[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

JP2006323178A - Pellicle for lithography, and its manufacturing method - Google Patents

Pellicle for lithography, and its manufacturing method Download PDF

Info

Publication number
JP2006323178A
JP2006323178A JP2005146828A JP2005146828A JP2006323178A JP 2006323178 A JP2006323178 A JP 2006323178A JP 2005146828 A JP2005146828 A JP 2005146828A JP 2005146828 A JP2005146828 A JP 2005146828A JP 2006323178 A JP2006323178 A JP 2006323178A
Authority
JP
Japan
Prior art keywords
pellicle
film
frame
tension
temporary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005146828A
Other languages
Japanese (ja)
Inventor
Akihiko Nagata
愛彦 永田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Chemical Co Ltd
Priority to JP2005146828A priority Critical patent/JP2006323178A/en
Priority to KR1020060029451A priority patent/KR101244727B1/en
Priority to TW095115045A priority patent/TWI297508B/en
Publication of JP2006323178A publication Critical patent/JP2006323178A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70983Optical system protection, e.g. pellicles or removable covers for protection of mask

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a pellicle for lithography, of which the pellicle frame is not deformed with film tension even in the case of a large frame with ≥300 mm respective edge lengths, and which satisfies a specified dimensional specification and its manufacturing method. <P>SOLUTION: The pellicle is a large sized pellicle having a pellicle film held on the pellicle frame with ≥300 mm respective edge lengths, is characterized by having the pellicle film constructed with an amorphous fluoropolymer composed of a perfluorobutenyl vinyl ether polymer, wherein the tension of the pellicle film is more than 0 N/mm and less than 2×10<SP>-2</SP>N/mm, and is obtained by: diluting the amorphous fluoropolymer composed of the perfluorobutenyl vinyl ether polymer with a solvent; applying the polymer solution to a substrate; removing the solvent therefrom by heating the substrate at a temperature of ≥180°C; subsequently sticking and fixing the obtained pellicle film to a temporary frame and releasing the film from the substrate; subsequently sticking the film to the pellicle frame; and detaching the temporary frame. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、LSI、超LSIなどの半導体装置や液晶表示板を製造する際のリソグラフィ用マスクのゴミよけとして使用される、リソグラフィ用ペリクル及びその製造方法に関する。   The present invention relates to a lithography pellicle used as a dust mask for a lithography mask when manufacturing semiconductor devices such as LSI and VLSI and a liquid crystal display panel, and a method for manufacturing the same.

LSI、超LSIなどの半導体や液晶表示板などの製造においては、半導体ウェハーあるいは液晶用原板に光を照射してパターニングを作製するが、使用する露光原板(リソグラフィ用マスク)にゴミが付着していると、ゴミが光を吸収したり、曲げるため、転写したパターンが変形する、エッジががさつく、下地が黒く汚れる等、寸法、品質、外観などが損なわれるという問題があった。   In manufacturing semiconductors such as LSI and VLSI and liquid crystal display panels, patterning is performed by irradiating a semiconductor wafer or liquid crystal master plate with light, but dust adheres to the exposure master plate (lithography mask) used. In this case, there is a problem that the size, quality, appearance, and the like are impaired, such as dust absorbing the light or bending, the transferred pattern is deformed, the edge is rough, and the base is stained black.

このため、これらの作業は通常クリーンルーム内で行われるが、このクリーンルーム内でも露光原板を常に清浄に保つことが難しいため、露光原板の表面にゴミよけとして、露光用の光をよく通過させるペリクルを貼着する方法が採られている。この場合、ゴミは露光原版の表面には直接付着せず、ペリクル膜に付着するため、リソグラフィ時に焦点を露光原版のパターン上に合わせておけば、ペリクル膜上のゴミは転写に無関係となる。   For this reason, these operations are usually performed in a clean room, but it is difficult to always keep the exposure original plate clean even in this clean room. Therefore, a pellicle that allows exposure light to pass well as dust on the surface of the exposure original plate. The method of sticking is adopted. In this case, the dust does not directly adhere to the surface of the exposure original plate but adheres to the pellicle film. Therefore, if the focus is set on the pattern of the exposure original plate at the time of lithography, the dust on the pellicle film becomes irrelevant to the transfer.

図1は、ペリクルの全容を示す斜視図であり、図2は、その側断面図である。
ペリクルは、基本的に次のような構成からなっている。すなわち、露光に用いる光を良く透過させるニトロセルロース、酢酸セルロース、フッ素系ポリマーなどからなる透明なペリクル膜が黒色アルマイト処理を施したJIS A7075、A6061、A5052などのアルミニウム合金、ステンレス、ポリエチレンなどからなるペリクル枠の上面にペリクル膜の良溶媒を塗布して展張され、風乾・接着されている(特許文献1参照)。
FIG. 1 is a perspective view showing the entire pellicle, and FIG. 2 is a side sectional view thereof.
The pellicle basically has the following configuration. That is, a transparent pellicle film made of nitrocellulose, cellulose acetate, fluorine polymer, etc. that transmits light used for exposure well is made of aluminum alloy such as JIS A7075, A6061, A5052, etc., stainless steel, polyethylene, etc. with black alumite treatment A pellicle film is coated with a good solvent on the upper surface of the pellicle frame, and spread and air-dried (see Patent Document 1).

あるいは、ペリクル膜をアクリル樹脂、エポキシ樹脂またはフッ素樹脂などの接着剤で接着し(特許文献2,3参照)、さらに、露光原版に装着するために、ペリクル枠の下面にポリブテン樹脂、ポリ酢酸ビニル樹脂、アクリル樹脂及びシリコーン樹脂等からなる粘着層、及び粘着層の保護を目的としたレチクル粘着剤保護用ライナーが設けられている。   Alternatively, the pellicle film is bonded with an adhesive such as an acrylic resin, an epoxy resin, or a fluororesin (see Patent Documents 2 and 3), and a polybutene resin or polyvinyl acetate is attached to the lower surface of the pellicle frame for mounting on the exposure master. A pressure-sensitive adhesive layer made of a resin, an acrylic resin, a silicone resin, or the like, and a reticle pressure-sensitive adhesive protecting liner for the purpose of protecting the pressure-sensitive adhesive layer are provided.

特開昭58-219023号公報JP 58-219023 A 米国特許第4861402号U.S. Pat. No. 4,861,402 特公昭63-27707号公報Japanese Patent Publication No.63-27707 特開平9-258433号公報JP-A-9-258433 特開2001-42507号公報Japanese Patent Laid-Open No. 2001-42507 実用新案登録第2528924号Utility model registration No. 2528924

ペリクルは、マスク基板の表面に形成されたパターン領域を囲むように設置され、ペリクル外部の塵埃がパターン面に付着しないように、パターン領域はペリクル外部から隔離される。   The pellicle is placed so as to surround the pattern area formed on the surface of the mask substrate, and the pattern area is isolated from the outside of the pellicle so that dust outside the pellicle does not adhere to the pattern surface.

近年、ペリクルは、LSI、超LSIなどの半導体リソグラフィ用のフォトマスクに防塵用カバーとして用いられるばかりではなく、高精細化の進む液晶表示板の製造工程における、TFT回路の形成工程やカラーフィルターの形成工程におけるリソグラフィ工程においても、フォトマスクの防塵用として用いられている。   In recent years, pellicle is not only used as a dust-proof cover for semiconductor lithography photomasks such as LSI and VLSI, but also in TFT circuit formation process and color filter process in the manufacturing process of high definition liquid crystal display panels. In the lithography process in the formation process, it is also used for dust protection of a photomask.

従来の半導体リソグラフィ用ペリクルのサイズは、最大でも150 mm角程度であったが、液晶表示板のリソグラフィ工程で使用されるペリクルは、小型のものでも330mm×450mm、大型では850mm×1200mm程度のサイズになる。
この程度の大きさになると、図3に示すように、先ず膜張力で変形しない強度を有する仮枠体にペリクル膜を展張し、その後ペリクル膜はペリクル枠に移し変えられるが、このときペリクル枠は、特にその長辺がペリクル膜の張力によって内側方向に変形し、ペリクルに要求される寸法仕様を満たすことができない場合がある。
The size of the conventional pellicle for semiconductor lithography was about 150 mm square at the maximum, but the pellicle used in the lithography process of the liquid crystal display panel is 330 mm × 450 mm even for small size, and about 850 mm × 1200 mm for large size become.
When this size is reached, as shown in FIG. 3, the pellicle film is first spread on a temporary frame body that does not deform due to film tension, and then the pellicle film is transferred to the pellicle frame. In particular, the long side may be deformed inward by the tension of the pellicle film, and the dimensional specification required for the pellicle may not be satisfied.

このような問題に対して、フォトマスクのパターン領域を分割して、小さなペリクルを複数貼り付けることにより、ペリクルの変形を防止する方法が提案されている(特許文献4参照)。
また、ペリクルを大型のままとし、その変形防止対策として、図4に示すように、ペリクル枠の長辺側を予め外側に突出させた形状に加工し、展張したペリクル膜の張力でペリクル枠を変形させ、ペリクル枠の長辺がおよそ直線状になるようにする方法が提案されている(特許文献5参照)。
To solve such a problem, there has been proposed a method for preventing deformation of the pellicle by dividing the pattern region of the photomask and attaching a plurality of small pellicles (see Patent Document 4).
In addition, as shown in FIG. 4, the pellicle remains large and is processed into a shape in which the long side of the pellicle frame protrudes outward in advance as shown in FIG. A method has been proposed in which the long side of the pellicle frame is deformed so as to be approximately linear (see Patent Document 5).

しかし、特許文献4の方法は、より大型の露光領域を求めるミラープロジェクション方式の露光機には対応できない。
また、特許文献5の方法は一見合理的であり、古くから類似した方法が長尺の対辺を持つ大型の枠体に、引っ張り応力を有するフィルムや網等を張る際に広く用いられている。しかしこの方法は、例えば、特許文献6に記載があるように、展張物の張力を常に一定にし、それと釣り合う形状の枠体を製作することは容易ではなく、精度やコストアップなどの問題があった。
However, the method of Patent Document 4 cannot be applied to a mirror projection type exposure machine that requires a larger exposure area.
Further, the method of Patent Document 5 is reasonable at first glance, and a similar method has long been widely used when a film or a net having a tensile stress is stretched on a large frame having a long opposite side. However, in this method, for example, as described in Patent Document 6, it is not easy to produce a frame body having a shape that balances the tension of the spread material at all times, and there are problems such as accuracy and cost increase. It was.

本発明は、上記問題点に鑑み、各辺が300mm以上の大型であっても膜張力でペリクル枠が変形せず、所定の寸法仕様を満たすことのできるリソグラフィ用ペリクル及びその製造方法を提供することを目的としている。   In view of the above-described problems, the present invention provides a lithography pellicle that can satisfy a predetermined dimensional specification without deformation of the pellicle frame due to film tension even if each side is a large size of 300 mm or more, and a manufacturing method thereof. The purpose is that.

本発明のリソグラフィ用ペリクルは、各辺が300mm以上の長さを有するペリクル枠にペリクル膜を保持する大型ペリクルであって、該ペリクル膜がパーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーからなり、ペリクル膜の張力が0 N/mmより大きく、2×10-2N/mm未満であることを特徴としている。ペリクル枠は、JIS A5000系、A6000系、A7000系の何れかのアルミ合金から選択するのが好ましい。 The lithography pellicle of the present invention is a large pellicle that holds a pellicle film on a pellicle frame having a length of 300 mm or more on each side, and the pellicle film is an amorphous fluorine made of a polymer of perfluorobutenyl vinyl ether. It is made of a polymer, and the pellicle membrane has a tension of greater than 0 N / mm and less than 2 × 10 −2 N / mm. The pellicle frame is preferably selected from any one of JIS A5000, A6000, and A7000 aluminum alloys.

本発明のリソグラフィ用ペリクルの製造方法は、パーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーを溶媒に希釈して基板上に塗布し、180℃以上の温度で加熱して溶媒を除去した後、得られたペリクル膜を仮枠体に接着固定して基板から剥離し、その後ペリクル枠に貼り付け、仮枠体を取り外すことを特徴としている。このとき、仮枠体にペリクル膜が張られた状態で、ペリクル膜の張力により弾性変形する仮枠体の変位量によって、ペリクル枠に貼り付け後の膜張力が0 N/mmより大きく、2×10-2N/mm未満となるように仮枠体はその断面二次モーメントが調整されている。
なお、仮枠体は、JIS A5000系、A6000系、A7000系の何れかのアルミ合金からなり、断面二次モーメントの値5mm4 以上3500mm4以下とする。
In the method for producing a pellicle for lithography according to the present invention, an amorphous fluoropolymer composed of a polymer of perfluorobutenyl vinyl ether is diluted in a solvent, applied onto a substrate, and heated at a temperature of 180 ° C. or higher to remove the solvent. After that, the obtained pellicle film is bonded and fixed to the temporary frame, peeled off from the substrate, and then attached to the pellicle frame, and the temporary frame is removed. At this time, in a state where the pellicle film is stretched on the temporary frame body, the film tension after being attached to the pellicle frame is greater than 0 N / mm by the amount of displacement of the temporary frame body that is elastically deformed by the tension of the pellicle film, The moment of inertia of the temporary frame is adjusted so that it is less than × 10 -2 N / mm.
The temporary frame is made of any aluminum alloy of JIS A5000, A6000, or A7000, and the sectional moment of inertia is 5 mm 4 or more and 3500 mm 4 or less.

本発明によれば、上記構成としたことにより、a;耐光性が高い、b;ペリクル枠の変形が少ない、c;破損時のマスクへのダメージが少ないなど、超LSIなどの半導体や液晶表示板の製造におけるリソグラフィ工程用に適した大型のペリクルが得られる。   According to the present invention, by adopting the above configuration, a: high light resistance, b: little deformation of the pellicle frame, c: little damage to the mask at the time of breakage, etc. A large pellicle suitable for a lithography process in the production of a plate can be obtained.

本発明者は、上記課題を解決するために、鋭意検討努力を重ねた結果、ペリクル膜の張力をある一定の範囲の数値に収めることによって、ペリクル枠が変形せず、ペリクル膜にシワや弛みを出なくすることができることを見出し、さらに検討を加えて、ペリクル膜に再現性良く一定の膜張力を与える方法を見出し、課題を達成した。これにより品質の安定したペリクルが得られる。   As a result of intensive studies to solve the above problems, the present inventor has made the pellicle film not to be deformed by keeping the tension of the pellicle film within a certain range, so that the pellicle film is not wrinkled or loosened. The inventors have found that it is possible to eliminate the problem, and have further studied, and have found a method for imparting a constant film tension to the pellicle film with good reproducibility. As a result, a pellicle with stable quality can be obtained.

具体的には、ペリクル膜にパーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーを使用し、ペリクルの膜張力を、0 N/mmより大きく、2×10-2N/mm以下としている。この膜張力を再現性良くペリクルに与えるには、ペリクル膜を成膜基板から剥離する際に、剥離治具として、所定の断面二次モーメントを有し、ペリクル膜張力によって弾性変形可能な寸法に加工された膜剥離保持枠(仮枠体)を使用するものである。
これにより、ペリクル膜張力を常に所望の値で一定にすることができ、膜張力を前記範囲とすることにより、ペリクル枠に変形が無く、ペリクル膜にシワや弛みのないペリクルを得ることができる。
Specifically, an amorphous fluoropolymer made of a polymer of perfluorobutenyl vinyl ether is used for the pellicle membrane, and the membrane tension of the pellicle is set to be greater than 0 N / mm and 2 × 10 -2 N / mm or less. Yes. In order to give this film tension to the pellicle with good reproducibility, when peeling the pellicle film from the film formation substrate, it has a predetermined moment of inertia as a peeling jig and has a dimension that can be elastically deformed by the pellicle film tension. A processed film peeling and holding frame (temporary frame) is used.
As a result, the pellicle membrane tension can always be kept constant at a desired value, and by setting the membrane tension within the above range, a pellicle can be obtained in which there is no deformation in the pellicle frame and the pellicle membrane is free of wrinkles and slack. .

以下、本発明について、図を用いてさらに詳細に説明する。
本発明のペリクルは図1、2に示したように、ペリクル枠の上端面にペリクル膜貼り付け用接着剤を介してペリクル膜が展張されている。通常、下端面にレチクル接着用粘着剤層が形成され、さらに粘着剤層の下端面にライナーが剥離可能に貼着されている。
Hereinafter, the present invention will be described in more detail with reference to the drawings.
As shown in FIGS. 1 and 2, the pellicle of the present invention has a pellicle film stretched on the upper end surface of the pellicle frame via a pellicle film bonding adhesive. Usually, a pressure-sensitive adhesive layer for reticle adhesion is formed on the lower end surface, and a liner is detachably attached to the lower end surface of the pressure-sensitive adhesive layer.

ペリクル構成部材の大きさは、通常のペリクルのうち、大型液晶表示板の製造で使用されるリソグラフィ工程用ペリクル等と同程度であり、ペリクル枠サイズはおよそ300×300mm〜1500×1500mmである。ペリクル枠の材質は、公知の材質のものでよいが、変形の問題を考慮すると余り柔らかい材質のものは使用できない。ステンレススチールをはじめとするスチール製でもよいが、好ましくは軽量なアルミ合金であるJIS A7075、JIS A6061、JIS A5052等が好適に用いられる。   The size of the pellicle constituent member is about the same as that of a pellicle for a lithography process used in the manufacture of a large liquid crystal display panel among normal pellicles, and the pellicle frame size is about 300 × 300 mm to 1500 × 1500 mm. The material of the pellicle frame may be a known material, but a soft material cannot be used in consideration of deformation problems. Although it may be made of steel such as stainless steel, JIS A7075, JIS A6061, JIS A5052, etc., which are preferably lightweight aluminum alloys, are preferably used.

ペリクル枠の表面は、通常、サンドブラストや化学研磨によって粗面化されるが、本発明は、粗面化の方法についてなんら制約を与えるものではない。例えば、アルミ材を使用した場合には、ステンレス、カーボランダム、ガラスビーズ等によって表面をブラスト処理し、さらにNaOH等による化学研磨を行って表面を粗面化するとよい。
ペリクル枠表面の陽極酸化処理は、公知の方法によって行うことができるが、一般に、酸性電解液中において行われる。酸性電解液としては、硫酸水溶液、シュウ酸水溶液などが一般的に用いられる。
The surface of the pellicle frame is usually roughened by sandblasting or chemical polishing, but the present invention does not impose any restrictions on the method of roughening. For example, when an aluminum material is used, the surface may be roughened by blasting the surface with stainless steel, carborundum, glass beads or the like, and further performing chemical polishing with NaOH or the like.
The anodic oxidation treatment of the pellicle frame surface can be performed by a known method, but is generally performed in an acidic electrolytic solution. As the acidic electrolytic solution, a sulfuric acid aqueous solution, an oxalic acid aqueous solution, or the like is generally used.

ペリクル枠の少なくとも一側面には、少なくとも一つ以上の通気口を形成し、そのサイズ、形状、個数、場所等については、通気口に設置するフィルターのメッシュサイズ、濾過面積またはこれらから求められる通気量によって適宜設定すればよい。必要以上に大きな通気口を設けず、必要最低限の通気口を形成するのが好ましい。
通気口に設置する除塵用フィルターの形状、個数、場所等については、通気口と同様に適宜設定すればよい。フィルターの材質には、樹脂(PTFE、ナイロン66等)金属(316Lステンレススチール等)、セラミックス(アルミナ、チッ化アルミ等)等が挙げられる。また、除塵用フィルターの外側に環境中の化学物質を吸着又は分解するケミカルフィルターを装備してもよい。
At least one or more ventilation holes are formed on at least one side surface of the pellicle frame, and the size, shape, number, location, etc. of the filter are the mesh size of the filter installed in the ventilation hole, the filtration area, or the ventilation required from these. What is necessary is just to set suitably according to quantity. It is preferable not to provide a vent hole that is larger than necessary, and to form a minimum vent hole.
What is necessary is just to set suitably about the shape, the number, location, etc. of the filter for dust removal installed in a vent hole similarly to a vent hole. Examples of the material of the filter include resin (PTFE, nylon 66, etc.) metal (316L stainless steel, etc.), ceramics (alumina, aluminum nitride, etc.), and the like. In addition, a chemical filter that adsorbs or decomposes chemical substances in the environment may be provided outside the dust removal filter.

ペリクル膜としては、パーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーを使用し、ペリクル膜作製時に必要に応じて溶媒、例えば、フッ素系溶媒などに溶解して基板、例えば、ガラス基板上に塗付すればよい。
基板上に塗付するには、スピンコーター、バーコーター、ダイコーターなどの方法を採用することができる。ペリクル膜として必要な特性が得られれば、その他の方法を採用してもよい。
As the pellicle film, an amorphous fluorine polymer made of a polymer of perfluorobutenyl vinyl ether is used, and when the pellicle film is prepared, it is dissolved in a solvent, for example, a fluorine-based solvent or the like, and a substrate, for example, a glass substrate Just apply on top.
In order to apply on the substrate, methods such as a spin coater, a bar coater, and a die coater can be employed. Other methods may be adopted as long as the characteristics required for the pellicle film are obtained.

ペリクル膜接着用接着剤としては、従来より使用されているものが使用でき、例えば、アクリル樹脂接着剤、エポキシ樹脂接着剤、シリコーン樹脂接着剤、含フッ素シリコーン接着剤等のフッ素ポリマー等を挙げることができる。なかでも、シリコーン樹脂接着剤、フッ素系ポリマーが高い耐光性を持つ点で好適である。フッ素系ポリマーとしては、具体的にはフッ素系ポリマーCT69(旭硝子社製、商品名)等が挙げられる。
レチクル貼り付け用接着剤としては、両面粘着テープ、シリコーン樹脂粘着剤、アクリル系粘着剤等が挙げられる。
As the adhesive for pellicle film adhesion, those conventionally used can be used, for example, fluoropolymers such as acrylic resin adhesive, epoxy resin adhesive, silicone resin adhesive, fluorine-containing silicone adhesive, etc. Can do. Among these, a silicone resin adhesive and a fluorine-based polymer are preferable in that they have high light resistance. Specific examples of the fluorine-based polymer include fluorine-based polymer CT69 (trade name, manufactured by Asahi Glass Co., Ltd.).
Examples of the adhesive for attaching the reticle include a double-sided pressure-sensitive adhesive tape, a silicone resin pressure-sensitive adhesive, and an acrylic pressure-sensitive adhesive.

本発明のペリクルは、通常の方法でペリクル枠の上端面にペリクル膜貼着用接着剤層を介してペリクル膜を展張して得られる。通常、ペリクル枠の下端面には、レチクル貼り付け用接着剤層が設けられ、さらにこの上に離型層が剥離可能に貼り付けられる。
なお、ペリクル膜貼り付け用接着剤層は、必要により溶媒で希釈してペリクル枠上端面に塗布し、加熱して乾燥・硬化させ形成される。接着剤の塗布方法としては、刷毛塗り、スプレー、自動ディスペンサーによる方法等が挙げられる。
本発明で使用する、レチクル接着剤保護用ライナーについては、公知の様々な材質のものが使用でき、例えば、PET、PTFE、PFA、PE、PC、塩ビ、PP等が挙げられ、これらの基材の表面に、使用する粘着剤に適した離型層が形成される。
The pellicle of the present invention is obtained by spreading a pellicle film on the upper end surface of the pellicle frame through an adhesive layer for attaching a pellicle film by a normal method. Usually, an adhesive layer for attaching a reticle is provided on the lower end surface of the pellicle frame, and a release layer is further attached to the release layer so as to be peelable.
The adhesive layer for attaching the pellicle film is formed by diluting with a solvent if necessary, applying it to the upper end surface of the pellicle frame, drying and curing by heating. Examples of the method for applying the adhesive include brush coating, spraying, and a method using an automatic dispenser.
As the reticle adhesive protection liner used in the present invention, various known materials can be used, and examples thereof include PET, PTFE, PFA, PE, PC, PVC, PP, and the like. A release layer suitable for the pressure-sensitive adhesive to be used is formed on the surface.

本発明では、大型基板上に形成したペリクル膜を、基板とほぼ同じサイズの仮枠体を膜面に接着し、仮枠体で膜を基板から剥離する。さらに、ペリクル枠に接着剤を塗布した後、仮枠体で剥離した膜を接着剤表面に貼り付ける。
仮枠体は、基板から膜を支障無く剥離できるものあれば、特に材質に制限はないが、その寸法は、最終的に所望のペリクル膜張力が得られるように、その材質によって決まるヤング率と、形状から所望の断面二次モーメントが得られるように設計する必要がある。これにより、膜の張力に応じて仮枠体は内側に向かって撓み、常に一定の膜張力で安定する。この状態でペリクル膜を仮枠体からペリクル枠に貼り替えることにより、所望の膜張力を有するペリクルが得られる。
In the present invention, a pellicle film formed on a large-sized substrate is bonded to a film surface with a temporary frame having substantially the same size as the substrate, and the film is peeled off from the substrate with the temporary frame. Further, after applying an adhesive to the pellicle frame, the film peeled off by the temporary frame is attached to the adhesive surface.
The material of the temporary frame is not particularly limited as long as the film can be peeled off from the substrate without hindrance, but the dimensions are determined by the Young's modulus determined by the material so that a desired pellicle film tension can be finally obtained. It is necessary to design so that a desired moment of inertia of the cross section can be obtained from the shape. As a result, the temporary frame body bends inward according to the tension of the film, and is always stabilized at a constant film tension. In this state, the pellicle film having a desired film tension can be obtained by replacing the pellicle film from the temporary frame body to the pellicle frame.

図5は、本発明の実施形態の一例を示している。
仮枠体1は、断面二次モーメントの値が5mm4 〜3500mm4の範囲にあり、仮枠体1に基板より剥離したペリクル膜が展張されている。仮枠体1は、ペリクル膜の張力によってその長辺が内側に撓み変形する。この変形により、ペリクル枠貼り付け後の膜張力は0〜2×10-2N/mmとなる。このペリクル膜に予め膜接着剤を塗布したペリクル枠を接着し、ペリクル枠周辺の不要な膜を切断除去することによりペリクルが得られる。これにより展張されたペリクル膜は、仮枠体1から剥離された時の膜張力を保持しているため、所望の膜張力を持ったペリクルが得られる。
FIG. 5 shows an example of an embodiment of the present invention.
Kariwakutai 1, the value of the second moment is in the range of 5mm 4 ~3500mm 4, peeled-off pellicle film was from the substrate to Kariwakutai 1 is stretched. The temporary frame 1 is deformed by bending its long side inward due to the tension of the pellicle film. Due to this deformation, the film tension after attaching the pellicle frame becomes 0 to 2 × 10 −2 N / mm. A pellicle can be obtained by adhering a pellicle frame to which a film adhesive has been applied in advance to this pellicle film, and cutting and removing unnecessary films around the pellicle frame. Since the stretched pellicle film retains the film tension when peeled from the temporary frame 1, a pellicle having a desired film tension can be obtained.

所望の膜張力を得るために必要な仮枠体は、以下の方法によって適宜設計することができる。
大型ペリクル枠体の変形量は、δを枠体の辺中央部での内側方向への変形量とすると、
δ=P L4/384EI
で求められる。なお、Pは膜張力、Eは枠体のヤング率、Iは枠体の断面二次モーメント、Lは仮枠体の辺長である。さらに、断面二次モーメントは、
I=hW3/12
で表される。hはペリクル枠の高さ、Wはペリクル枠の幅である。
The temporary frame necessary for obtaining a desired film tension can be appropriately designed by the following method.
The amount of deformation of the large pellicle frame is defined as the amount of deformation in the inner direction at the center of the side of the frame.
δ = PL 4 / 384EI
Is required. P is the film tension, E is the Young's modulus of the frame, I is the secondary moment of section of the frame, and L is the side length of the temporary frame. In addition, the moment of inertia of the cross section is
I = hW 3/12
It is represented by h is the height of the pellicle frame, and W is the width of the pellicle frame.

仮枠体の変形後ペリクル枠に貼り付けられた膜張力σ1は、変位δに膜の弾性係数を乗じた分張力が緩和される。すなわち、次式で表される。
σ1=σ0−kδ=σ0−(kPL4/384EI)=σ0−(kPL4/32Ebh3
ここで、σ0は仮枠体の変形がない場合の膜張力、kは膜の弾性係数である。ただし、σ1≧0であり、膜材料が弾性変形し、かつ仮枠体が膜張力によって塑性変形しない範囲で有れば、σ1≒0〜σ1=σ0の間で任意の膜張力をペリクルに持たせることが可能である。
従って、仮枠体の変形によって得られる緩和された膜張力は、仮枠体の材質を決めればヤング率が決まるため、仮枠体の形状及び寸法即ち、断面二次モーメント及び仮枠体の辺の長さによって決まることになる。
The film tension σ 1 affixed to the pellicle frame after deformation of the temporary frame is relaxed by the amount obtained by multiplying the displacement δ by the elastic coefficient of the film. That is, it is expressed by the following formula.
σ 1 = σ 0 −kδ = σ 0 − (kPL 4 / 384EI) = σ 0 − (kPL 4 / 32Ebh 3 )
Here, σ 0 is the film tension when there is no deformation of the temporary frame, and k is the elastic coefficient of the film. However, if σ 1 ≧ 0, the film material is elastically deformed, and the temporary frame is in a range where plastic deformation is not caused by film tension, any film tension between σ 1 ≈0 and σ 1 = σ 0 Can be held on the pellicle.
Therefore, since the relaxed film tension obtained by deformation of the temporary frame body determines the Young's modulus if the material of the temporary frame body is determined, the shape and dimensions of the temporary frame body, that is, the moment of inertia of the cross section and the side of the temporary frame body Will be determined by the length of.

断面2次モーメントの値は、必要とする仮枠体の大きさによって任意に決めることができるが、想定される大型液晶用ペリクルでは、仮枠体の大きさが一辺1400mm程度と推定されるため5mm4〜3500mm4とするのが好ましい。
図6に、辺長が900mm、1000mm、1400mmの場合について、断面二次モーメントと仮枠体の変形量との関係をグラフで示した。断面二次モーメントを3500mm4以上に取ると仮枠体の変形量が少なすぎ、ペリクル枠展張後の膜張力を所定の値に調節することができない。他方、仮枠体の断面二次モーメントを小さくし過ぎると、変形が大きくなりすぎ、ペリクル膜をペリクル枠に貼った際に膜に弛みやシワを生じる。
The value of the moment of inertia of the cross section can be determined arbitrarily depending on the size of the required temporary frame, but in the assumed large liquid crystal pellicle, the size of the temporary frame is estimated to be about 1400 mm on a side. preferably a 5mm 4 ~3500mm 4.
FIG. 6 is a graph showing the relationship between the cross-sectional secondary moment and the amount of deformation of the temporary frame when the side length is 900 mm, 1000 mm, and 1400 mm. If the second moment of section is 3500 mm 4 or more, the amount of deformation of the temporary frame is too small, and the film tension after the pellicle frame is stretched cannot be adjusted to a predetermined value. On the other hand, if the cross-sectional secondary moment of the temporary frame is too small, the deformation becomes too large, and when the pellicle film is attached to the pellicle frame, the film is slackened or wrinkled.

以下、本発明のペリクルの製造方法について、具体的に説明する。
先ず、大型基板上に、溶剤に溶解したポリマーをスピンコート法などで塗布する。さらに、溶媒の沸点付近の温度で乾燥し、ペリクル膜を形成する。次に、基板とほぼ同じ大きさの仮枠体に接着剤を塗布して基板上に形成したペリクル膜に貼り合わせる。接着後、仮枠体を基板上から剥離し、ペリクル膜を仮枠体に移し取る。
The pellicle manufacturing method of the present invention will be specifically described below.
First, a polymer dissolved in a solvent is applied onto a large substrate by a spin coat method or the like. Further, the film is dried at a temperature near the boiling point of the solvent to form a pellicle film. Next, an adhesive is applied to a temporary frame that is approximately the same size as the substrate and is bonded to a pellicle film formed on the substrate. After bonding, the temporary frame is peeled off from the substrate, and the pellicle film is transferred to the temporary frame.

仮枠体には、移し取ったペリクル膜の張力に対応する撓み量が発生する。このとき、仮枠体の断面二次モーメントがペリクル枠にペリクル膜を展張した際に、膜張力が0〜2×10-2N/mmになるように設定されているため、仮枠体に展張されたペリクル膜は、その伸びがペリクル枠に展張後の膜張力0〜2×10-2N/mmに対応する値となる。
仮枠体に展張されたペリクル膜をペリクル枠に接着剤で接着し、ペリクル枠の周囲の不要膜部分をカッターで切断除去して、膜張力が所定の範囲にあるペリクルが得られる。
A deflection amount corresponding to the tension of the transferred pellicle film is generated in the temporary frame. At this time, when the cross-sectional second moment of the temporary frame body is set so that the film tension is 0 to 2 × 10 -2 N / mm when the pellicle film is spread on the pellicle frame, the temporary frame body The stretched pellicle film has a value corresponding to a film tension of 0 to 2 × 10 −2 N / mm after stretching on the pellicle frame.
The pellicle film spread on the temporary frame body is adhered to the pellicle frame with an adhesive, and unnecessary film portions around the pellicle frame are cut and removed with a cutter to obtain a pellicle having a film tension within a predetermined range.

以下、実施例及び比較例を挙げてさらに具体的に説明する。
(実施例1)
先ず、外寸474mm×782mm×長辺幅7.0mm、短辺幅6.0mm、厚さ5.5mmの、材質A5052からなるアルミニウム合金製ペリクル枠を用意した。このペリクル枠の一側面中央に直径0.5mmの通気孔を10個設けた。ペリクル枠を表面洗浄した後、ガラスビーズを使用し、吐出圧1.5kg/cm2のサンドブラスト装置にて1分間表面処理し表面を粗化した。
Hereinafter, the present invention will be described more specifically with reference to examples and comparative examples.
(Example 1)
First, an aluminum alloy pellicle frame made of material A5052 having an outer dimension of 474 mm × 782 mm × long side width 7.0 mm, short side width 6.0 mm, and thickness 5.5 mm was prepared. Ten vent holes with a diameter of 0.5 mm were provided in the center of one side of the pellicle frame. After cleaning the surface of the pellicle frame, glass beads were used, and the surface was roughened by surface treatment for 1 minute with a sandblasting apparatus having a discharge pressure of 1.5 kg / cm 2 .

次いで、NaOH処理浴中にて10秒間処理し洗浄した後、化成電圧10V(1.3A)にて14%硫酸水溶液、液温18℃中で陽極酸化を行った。その後、ペリクル枠の内面にスプレーコーティング装置を用いて、シリコーン系粘着剤を1μmコーティングした。さらに、先に設けた通気孔に、材質がPTFEで塵埃濾過サイズが0.1μm〜3.0μmで99.9999%である、巾9.5mm高さ2.5mm、厚さ300μmのフィルターを取り付けた。
一方、ペリクル膜の仮枠体として、外寸800mm×920mm×6mm、厚さ6mmの材質A7075-T651からなるアルミニウム合金製ペリクル枠を用意した。
Next, after treatment for 10 seconds in a NaOH treatment bath and washing, anodization was performed at a conversion voltage of 10 V (1.3 A) in a 14% aqueous sulfuric acid solution at a liquid temperature of 18 ° C. Thereafter, the inner surface of the pellicle frame was coated with 1 μm of a silicone adhesive using a spray coating apparatus. Further, a filter having a width of 9.5 mm, a height of 2.5 mm, and a thickness of 300 μm, having a material of PTFE and a dust filtration size of 0.1 μm to 3.0 μm and 99.9999%, was attached to the vent hole provided in advance.
On the other hand, an aluminum alloy pellicle frame made of a material A7075-T651 having an outer dimension of 800 mm × 920 mm × 6 mm and a thickness of 6 mm was prepared as a temporary frame for the pellicle film.

次に、サイトップCTX809(旭硝子社製、商品名)をフッ素系溶剤・フロリナートFC-75(米国スリーエム社製、商品名)に溶解させて濃度8%の溶液を調整した。この溶液を、外寸850mm×1200mmの鏡面研磨した石英ガラス基板面に、スピンコーターを用いて膜厚4μmの透明なペリクル膜を形成した。
仮枠体に、エポキシ系接着剤アラルダイトラピッド(昭和高分子社製、商品名)を塗布して基板上のペリクルに接着し、基板よりペリクル膜を剥離した。
Next, Cytop CTX809 (trade name, manufactured by Asahi Glass Co., Ltd.) was dissolved in a fluorine-based solvent, Fluorinert FC-75 (trade name, manufactured by 3M USA) to prepare a solution having a concentration of 8%. A transparent pellicle film having a film thickness of 4 μm was formed on the surface of a quartz glass substrate having an external dimension of 850 mm × 1200 mm mirror-polished by using a spin coater.
An epoxy adhesive Araldai Rapid (trade name, manufactured by Showa Polymer Co., Ltd.) was applied to the temporary frame and adhered to the pellicle on the substrate, and the pellicle film was peeled off from the substrate.

ペリクル枠の一端面にシリコーン系粘着剤を塗布し、100℃で10分加熱し乾燥硬化させた。このペリクル枠の他方の端面上にもシリコーン系接着剤を塗布し100℃で10分加熱し乾燥硬化させた。PET製ライナーを用意し、CCDカメラによる画像処理位置決め機構を有するライナー貼り付け装置を用いて粘着剤で貼り合わせた。
このようにして仕上がったペリクル枠を、仮枠体に剥離したサイトップの膜表面に密着させ、IRランプでペリクル枠を加熱してペリクル枠と膜を接着させた。このとき、ペリクル枠と仮枠体は、ペリクル枠の接着面を上向きにして固定用の治具に取り付け、相対的に位置がずれないように固定した。
A silicone pressure-sensitive adhesive was applied to one end surface of the pellicle frame, and was dried and cured by heating at 100 ° C. for 10 minutes. A silicone-based adhesive was also applied to the other end surface of the pellicle frame, and was dried and cured by heating at 100 ° C. for 10 minutes. A PET liner was prepared and pasted with an adhesive using a liner pasting apparatus having an image processing positioning mechanism using a CCD camera.
The pellicle frame thus finished was brought into close contact with the surface of the Cytop film peeled off from the temporary frame, and the pellicle frame was heated with an IR lamp to bond the pellicle frame and the film. At this time, the pellicle frame and the temporary frame body were attached to a fixing jig with the adhesive surface of the pellicle frame facing upward, and were fixed so as not to be relatively displaced.

次いで、ペリクル枠の外側に位置する仮枠枠を引き上げて固定し、ペリクル枠外側の膜部に0.5g/cmの張力を与えた状態で、ペリクル枠の接着剤部分の周辺部に沿ってカッターを移動させながら、ペリクル枠外側の不要膜部分を切断除去した。
完成したペリクルのペリクル枠内側方向への撓みを定盤と隙間ゲージを用いて測定したところ、2つの長辺の中央付近で100μm以下、短辺で50μm以下であった。また、膜に弛みやしわの発生はなかった。
Next, the temporary frame frame located outside the pellicle frame is pulled up and fixed, and a cutter is applied along the periphery of the adhesive part of the pellicle frame with a tension of 0.5 g / cm applied to the film part outside the pellicle frame. The unnecessary film portion outside the pellicle frame was cut off and removed while moving.
When the deflection of the completed pellicle toward the inside of the pellicle frame was measured using a surface plate and a gap gauge, it was 100 μm or less near the center of the two long sides and 50 μm or less on the short side. In addition, there was no slack or wrinkle on the membrane.

(実施例2)
ペリクル枠として、外寸474mm×782mm×6.5mm、厚さ7mmの材質A7075-T651からなるアルミニウム合金製ペリクル枠を使用し、ペリクル膜の仮枠体として、外寸800mm×920mm×5mm、厚さ5mmの材質A6061-T651からなるアルミニウム合金製ペリクル枠を使用した以外は、実施例1と同様にしてペリクルを作製した。
完成したペリクルのペリクル枠内側方向への撓みを定盤と隙間ゲージを用いて測定したところ、2つの長辺の中央付近で100μm以下、短辺で25μm以下であった。また、膜に弛みやしわは発生しなかった。
(Example 2)
As the pellicle frame, an aluminum alloy pellicle frame made of material A7075-T651 with an outer dimension of 474 mm x 782 mm x 6.5 mm and a thickness of 7 mm is used, and as a temporary frame body of the pellicle film, the outer dimension is 800 mm x 920 mm x 5 mm, thickness A pellicle was produced in the same manner as in Example 1 except that an aluminum alloy pellicle frame made of 5 mm material A6061-T651 was used.
When the deflection of the completed pellicle toward the inside of the pellicle frame was measured using a surface plate and a gap gauge, it was 100 μm or less near the center of the two long sides and 25 μm or less on the short side. Further, no slack or wrinkle was generated on the film.

(比較例1)
ペリクル枠として、外寸474mm×782mm×長辺幅7.0mm、短辺幅6.0mm、厚さ5.5mmのA5052からなるアルミニウム合金製ペリクル枠を使用し、ペリクル膜の仮枠体として、外寸800mm×920mm×12mm、厚さ10mmのA6061-T651からなるアルミニウム合金製ペリクル枠を使用した以外は、実施例1と同様にしてペリクルを作製した。
完成したペリクルのペリクル枠内側方向への撓みを定盤と隙間ゲージを用いて測定したところ、膜に弛みやしわは無かったものの、2つの長辺の中央付近で1000μm、短辺で200μmであった。
(Comparative Example 1)
As the pellicle frame, an aluminum alloy pellicle frame consisting of A5052 with outer dimensions 474 mm × 782 mm × long side width 7.0 mm, short side width 6.0 mm, thickness 5.5 mm is used. A pellicle was produced in the same manner as in Example 1 except that an aluminum alloy pellicle frame made of A6061-T651 having a size of × 920 mm × 12 mm and a thickness of 10 mm was used.
When the deflection of the completed pellicle was measured using a surface plate and a gap gauge, the film was free of slack and wrinkles, but it was 1000 μm near the center of the two long sides and 200 μm on the short side. It was.

その他の条件で行った例を含め、実施例、比較例とともにその結果を表1にまとめて示した。表中、変位欄の○は、ペリクル枠に撓み(変位)が無かったことを示し、膜外観欄の○は、ペリクル膜に弛みやしわが無かったことを示している。なお、断面二次モーメントの単位はmm4であり、膜張力の単位は10-2N/mmである。その他の数値の単位はmmである。 The results are shown in Table 1 together with examples and comparative examples, including examples conducted under other conditions. In the table, ○ in the displacement column indicates that the pellicle frame has not been bent (displaced), and ○ in the film appearance column indicates that the pellicle film has no slack or wrinkles. The unit of the sectional moment is mm 4 and the unit of the film tension is 10 −2 N / mm. The unit of other numerical values is mm.

Figure 2006323178
Figure 2006323178

本発明のペリクルは、半導体リソグラフィ用として、特には、大型液晶ディスプレイ製造用TFT回路形成露光工程やカラーフィルターの形成露光工程に好適に用いられる。   The pellicle of the present invention is suitably used for semiconductor lithography, particularly in a TFT circuit forming exposure process for manufacturing a large liquid crystal display and a color filter forming exposure process.

ペリクルの全容を示す斜視図である。It is a perspective view showing the whole pellicle. 図1に示したペリクルの側断面図である。It is a sectional side view of the pellicle shown in FIG. 従来のペリクル膜の課題を説明する図である。It is a figure explaining the subject of the conventional pellicle film. 従来のペリクル膜の展張方法を説明する図である。It is a figure explaining the stretching method of the conventional pellicle film. 本発明によるペリクル膜の展張方法を説明する図である。It is a figure explaining the expansion method of the pellicle film | membrane by this invention. 断面二次モーメントと仮枠体の変形量との関係を示すグラフである。It is a graph which shows the relationship between a section secondary moment and the amount of deformation of a temporary frame.

Claims (5)

各辺が300mm以上の長さを有するペリクル枠にペリクル膜を保持する大型ペリクルであって、該ペリクル膜がパーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーからなり、ペリクル膜の張力が0 N/mmより大きく、2×10-2N/mm未満であることを特徴とするリソグラフィ用ペリクル。 A large pellicle that holds a pellicle film on a pellicle frame having a length of 300 mm or more on each side, the pellicle film is made of an amorphous fluoropolymer made of a polymer of perfluorobutenyl vinyl ether, and the tension of the pellicle film A pellicle for lithography, characterized in that is greater than 0 N / mm and less than 2 × 10 −2 N / mm. 前記ペリクル枠が、JIS A5000系、A6000系、A7000系の何れかのアルミ合金からなる請求項1に記載のリソグラフィ用ペリクル。 2. The pellicle for lithography according to claim 1, wherein the pellicle frame is made of any one of JIS A5000 series, A6000 series, and A7000 series aluminum alloys. パーフルオロブテニルビニルエーテルの重合体からなる非晶質フッ素ポリマーを溶媒に希釈して基板上に塗布し、180℃以上の温度で加熱して溶媒を除去した後、得られたペリクル膜を仮枠体に接着固定して基板から剥離し、その後ペリクル枠に貼り付け、仮枠体を取り外すことを特徴とするリソグラフィ用ペリクルの製造方法。 Amorphous fluoropolymer composed of a polymer of perfluorobutenyl vinyl ether is diluted in a solvent and coated on a substrate, heated at a temperature of 180 ° C. or higher to remove the solvent, and the resulting pellicle film is temporarily framed. A method for producing a pellicle for lithography, characterized by being bonded and fixed to a body, peeled off from a substrate, then attached to a pellicle frame, and a temporary frame body removed. 前記仮枠体にペリクル膜が張られた状態で、ペリクル膜の張力により弾性変形する仮枠体の変位量によって、ペリクル枠に貼り付け後の膜張力が0 N/mmより大きく、2×10-2N/mm未満となるように仮枠体の断面二次モーメントが調整されている請求項3に記載のリソグラフィ用ペリクルの製造方法。 With the pellicle film stretched on the temporary frame body, the film tension after being attached to the pellicle frame is greater than 0 N / mm due to the amount of displacement of the temporary frame body that is elastically deformed by the tension of the pellicle film, 2 × 10 The method for manufacturing a pellicle for lithography according to claim 3, wherein the moment of inertia of the cross section of the temporary frame is adjusted to be less than -2 N / mm. 前記仮枠体が、JIS A5000系、A6000系、A7000系の何れかのアルミ合金からなり、断面二次モーメントの値が、5mm4 以上3500mm4以下である請求項3又は4に記載のリソグラフィ用ペリクルの製造方法。
5. The lithography according to claim 3, wherein the temporary frame is made of an aluminum alloy of any of JIS A5000 series, A6000 series, and A7000 series, and a cross-sectional secondary moment value is 5 mm 4 or more and 3500 mm 4 or less. Pellicle manufacturing method.
JP2005146828A 2005-05-19 2005-05-19 Pellicle for lithography, and its manufacturing method Pending JP2006323178A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2005146828A JP2006323178A (en) 2005-05-19 2005-05-19 Pellicle for lithography, and its manufacturing method
KR1020060029451A KR101244727B1 (en) 2005-05-19 2006-03-31 Method of manufacturing pellicle for lithography
TW095115045A TWI297508B (en) 2005-05-19 2006-04-27 Pellicle for photolithography and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005146828A JP2006323178A (en) 2005-05-19 2005-05-19 Pellicle for lithography, and its manufacturing method

Publications (1)

Publication Number Publication Date
JP2006323178A true JP2006323178A (en) 2006-11-30

Family

ID=37542905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005146828A Pending JP2006323178A (en) 2005-05-19 2005-05-19 Pellicle for lithography, and its manufacturing method

Country Status (3)

Country Link
JP (1) JP2006323178A (en)
KR (1) KR101244727B1 (en)
TW (1) TWI297508B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008176102A (en) * 2007-01-19 2008-07-31 Shin Etsu Chem Co Ltd Method for applying film adhesive on pellicle frame
JP2009301022A (en) * 2008-05-13 2009-12-24 Shin-Etsu Chemical Co Ltd Pellicle stripping method and stripping apparatus used for the method
JP2010102357A (en) * 2007-07-06 2010-05-06 Asahi Kasei E-Materials Corp Frame of large pellicle and grasping method of the frame
JP2013195852A (en) * 2012-03-21 2013-09-30 Asahi Kasei E-Materials Corp Method of manufacturing pellicle, and pellicle
JP2016206527A (en) * 2015-04-27 2016-12-08 三井化学株式会社 Method for demounting pellicle
WO2022220228A1 (en) * 2021-04-13 2022-10-20 信越化学工業株式会社 Pellicle frame laminate and method for manufacturing pellicle using said laminate

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI456341B (en) * 2010-03-10 2014-10-11 Asahi Kasei E Materials Corp Large protective film frame and large protective film
US10031411B2 (en) 2014-11-26 2018-07-24 Taiwan Semiconductor Manufacturing Company, Ltd. Pellicle for EUV mask and fabrication thereof
CN106048520B (en) * 2016-05-27 2017-11-17 京东方科技集团股份有限公司 Mask plate framework and main body, mask plate and preparation method, substrate and display panel

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367262A (en) * 1989-05-31 1991-03-22 Asahi Glass Co Ltd Protective implement for preventing contamination
JP2528924Y2 (en) * 1991-06-21 1997-03-12 ワイケイケイアーキテクチュラルプロダクツ株式会社 Screen frame
JPH1165092A (en) * 1997-08-19 1999-03-05 Shin Etsu Chem Co Ltd Pellicle and manufacture of pellicle
JP2001042507A (en) * 1999-07-30 2001-02-16 Asahi Kasei Electronics Co Ltd Frame for large-sized pellicle
JP2001109135A (en) * 1999-07-30 2001-04-20 Asahi Kasei Electronics Co Ltd Frame for large-sized pellicle and large-sized pellicle
JP2001255643A (en) * 2000-03-10 2001-09-21 Shin Etsu Chem Co Ltd Pellicle for lithography
JP2001264957A (en) * 2000-03-22 2001-09-28 Shin Etsu Chem Co Ltd Pellicle for lithography
JP2004341225A (en) * 2003-05-15 2004-12-02 Asahi Kasei Electronics Co Ltd Assembling apparatus of large-size pellicle
JP2006146064A (en) * 2004-11-24 2006-06-08 Asahi Kasei Electronics Co Ltd Temporary frame for stripping large pellicle

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020053083A (en) * 1999-11-17 2002-07-04 메리 이. 보울러 Ultraviolet and Vacuum Ultraviolet Transparent Polymer Compositions and their Uses

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367262A (en) * 1989-05-31 1991-03-22 Asahi Glass Co Ltd Protective implement for preventing contamination
JP2528924Y2 (en) * 1991-06-21 1997-03-12 ワイケイケイアーキテクチュラルプロダクツ株式会社 Screen frame
JPH1165092A (en) * 1997-08-19 1999-03-05 Shin Etsu Chem Co Ltd Pellicle and manufacture of pellicle
JP2001042507A (en) * 1999-07-30 2001-02-16 Asahi Kasei Electronics Co Ltd Frame for large-sized pellicle
JP2001109135A (en) * 1999-07-30 2001-04-20 Asahi Kasei Electronics Co Ltd Frame for large-sized pellicle and large-sized pellicle
JP2001255643A (en) * 2000-03-10 2001-09-21 Shin Etsu Chem Co Ltd Pellicle for lithography
JP2001264957A (en) * 2000-03-22 2001-09-28 Shin Etsu Chem Co Ltd Pellicle for lithography
JP2004341225A (en) * 2003-05-15 2004-12-02 Asahi Kasei Electronics Co Ltd Assembling apparatus of large-size pellicle
JP2006146064A (en) * 2004-11-24 2006-06-08 Asahi Kasei Electronics Co Ltd Temporary frame for stripping large pellicle

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008176102A (en) * 2007-01-19 2008-07-31 Shin Etsu Chem Co Ltd Method for applying film adhesive on pellicle frame
JP2010102357A (en) * 2007-07-06 2010-05-06 Asahi Kasei E-Materials Corp Frame of large pellicle and grasping method of the frame
TWI498671B (en) * 2007-07-06 2015-09-01 Asahi Kasei Emd Corp Large pellicle frame and a method for holding such a frame
JP2009301022A (en) * 2008-05-13 2009-12-24 Shin-Etsu Chemical Co Ltd Pellicle stripping method and stripping apparatus used for the method
JP2013195852A (en) * 2012-03-21 2013-09-30 Asahi Kasei E-Materials Corp Method of manufacturing pellicle, and pellicle
JP2016206527A (en) * 2015-04-27 2016-12-08 三井化学株式会社 Method for demounting pellicle
WO2022220228A1 (en) * 2021-04-13 2022-10-20 信越化学工業株式会社 Pellicle frame laminate and method for manufacturing pellicle using said laminate
JP7556458B2 (en) 2021-04-13 2024-09-26 信越化学工業株式会社 Pellicle frame laminate and method for manufacturing a pellicle using the same

Also Published As

Publication number Publication date
KR101244727B1 (en) 2013-03-18
KR20060120403A (en) 2006-11-27
TW200709274A (en) 2007-03-01
TWI297508B (en) 2008-06-01

Similar Documents

Publication Publication Date Title
KR101762957B1 (en) Pellicle, mounting method therefor, pellicle-equipped mask, and mask
KR101244727B1 (en) Method of manufacturing pellicle for lithography
TWI440970B (en) Pellicle for lithography
JP5152870B2 (en) Pellicle for lithography and method for manufacturing the same
US10429730B2 (en) Pellicle
JP2008065258A (en) Pellicle for lithography
TWI554409B (en) A method for bonding a pellicle, and a bonding apparatus used in this method
JP2004157229A (en) Pellicle for lithography and its manufacturing method
JP2011076042A (en) Pellicle
JP7456526B2 (en) Method for manufacturing a pellicle, method for manufacturing a photomask with a pellicle, exposure method, method for manufacturing a semiconductor device, method for manufacturing a liquid crystal display, and method for manufacturing an organic EL display
JP4870788B2 (en) Pellicle for lithography
EP2998792B1 (en) A pellicle frame and a pellicle
JP4974389B2 (en) Pellicle frame for lithography and pellicle for lithography
TWI515509B (en) Pellicle for lithography and method for fabricating the same
KR20100117496A (en) Pellicle
JP2011164259A (en) Pellicle for lithography
KR102322399B1 (en) Pellicle
JP4202554B2 (en) Pellicle for semiconductor lithography
JP2012220533A (en) Pellicle, and method for manufacturing pellicle film
JP2003057804A (en) Pellicle for lithography
WO2022215609A1 (en) Pellicle frame, pellicle, photomask with pellicle, exposure method, method for manufacturing semiconductor device, and method for manufacturing liquid crystal display

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070522

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20091104

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091228

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100223

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100316

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100408

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100601

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100802

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20100928