JP2003046058A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JP2003046058A JP2003046058A JP2001229453A JP2001229453A JP2003046058A JP 2003046058 A JP2003046058 A JP 2003046058A JP 2001229453 A JP2001229453 A JP 2001229453A JP 2001229453 A JP2001229453 A JP 2001229453A JP 2003046058 A JP2003046058 A JP 2003046058A
- Authority
- JP
- Japan
- Prior art keywords
- control
- terminal
- semiconductor device
- power semiconductor
- semiconductor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group subclass H10D
- H01L25/072—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group subclass H10D the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48111—Disposition the wire connector extending above another semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49113—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting different bonding areas on the semiconductor or solid-state body to a common bonding area outside the body, e.g. converging wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Conversion In General (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は半導体装置に関し、
特にモジュール化された電力用半導体装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device,
In particular, it relates to a modularized power semiconductor device.
【0002】[0002]
【従来の技術】従来からトランジスタ素子、IGBT
(Insulated Gate Bipolar Transistor)素子、ダイオ
ード素子等の電力用半導体素子をパッケージングしてモ
ジュール化した構成(以後、半導体装置モジュールと呼
称)が知られている。2. Description of the Related Art Conventionally, transistor elements and IGBTs
2. Description of the Related Art A configuration in which power semiconductor elements such as (Insulated Gate Bipolar Transistor) elements and diode elements are packaged into a module (hereinafter referred to as a semiconductor device module) is known.
【0003】ここで、半導体装置モジュールの一例とし
て、図8にIGBT素子1およびダイオード素子2を有
した構成を示す。Here, as an example of a semiconductor device module, FIG. 8 shows a configuration having an IGBT element 1 and a diode element 2.
【0004】図8に示すようにダイオード素子2は、フ
リーホイールダイオードとして機能するように、IGB
T素子1に対して順電流が還流する向きに並列に接続さ
れている。As shown in FIG. 8, the diode element 2 functions as an IGB so that it functions as a freewheel diode.
The T element 1 is connected in parallel in a direction in which a forward current flows back.
【0005】IGBT素子1のコレクタは主コレクタ端
子板12に接続され、エミッタは主エミッタ端子板11
に接続されるとともに、制御エミッタ端子22にも接続
されている。The collector of the IGBT element 1 is connected to the main collector terminal plate 12, and the emitter thereof is the main emitter terminal plate 11.
And the control emitter terminal 22 as well.
【0006】制御エミッタ端子22はIGBT素子1の
駆動に際して使用され、制御エミッタ端子22とゲート
端子21との間にゲート−エミッタ間電圧(例えば15
V程度)を印加することでIGBT素子1を駆動するこ
とができる。The control emitter terminal 22 is used for driving the IGBT element 1, and a gate-emitter voltage (for example, 15 V) is applied between the control emitter terminal 22 and the gate terminal 21.
The IGBT element 1 can be driven by applying (about V).
【0007】また、IGBT素子1には電流センス電極
が設けられており、当該電流センス電極は電流センス端
子23に接続されている。電流センス電極とは主エミッ
タ電極に流れる電流の数千分の1の電流(センス電流)
が流れるように形成された電極であり、センス電流を検
出することで、IGBT素子1をフィードバック制御し
て、過電流保護および短絡保護が可能となる。Further, the IGBT element 1 is provided with a current sense electrode, and the current sense electrode is connected to the current sense terminal 23. A current sense electrode is a current (sense current) that is several thousandth of the current that flows in the main emitter electrode
Is an electrode formed so as to flow, and by detecting the sense current, the IGBT element 1 is feedback-controlled to enable overcurrent protection and short-circuit protection.
【0008】ゲート端子21、制御エミッタ端子22、
電流センス端子23等の制御端子は、半導体装置モジュ
ールの外部に導出されて、外部からの制御信号を受けた
り、検出したセンス電流を外部に出力するように構成さ
れる場合もあるが、昨今では、電力用半導体素子の駆動
回路や保護回路等の制御回路を内蔵したIPM(Intell
igent Power Module)が開発され、パッケージ内に内蔵
された制御回路基板に制御端子が接続される構成も多く
なっている。A gate terminal 21, a control emitter terminal 22,
The control terminals such as the current sense terminal 23 may be configured to be led to the outside of the semiconductor device module so as to receive a control signal from the outside and output the detected sense current to the outside. , IPM (Intell) with built-in control circuits such as drive circuits and protection circuits for power semiconductor devices.
igent Power Module) has been developed, and there are many configurations in which control terminals are connected to the control circuit board built into the package.
【0009】[0009]
【発明が解決しようとする課題】制御端子が外部に導出
される半導体装置モジュールにしても、IPMにして
も、制御端子のそれぞれは、端子間電圧による絶縁破壊
を防止するため、それぞれ端子間距離を有して配設され
ている。そして、複数の制御端子は、モジュールの小型
化や、半導体素子との接続の関係から隣接して配設され
ている。In order to prevent the dielectric breakdown due to the voltage between the terminals, the control terminal has a distance between the terminals, regardless of whether the semiconductor device module has the control terminals led to the outside or the IPM. Is provided. The plurality of control terminals are arranged adjacent to each other in view of miniaturization of the module and connection with the semiconductor element.
【0010】そのため、ゲート端子21と制御エミッタ
端子22、制御エミッタ端子22と電流センス端子23
が送信アンテナと受信アンテナのような関係になり、例
えばIGBT素子1のスイッチング動作により、エミッ
タにノイズが出力された場合には、制御エミッタ端子2
2のノイズがゲート端子21あるいは電流センス端子2
3に印加され、それぞれの信号がノイズを含む可能性が
ある。Therefore, the gate terminal 21 and the control emitter terminal 22, and the control emitter terminal 22 and the current sense terminal 23.
Has a relation like a transmitting antenna and a receiving antenna. For example, when noise is output to the emitter due to the switching operation of the IGBT element 1, the control emitter terminal 2
2 noise is gate terminal 21 or current sense terminal 2
3 and each signal can be noisy.
【0011】その一例を図9に示す。図9(a)には、ゲ
ート−エミッタ間電圧の正常な波形を、図9(b)には、
ゲート−エミッタ間電圧の波形にノイズを含む場合を示
す。An example thereof is shown in FIG. FIG. 9 (a) shows a normal waveform of the gate-emitter voltage, and FIG. 9 (b) shows
The case where noise is included in the waveform of the gate-emitter voltage is shown.
【0012】なお、このようなノイズは、IGBT素子
1のスイッチング動作に起因して発生するだけでなく、
外部から与えられる場合もある。It should be noted that such noise not only occurs due to the switching operation of the IGBT element 1, but also
It may be given from the outside.
【0013】本発明は上記のような問題点を解消するた
めになされたもので、制御端子にノイズが印加されるこ
とを防止した半導体装置を提供することを目的とする。The present invention has been made to solve the above problems, and an object thereof is to provide a semiconductor device in which noise is prevented from being applied to a control terminal.
【0014】[0014]
【課題を解決するための手段】本発明に係る請求項1記
載の半導体装置は、パッケージの底面部に収納された電
力用半導体素子と、前記電力用半導体素子に電気的に接
続され、前記電力用半導体素子の制御のための制御信号
の中継に使用される制御端子とを備え、前記制御端子
は、前記底面部に対して垂直方向に延在するように配設
され、前記制御信号が流れる中心導体と、前記中心導体
を取り囲むように配設された絶縁体と、前記絶縁体を取
り囲むように配設された外周導体とを有し、前記外周導
体は、前記電力用半導体素子の駆動に際して、基準電位
に相当する電位が与えられ、前記中心導体の前記底面部
側の第1の端部は、前記外周導体と絶縁を保って前記外
周導体の側面から突出して前記電力用半導体素子との電
気的接続のための端子台をなし、前記中心導体の前記底
面部とは反対側の第2の端部は、前記絶縁体および前記
外周導体の端面よりも突出し、前記制御信号の授受部を
なしている。According to a first aspect of the present invention, there is provided a semiconductor device, wherein a power semiconductor element housed in a bottom surface of a package is electrically connected to the power semiconductor element. A control terminal used for relaying a control signal for controlling the semiconductor device for use, the control terminal being arranged so as to extend in the vertical direction with respect to the bottom surface portion, and the control signal flows. A center conductor, an insulator arranged so as to surround the center conductor, and an outer peripheral conductor arranged so as to surround the insulator, the outer conductor being used for driving the power semiconductor element. , A potential corresponding to a reference potential is applied, and the first end portion of the central conductor on the bottom surface side protrudes from the side surface of the outer peripheral conductor while maintaining insulation with the outer peripheral conductor, End for electrical connection Without the platform, a second end opposite to the bottom surface portion of the center conductor protrudes from the end face of the insulator and the outer circumferential conductor, and forms a transfer portion of said control signal.
【0015】本発明に係る請求項2記載の半導体装置
は、前記制御端子が複数であって、前記複数の制御端子
のそれぞれは、単一の前記中心導体、前記絶縁体および
前記外周導体を備えている。A semiconductor device according to a second aspect of the present invention has a plurality of the control terminals, and each of the plurality of control terminals includes a single central conductor, the insulator and the outer peripheral conductor. ing.
【0016】本発明に係る請求項3記載の半導体装置
は、前記中心導体が複数であって、前記絶縁体は、前記
複数の中心導体を個々に取り囲むように複数配設され、
前記外周導体は、前記複数の絶縁体を共通して取り囲む
ように配設されている。In a semiconductor device according to a third aspect of the present invention, the central conductors are plural, and the insulators are plurally arranged so as to individually surround the plural central conductors.
The outer peripheral conductor is arranged so as to commonly surround the plurality of insulators.
【0017】本発明に係る請求項4記載の半導体装置
は、前記制御端子が、前記パッケージの前記底面部に平
行に配設された導体パターン上に配設され、前記外周導
体の端面が前記導体パターンに直接に接続される。According to a fourth aspect of the present invention, in the semiconductor device according to the fourth aspect, the control terminal is arranged on a conductor pattern arranged in parallel with the bottom surface portion of the package, and the end face of the outer peripheral conductor is the conductor. Connected directly to the pattern.
【0018】本発明に係る請求項5記載の半導体装置
は、パッケージの底面部に収納された電力用半導体素子
と、前記電力用半導体素子に電気的に接続され、前記電
力用半導体素子の制御のための制御信号の中継に使用さ
れる複数の制御端子とを備え、前記複数の制御端子は、
前記底面部に垂直に配置された平板状の本体部を有し、
前記本体部の互いの主面が対向するように隙間を開けて
平行に配設され、前記複数の制御端子のうちには、前記
電力用半導体素子の駆動に際して、基準電位に相当する
電位が与えられる制御端子が含まれ、前記複数の制御端
子のそれぞれは、前記本体部の互いに平行な2辺から延
在する第1および第2の突片を有し、前記複数の制御端
子のそれぞれの前記第1の突片は、前記底面部側におい
て、その主面が前記底面部に平行になるように折り曲げ
られて端子台をなし、前記複数の制御端子のそれぞれの
前記第2の突片は、前記制御信号の授受部をなす。According to a fifth aspect of the present invention, there is provided a semiconductor device according to claim 5, which is electrically connected to the power semiconductor element housed in the bottom surface of the package and is electrically connected to the power semiconductor element. A plurality of control terminals used for relaying a control signal for, the plurality of control terminals,
It has a flat plate-shaped main body arranged vertically to the bottom surface,
The main parts of the main body are arranged in parallel with a gap so that the main surfaces of the main parts face each other, and a potential corresponding to a reference potential is applied to the plurality of control terminals when the power semiconductor element is driven. Control terminals are included, each of the plurality of control terminals having first and second protrusions extending from two parallel sides of the body portion, and each of the plurality of control terminals. The first protrusion is a terminal block that is bent so that its main surface is parallel to the bottom face on the side of the bottom face, and the second protrusion of each of the plurality of control terminals is It forms a part for transmitting and receiving the control signal.
【0019】本発明に係る請求項6記載の半導体装置
は、前記複数の制御端子の前記本体部の主面間の前記隙
間には絶縁体が配設される。In the semiconductor device according to claim 6 of the present invention, an insulator is arranged in the gap between the main surfaces of the main body of the plurality of control terminals.
【0020】本発明に係る請求項7記載の半導体装置
は、前記半導体装置が、前記電力用半導体素子の駆動制
御を行う制御回路が配設された制御基板を内蔵してさら
に備え、前記授受部は、前記制御基板に直接に接続され
る。According to a seventh aspect of the present invention, in the semiconductor device, the semiconductor device further comprises a control board in which a control circuit for controlling the drive of the power semiconductor element is installed, and the transfer unit. Are directly connected to the control board.
【0021】本発明に係る請求項8記載の半導体装置
は、前記半導体装置が、前記電力用半導体素子の駆動制
御を行う制御回路が配設された制御基板を、前記パッケ
ージの外部においてさらに備え、前記授受部は、前記パ
ッケージから突出して前記制御基板に直接に接続され
る。A semiconductor device according to an eighth aspect of the present invention further comprises a control board provided outside the package, the control board having a control circuit for controlling the drive of the power semiconductor element. The transfer unit projects from the package and is directly connected to the control board.
【0022】[0022]
【発明の実施の形態】<A.実施の形態1>
<A−1.装置構成>本発明に係る半導体装置の実施の
形態1として、図1に半導体装置モジュール100の構
成を示す。BEST MODE FOR CARRYING OUT THE INVENTION <A. Embodiment 1><A-1. Device Configuration> FIG. 1 shows a configuration of a semiconductor device module 100 as a first embodiment of a semiconductor device according to the present invention.
【0023】図1は半導体装置モジュール100の内部
構成を示す斜視図であり、樹脂パッケージ10を部分的
に省略して内部構成を示している。FIG. 1 is a perspective view showing the internal structure of the semiconductor device module 100, in which the resin package 10 is partially omitted to show the internal structure.
【0024】図1に示すように、樹脂パッケージ10の
底部には絶縁性を有する絶縁基板3および中継端子基板
6が間隔を開けて配設され、絶縁基板3上にはエミッタ
パターン4、コレクタパターン5が互いに電気的に分離
されて配設され、中継端子基板6上には共通パターン7
が配設されている。なお、中継端子基板6は絶縁性を有
する基板であれば何でも良い。As shown in FIG. 1, an insulating substrate 3 having an insulating property and a relay terminal substrate 6 are arranged at a bottom portion of a resin package 10 with a space therebetween, and an emitter pattern 4 and a collector pattern are provided on the insulating substrate 3. 5 are electrically separated from each other, and the common pattern 7 is formed on the relay terminal board 6.
Is provided. The relay terminal board 6 may be any board as long as it has an insulating property.
【0025】そして、コレクタパターン5上にはIGB
T素子1およびダイオード素子2が1個ずつ配設され、
IGBT素子1とエミッタパターン4との間、ダイオー
ド素子2とエミッタパターン4との間は、複数の金属ワ
イヤーWRによって電気的に接続されている。On the collector pattern 5, IGB
One T element 1 and one diode element 2 are provided,
The IGBT element 1 and the emitter pattern 4 and the diode element 2 and the emitter pattern 4 are electrically connected by a plurality of metal wires WR.
【0026】また、共通パターン7上には、共通パター
ン7に垂直に延在する円筒状の制御端子T1およびT2
が配設され、IGBT素子1のゲートおよび電流センス
電極は、金属ワイヤーWRを介して、それぞれ制御端子
T1およびT2の基部に設けられた端子台211および
231に接続されている。また、IGBT素子1のエミ
ッタは、金属ワイヤーWRを介して共通パターン7に接
続されている。On the common pattern 7, cylindrical control terminals T1 and T2 extending perpendicularly to the common pattern 7 are provided.
The gate and the current sense electrode of the IGBT element 1 are connected to the terminal blocks 211 and 231 provided at the bases of the control terminals T1 and T2, respectively, via the metal wire WR. The emitter of the IGBT element 1 is connected to the common pattern 7 via the metal wire WR.
【0027】制御端子T1およびT2は、それぞれ円柱
状あるいは角柱状のゲート端子21および電流センス端
子23を中心導体として、その周囲を絶縁体IZ1で囲
み、絶縁体IZ1の外周をそれぞれ制御エミッタ端子2
2で囲んだ構造を有している。なお、制御エミッタ端子
22は絶縁体IZ1の外周を囲むように配設されるので
外周導体と呼称することができる。The control terminals T1 and T2 have a columnar or prismatic gate terminal 21 and a current sense terminal 23, respectively, as a central conductor and are surrounded by an insulator IZ1 and the outer periphery of the insulator IZ1 is controlled by the control emitter terminal 2 respectively.
It has a structure surrounded by 2. Since the control emitter terminal 22 is arranged so as to surround the outer periphery of the insulator IZ1, it can be called an outer conductor.
【0028】そして、制御端子T1およびT2において
は、周設された絶縁体IZ1および制御エミッタ端子2
2の端面よりもゲート端子21および電流センス端子2
3が突出しており、ゲート端子21および電流センス端
子23は、中継端子基板6の上方に配設された制御基板
30に電気的に接続される構成となっている。In the control terminals T1 and T2, the insulator IZ1 and the control emitter terminal 2 which are provided around the control terminals T1 and T2 are provided.
The gate terminal 21 and the current sense terminal 2 than the end surface of 2
3, the gate terminal 21 and the current sense terminal 23 are electrically connected to the control board 30 disposed above the relay terminal board 6.
【0029】制御基板30には、IGBT素子1の駆動
回路や保護回路等の制御回路が配設されており、制御基
板30を内蔵することで半導体装置モジュール100は
IPMとなっている。なお、制御基板30を内蔵するこ
とで、電力用半導体素子からの信号経路が短くなり、制
御信号にノイズが印加される可能性を低減できる。A control circuit such as a drive circuit and a protection circuit for the IGBT element 1 is arranged on the control board 30, and the semiconductor device module 100 becomes an IPM by incorporating the control board 30. By incorporating the control board 30, the signal path from the power semiconductor element is shortened, and the possibility that noise is applied to the control signal can be reduced.
【0030】また、エミッタパターン4およびコレクタ
パターン5には、主エミッタ端子板11および主コレク
タ端子板12が接続されている。主エミッタ端子板11
および主コレクタ端子板12は、細長形状を有し、その
長手方向の一端の主面がエミッタパターン4およびコレ
クタパターン5に接続されるように折り曲げられ、他端
の主面が樹脂パッケージ10の上面において露出するよ
うに配設されている。A main emitter terminal plate 11 and a main collector terminal plate 12 are connected to the emitter pattern 4 and the collector pattern 5. Main emitter terminal board 11
The main collector terminal plate 12 has an elongated shape, and is bent so that the main surface at one end in the longitudinal direction is connected to the emitter pattern 4 and the collector pattern 5, and the main surface at the other end is the upper surface of the resin package 10. It is arranged so as to be exposed at.
【0031】ここで、制御端子T2におけるA−A線で
の断面構成を図2に示す。また、図3に制御端子T2の
基部の構造を斜視図で示す。Here, FIG. 2 shows a sectional structure of the control terminal T2 taken along the line AA. 3 is a perspective view showing the structure of the base of the control terminal T2.
【0032】図2に示すように、電流センス端子23の
断面形状はL字形状をなし、L字形状の長辺にあたる部
分が中心導体として絶縁体IZ1および制御エミッタ端
子22で囲まれ、L字形状の短辺にあたる部分が端子台
231として露出している。As shown in FIG. 2, the cross section of the current sense terminal 23 is L-shaped, and the long side of the L-shape is surrounded by the insulator IZ1 and the control emitter terminal 22 as a central conductor, and the L-shaped section is formed. The portion corresponding to the short side of the shape is exposed as the terminal block 231.
【0033】なお、制御エミッタ端子22は、その底面
部において中継端子基板6の主面上の共通パターン7に
半田付け等で接続されるので、共通パターン7との接触
抵抗を低くすることができ、また、制御エミッタ端子2
2は、その上面部において制御基板30の下主面に設け
られた導体パターン302に半田付け等で接続されてい
るので、導体パターン302との接触抵抗を低くするこ
とができる。Since the control emitter terminal 22 is connected to the common pattern 7 on the main surface of the relay terminal board 6 at its bottom surface by soldering or the like, the contact resistance with the common pattern 7 can be lowered. , Control emitter terminal 2
Since 2 is connected to the conductor pattern 302 provided on the lower main surface of the control board 30 by soldering or the like on its upper surface portion, the contact resistance with the conductor pattern 302 can be reduced.
【0034】電流センス端子23は、IGBT素子1の
センス電極に流れるセンス電流の検出信号を制御基板3
0に中継するので、そこに流れる電気信号は、IGBT
素子1を直接に制御するものではないが、センス電流に
基づいてIGBT素子1がフィードバック制御されるの
で、電流センス端子23に流れる電気信号を制御信号と
呼称する。The current sense terminal 23 receives a detection signal of a sense current flowing through the sense electrode of the IGBT element 1 on the control board 3.
Since it relays to 0, the electric signal flowing there is IGBT
Although the element 1 is not directly controlled, since the IGBT element 1 is feedback-controlled based on the sense current, the electric signal flowing through the current sense terminal 23 is called a control signal.
【0035】なお、図2および図3で示すように、端子
台231の下部は絶縁体IZ1で覆われ、共通パターン
7とは電気的に絶縁されている。As shown in FIGS. 2 and 3, the lower portion of the terminal block 231 is covered with an insulator IZ1 and electrically insulated from the common pattern 7.
【0036】一方、電流センス端子23の長辺先端部は
制御基板30を貫通して制御基板30の上主面から突出
し、制御基板30の上主面に設けられた導体パターン3
01に半田付け等で接続されている。導体パターン30
1および302は、制御基板30上に設けられた制御回
路の所定部分に接続され、電気信号(制御信号)の授受
によりIGBT素子1およびダイオード素子2の動作を
制御することになるが、制御回路の構造および動作につ
いては本発明との関連が薄いので説明は省略する。On the other hand, the tip of the long side of the current sense terminal 23 penetrates the control board 30 and projects from the upper main surface of the control board 30, and the conductor pattern 3 provided on the upper main surface of the control board 30.
It is connected to 01 by soldering or the like. Conductor pattern 30
1 and 302 are connected to a predetermined portion of a control circuit provided on the control board 30 and control the operation of the IGBT element 1 and the diode element 2 by exchanging an electric signal (control signal). Since the structure and operation of the above are not closely related to the present invention, description thereof is omitted.
【0037】このような構成により、中継端子基板6の
主面上の共通パターン7は、制御エミッタ端子22を介
して制御基板30の下主面に設けられた導体パターン3
02に電気的に接続され、電流センス端子23は、制御
基板30の上主面に設けられた導体パターン301に電
気的に接続されることになる。なお、制御端子T1の構
成も制御端子T2と同様である。With this structure, the common pattern 7 on the main surface of the relay terminal board 6 is provided on the lower main surface of the control board 30 via the control emitter terminal 22.
02, and the current sense terminal 23 is electrically connected to the conductor pattern 301 provided on the upper main surface of the control substrate 30. The configuration of the control terminal T1 is the same as that of the control terminal T2.
【0038】<A−2.作用効果>以上説明したよう
に、本発明に係る半導体装置モジュール100において
は、ゲート端子21および電流センス端子23を中心導
体として、その周囲を絶縁体IZ1で囲み、絶縁体IZ
1の外周を、基準電位に相当する電位が与えられる制御
エミッタ端子22で囲んだ構造の制御端子T1およびT
2を有しているので、制御信号の中継に際して、ゲート
端子21と制御エミッタ端子22、制御エミッタ端子2
2と電流センス端子23が送信アンテナと受信アンテナ
のような関係になることが防止され、IGBT素子1の
スイッチング動作に起因して発生するノイズがゲート端
子21および電流センス端子23に流れる電気信号(制
御信号)に印加されることを防止できる。<A-2. Effect> As described above, in the semiconductor device module 100 according to the present invention, the gate terminal 21 and the current sense terminal 23 are used as the central conductors, and the periphery thereof is surrounded by the insulator IZ1.
Control terminals T1 and T having a structure in which the outer periphery of 1 is surrounded by a control emitter terminal 22 to which a potential corresponding to the reference potential is applied.
2 has a gate terminal 21, a control emitter terminal 22, and a control emitter terminal 2 when relaying the control signal.
2 and the current sense terminal 23 are prevented from forming a relationship such as a transmitting antenna and a receiving antenna, and noise generated due to the switching operation of the IGBT element 1 flows to the gate terminal 21 and the current sense terminal 23. Control signal) can be prevented from being applied.
【0039】また、ゲート端子21および電流センス端
子23を電気的にシールドでき、外部からのノイズがゲ
ート端子21および電流センス端子23に流れる電気信
号に印加されることを防止できる。Further, the gate terminal 21 and the current sense terminal 23 can be electrically shielded, and noise from the outside can be prevented from being applied to the electric signal flowing through the gate terminal 21 and the current sense terminal 23.
【0040】さらに、制御端子T1およびT2が独立し
ているので、制御端子の配設が自由にできる。Further, since the control terminals T1 and T2 are independent, the control terminals can be arranged freely.
【0041】<B.実施の形態2>
<B−1.装置構成>本発明に係る半導体装置の実施の
形態2として、図4に半導体装置モジュール200の構
成を示す。<B. Second Embodiment><B-1. Device Configuration> As a second embodiment of the semiconductor device according to the present invention, a configuration of a semiconductor device module 200 is shown in FIG.
【0042】図4は半導体装置モジュール200の内部
構成を示す斜視図であるが、制御端子T3以外の構成は
図1を用いて説明した半導体装置モジュール100と同
じであるので、図示および説明は省略する。FIG. 4 is a perspective view showing the internal structure of the semiconductor device module 200. Since the structure other than the control terminal T3 is the same as that of the semiconductor device module 100 described with reference to FIG. 1, illustration and description thereof are omitted. To do.
【0043】図4において、中継端子基板6主面の共通
パターン7上には、共通パターン7に垂直に延在する制
御端子T3が配設されている。そして、IGBT素子1
のゲートおよび電流センス電極は、金属ワイヤーWRを
介して、それぞれ制御端子T3の基部に設けられた端子
台211および231に接続されている。また、IGB
T素子1のエミッタは、金属ワイヤーWRを介して共通
パターン7に接続されている。In FIG. 4, on the common pattern 7 on the main surface of the relay terminal substrate 6, a control terminal T3 extending vertically to the common pattern 7 is arranged. And the IGBT element 1
The gate and the current sense electrode of are connected to terminal blocks 211 and 231 provided at the base of the control terminal T3, respectively, via the metal wire WR. Also, IGB
The emitter of the T element 1 is connected to the common pattern 7 via the metal wire WR.
【0044】制御端子T3は、共通パターン7上に間を
開けて垂直に延在するように配設されたゲート端子21
および電流センス端子23を中心導体とし、その周囲を
それぞれ絶縁体IZ1で囲み、2つの絶縁体IZ1の外
周を制御エミッタ端子22で共通に囲んだ構造を有して
いる。なお、制御エミッタ端子22は2つの絶縁体IZ
1の外周を囲むように配設されるので外周導体と呼称す
ることができる。The control terminal T3 is a gate terminal 21 arranged on the common pattern 7 so as to extend vertically with a gap.
And the current sense terminal 23 as a central conductor, each of which is surrounded by an insulator IZ1, and the outer periphery of the two insulators IZ1 is commonly surrounded by a control emitter terminal 22. The control emitter terminal 22 has two insulators IZ.
Since it is arranged so as to surround the outer periphery of 1, it can be called an outer conductor.
【0045】また、ゲート端子21および電流センス端
子23の構造は、図2を用いて説明した制御端子T2と
同様である。The structures of the gate terminal 21 and the current sense terminal 23 are similar to those of the control terminal T2 described with reference to FIG.
【0046】そして、ゲート端子21および電流センス
端子23に周設されたそれぞれの絶縁体IZ1および、
2つの絶縁体IZ1を共通に取り囲む制御エミッタ端子
22の端面よりも、ゲート端子21および電流センス端
子23が突出しており、ゲート端子21および電流セン
ス端子23は、中継端子基板6の上方に配設された制御
基板30に電気的に接続される構成となっている。The insulators IZ1 provided around the gate terminal 21 and the current sense terminal 23, and
The gate terminal 21 and the current sense terminal 23 are projected from the end surface of the control emitter terminal 22 that commonly surrounds the two insulators IZ1, and the gate terminal 21 and the current sense terminal 23 are arranged above the relay terminal board 6. The control board 30 is electrically connected.
【0047】<B−2.作用効果>以上説明したよう
に、本発明に係る半導体装置モジュール200において
は、ゲート端子21および電流センス端子23を中心導
体として、その周囲をそれぞれ絶縁体IZ1で囲み、2
つの絶縁体IZ1を基準電位に相当する電位が与えられ
る制御エミッタ端子22で共通に取り囲んだ構造の制御
端子T3を有しているので、制御エミッタ端子22の断
面積を広くでき、制御信号の中継に際して、ゲート端子
21および電流センス端子23に対する電気的なシール
ド性能を高めることができ、外部からのノイズがゲート
端子21および電流センス端子23に流れる電気信号
(制御信号)に印加されることを、より効果的に防止で
きる。<B-2. Effect> As described above, in the semiconductor device module 200 according to the present invention, the gate terminal 21 and the current sense terminal 23 are used as the central conductors, and the periphery thereof is surrounded by the insulator IZ1.
Since there is a control terminal T3 having a structure in which two insulators IZ1 are commonly surrounded by a control emitter terminal 22 to which a potential corresponding to a reference potential is applied, the cross-sectional area of the control emitter terminal 22 can be widened and the relay of the control signal can be performed. At this time, it is possible to improve the electric shield performance for the gate terminal 21 and the current sense terminal 23, and to apply noise from the outside to the electric signal (control signal) flowing through the gate terminal 21 and the current sense terminal 23. It can be prevented more effectively.
【0048】<C.実施の形態3>
<C−1.装置構成>本発明に係る半導体装置の実施の
形態3として、図5に半導体装置モジュール300の構
成を示す。<C. Third Embodiment><C-1. Device Configuration> As a third embodiment of the semiconductor device according to the present invention, FIG. 5 shows a configuration of a semiconductor device module 300.
【0049】実施の形態1および2として、図1および
図4を用いて説明した半導体装置モジュール100およ
び200においては、円柱状あるいは角柱状のゲート端
子21および電流センス端子23を中心導体として、そ
の周囲を絶縁体IZ1が囲む構造の制御端子を有してい
たが、図5に示す半導体装置モジュール300において
は、平板状をなすゲート端子210、制御エミッタ端子
220および電流センス端子230等の制御端子を、そ
れらの主面が対向するように配設する構成となってい
る。In the semiconductor device modules 100 and 200 described with reference to FIGS. 1 and 4 as the first and second embodiments, the cylindrical or prismatic gate terminal 21 and the current sense terminal 23 are used as the central conductors. Although the semiconductor device module 300 shown in FIG. 5 has a control terminal having a structure in which the insulator IZ1 surrounds the periphery, the control terminals such as the flat gate terminal 210, the control emitter terminal 220, and the current sense terminal 230 are provided. Are arranged so that their main surfaces face each other.
【0050】すなわち、制御端子であるゲート端子21
0、制御エミッタ端子220および電流センス端子23
0は、平面視形状が矩形状の本体部BD21、BD22
およびBD23と、それぞれの一方の長辺から延在する
突片212、222および232と、他方の長辺から延
在する突片211、221および231とを有し、突片
211、221および231の主面が中継端子基板6の
主面上に接続されるように折り曲げられ、それぞれ端子
台211、221および231となっている。That is, the gate terminal 21 which is a control terminal
0, control emitter terminal 220 and current sense terminal 23
0 is a main body portion BD21, BD22 having a rectangular shape in plan view.
And BD23, projecting pieces 212, 222 and 232 extending from one long side of each, and projecting pieces 211, 221, and 231 extending from the other long side, respectively, and projecting pieces 211, 221 and 231. Is bent so that the main surface thereof is connected to the main surface of the relay terminal board 6 to form terminal blocks 211, 221, and 231, respectively.
【0051】そして、基準電位に相当する電位が与えら
れる制御エミッタ端子220を中央に配置し、制御エミ
ッタ端子220の両主面にそれぞれの主面が対向するよ
うにゲート端子210および電流センス端子230が配
設されている。Then, the control emitter terminal 220 to which a potential corresponding to the reference potential is applied is arranged at the center, and the gate terminal 210 and the current sense terminal 230 are arranged so that their main surfaces face both main surfaces of the control emitter terminal 220. Is provided.
【0052】なお、端子台211、221および231
は、互いに電気的に分離される必要があるので、突片2
11、221および231は、本体部BD21、BD2
2およびBD23の一方の長辺のそれぞれ異なる位置か
ら延在し、互いに接触しないように折り曲げられてい
る。Note that the terminal blocks 211, 221, and 231 are
Need to be electrically isolated from each other, so
Reference numerals 11, 221, and 231 denote body portions BD21, BD2.
2 and BD23 extend from different positions on one long side of each and are bent so as not to contact each other.
【0053】また、中継端子基板6上には、端子台21
1、221および231が共通して接続されるような導
体パターンは設けられておらず、端子台211、221
および231をそれぞれ半田付け等で、中継端子基板6
上に接続するための部分的な導体パターンが設けられて
いるが、それらは端子台211、221および231と
同等の面積を有していれば良いので、端子台211、2
21および231の載置によって隠れ、図中には示され
ていない。On the relay terminal board 6, the terminal block 21
No conductor pattern is provided to connect 1, 221, and 231 in common, and the terminal blocks 211, 221 are not provided.
And 231 by soldering or the like to the relay terminal board 6
Although partial conductor patterns for connection are provided on the upper side, it is sufficient that they have the same area as the terminal blocks 211, 221, and 231.
It is hidden by the placement of 21 and 231 and is not shown in the figure.
【0054】そして、突片212、222および232
が、中継端子基板6の上方に配設された制御基板30に
電気的に接続される構成となっている。Then, the projecting pieces 212, 222 and 232
Are electrically connected to the control board 30 disposed above the relay terminal board 6.
【0055】なお、ゲート端子210、制御エミッタ端
子220および電流センス端子230の、それぞれの本
体部BD21、BD22およびBD23の間には、樹脂
パッケージ10を成形する際に、モールド樹脂が充填さ
れるので、組み立ての段階では間隙を有する構造として
いても良いが、確実な絶縁を行うために、絶縁材を挟む
ようにしても良い。The mold resin is filled between the main body portions BD21, BD22 and BD23 of the gate terminal 210, the control emitter terminal 220 and the current sense terminal 230 when the resin package 10 is molded. Although a structure having a gap may be provided at the stage of assembly, an insulating material may be sandwiched for reliable insulation.
【0056】図5に、ゲート端子210、制御エミッタ
端子220および電流センス端子230を図4の矢示B
方向から見た図を示す。図5に示すように、本体部BD
21とBD22との主面間、および本体部BD22とB
D23との主面間に、絶縁体IZ2を挟み込んだ構成に
することで、各主面間隔を一定にでき、また、確実な絶
縁が可能となる。The gate terminal 210, the control emitter terminal 220 and the current sense terminal 230 are shown in FIG.
The figure seen from the direction is shown. As shown in FIG. 5, the main body BD
21 between the main surfaces of BD22 and the main body BD22 and B
With the configuration in which the insulator IZ2 is sandwiched between the main surface with D23, the distance between the main surfaces can be made constant, and reliable insulation can be achieved.
【0057】なお、絶縁体IZ2は、ゲル状の絶縁材を
塗布して硬化させて形成しても良く、絶縁シートを挟み
込む構成としても良い。The insulator IZ2 may be formed by applying a gel-like insulating material and curing it, or by sandwiching an insulating sheet.
【0058】なお、その他の構成は図1を用いて説明し
た半導体装置モジュール100と同じであるので、図示
および説明は省略する。Since the other structure is the same as that of the semiconductor device module 100 described with reference to FIG. 1, its illustration and description are omitted.
【0059】<C−2.作用効果>以上説明したよう
に、本発明に係る半導体装置モジュール300において
は、基準電位に相当する電位が与えられる制御エミッタ
端子220を中央に配置し、制御エミッタ端子220の
両主面にそれぞれの主面が対向するようにゲート端子2
10および電流センス端子230が配設されているの
で、制御信号の中継に際して、ゲート端子210と制御
エミッタ端子220、制御エミッタ端子220と電流セ
ンス端子230が送信アンテナと受信アンテナのような
関係になることが防止され、IGBT素子1のスイッチ
ング動作に起因して発生するノイズがゲート端子210
および電流センス端子230に流れる電気信号(制御信
号)に印加されることを防止できる。また、各端子の主
面間隔を絶縁破壊しない程度まで狭くすることで、外部
からのノイズがゲート端子210および電流センス端子
230に流れる電気信号(制御信号)に印加されること
を防止できる。<C-2. Operation and Effect> As described above, in the semiconductor device module 300 according to the present invention, the control emitter terminal 220 to which a potential corresponding to the reference potential is applied is arranged in the center, and the control emitter terminal 220 is provided on both main surfaces thereof. Gate terminal 2 so that the main surfaces face each other
Since 10 and the current sense terminal 230 are provided, the gate terminal 210 and the control emitter terminal 220, and the control emitter terminal 220 and the current sense terminal 230 have a relationship like a transmitting antenna and a receiving antenna when relaying a control signal. And the noise generated due to the switching operation of the IGBT element 1 is prevented.
Also, it can be prevented from being applied to the electric signal (control signal) flowing through the current sense terminal 230. Further, by narrowing the main surface spacing of each terminal to the extent that dielectric breakdown does not occur, it is possible to prevent external noise from being applied to the electric signal (control signal) flowing to the gate terminal 210 and the current sense terminal 230.
【0060】なお、以上の説明においては、制御端子が
3つの場合について言及したが、制御端子が3つを越え
る場合であっても、制御エミッタ端子220を複数設
け、それらの両主面に対向するように残りの制御端子を
配設することで、制御エミッタ端子220と他の制御端
子との間で、送信アンテナと受信アンテナのような関係
になることが防止される。In the above description, the case where there are three control terminals has been mentioned, but even when the number of control terminals exceeds three, a plurality of control emitter terminals 220 are provided and they are opposed to both main surfaces thereof. By disposing the remaining control terminals as described above, it is possible to prevent the control emitter terminal 220 and the other control terminals from having a relationship such as a transmitting antenna and a receiving antenna.
【0061】<D.変形例>以上説明した実施の形態1
〜3の半導体装置モジュール100〜300において
は、制御基板30を内蔵したIPMとして説明したが、
制御基板30が外部に配設される構成であっても良い。<D. Modified example> Embodiment 1 described above
In the semiconductor device modules 100 to 300 of 3 to 3, the IPM including the control board 30 is described.
The control board 30 may be arranged outside.
【0062】その場合、制御基板30は樹脂パッケージ
10の上面上部に配設され、そこに、例えば、図1に示
す制御端子T1およびT2のゲート端子21および電流
センス端子23が樹脂パッケージ10の上面から突出し
て接続され、また、図4に示す制御端子T3のゲート端
子21および電流センス端子23が樹脂パッケージ10
の上面から突出して接続され、また、図5に示すゲート
端子210、制御エミッタ端子220および電流センス
端子230の突片212、222および232が樹脂パ
ッケージ10の上面から突出して接続されることにな
る。このような構成により、半導体装置モジュールを小
型化できる。In this case, the control board 30 is arranged on the upper surface of the resin package 10, and the gate terminals 21 and the current sense terminals 23 of the control terminals T1 and T2 shown in FIG. 4 and the gate terminal 21 and the current sense terminal 23 of the control terminal T3 shown in FIG.
Of the gate terminal 210, the control emitter terminal 220 and the current sense terminal 230 shown in FIG. 5 are connected so as to project from the upper surface of the resin package 10. . With such a configuration, the semiconductor device module can be downsized.
【0063】また、実施の形態1〜3の半導体装置モジ
ュール100〜300においては、図8に示したよう
に、IGBT素子1とダイオード素子2の1組の電力用
半導体素子を備える構成として説明したが、IGBT素
子1とダイオード素子2の組は1組に限定されるもので
はなく、複数の組が並列に接続されていても良く、また
直列に接続されて構成であっても良い。Further, in the semiconductor device modules 100 to 300 of the first to third embodiments, as shown in FIG. 8, it has been explained that the semiconductor device modules 100 to 300 are provided with one set of power semiconductor elements of the IGBT element 1 and the diode element 2. However, the set of the IGBT element 1 and the diode element 2 is not limited to one set, and a plurality of sets may be connected in parallel or may be connected in series.
【0064】例えば、図7に示すように、IGBT素子
1Aおよび1Bが直列に接続され、IGBT素子1Aお
よび1Bには、それぞれダイオード素子1Aおよび1B
が逆並列に接続されている。For example, as shown in FIG. 7, IGBT elements 1A and 1B are connected in series, and IGBT elements 1A and 1B have diode elements 1A and 1B, respectively.
Are connected in anti-parallel.
【0065】IGBT素子1Aのコレクタは主コレクタ
端子板121に接続され、IGBT素子1Aのエミッタ
およびIGBT素子1Bのコレクタは、共通して出力端
子板122に接続されている。この出力端子板122
は、外部に設けられたモータなどの誘導性負荷に接続さ
れる。そして、IGBT素子1Bのエミッタは主エミッ
タ端子板123に接続されている。The collector of the IGBT element 1A is connected to the main collector terminal plate 121, and the emitter of the IGBT element 1A and the collector of the IGBT element 1B are commonly connected to the output terminal plate 122. This output terminal board 122
Is connected to an inductive load such as a motor provided outside. The emitter of the IGBT element 1B is connected to the main emitter terminal plate 123.
【0066】また、IGBT素子1Aおよび1Bのエミ
ッタは、それぞれ制御エミッタ端子22Aおよび22B
に接続され、IGBT素子1Aおよび1Bの電流センス
電極は、それぞれ電流センス端子23Aおよび23Bに
接続され、IGBT素子1Aおよび1Bのゲートは、そ
れぞれゲート端子21Aおよび21Bに接続されてい
る。Further, the emitters of the IGBT elements 1A and 1B have control emitter terminals 22A and 22B, respectively.
The current sense electrodes of the IGBT elements 1A and 1B are connected to the current sense terminals 23A and 23B, respectively, and the gates of the IGBT elements 1A and 1B are connected to the gate terminals 21A and 21B, respectively.
【0067】このような構成において、ゲート端子21
A、制御エミッタ端子22Aおよび電流センス端子23
Aの3つの制御端子で1組をなし、ゲート端子21B、
制御エミッタ端子22Bおよび電流センス端子23Bの
3つの制御端子で1組をなすので、制御端子のそれぞれ
の組において、実施の形態1〜3の半導体装置モジュー
ル100〜300において示した制御端子の構成を採る
ようにすれば良い。In such a structure, the gate terminal 21
A, control emitter terminal 22A and current sense terminal 23
A set of three control terminals A, gate terminal 21B,
Since the control emitter terminal 22B and the current sense terminal 23B form a set of three control terminals, the control terminal configuration shown in the semiconductor device modules 100 to 300 of the first to third embodiments is set in each set of control terminals. It should be collected.
【0068】[0068]
【発明の効果】本発明に係る請求項1記載の半導体装置
によれば、制御信号が流れる中心導体の周囲を絶縁体で
囲み、絶縁体の外周を、基準電位に相当する電位が与え
られる外周導体で囲んだ構造の制御端子を備えるので、
中心導体がアンテナとなることを防止でき、制御信号の
中継に際して、電力用半導体素子のスイッチング動作に
起因して発生するノイズが制御信号に印加されることを
防止できる。また、中心導体を電気的にシールドでき、
外部からのノイズが制御信号に印加されることを防止で
きる。According to the semiconductor device of the first aspect of the present invention, the periphery of the central conductor through which the control signal flows is surrounded by an insulator, and the outer periphery of the insulator is provided with a potential corresponding to the reference potential. Since it has a control terminal surrounded by a conductor,
It is possible to prevent the central conductor from functioning as an antenna, and prevent the noise generated due to the switching operation of the power semiconductor element from being applied to the control signal when relaying the control signal. Also, the center conductor can be electrically shielded,
It is possible to prevent external noise from being applied to the control signal.
【0069】本発明に係る請求項2記載の半導体装置に
よれば、外周導体が、複数の制御端子のそれぞれに配設
されるので、各制御端子の独立性を保つことができ、制
御端子の配設が自由にできる。According to the semiconductor device of the second aspect of the present invention, since the outer peripheral conductor is provided for each of the plurality of control terminals, the independence of each control terminal can be maintained and the control terminal It can be arranged freely.
【0070】本発明に係る請求項3記載の半導体装置に
よれば、複数の中心導体の周囲をそれぞれ絶縁体で囲
み、複数の絶縁体の外周を、基準電位に相当する電位が
与えられる外周導体で共通に囲んだ構造の制御端子を備
えるので、外周導体の断面積を広くでき、制御信号の中
継に際して、複数の中心導体に対する電気的なシールド
性能を高めることができ、外部からのノイズが複数の中
心導体に流れる制御信号に印加されることを、より効果
的に防止できる。According to the semiconductor device of the third aspect of the present invention, the outer periphery of each of the plurality of central conductors is surrounded by an insulator, and the outer periphery of the plurality of insulators is given a potential corresponding to the reference potential. Since it has a control terminal that is commonly surrounded by, the cross-sectional area of the outer conductor can be widened, and when relaying the control signal, the electrical shield performance for multiple central conductors can be improved, and multiple external noises can be generated. It can be more effectively prevented from being applied to the control signal flowing through the central conductor of.
【0071】本発明に係る請求項4記載の半導体装置に
よれば、外周導体の端面が導体パターンに直接に接続さ
れるので、外周導体と導体パターンとの接触面積を広く
でき、接触抵抗を低減できる。According to the semiconductor device of the fourth aspect of the present invention, since the end face of the outer peripheral conductor is directly connected to the conductor pattern, the contact area between the outer peripheral conductor and the conductor pattern can be widened and the contact resistance can be reduced. it can.
【0072】本発明に係る請求項5記載の半導体装置に
よれば、複数の制御端子が、平板状の本体部の互いの主
面が対向するように隙間を開けて平行に配設され、複数
の制御端子のうちのには、電力用半導体素子の駆動に際
して、基準電位に相当する電位が与えられる制御端子が
含まれるので、例えば、制御端子が3つの場合には、基
準電位に相当する電位が与えられる制御端子を中央に配
置し、それを挟むように残りの制御端子を配置すること
で、基準電位に相当する電位が与えられる制御端子と、
その主面に対向するように配設された制御端子とは、ア
ンテナになることを防止でき、制御信号の中継に際し
て、電力用半導体素子のスイッチング動作に起因して発
生するノイズが制御信号に印加されることを防止でき
る。また、各端子の主面間隔を絶縁破壊しない程度まで
狭くすることで、外部からのノイズが制御信号に印加さ
れることを防止できる。According to a fifth aspect of the semiconductor device of the present invention, the plurality of control terminals are arranged in parallel with each other with a gap so that the main surfaces of the flat plate-shaped main body face each other. Since the control terminals to which a potential corresponding to the reference potential is applied at the time of driving the power semiconductor element are included, for example, in the case of three control terminals, the potential corresponding to the reference potential is included. A control terminal to which a potential corresponding to the reference potential is applied by arranging the control terminal to which the
The control terminal arranged so as to face the main surface can prevent it from becoming an antenna, and when relaying the control signal, noise generated due to the switching operation of the power semiconductor element is applied to the control signal. Can be prevented. Further, by making the main surface interval of each terminal narrow enough to prevent dielectric breakdown, it is possible to prevent external noise from being applied to the control signal.
【0073】本発明に係る請求項6記載の半導体装置に
よれば、複数の制御端子の本体部の主面間の隙間に絶縁
体が配設されているので、各主面間隔を一定にでき、ま
た、確実な絶縁が可能となる。According to the semiconductor device of the sixth aspect of the present invention, since the insulator is provided in the gap between the main surfaces of the main body of the plurality of control terminals, the main surface intervals can be made constant. Also, reliable insulation is possible.
【0074】本発明に係る請求項7記載の半導体装置に
よれば、電力用半導体素子の駆動制御を行う制御回路が
配設された制御基板を内蔵し、制御信号の授受部が制御
基板に直接に接続されるので、電力用半導体素子から制
御基板までの信号経路が短くなり、制御信号にノイズが
印加される可能性を低減できる。According to the semiconductor device of the seventh aspect of the present invention, the control board in which the control circuit for controlling the drive of the power semiconductor element is provided is built in, and the control signal transfer unit is directly connected to the control board. Since the signal path from the power semiconductor element to the control board is shortened, it is possible to reduce the possibility that noise is applied to the control signal.
【0075】本発明に係る請求項8記載の半導体装置に
よれば、電力用半導体素子の駆動制御を行う制御回路が
配設された制御基板を、樹脂パッケージの外部において
備えるので、半導体装置モジュールを小型化できる。According to the semiconductor device of the eighth aspect of the present invention, since the control board having the control circuit for controlling the drive of the power semiconductor element is provided outside the resin package, the semiconductor device module is provided. Can be miniaturized.
【図1】 本発明に係る実施の形態1の半導体装置モジ
ュールの内部構成を示す斜視図である。FIG. 1 is a perspective view showing an internal configuration of a semiconductor device module according to a first embodiment of the present invention.
【図2】 本発明に係る実施の形態1の半導体装置モジ
ュールの制御端子の構成を示す断面図である。FIG. 2 is a sectional view showing a configuration of a control terminal of the semiconductor device module according to the first embodiment of the present invention.
【図3】 本発明に係る実施の形態1の半導体装置モジ
ュールの制御端子の構成を示す斜視図である。FIG. 3 is a perspective view showing a configuration of a control terminal of the semiconductor device module according to the first embodiment of the present invention.
【図4】 本発明に係る実施の形態2の半導体装置モジ
ュールの内部構成を示す斜視図である。FIG. 4 is a perspective view showing an internal configuration of a semiconductor device module according to a second embodiment of the present invention.
【図5】 本発明に係る実施の形態3の半導体装置モジ
ュールの内部構成を示す斜視図である。FIG. 5 is a perspective view showing an internal configuration of a semiconductor device module according to a third embodiment of the present invention.
【図6】 本発明に係る実施の形態3の半導体装置モジ
ュールの制御端子の構成を示す側面図である。FIG. 6 is a side view showing a configuration of control terminals of a semiconductor device module according to a third embodiment of the present invention.
【図7】 電力用半導体素子の組み合わせの一例を示す
図である。FIG. 7 is a diagram showing an example of a combination of power semiconductor elements.
【図8】 電力用半導体素子と制御端子との接続関係を
示す図である。FIG. 8 is a diagram showing a connection relationship between a power semiconductor element and a control terminal.
【図9】 従来の半導体装置モジュールの問題点を示す
図である。FIG. 9 is a diagram showing a problem of a conventional semiconductor device module.
21,210 ゲート端子、22,220 制御エミッ
タ端子、23,230電流センス端子、211,231
端子台、T1,T2,T3 制御端子、IZ1,IZ
2 絶縁体。21,210 Gate terminal, 22,220 Control emitter terminal, 23,230 Current sense terminal, 211,231
Terminal block, T1, T2, T3 control terminals, IZ1, IZ
2 insulator.
Claims (8)
半導体素子と、 前記電力用半導体素子に電気的に接続され、前記電力用
半導体素子の制御のための制御信号の中継に使用される
制御端子と、を備え、 前記制御端子は、 前記底面部に対して垂直方向に延在するように配設さ
れ、前記制御信号が流れる中心導体と、 前記中心導体を取り囲むように配設された絶縁体と、 前記絶縁体を取り囲むように配設された外周導体と、を
有し、 前記外周導体は、前記電力用半導体素子の駆動に際し
て、基準電位に相当する電位が与えられ、 前記中心導体の前記底面部側の第1の端部は、前記外周
導体と絶縁を保って前記外周導体の側面から突出して前
記電力用半導体素子との電気的接続のための端子台をな
し、 前記中心導体の前記底面部とは反対側の第2の端部は、
前記絶縁体および前記外周導体の端面よりも突出し、前
記制御信号の授受部をなす、半導体装置。1. A power semiconductor element housed in a bottom surface of a package, and a control electrically connected to the power semiconductor element and used for relaying a control signal for controlling the power semiconductor element. A terminal, the control terminal is disposed so as to extend in a direction perpendicular to the bottom surface portion, a central conductor through which the control signal flows, and an insulation disposed so as to surround the central conductor. A body and an outer peripheral conductor arranged so as to surround the insulator, wherein the outer peripheral conductor is given a potential corresponding to a reference potential when the power semiconductor element is driven, The first end portion on the bottom surface side forms a terminal block for electrically connecting to the power semiconductor element by protruding from the side surface of the outer peripheral conductor while maintaining insulation with the outer peripheral conductor, Opposite side of the bottom Second end,
A semiconductor device, which projects from the end faces of the insulator and the outer peripheral conductor and serves as a part for transmitting and receiving the control signal.
体、前記絶縁体および前記外周導体を備える、請求項1
記載の半導体装置。2. The control terminals are plural, and each of the plural control terminals comprises a single central conductor, the insulator, and the outer peripheral conductor.
The semiconductor device described.
うに複数配設され、 前記外周導体は、前記複数の絶縁体を共通して取り囲む
ように配設される、請求項1記載の半導体装置。3. A plurality of the center conductors, a plurality of the insulators are arranged so as to individually surround the plurality of center conductors, and the outer peripheral conductors commonly surround the plurality of insulators. The semiconductor device according to claim 1, wherein the semiconductor device is arranged as follows.
ターン上に配設され、 前記外周導体の端面が前記導体パターンに直接に接続さ
れる、請求項1記載の半導体装置。4. The control terminal is arranged on a conductor pattern arranged in parallel to the bottom surface portion of the package, and an end surface of the outer peripheral conductor is directly connected to the conductor pattern. The semiconductor device described.
半導体素子と、 前記電力用半導体素子に電気的に接続され、前記電力用
半導体素子の制御のための制御信号の中継に使用される
複数の制御端子と、を備え、 前記複数の制御端子は、前記底面部に垂直に配置された
平板状の本体部を有し、前記本体部の互いの主面が対向
するように隙間を開けて平行に配設され、 前記複数の制御端子のうちには、前記電力用半導体素子
の駆動に際して、基準電位に相当する電位が与えられる
制御端子が含まれ、 前記複数の制御端子のそれぞれは、前記本体部の互いに
平行な2辺から延在する第1および第2の突片を有し、 前記複数の制御端子のそれぞれの前記第1の突片は、前
記底面部側において、その主面が前記底面部に平行にな
るように折り曲げられて端子台をなし、 前記複数の制御端子のそれぞれの前記第2の突片は、前
記制御信号の授受部をなす、半導体装置。5. A power semiconductor element housed in a bottom surface of a package, and a plurality of elements electrically connected to the power semiconductor element and used for relaying a control signal for controlling the power semiconductor element. And a control terminal, wherein the plurality of control terminals has a flat plate-shaped main body portion that is arranged perpendicular to the bottom surface portion, and a gap is formed so that main surfaces of the main body portion face each other. Arranged in parallel, among the plurality of control terminals, when driving the power semiconductor element, includes a control terminal to which a potential corresponding to a reference potential is applied, each of the plurality of control terminals, It has a 1st and 2nd projecting piece extended from the mutually parallel 2 sides of a main-body part, The said 1st projecting piece of each of these control terminals WHEREIN: The main surface is the said bottom surface side. Bend it so that it is parallel to the bottom. No terminal blocks Te, each of said second projecting piece of the plurality of control terminals forms a transfer portion of the control signal, the semiconductor device.
間の前記隙間には、絶縁体が配設される、請求項5記載
の半導体装置。6. The semiconductor device according to claim 5, wherein an insulator is provided in the gap between the main surfaces of the main body of the plurality of control terminals.
された制御基板を内蔵してさらに備え、 前記授受部は、前記制御基板に直接に接続される、請求
項1または請求項5記載の半導体装置。7. The semiconductor device further includes a control board in which a control circuit for controlling driving of the power semiconductor element is provided, and the transfer unit is directly connected to the control board. The semiconductor device according to claim 1 or claim 5.
された制御基板を、前記パッケージの外部においてさら
に備え、 前記授受部は、前記パッケージから突出して前記制御基
板に直接に接続される、請求項1または請求項5記載の
半導体装置。8. The semiconductor device further comprises a control board on the outside of the package, the control board having a control circuit for controlling the drive of the power semiconductor element, wherein the transfer unit projects from the package. The semiconductor device according to claim 1 or 5, which is directly connected to the control substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001229453A JP4601874B2 (en) | 2001-07-30 | 2001-07-30 | Semiconductor device |
Applications Claiming Priority (1)
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