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JP2005327820A - Package for light emitting diode, light emitting device employing same and manufacturing method of the light emitting device - Google Patents

Package for light emitting diode, light emitting device employing same and manufacturing method of the light emitting device Download PDF

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JP2005327820A
JP2005327820A JP2004142845A JP2004142845A JP2005327820A JP 2005327820 A JP2005327820 A JP 2005327820A JP 2004142845 A JP2004142845 A JP 2004142845A JP 2004142845 A JP2004142845 A JP 2004142845A JP 2005327820 A JP2005327820 A JP 2005327820A
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light emitting
emitting diode
light
package
diode chip
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JP2004142845A
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JP4301075B2 (en
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Kazunari Kuzuhara
一功 葛原
Shigenari Takami
茂成 高見
Takanori Akeda
孝典 明田
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Panasonic Electric Works Co Ltd
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Matsushita Electric Works Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a package for a light emitting diode capable of reducing a mounting area onto a mounting substrate, and improving the take-out efficiency of light to outside while high in reliability; and to provide the manufacturing method of the light emitting device. <P>SOLUTION: The package 1 is constituted of a package body 1a and a protective member 1b. The package main body 1a is provided with a receiving recess 11 for receiving a light emitting diode chip A which is formed on one surface side of a silicon substrate 10, electrodes 15a, 15b for external connection formed on the other surface side of the substrate 10, chip connecting electrodes 13a, 13b on the inner bottom of the recess 11, and wirings 16a, 16b for connecting the chip connecting electrodes 13a, 13b to the externally connecting electrode 15a, 15b while penetrating the package body 1a. The protective member 1b is provided with transparency with respect to light irradiated from the light emitting diode chip A, and constituted of a glass substrate secured to the package body 1a so as to be air-tight in a form to close the receiving recess 11 in one surface side of the silicon substrate 10. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、発光ダイオード用パッケージおよびそれを用いた発光装置およびその発光装置の製造方法に関するものである。   The present invention relates to a light emitting diode package, a light emitting device using the same, and a method for manufacturing the light emitting device.

従来から、図3に示すように、サファイア基板41の厚み方向の一表面(図3における下面)側に、バッファ層42、n形半導体層43、発光層44、p形半導体層45が順次形成された発光ダイオードチップAが知られている(例えば、特許文献1、特許文献2参照)。なお、バッファ層42、n形半導体層43、発光層44、p形半導体層45は、それぞれ窒化ガリウム系の化合物半導体材料(例えば、GaN、InGaNなど)により形成されている。   Conventionally, as shown in FIG. 3, a buffer layer 42, an n-type semiconductor layer 43, a light emitting layer 44, and a p-type semiconductor layer 45 are sequentially formed on one surface (the lower surface in FIG. 3) of the sapphire substrate 41 in the thickness direction. A light-emitting diode chip A is known (see, for example, Patent Document 1 and Patent Document 2). The buffer layer 42, the n-type semiconductor layer 43, the light emitting layer 44, and the p-type semiconductor layer 45 are each formed of a gallium nitride-based compound semiconductor material (for example, GaN, InGaN, etc.).

図3に示した発光ダイオードチップAは、n形半導体層43上にn電極(パッド)48が設けられるとともに、p形半導体層45上に電流拡散膜46を介してp電極(パッド)47が設けられ、電流拡散膜46が導電性を有し且つ反射率の高い金属材料により形成されており、発光層44にて発光した光がサファイア基板41を通して外部へ放射される。要するに、発光ダイオードチップAは、サファイア基板41の厚み方向の他表面(図3における上面)からなる裏面を光取り出し面として用いられる。   In the light-emitting diode chip A shown in FIG. 3, an n-electrode (pad) 48 is provided on the n-type semiconductor layer 43, and a p-electrode (pad) 47 is provided on the p-type semiconductor layer 45 via a current diffusion film 46. The current diffusion film 46 is formed of a metal material having conductivity and high reflectivity, and light emitted from the light emitting layer 44 is emitted to the outside through the sapphire substrate 41. In short, the light emitting diode chip A uses the back surface formed of the other surface (upper surface in FIG. 3) in the thickness direction of the sapphire substrate 41 as the light extraction surface.

なお、図3中の矢印Eは、発光層44からn形半導体層43側へ放射されサファイア基板41の光取り出し面を通して外部へ放射された光を示し、同図中の矢印Rは、電流拡散膜46にて反射されサファイア基板41の光取り出し面を通して外部へ放射された光を示し、同図中の矢印Lは、サファイア基板41とバッファ層42との界面で全反射して発光層44に再吸収される光を示している。   3 indicates the light emitted from the light emitting layer 44 to the n-type semiconductor layer 43 side and emitted to the outside through the light extraction surface of the sapphire substrate 41, and the arrow R in FIG. The light reflected by the film 46 and emitted to the outside through the light extraction surface of the sapphire substrate 41 is shown, and an arrow L in the figure is totally reflected at the interface between the sapphire substrate 41 and the buffer layer 42 and becomes the light emitting layer 44. The light is reabsorbed.

ところで、上述の発光ダイオードチップAを備えた発光装置としては、例えば、図4に示す構造のものや図5に示す構造のものが提案されている。   By the way, as a light-emitting device provided with the above-mentioned light-emitting diode chip A, for example, those having the structure shown in FIG. 4 and those having the structure shown in FIG. 5 have been proposed.

図4に示した構造の発光装置は、発光ダイオードチップAと、発光ダイオードチップAを収納したパッケージ(発光ダイオード用パッケージ)5と、パッケージ5を実装した金属基板20とを備えている。ここにおいて、パッケージ5は、セラミック基板50の厚み方向の一面に発光ダイオードチップAを収納する収納凹所51が形成され、収納凹所51の内底面に発光ダイオードチップAがバンプ3a,3bを介して電気的に接続されるチップ接続用電極52a,52bが形成されている。すなわち、発光ダイオードチップAはパッケージ5に対してフリップチップ実装されている。また、金属基板20は、金属板21の一表面上に絶縁層22が形成され、絶縁層22上に導電パターン23a,23bが形成されたものであって、パッケージ5と絶縁層22との間に半田からなる接着層55が介在しており、導電パターン23a,23bがボンディングワイヤ57a,57bを介してチップ接続用電極52a,52bと電気的に接続されている。この図4に示した構造の発光装置では、発光ダイオードチップAから放射された光が収納凹所51内に充填された封止樹脂(例えば、エポキシ樹脂など)よりなる樹脂封止部(図示せず)を通して前面側(図4における上面側)へ取り出される。なお、収納凹所51は内底面に近づくほど開口面積が小さくなるように開口されている。   The light emitting device having the structure shown in FIG. 4 includes a light emitting diode chip A, a package (light emitting diode package) 5 containing the light emitting diode chip A, and a metal substrate 20 on which the package 5 is mounted. Here, in the package 5, a housing recess 51 for housing the light emitting diode chip A is formed on one surface in the thickness direction of the ceramic substrate 50, and the light emitting diode chip A is disposed on the inner bottom surface of the housing recess 51 via the bumps 3a and 3b. Chip connection electrodes 52a and 52b are formed so as to be electrically connected. That is, the light emitting diode chip A is flip-chip mounted on the package 5. The metal substrate 20 has an insulating layer 22 formed on one surface of the metal plate 21 and conductive patterns 23 a and 23 b formed on the insulating layer 22, and is provided between the package 5 and the insulating layer 22. The conductive layer 23a, 23b is electrically connected to the chip connection electrodes 52a, 52b via the bonding wires 57a, 57b. In the light emitting device having the structure shown in FIG. 4, a resin sealing portion (not shown) made of a sealing resin (for example, epoxy resin) in which light emitted from the light emitting diode chip A is filled in the housing recess 51. 2) to the front side (upper side in FIG. 4). The storage recess 51 is opened so that the opening area becomes smaller as it approaches the inner bottom surface.

また、図5に示した構造の発光装置は、発光ダイオードチップAが金属基板20にフリップチップ実装され、発光ダイオードチップAを全周に亘って囲む枠状の枠部材6が接着材からなる接着層66を介して金属基板20に固着されている。ここにおいて、発光ダイオードチップAは、バンプ3a,3bを介して金属基板20の導電パターン23a,23bと電気的に接続されている。この図5に示した構造の発光装置では、発光ダイオードチップAから放射された光が枠部材6の内側に充填された封止樹脂(例えば、エポキシ樹脂など)よりなる樹脂封止部(図示せず)を通して前面側(図5における上面側)へ取り出される。ここにおいて、枠部材6は、金属基板20に近づくほど開口面積が小さくなるように開口されており、内周面に金属材料からなる反射膜64が形成されている。したがって、図5に示した構造の発光装置では、発光ダイオードチップAから側方へ放射された光を反射膜64にて反射させて前面側へ取り出すことができる。   In the light emitting device having the structure shown in FIG. 5, the light emitting diode chip A is flip-chip mounted on the metal substrate 20, and the frame-shaped frame member 6 surrounding the light emitting diode chip A over the entire circumference is bonded with an adhesive. It is fixed to the metal substrate 20 via the layer 66. Here, the light emitting diode chip A is electrically connected to the conductive patterns 23a and 23b of the metal substrate 20 via the bumps 3a and 3b. In the light emitting device having the structure shown in FIG. 5, a resin sealing portion (not shown) made of a sealing resin (for example, an epoxy resin) filled with light emitted from the light emitting diode chip A inside the frame member 6. 2) to the front side (upper side in FIG. 5). Here, the frame member 6 is opened so that the opening area becomes smaller as it approaches the metal substrate 20, and a reflective film 64 made of a metal material is formed on the inner peripheral surface. Therefore, in the light emitting device having the structure shown in FIG. 5, the light emitted from the light emitting diode chip A to the side can be reflected by the reflection film 64 and extracted to the front side.

また、従来の発光ダイオード用パッケージは、発光ダイオードチップを外部から保護する機能の他に、外部の電気回路との電気的接続機能および実装基板に対する実装機能を有しており、発光ダイオード用パッケージとは別途に設けた制御回路によって発光ダイオードチップへ供給される電流や電圧を制御することによって発光ダイオードチップを所望の光量で発光させることが可能となる。なお、上記特許文献2には、静電気放電(ESD)により発光ダイオードチップが破壊されるのを防止するために、複数のツェナダイオードからなる保護回路を形成したチップに発光ダイオードチップを実装した構成が提案されている。   In addition to the function of protecting the light-emitting diode chip from the outside, the conventional light-emitting diode package has an electrical connection function with an external electric circuit and a mounting function with respect to a mounting board. By controlling the current and voltage supplied to the light emitting diode chip by a separately provided control circuit, the light emitting diode chip can be made to emit light with a desired light amount. The above-mentioned Patent Document 2 has a configuration in which a light emitting diode chip is mounted on a chip in which a protection circuit composed of a plurality of Zener diodes is formed in order to prevent the light emitting diode chip from being destroyed by electrostatic discharge (ESD). Proposed.

また、従来から、上述の樹脂封止部に用いる封止樹脂に蛍光体粒子を分散させて発光ダイオードチップを覆うように塗布した発光装置が提案されており、この種の発光装置では、封止樹脂部が発光ダイオードチップから放射された光の一部により励起されて発光ダイオードチップの光とは異なる波長の光を放射する波長変換機能を有することとなって、発光ダイオードチップの発光色とは異なる色(例えば、白色など)の光(合成光)を得ることが可能となる。
特開平11−220170号公報 特開2001−237458号公報
Conventionally, a light-emitting device in which phosphor particles are dispersed in a sealing resin used for the above-described resin sealing portion and coated so as to cover a light-emitting diode chip has been proposed. The resin part is excited by a part of the light emitted from the light emitting diode chip and has a wavelength conversion function to emit light having a wavelength different from that of the light emitting diode chip. It is possible to obtain light (combined light) of different colors (for example, white).
JP-A-11-220170 JP 2001-237458 A

ところで、図4に示した構造の発光装置では、チップ接続用電極52a,52bにボンディングワイヤ57a,57bの一端部をボンディングする必要があるので、収納凹所51の内底面の面積を比較的大きくする必要があり、しかも、パッケージ5を実装する実装基板としての金属基板20においてボンディングワイヤ57a,57bの他端をボンディングするためのスペースを確保する必要があるので、金属基板20に対するパッケージ5の実装面積が比較的大きくなってしまうという不具合があった。   By the way, in the light emitting device having the structure shown in FIG. 4, since it is necessary to bond one end portions of the bonding wires 57a and 57b to the chip connection electrodes 52a and 52b, the area of the inner bottom surface of the housing recess 51 is relatively large. In addition, since it is necessary to secure a space for bonding the other ends of the bonding wires 57a and 57b in the metal substrate 20 as a mounting substrate on which the package 5 is mounted, the package 5 is mounted on the metal substrate 20. There was a problem that the area was relatively large.

これに対して、図5に示した構造の発光装置では、枠部材6を実装基板としての金属基板20に接着材からなる接着層66を介して固着する必要があり、接着材のはみ出しなどを考慮すると実装面積が比較的大きくなってしまうという不具合があった。なお、上述のような制御回路を別途に外付けした発光装置では価格が高く、低コスト化が望まれている。   On the other hand, in the light emitting device having the structure shown in FIG. 5, it is necessary to fix the frame member 6 to the metal substrate 20 as the mounting substrate through the adhesive layer 66 made of an adhesive, and the adhesive may protrude. Considering this, there was a problem that the mounting area was relatively large. Note that a light emitting device having a control circuit as described above externally attached is expensive and low cost is desired.

また、図4に示した構造の発光装置では、発光ダイオードチップAから側方へ放射された光の一部がセラミック基板からなるパッケージ5に吸収されてしまい、図5に示した構造の発光装置では、発光ダイオードチップAから側方へ放射された光の一部が接着層66で吸収されてしまうので、いずれの発光装置においても外部への光取り出し効率の更なる向上が望まれている。また、図4や図5に示した構成の発光装置では、上記封止樹脂部により発光ダイオードチップAを外部からの機械的な破壊要因(機械的応力、振動、衝撃など)や環境的な破壊要因(汚染物質など)から保護することができるが、発光ダイオードチップAからの光や熱、大気中からの水分などにより封止樹脂が劣化してしまうことがあり、信頼性のより一層の向上が望まれている。なお、封止樹脂中に蛍光体粒子を分散させて発光ダイオードチップAに直接塗布した発光装置では、樹脂封止部の厚みの面内ばらつに起因して輝度の面内ばらつきが大きくなってしまう。   In the light emitting device having the structure shown in FIG. 4, part of the light emitted from the light emitting diode chip A to the side is absorbed by the package 5 made of the ceramic substrate, and the light emitting device having the structure shown in FIG. Then, since a part of the light emitted from the light emitting diode chip A to the side is absorbed by the adhesive layer 66, further improvement of the light extraction efficiency to the outside is desired in any light emitting device. Further, in the light emitting device having the configuration shown in FIGS. 4 and 5, the sealing resin portion causes the light emitting diode chip A to be mechanically damaged from the outside (mechanical stress, vibration, impact, etc.) or environmentally damaged. Although it can be protected from factors (contaminants, etc.), the sealing resin may be deteriorated by light, heat from the light-emitting diode chip A, moisture from the atmosphere, etc., and reliability is further improved. Is desired. In the light emitting device in which the phosphor particles are dispersed in the sealing resin and directly applied to the light emitting diode chip A, the in-plane variation in luminance is increased due to the in-plane variation in the thickness of the resin sealing portion. End up.

本発明は上記事由に鑑みて為されたものであり、請求項1〜6の発明の目的は、実装基板への実装面積を小さくすることができ且つ外部への光取り出し効率を向上可能で、信頼性の高い発光ダイオード用パッケージを提供することにあり、請求項7の発明の目的は、実装基板に対する実装面積を小さくでき且つ外部への光取り出し効率および信頼性を向上した発光装置を提供することにあり、請求項8の発明の目的は実装基板に対する実装面積を小さくでき且つ外部への光取り出し効率および信頼性を向上した発光装置の製造方法を提供することにある。   The present invention has been made in view of the above reasons, and the object of the invention of claims 1 to 6 is that the mounting area on the mounting substrate can be reduced and the light extraction efficiency to the outside can be improved. The object of the invention of claim 7 is to provide a light emitting device that can reduce the mounting area of the mounting substrate and improve the light extraction efficiency and reliability to the outside. In particular, it is an object of the present invention to provide a method of manufacturing a light emitting device that can reduce the mounting area of the mounting substrate and improve the light extraction efficiency and reliability to the outside.

請求項1の発明は、半導体基板の厚み方向の一面に他面に近づくほど開口面積が小さくなり発光ダイオードチップを収納する収納凹所が形成されるとともに、半導体基板の前記他面側に外部接続用電極が形成され、収納凹所の内底面にフェースダウンで対向配置される発光ダイオードチップを接続するチップ接続用電極が形成され、チップ接続用電極と外部接続用電極とを電気的に接続する配線が半導体基板における収納凹所の内底面と前記他面との間の部分からなる実装部の厚み方向に貫設され、収納凹所の内周面に金属材料からなる反射膜が形成されたパッケージ本体と、発光ダイオードチップから放射される光に対して透光性を有し半導体基板の前記一面側において収納凹所を閉塞する形でパッケージ本体に気密的に固着される平板状の保護部材とを備えることを特徴とする。   According to the first aspect of the present invention, the closer to one surface of the semiconductor substrate in the thickness direction the closer to the other surface, the smaller the opening area is, and a housing recess for housing the light emitting diode chip is formed. A chip connection electrode is formed on the inner bottom surface of the housing recess to connect a light-emitting diode chip disposed face-down to face, and electrically connects the chip connection electrode and the external connection electrode. The wiring is provided in the thickness direction of the mounting portion formed between the inner bottom surface of the housing recess and the other surface of the semiconductor substrate, and a reflective film made of a metal material is formed on the inner peripheral surface of the housing recess. A flat plate shape that is translucent to the light emitted from the light emitting diode chip and the package main body and is hermetically fixed to the package main body so as to close the housing recess on the one surface side of the semiconductor substrate. Characterized in that it comprises a protective member.

この発明によれば、発光ダイオードチップを収納する収納凹所を厚み方向の一面側に形成した半導体基板の他面側に外部接続用電極を形成してあるので、実装基板への実装面積を小さくすることができ、また、収納凹所の内周面に発光ダイオードチップからの光を反射する反射膜が形成されているので、発光ダイオードチップから側方へ放射された光を反射膜により反射させて収納凹所の外部へ取り出すことが可能となり、外部への光取り出し効率を向上可能となる。また、発光ダイオードチップから放射される光に対して透光性を有し半導体基板の前記一面側において収納凹所を閉塞する形でパッケージ本体に気密的に固着される平板状の保護部材を備えているので、従来のような封止樹脂を用いることなく内部に収納する発光ダイオードチップを外部からの機械的な破壊要因や環境的な破壊要因から保護することができ、信頼性を向上させることができる。また、パッケージ本体が半導体基板を用いて形成されているので、パッケージ本体に発光ダイオードチップの発光を制御する制御回路を形成することが可能となる。   According to the present invention, since the external connection electrode is formed on the other surface side of the semiconductor substrate in which the housing recess for housing the light emitting diode chip is formed on one surface side in the thickness direction, the mounting area on the mounting substrate is reduced. In addition, since a reflection film that reflects light from the light emitting diode chip is formed on the inner peripheral surface of the housing recess, the light emitted from the light emitting diode chip to the side is reflected by the reflection film. Thus, the light can be taken out of the storage recess, and the light extraction efficiency to the outside can be improved. Also, a flat protective member that is light-transmitting to the light emitted from the light-emitting diode chip and is hermetically fixed to the package body so as to close the housing recess on the one surface side of the semiconductor substrate. Therefore, it is possible to protect the light-emitting diode chip housed inside without using sealing resin as in the past, from external mechanical destruction factors and environmental destruction factors, and to improve reliability Can do. Further, since the package body is formed using a semiconductor substrate, a control circuit for controlling light emission of the light emitting diode chip can be formed on the package body.

請求項2の発明は、請求項1の発明において、前記保護部材は、前記厚み方向に交差する2つの表面の一方に、前記発光ダイオードチップからの光によって励起されて可視光を放射する蛍光体粒子を有する波長変換層が形成されてなることを特徴とする。   According to a second aspect of the present invention, in the first aspect of the invention, the protective member is a phosphor that emits visible light when excited by light from the light emitting diode chip on one of the two surfaces intersecting the thickness direction. A wavelength conversion layer having particles is formed.

この発明によれば、発光ダイオードチップの発光色と蛍光体粒子の発光色とで発光装置全体の発光色が決まることとなり、発光ダイオードチップから放射される光とは異なる色の光を得ることができ、また、波長変換層が平板状の前記保護部材の表面に形成されているので、均一な厚みの波長変換層を形成することができ、輝度の面内ばらつきを小さくすることができる(均一な光を得ることができる)。   According to this invention, the light emission color of the entire light emitting device is determined by the light emission color of the light emitting diode chip and the light emission color of the phosphor particles, and light of a color different from the light emitted from the light emitting diode chip can be obtained. In addition, since the wavelength conversion layer is formed on the surface of the flat protective member, it is possible to form a wavelength conversion layer with a uniform thickness and to reduce in-plane variation in luminance (uniformity). Light can be obtained).

請求項3の発明は、請求項1または請求項2の発明において、前記保護部材は、前記発光ダイオードチップからの光によって励起されて可視光を放射する蛍光体粒子を含有してなることを特徴とする。   According to a third aspect of the present invention, in the first or second aspect of the present invention, the protective member contains phosphor particles that are excited by light from the light emitting diode chip to emit visible light. And

この発明によれば、発光ダイオードチップの発光色と蛍光体粒子の発光色とで発光装置全体の発光色が決まることとなり、発光ダイオードチップから放射される光とは異なる色の光を得ることができ、また、前記保護部材が波長変換層を構成することとなって均一な厚みの波長変換層が得られるから、輝度の面内ばらつきを小さくすることができる(均一な光を得ることができる)。   According to this invention, the light emission color of the entire light emitting device is determined by the light emission color of the light emitting diode chip and the light emission color of the phosphor particles, and light of a color different from the light emitted from the light emitting diode chip can be obtained. In addition, since the protective member constitutes a wavelength conversion layer and a wavelength conversion layer having a uniform thickness can be obtained, in-plane variation in luminance can be reduced (uniform light can be obtained). ).

請求項4の発明は、請求項2または請求項3の発明において、前記半導体基板をシリコン基板により構成するとともに前記保護部材をガラス基板により構成し、前記保護部材は、前記パッケージ本体と陽極接合により固着されてなることを特徴とする。   The invention of claim 4 is the invention of claim 2 or claim 3, wherein the semiconductor substrate is made of a silicon substrate and the protective member is made of a glass substrate, and the protective member is formed by anodic bonding with the package body. It is characterized by being fixed.

この発明によれば、接着材を用いることなく前記保護部材と前記パッケージ本体とを気密的に接合することができるとともに、発光ダイオード用パッケージの気密性を向上させることができ、信頼性をより向上させることができる。   According to the present invention, the protective member and the package body can be hermetically bonded without using an adhesive, and the airtightness of the light emitting diode package can be improved, thereby further improving the reliability. Can be made.

請求項5の発明は、請求項2または請求項3の発明において、前記半導体基板をシリコン基板により構成するとともに前記保護部材をガラス基板により構成し、前記保護部材は、前記パッケージ本体と表面活性化接合により固着されてなることを特徴とする。   The invention of claim 5 is the invention of claim 2 or claim 3, wherein the semiconductor substrate is made of a silicon substrate and the protective member is made of a glass substrate, and the protective member is surface activated with the package body. It is fixed by joining.

この発明によれば、前記保護部材と前記パッケージ本体とを常温で接合することが可能となり、前記保護部材と前記パッケージ本体との接合工程で前記発光ダイオードチップに熱ダメージが発生するのを防止することができる。また、前記保護部材と前記パッケージ本体との熱膨張係数差に起因した気密性の低下を防止することができる。   According to the present invention, the protective member and the package body can be bonded at room temperature, and the light emitting diode chip is prevented from being thermally damaged in the bonding process of the protective member and the package body. be able to. In addition, it is possible to prevent a decrease in airtightness due to a difference in thermal expansion coefficient between the protective member and the package body.

請求項6の発明は、請求項1ないし請求項5の発明において、前記半導体基板における前記収納凹所の前記内底面と前記半導体基板の前記他面との少なくとも一方に前記発光ダイオードチップを制御する制御回路を形成してなるることを特徴とする。   According to a sixth aspect of the present invention, in the first to fifth aspects of the invention, the light emitting diode chip is controlled to at least one of the inner bottom surface of the housing recess and the other surface of the semiconductor substrate in the semiconductor substrate. A control circuit is formed.

この発明によれば、発光装置の機能アップを図れ、また、制御回路を外付けする場合に比べて低コスト化を図れる。   According to the present invention, the function of the light emitting device can be improved, and the cost can be reduced as compared with the case where a control circuit is externally attached.

請求項7の発明は、請求項1ないし請求項6のいずれか1項に記載の発光ダイオード用パッケージと、裏面を光取り出し面とし発光ダイオード用パッケージの収納凹所内で実装部にフリップチップ実装された発光ダイオードチップとを備えることを特徴とする。   According to a seventh aspect of the present invention, the light emitting diode package according to any one of the first to sixth aspects is flip-chip mounted on the mounting portion in the housing recess of the light emitting diode package with the back surface as the light extraction surface. And a light emitting diode chip.

この発明によれば、発光ダイオード用パッケージの前記外部接続用電極が前記半導体基板の厚み方向における前記他面側に形成されているので、実装基板に対する発光ダイオード用パッケージの実装面積を小さくすることができ、また、発光ダイオードチップから側方へ放射された光が前記収納凹所の内周面に形成した前記反射膜で反射されて外部へ取り出されることになり、発光ダイオードチップで発光した光の外部への取り出し効率を向上させることができる。また、発光ダイオードチップから放射される光に対して透光性を有し半導体基板の前記一面側において収納凹所を閉塞する形でパッケージ本体に気密的に固着された平板状の保護部材を備えているので、従来のような封止樹脂を用いることなく発光ダイオードチップを外部からの機械的な破壊要因や環境的な破壊要因から保護することができ、信頼性を向上させることができる。   According to this invention, since the external connection electrode of the light emitting diode package is formed on the other surface side in the thickness direction of the semiconductor substrate, the mounting area of the light emitting diode package on the mounting substrate can be reduced. In addition, the light emitted from the light emitting diode chip to the side is reflected by the reflective film formed on the inner peripheral surface of the housing recess and taken out to the outside. The efficiency of taking out to the outside can be improved. In addition, a flat protective member that is transparent to light emitted from the light emitting diode chip and is hermetically fixed to the package body so as to close the housing recess on the one surface side of the semiconductor substrate. Therefore, the light emitting diode chip can be protected from external mechanical destruction factors and environmental destruction factors without using a conventional sealing resin, and the reliability can be improved.

請求項8の発明は、請求項7記載の発光装置の製造方法であって、パッケージ本体を多数形成した半導体ウェハにおける各パッケージ本体それぞれに発光ダイオードチップを実装し、最終的に複数の発光装置の個片に分離することを特徴とする。   The invention of claim 8 is the method of manufacturing a light emitting device according to claim 7, wherein a light emitting diode chip is mounted on each package body in a semiconductor wafer on which a large number of package bodies are formed, and finally a plurality of light emitting devices are manufactured. It is characterized by being separated into individual pieces.

この発明によれば、実装基板への実装面積を小さくすることができ且つ外部への光取り出し効率を向上可能で信頼性が高い発光装置の生産性を高めることができる。   According to the present invention, the mounting area on the mounting substrate can be reduced, and the light extraction efficiency to the outside that can improve the light extraction efficiency to the outside can be increased.

請求項1の発明は、実装基板への実装面積を小さくすることができ且つ外部への光取り出し効率を向上可能で、しかも、内部に収納する発光ダイオードチップを保護部材にて保護できて信頼性を高めることができるという効果がある。   According to the first aspect of the present invention, the mounting area on the mounting substrate can be reduced, the light extraction efficiency to the outside can be improved, and the light-emitting diode chip housed inside can be protected by the protective member, and the reliability is improved. There is an effect that can be increased.

請求項7の発明は、実装基板への実装面積を小さくすることができ且つ発光ダイオードチップで発光した光の外部への光取り出し効率を向上させることができ、しかも、発光ダイオードチップを確実に保護できて信頼性を高めることができるという効果がある。   The invention of claim 7 can reduce the mounting area on the mounting substrate, improve the light extraction efficiency of the light emitted from the light emitting diode chip to the outside, and reliably protect the light emitting diode chip. It is possible to increase the reliability.

請求項8の発明は、実装基板への実装面積を小さくすることができ且つ外部への光取り出し効率を向上可能で信頼性が高い発光装置の生産性を高めることができるという効果がある。   The invention according to claim 8 has an effect that the mounting area on the mounting substrate can be reduced, the light extraction efficiency to the outside can be improved, and the productivity of the light emitting device with high reliability can be increased.

本実施形態の発光装置は、図1に示すように、発光ダイオードチップAと、発光ダイオードチップAを収納するパッケージ(発光ダイオード用パッケージ)1とを備えており、図4や図5を参照して説明した金属基板2などの実装基板やリードフレームなどへ実装することができる。   As shown in FIG. 1, the light-emitting device of this embodiment includes a light-emitting diode chip A and a package (light-emitting diode package) 1 that houses the light-emitting diode chip A. See FIG. 4 and FIG. It can be mounted on a mounting substrate such as the metal substrate 2 described above or a lead frame.

発光ダイオードチップAは、上述の図3に示した構成を有する青色発光ダイオードチップであり、サファイア基板41の厚み方向の一表面(図3における下面)側に、バッファ層42、n形半導体層43、発光層44、p形半導体層45が順次形成されている。また、発光ダイオードチップAは、n形半導体層43上にn電極(パッド)48が設けられるとともに、p形半導体層45上に電流拡散膜46を介してp電極(パッド)47が設けられ、電流拡散膜46が導電性を有し且つ反射率の高い金属材料により形成されており、発光層44にて発光した光がサファイア基板41を通して外部へ放射される。要するに、発光ダイオードチップAは、サファイア基板41の厚み方向の他表面(図3における上面)からなる裏面を光取り出し面としたものであって、パッケージ1のパッケージ本体1aにフリップチップ実装されている。なお、バッファ層42、n形半導体層43、発光層44、p形半導体層45は、それぞれ窒化ガリウム系の化合物半導体材料(例えば、GaN、InGaNなど)により形成されている。また、本実施形態における発光ダイオードチップAはダブルへテロ構造を有しているが、発光ダイオードチップAの構造は特に限定するものではなく、上述の電流拡散膜46についても必ずしも設ける必要はない。   The light-emitting diode chip A is a blue light-emitting diode chip having the configuration shown in FIG. 3 described above. The buffer layer 42 and the n-type semiconductor layer 43 are disposed on one surface (the lower surface in FIG. 3) in the thickness direction of the sapphire substrate 41. The light emitting layer 44 and the p-type semiconductor layer 45 are sequentially formed. The light-emitting diode chip A includes an n-electrode (pad) 48 provided on the n-type semiconductor layer 43 and a p-electrode (pad) 47 provided on the p-type semiconductor layer 45 via a current diffusion film 46. The current diffusion film 46 is made of a metal material having conductivity and high reflectivity, and light emitted from the light emitting layer 44 is emitted to the outside through the sapphire substrate 41. In short, the light emitting diode chip A has a back surface made of the other surface (upper surface in FIG. 3) in the thickness direction of the sapphire substrate 41 as a light extraction surface, and is flip-chip mounted on the package body 1a of the package 1. . The buffer layer 42, the n-type semiconductor layer 43, the light emitting layer 44, and the p-type semiconductor layer 45 are each formed of a gallium nitride-based compound semiconductor material (for example, GaN, InGaN, etc.). Further, although the light-emitting diode chip A in the present embodiment has a double hetero structure, the structure of the light-emitting diode chip A is not particularly limited, and the above-described current diffusion film 46 is not necessarily provided.

また、パッケージ1のパッケージ本体1aは、半導体基板たるシリコン基板10を加工することにより形成されており、厚み方向の一面側に発光ダイオードチップAを収納する収納凹所11が形成されるとともに、他面側に金属材料(例えば、Al、Ag、Rhなど)からなる外部接続用電極15a,15bが形成されている。   The package body 1a of the package 1 is formed by processing a silicon substrate 10 as a semiconductor substrate, and a storage recess 11 for storing the light-emitting diode chip A is formed on one surface side in the thickness direction. External connection electrodes 15a and 15b made of a metal material (for example, Al, Ag, Rh, etc.) are formed on the surface side.

ここにおいて、パッケージ1は、収納凹所11の内底面が平面状に形成されており、収納凹所11の内底面に、発光ダイオードチップAのパッド47,48を金属材料(例えば、Au、Cu、Sn、In、あるいはそれらを含む金合金など)からなるバンプ3a,3bを介して電気的に接続する金属材料(例えば、Al、Ag、Rhなど)からなるチップ接続用電極13a,13bが形成され、チップ接続用電極13a,13bと外部接続用電極15a,15bとを電気的に接続する金属材料(例えば、W、Cu、Niなど)からなる配線16a,16bがシリコン基板10における収納凹所11の内底面と上記他面との間の薄肉の部分からなる実装部12に貫設されている。   Here, in the package 1, the inner bottom surface of the storage recess 11 is formed in a flat shape, and the pads 47 and 48 of the light emitting diode chip A are formed on the inner bottom surface of the storage recess 11 with a metal material (for example, Au, Cu). , Sn, In, or a gold alloy containing them), and chip connection electrodes 13a and 13b made of a metal material (for example, Al, Ag, Rh, etc.) electrically connected via bumps 3a and 3b made of them are formed. The wiring recesses 16a and 16b made of metal materials (for example, W, Cu, Ni, etc.) that electrically connect the chip connection electrodes 13a and 13b and the external connection electrodes 15a and 15b 11 is formed through the mounting portion 12 formed of a thin portion between the inner bottom surface and the other surface.

また、パッケージ本体1aにおける収納凹所11は、シリコン基板10の厚み方向において上記一面から上記内底面に近づくほど開口面積が小さくなっており(言い換えれば、パッケージ本体1aにおける収納凹所11は、実装部12から離れるほど開口面積が大きくなっており)、収納凹所11の内周面には反射率の高い金属材料(例えば、Al、Ag、Rhなど)からなる反射膜18が略全面に形成されている。   The storage recess 11 in the package body 1a has a smaller opening area as it approaches the inner bottom surface from the one surface in the thickness direction of the silicon substrate 10 (in other words, the storage recess 11 in the package body 1a As the distance from the portion 12 increases, the opening area increases, and a reflective film 18 made of a highly reflective metal material (eg, Al, Ag, Rh, etc.) is formed on the inner peripheral surface of the storage recess 11 over substantially the entire surface. Has been.

ところで、本実施形態におけるパッケージ1は、上述のパッケージ本体1aと、発光ダイオードチップAから放射される光に対して透光性を有しシリコン基板10の上記一面側において収納凹所11を閉塞する形でパッケージ本体1aに気密的に固着された平板状のガラス基板からなる保護部材1bとで構成されている。ここにおいて、保護部材1bは、発光ダイオードチップAをパッケージ本体1aの実装部12にフェースダウンで実装した後で、パッケージ本体1aに固着されている。   By the way, the package 1 in the present embodiment is transparent to the light emitted from the package body 1a and the light-emitting diode chip A, and closes the housing recess 11 on the one surface side of the silicon substrate 10. And a protective member 1b made of a flat glass substrate that is airtightly fixed to the package body 1a. Here, the protective member 1b is fixed to the package body 1a after the light-emitting diode chip A is mounted face-down on the mounting portion 12 of the package body 1a.

以上説明した本実施形態の発光装置におけるパッケージ1では、シリコン基板10の厚み方向の一面に発光ダイオードチップAを収納する収納凹所11が形成されるとともに、厚み方向の他面に外部接続用電極15a,15bが形成されているので、実装基板への実装面積を小さくすることができ、しかも、収納凹所11の内周面に反射膜18が形成されているので、発光ダイオードチップAから側方へ放射された光を反射膜18により反射させて収納凹所11の外部へ取り出すことが可能となり、発光ダイオードチップAから側方へ放射された光が図4に示した従来例のようにパッケージ5で吸収されたり図5に示した従来例のように接着層66で吸収されたりすることがなく、外部への光取り出し効率を向上可能となる。また、発光ダイオードチップAから放射される光に対して透光性を有しシリコン基板10の上記一面側において収納凹所11を閉塞する形でパッケージ本体1aに気密的に固着される平板状の保護部材1bを備えているので、従来のような封止樹脂を用いることなく内部に収納する発光ダイオードチップAを外部からの機械的な破壊要因や環境的な破壊要因から保護することができ、信頼性を向上させることができる。また、パッケージ本体1aがシリコン基板10を用いて形成されているので、パッケージ本体1aに発光ダイオードチップの発光を制御する制御回路を形成することが可能となり、例えば、半導体基板10における収納凹所11の内底面とシリコン基板10の上記他面との少なくとも一方に発光ダイオードチップAを制御する制御回路を形成しておけば、発光装置の機能アップを図れ、また、制御回路を外付けする場合に比べて低コスト化を図れる。また、反射膜18をチップ接続用電極13a,13bと同じ金属材料により形成するようにすれば、反射膜18をチップ接続用電極13a,13bと同時に形成することができ、チップ接続用電極13a,13bを反射膜18と同じ反射率の高い金属材料により形成することで、発光ダイオードチップAから収納凹所11の内底面側へ放射された光をチップ接続用電極13a,13bで反射させて収納凹所11の外部へ取り出すことができる。   In the package 1 in the light emitting device of the present embodiment described above, the housing recess 11 for housing the light emitting diode chip A is formed on one surface of the silicon substrate 10 in the thickness direction, and the external connection electrode is formed on the other surface in the thickness direction. Since 15a and 15b are formed, the mounting area on the mounting substrate can be reduced, and the reflection film 18 is formed on the inner peripheral surface of the housing recess 11, so that the side from the light emitting diode chip A is formed. The light radiated to the side is reflected by the reflection film 18 and can be taken out of the housing recess 11, and the light radiated from the light emitting diode chip A to the side is as in the conventional example shown in FIG. The light extraction efficiency to the outside can be improved without being absorbed by the package 5 or absorbed by the adhesive layer 66 unlike the conventional example shown in FIG. Further, it is light-transmitting to the light emitted from the light-emitting diode chip A, and has a flat plate shape that is airtightly fixed to the package body 1a so as to close the housing recess 11 on the one surface side of the silicon substrate 10. Since the protective member 1b is provided, it is possible to protect the light emitting diode chip A housed therein without using a sealing resin as in the past from mechanical destruction factors and environmental destruction factors from the outside, Reliability can be improved. Further, since the package body 1a is formed using the silicon substrate 10, it is possible to form a control circuit for controlling the light emission of the light emitting diode chip on the package body 1a. For example, the housing recess 11 in the semiconductor substrate 10 can be formed. If a control circuit for controlling the light-emitting diode chip A is formed on at least one of the inner bottom surface of the silicon substrate 10 and the other surface of the silicon substrate 10, the function of the light-emitting device can be improved and the control circuit can be externally attached. Compared to cost reduction. If the reflective film 18 is formed of the same metal material as the chip connecting electrodes 13a and 13b, the reflective film 18 can be formed simultaneously with the chip connecting electrodes 13a and 13b. 13b is formed of a metal material having the same reflectivity as that of the reflective film 18, and the light emitted from the light emitting diode chip A toward the inner bottom surface of the housing recess 11 is reflected by the chip connection electrodes 13a and 13b and stored. It can be taken out of the recess 11.

ここにおいて、保護部材1bの厚み方向に交差する2つの表面(厚み方向の両面)の一方(例えば、保護部材1bにおける収納凹所11の内底面との対向面)に、発光ダイオードチップAからの光によって励起されて可視光を放射する蛍光体粒子を有する波長変換層を形成しておけば、発光ダイオードチップAの発光色と蛍光体粒子の発光色とで発光装置全体の発光色が決まることとなり、発光ダイオードチップAから放射される光とは異なる色の光を得ることができ、また、波長変換層が平板状の保護部材1bの表面に形成されているので、均一な厚みの波長変換層を形成することができ、輝度の面内ばらつきを小さくすることができる(均一な光を得ることができる)。また、保護部材1b中に発光ダイオードチップAの発光によって励起されて所望の波長の可視光を放射する蛍光体粒子を含有させておけば、発光ダイオードチップAから放射される光と蛍光体粒子から放射される光との合成光を得ることができ、例えば白色光を得ることも可能となり、しかも、保護部材1bが波長変換層を構成することとなって均一な厚みの波長変換層が得られるから、輝度の面内ばらつきを小さくすることができる(均一な光を得ることができる)。   Here, one of the two surfaces (both surfaces in the thickness direction) intersecting the thickness direction of the protection member 1b (for example, the surface facing the inner bottom surface of the storage recess 11 in the protection member 1b) is formed from the light emitting diode chip A. If a wavelength conversion layer having phosphor particles that are excited by light and emit visible light is formed, the emission color of the entire light-emitting device is determined by the emission color of the light-emitting diode chip A and the emission color of the phosphor particles. Thus, light of a color different from the light emitted from the light-emitting diode chip A can be obtained, and the wavelength conversion layer is formed on the surface of the flat protective member 1b, so that the wavelength conversion with a uniform thickness is achieved. A layer can be formed, and in-plane variation in luminance can be reduced (uniform light can be obtained). Further, if phosphor particles that are excited by light emission of the light-emitting diode chip A and emit visible light having a desired wavelength are included in the protective member 1b, the light emitted from the light-emitting diode chip A and the phosphor particles are used. Synthetic light with emitted light can be obtained, for example, white light can be obtained, and the protective member 1b constitutes the wavelength conversion layer, so that a wavelength conversion layer having a uniform thickness can be obtained. Therefore, in-plane variation in luminance can be reduced (uniform light can be obtained).

以下、本実施形態の発光装置の製造方法について図2を参照しながら説明する。   Hereinafter, a method for manufacturing the light emitting device of this embodiment will be described with reference to FIG.

まず、単結晶のシリコン基板10の厚み方向の上記一面に収納凹所11を形成することにより、シリコン基板10における収納凹所11の内底面と上記他面との間に他の部位に比べて薄肉の実装部12を形成してから、実装部12のうち配線16a,16bそれぞれの形成予定部位に厚み方向に貫通する貫通孔(スルーホール)をリソグラフィ技術およびエッチング技術を利用して形成し、必要に応じて上記制御回路を形成した後、配線16a,16b、外部接続用電極15a,15b、チップ接続用電極13a,13b、反射膜18を形成することによって、図2(a)に示す構造を得る。なお、上記収納凹所11を形成するにあたっては、例えば、シリコン基板10の厚み方向の両面にシリコン酸化膜を形成してから、上記一面側のシリコン酸化膜をパターニングし、当該パターニングされたシリコン酸化膜をマスクとして、アルカリ系溶液(例えば、KOH、TMAHなど)を用いた異方性エッチングを行うことで収納凹所11を形成し、その後、厚み方向の両面のシリコン酸化膜を除去すればよい。   First, the storage recess 11 is formed on the one surface of the single crystal silicon substrate 10 in the thickness direction, so that the silicon substrate 10 has an inner bottom surface of the storage recess 11 and the other surface as compared with other portions. After forming the thin mounting portion 12, through holes (through holes) penetrating in the thickness direction are formed in the portions where the wirings 16 a and 16 b are to be formed in the mounting portion 12 by using lithography technology and etching technology, After forming the control circuit as necessary, the wirings 16a and 16b, the external connection electrodes 15a and 15b, the chip connection electrodes 13a and 13b, and the reflection film 18 are formed, whereby the structure shown in FIG. Get. In forming the storage recess 11, for example, a silicon oxide film is formed on both sides in the thickness direction of the silicon substrate 10, and then the silicon oxide film on the one surface side is patterned, and the patterned silicon oxide is formed. The storage recess 11 may be formed by performing anisotropic etching using an alkaline solution (for example, KOH, TMAH, etc.) using the film as a mask, and then the silicon oxide films on both sides in the thickness direction may be removed. .

その後、チップ接続用電極13a,13bにおいて発光ダイオードチップAの各電極47,48それぞれに対応する部位にバンプ3a,3bを形成し、続いて、パッケージ本体1aに形成されたバンプ3a,3bに発光ダイオードチップAの各電極47,78の位置が合うようにパッケージ本体1aに対する発光ダイオードチップAの位置合わせを行ってから、加熱をしながら加圧することで各バンプ3a,3bと各電極47,48とを接合する(つまり、発光ダイオードチップAをパッケージ本体1aの実装部12へフリップチップ実装する)ことによって、図2(b)に示す構造を得る。なお、バンプ3a,3bの形成にあたっては、例えば、線径が5μm〜50μmの金属細線の先端部を溶融させてボールを形成し、当該ボールを形成予定部位(ここでは、パッケージ本体1aにおける各チップ接合用電極13a,13b)に接合して形成する所謂スタッドバンプ法を採用してもよいし、バンプ3a,3bの形成予定部位以外をレジスト層により覆ってから、めっき法により金属を析出させることで所望の形状のバンプ3a,3bを形成し、レジスト層を除去する方法などを採用すればよい。また、発光ダイオードチップAの各電極47,48と各バンプ3a,3bとを接合する接合工程では、例えば、パッケージ本体1aおよび発光ダイオードチップAの加熱温度を350℃以上として各バンプ3a,3bそれぞれの加圧を数十グラム程度とすればよいが、接合時に超音波(例えば、周波数が20kHz〜200kHz程度の超音波)を印加することで加熱温度を100℃前後まで低温化することも可能である。   Thereafter, bumps 3a and 3b are formed in the portions corresponding to the electrodes 47 and 48 of the light-emitting diode chip A in the chip connection electrodes 13a and 13b, and then light is emitted to the bumps 3a and 3b formed in the package body 1a. After aligning the light emitting diode chip A with the package body 1a so that the electrodes 47 and 78 of the diode chip A are aligned, the bumps 3a and 3b and the electrodes 47 and 48 are pressed by heating. (That is, the light emitting diode chip A is flip-chip mounted on the mounting portion 12 of the package body 1a) to obtain the structure shown in FIG. In forming the bumps 3a and 3b, for example, the tip of a thin metal wire having a wire diameter of 5 μm to 50 μm is melted to form a ball, and the ball is to be formed (here, each chip in the package body 1a). A so-called stud bump method may be employed in which the electrodes are bonded to the bonding electrodes 13a and 13b), or a portion other than the formation site of the bumps 3a and 3b is covered with a resist layer, and then a metal is deposited by a plating method. Then, a method of forming bumps 3a and 3b having a desired shape and removing the resist layer may be employed. Further, in the bonding step of bonding the electrodes 47 and 48 of the light-emitting diode chip A and the bumps 3a and 3b, for example, the heating temperature of the package body 1a and the light-emitting diode chip A is set to 350 ° C. or more, and the bumps 3a and 3b respectively. However, it is possible to reduce the heating temperature to around 100 ° C. by applying ultrasonic waves (for example, ultrasonic waves having a frequency of about 20 kHz to 200 kHz) at the time of bonding. is there.

次に、ガラス基板からなる保護部材1bとパッケージ本体1aとを気密的に固着する結合工程を行うことによって、図2(c)に示す構造を得る。なお、保護部材1bとパッケージ本体1aとを固着する結合工程では、例えば保護部材1bの周部とパッケージ本体1aの周部とを接着材を用いて固着するようにしてもよいし、陽極接合により固着するようにしてもよいし、表面活性化接合により固着するようにしてもよい。ここにおいて、保護部材1bとパッケージ本体1aとを陽極接合により固着する場合には、例えば、ガラス基板からなる保護部材1bの周部とシリコン基板を用いて形成されたパッケージ本体1aの周部との接合部を加圧(例えば、数百グラム程度)するとともに加熱(例えば、300℃〜400℃)した状態で、保護部材1bがパッケージ本体1aに対して低電位側となるような負電圧(例えば、200〜400V)を印加すればよく、保護部材1bとパッケージ本体1aとを表面活性化接合により固着する場合には、保護部材1bの周部とパッケージ本体1aの周部との互いの対向面に金属材料(例えば、金、銅など)からなる金属膜を形成し、各金属膜の表面にアルゴン等のプラズマを照射することで各金属膜の表面を活性化させてから保護部材1bとパッケージ本体1aとを重ね合わて加圧することにより、保護部材1bとパッケージ本体1aとを常温で接合することができる。また、保護部材1bに上述の波長変換層を付加する場合には、保護部材1bとパッケージ本体1aとを接合する前に、ガラス基板の表面に例えば印刷法などによって蛍光体層からなる波長変換層を形成しておけばよく、保護部材1bに上述の蛍光体粒子を含有させた構造を採用する場合には、あらかじめ所望の発光色が得られる蛍光体粒子を含有させたガラス基板を用意しておけばよい。   Next, a structure shown in FIG. 2C is obtained by performing a bonding step for hermetically fixing the protective member 1b made of a glass substrate and the package body 1a. In the bonding step of fixing the protective member 1b and the package main body 1a, for example, the peripheral portion of the protective member 1b and the peripheral portion of the package main body 1a may be fixed using an adhesive, or by anodic bonding. It may be fixed or may be fixed by surface activated bonding. Here, when the protective member 1b and the package main body 1a are fixed by anodic bonding, for example, the peripheral portion of the protective member 1b made of a glass substrate and the peripheral portion of the package main body 1a formed using a silicon substrate are used. A negative voltage (for example, such that the protective member 1b is at a low potential side with respect to the package body 1a in a state where the joint is pressurized (for example, about several hundred grams) and heated (for example, 300 ° C. to 400 ° C.). 200-400V), and when the protective member 1b and the package main body 1a are fixed by surface activation bonding, the opposing surfaces of the peripheral portion of the protective member 1b and the peripheral portion of the package main body 1a A metal film made of a metal material (eg, gold, copper, etc.) is formed on the surface, and the surface of each metal film is activated by irradiating the surface of each metal film with a plasma such as argon. By pressurizing overlapping the protective member 1b and the package body 1a, it is possible to bond the protective member 1b and the package body 1a at ambient temperature. In addition, when the above-described wavelength conversion layer is added to the protective member 1b, the wavelength conversion layer made of a phosphor layer is formed on the surface of the glass substrate by, for example, a printing method before joining the protective member 1b and the package body 1a. In the case of adopting the structure in which the protective member 1b contains the above-described phosphor particles, a glass substrate containing phosphor particles that can obtain a desired emission color is prepared in advance. Just keep it.

ところで、本実施形態の発光装置の製造方法では、以上説明した工程までをウェハの状態で行っており、図2(a)の左側に示したパッケージ本体1aは図2(a)の右側に示したシリコンウェハからなる半導体ウェハ100に多数形成され、図2(b)の左側に示したパッケージ本体1a中の発光ダイオードチップAは図2(b)の右側に示した半導体ウェハ100における各パッケージ本体1a毎に実装され、図2(c)の左側に示した発光装置におけるパッケージ本体1aは図2(c)の右側に示した半導体ウェハ100に多数形成され、図2(c)の左側に示した発光装置における保護部材1bは図2(c)の右側に示したガラスウェハ200に多数形成されている。すなわち、本実施形態の発光装置の製造方法ではパッケージ本体1aと保護部材1bとを接合する結合工程が終了するまでは発光ダイオードチップA以外をウェハの状態で取り扱うことになる。   By the way, in the manufacturing method of the light emitting device of the present embodiment, the steps described above are performed in a wafer state, and the package body 1a shown on the left side of FIG. 2A is shown on the right side of FIG. A large number of light emitting diode chips A in the package body 1a shown on the left side of FIG. 2B are formed on the semiconductor wafer 100 made of a silicon wafer, and each package body in the semiconductor wafer 100 shown on the right side of FIG. A large number of package bodies 1a are mounted on the semiconductor wafer 100 shown on the right side of FIG. 2 (c) and mounted on the left side of FIG. 2 (c). A large number of protective members 1b in the light emitting device are formed on the glass wafer 200 shown on the right side of FIG. That is, in the method for manufacturing the light emitting device according to the present embodiment, the components other than the light emitting diode chip A are handled in a wafer state until the joining step for joining the package body 1a and the protection member 1b is completed.

そして、本実施形態の発光装置の製造方法では、上述の結合工程が終了した後、最終的に半導体ウェハ100とガラスウェハ200との積層物からなるウェハを図2(d)に示すようにダイシングソー4などにより個々の発光装置の個片Bに分離する分離工程を行うようにしている。   And in the manufacturing method of the light-emitting device of this embodiment, after the above-mentioned joining process is completed, the wafer which finally consists of a laminate of the semiconductor wafer 100 and the glass wafer 200 is diced as shown in FIG. A separation process for separating the individual light emitting devices into individual pieces B using a saw 4 or the like is performed.

以上説明した発光装置の製造方法によれば、パッケージ本体1aを多数形成した半導体ウェハ100における各パッケージ本体1aそれぞれに発光ダイオードチップAを実装し、最終的に複数の発光装置の個片Bに分離するので、発光装置の生産性を高めることができる。ここに、上述のように、半導体基板をシリコン基板10により構成するとともに保護部材1bをガラス基板により構成し、保護部材1bとパッケージ本体1aとを陽極接合により固着するようにすれば、接着材を用いることなく保護部材1bとパッケージ本体1aとを気密的に接合することができるとともに、発光ダイオード用パッケージ1の気密性を向上させることができ、信頼性をより向上させることができる。また、保護部材1bとパッケージ本体1aと表面活性化接合により固着するようにすれば、保護部材1bとパッケージ本体1aとを常温で接合することが可能となり、保護部材1bとパッケージ本体1aとの接合工程で発光ダイオードチップAに熱ダメージが発生するのを防止することができ、しかも、保護部材1bとパッケージ本体1aとの熱膨張係数差に起因した気密性の低下や接合強度の低下を防止することができる。   According to the manufacturing method of the light emitting device described above, the light emitting diode chip A is mounted on each package body 1a in the semiconductor wafer 100 on which a large number of package bodies 1a are formed, and finally separated into individual pieces B of a plurality of light emitting devices. Therefore, the productivity of the light emitting device can be increased. Here, as described above, if the semiconductor substrate is constituted by the silicon substrate 10 and the protective member 1b is constituted by the glass substrate, and the protective member 1b and the package body 1a are fixed by anodic bonding, the adhesive material can be obtained. Without being used, the protective member 1b and the package body 1a can be hermetically bonded, the airtightness of the light emitting diode package 1 can be improved, and the reliability can be further improved. Further, if the protective member 1b and the package main body 1a are fixed to each other by surface activation bonding, the protective member 1b and the package main body 1a can be bonded at room temperature, and the protective member 1b and the package main body 1a are bonded. In the process, it is possible to prevent the light-emitting diode chip A from being damaged by heat, and to prevent a decrease in airtightness and a decrease in bonding strength due to a difference in thermal expansion coefficient between the protective member 1b and the package body 1a. be able to.

実施形態における発光装置を示し、(a)は概略平面図、(b)は概略断面図である。The light-emitting device in embodiment is shown, (a) is a schematic plan view, (b) is a schematic sectional drawing. 同上における発光装置の製造方法の説明図である。It is explanatory drawing of the manufacturing method of the light-emitting device same as the above. 従来の発光ダイオードチップの一例を示す概略断面図である。It is a schematic sectional drawing which shows an example of the conventional light emitting diode chip | tip. 従来例を示す発光装置の概略断面図である。It is a schematic sectional drawing of the light-emitting device which shows a prior art example. 他の従来例を示す発光装置の概略断面図である。It is a schematic sectional drawing of the light-emitting device which shows another prior art example.

符号の説明Explanation of symbols

A 発光ダイオードチップ
1 パッケージ
1a パッケージ本体
1b 保護部材
3a,3b バンプ
10 シリコン基板
11 収納凹所
12 実装部
13a,13b チップ接続用電極
15a,15b 外部接続用電極
16a,16b 配線
18 反射膜
A Light emitting diode chip 1 Package 1a Package body 1b Protective member 3a, 3b Bump 10 Silicon substrate 11 Storage recess 12 Mounting part 13a, 13b Chip connection electrode 15a, 15b External connection electrode 16a, 16b Wiring 18 Reflective film

Claims (8)

半導体基板の厚み方向の一面に他面に近づくほど開口面積が小さくなり発光ダイオードチップを収納する収納凹所が形成されるとともに、半導体基板の前記他面側に外部接続用電極が形成され、収納凹所の内底面にフェースダウンで対向配置される発光ダイオードチップを接続するチップ接続用電極が形成され、チップ接続用電極と外部接続用電極とを電気的に接続する配線が半導体基板における収納凹所の内底面と前記他面との間の部分からなる実装部の厚み方向に貫設され、収納凹所の内周面に金属材料からなる反射膜が形成されたパッケージ本体と、発光ダイオードチップから放射される光に対して透光性を有し半導体基板の前記一面側において収納凹所を閉塞する形でパッケージ本体に気密的に固着される平板状の保護部材とを備えることを特徴とする発光ダイオード用パッケージ。   The closer to one surface in the thickness direction of the semiconductor substrate the closer to the other surface, the smaller the opening area becomes, forming a housing recess for housing the light emitting diode chip, and forming and housing an external connection electrode on the other surface side of the semiconductor substrate. A chip connection electrode is formed on the inner bottom surface of the recess to connect a light-emitting diode chip that is opposed to face-down, and a wiring that electrically connects the chip connection electrode and the external connection electrode is provided in the storage recess in the semiconductor substrate. A light emitting diode chip, and a package body that is provided in a thickness direction of a mounting portion that is a portion between the inner bottom surface of the location and the other surface, and a reflective film made of a metal material is formed on the inner peripheral surface of the housing recess A flat protective member that is transparent to light emitted from the semiconductor substrate and is hermetically fixed to the package body so as to close the housing recess on the one surface side of the semiconductor substrate. A light emitting diode package, characterized in that. 前記保護部材は、前記厚み方向に交差する2つの表面の一方に、前記発光ダイオードチップからの光によって励起されて可視光を放射する蛍光体粒子を有する波長変換層が形成されてなることを特徴とする請求項1記載の発光ダイオード用パッケージ。   The protective member is formed by forming a wavelength conversion layer having phosphor particles that are excited by light from the light emitting diode chip and emit visible light on one of two surfaces intersecting the thickness direction. The light emitting diode package according to claim 1. 前記保護部材は、前記発光ダイオードチップからの光によって励起されて可視光を放射する蛍光体粒子を含有してなることを特徴とする請求項1または請求項2記載の発光ダイオード用パッケージ。   3. The light emitting diode package according to claim 1, wherein the protective member contains phosphor particles that are excited by light from the light emitting diode chip to emit visible light. 前記半導体基板をシリコン基板により構成するとともに前記保護部材をガラス基板により構成し、前記保護部材は、前記パッケージ本体と陽極接合により固着されてなることを特徴とする請求項2または請求項3記載の発光ダイオード用パッケージ。   The said semiconductor substrate is comprised with a silicon substrate, and the said protection member is comprised with a glass substrate, The said protection member adheres to the said package main body by anodic bonding, The Claim 2 or Claim 3 characterized by the above-mentioned. Light emitting diode package. 前記半導体基板をシリコン基板により構成するとともに前記保護部材をガラス基板により構成し、前記保護部材は、前記パッケージ本体と表面活性化接合により固着されてなることを特徴とする請求項2または請求項3記載の発光ダイオード用パッケージ。   4. The semiconductor substrate is made of a silicon substrate and the protective member is made of a glass substrate, and the protective member is fixed to the package body by surface activation bonding. The package for light emitting diodes as described. 前記半導体基板における前記収納凹所の前記内底面と前記半導体基板の前記他面との少なくとも一方に前記発光ダイオードチップを制御する制御回路を形成してなるることを特徴とする請求項1ないし請求項5のいずれかに記載の発光ダイオード用パッケージ。   The control circuit for controlling the light emitting diode chip is formed on at least one of the inner bottom surface of the housing recess and the other surface of the semiconductor substrate in the semiconductor substrate. Item 6. The light emitting diode package according to any one of Items 5 to 6. 請求項1ないし請求項6のいずれか1項に記載の発光ダイオード用パッケージと、裏面を光取り出し面とし発光ダイオード用パッケージの収納凹所内で実装部にフリップチップ実装された発光ダイオードチップとを備えることを特徴とする発光装置。   A light emitting diode package according to any one of claims 1 to 6, and a light emitting diode chip flip-chip mounted on a mounting portion in a housing recess of the light emitting diode package with a back surface as a light extraction surface. A light emitting device characterized by that. 請求項7記載の発光装置の製造方法であって、パッケージ本体を多数形成した半導体ウェハにおける各パッケージ本体それぞれに発光ダイオードチップを実装し、最終的に複数の発光装置の個片に分離することを特徴とする発光装置の製造方法。   8. The method of manufacturing a light emitting device according to claim 7, wherein a light emitting diode chip is mounted on each package body in a semiconductor wafer on which a large number of package bodies are formed, and finally separated into a plurality of light emitting device pieces. A method for manufacturing a light emitting device.
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