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JP2003081689A - Synthetic quartz crucible and method of producing the same - Google Patents

Synthetic quartz crucible and method of producing the same

Info

Publication number
JP2003081689A
JP2003081689A JP2001273899A JP2001273899A JP2003081689A JP 2003081689 A JP2003081689 A JP 2003081689A JP 2001273899 A JP2001273899 A JP 2001273899A JP 2001273899 A JP2001273899 A JP 2001273899A JP 2003081689 A JP2003081689 A JP 2003081689A
Authority
JP
Japan
Prior art keywords
crucible
synthetic quartz
quartz crucible
melt line
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001273899A
Other languages
Japanese (ja)
Inventor
Hiroyuki Watabe
弘行 渡部
Keiko Sanpei
桂子 三瓶
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KUSUWA KUORUTSU KK
Original Assignee
KUSUWA KUORUTSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KUSUWA KUORUTSU KK filed Critical KUSUWA KUORUTSU KK
Priority to JP2001273899A priority Critical patent/JP2003081689A/en
Publication of JP2003081689A publication Critical patent/JP2003081689A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Glass Melting And Manufacturing (AREA)

Abstract

PROBLEM TO BE SOLVED: To suppress vibration of the liquid surface caused in the vicinity of a melt line when a silicon single crystal is pulled and to produce a crucible providing a good DF (dislocation-free) rate even when it is used for pulling the crystal for a long time. SOLUTION: In a synthetic quartz glass crucible for pulling the single crystal, the etching amount in the vicinity of the melt line in silicon melting is made different from that at the part below the melt line.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は合成石英ルツボに関する
ものであり、特に液面振動が少なく、かつDF化率が良い
ルツボに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a synthetic quartz crucible, and more particularly to a crucible having a low liquid level vibration and a high DF conversion rate.

【0002】[0002]

【従来の技術】最近、シリコン単結晶の大口径化および
低欠陥化にともない、高温、長時間の引上げが行われる
ようになり、合成石英ルツボが使用されるようになっ
た。この合成石英ルツボは天然石英ガラスに合成石英ガ
ラスを内張りしたものが使用されているが、これは合成
石英が失透しにくいことを利用したものである。この合
成石英ルツボはドイツパテント4528163が最初の特許で
あるが、この特許には合成ルツボの製造方法のみが記述
されている。1990年に入り、実用化を目指した開発が行
われたが、液面振動およびコストの面から採用が見送ら
れていた。しかし、1995年に入りリチャージや低COP等
の面から徐々に採用され、現在では22インチ以上のルツ
ボは約7割が合成石英ルツボとなっている。
2. Description of the Related Art Recently, with the increase in diameter and the reduction in defects of silicon single crystals, pulling at high temperature for a long time has been carried out, and synthetic quartz crucibles have come to be used. As this synthetic quartz crucible, a synthetic quartz glass lined with natural quartz glass is used. This is because synthetic quartz is less likely to devitrify. The first patent for this synthetic quartz crucible was German Patent 4528163, but this patent only describes a method for producing the synthetic crucible. In 1990, development aimed at commercialization was carried out, but adoption was postponed due to liquid level vibration and cost. However, in 1995, it was gradually adopted from the viewpoint of recharging and low COP, and now about 70% of crucibles of 22 inches or more are synthetic quartz crucibles.

【0003】[0003]

【発明が解決しようとする課題】本発明の目的は、液面
振動が少なく、長時間使用しても、DF化率がよい合成石
英ルツボを提供するものである。石英ルツボを長時間使
用するためには純度を上げ、失透しないようにすること
が必要であるが、超高純度の合成石英ルツボを使用する
と激しい液面振動が起きて種結晶を絞れないことがあ
る。このため操業性が著しく悪くなっていた。
SUMMARY OF THE INVENTION An object of the present invention is to provide a synthetic quartz crucible which has a small liquid surface vibration and a good DF ratio even when used for a long time. In order to use a quartz crucible for a long time, it is necessary to raise the purity and prevent devitrification, but when using an ultra-high purity synthetic quartz crucible, vigorous liquid surface vibration occurs and the seed crystal cannot be squeezed. There is. Therefore, the operability was remarkably deteriorated.

【0004】[0004]

【課題を解決するための手段】本発明者らは鋭意研究の
結果、液面振動のメカニズムおよびDF化率のメカニズム
を解明し、かつこの二つが石英ルツボの設計で両方とも
満足させることを見い出したものである。
[Means for Solving the Problems] As a result of diligent research, the present inventors have clarified the mechanism of liquid level vibration and the mechanism of DF conversion rate, and found that the two satisfy both in the design of the quartz crucible. It is a thing.

【0005】[0005]

【発明の実施の形態】合成石英ルツボは失透しにくいた
め、DF化率が良いということはすでに周知の事実であ
る。しかしながら合成石英ルツボを使用すると液面が振
動し、種付けさえできなくなる現象が起こる。これはDF
化率が良いルツボほど顕著に発生する。本発明者は液面
振動とDF化率とが正反対の現象であることに気付き、石
英ガラスの失透と関係があることを突き止めた。失透速
度が石英の溶損速度とある範囲でつり合った場合、液面
振動は止まる。ここで石英ルツボの失透は石英ガラス自
体の構造と不純物とで決定される。そして失透速度は失
透核生成と成長により決定される。例えば、天然石英は
その構造が結晶に近いことから容易に結晶核を生成し、
失透速度は速くなる。よって、液面振動は起きにくい
が、失透速度が速いためにDF化率は長時間使用した場
合、悪くなる。合成石英はその逆の現象が起きる。本発
明者はこの相反する問題を解決する方法として、メルト
ライン附近の表面不純物濃度をそれより下の部分より悪
くすることにより、失透速度を制御し、液面振動の少な
い、かつDF化率の良いルツボを発明したものである。例
えば、ルツボ上端よりメルトラインより30mm下までの部
分をフッ酸により、2μmから4μmエッチングをし、その
下の部分を6μmから12μmエッチングすることによりル
ツボの表面層の純度を変化させる。ルツボ内表面は通常
汚染されており、エッチングを増せば、純度は良くな
る。ルツボ上端よりメルトラインより30mm下までの部分
は早くに結晶核を生成し、失透していき、シリコン融液
との反応も少なくなり、液面振動は少なくなる。その下
の部分は純度が良いため、失透しにくくなり、DF化率は
良くなる。
BEST MODE FOR CARRYING OUT THE INVENTION It is a well known fact that a synthetic quartz crucible has a good DF ratio because it is hard to devitrify. However, when a synthetic quartz crucible is used, the liquid surface vibrates and the phenomenon that seeding cannot be performed occurs. This is DF
Crucibles with a high rate of conversion occur remarkably. The present inventor has noticed that the liquid level vibration and the DF conversion rate are the opposite phenomena, and has found that it is related to the devitrification of quartz glass. When the devitrification rate balances with the melting loss rate of quartz within a certain range, the liquid surface vibration stops. Here, the devitrification of the quartz crucible is determined by the structure of the quartz glass itself and impurities. And the devitrification rate is determined by devitrification nucleation and growth. For example, natural quartz easily forms crystal nuclei because its structure is close to that of crystals,
The devitrification speed becomes faster. Therefore, the liquid level vibration is unlikely to occur, but the devitrification rate is high, and therefore the DF ratio deteriorates when used for a long time. The opposite phenomenon occurs in synthetic quartz. As a method for solving this contradictory problem, the present inventor controls the devitrification rate by making the surface impurity concentration near the melt line worse than the portion below it, and the liquid level vibration is small, and the DF conversion rate is low. It was the inventor of a good crucible. For example, the portion up to 30 mm below the melt line from the upper end of the crucible is etched with hydrofluoric acid to 2 μm to 4 μm, and the lower portion is etched from 6 μm to 12 μm to change the purity of the crucible surface layer. The inner surface of the crucible is usually contaminated, and the more etching, the better the purity. The part 30 mm below the melt line from the top of the crucible forms crystal nuclei early and devitrifies, and the reaction with the silicon melt is reduced, and the liquid surface vibration is reduced. Since the portion underneath has good purity, devitrification is less likely to occur and the DF conversion rate is improved.

【0006】[0006]

【実施例】以下に実施例を挙げ、さらに具体的に本発明
を説明するが、本発明はこれらに限定されるものでは無
い。
The present invention will be described in more detail with reference to the following examples, but the present invention is not limited thereto.

【0007】[0007]

【実施例1】常法にて24インチ合成石英ルツボをつく
り、メルトラインより30mm下までを12%フッ酸で4μmエ
ッチングし、その下部を10μmエッチングした。このル
ツボを使用して8"シリコン単結晶を引き上げた。その結
果を表1に示した。
Example 1 A 24-inch synthetic quartz crucible was prepared by a conventional method, and a portion 30 mm below the melt line was etched with 12% hydrofluoric acid to 4 μm, and a lower portion thereof was etched with 10 μm. Using this crucible, an 8 "silicon single crystal was pulled. The results are shown in Table 1.

【0008】[0008]

【実施例2】常法にて24インチ合成石英ルツボをつく
り、1200℃で10時間熱処理した後、メルトラインより30
mm下までを12%フッ酸で4μmエッチングし、その下部を1
0μmエッチングした。このルツボを使用して8"シリコン
単結晶を引き上げた。その結果を表1に示した。
Example 2 A 24-inch synthetic quartz crucible was prepared by a conventional method, heat-treated at 1200 ° C. for 10 hours, and then melted from the melt line at 30 ° C.
Etching up to 4 mm with 12% hydrofluoric acid to the bottom of the
It was etched by 0 μm. Using this crucible, an 8 "silicon single crystal was pulled. The results are shown in Table 1.

【比較例1】常法にて24インチ合成石英ルツボをつく
り、ルツボ全体を12%フッ酸で4μmエッチングした。こ
のルツボを使用して8"シリコン単結晶を引き上げた。そ
の結果を表1に示した。
Comparative Example 1 A 24-inch synthetic quartz crucible was prepared by a conventional method, and the entire crucible was etched with 12% hydrofluoric acid to 4 μm. Using this crucible, an 8 "silicon single crystal was pulled. The results are shown in Table 1.

【比較例2】常法にて24インチ合成石英ルツボをつく
り、ルツボ全体を12%フッ酸で6μmエッチングした。こ
のルツボを使用して8"シリコン単結晶を引き上げた。そ
の結果を表1に示した。
Comparative Example 2 A 24-inch synthetic quartz crucible was prepared by a conventional method, and the entire crucible was etched with 12% hydrofluoric acid to 6 μm. Using this crucible, an 8 "silicon single crystal was pulled. The results are shown in Table 1.

【比較例3】常法にて24インチ合成石英ルツボをつく
り、ルツボ全体を12%フッ酸で11μmエッチングした。こ
のルツボを使用して8"シリコン単結晶を引き上げた。そ
の結果を表1に示した。
Comparative Example 3 A 24-inch synthetic quartz crucible was prepared by a conventional method, and the entire crucible was etched with 12% hydrofluoric acid for 11 μm. Using this crucible, an 8 "silicon single crystal was pulled. The results are shown in Table 1.

【0009】[0009]

【表1】 [Table 1]

【0010】[0010]

【発明の効果】本発明のルツボは大口径シリコン単結晶
の引上げ時における操業性向上および歩留まり向上に有
用なルツボを提供するものである。
The crucible of the present invention provides a crucible useful for improving operability and yield in pulling a large-diameter silicon single crystal.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 石英ルツボにシリコンを溶解した時のメ
ルトライン附近の純度がそれより下部の部分の純度より
悪いことを特徴とする合成石英ルツボ
1. A synthetic quartz crucible characterized in that the purity near the melt line when silicon is melted in the quartz crucible is worse than the purity in the lower part.
【請求項2】上記石英ルツボの酸によるエッチング量を
変えることにより、シリコンを溶解した時のメルトライ
ン附近とそれより下部の部分の純度を変えることを特徴
とする合成石英ルツボの製造方法
2. A method for producing a synthetic quartz crucible, characterized in that the purity of the portion near the melt line and the portion below the melt line when the silicon is dissolved is changed by changing the etching amount of the quartz crucible with acid.
JP2001273899A 2001-09-10 2001-09-10 Synthetic quartz crucible and method of producing the same Pending JP2003081689A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001273899A JP2003081689A (en) 2001-09-10 2001-09-10 Synthetic quartz crucible and method of producing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001273899A JP2003081689A (en) 2001-09-10 2001-09-10 Synthetic quartz crucible and method of producing the same

Publications (1)

Publication Number Publication Date
JP2003081689A true JP2003081689A (en) 2003-03-19

Family

ID=19099042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001273899A Pending JP2003081689A (en) 2001-09-10 2001-09-10 Synthetic quartz crucible and method of producing the same

Country Status (1)

Country Link
JP (1) JP2003081689A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009051729A (en) * 2003-05-01 2009-03-12 Shinetsu Quartz Prod Co Ltd Quartz glass crucible for pulling up silicon single crystal and its manufacturing method
EP2460912A2 (en) 2010-12-01 2012-06-06 Japan Super Quartz Corporation Vitreous silica crucible

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62175077U (en) * 1986-04-28 1987-11-06
JPH02196083A (en) * 1989-01-25 1990-08-02 Fujitsu Ltd Production of high purity quartz crucible
JPH06279167A (en) * 1992-06-23 1994-10-04 Mitsubishi Material Kuootsu Kk Quartz crucible for pulling up silicon single crystal and its production
JP2000327478A (en) * 1999-04-16 2000-11-28 Shinetsu Quartz Prod Co Ltd Quartz glass crucible and production of the crucible

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62175077U (en) * 1986-04-28 1987-11-06
JPH02196083A (en) * 1989-01-25 1990-08-02 Fujitsu Ltd Production of high purity quartz crucible
JPH06279167A (en) * 1992-06-23 1994-10-04 Mitsubishi Material Kuootsu Kk Quartz crucible for pulling up silicon single crystal and its production
JP2000327478A (en) * 1999-04-16 2000-11-28 Shinetsu Quartz Prod Co Ltd Quartz glass crucible and production of the crucible

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009051729A (en) * 2003-05-01 2009-03-12 Shinetsu Quartz Prod Co Ltd Quartz glass crucible for pulling up silicon single crystal and its manufacturing method
EP2460912A2 (en) 2010-12-01 2012-06-06 Japan Super Quartz Corporation Vitreous silica crucible
US9347148B2 (en) 2010-12-01 2016-05-24 Sumco Corporation Vitreous silica crucible with specific ratio of transparent layer and bubble-containing layer thicknesses

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