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JP2007085847A - Abnormality detection system for cell balance circuit - Google Patents

Abnormality detection system for cell balance circuit Download PDF

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JP2007085847A
JP2007085847A JP2005274107A JP2005274107A JP2007085847A JP 2007085847 A JP2007085847 A JP 2007085847A JP 2005274107 A JP2005274107 A JP 2005274107A JP 2005274107 A JP2005274107 A JP 2005274107A JP 2007085847 A JP2007085847 A JP 2007085847A
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bypass
cell
cell balance
circuit
voltage
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JP4832840B2 (en
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Masaki Nagaoka
正樹 長岡
Akihiko Kudo
彰彦 工藤
Kenichiro Tsuru
憲一朗 水流
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Vehicle Energy Japan Inc
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Hitachi Vehicle Energy Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an abnormality detection system for cell balance circuit which can detect individual abnormality causes of a cell balance circuit. <P>SOLUTION: A cell module control circuit comprises a cell balance circuit section comprising bypass resistors 4, 5 and bypass FETs 2, 3; an abnormality detection circuit section comprising comparators 10 to 13, reference voltage sources 6 to 9, and resistors 14, 15; and a microcontroller 28 which measures the individual voltage of unit cells C1, C2, controls the cell balance of the unit cells C1, C2, and determines abnormality in the cell balance circuit through the output from the abnormality detection circuit section. By comparing the voltages of the bypass FETs 2, 3 by the reference voltage sources 6 to 9 and the comparators 10 to 13, external shorting of the FETs 2, 3 and shorting and opening of the bypass resistors 4, 5, which are the causes of abnormality in the cell balance circuit section, are individually detected. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明はセルバランス回路異常検出方式に係り、特に、複数の単電池を接続した電池モジュールの各単電池に並列に接続されバイパススイッチとバイパス抵抗とで構成されたセルバランス回路の異常検出方式に関する。   The present invention relates to a cell balance circuit abnormality detection system, and more particularly, to a cell balance circuit abnormality detection system configured by a bypass switch and a bypass resistor connected in parallel to each unit cell of a battery module in which a plurality of unit cells are connected. .

従来、複数の単電池を直並列に接続した電池モジュールでは、単電池電圧測定機能や単電池の充電状態を制御するセルバランス機能を有する制御回路を備えている(例えば、特許文献1参照)。その理由は、電池モジュールを構成する各単電池の残存容量が異なると、電池モジュールとしての容量が確保されないだけでなく、充放電した場合に残存容量が異なる単電池あるいはモジュールが過充電あるいは過放電となって、単電池が劣化してしまう可能性があるためである。   Conventionally, a battery module in which a plurality of single cells are connected in series and parallel includes a control circuit having a single cell voltage measurement function and a cell balance function for controlling the state of charge of the single cells (see, for example, Patent Document 1). The reason is that if the remaining capacity of each unit cell constituting the battery module is different, not only the capacity as the battery module is not secured, but also the unit cell or module having a different remaining capacity when charged or discharged is overcharged or overdischarged. This is because the cell may be deteriorated.

電池モジュールを構成する単電池には、例えば、リチウムイオン電池やニッケル水素電池が用いられている。リチウムイオン電池では、過充電となると安全性に影響があるため、セルバランス(調整)回路が必要であり、また、セルバランス回路の異常を検出することも必要である。   For example, a lithium ion battery or a nickel metal hydride battery is used as the unit cell constituting the battery module. In a lithium ion battery, if it is overcharged, safety is affected, so a cell balance (adjustment) circuit is necessary, and it is also necessary to detect an abnormality in the cell balance circuit.

その例を、図2を用いて説明する。図2に示すように、一般に、セルバランス回路は、バイパス抵抗19(20)とFET等で構成されるバイパススイッチ(以下、バイパスFETという。)17(18)とで構成されており、電池モジュール1を構成する単電池毎に並列接続されている。マイクロコントローラ21は、電池モジュールを構成し直列接続された各単電池の電圧を測定して、各単電池の残存容量を揃えるためのバイパスFET17、18のオン時間を算出し、算出したオン時間の間、バイパスFET17、18をオン状態とし、バイパス抵抗19、20を介して単電池を放電させて残存容量を揃える。また、マイクロコントローラ21は、バイパスFET17、18のオン、オフをトランジスタ22〜25を介してモニタ(監視)し、セルバランス回路の異常を検出する。   An example of this will be described with reference to FIG. As shown in FIG. 2, the cell balance circuit generally includes a bypass resistor 19 (20) and a bypass switch (hereinafter referred to as a bypass FET) 17 (18) including an FET or the like, and a battery module. 1 are connected in parallel for each unit cell constituting one. The microcontroller 21 measures the voltage of each cell connected in series that constitutes the battery module, calculates the ON time of the bypass FETs 17 and 18 for aligning the remaining capacity of each cell, and calculates the calculated ON time. Meanwhile, the bypass FETs 17 and 18 are turned on, and the cells are discharged through the bypass resistors 19 and 20 to make the remaining capacity uniform. Further, the microcontroller 21 monitors on / off of the bypass FETs 17 and 18 via the transistors 22 to 25, and detects an abnormality of the cell balance circuit.

特開2000−92732号公報JP 2000-92732 A

ところが、従来のセルバランス回路では、バイパスFETのオン、オフをモニタしているだけのため、バイパスオン時のバイパススイッチ外部短絡、バイパスオフ時のバイパス抵抗開放など検出不能なものがある。また、セルバランス回路の異常という全体的な検出しかできず、詳細にどのような異常かの個別的な検出は不能である。   However, in the conventional cell balance circuit, since only the on / off of the bypass FET is monitored, there are some circuits that cannot be detected, such as an external short circuit of the bypass switch when the bypass is on and the opening of the bypass resistor when the bypass is off. Further, only the overall detection of the abnormality of the cell balance circuit can be performed, and the individual detection of the abnormality in detail is impossible.

本発明は上記事案に鑑み、セルバランス回路の個別的な異常原因を検出可能なセルバランス異常検出方式を提供することを課題とする。   An object of the present invention is to provide a cell balance abnormality detection method capable of detecting individual causes of abnormality of a cell balance circuit in view of the above-mentioned cases.

上記課題を解決するために、本発明に係るセルバランス回路異常検出方式は、複数の単電池を接続した電池モジュールの各単電池の電圧測定機能およびバイパススイッチとバイパス抵抗とで構成され各単電池に並列に接続されたセルバランス回路により各単電池の充電状態を制御するセルバランス機能を有する制御回路を備え、前記バイパススイッチの電圧と基準電圧とをコンパレータで比較し、前記バイパススイッチの外部短絡、前記バイパス抵抗の短絡および開放を検出することを特徴とする。   In order to solve the above-mentioned problem, the cell balance circuit abnormality detection system according to the present invention includes a voltage measuring function of each unit cell of a battery module in which a plurality of unit cells are connected, a bypass switch, and a bypass resistor. A control circuit having a cell balance function for controlling the state of charge of each single cell by a cell balance circuit connected in parallel to the comparator, comparing the voltage of the bypass switch with a reference voltage by a comparator, and externally shorting the bypass switch A short circuit and an open circuit of the bypass resistor are detected.

本発明では、複数の単電池を接続した電池モジュールの各単電池の電圧測定機能およびバイパススイッチとバイパス抵抗とで構成され各単電池に並列に接続されたセルバランス回路により各単電池の充電状態を制御するセルバランス機能を有する制御回路を備えている。セルバランス回路の異常を、バイパススイッチの電圧と基準電圧とをコンパレータで比較し、バイパススイッチの外部短絡、バイパス抵抗の短絡および開放を検出する。   In the present invention, the state of charge of each unit cell is measured by a voltage measuring function of each unit cell of a battery module in which a plurality of unit cells are connected, and a cell balance circuit configured by a bypass switch and a bypass resistor and connected in parallel to each unit cell. And a control circuit having a cell balance function for controlling. Comparing the voltage of the bypass switch and the reference voltage with a comparator to detect an abnormality in the cell balance circuit, an external short circuit of the bypass switch, a short circuit and an open circuit of the bypass resistor are detected.

本発明において、バイパススイッチにFETを用い、該FETのソース−ドレイン間の電圧と基準電圧とをコンパレータで比較することが好ましい。   In the present invention, it is preferable to use an FET as a bypass switch and compare the source-drain voltage of the FET with a reference voltage by a comparator.

本発明によれば、バイパススイッチの電圧と基準電圧とをコンパレータで比較することで、セルバランス回路の個別的な異常原因であるバイパススイッチの外部短絡、バイパス抵抗の短絡および開放を検出することができる、という効果を得ることができる。   According to the present invention, it is possible to detect an external short circuit of a bypass switch, a short circuit and an open circuit of a bypass resistor, which are individual causes of abnormalities in the cell balance circuit, by comparing the voltage of the bypass switch and a reference voltage with a comparator. The effect that it is possible can be acquired.

以下、セルバランス回路(部)の個別的異常検出が可能な電池モジュール制御回路の実施の形態について説明する。   Hereinafter, an embodiment of a battery module control circuit capable of detecting individual abnormalities in the cell balance circuit (unit) will be described.

図1に示すように、電池モジュール制御回路の制御対象となる電池モジュール1は、2個の単電池C1、C2が直列接続されている。なお、図1では、説明を簡単にするために、2個の単電池で構成された電池モジュール1の例を示している。   As shown in FIG. 1, in the battery module 1 to be controlled by the battery module control circuit, two unit cells C1 and C2 are connected in series. FIG. 1 shows an example of a battery module 1 composed of two single cells for the sake of simplicity.

本実施形態の電池モジュール制御回路は、バイパス抵抗4、5及びバイパスFET2、3で構成されるセルバランス回路部と、コンパレータ10〜13、基準電圧源6〜9及び抵抗14、15で構成される異常検出回路部と、単電池C1、C2の個々の電圧を測定し単電池C1、C2のセルバランスを制御すると共に、異常検出回路部からの出力によりセルバランス回路の異常判定を行うマイクロコントローラ28とを備えている。   The battery module control circuit according to the present embodiment includes a cell balance circuit unit including bypass resistors 4 and 5 and bypass FETs 2 and 3, comparators 10 to 13, reference voltage sources 6 to 9, and resistors 14 and 15. A microcontroller 28 that measures the individual voltages of the abnormality detection circuit unit and the single cells C1 and C2 to control the cell balance of the single cells C1 and C2 and determines abnormality of the cell balance circuit based on the output from the abnormality detection circuit unit. And.

すなわち、単電池C1の正極にはPチャネル型バイパスFET2のドレインが接続されており、バイパスFET2のソースは、他端が単電池C1の負極に接続されたバイパス抵抗4の一端に接続されている。また、バイパスFET2のゲートはマイクロコントローラ28の出力ポート(後述するDAコンバータの出力側)に接続されている。バイパスFET2のソース−ドレイン間には抵抗14が挿入されており、バイパスFET2のソースは、コンパレータ10の+入力(被比較入力電圧)端子及びコンパレータ11の−入力(比較基準電圧)端子に接続されている。コンパレータ10の−入力端子及びコンパレータ11の+入力端子には、それぞれ、基準電圧源6、7が接続されており、コンパレータ10、11の出力端子はマイクロコントローラ28に接続されている。また、単電池C1の正極、負極は、単電池電圧を測定するために、マイクロコンピュータ28に接続されている。   That is, the drain of the P-channel bypass FET 2 is connected to the positive electrode of the cell C1, and the source of the bypass FET 2 is connected to one end of the bypass resistor 4 whose other end is connected to the negative electrode of the cell C1. . The gate of the bypass FET 2 is connected to the output port of the microcontroller 28 (the output side of a DA converter described later). A resistor 14 is inserted between the source and drain of the bypass FET 2, and the source of the bypass FET 2 is connected to the + input (compared input voltage) terminal of the comparator 10 and the −input (comparison reference voltage) terminal of the comparator 11. ing. Reference voltage sources 6 and 7 are connected to the − input terminal of the comparator 10 and the + input terminal of the comparator 11, respectively, and the output terminals of the comparators 10 and 11 are connected to the microcontroller 28. Further, the positive electrode and the negative electrode of the unit cell C1 are connected to the microcomputer 28 in order to measure the unit cell voltage.

同様に、単電池C2の正極には他端がnチャネル型バイパスFET3のドレインに接続されたバイパス抵抗5の一端に接続されており、バイパスFET3のソースは単電池C2の負極に接続されている。また、バイパスFET3のゲートはマイクロコントローラ28の出力ポートに接続されている。バイパスFET3のソース−ドレイン間には抵抗15が挿入されており、バイパスFET3のドレインは、コンパレータ12の+入力端子及びコンパレータ13の−入力端子に接続されている。コンパレータ12の−入力端子及びコンパレータ13の+入力端子には、それぞれ、基準電圧源8、9が接続されており、コンパレータ12、13の出力端子はマイクロコントローラ28に接続されている。また、単電池C2の正極、負極は、単電池電圧を測定するために、マイクロコンピュータ28に接続されているが、単電池C2の正極は単電池C1の負極に接続されているため、単電池C1の負極と共通化されている。   Similarly, the other end of the positive electrode of the cell C2 is connected to one end of a bypass resistor 5 connected to the drain of the n-channel bypass FET 3, and the source of the bypass FET 3 is connected to the negative electrode of the cell C2. . The gate of the bypass FET 3 is connected to the output port of the microcontroller 28. A resistor 15 is inserted between the source and drain of the bypass FET 3, and the drain of the bypass FET 3 is connected to the + input terminal of the comparator 12 and the − input terminal of the comparator 13. Reference voltage sources 8 and 9 are connected to the − input terminal of the comparator 12 and the + input terminal of the comparator 13, respectively, and the output terminals of the comparators 12 and 13 are connected to the microcontroller 28. Further, the positive electrode and the negative electrode of the unit cell C2 are connected to the microcomputer 28 in order to measure the unit cell voltage, but the unit cell C2 is connected to the negative electrode of the unit cell C1, so that the unit cell It is shared with the negative electrode of C1.

マイクロコントローラ28は、差動増幅回路を有し単電池C1、C2の電圧を検出する単電池電圧検出回路部と、CPU、ROM、RAMで構成されたマイクロコンピュータ部と、ADコンバータ及びDAコンバータを有するAD/DA変換部と、上位制御システムに異常状況を報知するためのインターフェースとを備えている。なお、バイパスFET2、3のゲートはDAコンバータの出力に接続されており、コンパレータ10〜13の出力はADコンバータの入力に接続されている。また、単電池電圧検出回路部はADコンバータを介してマイクロコンピュータ部の外部バスに接続されている。   The microcontroller 28 includes a unit cell voltage detection circuit unit having a differential amplifier circuit for detecting the voltages of the unit cells C1 and C2, a microcomputer unit composed of a CPU, a ROM and a RAM, an AD converter and a DA converter. An AD / DA conversion unit, and an interface for notifying the host control system of an abnormal situation. The gates of the bypass FETs 2 and 3 are connected to the output of the DA converter, and the outputs of the comparators 10 to 13 are connected to the input of the AD converter. The single cell voltage detection circuit unit is connected to an external bus of the microcomputer unit via an AD converter.

次に、本実施形態の電池モジュール制御回路の動作について、マイクロコントローラ28のマイクロコンピュータ部のCPU(以下、単にCPUと略称する。)を主体として説明する。   Next, the operation of the battery module control circuit of the present embodiment will be described with a CPU of the microcomputer unit of the microcontroller 28 (hereinafter simply referred to as “CPU”) as a main component.

CPUは、単電池電圧検出回路部からの単電池C1、C2の出力電圧を、ADコンバータを介してデジタル値として取り込む。すなわち、単電池C1、C2の電圧を測定する。この場合に、単電池C1、C2の充電状態(ないし残存容量)を精度よく演算するためには、開回路電圧を測定することが好ましい。   The CPU captures the output voltages of the cells C1, C2 from the cell voltage detection circuit unit as digital values via the AD converter. That is, the voltages of the single cells C1 and C2 are measured. In this case, in order to accurately calculate the state of charge (or remaining capacity) of the cells C1, C2, it is preferable to measure the open circuit voltage.

次に、CPUは、測定した単電池C1、C2の電圧から、例えば、ROMに予め格納されRAMに展開された電圧−充電状態マップを用いて、単電池C1、C2の充電状態を演算する。次いで、CPUは、単電池C1、C2のセルバランスを採るために、バイパス抵抗4、5に放電(ないし充電中の充電電流のバイパス)させる時間を演算する。そして、CPUは、予め定められたタイミングで(例えば、電池モジュール1の充電、放電、及び/又は休止中に)、演算した時間の間、DAコンバータを介してハイレベル信号を送出しバイパスFET2、3をオン状態として、単電池C1、C2の残存容量を揃える。なお、電圧−充電マップによる演算方法やバイパス時間の演算方法は公知技術として知られている。   Next, the CPU calculates the state of charge of the cells C1, C2 from the measured voltage of the cells C1, C2, for example, using a voltage-charge state map stored in advance in the ROM and developed in the RAM. Next, the CPU calculates a time for discharging the bypass resistors 4 and 5 (or bypassing the charging current during charging) in order to obtain the cell balance of the single cells C1 and C2. Then, the CPU sends a high-level signal via the DA converter for a calculated time at a predetermined timing (for example, during charging, discharging and / or resting of the battery module 1), and bypass FET2, 3 is turned on, and the remaining capacities of the cells C1, C2 are made uniform. In addition, the calculation method by a voltage-charge map and the calculation method of a bypass time are known as a well-known technique.

本実施形態の電池モジュール制御回路の特徴は、バイパスFET2、3のソース−ドレイン間の電圧を基準電圧源6〜9とコンパレータ10〜13で比較し、CPUがセルバランス回路部の異常検出を個別的に行う点にある。以下、表1を参照して、CPUによる異常検出について説明する。なお、表1は、単電池C1、C2の電圧:3.7V、バイパスFET2、3のオン状態時の抵抗値:10Ω、バイパス抵抗4、5:68Ω、基準電圧源6、8:0.3V、基準電圧源7、9:3.5V、抵抗14、15:1MΩでの条件でセルバランス回路部の異常検出結果を示したものである。   The battery module control circuit of this embodiment is characterized in that the voltage between the source and drain of the bypass FETs 2 and 3 is compared by the reference voltage sources 6 to 9 and the comparators 10 to 13, and the CPU individually detects abnormality in the cell balance circuit unit. The point is to do it. Hereinafter, the abnormality detection by the CPU will be described with reference to Table 1. Table 1 shows that the voltages of the cells C1 and C2 are 3.7 V, the resistance values when the bypass FETs 2 and 3 are in the on state: 10Ω, bypass resistors 4 and 5: 68Ω, the reference voltage sources 6 and 8 are 0.3 V. 7 shows the result of abnormality detection of the cell balance circuit section under the conditions of the reference voltage source 7, 9: 3.5 V, the resistance 14, 15: 1 MΩ.

Figure 2007085847
Figure 2007085847

セルバランス回路部が正常な場合、バイパススイッチの設定がOFFであれば(マイクロコントローラ28がDAコンバータを介してバイパスFET2、3のゲートにハイレベル信号を出力しなければ)、バイパスFET2、3のソース−ドレイン間の電圧は単電池電圧の3.7Vとなり、コンパレータ10、13出力はLow、コンパレータ11、12出力はHighとなる。バイパススイッチの設定がONであれば、バイパスFET2、3のソース−ドレイン間の電圧はバイパスFET2、3のオン状態時の抵抗値10Ωがあるため0.5Vであり、コンパレータ10〜13出力はHighとなる。バイパスFET2、3が外部短絡している場合、バイパススイッチの設定がOFF、ONに拘わらず、バイパスFET2、3のソース−ドレイン間の電圧は0Vとなり、コンパレータ10、13出力はHigh、コンパレータ11、12出力はLowとなり、CPUは異常検出が可能である。   If the cell balance circuit is normal and the bypass switch is set to OFF (if the microcontroller 28 does not output a high level signal to the gates of the bypass FETs 2 and 3 via the DA converter), the bypass FETs 2 and 3 The voltage between the source and the drain is 3.7 V, which is the cell voltage, the outputs of the comparators 10 and 13 are Low, and the outputs of the comparators 11 and 12 are High. If the setting of the bypass switch is ON, the voltage between the source and drain of the bypass FETs 2 and 3 is 0.5 V because of the resistance value 10Ω when the bypass FETs 2 and 3 are in the ON state, and the outputs of the comparators 10 to 13 are High. It becomes. When the bypass FETs 2 and 3 are short-circuited externally, the voltage between the source and drain of the bypass FETs 2 and 3 becomes 0 V regardless of the setting of the bypass switch OFF and ON, and the outputs of the comparators 10 and 13 are High, the comparator 11, 12 output becomes Low, and the CPU can detect abnormality.

バイパス抵抗4、5短絡の場合、バイパススイッチの設定がONであれば、バイパスFET2、3のソース−ドレイン間の電圧は3.7Vとなり、コンパレータ10、13出力はLow、コンパレータ11、12出力はHighとなり、CPUは異常検出が可能である。バイパススイッチの設定がOFF場合は、バイパスFET2、3のソース−ドレイン間の電圧は3.7Vとなり、コンパレータ10、13出力はLow、コンパレータ11、12出力はHighとなり、異常検出不能であるが、バイパススイッチの設定がONの時にのみバイパス電流が通電され、その時点で異常検出可能なため問題はない。   When the bypass resistors 4 and 5 are short-circuited and the bypass switch is set to ON, the voltage between the source and drain of the bypass FETs 2 and 3 is 3.7 V, the outputs of the comparators 10 and 13 are Low, and the outputs of the comparators 11 and 12 are High, and the CPU can detect an abnormality. When the setting of the bypass switch is OFF, the voltage between the source and drain of the bypass FETs 2 and 3 is 3.7 V, the outputs of the comparators 10 and 13 are Low, the outputs of the comparators 11 and 12 are High, and the abnormality cannot be detected. There is no problem because a bypass current is applied only when the bypass switch is set to ON, and an abnormality can be detected at that time.

バイパス抵抗4、5開放の場合、バイパススイッチの設定がOFF、ONに拘わらず、バイパスFET2、3のソース−ドレイン間の電圧は0Vとなり、コンパレータ10、13出力はHigh、コンパレータ11、12出力はLowとなり、CPUは異常検出が可能である。   When bypass resistors 4 and 5 are open, regardless of whether the bypass switch is set to OFF or ON, the voltage between the source and drain of bypass FETs 2 and 3 is 0 V, the outputs of comparators 10 and 13 are high, and the outputs of comparators 11 and 12 are It becomes Low and the CPU can detect an abnormality.

CPUは、セルバランス回路部の異常検出結果、又は、セルバランス回路部の異常検査を行った結果を(異常のない場合を含め)、インターフェースを介して上位制御システムに報知する。   The CPU notifies the host control system via the interface of the abnormality detection result of the cell balance circuit unit or the result of the abnormality check of the cell balance circuit unit (including the case where there is no abnormality).

以上のように、本実施形態の電池モジュール制御回路は、バイパススイッチとして機能するバイパスFET2、3の電圧を基準電圧源6〜9とコンパレータ10〜13で比較してセルバランス回路部の異常原因であるバイパスFET2、3の外部短絡、バイパス抵抗4、5の短絡及び開放を個別的に検出することが可能である。   As described above, the battery module control circuit according to the present embodiment compares the voltages of the bypass FETs 2 and 3 functioning as bypass switches between the reference voltage sources 6 to 9 and the comparators 10 to 13 to cause an abnormality in the cell balance circuit unit. It is possible to individually detect an external short circuit of a certain bypass FET 2, 3 and a short circuit and an open circuit of the bypass resistors 4, 5.

なお、本実施形態では、単電池電圧検出回路部をマイクロコントローラ28に内蔵した例を示したが、本発明はこれに制限されず、単電池電圧検出回路部をマイクロコントローラ28の外に配置するようにしてもよい。このような単電池電圧検出回路部にはマルチプレクサを用いることができ、マイクロコントローラ28からマルチプレクサに単電池を指定し、マルチプレクサは指定された単電池電圧をマイクロコントローラ28に出力し、マイクロコントローラ28はADコンバータを介してデジタル値を取り込むことで電池モジュールを構成する各単電池の電池電圧を把握する。   In the present embodiment, an example in which the single battery voltage detection circuit unit is built in the microcontroller 28 has been described. However, the present invention is not limited to this, and the single battery voltage detection circuit unit is disposed outside the microcontroller 28. You may do it. A multiplexer can be used for such a single cell voltage detection circuit unit, and a single cell is designated from the microcontroller 28 to the multiplexer, the multiplexer outputs the designated single cell voltage to the microcontroller 28, and the microcontroller 28 The battery voltage of each single cell constituting the battery module is grasped by taking a digital value through the AD converter.

また、本実施形態では、説明を簡単にするために、電池モジュール1を2個の単電池C1、C2で直列接続した例を説明したが、例えば、電気自動車用電池モジュールのように、直列ないし直並列される電池個数が多数の場合にも本発明が適用可能である。更に、本実施形態では、抵抗等の定数の具体例について説明したが、本発明がこれに制限されるものでないことは論を待たない。   Further, in the present embodiment, for the sake of simplicity, an example in which the battery module 1 is connected in series with two unit cells C1 and C2 has been described. However, for example, as in the case of an electric vehicle battery module, the battery module 1 may be connected in series. The present invention is also applicable when the number of series-parallel batteries is large. Furthermore, in the present embodiment, a specific example of a constant such as a resistance has been described, but it should be understood that the present invention is not limited to this.

本発明はセルバランス回路の個別的な異常を検出可能なセルバランス異常検出方式を提供するものであるため、セルバランス回路、電池モジュール制御回路又は同回路を有する電池モジュールの製造、販売に寄与するので、産業上の利用可能性を有する。   Since the present invention provides a cell balance abnormality detection method capable of detecting individual abnormality of a cell balance circuit, it contributes to the manufacture and sale of a cell balance circuit, a battery module control circuit, or a battery module having the circuit. So it has industrial applicability.

本発明が適用可能な実施形態の電池モジュール制御回路のブロック回路図である。It is a block circuit diagram of the battery module control circuit of an embodiment to which the present invention is applicable. 従来の電池モジュール制御回路のブロック回路図である。It is a block circuit diagram of the conventional battery module control circuit.

符号の説明Explanation of symbols

1 電池モジュール
2、3 バイパスFET(バイパススイッチ)
4、5 バイパス抵抗
10、11、12、13 コンパレータ
C1、C2 単電池
1 Battery module 2, 3 Bypass FET (Bypass switch)
4, 5 Bypass resistor 10, 11, 12, 13 Comparator C1, C2 Cell

Claims (2)

複数の単電池を接続した電池モジュールの各単電池の電圧測定機能およびバイパススイッチとバイパス抵抗とで構成され各単電池に並列に接続されたセルバランス回路により各単電池の充電状態を制御するセルバランス機能を有する制御回路を備え、前記バイパススイッチの電圧と基準電圧とをコンパレータで比較し、前記バイパススイッチの外部短絡、前記バイパス抵抗の短絡および開放を検出することを特徴とするセルバランス回路異常検出方式。   A cell that controls the charging state of each unit cell by a voltage measuring function of each unit cell of a battery module in which a plurality of unit cells are connected, and a cell balance circuit configured by a bypass switch and a bypass resistor and connected in parallel to each unit cell A cell balance circuit abnormality characterized by comprising a control circuit having a balance function, comparing a voltage of the bypass switch and a reference voltage by a comparator, and detecting an external short circuit of the bypass switch, a short circuit and an open circuit of the bypass resistor Detection method. 前記バイパススイッチにFETを用い、該FETのソース−ドレイン間の電圧と基準電圧とを前記コンパレータで比較することを特徴とする請求項1に記載のセルバランス回路異常検出方式。   2. The cell balance circuit abnormality detection system according to claim 1, wherein an FET is used as the bypass switch, and a voltage between a source and a drain of the FET is compared with a reference voltage by the comparator.
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