JP2005071068A - Storage device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To surely analyze the cause of a failure in a short time by recording the information needed to analyze the cause of the failure. <P>SOLUTION: A flash disk 1 is provided with a voltage sensor 10, a temperature sensor 11, an impact sensor 12, and a host interface cable disconnection sensor 13. At certain intervals an MPU 3 takes in the data detected by the sensors and stores the data in memory chips 14<SB>1</SB>, 14<SB>2</SB>as measurements along with the cumulative number of times that power is on and timer values. The MPU 3 also stores in the memory chips 14<SB>1</SB>, 14<SB>2</SB>other operating histories such as the cumulative number of times that the flash disk 1 is powered, the timer values, a history of command processes, internal error numbers, and a history of alternative processes. In case of failure, the failure of the flash disk 1 is analyzed as the measurements stored and the operating histories are referred to. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to anomaly detection technology in a storage device, and in particular, is applied to failure analysis in a storage device using a semiconductor memory such as a flash disk or a storage medium such as a hard disk drive or a magneto-optical disk drive that performs storage by light or magnetism. And effective technology.

  Storage devices such as flash disks are widely used as storage devices such as mobile phones and PDAs (Personal Digital Assistants). This flash disk, for example, reports an error to the host when an abnormality is detected in a data writing or erasing operation in the flash disk and notifies the user that there is a problem.

In addition, when an IC card, which is one of the storage devices, receives, for example, a deletion instruction or an addition instruction for data to be moved, information for verifying the reception is written in a nonvolatile memory, thereby In some cases, when an abnormality occurs in the process of moving the converted data and communication is interrupted, it is possible to track up to which step the process has been completed (see, for example, Patent Document 1).
Japanese Patent Laid-Open No. 5-166012

  However, the present inventor has found that there are the following problems in the notification technique of the malfunction in the storage device as described above.

  In other words, when an engineer analyzes a storage device in which a problem has occurred, information that identifies the cause of failure necessary for analysis of the usage environment and usage status does not remain in the storage device. Has become very difficult.

  In addition, the failure cause cannot be specified, and the failure cause report cannot be performed and the user's trust may not be obtained. Furthermore, since the cause of the failure is not specified, there is a problem that feedback cannot be provided for quality improvement in the future product.

  An object of the present invention is to provide a storage device that can analyze a cause of a failure in a short time and reliably by recording information necessary for analyzing the cause of the failure.

  The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  Of the inventions disclosed in the present application, the outline of typical ones will be briefly described as follows.

  The storage device of the present invention reads one or more storage media, an analysis information detection unit that detects failure analysis information, and data stored in the one or more storage media based on an operation program, and performs predetermined processing. And an information processing unit for instructing data write operation, and the information processing unit captures failure analysis information detected by the analysis information detection unit every arbitrary period and writes it in a storage medium.

  Moreover, the outline | summary of the other invention of this application is shown briefly.

  The storage device of the present invention reads one or more storage media, an analysis information detection unit that detects failure analysis information, and data stored in the one or more storage media based on an operation program, and performs predetermined processing. And an information processing unit for instructing data write operation, and a threshold value storage unit for storing a threshold value for determination. The information processing unit is used for determining failure analysis information captured from an analysis information detection unit. The failure analysis information exceeding the threshold for determination is written to the storage medium by comparing with the threshold value.

  Further, the storage device of the present invention includes a buffer for temporarily storing failure analysis information detected by the analysis information detection unit, and the information processing unit stores the buffer when the storage capacity of the buffer exceeds an arbitrary capacity. The stored failure analysis information is written to a storage medium.

  Furthermore, the storage device of the present invention has a processing history consisting of time information such as the cumulative power-on count and timer value, command processing history, internal error number, and alternative processing history each time the information processing unit executes processing. Is stored in a storage medium. This time information only needs to be information that can clarify the generation order of the processing history.

  Furthermore, when storing the failure analysis information and the processing history in the storage medium, they are multiplexed and stored.

  Then, the failure analysis information and the processing history stored in the storage medium can be output to the host device to which the storage device of the present invention is connected in accordance with a predetermined instruction from the host device.

  Among the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows.

  (1) The cause of failure can be analyzed in detail, and the cause of failure can be easily identified in a short time.

  (2) Moreover, since the cause of failure can be promptly fed back, the reliability of the storage device can be improved.

  (3) Furthermore, since the processing history can be easily acquired, the user can grasp the state of the storage device himself / herself, and the occurrence of a malfunction of the storage device can be prevented beforehand.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiment, and the repetitive description thereof will be omitted.

(Embodiment 1)
FIG. 1 is a block diagram of a flash disk according to Embodiment 1 of the present invention, and FIG. 2 shows an example of a storage format for storing measurement results obtained from sensors provided in the flash disk of FIG. 1 in a memory chip. FIG. 3 is an explanatory diagram illustrating an example of a storage format of a processing history stored in a memory chip provided in the flash disk of FIG. 1, and FIG. 4 is a diagram illustrating a recording process of measurement results in the flash disk of FIG. FIG. 5 is a flowchart of received command recording processing in the flash disk of FIG. 1, FIG. 6 is a flowchart of command response recording processing in the flash disk of FIG. 1, and FIG. 7 is an internal error in the flash disk of FIG. FIG. 8 is a flowchart of the recording process of FIG. Flowchart of replacement recording process of the process, FIG. 9 is a flowchart of the information gathering process in flash disk of FIG. 1, FIG. 10 is a flowchart of the failure dealing processing in the flash disk in FIG.

In the present embodiment, the flash disk (storage device) 1 includes a host interface connector 2, an MPU (information processing unit) 3, a host interface control unit 4, a memory chip control unit 5, and an ECC control unit, as shown in FIG. 6, timer 7, buffer interface control unit 8, buffer 9, voltage sensor (analysis information detection unit, voltage detection unit) 10, temperature sensor (analysis information detection unit, temperature detection unit) 11, impact sensor (analysis information detection unit, It includes an impact detection unit 12, a host interface cable disconnection detection sensor (analysis information detection unit, cable disconnection detection unit) 13, and a plurality of memory chips (nonvolatile semiconductor memories) 14 _{1 to} 14 _N.

  The host interface connector 2 is a connector for connecting a host interface cable HC connected to the host. The host interface connector 2 detects a contact failure between the host interface connector 2 and the host interface cable HC, and outputs it to a MPU (Microprocessing Unit) 3 as a measured value.

  The host interface control unit 4 receives commands input / output from the host via the host interface connector 2 and inputs / outputs data necessary for these operations.

The buffer interface control unit 8 performs interface control of data input / output via the host interface control unit 4 and the memory chip control unit 5. The buffer 9 is a memory that temporarily stores data input / output from / to the host and the memory chips 14 _{1 to} 14 _N , and includes, for example, a RAM (Random Access Memory).

The memory chip control unit 5 controls the memory chips 14 _{1 to} 14 _N. These non-volatile semiconductor memories 14 _{1 to} 14 _N are composed of non-volatile semiconductor memories such as flash memories, for example.

The ECC control unit 6 performs ECC (Error Correcting Code) processing of data written to / read from the memory chips 14 _{1 to} 14 _N , generates error correction information at the time of writing, and when the data has an error at the time of reading Correct to output.

The MPU 3 performs write / read operation processing for the memory chips 14 _{1 to} 14 _N and control of the entire flash disk 1 based on the operation program.

  The MPU 3 is provided with a RAM (threshold storage unit) 3a, and the RAM 3a stores first and second threshold values used for abnormality determination. The timer 7 counts up the timer clock and outputs a timer counter signal to the MPU 3.

  The voltage sensor 10 measures the power supply level of the power supply voltage supplied to the flash disk 1. The temperature sensor 11 measures the temperature inside the flash disk 1. The impact sensor 12 measures the impact (gravity acceleration G) applied to the flash disk 1.

Then, the measured values of the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13 are transmitted to the MPU 3. The MPU 3 converts the received measurement values into a measurement result format that can be stored and discriminated, and stores them in the memory chips 14 ₁ and 14 ₂ .

Further, the MPU 3 compares with the first threshold value every time the measurement result (failure analysis information) is stored in the memory chips 14 ₁ and 14 _2, and determines the measurement result. The first threshold value is a threshold value at which the measurement result is determined to be an attention level, and the second threshold value is more serious than the first threshold value and is determined to be a warning level. Is the threshold value.

  When the MPU 3 determines that there is a measurement result exceeding the first threshold or when there is a failure response request from the host, the MPU 3 executes failure response processing to prepare for the occurrence of a secondary failure. .

Host interface connector 2, MPU 3, host interface controller 4, memory chip controller 5, ECC controller 6, timer 7, buffer interface controller 8, buffer 9, voltage sensor 10, temperature sensor 11, impact sensor 12, host interface The cable disconnection detection sensor 13 and the memory chips 14 _{1 to} 14 _N are connected to each other by a control line CNB.

  Further, the host interface connector 2, the host interface control unit 4, the memory chip control unit 5, the ECC control unit 6, the buffer interface control unit 8, the buffer 9, and the nonvolatile semiconductor memory 14 are connected to each other by a data bus DB. .

FIG. 2 is an explanatory diagram showing an example of a data storage format of measurement results stored in the memory chips 14 ₁ and 14 ₂ .

The memory chip 14 ₁ is provided with a measurement result recording area SA. The measurement result recording area SA can store measurement results for n times.

  The measurement result for one time recorded in the measurement result recording area SA includes the cumulative number of power ON times, the timer value, and the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13 in the flash disk 1. Each measurement result consists of a measurement result.

  When the writing of the measurement result n times is completed, the process returns to the area where the measurement result is written first and overwrites the latest measurement result. The time series of the measurement results for n times written in the measurement result recording area SA is determined by the cumulative number of power ON times and the timer value. For example, if the measurement result with the larger number of power ONs is the latest and the number of power ONs is the same, the measurement result with the larger timer value is newer.

This measurement result recording area SA is also provided with a memory chip 14 ₂ , and the same measurement result is also stored in the memory chip 14 ₂ to duplicate data.

  The measurement result is written into the measurement result recording area SA at regular intervals based on the timer counter signal from the timer 7. In addition, when the impact is measured by the impact sensor 12, the measurement result is written to the measurement result recording area SA as needed even when the impact sensor 12 measures the impact. The MPU 3 writes the measurement result at the position indicated by the measurement result recording pointer P in the measurement result recording area SA, and increments the measurement result recording pointer P.

Furthermore, as shown in FIG. 3, the memory chips 14 ₁ and 14 ₂ are provided with a processing history recording area CA. The processing history recording area CA can store n processing histories.

  In the processing history recording area CA, the cumulative number of times the power is turned on in the flash disk 1, a timer value, a command processing history, an internal error number, an alternative processing history, and the like are recorded as a processing history.

  The command processing history is a history of received commands output from the host and command responses after completion of received command processing.

  The internal error number is a number indicating the type of internal error such as a write error or an ECC uncorrectable error at the time of reading. When this internal error occurs, the MPU 3 records the internal error number in the processing history recording area CA and immediately performs the sensor measurement result recording process (FIG. 4). This is to record the external situation at the time of error detection.

The substitution process history is a record of a substitution source address / substitution destination address when the substitution process of the memory chips 14 _{1 to} 14 _N is executed.

  The processing history has a variable length data structure. One command process is recorded over several records, starting with a received command and starting with a command response. An internal error number generated during command processing and a substitute processing history are recorded between the received command and the command response.

  Each record also records attribute information indicating the type of information (received command, command response, internal error number, alternative information) held by the record.

  Similarly to the measurement result recording area SA of FIG. 2, the processing history recording area CA returns to the area where the processing history is first written and overwrites the latest processing history when the writing of the processing history n times is completed.

Also in this case, the time series of the measurement results for n times written in the processing history recording area CA is determined based on the cumulative number of power ON times and the timer value. The processing history recording area CA is also provided with a memory chip 14 ₂ , and the same processing history is also stored in the memory chip 14 ₂ and data is multiplexed.

  In some cases, after the failure of the flash disk 1 occurs, user data in the flash disk 1 may be saved to another flash disk. However, there is a possibility that the log storing the situation at the time of failure is overwritten and lost due to the read processing at the time of saving.

In preparation for such a case, the log recording function can be stopped by a request from the host.
As a method for stopping the log recording function, for example, the host selects either the complete stop of the log recording function or the recording stop for one log among the multiplexed logs and the continuation of recording for the other logs.

  The MPU 3 writes the processing history at the position pointed to by the processing history recording pointer Pa in the processing history recording area CA, and increments the processing history recording pointer Pa.

  Next, the operation of the present embodiment will be described.

  First, the measurement result recording process by the flash disk 1 will be described with reference to the flowchart of FIG.

  First, when the timer value of the timer 7 reaches a specified value or when an impact is measured and an impact request is received from the impact sensor 12, the MPU 3 has updated the cumulative number of power on times after the flash disk 1 is powered on. It is determined whether or not (step S101). If not updated, the previous power ON count is updated to the incremented value (step S102).

  After that, the MPU 3 acquires the measurement values of the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13, and converts the measurement values into a measurement result format that can be stored and distinguished (step). S103).

Subsequently, the MPU 3 writes the number of power-on times, the timer value, and the measurement result when the measurement value is acquired in the position indicated by the measurement result recording pointer P in the measurement result recording area SA of the memory chips 14 ₁ and 14 _2. (Step S104).

  Then, the MPU 3 determines whether or not the measurement result recording pointer P has reached the boundary (n times) (step S105), and clears the measurement result recording pointer P to 0 when it has reached the boundary (step S105). S106).

  If the boundary has not been reached in the process of step S105, the measurement result recording pointer P is incremented (step S107). This completes the measurement result recording process.

  Further, recording processing in the received command, command response, and internal error substitution processing by the flash disk 1 will be described.

  First, the received command recording process will be described with reference to the flowchart of FIG.

  When receiving a command from the host, the MPU 3 determines whether or not the cumulative number of times of power ON has been updated after the power of the flash disk 1 is turned ON (step S201). If not updated, the previous power ON count is updated to the incremented value (step S202).

Subsequently, the MPU 3 writes the power-on count, the timer value, the attribute, and the received command at the position indicated by the processing history recording pointer Pa in the processing history recording area CA of the memory chips 14 ₁ and 14 ₂ (step S203).

  Thereafter, the MPU 3 determines whether or not the processing history recording pointer Pa has reached the boundary (n times) (step S204). If the processing history recording pointer Pa has reached the boundary, the processing history recording pointer Pa is cleared to 0 (step S204). Step S205).

  If the boundary is not reached in the process of step S204, the process history recording pointer Pa is incremented (step S206), and the received command recording process ends.

  Next, command response recording processing will be described with reference to the flowchart of FIG.

When the MPU 3 outputs a command response to the host, the MPU 3 indicates the number of times the power is turned on or the timer value, attribute, and response command by the processing history recording pointer Pa in the processing history recording area CA of the memory chips 14 ₁ and 14 _2. The position is written (step S301).

  Then, the MPU 3 determines whether or not the processing history recording pointer Pa has reached the boundary (n times) (step S302). If the processing history recording pointer Pa has reached the boundary, the processing history recording pointer Pa is cleared to 0 (step S302). Step S303).

  If the boundary has not been reached in the process of step S302, the process history recording pointer Pa is incremented (step S304), and the response command recording process ends.

  The internal error recording process will be described with reference to the flowchart of FIG.

When the MPU 3 detects an internal error, the MPU 3 executes measurement result recording processing (FIG. 4, steps S101 to S107) (step S401). Thereafter, the MPU 3 writes the power ON count, the timer value, the attribute, and the internal error number at the position pointed to by the processing history recording pointer Pa in the processing history recording area CA of the memory chips 14 ₁ and 14 ₂ (step S402).

  Subsequently, the MPU 3 determines whether or not the processing history recording pointer Pa has reached the boundary (n times) (step S403). If the processing history recording pointer Pa has reached the boundary, the processing history recording pointer Pa is cleared to zero. (Step S404).

  If the boundary has not been reached in the process of step S403, the process history recording pointer Pa is incremented (step S405), and the internal process recording process ends.

  The recording process of the alternative process will be described with reference to the flowchart of FIG.

When the substitution process by the MPU 3 is completed, the MPU 3 indicates the number of times the power is turned on, the timer value, the attribute, and the substitution destination / substitution source address by the process history record pointer Pa in the process history record area CA of the memory chips 14 ₁ and 14 _2. The position is written (step S501).

  Subsequently, the MPU 3 determines whether or not the processing history recording pointer Pa has reached the boundary (n times) (step S502). If the processing history recording pointer Pa has reached the boundary, the processing history recording pointer Pa is cleared to zero. (Step S503).

  If the boundary has not been reached in the process of step S502, the process history recording pointer Pa is incremented (step S504), and the alternative process recording process ends.

  The flash disk 1 has a function of outputting failure / life information to the host in response to a request from the host. Here, as a means for the host to request a failure / lifetime information report, there is, for example, an ATA (AT Attachment) smart command, a vendor unique command, or a dedicated signal line.

  The failure / lifetime information includes, for example, information stored in the measurement result recording area SA, information stored in the processing history recording area CA, the number of the memory chip having an abnormal operation, and the number of remaining alternative sectors of each memory chip. , And scan information consisting of a damaged data storage address (when damaged data due to power interruption or the like is detected).

  FIG. 9 is a flowchart of information collection processing when a request for failure / lifetime information collection is received from the host.

When receiving a request (command) for collecting failure / lifetime information from the host, the MPU 3 first scans all the memory chips 14 _{1 to} 14 _N , and identifies the number of the malfunctioning memory chip and each of the memory chips 14 _{1 to} 14. Scan information such as the number of remaining alternative sectors of _N and damaged data storage addresses is collected and stored in the buffer 9 (step S601).

Then, read the memory chips 14 _1, 14 ₂ of the measurement result recording area measurement result stored in the SA, and the memory chip 14 _1, 14 ₂ of the process history recording area processing history stored in the CA respectively, a buffer 9 (Step S602).

  Subsequently, the MPU 3 transfers the scan information, measurement results, and processing history stored in the buffer 9 to the host as fault / lifetime information collection (step S603).

  FIG. 10 is a flowchart of the failure handling process when there is a measurement result exceeding the first threshold or when there is a failure handling request from the host.

  When the measurement result exceeds the first threshold value or when there is a failure response request from the host, the MPU 3 immediately stores unwritten data in the buffer 9 when there is unwritten data in the memory chip in the buffer 9. Store in the memory chip (step S701).

  Then, the MPU 3 compares the measurement result with the second threshold value stored in the RAM 3a. As a result, if the second threshold value is exceeded, or the host has issued an instruction to stop the operation. In that case (step S702), the operation of the flash disk 1 is stopped at the DATA value (step S703).

  If the second threshold value is not exceeded and there is no instruction to stop the operation from the host, the operation mode of the flash disk 1 is set to the limit mode (step S704). This restriction mode is a mode in which the function of the flash disk 1 is restricted in order to prevent loss of data stored in the flash disk 1, and for example, a read operation is permitted and other operations are not permitted.

As a result, according to the first embodiment, the cause of the failure can be analyzed in detail by referring to the measurement results stored in the memory chips 14 ₁ and 14 ₂ , the processing history, and the like. The cause of the failure can be specified reliably.

  In addition, it is possible for the user to grasp the state of the flash disk 1 easily by acquiring failure / lifetime information according to a request from the host, and the maintenance by the user can be easily performed. It is possible to prevent the flash disk 1 from occurring.

(Embodiment 2)
11 is a block diagram of a flash disk according to Embodiment 2 of the present invention, FIG. 12 is a flowchart of the measurement result recording process in the flash disk of FIG. 11, and FIG. 13 is a flowchart of the measurement result recording process following FIG. is there.

In the second embodiment, the flash disk (storage device) 1a includes, as shown in FIG. 11, a host interface connector 2, an MPU 3, and a host interface control unit 4 having the same configuration as that of the first embodiment (FIG. 1). , Memory chip control unit 5, ECC control unit 6, timer 7, buffer interface control unit 8, buffer 9, voltage sensor 10, temperature sensor 11, impact sensor 12, host interface cable disconnection detection sensor 13, and a plurality of memory chips 14 _{1 to} 14 _N.

Further, the MPU 3 is provided with a RAM 3a. In addition to the first and second threshold values described in the first embodiment, the RAM 3a has a third threshold value (the threshold for determination). Value) is stored. The third threshold value is a value for determining whether or not to record the measurement result in the measurement result recording area SA (FIG. 2) of the memory chips 14 ₁ and 14 ₂ .

  Since the connection configuration in the flash disk 1a and the command processing history recording process (FIGS. 3, 5, and 6) are the same as those of the flash disk 1 (FIG. 1) shown in the first embodiment, description thereof is omitted. To do.

  The measurement result recording process using the third threshold value in the flash disk 1a will be described with reference to the flowcharts of FIGS.

  First, when the timer value of the timer 7 reaches a specified value or when an impact is measured and an impact request is received from the impact sensor 12, the MPU 3 has updated the cumulative number of power on times after the flash disk 1 is powered on. It is determined whether or not (step S801). If not updated, the previous power-on count is updated to the incremented value (step S802).

  After that, the MPU 3 acquires the measurement values of the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13, and converts the measurement values into a measurement result format that can be stored and distinguished (step). S803).

Subsequently, the MPU 3 compares the measurement result with the third threshold value stored in the RAM 3a (step S804), and if there is no measurement result exceeding the third threshold value, the recording process is performed. Thus, the measurement result is not recorded in the measurement result recording area SA of the memory chips 14 ₁ and 14 ₂ .

If there is a measurement result that exceeds the third threshold value in the process of step S804, the number of power ON times, the timer value, and the measurement result are measured in the measurement result recording area SA of the memory chips 14 ₁ and 14 _2. Writing is performed at the position indicated by the result recording pointer P (FIG. 2) (step S805).

  Then, the MPU 3 determines whether or not the measurement result recording pointer P has reached the boundary (n times) (step S806), and clears the measurement result recording pointer P to 0 when it has reached the boundary (step S806). S807).

  If the boundary is not reached in the process of step S806, the measurement result recording pointer P is incremented (step S808), and the measurement result recording process ends.

  As a result, according to the second embodiment, only the measurement result exceeding the third threshold value is recorded, so that the load on the MPU 3 can be greatly reduced. can do.

Further, it is possible to reduce the number of writes the measurement result to the memory chip 14 _1, 14 _2, it is possible to reduce the memory chips 14 _1, 14 ₂ of the deterioration due to the writing is repeated, flash disk 1a Reliability can be improved.

(Embodiment 3)
FIG. 14 is an explanatory diagram of the data format in the measurement result temporary recording area provided in the buffer of the flash disk according to the third embodiment of the present invention, and FIG. 15 is provided in the flash disk according to the third embodiment of the present invention. FIG. 16 is a flowchart of the measurement result recording process of the flash disk in the third embodiment, and FIG. 17 is a flowchart of the measurement result recording process subsequent to FIG. FIG. 18 is a flowchart of the flash disk immediate storage process according to the third embodiment, and FIG. 19 is a flowchart of the immediate storage process subsequent to FIG.

  The third embodiment is different from the second embodiment in that the measurement result is recorded in the buffer 9 (FIG. 11) and the command processing history is temporarily stored.

  FIG. 14 is an explanatory diagram of a data format in the measurement result temporary recording area SA1 provided in the buffer 9.

The measurement result temporary recording area SA1 provided in the buffer 9 can store measurement results for n2 times. The measurement result for one time recorded in the measurement result temporary recording area SA1 is the accumulated result in the flash disk 1 in the same manner as the measurement result (FIG. 2) stored in the measurement result recording area SA of the memory chips 14 ₁ and 14 ₂ . The number of power ON times, the timer value, and the measurement results measured by the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13, respectively.

  When the writing of the measurement results n2 times is completed, the process returns to the area where the measurement results were first written and overwrites the latest measurement results. The time series of the measurement results for n2 times written in the measurement result temporary recording area SA1 is determined based on the cumulative number of power ON times and the timer value. For example, if the measurement result with the larger number of power ONs is the latest and the number of power ONs is the same, the measurement result with the larger timer value is newer.

  The measurement result is written into the measurement result temporary recording area SA1 at regular intervals based on a timer counter signal from the timer 7, for example. In addition, when the impact is measured by the impact sensor 12, the measurement result is written in the measurement result temporary recording area SA1 as needed even when the impact sensor 12 measures the impact. The MPU 3 (FIG. 11) writes the measurement result at the position pointed to by the measurement result temporary recording pointer P1 in the measurement result temporary recording area SA1, and increments the measurement result temporary recording pointer P1.

When the measurement result temporary recording area SA1 becomes full, the contents stored in the measurement result temporary recording area SA1 are transferred and stored in the measurement result recording area SA2 of the memory chips 14 ₁ and 14 ₂ as shown in FIG. Is done.

  At that time, the measurement result temporary recording pointer P1 returns to the head of the measurement result temporary recording area SA1, and the measurement results are sequentially overwritten.

  Further, the buffer 9 is provided with a processing history temporary recording area for storing processing history for n times. In this processing history temporary recording area, as in FIG. 3 of the first embodiment, processing history such as the cumulative number of power ON times, timer value, command processing history, internal error number, and alternative processing history is recorded.

The MPU 3 writes the processing history at the position indicated by the processing history area temporary recording pointer in the temporary processing history area, and increments the processing history area temporary recording pointer. When the processing history temporary recording area CA1 becomes full, the contents stored in the processing history temporary recording area CA1 are transferred and stored in the processing history recording area CA2 of the memory chips 14 ₁ and 14 ₂ shown in FIG. At that time, the processing history area temporary recording pointer of the processing history temporary recording area CA1 returns to the head of the processing history temporary recording area CA1, and the measurement results are overwritten in sequence.

  16 and 17 are flowcharts of the measurement result recording process in the third embodiment.

  First, when the timer value of the timer 7 reaches a specified value or when an impact is measured and an impact request is received from the impact sensor 12, the MPU 3 has updated the cumulative number of power on times after the flash disk 1 is powered on. It is determined whether or not (step S901). If not updated, the previous power ON count is updated to the incremented value (step S902).

  Subsequently, the MPU 3 acquires the measurement values of the voltage sensor 10, the temperature sensor 11, the impact sensor 12, and the host interface cable disconnection detection sensor 13, respectively, and converts the measurement values into a measurement result format that can be stored and distinguished (see FIG. Step S903).

  Then, the MPU 3 compares the measurement result with the third threshold value stored in the RAM 3a (step S904), and if there is no measurement result exceeding the third threshold value, the buffer 9 The recording process ends without recording in the measurement result temporary recording area SA1.

  If there is a measurement result exceeding the third threshold value in the process of step S904, the number of power-ons, the timer value, and the measurement result are displayed in the measurement result temporary recording pointer in the measurement result temporary recording area SA1 of the buffer 9. Writing is performed at the position indicated by P1 (step S905).

  The MPU 3 determines whether or not the measurement result temporary recording pointer P1 has reached the boundary (n2 times) (step S906). If the measurement result temporary recording pointer P1 has not reached the boundary, the MPU 3 increments the measurement result temporary recording pointer P1 (step S907). ), The measurement result recording process ends.

In the process of step S806, when the measurement result temporary recording pointer P1 reaches the boundary, all the contents stored in the measurement result temporary recording area SA1 of the buffer 9 are transferred to the memory chips 14 ₁ , 14 _2. Is written in the measurement result recording area SA2 (step S908).

Subsequently, the MPU 3 determines whether or not the measurement result recording pointer P in the measurement result recording area SA of the memory chips 14 ₁ and 14 ₂ has reached the boundary (n3 times) (step S909).

  When the boundary is reached, the measurement result recording pointer P1 is cleared to 0 (step S910), and when the boundary is not reached, the measurement result recording pointer P1 is incremented (step S911).

  Thereafter, the MPU 3 clears the measurement result temporary recording pointer P1 to 0 (step S912), and the measurement result recording process ends.

  18 and 19 are flowcharts of the immediate saving process of the measurement result temporary recording area SA1 in the buffer 9. FIG.

When there is a request for immediate storage from the host or when the MPU 3 detects a serious error, the MPU 3 immediately stores the data temporarily stored in the buffer 9 (unwritten) in any memory chip 14 _{1 to} 14 _N. Then, loss of user data is prevented (step S1001).

Thereafter, the MPU 3 stores the contents of the measurement result temporary recording area SA1 stored in the buffer 9 in the area pointed to by the measurement result recording pointer P of the memory chips 14 ₁ and 14 ₂ (step S1002).

  Subsequently, the MPU 3 determines whether or not the measurement result recording pointer P has reached the boundary (n3 times) (step S1003), and clears the measurement result recording pointer P to 0 when the boundary has been reached (step S1003). Step S1004).

  If the boundary has not been reached in the process of step S1003, the measurement result recording pointer P is incremented (step S1005).

  When either step S1004 or step S1005 is completed, the MPU 3 increments the measurement result temporary recording pointer P1 in the buffer 9 (step S1006).

Then, the MPU 3 stores the contents of the processing history temporary recording area CA1 stored in the buffer 9 in the area pointed to by the processing history recording pointer Pa in the processing history recording area CA2 of the memory chips 14 ₁ and 14 ₂ (step S1007). ).

  The MPU 3 determines whether or not the processing history recording pointer Pa has reached the boundary (n4 times) (step S1008), and clears the processing history recording pointer Pa to 0 when the boundary has been reached (step S1009). .

  If the boundary has not been reached in the processing of step S1008, the processing history recording pointer Pa is incremented (step S1010), and then the processing history area temporary recording pointer of the buffer 9 is cleared to 0 (step S1011) and immediately saved. The process ends.

  Thereby, in the third embodiment, it is possible to prevent loss of measurement results, processing history, user data and the like stored in the buffer 9 due to shutdown of the host or a serious error or the like. Furthermore, since the processing history and the number of times measurement information is stored are reduced, the load on the MPU 3 can be reduced and the deterioration of the memory chip can be suppressed.

(Embodiment 4)
FIG. 20 is a block diagram of a flash disk according to the fourth embodiment of the present invention.

In the fourth embodiment, the flash disk (storage device) 1b includes a host interface connector 2, an MPU 3, a host interface control unit 4, a memory chip control unit 5, an ECC control unit 6, a timer 7, as shown in FIG. The second embodiment (FIG. 11) comprising the buffer interface control unit 8, the buffer 9, the voltage sensor 10, the temperature sensor 11, the impact sensor 12, the host interface cable disconnection detection sensor 13, and the plurality of memory chips 14 _{1 to} 14 _N. A backup power supply 15 is newly provided in the same configuration as in FIG.

The backup power supply 15 supplies backup power to the buffer 9. For example, when a serious error is detected, writing to all the memory chips 14 _{1 to} 14 _N may be impossible. If the power to the flash disk 1b is cut off as it is, it is necessary for failure analysis. Information will not remain. In the third embodiment, the failure analysis information temporarily stored in the buffer 9 is lost.

  Therefore, the backup power supply 15 is a power supply for avoiding the problem, and the power supply voltage is supplied to the buffer 9 via the backup power supply 15. When an unexpected power interruption occurs, the backup power supply 15 supplies a backup power supply voltage to the buffer 9 and stores it in the measurement result temporary recording area SA1 and the processing history temporary recording area CA1 in the buffer 9. Maintain the contents.

  In this case, generally, the contents of the buffer are initialized in the power-on process of the flash disk. However, the flash disk 1b according to the fourth embodiment is configured to hold the contents stored in the measurement result temporary recording area SA1 and the processing history temporary recording area CA1. This is because the information remaining in the measurement result temporary recording area SA1 and the processing history temporary recording area CA1 can be output to the host after the power is turned on again.

  As a result, in the fourth embodiment, even if the power supply of the flash disk 1b is unexpectedly cut off, measurement results, processing history, etc. are stored in the buffer 9, so failure analysis of the flash disk 1b is performed. It can be done efficiently.

  As mentioned above, the invention made by the present inventor has been specifically described based on the embodiment. However, the present invention is not limited to the embodiment, and various modifications can be made without departing from the scope of the invention. Needless to say.

  For example, in the first to fourth embodiments, a flash disk using a flash memory as a recording medium has been described. However, the present invention can be applied to a storage device such as a memory card configured using a nonvolatile semiconductor memory, a magnetic disk, Also applicable to storage devices having recording media other than memory chips using magneto-optical disks as recording media, or array type disk devices such as RAID (Redundant Array of Inexpensive Disks) equipped with a plurality of single disk devices. Is possible.

1 is a block diagram of a flash disk according to Embodiment 1 of the present invention. FIG. It is explanatory drawing which shows an example of the storage format of the measurement result stored in the memory chip provided in the flash disk of FIG. FIG. 2 is an explanatory diagram illustrating an example of a storage format of processing history stored in a memory chip provided in the flash disk of FIG. 1. 3 is a flowchart of a measurement result recording process in the flash disk of FIG. 1. 2 is a flowchart of received command recording processing in the flash disk of FIG. 1; 2 is a flowchart of command response recording processing in the flash disk of FIG. 1. 3 is a flowchart of an internal error recording process in the flash disk of FIG. 1. 2 is a flowchart of a recording process of an alternative process in the flash disk of FIG. 2 is a flowchart of information collection processing in the flash disk of FIG. 1. 2 is a flowchart of a failure handling process in the flash disk of FIG. It is a block diagram of the flash disk by Embodiment 2 of this invention. 12 is a flowchart of a measurement result recording process in the flash disk of FIG. It is a flowchart of the measurement result recording process following FIG. It is explanatory drawing of the data format in the measurement result temporary recording area provided in the buffer of the flash disk by Embodiment 3 of this invention. It is explanatory drawing of the measurement result recording area of the memory chip provided in the flash disk by Embodiment 3 of this invention, and a process history recording area. 14 is a flowchart of a measurement result recording process of a flash disk in the third embodiment. It is a flowchart of the measurement result recording process following FIG. 14 is a flowchart of flash disk immediate storage processing according to the third embodiment. FIG. 19 is a flowchart of an immediate storage process following FIG. 18. FIG. It is a block diagram of the flash disk by Embodiment 4 of this invention.

Explanation of symbols

1 Flash disk (storage device)
1a Flash disk (storage device)
1b Flash disk (storage device)
2 Host interface connector 3 MPU (information processing unit)
3a RAM (threshold storage unit)
4 Host interface control unit 5 Memory chip control unit 6 ECC control unit 7 Timer 8 Buffer interface control unit 9 Buffer 10 Voltage sensor (analysis information detection unit, voltage detection unit)
11 Temperature sensor (analysis information detector, temperature detector)
12 Impact sensor (analysis information detector, impact detector)
13 Host interface cable disconnection detection sensor (analysis information detection unit, cable disconnection detection unit)
14 _{1 to} 14 _N memory chip (semiconductor memory)
15 Backup power supply HC Host interface cable SA Measurement result recording area SA1 Measurement result temporary recording area P Measurement result recording pointer CA Processing history recording area CA1 Processing history recording area Pa Processing history recording pointer P1 Measurement result temporary recording pointer CNB Control line DB data bus

Claims (16)

One or more storage media;
An analysis information detector for detecting failure analysis information;
An information processing unit that reads data stored in the one or more storage media based on an operation program and performs predetermined processing, data write operation instructions, and the like.
The information processing unit captures failure analysis information detected by the analysis information detection unit every arbitrary period and writes the failure analysis information to the storage medium. One or more storage media;
An analysis information detector for detecting failure analysis information;
An information processing unit that reads data stored in the one or more storage media based on an operation program and performs predetermined processing, data write operation instructions, and the like;
A threshold storage unit for storing a threshold for determination,
The information processing unit
Comparing the failure analysis information fetched from the analysis information detection unit with the determination threshold value, and writing the failure analysis information exceeding the determination threshold value into the storage medium . The storage device according to claim 2.
A buffer for temporarily storing failure analysis information detected by the analysis information detection unit;
The information processing unit writes the failure analysis information stored in the buffer to the storage medium when the storage capacity of the buffer exceeds an arbitrary capacity. The storage device according to claim 3.
A storage device comprising a backup power supply for supplying a backup power supply voltage to the buffer when supply of power supply voltage is stopped. The storage device according to any one of claims 1 to 4,
A threshold storage unit for storing the first and second thresholds;
The information processing unit
Each failure analysis information detected by the analysis information detection unit is compared with the first threshold value, and when there is a piece of failure analysis information that exceeds the first threshold value. , Comparing the failure analysis information exceeding the first threshold value with the second threshold value, and if there is something exceeding the second threshold value, the operation is stopped, A storage device that shifts to an operation restriction mode for restricting an operation function when the second threshold value is not exceeded. The storage device according to any one of claims 1 to 5,
The analysis information detection unit
A voltage detection unit for detecting the voltage level of the supplied power supply voltage;
A temperature detector for detecting the internal temperature;
At least one cable disconnection detection unit for detecting a contact failure of the interface cable connected to the host and cable disconnection,
The failure analysis information written to the storage medium includes a cumulative power-on count, a timer value, and each measurement result measured by the analysis information detector. The storage device according to claim 1.
The analysis information detection unit includes an impact detection unit for detecting an impact,
The impact detection unit makes an interrupt request to the information processing unit when detecting an impact, and the analysis information detection unit measures the information processing unit every time there is an interrupt request from the impact detection unit. A storage device, wherein each of the measured results is captured and written to the storage medium. The storage device according to any one of claims 2 to 4,
The analysis information detection unit includes an impact detection unit for detecting an impact,
The impact detection unit makes an interrupt request to the information processing unit when detecting an impact, and the analysis information detection unit measures the information processing unit every time there is an interrupt request from the impact detection unit. Each of the measured results is captured, the failure analysis information captured from the analysis information detection unit is compared with the determination threshold value, and the failure analysis information exceeding the determination threshold value is stored in the storage medium. A storage device characterized by writing. The storage device according to claim 5.
The analysis information detection unit includes an impact detection unit for detecting an impact,
The impact detection unit makes an interrupt request to the information processing unit when an impact is detected,
The information processing unit fetches each measurement result measured by the analysis information detection unit every time there is an interrupt request from the impact detection unit, and each failure analysis information detected by the analysis information detection unit and the first The failure analysis information that exceeds the first threshold value when there is a piece of the failure analysis information that exceeds the first threshold value. Compared with the second threshold value, if there is something that exceeds the second threshold value, the operation is stopped, and if it does not exceed the second threshold value, the operation function A storage device which is shifted to an operation restriction mode for restricting the operation. The storage device according to any one of claims 1 to 9,
The information processing unit stores a processing history in the storage medium every time the information processing unit executes a process. The storage device according to claim 10.
The processing history stored in the storage medium by the information processing unit includes a cumulative power-on count, a timer value, a command processing history, an internal error number, and an alternative processing history. The storage device according to claim 10 or 11,
A buffer for temporarily storing a processing history processed by the information processing unit;
The information processing unit writes the processing history stored in the buffer to the storage medium when the storage capacity of the buffer exceeds an arbitrary capacity. The storage device according to claim 12,
A storage device comprising a backup power supply for supplying a backup power supply voltage to the buffer when supply of power supply voltage is stopped. The storage device according to claim 12,
A storage device characterized by stopping the storage of the failure analysis information and the processing history after writing the processing history to the storage medium. The storage device according to claim 12,
A storage device that stores the failure analysis information and the processing history a plurality of times in an area specified by different addresses of the storage medium when writing the processing history to the storage medium. The storage device according to claim 12 can be connected to an external device,
The storage device is capable of outputting the failure analysis information and the processing history to the external device.

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