 17. The test apparatus according to claim 16, wherein each opening of the partition wall has an area corresponding to a distance from the front surface or the back surface of the cooling housing to which the supply pipe and the discharge pipe are connected.
è«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The test apparatus according to claim 13, wherein the partition wall is provided to be exchangeable with another partition wall having a different area.
äºãå®ããããåè·¯çŽ åã®æž©åºŠãæ€åºãã枩床æ€åºéšãšã
åœè©²åè·¯çŽ åãå·åŽãããã«ãã§çŽ åãšã
åèšæž©åºŠæ€åºéšãæ€åºããåœè©²åè·¯çŽ åã®æž©åºŠã«åºã¥ããŠã察å¿ããåèšãã«ãã§çŽ åãå¶åŸ¡ããåå¥æž©åºŠå¶åŸ¡éšãš
ãæããè«æ±é ïŒïŒã«èšèŒã®è©Šéšè£ 眮ã The circuit board is
A temperature detecting unit for detecting a temperature of a predetermined circuit element;
A Peltier element for cooling the circuit element;
The test apparatus according to claim 10, further comprising: an individual temperature control unit that controls the corresponding Peltier element based on the temperature of the circuit element detected by the temperature detection unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006338702A JP2008151593A (en) | 2006-12-15 | 2006-12-15 | Testing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006338702A JP2008151593A (en) | 2006-12-15 | 2006-12-15 | Testing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2008151593A true JP2008151593A (en) | 2008-07-03 |
Family
ID=39653909
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006338702A Withdrawn JP2008151593A (en) | 2006-12-15 | 2006-12-15 | Testing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2008151593A (en) |
-
2006
- 2006-12-15 JP JP2006338702A patent/JP2008151593A/en not_active Withdrawn
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Legal Events
Date | Code | Title | Description |
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A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20100302 |