JP2007283674A - Spacer for nano-imprinting, preparation method of specimen for conditioning electron-microscope using it, sample for electron microscope conditioning and electron-microscope provided with it - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for a nano-imprint superior in space contorollability using a single polymeric material as a transfer material and a specimen for conditioning the electron-microscope using it. <P>SOLUTION: The spacer for nano-imprinting comprises a construction having a wall designed as the same thickness as that of the transfer material after transferred and a face for holding the stamper and has a structure to put into the transfer material being a single polymeric material and the spacer having a shape surrounding the stamper at the same time on the nano-imprinting. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a spacer used in a nanoimprint process for transferring a pattern by pressing a stamper having fine irregularities on a transfer material, and an electron microscope adjustment sample manufacturing method using the spacer.

  Correction of the electron beam optical system axis and astigmatism in the electron microscope is performed by adjusting the control current of the correction coil of the electron lens. In this case, a sample for adjustment is usually prepared. This is because the above-described adjustment may be performed with a secondary electron image obtained by directly irradiating an object to be observed with an electron beam, but the object is not necessarily used for correcting an axis or astigmatism. This is because the structure is not necessarily suitable. By installing this adjustment sample at a fixed location, such as on the stage in an electron microscope device, the stage can be moved and the axis and astigmatism corrected by observing the adjustment sample when necessary. It can be done. Also, by correcting the movement of the stage and the image processing of the secondary electron image, it is possible to automatically correct the axis and astigmatism. However, in order for the correction by the adjustment sample to work effectively on the object placed on the stage, it is desirable that the surface of the adjustment sample and the surface of the object are substantially on the same plane. . This is because if the height of the surface of the adjustment sample and the surface of the object are different, the focal position changes, and the correction value of the axis and astigmatism is affected.

  By the way, as a method for preparing a sample for adjustment, there is a technique called a nanoimprint method in which a polymer material is heated to a glass transition point or higher and a stamper having fine irregularities is pressed to transfer a pattern in recent years. This method is particularly attracting attention as an inexpensive microstructure transfer technique. The structure of the transfer material to which the pattern is transferred includes a method in which a polymer material is thinly applied on a strong substrate such as silicon by a few μm, or a single high with a thickness of several tens to several hundreds of μm. Two methods of using molecular materials are conceivable.

  Since the sample for adjusting the electron microscope is placed on a part of the stage, the size thereof is about several mm to several tens mm, and after transferring the pattern by the nanoimprint method, it is necessary to cleave it to a desired size. In this case, a transfer material obtained by applying a polymer material on a silicon substrate is likely to peel off the film, and it is advantageous to use a single polymer material as the transfer material. In addition, when the transfer material is a single polymer material, the step of applying the polymer material on the substrate can be omitted, which has the advantage of simplifying the manufacturing process. By the way, when a single polymer material is used as a transfer material, the polymer material heated above the glass transition point is deformed by pressing the stamper, and there are differences in conditions such as heating temperature, pressing force, and pressing time. There is a problem that the thickness after transfer varies.

  As a means for controlling the in-plane thickness of the transfer material, for example, as disclosed in Patent Document 1, a method of obtaining a uniform pressing force by providing a flat plate of the same height around the transfer material, or a patent As described in Document 2, a method of installing dummy members having substantially the same surface height around the stamper can be considered.

JP 2005-268675 A JP 2005-349619 A

  However, in any case, when a single polymer material is used as the transfer material, the thickness of the transfer material itself cannot be controlled. Therefore, there is a problem that the methods of Patent Documents 1 and 2 cannot correct the axis and astigmatism accurately.

  The present invention has been made in view of such problems, and provides a nanoimprint spacer capable of controlling the thickness of a transfer material. In addition, the present invention provides a method for manufacturing an electron microscope adjustment sample using the spacer, a sample manufactured by the manufacturing method, and an electron microscope that includes the sample and corrects an axis and astigmatism.

  In order to solve the above problems, a nanoimprint spacer according to the present invention is a nanoprint spacer used in a nanoimprint process in which a fine pattern of a stamper is transferred onto the surface of a transfer material. A stamper and a transfer material are sandwiched between opposing stages, and a side wall portion disposed so as to surround the transfer material and a stamper holding portion that holds the stamper are provided. The stamper holding portion has a wall designed to have a thickness of the transfer material after transfer. Then, a spacer having a shape surrounding the transfer material and the stamper is sandwiched at the same time for nanoimprinting.

  If the nanoimprint spacer of the present invention is used, since the stamper and the transfer material are sandwiched between opposing stages, the side wall portion disposed so as to surround the transfer material, and the stamper holding portion that holds the stamper are provided. In addition, it is possible to manufacture an electron microscope adjustment sample having excellent thickness controllability.

  Hereinafter, embodiments according to the present invention will be described in detail with reference to the drawings.

<First Embodiment>
FIG. 1 is a schematic structural cross-sectional view showing a state in which a sample for adjusting an electron microscope is generated by transferring a fine pattern of a stamper onto a transfer material using the nanoimprint spacer according to the first embodiment of the present invention. A stamper 3 made of nickel, for example, a transfer material 4 made of polystyrene, for example, a spacer 5 made of PEEK (polyetheretherketone) is installed between the upper stage 1 and the lower stage 2. In FIG. 1, after the transfer material 4 is heated to a temperature equal to or higher than the glass transition point, the upper stage 1 and the lower stage 2 are pressed, the transfer material 4 is deformed, and the fine uneven pattern 32 on the surface 31 of the stamper 3 is formed on the surface 41. The transferred state is shown. At the stage of completion of nanoimprint transfer, the middle step surface (stamper holding portion) 52 provided in the middle step of the wall 51 of the spacer 5 is in contact with the surface 31 of the stamper 3. At this time, the distance L1 between the surface 21 of the lower stage 2 and the intermediate stage surface 52 is designed to be a finally required transfer material thickness, so that an electron microscope adjustment sample having a stable thickness can be obtained. Manufacturable. Here, the intermediate step surface 52 restricts the height in the pressing direction of the stamper 3 to L, and the side wall upper part 50 of the spacer 5 is provided for positioning the stamper 3 in the lateral direction.

  In FIG. 1, only one stage is provided for holding the stamper 1 and restricting the height of the stamper. However, two or more stages may be provided. By providing a plurality of stages of stamper holding portions, it is possible to achieve a technical effect that it can be functionalized such that it can be used even if the mold sizes are different.

  FIG. 2 is a top view of the nanoimprint spacer used in FIG. A closed loop is formed so as to surround the gap 53. In the present embodiment, the closed loop is rectangular, but it may be circular, polygonal, or other shapes.

  Next, the manufacturing process of the electron microscope adjustment sample according to the present invention will be described with reference to FIG.

  (A) The spacer 5 is placed on the lower stage 2, the transfer material 4 is placed at the approximate center of the central gap 53, and the stamper 3 is placed at the approximate center thereabove. At this time, the height L2 of the spacer 5 is designed to be larger than the distance L3 between the surface 21 of the lower stage 2 and the surface 31 of the stamper 3, so that the upper inner side wall 57 of the spacer 5 is It can be used as a positioning guide.

  (B) The stage is heated above the glass transition point of the transfer material 4 to soften the transfer material 4, and the upper stage 1 and the lower stage 2 are pressed. In addition, when pressing, the surrounding atmosphere is evacuated in advance so that bubbles and the like do not remain at the interface. When the pressed state is held for several seconds to several minutes, the transfer material 4 is deformed, and the deformation of the transfer material 4 is completed when the surface 31 of the stamper 3 comes into contact with the middle step surface 52 of the spacer 5. Although the spread in the planar direction of the transfer material is not necessarily point-symmetric, the spread can be kept in the gap 53 of the spacer 5 by making the shape of the spacer 5 a closed loop structure. Further, if a gap is not generated when the front surface 31 of the stamper 3 is in contact with the middle surface 52 of the spacer 5, the transfer material 4 wraps around the side surface or back surface of the stamper 3 so that the stamper 3 and the transfer material 4 are The concern that the nanoimprint cannot be removed after the nanoimprint can be eliminated.

  (C) After cooling the stage, the pressing force is released, and the stamper 3 and the spacer 5 are removed (desirably removed in the vertical direction so as not to damage the transferred pattern). At this time, a release agent such as silicone oil is also applied to the surface of the stamper 3 in advance so that the stamper 3 and the transfer material 4 are smoothly separated. The side wall 42 of the transfer material 4 after nanoimprinting has a curved shape due to the spread during nanoimprinting.

  (D) Since the spread in the planar direction during nanoimprinting is not uniform, it is finished to a desired dimension by cleaving with dicing or the like.

<Second Embodiment>
FIG. 4 is a schematic structural cross-sectional view showing a state in which a sample for adjusting an electron microscope is generated by transferring a fine pattern of a stamper onto a transfer material using a nanoimprint spacer according to a second embodiment of the present invention. FIG. 5 is a top view of the nanoimprint spacer used in FIG.

  As shown in FIG. 4, the spacer 5 includes a wall 51 and a bottom plate 54, and the distance L1 between the surface 55 of the bottom plate 54 and the middle step surface 52 is designed to the thickness of the transfer material that is finally required. Thus, an electron microscope adjustment sample having a stable thickness can be manufactured. Further, the bottom plate 54 is provided with a protrusion 56. When the transfer material 4 is deformed at the time of nanoimprinting, the transfer material is not filled in the region of the protrusion 56, so that a cleaving groove is formed. In the present embodiment, the protrusion 56 is a square closed loop. However, the protrusion 56 is not necessarily a closed loop. For example, a plurality of linear protrusions may be arranged as long as the shape is desired to be cut, as shown in FIG. Alternatively, they may be arranged in a lattice pattern. If the projection 56 is designed to have a required size in advance, it can be easily cleaved into a shape as shown in FIG. 7 without using a machine such as a dicer.

<Third Embodiment>
FIG. 8 is a schematic structural cross-sectional view showing a state in which a sample for adjusting an electron microscope is generated by transferring a fine pattern of a stamper to a transfer material using a nanoimprint spacer according to a second embodiment of the present invention. FIG. 9 is a top view of the nanoimprint spacer used in FIG.

  As shown in FIG. 8, the distance L1 between the surface 21 of the lower stage 2 and the intermediate surface 52 is designed to the thickness of the transfer material that is finally required. The wall 51 of the spacer 5 is formed with a flow path 60 that penetrates from the lower inner side wall 58 to the outer side wall 59. The volume of the gap 53 surrounded by the intermediate surface 52 of the spacer 5, the lower inner side wall 58 of the spacer 5 and the surface 21 of the lower stage 2 is designed to be substantially the same as or slightly smaller than the volume of the transfer material 4. Thus, the gap 53 is filled with the transfer material 4 during nanoimprinting. By reducing the conductance of the flow path 60, the transfer material fills all the gaps 53, and a small volume that still remains oozes out into the flow path 60. Further, since the side wall 42 of the completed transfer material 4 is formed along the lower inner side wall 58 of the spacer 5, if the lower inner side wall 58 of the spacer 5 is designed to a required size in advance, a dicer or the like is used. Without using a machine, it is possible to easily finish the shape as shown in FIG. 10 simply by scraping the slight transfer material 4 that has oozed into the flow path 60. In this embodiment, the flow paths 60 are provided at four locations on the wall 51 constituting the closed loop of the spacer 5, but one or more channels may be provided. Further, in the present embodiment, the concave flow path 60 is formed by scraping the lower surface of the spacer 5, but the flow path may be formed at an arbitrary position of the wall 51 as long as it is below the middle step surface 52. .

<Other embodiments>
In the embodiments so far, one stamper 3, one transfer material 4 and one spacer 5 are arranged between the upper stage 1 and the lower stage 2, but depending on the size of the stage, all of them may be used. A plurality of them may be arranged. It is also possible to arrange a plurality of intermediate step surfaces 52 and gaps 53 in the spacer 5 and arrange a plurality of stampers 3 and transfer materials 4 in one spacer 5. By these methods, it becomes possible to produce a plurality of transfer materials by a single nanoimprint, and productivity can be improved. In order to improve productivity, the spacer 5 may be incorporated in the stage in advance.

<Technical effect>
As described above, by using a single imprint material and using the nanoimprint spacer of the present invention, it is possible to produce a nanoimprint method having excellent thickness controllability and an electron microscope adjustment sample. Further, it is possible to facilitate cleaving by providing protrusions and flow paths in the nanoimprint spacer.

<Application to electron microscope>
As shown in FIG. 11, the electron microscope adjustment sample 70 manufactured as described above is bonded to, for example, a stainless steel sample stage 71 with, for example, an epoxy adhesive 72, and then a conductive thin film 73 such as aluminum is applied from the upper surface. It is formed by vapor deposition and is finally mounted on the stage 74. If the transfer material that is a constituent material of the electron microscope adjustment sample 70 is conductive, the formation of the conductive thin film 73 may be omitted.

  FIG. 12 shows an outline of electron beam control in the electron microscope apparatus 88. In the electron microscope device 88, an electron beam 82 is emitted from the electron source 81, and the electron beam 82 is converged by a focusing lens 83. The objective lens 85 is a lens for focusing the converged electron beam 82 on the sample, and the aberration correction lens 84 is a lens for correcting astigmatism. The electron beam 82 incident on the sample emits secondary electrons and is detected by the detector 86. The shape of the sample surface is observed by imaging secondary electron information, but when correcting the axis and astigmatism, each lens is adjusted so that the fluctuation of the imaged secondary electron image is minimized. adjust.

  The electron microscope adjustment sample 70 manufactured in the above-described embodiment is formed with a pattern capable of efficiently performing these corrections, and is necessary for installation in the corner of the stage 87 in the electron microscope apparatus 88, for example. In this case, the stage 87 is moved to observe the electron microscope adjustment sample 70, and the axis and astigmatism can be corrected based on the result. In an electron microscope used for dimensional inspection of a silicon wafer, the object 75 is a silicon wafer having a substantially constant thickness. For example, the surface of an electron microscope adjustment sample 70 manufactured by nanoimprinting (any surface irregularity) Therefore, the surface of the object 75 may be on the same plane (the same height) and the electron microscope may be adjusted. The correction value of the axis and astigmatism corrected by the sample 70 for the object 70 hardly changes even in the observation of the object 75, and the correction accuracy can be improved.

It is a schematic structure sectional view showing a 1st transfer embodiment of a sample for electron microscope adjustment using a nanoimprint spacer in a 1st embodiment. It is a top view of the spacer for nanoimprint used in 1st Embodiment. It is a manufacturing process figure for demonstrating the effect by embodiment of this invention. It is a schematic structure sectional view showing a 2nd transfer embodiment of a sample for electron microscope adjustment using a nanoimprint spacer in the present invention. It is a top view of the spacer for nanoimprint used in 2nd Embodiment. It is a top view of the spacer alternative for nanoimprint used in a 2nd embodiment. It is a general | schematic structure sectional drawing which shows the shape after the cleaving of the sample for electron microscope adjustment manufactured in 2nd Embodiment. It is a schematic structure sectional view showing a 3rd transfer embodiment of a sample for electron microscope adjustment using a nanoimprint spacer in the present invention. It is a top view of the spacer for nanoimprint used in 3rd Embodiment. It is a general | schematic structure sectional drawing which shows the shape after the cleaving of the sample for electron microscope adjustment manufactured in 3rd Embodiment. It is the figure which incorporated the sample for electron microscope adjustment manufactured by the embodiment of the present invention in the stage of an electron microscope. It is the figure which showed the outline of control of the electron beam in an electron microscope apparatus.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Upper stage, 2 ... Lower stage, 3 ... Stamper, 4 ... Transfer material, 5 ... Spacer, 21 ... Lower stage surface, 31 ... Stamper surface, 32. ..Fine concavo-convex pattern, 41 ... transfer material surface, 42 ... side wall of transfer material after nanoimprinting, 51 ... spacer wall, 52 ... intermediate surface of spacer, 53 ... void portion of spacer 54 ... Spacer bottom plate, 55 ... Spacer bottom plate surface, 56 ... Projections provided on the spacer bottom plate, 57 ... Spacer upper inner side wall, 58 ... Spacer lower inner side wall 59 ... External side walls of spacer, 60 ... channel, 70 ... sample for electron microscope adjustment, 71 ... sample stage, 72 ... adhesive, 73 ... conductive thin film, 74 ... Stage, 75 ... Subject, L1 ..Final transfer material thickness required, L2 ... Space height, L3 ... Distance between lower stage surface and stamper surface before nanoimprint, 81 ... Electron source, 82 ... Electron 83, focusing lens, 84 ... aberration correction lens, 85 ... objective lens, 86 ... detector, 87 ... stage, 88 ... electron microscope apparatus

Claims (14)

A nanoprint spacer used in a nanoimprint process for transferring a fine pattern on a surface of a transfer material to a stamper,
A side wall portion sandwiched between stages facing the stamper and the transfer material and arranged to surround the transfer material;
A stamper holding portion for holding the stamper;
A spacer for nanoimprinting, comprising:   The nanoimprint spacer according to claim 1, wherein the side wall portion has a closed loop shape surrounding the transfer material.   The nanoimprint spacer according to claim 1, further comprising a bottom plate portion for covering the bottom portion of the transfer material.   4. The nanoimprint spacer according to claim 3, further comprising a protrusion structure on the bottom plate portion.   5. The nanoimprint spacer according to claim 4, wherein the protruding structure has a closed loop shape.   The nanoimprint spacer according to any one of claims 1 to 5, wherein the stamper holding portion has a stepped shape having a step.   The nanoimprint spacer according to any one of claims 1 to 6, wherein the side wall has a flow path penetrating from the inside to the outside of the side wall.   The nanoimprint spacer according to any one of claims 1 to 7, wherein the spacer is made of a polymer material having a glass transition point higher than that of the transfer material. An electron microscope adjustment sample manufacturing method for manufacturing an electron microscope adjustment sample using the nanoimprint spacer according to any one of claims 1 to 8,
The spacer is placed on the nanoimprint lower stage, a transfer material is disposed on the lower stage and in the side wall portion of the spacer, the nanoimprint stamper on the transfer material, and the nanoimprint upper stage on the stamper A process of placing;
Heating the transfer material above the glass transition point by heating the upper and lower stages;
Pressing the transfer material heated above the glass transition point at the upper and lower stages;
Cooling the upper and lower stages after pressing, releasing the pressing force and taking out the stamper and the spacer;
A sample manufacturing method for adjusting an electron microscope, comprising: The nanoimprint spacer according to any one of claims 1 to 8,
A lower stage on which the spacer is placed;
A stamper having a printed pattern on the surface;
A lower stage placed on the stamper,
A nanoimprint apparatus for transferring the print pattern of the stamper onto a transfer material.   An electron microscope adjusting sample manufactured by controlling the thickness according to the electron microscope adjusting sample manufacturing method according to claim 9.   The sample for electron microscope adjustment according to claim 11, wherein a single polymer material is used as a constituent material.   The sample for electron microscope adjustment according to claim 11, wherein a single polymer material is used as a constituent material, and a conductive thin film is formed on the surface thereof.   An electron microscope apparatus having a function of automatically adjusting an axis and astigmatism by installing the electron microscope adjustment sample according to any one of claims 11 to 12 in the apparatus.

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