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JP2003257919A - Liquid supplying method and apparatus therefor - Google Patents

Liquid supplying method and apparatus therefor

Info

Publication number
JP2003257919A
JP2003257919A JP2002056212A JP2002056212A JP2003257919A JP 2003257919 A JP2003257919 A JP 2003257919A JP 2002056212 A JP2002056212 A JP 2002056212A JP 2002056212 A JP2002056212 A JP 2002056212A JP 2003257919 A JP2003257919 A JP 2003257919A
Authority
JP
Japan
Prior art keywords
liquid
substrate
centrifugal force
liquid supply
pool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002056212A
Other languages
Japanese (ja)
Inventor
Masayuki Nakanishi
正行 中西
Shiyunichi Aiyoshizawa
俊一 相吉澤
Norio Kimura
憲雄 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP2002056212A priority Critical patent/JP2003257919A/en
Publication of JP2003257919A publication Critical patent/JP2003257919A/en
Pending legal-status Critical Current

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  • Cleaning In General (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a liquid supplying method and an apparatus therefor in which a mechanism is simplified, less number of areas are contaminated, and liquid is supplied uniformly to the lower surface of a rotating substrate in an entire circumferential direction without depending on liquid pressure in the amount of liquid to be supplied. <P>SOLUTION: The liquid supply apparatus is capable of supplying liquid to the lower surface of the rotating substrate 3 supported by a substrate supporting base 1. A liquid pooling area 5 having an annular internal circumferential is provided on the lower surface of the substrate 3, and a fin 7 which rotates together with a rotating shaft 2 is also provided to give a centrifugal force to the liquid within the liquid pooling area 5. By the centrifugal force given to the liquid by the fin 7, the liquid is supplied to the entire circumferential direction of the lower surface of the substrate 3. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は回転軸を中心に回転
する回転装置に支持され回転する半導体ウエハ等の基板
の下面の全周方向に純水等の液を供給する(下面に液を
掛ける)ために好適な液供給方法及び液供給装置に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention supplies a liquid such as pure water in the entire circumferential direction of the lower surface of a substrate such as a semiconductor wafer which is supported and rotated by a rotating device which rotates about a rotating shaft (the liquid is applied to the lower surface). The present invention relates to a liquid supply method and a liquid supply device suitable for

【0002】[0002]

【従来の技術】従来、上記のように回転軸を中心に回転
する回転装置に支持され回転する半導体ウエハ等の基板
の下面に回転側から液を均一に供給(下面に液を掛け
る)するには、回転側に設けた液噴射ノズルにロータリ
ージョイント及び配管を通して液を送り、該液噴射ノズ
ルから液を基板下面に向けて噴射し、回転する基板の遠
心力により下面に到達した液を基板下面に沿って径方向
に拡散させて行っている。そして供給する液の流量は、
配管を通す液圧を調整して行っている。
2. Description of the Related Art Conventionally, in order to uniformly supply (spray the liquid on the lower surface) the liquid from the rotating side to the lower surface of a substrate such as a semiconductor wafer which is supported and rotated by a rotating device which rotates about a rotating shaft as described above. Sends liquid through a rotary joint and piping to a liquid jet nozzle provided on the rotating side, jets the liquid from the liquid jet nozzle toward the lower surface of the substrate, and the liquid that reaches the lower surface by the centrifugal force of the rotating substrate is placed on the lower surface of the substrate. Along the radial direction. And the flow rate of the supplied liquid is
The liquid pressure through the piping is adjusted.

【0003】上記のように従来の液供給方法は、ロータ
リージョイントを用いるため機構が複雑になるという問
題があった。また、ロータリージョイントや配管を使用
するため該ロータリージョイントや配管の汚染により、
液が汚染され、その結果基板も汚染されるという問題も
あった。また、液噴射ノズルを用いるためノズルがある
部分にしか液を吹きつけることができないため、基板下
面の全周面に均一に液を供給することが困難であるとい
う問題もあった。更に供給する液流量を液圧を用いて調
整するため、液圧の変動により供給される液流量が変化
するという問題もあった。
As described above, the conventional liquid supply method has a problem that the mechanism is complicated because the rotary joint is used. Also, since rotary joints and pipes are used, due to contamination of the rotary joints and pipes,
There is also a problem that the liquid is contaminated and, as a result, the substrate is also contaminated. Further, since the liquid jetting nozzle is used, the liquid can be sprayed only on the portion where the nozzle is present, so that there is a problem that it is difficult to uniformly supply the liquid to the entire peripheral surface of the lower surface of the substrate. Further, since the liquid flow rate to be supplied is adjusted using the liquid pressure, there is also a problem that the liquid flow rate to be supplied changes due to fluctuations in the liquid pressure.

【0004】[0004]

【発明が解決しようとする課題】本発明は上述の点に鑑
みてなされたもので、機構が簡単で、汚染個所が少な
く、且つ供給される液流量が液圧により左右されること
なく、回転する基板の下面の全周方向に均一に液を供給
できる液供給方法及び液供給装置を提供することを目的
とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and has a simple mechanism, a small number of contaminated parts, and a liquid flow rate to be supplied without being influenced by the liquid pressure. It is an object of the present invention to provide a liquid supply method and a liquid supply device capable of uniformly supplying liquid in the entire circumferential direction of the lower surface of a substrate.

【0005】[0005]

【課題を解決するための手段】上記課題を解決するため
請求項1に記載の発明は、基板支持手段に支持されて回
転する基板の下面に液を供給する液供給方法であって、
基板の下方に内周が円環状の液溜り場を設け、該液溜り
場内の液に遠心力を与え、該遠心力により液を基板の下
面に供給することを特徴とする。
In order to solve the above problems, the invention according to claim 1 is a liquid supply method for supplying a liquid to the lower surface of a substrate which is supported by substrate supporting means and rotates.
A liquid pool having an annular inner circumference is provided below the substrate, a centrifugal force is applied to the liquid in the liquid pool, and the liquid is supplied to the lower surface of the substrate by the centrifugal force.

【0006】上記のように基板の下方に設けた液溜り場
内の液に遠心力を与え、遠心力により液を基板の下面に
供給するので、液溜り場からノズルやロータリージョイ
ントや配管を介することなく、直接基板の下面の全周方
向に簡単に液を供給することができる。また、液の供給
圧等により、液供給量が変動することなく、安定して液
を供給できる。また、液の汚染する個所も少なくでき
る。
As described above, a centrifugal force is applied to the liquid in the liquid pool provided under the substrate, and the liquid is supplied to the lower surface of the substrate by the centrifugal force, so that the liquid pool does not have to pass through a nozzle, a rotary joint, or a pipe. The liquid can be easily supplied directly to the entire circumference of the lower surface of the substrate. Further, the liquid can be stably supplied without changing the liquid supply amount due to the liquid supply pressure or the like. Further, the number of places where the liquid is contaminated can be reduced.

【0007】請求項2に記載の発明は、基板支持手段に
支持されて回転する基板の下面に液を供給する液供給装
置であって、基板の下方に内周が円環状の液溜り場を設
けるとともに、該液溜り場内の液に遠心力を与える遠心
力付与手段を設け、該遠心力付与手段で液に付与した遠
心力により該液を基板の下面に供給することを特徴とす
る。
According to a second aspect of the invention, there is provided a liquid supply device for supplying a liquid to the lower surface of the substrate which is supported by the substrate supporting means and rotates, and a liquid pool having an annular inner circumference is provided below the substrate. At the same time, a centrifugal force applying means for applying a centrifugal force to the liquid in the liquid pool is provided, and the liquid is supplied to the lower surface of the substrate by the centrifugal force applied to the liquid by the centrifugal force applying means.

【0008】上記のように基板の下方に設けた液溜り場
内の液に遠心力付与手段で付与した遠心力により該液を
基板の下面の全周方向に供給するので、上記と同様、液
溜り場からノズルやロータリージョイントや配管を介す
ることなく、直接基板の下面に液を供給することがで
き、構成の簡単な液供給装置となる。また、液の供給圧
等により、液供給量が変動することなく、構成が簡単で
あるため、液の汚染する個所も少なくできる。
As described above, since the liquid is supplied to the liquid in the liquid pool provided under the substrate by the centrifugal force applied by the centrifugal force applying means, the liquid is supplied in the entire circumferential direction of the lower surface of the substrate. Can directly supply the liquid to the lower surface of the substrate without using a nozzle, a rotary joint, or a pipe, and the liquid supply device has a simple structure. Moreover, since the liquid supply amount does not change due to the liquid supply pressure and the like, and the structure is simple, the number of places where the liquid is contaminated can be reduced.

【0009】請求項3に記載の発明は、請求項2に記載
の液供給装置において、基板支持手段は回転軸を中心に
回転し、基板面を支持して回転する基板支持手段であ
り、液溜り場は基板支持手段の回転軸外周に配置された
同心円状溝を有する液溜り場であることを特徴とする。
According to a third aspect of the present invention, in the liquid supply apparatus according to the second aspect, the substrate supporting means is a substrate supporting means that rotates about a rotation axis and supports and rotates the substrate surface. The pool is characterized in that it is a pool having concentric grooves arranged on the outer circumference of the rotation axis of the substrate supporting means.

【0010】上記のように基板支持手段の回転軸外周に
配置された同心円状溝の液溜り場の液に遠心力を付与す
ることにより、液は遠心力によって同心円状溝から上昇
して直接基板の下面の全周方向に均一に供給されること
になる。
By imparting a centrifugal force to the liquid in the liquid pool of the concentric grooves arranged on the outer periphery of the rotation shaft of the substrate supporting means as described above, the liquid rises from the concentric grooves by the centrifugal force and directly moves to the substrate. It is uniformly supplied in the entire circumferential direction of the lower surface.

【0011】請求項4に記載の発明は、請求項3に記載
の液供給装置において、遠心力付与手段は回転手段の回
転軸の回転に連動し、液溜り場内を円周方向に移動する
フィンであることを特徴とする。
According to a fourth aspect of the present invention, in the liquid supply apparatus according to the third aspect, the centrifugal force applying means is interlocked with the rotation of the rotating shaft of the rotating means, and the fins move in the circumferential direction in the liquid pool. Is characterized in that.

【0012】遠心力付与手段は回転手段の回転軸の回転
に連動し、液溜り場内を円周方向に移動するフィンであ
るので、液溜り場内の液に遠心力を与えるための格別の
動力及びその伝達機構を必要としない。
Since the centrifugal force applying means is a fin that moves in the circumferential direction in the liquid pool in conjunction with the rotation of the rotating shaft of the rotating means, a special force for applying a centrifugal force to the liquid in the liquid pool is provided. It does not require that transmission mechanism.

【0013】請求項5に記載の発明は、請求項4に記載
の液供給装置において、液溜り場の上部に遠心力で拡散
する液を基板の下面方向に向けて案内する案内板を設け
たことを特徴とする。
According to a fifth aspect of the present invention, in the liquid supply apparatus according to the fourth aspect, a guide plate for guiding the liquid diffused by centrifugal force toward the lower surface of the substrate is provided above the liquid pool. Is characterized by.

【0014】上記のように液溜り場の上部に案内板を設
けることにより、遠心力で拡散する液を基板の下面の全
周方向に向けて案内することができ、効率よく液を基板
下面に供給することができる。
By providing the guide plate above the liquid pool as described above, the liquid diffused by centrifugal force can be guided in the entire circumferential direction of the lower surface of the substrate, and the liquid can be efficiently supplied to the lower surface of the substrate. can do.

【0015】[0015]

【発明の実施の形態】以下、発明の実施の形態例を図面
に基づいて説明する。図1は本発明に係る液供給装置の
構成を示す図である。図1において、1は回転軸2を中
心に矢印A方向に回転する基板支持台であり、該基板支
持台1の上には半導体ウエハ等の基板3が真空吸着等に
より載置・支持されている。回転軸2の外周近傍には該
回転軸2と同心円状の環状溝4を有する液溜り場5が配
設されている。該液溜り場5の環状溝4内には液供給口
6から純水Qが供給されるようになっている。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing the configuration of a liquid supply apparatus according to the present invention. In FIG. 1, reference numeral 1 denotes a substrate support base that rotates in a direction of an arrow A about a rotation axis 2. A substrate 3 such as a semiconductor wafer is placed and supported on the substrate support base 1 by vacuum suction or the like. There is. A liquid pool 5 having an annular groove 4 concentric with the rotary shaft 2 is arranged near the outer circumference of the rotary shaft 2. Pure water Q is supplied from the liquid supply port 6 into the annular groove 4 of the liquid pool 5.

【0016】7は円筒状のフィンであり、その先端部
(下端部)は環状溝4内の純水Q中に水没し、その上端
部は基板支持台1に固定され、基板支持台1の回転に伴
って回転する。液溜り場5の上部には環状溝4の外周壁
に連続してラッパ筒状の案内板8が配設されている。
Reference numeral 7 denotes a cylindrical fin, the tip (lower end) of which is submerged in the pure water Q in the annular groove 4, and the upper end of which is fixed to the substrate support 1 and It rotates with the rotation. Above the liquid pool 5, a trumpet-shaped tubular guide plate 8 is arranged continuously to the outer peripheral wall of the annular groove 4.

【0017】上記構成の液供給装置において、液供給口
6から液溜り場5の環状溝4内に純水Qを供給し、基板
支持台1を回転軸2を中心に矢印A方向に高速回転する
と、環状溝4内の純水Qはフィン7の回転に伴って環状
溝4内を円周方向に移動する流れとなり、遠心力が付与
される。この遠心力により純水Qは案内板8の内面に沿
って円周方向に且つ径方向に拡大しながら流れ上昇し、
基板3の下面に達し、更に基板3が回転する遠心力によ
り径方向に拡大しながら下面に沿って流れ排水される。
In the liquid supply device having the above structure, when pure water Q is supplied from the liquid supply port 6 into the annular groove 4 of the liquid pool 5 and the substrate support 1 is rotated at high speed in the direction of arrow A about the rotation shaft 2. The pure water Q in the annular groove 4 becomes a flow that moves in the annular groove 4 in the circumferential direction as the fin 7 rotates, and centrifugal force is applied. Due to this centrifugal force, the pure water Q flows up along the inner surface of the guide plate 8 while expanding in the circumferential direction and the radial direction,
After reaching the lower surface of the substrate 3, the centrifugal force by which the substrate 3 rotates further expands in the radial direction and flows along the lower surface to be drained.

【0018】上記のように先端部を液溜り場5の環状溝
4内に水没したフィン7を回転するだけで、純水Qは遠
心力により矢印a〜dに示すように案内板8の内面に沿
って円周方向に且つ径方向に拡大しながら流れ上昇し基
板3の下面に達し、更に径方向に拡大しながら基板3の
下面に沿って流れるので、純水Qを基板3の下面に供給
するために、従来のようにノズルやロータリージョイン
トや配管を介することなく、簡単な構成で、純水Qを直
接基板3の下面の全周方向に均一に供給することができ
る。
As described above, the pure water Q is applied to the inner surface of the guide plate 8 by the centrifugal force as shown by arrows a to d only by rotating the fin 7 whose tip is submerged in the annular groove 4 of the liquid pool 5. The pure water Q is supplied to the lower surface of the substrate 3 as it flows up and rises in the circumferential direction along the radial direction to reach the lower surface of the substrate 3 and further flows in the radial direction along the lower surface of the substrate 3. Therefore, the pure water Q can be directly supplied uniformly in the entire circumferential direction of the lower surface of the substrate 3 with a simple configuration without using a nozzle, a rotary joint, or a pipe unlike the conventional case.

【0019】また、液溜り場5の環状溝4内に純水Qを
溜めるため、従来のように供給される純水Qの供給圧に
影響されることなく、安定して基板3の下面に純水Qを
供給することができる。また、基板支持台1に固定され
たフィン7を該基板支持台1と伴に回転させるだけで、
環状溝4内の純水Qを基板3の下面に直接供給できるの
で、配管等からの汚れを最小限に抑えることが可能とな
る。
Further, since the pure water Q is stored in the annular groove 4 of the liquid pool 5, the pure water Q is stably applied to the lower surface of the substrate 3 without being affected by the supply pressure of the pure water Q which is conventionally supplied. Water Q can be supplied. Further, by simply rotating the fin 7 fixed to the substrate support base 1 together with the substrate support base 1,
Since the pure water Q in the annular groove 4 can be directly supplied to the lower surface of the substrate 3, it is possible to minimize the contamination from the piping and the like.

【0020】図2は本発明に係る液供給装置の他の構成
を示す図である。本液供給装置が図1の液供給装置と相
違する点は、図1では回転軸2と同心円状の環状溝4を
有する液溜り場5を回転軸2の根元に設けているが、本
液供給装置では図2に示すように回転軸2の上部外周近
傍とし、環状溝4の水出口を基板3の下面に近づけてい
る点である。また、円筒状のフィン9を断面形状が逆台
形状としている。
FIG. 2 is a diagram showing another structure of the liquid supply apparatus according to the present invention. 1 is different from the liquid supply device of FIG. 1 in that the liquid pool 5 having an annular groove 4 concentric with the rotary shaft 2 is provided at the base of the rotary shaft 2 in FIG. In the apparatus, as shown in FIG. 2, it is near the outer periphery of the upper part of the rotary shaft 2 and the water outlet of the annular groove 4 is close to the lower surface of the substrate 3. Further, the cylindrical fin 9 has an inverted trapezoidal cross section.

【0021】図2に示す構成の液供給装置においても、
フィン9を回転することにより、純水Qは遠心力により
矢印a〜cに示すように、案内板8の内面に沿って円周
方向に且つ径方向に拡大しながら流れ上昇し基板3の下
面に達し、更に径方向に拡大しながら基板3の下面に沿
って流れるので、簡単な構成で、純水Qを直接基板3の
下面の全周方向に均一に供給することができる。
Also in the liquid supply apparatus having the structure shown in FIG.
By rotating the fins 9, the pure water Q flows upward by the centrifugal force while expanding in the circumferential direction and the radial direction along the inner surface of the guide plate 8 by the centrifugal force, as shown by the arrows a to c. Since it flows along the lower surface of the substrate 3 while further expanding in the radial direction, the pure water Q can be directly supplied uniformly in the entire circumferential direction of the lower surface of the substrate 3 with a simple configuration.

【0022】また、図1の液供給装置と同様、液溜り場
5の環状溝4内に純水Qを溜めるため、従来のように供
給される純水の供給圧に影響されることなく、安定して
基板3の下面の全周方向に純水Qを供給することができ
る。また、基板支持台1に固定されたフィン9を該基板
支持台1と共に回転させるだけで、環状溝4内の純水Q
を基板3の下面に供給できるので、配管からの汚れを最
小限に抑えることが可能となる。
Further, like the liquid supply device of FIG. 1, since the pure water Q is stored in the annular groove 4 of the liquid pool 5, it is stable without being affected by the supply pressure of the pure water supplied as in the conventional case. Then, the pure water Q can be supplied to the entire lower surface of the substrate 3 in the circumferential direction. Further, by simply rotating the fin 9 fixed to the substrate support 1 together with the substrate support 1, pure water Q in the annular groove 4
Since it can be supplied to the lower surface of the substrate 3, it is possible to minimize contamination from the piping.

【0023】なお、図1及び図2に示す液供給装置で
は、回転軸2を中心に回転する基板支持台1の回転軸2
の外周近傍には該回転軸2と同心円状の環状溝4を有す
る液溜り場5が配設されている場合を示したがこれに限
定されるものではなく、図3に示すように、基板支持台
11を基板13の上面を吸着支持し、回転軸12を中心
に矢印B方向に回転する構成とし、該基板13の下方に
円状の環状溝14を有する液溜り場15を配設し、更に
液溜り場15の中心部に回転軸20を配設し、該回転軸
20に先端(下端)が環状溝14内の純水Q中に水没す
る円筒状のフィン21を配設した構成の液供給装置とし
てもよい。なお、液溜り場15の環状溝14には液供給
口16から純水Qを供給する。
In the liquid supply apparatus shown in FIGS. 1 and 2, the rotation shaft 2 of the substrate support base 1 which rotates about the rotation shaft 2 is used.
A case where a liquid pool 5 having an annular groove 4 concentric with the rotary shaft 2 is provided near the outer periphery of the substrate is not limited to this, and as shown in FIG. The table 11 is structured so as to adsorb and support the upper surface of the substrate 13 and rotate in the direction of arrow B around the rotary shaft 12, and a liquid pool 15 having a circular annular groove 14 is arranged below the substrate 13 and further. A liquid supply in which a rotary shaft 20 is arranged at the center of the liquid pool 15 and a cylindrical fin 21 whose tip (lower end) is submerged in the pure water Q in the annular groove 14 is arranged on the rotary shaft 20. It may be a device. Pure water Q is supplied to the annular groove 14 of the liquid pool 15 from the liquid supply port 16.

【0024】図3に示す構成の液供給装置において、基
板支持台11を回転軸12を中心に矢印B方向に回転す
るとともに、フィン21を回転軸20を中心に矢印C方
向に回転(矢印Bと矢印Cとは同方向)すると、環状溝
14内の純水Qはフィン21の回転に伴って、周方向に
移動する流れとなり、その遠心力により、矢印a〜cに
示すように案内板18の内面に沿って円周方向に且つ径
方向に拡大しながら流れ上昇し基板13の下面に達し、
更に径方向に拡大しながら基板13の下面に沿って流れ
る。これにより図1及び図2に示す構成の液供給装置と
同様、簡単な構成で、純水Qを直接基板13の下面の全
周方向に均一に供給することができる。
In the liquid supply apparatus having the structure shown in FIG. 3, the substrate support 11 is rotated about the rotary shaft 12 in the direction of arrow B, and the fins 21 are rotated about the rotary shaft 20 in the direction of arrow C (arrow B). And the arrow C is in the same direction), the pure water Q in the annular groove 14 becomes a flow that moves in the circumferential direction as the fins 21 rotate, and the centrifugal force thereof causes a guide plate as shown by arrows a to c. Along the inner surface of 18 while flowing in the circumferential direction and in the radial direction, the flow rises and reaches the lower surface of the substrate 13,
It flows along the lower surface of the substrate 13 while further expanding in the radial direction. As a result, as with the liquid supply device having the configuration shown in FIGS. 1 and 2, the pure water Q can be directly and uniformly supplied to the entire lower surface of the substrate 13 with a simple configuration.

【0025】また、回転軸20には内部に液噴射ノズル
を配置し、該液噴射ノズルの液吐出口20aを基板13
の裏面(下面)に接触しない範囲で接近させ、該液吐出
口20aから純水Qを矢印dに示すように、基板13の
裏面(下面)に向けて噴出させることより、純水Qの表
面張力を利用して基板13の裏面の周縁部への純水Qの
供給を効率化させる。また、基板13の裏面を伝わり拡
散し、外部に飛散するのを防止するため、基板13の外
周部にカバー22を設けてもよい(これは図1及び図2
に示す液供給装置でも同様である)。
A liquid jet nozzle is arranged inside the rotary shaft 20, and the liquid discharge port 20a of the liquid jet nozzle is provided on the substrate 13.
The front surface of the pure water Q by causing the pure water Q to be ejected toward the back surface (lower surface) of the substrate 13 from the liquid discharge port 20a as shown by an arrow d so that the pure water Q approaches the back surface (lower surface). The tension is used to make the supply of pure water Q to the peripheral portion of the back surface of the substrate 13 efficient. Further, a cover 22 may be provided on the outer peripheral portion of the substrate 13 in order to prevent it from being transmitted along the back surface of the substrate 13 and diffused and scattered to the outside (this is shown in FIGS. 1 and 2).
The same applies to the liquid supply device shown in FIG.

【0026】また、図3では、液溜り場15は円形の環
状溝14を有する例を示したが、液溜り場15では、純
水Qを円周方向の流れとし、与えられる遠心力により、
純水を上昇させるのに適した構成であればよいから、少
なくとも内周が円形をなす側壁を有する構成であればよ
い。
Although FIG. 3 shows an example in which the liquid pool 15 has the circular annular groove 14, in the liquid pool 15, pure water Q is caused to flow in the circumferential direction, and by the centrifugal force applied,
Any structure may be used as long as it is suitable for raising pure water, so that it is sufficient that at least the inner periphery has a side wall having a circular shape.

【0027】図4は本発明に係る液供給装置の他の構成
を示す図である。液供給装置は上端が開口した円筒状の
カバー30を具備し、該カバー30の上端内側には基板
3を載置する基板載置部31が形成され、更に該カバー
30の上端には円周方向に所定の間隔で回転軸32を中
心に回動するスピンチャック33が複数個設けられてい
る。基板3は基板載置部31上に載置した状態でスピン
チャック33で固定できるようになっている。カバー3
0の内部には環状溝34が設けられ、該環状溝34の外
周上部にはラッパ筒状の案内板35が配置されている。
カバー30は回転軸36を中心に回転できるようになっ
ている。
FIG. 4 is a diagram showing another structure of the liquid supply apparatus according to the present invention. The liquid supply device includes a cylindrical cover 30 having an open upper end, a substrate mounting portion 31 on which the substrate 3 is mounted is formed inside the upper end of the cover 30, and the upper end of the cover 30 has a circular circumference. A plurality of spin chucks 33 that rotate around the rotation shaft 32 at predetermined intervals in the direction are provided. The substrate 3 can be fixed by the spin chuck 33 while being placed on the substrate rest 31. Cover 3
An annular groove 34 is provided inside 0, and a trumpet-shaped guide plate 35 is disposed on the outer peripheral upper portion of the annular groove 34.
The cover 30 can rotate about a rotation shaft 36.

【0028】回転軸36の内部には固定された液噴射ノ
ズル37が配置されている。該液噴射ノズル37の液吐
出口37aは基板3の裏面(下面)に接近して配置され
ている。環状溝34には、液噴射ノズル37に供給され
る純水Qがロータリージョイント38を通して供給され
るようになっている。また、液噴射ノズル37には下端
が上記環状溝34内に挿入されるようにフィン39が固
定配置されている。
A fixed liquid jet nozzle 37 is arranged inside the rotary shaft 36. The liquid ejection port 37a of the liquid jet nozzle 37 is arranged close to the back surface (lower surface) of the substrate 3. Pure water Q supplied to the liquid jet nozzle 37 is supplied to the annular groove 34 through a rotary joint 38. Further, fins 39 are fixedly arranged on the liquid jet nozzle 37 so that the lower end is inserted into the annular groove 34.

【0029】図4に示す構成の液供給装置において、カ
バー30を回転軸36を中心に矢印D方向に回転する
と、環状溝34が回転すると共に内部の純水Qも回転す
る。この回転により、純水Qはその遠心力で矢印a〜c
に示すように案内板35の内面に沿って円周方向に拡大
しなから上昇し、基板3の下面に達する。また、液噴射
ノズル37の液吐出口37aから純水Qが矢印dに示す
ように噴出し、基板3の裏面に達すると共に、液自身の
表面張力により周縁部に伝わり効率良く供給される。基
板3の外周に飛散しようとする純水はカバー30の内面
に当接し、外部には飛散しない。
In the liquid supply apparatus having the structure shown in FIG. 4, when the cover 30 is rotated about the rotary shaft 36 in the direction of arrow D, the annular groove 34 is rotated and the pure water Q therein is also rotated. Due to this rotation, the pure water Q is caused by its centrifugal force and is indicated by arrows ac
As shown in FIG. 5, the inner surface of the guide plate 35 expands in the circumferential direction and then rises to reach the lower surface of the substrate 3. Further, the pure water Q is jetted from the liquid discharge port 37a of the liquid jet nozzle 37 as shown by the arrow d, reaches the back surface of the substrate 3, and is transmitted to the peripheral portion by the surface tension of the liquid itself and is efficiently supplied. Pure water, which is about to be scattered on the outer periphery of the substrate 3, contacts the inner surface of the cover 30 and is not scattered to the outside.

【0030】なお、上記例では純水を供給する例を示し
たが、本発明に係る液供給装置で供給する液は、純水に
限定されるものではなく、どのような液であってもよい
ことは当然である。
In the above example, pure water is supplied, but the liquid supplied by the liquid supply apparatus according to the present invention is not limited to pure water, and any kind of liquid may be used. The good thing is right.

【0031】[0031]

【発明の効果】以上、説明したように各請求項に記載の
発明によれば、下記のような優れた効果が得られる。
As described above, according to the invention described in each claim, the following excellent effects can be obtained.

【0032】請求項1に記載の発明によれば、基板の下
方に設けた液溜り場内の液に遠心力を与え、該遠心力に
より液を基板の下面に供給するので、従来のようにノズ
ルやロータリージョイントや配管を介することなく、液
溜り場から基板の下面の全周方向に簡単に直接液を供給
する液供給方法を提供できる。また、液を液溜り場内に
溜めるから、液の供給圧等により、液供給量が変動する
ことなく安定して液を供給でき、且つ液の汚染する個所
も少なくできるから、液の汚染も抑えることができる。
According to the first aspect of the present invention, the centrifugal force is applied to the liquid in the liquid pool provided below the substrate, and the centrifugal force causes the liquid to be supplied to the lower surface of the substrate. It is possible to provide a liquid supply method for directly and directly supplying liquid from the liquid reservoir to the entire circumference of the lower surface of the substrate without using a rotary joint or piping. Further, since the liquid is stored in the liquid pool, it is possible to stably supply the liquid without changing the liquid supply amount due to the liquid supply pressure and the like, and it is possible to reduce the number of places where the liquid is contaminated. be able to.

【0033】請求項2に記載の発明によれば、基板の下
方に設けた液溜り場内の液に遠心力付与手段で付与した
遠心力により該液を基板の下面の全周方向に供給するの
で、上記と同様、液溜り場からノズルやロータリージョ
イントや配管を介することなく、直接基板の下面に液を
供給することができ、構成の簡単な液供給装置を提供で
きる。また、液を液溜り場に溜めるから、液の供給圧等
により、液供給量が変動することなく安定して液を供給
できる。また、構成が簡単であるため、液の汚染する個
所も少なくできるから、液の汚染も抑えることができ
る。
According to the second aspect of the invention, the liquid is supplied to the liquid in the liquid pool provided below the substrate by the centrifugal force applied by the centrifugal force applying means in the entire circumferential direction of the lower surface of the substrate. Similarly to the above, the liquid can be directly supplied to the lower surface of the substrate from the liquid reservoir without passing through the nozzle, the rotary joint, or the pipe, and the liquid supply device having a simple structure can be provided. Further, since the liquid is stored in the liquid pool, it is possible to stably supply the liquid without changing the liquid supply amount due to the liquid supply pressure or the like. Further, since the structure is simple, the number of places where the liquid is contaminated can be reduced, so that the liquid can be prevented from being contaminated.

【0034】請求項3に記載の発明によれば、基板支持
手段の回転軸外周に配置された同心円状溝の液溜り場の
液に遠心力を付与することにより、液は遠心力によって
同心円状溝から上昇して直接基板の下面の全周方向に均
一に供給される簡単な構成の液供給装置を提供できる。
According to the third aspect of the present invention, the centrifugal force is applied to the liquid in the liquid pool of the concentric grooves arranged on the outer circumference of the rotation axis of the substrate supporting means, whereby the liquid is centrifugally applied to the concentric grooves. Thus, it is possible to provide a liquid supply device having a simple structure in which the liquid is directly supplied to the entire surface of the lower surface of the substrate evenly.

【0035】請求項4に記載の発明によれば、遠心力付
与手段は回転手段の回転軸の回転に連動し、液溜り場内
を円周方向に移動するフィンであるので、液溜り場内の
液に遠心力を与えるための格別の動力及びその伝達機構
を必要としない簡単な構成の液供給装置を提供できる。
According to the fourth aspect of the invention, the centrifugal force imparting means is a fin that moves in the circumferential direction in the liquid pool in conjunction with the rotation of the rotary shaft of the rotating means. It is possible to provide a liquid supply device having a simple structure that does not require a special power for imparting a centrifugal force to and a transmission mechanism therefor.

【0036】請求項5に記載の発明によれば、液溜り場
の上部に案内板を設けることにより、遠心力で拡散する
液を基板の下面の全周方向に向けて案内することがで
き、効率よく液を基板下面に供給することができる簡単
な構成の液供給装置を提供できる。
According to the invention described in claim 5, by providing the guide plate on the upper part of the liquid pool, the liquid diffused by centrifugal force can be guided in the entire circumferential direction of the lower surface of the substrate, and the efficiency can be improved. It is possible to provide a liquid supply device having a simple structure that can well supply liquid to the lower surface of the substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る液供給装置の構成を示す図であ
る。
FIG. 1 is a diagram showing a configuration of a liquid supply apparatus according to the present invention.

【図2】本発明に係る液供給装置の他の構成を示す図で
ある。
FIG. 2 is a diagram showing another configuration of the liquid supply apparatus according to the present invention.

【図3】本発明に係る液供給装置の他の構成を示す図で
ある。
FIG. 3 is a diagram showing another configuration of the liquid supply apparatus according to the present invention.

【図4】本発明に係る液供給装置の他の構成を示す図で
ある。
FIG. 4 is a diagram showing another configuration of the liquid supply apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

1 基板支持台 2 回転軸 3 基板 4 環状溝 5 液溜り場 6 液供給口 7 フィン 8 案内板 9 フィン 11 基板支持台 12 回転軸 13 基板 14 環状溝 15 液溜り場 16 液供給口 18 案内板 20 回転軸 21 フィン 22 カバー 30 カバー 31 基板載置部 32 回転軸 33 スピンチャック 34 環状溝 35 案内板 36 回転軸 37 液噴射ノズル 38 ロータリージョイント 39 フィン 1 Substrate support 2 rotation axes 3 substrates 4 annular groove 5 pool 6 liquid supply port 7 fins 8 information board 9 fins 11 Substrate support 12 rotation axes 13 board 14 annular groove 15 Liquid pool 16 liquid supply port 18 Information board 20 rotation axis 21 fins 22 cover 30 covers 31 Substrate placement section 32 rotation axis 33 Spin chuck 34 annular groove 35 guide plate 36 rotation axis 37 Liquid injection nozzle 38 Rotary joint 39 fins

───────────────────────────────────────────────────── フロントページの続き (72)発明者 木村 憲雄 東京都大田区羽田旭町11番1号 株式会社 荏原製作所内 Fターム(参考) 3B116 AA03 AB03 AB34 AB47 BB21 3B201 AA03 AB03 AB34 AB47 BB21   ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Norio Kimura             11-1 Haneda Asahi-cho, Ota-ku, Tokyo Co., Ltd.             Inside the EBARA CORPORATION F term (reference) 3B116 AA03 AB03 AB34 AB47 BB21                 3B201 AA03 AB03 AB34 AB47 BB21

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 基板支持手段に支持されて回転する基板
の下面に液を供給する液供給方法であって、 前記基板の下方に内周が円環状の液溜り場を設け、該液
溜り場内の液に遠心力を与え、該遠心力により該液を前
記基板の下面に供給することを特徴とする液供給方法。
1. A liquid supply method for supplying a liquid to a lower surface of a substrate which is supported and rotated by a substrate supporting means, wherein a liquid pool having an annular inner periphery is provided below the substrate, and the liquid pool in the liquid pool is provided. A liquid supply method, wherein a centrifugal force is applied to the liquid, and the liquid is supplied to the lower surface of the substrate by the centrifugal force.
【請求項2】 基板支持手段に支持されて回転する基板
の下面に液を供給する液供給装置であって、 前記基板の下方に内周が円環状の液溜り場を設けるとと
もに、該液溜り場内の液に遠心力を与える遠心力付与手
段を設け、該遠心力付与手段で液に付与した遠心力によ
り該液を前記基板の下面に供給することを特徴とする液
供給装置。
2. A liquid supply device for supplying a liquid to a lower surface of a substrate which is supported by a substrate supporting means and rotates, wherein a liquid pool having an annular inner periphery is provided below the substrate, and the liquid pool is provided in the liquid pool. A liquid supply device, wherein a centrifugal force applying means for applying a centrifugal force to the liquid is provided, and the liquid is supplied to the lower surface of the substrate by the centrifugal force applied to the liquid by the centrifugal force applying means.
【請求項3】 請求項2に記載の液供給装置において、 前記基板支持手段は回転軸を中心に回転し、基板面を支
持して回転する基板支持手段であり、前記液溜り場は前
記基板支持手段の回転軸外周に配置された同心円状溝を
有する液溜り場であることを特徴とする液供給装置。
3. The liquid supply apparatus according to claim 2, wherein the substrate supporting unit is a substrate supporting unit that rotates about a rotation axis and supports and rotates a substrate surface, and the liquid pool is the substrate supporting unit. A liquid supply device comprising a liquid pool having concentric circular grooves arranged on the outer circumference of the rotating shaft of the means.
【請求項4】 請求項3に記載の液供給装置において、 前記遠心力付与手段は前記回転手段の回転軸の回転に連
動し、前記液溜り場内を円周方向に移動するフィンであ
ることを特徴とする液供給装置。
4. The liquid supply apparatus according to claim 3, wherein the centrifugal force applying means is a fin that moves in the circumferential direction in the liquid pool in conjunction with the rotation of the rotating shaft of the rotating means. Characteristic liquid supply device.
【請求項5】 請求項4に記載の液供給装置において、 前記液溜り場の上部に前記遠心力で拡散する前記液を前
記基板の下面方向に向けて案内する案内板を設けたこと
を特徴とする液供給装置。
5. The liquid supply apparatus according to claim 4, wherein a guide plate for guiding the liquid diffused by the centrifugal force toward the lower surface of the substrate is provided above the liquid pool. Liquid supply device.
JP2002056212A 2002-03-01 2002-03-01 Liquid supplying method and apparatus therefor Pending JP2003257919A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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Publications (1)

Publication Number Publication Date
JP2003257919A true JP2003257919A (en) 2003-09-12

Family

ID=28666845

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2003257919A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010021279A (en) * 2008-07-09 2010-01-28 Tokyo Electron Ltd Liquid processing apparatus and liquid processing method
JP2010094785A (en) * 2008-10-17 2010-04-30 Disco Abrasive Syst Ltd Grinding apparatus
JPWO2014087761A1 (en) * 2012-12-04 2017-01-05 リソテック ジャパン株式会社 Substrate processing mechanism and small manufacturing apparatus using the same
JP2017191883A (en) * 2016-04-14 2017-10-19 トヨタ自動車株式会社 Wafer processing apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010021279A (en) * 2008-07-09 2010-01-28 Tokyo Electron Ltd Liquid processing apparatus and liquid processing method
JP2010094785A (en) * 2008-10-17 2010-04-30 Disco Abrasive Syst Ltd Grinding apparatus
JPWO2014087761A1 (en) * 2012-12-04 2017-01-05 リソテック ジャパン株式会社 Substrate processing mechanism and small manufacturing apparatus using the same
JP2017191883A (en) * 2016-04-14 2017-10-19 トヨタ自動車株式会社 Wafer processing apparatus

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