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Publication number
JP2007235891A5
JP2007235891A5 JP2006058365A JP2006058365A JP2007235891A5 JP 2007235891 A5 JP2007235891 A5 JP 2007235891A5 JP 2006058365 A JP2006058365 A JP 2006058365A JP 2006058365 A JP2006058365 A JP 2006058365A JP 2007235891 A5 JP2007235891 A5 JP 2007235891A5
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Japan
Prior art keywords
vertical line
correction
defect
temperature
image
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JP2006058365A
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JP2007235891A (en
JP4785564B2 (en
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Publication of JP2007235891A5 publication Critical patent/JP2007235891A5/ja
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Claims (6)

撮像素子の垂直転送部の欠陥に起因する縦線キズを補正するための欠陥補正装置であって、
前記撮像素子の温度を検出する温度検出手段と、
ダーク画像の縦線キズレベルを前記ダーク画像の縦線キズレベルの測定時の温度とともに記憶した記憶手段と、
前記記憶手段に記憶された前記ダーク画像の縦線キズレベル及び前記ダーク画像の縦線キズレベルの測定時の温度と、前記温度検出手段により検出された温度とに基づいて、撮影画像に発生する縦線キズレベルを近似的に算出する演算手段と、
前記撮像素子の有効画素出力信号から前記演算手段により近似的に算出された前記縦線キズレベルを減算することで撮影画像の縦線キズを補正する補正手段と、
を具備することを特徴とする欠陥補正装置。 A defect correction apparatus for correcting a vertical line scratch caused by a defect in a vertical transfer unit of an image sensor,
Temperature detecting means for detecting the temperature of the image sensor;
Storage means for storing the vertical line scratch level of the dark image together with the temperature at the time of measuring the vertical line scratch level of the dark image;
Vertical lines generated in the captured image based on the temperature at the time of measurement of the vertical line scratch level of the dark image and the vertical line scratch level of the dark image stored in the storage unit, and the temperature detected by the temperature detection unit A calculation means for calculating the scratch level approximately,
Correction means for correcting a vertical line flaw of a captured image by subtracting the vertical line flaw level approximately calculated by the calculation means from an effective pixel output signal of the image sensor;
A defect correction apparatus comprising: 前記補正手段は、前記演算手段により算出された縦線キズレベルが所定値以下である場合に補正処理を行なわないことを特徴とする請求項１に記載の欠陥補正装置。 The defect correction apparatus according to claim 1, wherein the correction unit does not perform correction processing when the vertical line scratch level calculated by the calculation unit is equal to or less than a predetermined value . さらに、前記撮像素子でスミアが発生しているかどうかを判定する判定手段を具備し、前記補正手段は、前記判定手段による判定結果に応じて、前記スミアの補正処理と前記縦線キズの補正処理とを切り替えることを特徴とする請求項１に記載の欠陥補正装置。 The image sensor further includes a determination unit that determines whether smear has occurred, and the correction unit corrects the smear and the vertical line defect according to a determination result by the determination unit. defect correction apparatus of claim 1, characterized in that switching and. 撮像素子の垂直転送部の欠陥に起因する縦線キズを補正するための欠陥補正方法であって、
前記撮像素子の温度を検出する温度検出工程と、
記憶手段に予め記憶されたダーク画像の縦線キズレベル及び前記ダーク画像の縦線キズレベルの測定時の温度と、前記温度検出工程において検出された温度とに基づいて、撮影画像に発生する縦線キズレベルを近似的に算出する演算工程と、
前記撮像素子の有効画素出力信号から前記演算工程において近似的に算出された前記縦線キズレベルを減算することで撮影画像の縦線キズを補正する補正工程と、
を具備することを特徴とする欠陥補正方法。 A defect correction method for correcting a vertical line scratch caused by a defect in a vertical transfer unit of an image sensor,
A temperature detection step of detecting the temperature of the image sensor;
The vertical line scratch level generated in the photographed image based on the temperature at the time of measuring the vertical line scratch level of the dark image and the vertical line scratch level of the dark image stored in the storage means and the temperature detected in the temperature detection step A calculation step of approximately calculating
A correction step of correcting a vertical line flaw of a captured image by subtracting the vertical line flaw level approximately calculated in the calculation step from an effective pixel output signal of the image sensor;
A defect correction method comprising: 前記補正工程では、前記演算工程において算出された縦線キズレベルが所定値以下である場合に補正処理を行なわないことを特徴とする請求項４に記載の欠陥補正方法。 5. The defect correction method according to claim 4, wherein in the correction step, the correction process is not performed when the vertical line scratch level calculated in the calculation step is equal to or less than a predetermined value . さらに、前記撮像素子でスミアが発生しているかどうかを判定する判定工程を具備し、前記補正工程では、前記判定工程における判定結果に応じて、前記スミアの補正処理と前記縦線キズの補正処理とを切り替えることを特徴とする請求項４に記載の欠陥補正方法。 Further, the image processing device further includes a determination step for determining whether smear has occurred in the imaging device, and the correction step includes a correction process for the smear and a correction process for the vertical line defect according to the determination result in the determination step. defect correction method according to claim 4, characterized in that switching and.
JP2006058365A 2006-03-03 2006-03-03 Defect correction apparatus and defect correction method Expired - Fee Related JP4785564B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006058365A JP4785564B2 (en) 2006-03-03 2006-03-03 Defect correction apparatus and defect correction method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006058365A JP4785564B2 (en) 2006-03-03 2006-03-03 Defect correction apparatus and defect correction method

Publications (3)

Publication Number Publication Date
JP2007235891A JP2007235891A (en) 2007-09-13
JP2007235891A5 true JP2007235891A5 (en) 2009-04-09
JP4785564B2 JP4785564B2 (en) 2011-10-05

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JP2006058365A Expired - Fee Related JP4785564B2 (en) 2006-03-03 2006-03-03 Defect correction apparatus and defect correction method

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5245642B2 (en) * 2008-08-21 2013-07-24 株式会社ニコン Imaging apparatus and defect correction apparatus
JP5335327B2 (en) * 2008-08-29 2013-11-06 キヤノン株式会社 Defect detection and correction apparatus and defect detection and correction method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07105916B2 (en) * 1986-02-13 1995-11-13 キヤノン株式会社 Imaging device
JP2565260B2 (en) * 1987-10-17 1996-12-18 ソニー株式会社 Image defect correction device for solid-state imaging device
JP3618645B2 (en) * 1999-08-02 2005-02-09 オリンパス株式会社 Imaging device and method for correcting degraded pixel signal thereof
JP2004023683A (en) * 2002-06-20 2004-01-22 Fuji Photo Film Co Ltd Defect correction apparatus and method for solid-state imaging device
JP4481764B2 (en) * 2004-08-19 2010-06-16 キヤノン株式会社 Method for correcting signal output from image sensor and image processing apparatus using the same

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