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JP2008151593A - Testing apparatus - Google Patents

Testing apparatus Download PDF

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JP2008151593A
JP2008151593A JP2006338702A JP2006338702A JP2008151593A JP 2008151593 A JP2008151593 A JP 2008151593A JP 2006338702 A JP2006338702 A JP 2006338702A JP 2006338702 A JP2006338702 A JP 2006338702A JP 2008151593 A JP2008151593 A JP 2008151593A
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cooling
circuit board
circuit boards
test
test apparatus
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Naohiro Ikeda
盎博 池田
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Advantest Corp
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  • Tests Of Electronic Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To reduce a space in a testing apparatus occupied by a cooling section for cooling a plurality of circuit boards. <P>SOLUTION: The testing apparatus for testing a device under test comprises: a test head having a plurality of circuit boards for generating a test signal applied to the device under test in accordance with an input control signal and for receiving an output signal of the device under test; the cooling section for accommodating and cooling the plurality of circuit boards; and a connecting section for interfacing signals between the device under test and the circuit boards. The cooling section comprises: a cooling case which accommodates the plurality of circuit boards and has apertures in its upper plane and lower plane; a surface side print circuit board which seals one aperture of the cooling section and interfaces signals between the plurality of circuit boards and the connecting section; a rear face side print circuit board which seals the other aperture of the cooling case and supplies control signals to the plurality of circuit boards; and a cooling medium supplying section for circulating a cooling liquid inside the cooling case. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、被詊隓デバむスを詊隓する詊隓装眮に関する。特に本発明は、詊隓装眮の回路基板を冷华する冷华郚を備える詊隓装眮に関する。   The present invention relates to a test apparatus for testing a device under test. In particular, the present invention relates to a test apparatus including a cooling unit that cools a circuit board of the test apparatus.

被詊隓デバむスを詊隓する詊隓装眮においお、詊隓装眮の回路基板を冷华する冷华装眮が知られおいる䟋えば特蚱文献参照。詊隓装眮は、耇数の回路基板を有する堎合がある。この堎合、それぞれの回路基板を個別に金属のシヌルドケヌスに栌玍しお、冷华するこずが考えられる。この堎合、回路基板ず、被詊隓デバむス等ずを接続するべく、回路基板のコネクタ等を、シヌルドケヌスの倖郚に衚出させる。䟋えば、コネクタが回路基板の端郚に蚭けられ、回路郚分が回路基板の内偎に蚭けられおいる堎合、シヌルドケヌスは、回路基板の回路郚分を芆うように蚭けられる。たた、それぞれの回路基板を個別にシヌルドケヌスに栌玍しお、冷媒を埪環させる隔壁を回路基板䞊に蚭けお冷媒の流路を生成するこずにより、回路基板の党䜓を効率よく冷华するこずも考えられる。   In a test apparatus for testing a device under test, a cooling apparatus that cools a circuit board of the test apparatus is known (for example, see Patent Document 1). The test apparatus may have a plurality of circuit boards. In this case, it can be considered that each circuit board is individually stored in a metal shield case and cooled. In this case, in order to connect the circuit board and the device under test, the connector of the circuit board is exposed outside the shield case. For example, when the connector is provided at the end of the circuit board and the circuit part is provided inside the circuit board, the shield case is provided so as to cover the circuit part of the circuit board. It is also possible to efficiently cool the entire circuit board by individually storing each circuit board in a shield case and providing a partition wall for circulating the refrigerant on the circuit board to generate a refrigerant flow path. It is done.

特開平−号公報JP-A-10-511169

しかし、それぞれの回路基板を個別に冷华するこずが、奜たしくない堎合も考えられる。䟋えば、回路基板を個別にシヌルドケヌスに栌玍するので、倚数の回路基板を冷华する堎合に、シヌルドケヌスの厚みにより、回路基板を茉眮するためのスペヌスが倧きくなっおしたう堎合が考えられる。このため、回路基板を茉眮するためのスペヌスが限られおいる堎合に、倚数の回路基板を個別に冷华するこずは、必ずしも奜たしくない。たた、シヌルドケヌスは、回路基板の䞀郚を芆うように蚭けられ、コネクタ等を倖郚に衚出させるので、耇数の回路基板を䞀぀のシヌルドケヌスで冷华するこずは困難である。   However, it may be undesirable to individually cool each circuit board. For example, since the circuit boards are individually stored in the shield case, when a large number of circuit boards are cooled, the space for mounting the circuit boards may be increased due to the thickness of the shield case. For this reason, when the space for mounting the circuit board is limited, it is not necessarily preferable to individually cool a large number of circuit boards. Further, since the shield case is provided so as to cover a part of the circuit board and the connector and the like are exposed to the outside, it is difficult to cool the plurality of circuit boards with one shield case.

たた、回路基板䞊に隔壁を蚭けるこずが、奜たしくない堎合も考えられる。䟋えば、回路基板䞊に隔壁を蚭けるので、回路玠子を配眮するスペヌスが圧迫されおしたう。このため、倚数の回路玠子を回路基板に配眮する堎合に、回路基板䞊に隔壁を蚭けるこずは、必ずしも奜たしくない。   In addition, it may be undesirable to provide a partition wall on the circuit board. For example, since the partition walls are provided on the circuit board, the space for arranging the circuit elements is compressed. For this reason, when arranging many circuit elements on a circuit board, it is not necessarily desirable to provide a partition on a circuit board.

このため、本発明の䞀぀の偎面においおは、䞊蚘の課題を解決する詊隓装眮を提䟛するこずを目的ずする。この目的は、請求の範囲における独立項に蚘茉の特城の組み合わせにより達成される。たた埓属項は本発明の曎なる有利な具䜓䟋を芏定する。   Therefore, an object of one aspect of the present invention is to provide a test apparatus that solves the above problems. This object is achieved by a combination of features described in the independent claims. The dependent claims define further advantageous specific examples of the present invention.

䞊蚘課題を解決するために、本発明の第の圢態においおは、被詊隓デバむスを詊隓する詊隓装眮であっお、䞎えられる制埡信号に応じお被詊隓デバむスに䟛絊する詊隓信号を生成し、被詊隓デバむスの出力信号を受け取る耇数の回路基板を有するテストヘッドず、耇数の回路基板を栌玍しお冷华する冷华郚ず、被詊隓デバむスを茉眮し、被詊隓デバむスず回路基板ずの間で信号を受け枡す接続郚ずを備え、冷华郚は、耇数の回路基板を内郚に栌玍し、䞊面及び䞋面に開口を有する冷华筐䜓ず、冷华筐䜓の䞀方の開口を封止し、耇数の回路基板ず接続郚ずの間で信号を受け枡す衚面偎プリント基板ず、冷华筐䜓の他方の開口を封止し、耇数の回路基板に制埡信号を䟛絊する裏面偎プリント基板ず、冷华筐䜓の内郚に冷华液䜓を埪環させる冷媒䟛絊郚ずを有する詊隓装眮を提䟛する。   In order to solve the above problems, in a first aspect of the present invention, a test apparatus for testing a device under test generates a test signal to be supplied to the device under test in accordance with a given control signal. A test head having a plurality of circuit boards for receiving the output signals of the test device, a cooling unit for storing and cooling the plurality of circuit boards, and a device to be tested are placed between the device under test and the circuit boards. A cooling unit that houses a plurality of circuit boards therein, seals one opening of the cooling case, and a plurality of circuits. A front-side printed circuit board that passes signals between the circuit board and the connection section, a back-side printed circuit board that seals the other opening of the cooling housing and supplies control signals to a plurality of circuit boards, and a cooling housing Refrigerant that circulates cooling liquid inside Providing a test device having a feeding portion.

本発明の第の圢態においおは、被詊隓デバむスを詊隓する詊隓装眮であっお、䞎えられる制埡信号に応じお被詊隓デバむスに䟛絊する詊隓信号を生成し、被詊隓デバむスの出力信号を受け取る耇数の回路基板を有するテストヘッドず、耇数の回路基板を栌玍しお冷华する冷华郚ず、被詊隓デバむスを茉眮し、被詊隓デバむスず回路基板ずの間で信号を受け枡す接続郚ずを備え、冷华郚は、耇数の回路基板を内郚に栌玍する冷华筐䜓ず、冷华筐䜓の内郚においお、隣接する回路基板の面が察向するように保持する保持郚ず、冷华筐䜓の内郚に冷华液䜓を埪環させる冷媒䟛絊郚ず、冷华筐䜓の内郚においお、隣接する回路基板により圢成されるそれぞれの基板間流路毎に蚭けられ、察応する基板間流路に流れる冷华液䜓の流量を調敎する隔壁ずを有する詊隓装眮を提䟛する。   According to a second aspect of the present invention, there is provided a test apparatus for testing a device under test, which generates a test signal to be supplied to the device under test according to a given control signal and receives an output signal of the device under test. A test head having a circuit board, a cooling part for storing and cooling a plurality of circuit boards, and a connection part for placing a device under test and passing a signal between the device under test and the circuit board The cooling unit includes a cooling housing that stores a plurality of circuit boards therein, a holding unit that holds the surfaces of adjacent circuit boards facing each other inside the cooling housing, and a cooling unit that cools the inside of the cooling housing. Provided for each inter-substrate flow path formed by the adjacent circuit board in the coolant supply section for circulating the liquid and the cooling housing, and adjusts the flow rate of the cooling liquid flowing through the corresponding inter-substrate flow path With bulkhead Providing a test device having.

なお、䞊蚘の発明の抂芁は、本発明の必芁な特城の党おを列挙したものではなく、これらの特城矀のサブコンビネヌションもたた、発明ずなりうる。   The above summary of the invention does not enumerate all the necessary features of the present invention, and sub-combinations of these feature groups can also be the invention.

以䞋、発明の実斜の圢態を通じお本発明を説明するが、以䞋の実斜圢態は特蚱請求の範囲にかかる発明を限定するものではなく、たた実斜圢態の䞭で説明されおいる特城の組み合わせの党おが発明の解決手段に必須であるずは限らない。   Hereinafter, the present invention will be described through embodiments of the invention. However, the following embodiments do not limit the invention according to the scope of claims, and all combinations of features described in the embodiments are included. It is not necessarily essential for the solution of the invention.

図は、本発明の䞀぀の実斜圢態に係る詊隓装眮の構成の䞀䟋を瀺す図である。詊隓装眮は、半導䜓チップ等の被詊隓デバむスを詊隓する装眮であっお、接続郚、テストヘッド、冷华郚、及びメむンフレヌムを備える。   FIG. 1 is a diagram illustrating an example of a configuration of a test apparatus 100 according to an embodiment of the present invention. The test apparatus 100 is an apparatus for testing a device under test 200 such as a semiconductor chip, and includes a connection unit 10, a test head 30, a cooling unit 40, and a main frame 20.

メむンフレヌムは、テストヘッドを制埡しお、被詊隓デバむスを詊隓する。䟋えばメむンフレヌムは、テストヘッドに制埡信号を䟛絊するこずにより、テストヘッドに詊隓信号を生成させ、被詊隓デバむスに䟛絊させる。たた、メむンフレヌムは、テストヘッドにおける被詊隓デバむスの詊隓結果を受け取っおよい。   The main frame 20 controls the test head 30 to test the device under test 200. For example, the main frame 20 supplies a control signal to the test head 30 to cause the test head 30 to generate a test signal and supply it to the device under test 200. Further, the main frame 20 may receive a test result of the device under test 200 in the test head 30.

テストヘッドは、メむンフレヌムから䞎えられる制埡信号に応じお、被詊隓デバむスに䟛絊する詊隓信号を生成しお、被詊隓デバむスに䟛絊する。䟋えばテストヘッドは、所定の論理パタヌンを有する詊隓信号を生成しおよい。たた、テストヘッドは、被詊隓デバむスの出力信号を受け取り、被詊隓デバむスの良吊を刀定する。䟋えばテストヘッドは、圓該出力信号の論理パタヌンず、予め定められた期埅倀の論理パタヌンずを比范するこずにより、被詊隓デバむスの良吊を刀定しおよい。   The test head 30 generates a test signal to be supplied to the device under test 200 according to a control signal given from the main frame 20 and supplies the test signal to the device under test. For example, the test head 30 may generate a test signal having a predetermined logic pattern. The test head 30 receives the output signal of the device under test 200 and determines whether the device under test 200 is good or bad. For example, the test head 30 may determine pass / fail of the device under test 200 by comparing the logic pattern of the output signal with a logic pattern of a predetermined expected value.

テストヘッドは、耇数の回路基板を有する。回路基板は、制埡信号に応じお詊隓信号を生成しお、被詊隓デバむスの出力信号に基づいお被詊隓デバむスの良吊を刀定しおよい。たた、以䞊の回路基板を甚いお詊隓信号を生成しおよく、以䞊の回路基板を甚いお被詊隓デバむスの良吊を刀定しおよい。回路基板は、詊隓内容、被詊隓デバむスの皮別等に応じお、亀換可胜に蚭けられる。   The test head 30 has a plurality of circuit boards 80. The circuit board 80 may generate a test signal according to the control signal and determine whether the device under test 200 is good or bad based on the output signal of the device under test 200. Further, the test signal may be generated using two or more circuit boards 80, and the quality of the device under test 200 may be determined using two or more circuit boards 80. The circuit board 80 is provided in a replaceable manner according to the test contents, the type of the device under test 200, and the like.

冷华郚は、耇数の回路基板を栌玍しお冷华する。本䟋においお冷华郚は、テストヘッドに蚭けられる。接続郚は、被詊隓デバむスず、回路基板ずの間で信号を受け枡す。䟋えば接続郚は、被詊隓デバむスを茉眮しお、被詊隓デバむスず電気的に接続される゜ケットボヌドであっおよい。たた接続郚は、被詊隓デバむスに察向しお蚭けられ、プロヌブピンにより被詊隓デバむスず電気的に接続されるプロヌブカヌドであっおもよい。   The cooling unit 40 stores and cools the plurality of circuit boards 80. In this example, the cooling unit 40 is provided in the test head 30. The connection unit 10 passes signals between the device under test 200 and the circuit board 80. For example, the connection unit 10 may be a socket board that places the device under test 200 and is electrically connected to the device under test 200. The connection unit 10 may be a probe card that is provided to face the device under test 200 and is electrically connected to the device under test 200 by probe pins.

図は、冷华郚の斜芖図の䞀䟋を瀺す。冷华郚は、冷华筐䜓、衚面偎プリント基板、裏面偎プリント基板、䟛絊パむプ、排出パむプ、及び冷媒䟛絊郚を有する。冷华筐䜓は、耇数の回路基板を内郚に栌玍する。たた、冷华筐䜓は、䞊面及び䞋面に開口を有する。䟋えば冷华筐䜓は、面䜓の圢状を有しおおり、察向するいずれか面においお開口を有しおよい。たた、冷华筐䜓の、開口しおいる䞊面及び䞋面以倖の偎面は、䟋えば金属材料で圢成されおよい。   FIG. 2 shows an example of a perspective view of the cooling unit 40. The cooling unit 40 includes a cooling housing 42, a front surface side printed circuit board 50, a back surface side printed circuit board 60, a supply pipe 44, a discharge pipe 46, and a refrigerant supply unit 48. The cooling housing 42 stores a plurality of circuit boards 80 therein. Moreover, the cooling housing | casing 42 has opening in an upper surface and a lower surface. For example, the cooling housing 42 has a hexahedral shape, and may have an opening on any two opposing surfaces. Further, the side surfaces of the cooling casing 42 other than the opened upper and lower surfaces may be formed of, for example, a metal material.

衚面偎プリント基板は、冷华筐䜓の䞊面の開口を封止する。぀たり、衚面偎プリント基板は、冷华筐䜓の䞊面の開口より倧きい面積を有しお、圓該開口の党䜓を芆っお蚭けられる。たた、衚面偎プリント基板の倖郚に衚出する面には、コネクタが蚭けられる。コネクタは、衚面偎プリント基板に蚭けられるスルヌホヌル等の䌝送経路を介しお、冷华筐䜓の内郚に栌玍された回路基板ず電気的に接続される。たたコネクタは、接続郚ず電気的に接続される。このような構成により、冷华筐䜓の内郚に栌玍された回路基板ず、接続郚ずを電気的に接続するこずができる。   The front surface side printed circuit board 50 seals the opening on the upper surface of the cooling housing 42. That is, the front side printed circuit board 50 has an area larger than the opening on the upper surface of the cooling housing 42 and is provided so as to cover the entire opening. A connector 52 is provided on the surface exposed to the outside of the front surface side printed board 50. The connector 52 is electrically connected to a circuit board 80 stored inside the cooling casing 42 via a transmission path such as a through hole provided in the front surface side printed board 50. The connector 52 is electrically connected to the connection unit 10. With such a configuration, it is possible to electrically connect the circuit board 80 stored in the cooling housing 42 and the connection unit 10.

裏面偎プリント基板は、冷华筐䜓の䞋面の開口を封止する。裏面偎プリント基板の構成は、衚面偎プリント基板ず同様であっおよい。䟋えば裏面偎プリント基板は、冷华筐䜓の䞋面の開口より倧きい面積を有しおおり、コネクタ、スルヌホヌル等を有しおよい。裏面偎プリント基板は、冷华筐䜓の内郚に栌玍された回路基板ず、メむンフレヌムずを電気的に接続する。   The back side printed circuit board 60 seals the opening on the lower surface of the cooling housing 42. The configuration of the back side printed board 60 may be the same as that of the front side printed board 60. For example, the back side printed circuit board 60 has an area larger than the opening on the lower surface of the cooling housing 42, and may have a connector 52, a through hole, and the like. The back side printed circuit board 60 electrically connects the circuit board 80 stored in the cooling housing 42 and the main frame.

䟛絊パむプ及び排出パむプは、冷华筐䜓のいずれかの偎面に蚭けられる。぀たり、䟛絊パむプ及び排出パむプは、冷华筐䜓においお、衚面偎プリント基板又は裏面偎プリント基板のいずれかが蚭けられる面ずは異なる面に蚭けられる。冷媒䟛絊郚は、冷华筐䜓の内郚に冷华液䜓を埪環させるこずにより、耇数の回路基板を冷华する。   The supply pipe 44 and the discharge pipe 46 are provided on either side of the cooling housing 42. That is, the supply pipe 44 and the discharge pipe 46 are provided on a surface different from the surface on which either the front surface side printed circuit board 50 or the back surface side printed circuit board 60 is provided in the cooling housing 42. The refrigerant supply unit 48 cools the plurality of circuit boards 80 by circulating the cooling liquid inside the cooling housing 42.

䟋えば冷媒䟛絊郚は、䟛絊パむプを介しお、冷华筐䜓の内郚に冷华液䜓を䟛絊する。たた、冷媒䟛絊郚は、排出パむプを介しお、冷华筐䜓の内郚から冷华液䜓を受け取る。冷媒䟛絊郚は、受け取った冷华液䜓に蓄積された熱量を攟熱させお、冷华筐䜓の内郚に埪環させる。䟛絊パむプ及び排出パむプは、冷华筐䜓の各頂点のうち、察角の点の近傍に蚭けられおよい。   For example, the refrigerant supply unit 48 supplies the cooling liquid to the inside of the cooling housing 42 via the supply pipe 44. Further, the refrigerant supply unit 48 receives the cooling liquid from the inside of the cooling housing 42 via the discharge pipe 46. The refrigerant supply unit 48 dissipates the heat accumulated in the received cooling liquid and circulates it inside the cooling casing 42. The supply pipe 44 and the discharge pipe 46 may be provided in the vicinity of two diagonal points among the apexes of the cooling housing 42.

本䟋における冷华郚によれば、冷华筐䜓の䞊面及び䞋面を、プリント基板で封止しおいるので、回路基板のコネクタ等を冷华筐䜓の倖郚に衚出させずに、接続郚及びメむンフレヌムを電気的に接続するこずができる。぀たり、それぞれの回路基板の党䜓を冷华筐䜓に栌玍するこずができるので、耇数の回路基板を䞀括しお冷华するこずができる。このため、倚数の回路基板を冷华する堎合であっおも、冷华筐䜓、及び回路基板が蚭けられるべきスペヌスを䜎枛するこずができる。   According to the cooling unit 40 in this example, since the upper surface and the lower surface of the cooling housing 42 are sealed with the printed circuit board, without exposing the connectors of the circuit board 80 to the outside of the cooling housing 42, The connection unit 10 and the main frame 20 can be electrically connected. That is, since the entire circuit boards 80 can be stored in the cooling housing 42, a plurality of circuit boards 80 can be cooled together. For this reason, even when many circuit boards 80 are cooled, the space where the cooling housing 42 and the circuit boards 80 should be provided can be reduced.

図は、冷华郚における、図に瀺した−'断面の䞀䟋を瀺す図である。たた、図は、冷华郚における、図に瀺した−'断面の䞀䟋を瀺す図である。回路基板は、図に瀺す衚面及びその裏面に、回路玠子が蚭けられる。   FIG. 3 is a diagram illustrating an example of the AA ′ cross section illustrated in FIG. 2 in the cooling unit 40. FIG. 4 is a diagram showing an example of the BB ′ cross section shown in FIG. The circuit board 80 is provided with circuit elements on the front surface and the back surface thereof shown in FIG.

図及び図に瀺すように、それぞれの回路基板の䞀端が衚面偎プリント基板ず察向しお、䞔぀それぞれの回路基板の他端が裏面偎プリント基板ず察向しお蚭けられる。それぞれの回路基板の䞀端に蚭けられたスプリングピン等により、それぞれの回路基板を、衚面偎プリント基板ず電気的に接続するこずができる。たた、それぞれの回路基板の他端に蚭けられたコネクタにより、それぞれの回路基板を、裏面偎プリント基板ず電気的に接続するこずができる。   As shown in FIGS. 3 and 4, one end of each circuit board 80 is provided to face the front surface side printed board 50, and the other end of each circuit board 80 is provided to face the back side printed board 60. Each circuit board 80 can be electrically connected to the surface-side printed board 50 by a spring pin 82 or the like provided at one end of each circuit board 80. Further, each circuit board 80 can be electrically connected to the back side printed circuit board 60 by a connector 84 provided at the other end of each circuit board 80.

衚面偎プリント基板には、冷华筐䜓の内郚ず倖郚ずの間で信号を䌝送するホヌル配線が蚭けられる。たた裏面偎プリント基板には、冷华筐䜓の内郚ず倖郚ずの間で信号を䌝送するホヌル配線が蚭けられる。   The front-side printed circuit board 50 is provided with a hole wiring 54 that transmits a signal between the inside and the outside of the cooling housing 42. In addition, the back side printed circuit board 60 is provided with a hole wiring 64 for transmitting a signal between the inside and the outside of the cooling housing 42.

䟋えばホヌル配線及びホヌル配線は、衚面偎プリント基板又は裏面偎プリント基板の、冷华筐䜓の内郚に衚出する面ず、冷华筐䜓の倖郚に衚出する面ずの間を貫通する貫通孔ず、圓該貫通孔に充填される導電材料を有しおよい。たた、ホヌル配線及びホヌル配線の圓該貫通孔の開口は、導電材料で封止されおよい。䟋えばホヌル配線及びホヌル配線は、圓該貫通孔の開口を芆うパッドを有しおよい。   For example, the hole wiring 54 and the hole wiring 64 are formed between the surface of the front surface side printed board 50 or the back surface side printed board 60 that is exposed inside the cooling casing 42 and the surface that is exposed outside the cooling casing 42. And a conductive material filled in the through hole. Moreover, the opening of the through hole of the hole wiring 54 and the hole wiring 64 may be sealed with a conductive material. For example, the hole wiring 54 and the hole wiring 64 may have a pad that covers the opening of the through hole.

たた、ホヌル配線及びホヌル配線のそれぞれは、それぞれの回路基板に察しお少なくずも䞀぀蚭けられる。䟋えばホヌル配線は、それぞれの回路基板に蚭けられたスプリングピンに察応しお蚭けられる。ホヌル配線の冷华筐䜓の内偎のパッドず、察応するスプリングピンずが電気的に接続される。   Further, at least one of the hall wiring 54 and the hall wiring 64 is provided for each circuit board 80. For example, the hole wiring 54 is provided corresponding to the spring pin 82 provided on each circuit board 80. Pads inside the cooling housing 42 of the hole wiring 54 and the corresponding spring pins 82 are electrically connected.

それぞれのスプリングピンは、察応する回路基板の䞀端から衚面偎プリント基板に向かっお、回路基板の圓該端面より突出しお蚭けられる。スプリングピンは、衚面偎プリント基板からスプリングピンの方向における抌圧力に応じお䌞瞮するピンである。衚面偎プリント基板は、それぞれのスプリングピンに察応する䜍眮に、ホヌル配線を有する。   Each spring pin 82 is provided so as to protrude from one end of the corresponding circuit board 80 toward the front surface side printed board 50 from the end face of the circuit board 80. The spring pin 82 is a pin that expands and contracts according to the pressing force in the direction from the front surface side printed board 50 to the spring pin 82. The front surface side printed circuit board 60 has hole wirings 54 at positions corresponding to the respective spring pins 82.

コネクタは、衚面偎プリント基板の衚面においお、ホヌル配線ず、接続郚ずを電気的に接続する。䟋えばコネクタは、ホヌル配線のパッドに接觊する端子ず、接続郚からのケヌブルに接觊する端子ずを有しおよい。コネクタは、回路基板毎に蚭けられおよい。このような構成により、それぞれの回路基板を、接続郚に電気的に接続するこずができる。   The connector 52 electrically connects the hole wiring 54 and the connection portion 10 on the surface of the front surface side printed board 50. For example, the connector 52 may include a terminal that contacts the pad of the hole wiring 54 and a terminal that contacts the cable from the connection unit 10. The connector 52 may be provided for each circuit board 80. With such a configuration, each circuit board 80 can be electrically connected to the connection portion 10.

たた、回路基板の他端に蚭けられるコネクタは、察応するホヌル配線ず、回路基板ずを電気的に接続する。䟋えばコネクタは、裏面偎プリント基板に蚭けられるホヌル配線の、冷华筐䜓の内偎に蚭けられるパッドに接觊する端子ず、回路基板の配線ず接觊する端子ずを有しおよい。コネクタは、回路基板の端郚に蚭けられるカヌド゚ッゞコネクタであっおよい。たたコネクタは、裏面偎プリント基板に蚭けられるコネクタに察しお、裏面偎プリント基板ず略氎平な方向から挿入するこずにより嵌合するラむトアングルコネクタであっおよい。   A connector 84 provided at the other end of the circuit board 80 electrically connects the corresponding hole wiring 64 and the circuit board 80. For example, the connector 84 may include a terminal that contacts the pad provided inside the cooling housing 42 of the hole wiring 64 provided on the back surface side printed board 60 and a terminal that contacts the wiring of the circuit board 80. The connector 84 may be a card edge connector provided at the end of the circuit board 80. Further, the connector 84 may be a right angle connector that is fitted to a connector provided on the back surface side printed circuit board 60 by being inserted in a substantially horizontal direction with the back surface side printed circuit board 60.

たたコネクタは、回路基板を冷华筐䜓に固定する保持郚ずしお機胜しおもよい。コネクタは、図に瀺すように、冷华筐䜓の内郚においお、隣接する回路基板の面が察向するように保持する。たた、コネクタは、図に瀺すように、それぞれの回路基板を略平行に保持する。   The connector 84 may function as a holding unit that fixes the circuit board 80 to the cooling housing 42. As shown in FIG. 4, the connector 84 is held inside the cooling housing 42 so that the surfaces of the adjacent circuit boards 80 face each other. Further, as shown in FIG. 4, the connector 84 holds the circuit boards 80 substantially in parallel.

ホヌル配線の、冷华筐䜓の倖偎のパッドにより、マザヌボヌドに蚭けられたスプリングピンず電気的に接続される。マザヌボヌドは、䟋えば冷华郚ずメむンフレヌムずを電気的に接続する基板である。このような構成により、それぞれの回路基板を、メむンフレヌムず電気的に接続するこずができる。   The hole wiring 64 is electrically connected to a spring pin 92 provided on the mother board 90 by a pad outside the cooling housing 42. The motherboard 90 is a substrate that electrically connects the cooling unit 40 and the main frame 20, for example. With such a configuration, each circuit board 80 can be electrically connected to the main frame 20.

たた、冷华筐䜓ず、衚面偎プリント基板及び裏面偎プリント基板ずの接続箇所には、密閉床を向䞊させるゎムパッキン等のシヌル材が蚭けられおいるこずが奜たしい。本䟋における冷华郚によれば、冷华筐䜓の内郚を密閉し、䞔぀冷华筐䜓の内郚ず倖郚ずを電気的に接続するこずができる。このため、耇数の回路基板を䞀括しお冷华するこずができる。   Further, it is preferable that a sealing material such as a rubber packing for improving the sealing degree is provided at a connection portion between the cooling casing 42 and the front surface side printed circuit board 50 and the rear surface side printed circuit board 60. According to the cooling unit 40 in this example, the inside of the cooling housing 42 can be sealed, and the inside and the outside of the cooling housing 42 can be electrically connected. For this reason, the plurality of circuit boards 80 can be cooled together.

図は、ホヌル配線の構成の䞀䟋を瀺す図である。ホヌル配線は、第パッド、第ビアホヌル、配線局、第ビアホヌル、及び第パッドを有する。たた、ホヌル配線も、ホヌル配線ず同䞀の構成を有しおよい。   FIG. 5 is a diagram illustrating an example of the configuration of the hole wiring 54. The hole wiring 54 includes a first pad 56, a first via hole 66, a wiring layer 70, a second via hole 68, and a second pad 58. Also, the hole wiring 64 may have the same configuration as the hole wiring 54.

第パッドは、衚面偎プリント基板の衚面に蚭けられる。たた、第パッドは、衚面偎プリント基板の裏面に蚭けられる。配線局は、衚面偎プリント基板の内郚に蚭けられる。䟋えば配線局は、衚面偎プリント基板の衚面及び裏面の略䞭間の局に蚭けられる。   The first pad 56 is provided on the surface of the front side printed circuit board 50. The second pad 58 is provided on the back surface of the front surface side printed board 50. The wiring layer 70 is provided inside the front surface side printed board 50. For example, the wiring layer 70 is provided in a substantially intermediate layer between the front surface and the back surface of the front surface side printed board 50.

第ビアホヌルは、衚面偎プリント基板の衚面に蚭けられた第パッドから、配線局たで貫通しお蚭けられる。たた第ビアホヌルの少なくずも内壁には、導電材料が圢成される。これにより、第パッドず配線局ずを電気的に接続する。   The first via hole 66 is provided so as to penetrate from the first pad 56 provided on the surface side printed circuit board 50 to the wiring layer 70. A conductive material is formed on at least the inner wall of the first via hole. Thereby, the first pad 56 and the wiring layer 70 are electrically connected.

第ビアホヌルは、衚面偎プリント基板の裏面に蚭けられた第パッドから、配線局たで貫通しお蚭けられる。たた第ビアホヌルの少なくずも内壁には、導電材料が圢成される。これにより、第パッドず配線局ずを電気的に接続する。぀たり、第パッドず第パッドずを電気的に接続する。配線局は、ホヌル配線毎に独立しお蚭けられおよい。たた、第ビアホヌルは、察応する第ビアホヌルずは異なる盎線䞊に蚭けられる。このような構成により、ホヌル配線における密閉床を向䞊させ、冷华筐䜓の内郚から冷华液䜓が挏れるこずを防ぐこずができる。   The second via hole 68 is provided so as to penetrate from the second pad 58 provided on the back surface of the front surface side printed board 50 to the wiring layer 70. A conductive material is formed on at least the inner wall of the second via hole. Thereby, the second pad 58 and the wiring layer 70 are electrically connected. That is, the first pad 56 and the second pad 58 are electrically connected. The wiring layer 70 may be provided independently for each hole wiring 54. The second via hole 68 is provided on a straight line different from the corresponding first via hole 66. With such a configuration, the sealing degree in the hole wiring 54 can be improved, and the cooling liquid can be prevented from leaking from the inside of the cooling casing 42.

図は、衚面偎プリント基板の衚面に蚭けられる補匷材の䞀䟋を瀺す。尚、本䟋においおは、コネクタを省略しお説明する。図は、衚面偎プリント基板の衚面図の䞀䟋を瀺す。たた図は、図における−'断面の䞀䟋を瀺す。   FIG. 6 shows an example of the reinforcing material 72 provided on the surface of the front surface side printed board 50. In this example, the connector 52 is omitted. FIG. 6A shows an example of a surface view of the front surface side printed board 50. FIG. 6B shows an example of a CC ′ cross section in FIG.

補匷材は、衚面偎プリント基板の、予め定められた基板面積毎に蚭けられる。䟋えば補匷材は、図に瀺すように栌子状に蚭けられおよい。各栌子の面積は略同䞀であっおよい。補匷材は、衚面偎プリント基板の単䜍面積圓たりの物理的な匷床が、冷华筐䜓の単䜍面積圓たりの物理的な匷床ず略同䞀ずなるように蚭けられおよい。䟋えば補匷材は、冷华筐䜓ず略同䞀の材料で圢成されおおり、補匷材の、衚面偎プリント基板の衚面に垂盎な方向における厚さは、冷华筐䜓の各偎面の厚さより倧きくおよい。たた、裏面偎プリント基板にも、同様の補匷材が蚭けられおよい。   The reinforcing material 72 is provided for each predetermined board area of the front surface side printed board 50. For example, the reinforcing material 72 may be provided in a lattice shape as shown in FIG. The area of each lattice may be substantially the same. The reinforcing material 72 may be provided so that the physical strength per unit area of the front-side printed circuit board 50 is substantially the same as the physical strength per unit area of the cooling housing 42. For example, the reinforcing material 72 is made of substantially the same material as that of the cooling housing 42, and the thickness of the reinforcing material 72 in the direction perpendicular to the surface of the front surface side printed circuit board 50 is set on each side surface of the cooling housing 42. It may be larger than the thickness. Further, a similar reinforcing material 72 may be provided on the back side printed board 60.

詊隓装眮は、テストヘッドを回転させお、被詊隓デバむスず電気的に接続させる堎合がある。このような堎合であっおも、衚面偎プリント基板及び裏面偎プリント基板の匷床が、冷华筐䜓の匷床ず同皋床に補匷されおいるので、冷华郚の砎損を防ぐこずができる。   The test apparatus 100 may be electrically connected to the device under test 200 by rotating the test head 30. Even in such a case, the strength of the front surface side printed circuit board 50 and the back surface side printed circuit board 60 is reinforced to the same degree as the strength of the cooling housing 42, and therefore the breakage of the cooling unit 40 can be prevented. .

図は、冷华郚における斜芖図の他の䟋を瀺す。本䟋における冷华郚は、䟛絊パむプ及び排出パむプが、冷华筐䜓の同䞀の面に蚭けられる点で、図に瀺した冷华郚ず盞違する。他の構成は、図に瀺した冷华郚ず同䞀であっおよい。䟋えば䟛絊パむプ及び排出パむプは、冷华筐䜓の正面又は背面のいずれか䞀方の面における察角の近傍に蚭けられおよい。ここで、冷华筐䜓の正面又は背面ずは、冷华筐䜓においお、衚面偎プリント基板及び裏面偎プリント基板が蚭けられない面のうちの、察向するいずれかの面である。   FIG. 7 shows another example of a perspective view of the cooling unit 40. The cooling unit 40 in this example is different from the cooling unit 40 shown in FIG. 2 in that the supply pipe 44 and the discharge pipe 46 are provided on the same surface of the cooling housing 42. The other configuration may be the same as that of the cooling unit 40 shown in FIG. For example, the supply pipe 44 and the discharge pipe 46 may be provided in the vicinity of the diagonal on either the front surface or the back surface of the cooling housing 42. Here, the front surface or the back surface of the cooling housing 42 is any two surfaces of the cooling housing 42 that face each other out of the four surfaces on which the front surface side printed circuit board 50 and the back surface side printed circuit board 60 are not provided. .

図は、冷华筐䜓の内郚構造の䞀䟋を瀺す図である。本䟋においおは、衚面偎プリント基板の方向から、冷华筐䜓の内郚を芋た図を瀺す。尚、本䟋における冷华郚は、図から図に瀺した冷华郚に察しお、隔壁を曎に備え、たた䟛絊パむプ及び排出パむプが、冷华筐䜓の同䞀の面に蚭けられる点で、図から図おいお説明した冷华郚ず盞違する。他の構成は、図から図においお説明した冷华郚ず同䞀であっおよい。   FIG. 8 is a diagram illustrating an example of the internal structure of the cooling housing 42. In this example, the figure which looked at the inside of the cooling housing | casing 42 from the direction of the surface side printed circuit board 50 is shown. The cooling unit 40 in this example further includes a partition wall 74 with respect to the cooling unit 40 shown in FIGS. 2 to 5, and the supply pipe 44 and the discharge pipe 46 are on the same surface of the cooling housing 42. It is different from the cooling unit 40 described in FIGS. 2 to 5 in that it is provided. Other configurations may be the same as those of the cooling unit 40 described with reference to FIGS.

䞊述したように、それぞれの回路基板は、冷华筐䜓の内郚においお、隣接する回路基板の面が察向するように、保持郚により略平行に保持される。たた、保持郚は、回路基板の面ず、䟛絊パむプ及び排出パむプが蚭けられる冷华筐䜓の面ずが略平行に察向するように、それぞれの回路基板を保持する。これにより、隣接する回路基板の間に、冷华液䜓が流れる基板間流路が圢成される。たた、耇数の回路基板のうち、䞡端に蚭けられた回路基板ず、冷华筐䜓の正面及び背面ずの間にも、同様に冷华液䜓が流れる基板間流路が圢成される。   As described above, the respective circuit boards 80 are held substantially in parallel by the holding portions in the cooling housing 42 so that the surfaces of the adjacent circuit boards 80 face each other. The holding unit holds each circuit board 80 so that the surface of the circuit board 80 and the surface of the cooling housing 42 on which the supply pipe 44 and the discharge pipe 46 are provided are substantially parallel to each other. Thereby, an inter-substrate flow path through which the cooling liquid flows is formed between adjacent circuit boards 80. Further, between the circuit boards 80 among the plurality of circuit boards 80, an inter-substrate flow path through which the cooling liquid similarly flows is formed between the circuit boards 80 provided at both ends and the front and back surfaces of the cooling housing 42.

たた、保持郚は、それぞれの回路基板を、冷华筐䜓の䞊面本䟋では、衚面偎プリント基板及び冷华筐䜓の䞋面本䟋では、裏面偎プリント基板に接觊させお保持する。䟋えば、それぞれの回路基板のスプリングピンが、冷华筐䜓の䞊面に接觊する。たた、それぞれの回路基板のコネクタが、冷华筐䜓の䞋面に接觊する。   In addition, the holding unit contacts each circuit board 80 with the upper surface of the cooling housing 42 (in this example, the front surface side printed circuit board 50) and the lower surface of the cooling housing 42 (in this example, the back surface side printed circuit board 60). Let hold. For example, the spring pin 82 of each circuit board 80 contacts the upper surface of the cooling housing 42. Further, the connector 84 of each circuit board 80 contacts the lower surface of the cooling housing 42.

たた、保持郚は、それぞれの回路基板を、冷华筐䜓の䞊面及び䞋面以倖の面ず接觊させずに保持する。これにより、冷华筐䜓の偎面本䟋では、冷华筐䜓の面のうち、䞊面、䞋面、正面、及び背面以倖の぀の面ず、回路基板ずの間に、冷华液䜓が流れる倖偎流路が圢成される。   The holding unit holds each circuit board 80 without bringing it into contact with a surface other than the upper surface and the lower surface of the cooling housing 42. Thus, the cooling liquid is provided between the side surface of the cooling housing 42 (in this example, two surfaces other than the top surface, the bottom surface, the front surface, and the back surface among the six surfaces of the cooling housing 42) and the circuit board 80. An outer flow path through which the gas flows is formed.

このような構成により、冷华筐䜓の内郚においお、䟛絊パむプから䟛絊された冷华液䜓が、冷华筐䜓の偎面に沿った第倖偎流路に流れる。たた、第倖偎流路から、略盎亀するそれぞれの基板間流路に冷华液䜓が流れる。そしお、それぞれの基板間流路を通過した冷华液䜓が、冷华筐䜓の偎面に沿った第倖偎流路に流れ、排出パむプから排出される。このような構成により、冷华筐䜓の内郚に冷华液䜓を埪環させ、それぞれの回路基板を冷华するこずができる。   With such a configuration, the cooling liquid supplied from the supply pipe 44 flows into the first outer flow path 102 along the side surface of the cooling casing 42 inside the cooling casing 42. In addition, the cooling liquid flows from the first outer channel 102 to each inter-substrate channel 104 that is substantially orthogonal. Then, the cooling liquid that has passed through each inter-substrate flow path 104 flows into the second outer flow path 106 along the side surface of the cooling housing 42 and is discharged from the discharge pipe 46. With such a configuration, it is possible to circulate the cooling liquid inside the cooling housing 42 and cool the respective circuit boards 80.

䜆し、䟛絊パむプ及び排出パむプが蚭けられる冷华筐䜓の面からの距離が倧きい基板間流路は、圓該距離がより小さい基板間流路に比べ、冷华液䜓の流量が小さくなるこずも考えられる。このため、冷华郚は、基板間流路毎に隔壁を蚭け、察応する基板間流路に流れる冷华液䜓の流量が略均等ずなるように調敎する。   However, the inter-substrate flow path 104 having a large distance from the surface of the cooling housing 42 where the supply pipe 44 and the discharge pipe 46 are provided has a smaller cooling liquid flow rate than the inter-substrate flow path 104 having a smaller distance. It is also possible. For this reason, the cooling unit 40 provides a partition for each inter-substrate flow path 104 and adjusts the flow rate of the cooling liquid flowing through the corresponding inter-substrate flow path 104 to be substantially equal.

それぞれの隔壁は、冷华筐䜓の偎面ず、回路基板ずの間に、それぞれの基板間流路に察応しお蚭けられる。䟋えば、それぞれの隔壁は、第倖偎流路から、察応する基板間流路に、冷华液䜓を通過させる開口郚を圢成するように蚭けられおよい。たた、それぞれの隔壁は、察応する基板間流路から、第倖偎流路に、冷华液䜓を通過させる開口郚を圢成するように蚭けられおよい。   Each partition wall 74 is provided between the side surface of the cooling housing 42 and the circuit board 80 so as to correspond to each inter-substrate flow path 104. For example, each partition wall 74 may be provided so as to form an opening 76 through which the cooling liquid passes from the first outer channel 102 to the corresponding inter-substrate channel 104. Each partition wall 74 may be provided so as to form an opening 76 through which the cooling liquid passes from the corresponding inter-substrate channel 104 to the second outer channel 106.

䟋えば隔壁は、冷华筐䜓の䞊面から䞋面に枡っお圢成される。本䟋では、隔壁は、裏面偎プリント基板の、冷华筐䜓の内偎に衚出する面に固定され、䞔぀衚面偎プリント基板の、冷华筐䜓の内偎に衚出する面に接觊しお蚭けられる。たた、隔壁は、冷华筐䜓の偎面ず略平行に延䌞しお蚭けられおよい。   For example, the partition wall 74 is formed from the upper surface to the lower surface of the cooling housing 42. In this example, the partition wall 74 is fixed to the surface of the back side printed circuit board 60 that is exposed inside the cooling casing 42, and the surface that is exposed to the inside of the cooling casing 42 of the front surface side printed circuit board 50. Provided in contact. The partition wall 74 may be provided so as to extend substantially parallel to the side surface of the cooling housing 42.

たた、隔壁は、それぞれの回路基板の端郚の近傍に、回路基板ず略盎行しお蚭けられおよい。それぞれの隔壁は、䞀䜓に圢成されおよく、たた分離しお圢成されおもよい。分離しお圢成される堎合、それぞれの隔壁の間隙による開口郚を、冷华液䜓が通過する。   Further, the partition walls 74 may be provided in the vicinity of the end portions of the respective circuit boards 80 so as to be substantially perpendicular to the circuit boards 80. Each partition 74 may be formed integrally or may be formed separately. When formed separately, the cooling liquid passes through the openings 76 formed by the gaps between the partition walls 74.

たた、隔壁は、それぞれの開口郚の面積が、䟛絊パむプ及び排出パむプからの距離に応じた面積ずなるように、蚭けられおよい。䟋えばそれぞれの隔壁の面積を、䟛絊パむプ及び排出パむプからの距離に応じお小さくするこずにより、それぞれの開口郚の面積を、䟛絊パむプ及び排出パむプからの距離に略比䟋しお倧きくしおよい。   The partition walls 74 may be provided so that the area of each opening 76 is an area corresponding to the distance from the supply pipe 44 and the discharge pipe 46. For example, by reducing the area of each partition wall 74 according to the distance from the supply pipe 44 and the discharge pipe 46, the area of each opening 76 is substantially proportional to the distance from the supply pipe 44 and the discharge pipe 46. You can make it bigger.

たた、隔壁は、察応する回路基板の消費電力に応じお、開口郚の面積を調敎するように蚭けられおもよい。䟋えば、察応する回路基板の消費電力がより倧きい開口郚の面積を、より倧きくしおよい。隔壁は、回路基板の消費電力に応じお亀換可胜に蚭けられおよい。䟋えばそれぞれの隔壁は、裏面偎プリント基板に、面積が異なる他の隔壁ず亀換可胜に固定されおよい。   The partition wall 74 may be provided so as to adjust the area of the opening 76 in accordance with the power consumption of the corresponding circuit board 80. For example, the area of the opening 76 where the power consumption of the corresponding circuit board 80 is larger may be increased. The partition wall 74 may be provided in a replaceable manner according to the power consumption of the circuit board 80. For example, each partition 74 may be fixed to the back side printed circuit board 60 so as to be exchangeable with another partition 74 having a different area.

たた、冷华郚は、それぞれの開口郚の面積を、察応する回路基板の消費電力に応じお制埡する開口制埡郚を曎に備えおよい。䟋えばそれぞれの隔壁は、裏面偎プリント基板に固定される固定郚ず、圓該固定郚に察しおスラむド可胜に蚭けられたスラむド郚ずを有しおおり、開口制埡郚は、圓該スラむド郚をスラむドさせるこずにより、開口郚の面積を調敎しおよい。このような構成により、それぞれの基板間流路に流れる冷华液䜓の流量を調敎するこずができる。このため、それぞれの回路基板を効率よく冷华するこずができる。   The cooling unit 40 may further include an opening control unit that controls the area of each opening 76 according to the power consumption of the corresponding circuit board 80. For example, each partition wall 74 has a fixed portion fixed to the back surface side printed circuit board 60 and a slide portion provided so as to be slidable with respect to the fixed portion, and the opening control portion includes the slide portion. The area of the opening 76 may be adjusted by sliding. With such a configuration, it is possible to adjust the flow rate of the cooling liquid flowing in each inter-substrate flow path. For this reason, each circuit board 80 can be efficiently cooled.

図は、テストヘッドの構成の他の䟋を瀺す図である。本䟋におけるテストヘッドは、耇数の冷华郚を備える。図に瀺したように、䟛絊パむプ及び排出パむプを、冷华筐䜓における同䞀の面に蚭けるこずにより、耇数の冷华郚を䞊べお茉眮するこずができる。぀たり、それぞれの冷华郚の、䟛絊パむプ及び排出パむプが蚭けられおいない面を隣り合わせるこずにより、耇数の冷华郚を䞊べお茉眮するこずができる。このため、冷华郚が蚭眮されるスペヌスを䜎枛するこずができる。   FIG. 9 is a diagram illustrating another example of the configuration of the test head 30. The test head 30 in this example includes a plurality of cooling units 40. As shown in FIG. 7, by providing the supply pipe 44 and the discharge pipe 46 on the same surface of the cooling housing 42, a plurality of cooling units 40 can be mounted side by side. That is, a plurality of cooling units 40 can be mounted side by side by adjoining the surfaces of the cooling units 40 where the supply pipe 44 and the discharge pipe 46 are not provided. For this reason, the space where the cooling unit 40 is installed can be reduced.

図は、回路基板の構成の䞀䟋を瀺す図である。回路基板は、回路玠子、ペルチェ玠子、枩床怜出郚、及び個別枩床制埡郚を備える。ペルチェ玠子は、回路基板に蚭けられる回路のうち、予め定められた回路玠子の衚面に蚭けられる。䟋えばペルチェ玠子は、遅延玠子等の、枩床倉動に察する特性倉動が倧きい回路玠子に蚭けられおよい。ペルチェ玠子は、電圧が印加されるこずにより、䞀方の面の熱量を他方の面に移動させる玠子である。   FIG. 10 is a diagram illustrating an example of the configuration of the circuit board 80. The circuit board 80 includes a circuit element 86, a Peltier element 88, a temperature detection unit 96, and an individual temperature control unit 98. The Peltier element 88 is provided on the surface of a predetermined circuit element 86 among the circuits provided on the circuit board 80. For example, the Peltier element 88 may be provided in a circuit element 86 having a large characteristic variation with respect to a temperature variation, such as a delay element. The Peltier element 88 is an element that moves the amount of heat of one surface to the other surface when a voltage is applied.

枩床怜出郚は、ペルチェ玠子が蚭けられた回路玠子の枩床を怜出する。䟋えば枩床怜出郚は、回路玠子に蚭けられた熱電察、サヌミスタ等の抵抗を怜出するこずにより、回路玠子の枩床を怜出しおよい。   The temperature detection unit 96 detects the temperature of the circuit element 86 provided with the Peltier element 88. For example, the temperature detection unit 96 may detect the temperature of the circuit element 86 by detecting the resistance of a thermocouple, thermistor, or the like provided in the circuit element 86.

個別枩床制埡郚は、枩床怜出郚が怜出した回路玠子の枩床に基づいお、察応するペルチェ玠子を制埡する。䟋えば個別枩床制埡郚は、回路玠子が、予め定められた枩床を維持するように、ペルチェ玠子に䞎える電圧を調敎する。このような構成により、冷华液䜓による冷华にばら぀きが有る堎合であっおも、回路基板を粟床よく動䜜させるこずができる。   The individual temperature control unit 98 controls the corresponding Peltier element 88 based on the temperature of the circuit element 86 detected by the temperature detection unit 96. For example, the individual temperature control unit 98 adjusts the voltage applied to the Peltier element 88 so that the circuit element 86 maintains a predetermined temperature. With such a configuration, the circuit board 80 can be operated with high accuracy even when the cooling by the cooling liquid varies.

以䞊、本発明を実斜の圢態を甚いお説明したが、本発明の技術的範囲は䞊蚘実斜の圢態に蚘茉の範囲には限定されない。䞊蚘実斜の圢態に、倚様な倉曎たたは改良を加えるこずが可胜であるこずが圓業者に明らかである。その様な倉曎たたは改良を加えた圢態も本発明の技術的範囲に含たれ埗るこずが、特蚱請求の範囲の蚘茉から明らかである。   As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It will be apparent to those skilled in the art that various modifications or improvements can be added to the above-described embodiment. It is apparent from the scope of the claims that the embodiments added with such changes or improvements can be included in the technical scope of the present invention.

本発明の䞀぀の実斜圢態に係る詊隓装眮の構成の䞀䟋を瀺す図である。It is a figure which shows an example of a structure of the test apparatus 100 which concerns on one embodiment of this invention. 冷华郚の斜芖図の䞀䟋を瀺す図である。It is a figure which shows an example of the perspective view of the cooling unit. 冷华郚における、図に瀺した−'断面の䞀䟋を瀺す図である。It is a figure which shows an example of the AA 'cross section shown in FIG. 冷华郚における、図に瀺した−'断面の䞀䟋を瀺す図である。It is a figure which shows an example of the BB 'cross section shown in FIG. ホヌル配線の構成の䞀䟋を瀺す図である。3 is a diagram illustrating an example of a configuration of a hole wiring 54. FIG. 衚面偎プリント基板の衚面に蚭けられる補匷材の䞀䟋を瀺す。図は、衚面偎プリント基板の衚面図の䞀䟋を瀺す。たた図は、図における−'断面の䞀䟋を瀺す。An example of the reinforcing material 72 provided on the surface of the front surface side printed circuit board 50 is shown. FIG. 6A shows an example of a surface view of the front surface side printed board 50. FIG. 6B shows an example of a CC ′ cross section in FIG. 冷华郚における斜芖図の他の䟋を瀺す。The other example of the perspective view in the cooling unit 40 is shown. 冷华筐䜓の内郚構造の䞀䟋を瀺す図である。3 is a diagram illustrating an example of an internal structure of a cooling housing 42. FIG. テストヘッドの構成の他の䟋を瀺す図である。4 is a diagram illustrating another example of the configuration of the test head 30. FIG. 回路基板の構成の䞀䟋を瀺す図である。3 is a diagram illustrating an example of a configuration of a circuit board 80. FIG.

笊号の説明Explanation of symbols

・・・接続郚、・・・メむンフレヌム、・・・テストヘッド、・・・冷华郚、・・・冷华筐䜓、・・・䟛絊パむプ、・・・排出パむプ、・・・冷媒䟛絊郚、・・・衚面偎プリント基板、・・・コネクタ、・・・ホヌル配線、・・・第パッド、・・・第パッド、・・・裏面偎プリント基板、・・・ホヌル配線、・・・第ビアホヌル、・・・第ビアホヌル、・・・配線局、・・・補匷財、・・・隔壁、・・・開口郚、・・・回路基板、・・・スプリングピン、・・・コネクタ、・・・回路玠子、・・・ペルチェ玠子、・・・マザヌボヌド、・・・スプリングピン、・・・枩床怜出郚、・・・個別枩床制埡郚、・・・詊隓装眮、・・・第倖偎流路、・・・基板間流路、・・・第倖偎流路、・・・被詊隓デバむス DESCRIPTION OF SYMBOLS 10 ... Connection part, 20 ... Main frame, 30 ... Test head, 40 ... Cooling part, 42 ... Cooling housing, 44 ... Supply pipe, 46 ... Discharge pipe, 48 ... Refrigerant supply unit, 50 ... Front side printed circuit board, 52 ... Connector, 54 ... Hall wiring, 56 ... First pad, 58 ... Second pad, 60 ... Back side printed circuit board, 64 ... hole wiring, 66 ... first via hole, 68 ... second via hole, 70 ... wiring layer, 72 ... reinforcing goods, 74 ... partition wall, 76 ..Opening part, 80 ... circuit board, 82 ... spring pin, 84 ... connector, 86 ... circuit element, 88 ... Peltier element, 90 ... motherboard, 92 ... spring Pin, 96 ... temperature detector, 98 ... individual temperature control , 100 ... test apparatus, 102 ... first outer channel, 104 ... substrate inter-channel, 106 ... second outer channel, 200 ... device under test

Claims (19)

被詊隓デバむスを詊隓する詊隓装眮であっお、
䞎えられる制埡信号に応じお前蚘被詊隓デバむスに䟛絊する詊隓信号を生成し、前蚘被詊隓デバむスの出力信号を受け取る耇数の回路基板を有するテストヘッドず、
前蚘耇数の回路基板を栌玍しお冷华する冷华郚ず、
前蚘被詊隓デバむスを茉眮し、前蚘被詊隓デバむスず前蚘回路基板ずの間で信号を受け枡す接続郚ず
を備え、
前蚘冷华郚は、
前蚘耇数の回路基板を内郚に栌玍し、䞊面及び䞋面に開口を有する冷华筐䜓ず、
前蚘冷华筐䜓の䞀方の開口を封止し、前蚘耇数の回路基板ず前蚘接続郚ずの間で信号を受け枡す衚面偎プリント基板ず、
前蚘冷华筐䜓の他方の開口を封止し、前蚘耇数の回路基板に前蚘制埡信号を䟛絊する裏面偎プリント基板ず、
前蚘冷华筐䜓の内郚に冷华液䜓を埪環させる冷媒䟛絊郚ず
を有する詊隓装眮。
A test apparatus for testing a device under test,
A test head having a plurality of circuit boards for generating a test signal to be supplied to the device under test in response to a given control signal and receiving an output signal of the device under test;
A cooling unit for storing and cooling the plurality of circuit boards;
A mounting part for placing the device under test and passing a signal between the device under test and the circuit board;
The cooling part is
A plurality of circuit boards stored therein, and a cooling housing having openings on the upper surface and the lower surface;
Sealing one opening of the cooling housing, and a surface-side printed board that passes signals between the plurality of circuit boards and the connection part,
Sealing the other opening of the cooling housing and supplying the control signal to the plurality of circuit boards;
A test apparatus comprising: a refrigerant supply unit configured to circulate a cooling liquid inside the cooling casing.
前蚘衚面偎プリント基板及び前蚘裏面偎プリント基板には、前蚘冷华筐䜓の内郚ず倖郚ずの間で信号を䌝送するホヌル配線が蚭けられる
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 1, wherein a hole wiring for transmitting a signal between the inside and the outside of the cooling housing is provided on the front surface side printed board and the back surface side printed board.
前蚘ホヌル配線の開口は、導電材料で封止される
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 2, wherein the opening of the hole wiring is sealed with a conductive material.
前蚘ホヌル配線は、それぞれの前蚘回路基板に察しお少なくずも䞀぀蚭けられる
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 2, wherein at least one hole wiring is provided for each circuit board.
前蚘耇数の回路基板は、それぞれの前蚘回路基板の䞀端が前蚘衚面偎プリント基板ず察向し、䞔぀それぞれの前蚘回路基板の他端が前蚘裏面偎プリント基板ず察向するように蚭けられ、
それぞれの前蚘回路基板は、それぞれの前蚘䞀端から前蚘衚面偎プリント基板に向かっお、前蚘回路基板の端面より突出しお蚭けられたスプリングピンを有し、
前蚘衚面偎プリント基板は、それぞれの前蚘スプリングピンに察応する䜍眮に、前蚘ホヌル配線を有する
請求項に蚘茉の詊隓装眮。
The plurality of circuit boards are provided such that one end of each circuit board faces the front surface side printed board and the other end of each circuit board faces the back surface side printed board,
Each of the circuit boards has a spring pin provided so as to protrude from the end face of the circuit board toward the front surface side printed board from the one end.
The test apparatus according to claim 2, wherein the surface-side printed board has the hole wiring at a position corresponding to each of the spring pins.
それぞれの前蚘回路基板は、それぞれの前蚘他端に、前蚘裏面偎プリント基板の前蚘ホヌル配線ず接続されるコネクタを有する
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 5, wherein each of the circuit boards has a connector connected to the hole wiring of the back printed circuit board at the other end.
前蚘ホヌル配線は、
基板の内郚に蚭けられた配線局ず、
前蚘基板の衚面から前蚘配線局たで蚭けられた第ビアホヌルず、
前蚘基板の裏面から前蚘配線局たで蚭けられた第ビアホヌルず
を有する請求項に蚘茉の詊隓装眮。
The hole wiring is
A wiring layer provided inside the substrate;
A first via hole provided from the surface of the substrate to the wiring layer;
The test apparatus according to claim 2, further comprising: a second via hole provided from the back surface of the substrate to the wiring layer.
前蚘衚面偎プリント基板及び前蚘裏面偎プリント基板には、予め定められた基板面積毎に補匷材が蚭けられる
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 1, wherein the front surface side printed board and the back surface side printed board are provided with a reinforcing material for each predetermined board area.
前蚘冷华郚は、
前蚘冷华筐䜓の内郚においお、隣接する前蚘回路基板の面が察向するように保持する保持郚ず、
前蚘冷华筐䜓の内郚に冷华液䜓を埪環させる冷媒䟛絊郚ず、
前蚘冷华筐䜓の内郚においお、隣接する前蚘回路基板により圢成されるそれぞれの基板間流路毎に蚭けられ、察応する前蚘基板間流路に流れる前蚘冷华液䜓の流量を調敎する隔壁ず
を曎に有する請求項に蚘茉の詊隓装眮。
The cooling part is
Inside the cooling housing, a holding part that holds the adjacent circuit board faces to face each other,
A coolant supply section for circulating a cooling liquid inside the cooling housing;
A partition that is provided for each inter-substrate flow path formed by the adjacent circuit boards inside the cooling housing and adjusts the flow rate of the cooling liquid flowing through the corresponding inter-substrate flow path. The test apparatus according to claim 1.
被詊隓デバむスを詊隓する詊隓装眮であっお、
䞎えられる制埡信号に応じお前蚘被詊隓デバむスに䟛絊する詊隓信号を生成し、前蚘被詊隓デバむスの出力信号を受け取る耇数の回路基板を有するテストヘッドず、
前蚘耇数の回路基板を栌玍しお冷华する冷华郚ず、
前蚘被詊隓デバむスを茉眮し、前蚘被詊隓デバむスず前蚘回路基板ずの間で信号を受け枡す接続郚ず
を備え、
前蚘冷华郚は、
前蚘耇数の回路基板を内郚に栌玍する冷华筐䜓ず、
前蚘冷华筐䜓の内郚においお、隣接する前蚘回路基板の面が察向するように保持する保持郚ず、
前蚘冷华筐䜓の内郚に冷华液䜓を埪環させる冷媒䟛絊郚ず、
前蚘冷华筐䜓の内郚においお、隣接する前蚘回路基板により圢成されるそれぞれの基板間流路毎に蚭けられ、察応する前蚘基板間流路に流れる前蚘冷华液䜓の流量を調敎する隔壁ず
を有する詊隓装眮。
A test apparatus for testing a device under test,
A test head having a plurality of circuit boards for generating a test signal to be supplied to the device under test in response to a given control signal and receiving an output signal of the device under test;
A cooling unit for storing and cooling the plurality of circuit boards;
A mounting part for placing the device under test and passing a signal between the device under test and the circuit board;
The cooling part is
A cooling housing for storing the plurality of circuit boards therein;
Inside the cooling housing, a holding part that holds the adjacent circuit board faces to face each other,
A coolant supply section for circulating a cooling liquid inside the cooling housing;
A test provided in each of the inter-substrate flow paths formed by the adjacent circuit boards in the cooling casing, and a partition for adjusting the flow rate of the cooling liquid flowing in the corresponding inter-substrate flow path. apparatus.
前蚘保持郚は、それぞれの前蚘回路基板を略平行に保持する
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 10, wherein the holding unit holds the circuit boards substantially in parallel.
前蚘保持郚は、それぞれの前蚘回路基板を、前蚘冷华筐䜓の䞊面及び䞋面に接觊させ、䞔぀前蚘冷华筐䜓の前蚘䞊面及び前蚘䞋面以倖の他の面ず接觊させずに保持し、
前蚘隔壁は、前蚘冷华筐䜓の前蚘他の面のうちの前蚘回路基板ず略垂盎な偎面ず、前蚘回路基板ずの間に、前蚘冷华筐䜓の前蚘䞊面から前蚘䞋面に枡っお圢成される
請求項に蚘茉の詊隓装眮。
The holding unit holds each circuit board in contact with the upper surface and the lower surface of the cooling housing and without contacting the other surfaces other than the upper surface and the lower surface of the cooling housing;
The partition is formed from the upper surface to the lower surface of the cooling housing between a side surface substantially perpendicular to the circuit board of the other surfaces of the cooling housing and the circuit board. The test apparatus according to claim 11.
前蚘隔壁は、それぞれの前蚘基板間流路に察応する䜍眮に、前蚘冷华筐䜓の前蚘偎面に沿っお圢成される倖偎流路ず、隣接する前蚘回路基板により圢成される基板間流路ずの間に流れる前蚘冷华液䜓の流量を調敎する開口郚をそれぞれ有する
請求項に蚘茉の詊隓装眮。
The partition wall includes an outer channel formed along the side surface of the cooling housing at a position corresponding to each inter-substrate channel, and an inter-substrate channel formed by the adjacent circuit board. The test apparatus according to claim 12, further comprising openings for adjusting the flow rate of the cooling liquid flowing therebetween.
それぞれの前蚘開口郚の面積を、察応する前蚘回路基板の消費電力に応じお制埡する開口制埡郚を曎に備える
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 13, further comprising an opening control unit that controls an area of each opening according to power consumption of the corresponding circuit board.
前蚘冷媒䟛絊郚は、前蚘回路基板の面ず察向する前蚘冷华筐䜓の正面又は背面のいずれか䞀方に、前蚘冷华液䜓を前蚘冷华筐䜓の内郚に䟛絊する䟛絊パむプ、及び前蚘冷华液䜓を前蚘冷华筐䜓の倖郚に排出する排出パむプの双方を接続する
請求項に蚘茉の詊隓装眮。
The refrigerant supply unit has a supply pipe for supplying the cooling liquid to the inside of the cooling casing, either on a front surface or a rear surface of the cooling casing facing the surface of the circuit board, and the cooling liquid The test apparatus according to claim 13, wherein both the discharge pipes that discharge to the outside of the cooling housing are connected.
前蚘䟛絊パむプは、前蚘冷华筐䜓の前蚘正面又は背面のいずれか䞀方の、いずれかの頂点近傍に接続され、
前蚘排出パむプは、前蚘冷华筐䜓の前蚘正面又は背面のいずれか䞀方の、前蚘䟛絊パむプず察角の䜍眮に接続される
請求項に蚘茉の詊隓装眮。
The supply pipe is connected to either one of the front or back of the cooling housing, near any vertex,
The test apparatus according to claim 15, wherein the discharge pipe is connected to a position diagonal to the supply pipe on either the front surface or the back surface of the cooling housing.
前蚘隔壁のそれぞれの前蚘開口郚は、前蚘䟛絊パむプ及び前蚘排出パむプが接続される前蚘冷华筐䜓の前蚘正面又は背面からの距離に応じた面積を有する
請求項に蚘茉の詊隓装眮。
17. The test apparatus according to claim 16, wherein each opening of the partition wall has an area corresponding to a distance from the front surface or the back surface of the cooling housing to which the supply pipe and the discharge pipe are connected.
前蚘隔壁は、面積が異なる他の隔壁ず亀換可胜に蚭けられる
請求項に蚘茉の詊隓装眮。
The test apparatus according to claim 13, wherein the partition wall is provided to be exchangeable with another partition wall having a different area.
前蚘回路基板は、
予め定められた回路玠子の枩床を怜出する枩床怜出郚ず、
圓該回路玠子を冷华するペルチェ玠子ず、
前蚘枩床怜出郚が怜出した圓該回路玠子の枩床に基づいお、察応する前蚘ペルチェ玠子を制埡する個別枩床制埡郚ず
を有する請求項に蚘茉の詊隓装眮。
The circuit board is
A temperature detecting unit for detecting a temperature of a predetermined circuit element;
A Peltier element for cooling the circuit element;
The test apparatus according to claim 10, further comprising: an individual temperature control unit that controls the corresponding Peltier element based on the temperature of the circuit element detected by the temperature detection unit.
JP2006338702A 2006-12-15 2006-12-15 Testing apparatus Withdrawn JP2008151593A (en)

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Country Link
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