JP2003044789A - Rf-id inspection method and its inspection system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve measuring of a communication distance and to improve an yield concerning an inspection method and system for inspecting whether RF-ID manufactured is satisfactory or not. SOLUTION: By using a reference piece 12 which has the same constitution as the test piece 15 of the RF-ID that is not influenced by surrounding environment. Communicable distance as the result of communication between the antenna 24 of the reference piece 12 and the antenna 33 of a system is specified. A correction value in the specified communication distance is extracted from a correction table. Whether the test piece 15 is satisfactory or not is judged by whether the communication is possible or not at a communication distance to the test piece 15 added with the correction value.

Description

Detailed Description of the Invention

[0001]

TECHNICAL FIELD The present invention relates to an RF-manufactured product.
The present invention relates to an inspection method and an inspection system for inspecting the quality of an ID.

[0002]

2. Description of the Related Art In recent years, RF-ID (Radio Fre
A technique relating to a non-contact type identification medium (a non-contact type IC card or the like) called a "Quality Identification" is rapidly advancing, and its use is also wide-ranging. Such an RF-ID has a communication distance determined according to its performance with a reader / writer, and it is desired to improve communication measurement and yield.

Conventionally, in an RF-ID, an antenna coil is formed on a film base and an IC module is mounted thereon, and a predetermined number of these are formed on a film base of a predetermined size at the manufacturing stage. It is commonplace. Then, the communication distance is measured for each single IC module and each antenna coil before being made as a single unit,
The quality of products is inspected. Regarding the measurement of the communication distance, it is determined whether the communication distance with the reader / writer is secured according to its performance. In general, the communication distance to be set includes a certain amount of margin, and for example, a quality judgment criterion is 45 cm for a performance of 50 cm.

[0004]

However, in the case of performing the communication distance inspection as described above, the RF-ID reader /
The communication status between the writer and the RF-ID antenna is noise,
It is impossible to perform stable performance measurement because the measurement result fluctuates due to the surrounding environment such as surrounding substances, temperature and humidity, and the output change of the RF-ID reader / writer itself. For example, when the RF-ID reader / writer is affected by the surrounding environment, even if the same RF-ID is measured, the same communication distance measurement result cannot always be obtained, which causes an error in the quality judgment. Become. That is, there is a problem in that the product may be determined to be defective even though it is originally a non-defective product, leading to a decrease in yield.

Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide an RF-ID inspection method and an inspection system for improving the measurement of communication distance and the yield.

[0006]

In order to solve the above problems, according to the invention of claim 1, a standard having the same configuration as the test piece of the RF-ID provided with the IC module and the antenna to be inspected, which is not affected by the surrounding environment. An inspection method in which a piece is prepared, the reference piece and the inspection piece communicate with each other by a transmission / reception inspection system, and the quality is inspected, and the transmission / reception inspection system communicates with the reference piece to enable communication. And a step of determining the communication state by the transmission / reception inspection system performing communication with the inspection piece based on the first element, and the measurement result. And a step of judging pass / fail depending on whether the inspection piece is communicable or not.

According to the inventions of claims 2 and 3, "the first
Is the distance between the antenna of the inspection piece and the antenna of the transmission / reception inspection system, and the communicable state of the reference piece and the RF-ID serving as the inspection piece is measured in advance,
Compensation distances based on mutual tendencies are created as a table, and when measuring the communication state of the inspection piece, the communication distance corrected by the compensation distance is used. The distance between the antenna of one piece and the antenna of the transmission / reception inspection system is set, and the communication state of the inspection piece is measured at the distance specified by the communication with the reference piece. "

According to a fourth aspect of the invention, an IC to be inspected
A method of inspecting whether the RF / ID inspection piece including a module and an antenna is communicated by a transmission / reception inspection system and inspecting the quality, wherein the transmission / reception inspection system performs communication with the inspection piece, Identifying a second factor of radio field strength or communication distance at which communication is possible,
The transmission / reception inspection system communicates with the inspection piece with reference to a first element of communication distance or radio field intensity to measure the second element, and the second element of the measurement result is used. And a step of determining pass / fail depending on whether or not the inspection piece can communicate.

According to a fifth aspect of the invention, an IC to be inspected
A test system, in which a reference piece having the same configuration as an RF-ID test piece including a module and an antenna and not affected by the surrounding environment is prepared, and the reference piece and the test piece are communicated with each other to inspect the quality, The antenna for performing the above, a driving unit that moves the antenna for communicating with the antennas of the reference piece and the inspection piece, and
At least any one of to 3 of the above-mentioned 3 and the processing part which performs quality judgment by the inspection method of any one are comprised.

According to a sixth aspect of the invention, an IC to be inspected
A module and an inspection system that communicates with an RF-ID inspection piece, and inspects whether it is good or bad, in order to communicate with an antenna for communication and the antenna to the antenna of the inspection piece. At least a drive unit for moving the inspection piece, a detection unit for detecting a transmission state from the inspection piece, and a processing unit for making a pass / fail judgment by the inspection method according to claim 4.

As described above, the reference piece which has the same structure as the inspection piece of the RF-ID to be inspected and is not affected by the surrounding environment is used.
The first element in the communication result with the reference piece is specified, and it is determined whether or not communication is possible using the first element in the communication inspection with the inspection piece. In other words, since the reference piece is not affected by the surrounding environment, it is possible to identify how much the transmission / reception inspection system is affected by the surrounding environment even if the transmission / reception inspection system is affected by the surrounding environment, thus improving communication distance measurement. Can be achieved. As a result, it is possible to improve the yield without being regarded as a defective product due to the influence of the surrounding environment although it is originally a good product.

When the reference piece is not used, the second element of the radio wave intensity or the communication distance that enables communication with the inspection piece is specified, and the first element of the communication distance or the radio wave intensity is specified for the inspection piece. The quality of the test piece is determined by communicating with the element as a reference and measuring the second element. That is,
Since the communication state of the test piece can be determined by the relative relationship between the radio field intensity and the communication distance, it is possible to improve the measurement of the communication distance and, consequently, the yield.

[0013]

BEST MODE FOR CARRYING OUT THE INVENTION Preferred embodiments of the present invention will be described below with reference to the drawings. Here, the RF-ID according to the present invention
Is a medium capable of transmitting and receiving data such as identification information without contact such as a contactless type IC card as well as a contactless type label or tag. FIG. 1 shows a block configuration diagram of an inspection system in the first embodiment of the present invention. In FIG. 1, R
The F-ID inspection system 11A is an IC to be inspected.
The module has the same structure as the RF-ID inspection piece equipped with an antenna, and includes a reference piece 12, a drive structure means 13, and an inspection processing means 14 which are not affected by the surrounding environment.
The drive structure means 13 and the inspection processing means 14 constitute a transmission / reception inspection system. In the drawing, the reference piece 12 is the same as the inspection piece 15 of the RF-ID to be inspected at the time of inspection.

The reference piece 12 (inspection piece 15) is composed of an IC module M composed of a processing section 21, a memory 22 and a demodulation section 23, and an antenna 24. The antenna 25 is, for example, wound in a coil shape on a plane as will be described later, and plays a role of receiving a signal from the transmission / reception inspection system or transmitting data from the RF-ID to the transmission / reception inspection system.

In the IC module M, the memory 2
2 is for storing various information as the card. The demodulation unit 23 demodulates the control signal and data from the radio wave received by the antenna 24, and appropriately performs code conversion. Then, the processing unit 21 causes the memory 22 to store the received control signal and data and transmits the data stored in the memory according to the program.

The drive structure means 13 comprises a transport drive section 31.
And the antenna driving unit 32, and the RF-ID
An antenna 33 for communicating with 12 (15) is mounted.
The transport driving unit 31 is for transporting and moving the relevant inspection strip to the inspection position when performing the inspection in the state where a predetermined number of the inspection strips 15 are formed on the film base in the manufacturing stage. The antenna drive unit 32, which will be described with reference to FIG. 3, moves the antenna 33 in the direction of the reference piece 12 and the inspection piece 15, and horizontally moves between the reference piece 12 and the inspection piece 15, and the reference piece. 12 and the antenna 24 of the inspection piece 15 are moved up and down.

The inspection processing means 14 is provided with a control section 41, an inspection processing section 42, a data memory 43, a correction setting section 44, and a power amplification section 45, which constitutes a processing section for judging the quality of the inspection piece. The modulator 46, the transmitter 47, the detector 48, the data converter 49, the carrier drive controller 50, the antenna drive controller 51, the interface (IF) unit 52, and the display unit 53 are provided.

The control unit 41 has the inspection processing means 14
It controls the whole of, and the program according to this is set. The inspection processing unit 42, which will be described in detail with reference to FIG. 2, performs inspection processing and determination on the reference piece 12 and the inspection piece 15 in an inspection routine by a program. The data memory 43 stores various data and is a temporary storage area for inspection determination as appropriate (a buffer and may be provided in the inspection processing unit 42).
Also plays a role. The various data include, for example, random inspection identification information to be stored in the memory 22 of the reference piece 12, information (for example, identification information) to be stored in the memory 22 of each inspection piece 15, and the reference piece 12. There are reference data and the like of the communication distance with respect to.

The correction setting section 44 basically comprises the inspection piece 1.
5, the correction value (correction distance) derived in relation to the reference piece 12 at the time of inspection is set, and the correction table 6
1 and a time setting unit 62 as appropriate. Correction table 6
5 shows an example in FIG. 5, the communication distance as the first element in the communicable state (between the antennas 24 and 33) with the reference piece 12 and the inspection piece 15 is measured in advance, and the mutual tendencies are measured. Is prepared as a table, and when measuring the communication state of the inspection piece 15, the communication distance of the inspection piece 15 is measured with the communication distance corrected by the correction distance. The time setting unit 62 is the system 11A.
This is because the time when the communication distance is specified with respect to the reference piece 12 at every predetermined time is set as the reference data.

The data conversion section 49 converts the information when transmitting information to the reference piece 12 or the inspection piece 15 into, for example, "1" or "0", and the reference piece 12 and the inspection piece 15 respectively. The transmission data of is converted into, for example, "1" or "0". The modulating unit 46 modulates the information converted by the data converting unit 49 into, for example, an FSK (frequency shift keying) modulated wave based on the transmission output from the transmitting unit 47. The power amplifier 45 power-amplifies the modulated wave modulated by the modulator 46, and the amplified modulated wave is transmitted from the antenna 33. Then, the detection unit 48
Is the reference piece 12 or the inspection piece 1 received by the antenna 33.
The transmission radio wave from 5 is detected and demodulated.

On the other hand, the transport drive control section 50 transports the test pieces 15 in order to sequentially inspect them.
A control signal for driving 1 is generated based on a command from the control means 41 and sent to the transport drive section 31 via the IF section 52. In addition, the antenna drive control unit 51
Is an antenna 33 with respect to the reference piece 12 or the inspection piece 15.
Is moved to either direction, a signal for controlling the distance (communication distance) to the target antenna 24 is generated based on a command from the control unit 41, and the antenna drive unit 32 is transmitted via the IF unit 52.
To be sent to.

FIG. 2 is a block diagram showing an example of the inspection processing unit shown in FIG. In FIG. 2, the inspection processing unit 4
2 includes a processing unit 71, a reception data acquisition unit 72, a transmission data acquisition unit 73, a correction data acquisition unit 74, a reference data acquisition unit 75, and a determination unit 76 as functions of program processing. The processing means 71 supervises the entire processing of the inspection processing unit 42, and appropriately sets the reference piece 1 at the time interval set in the time setting unit 62 of the correction setting unit 44.
The measurement for 2 is performed via the control unit 41. The reception data acquisition means 72 is the reference piece 12 or the inspection piece 1.
5 is acquired when the data transmitted from 5 is received, and is appropriately stored in the data memory 43 (if the received data acquisition means 72 includes a buffer, it may be temporarily stored in the buffer). .

The transmission data acquisition means 73 is the reference piece 1
2 or the identification information to be written in the memory 22 by communication with the inspection piece 15 is read from the data memory 43 and acquired. The correction data acquisition means 74 acquires a correction value for the communication distance specified by the communication with the reference piece 12 as the first element, and is for reflecting it in the communication distance for the inspection piece 15. The reference data acquisition means 7
Reference numeral 5 denotes the antenna 24 of the reference piece 12 and the antenna 3 of the drive structure means 13 when communicating with the reference piece 12.
The distance data (communication distance) from the data memory 43 is acquired from the data memory 43, and the time data set in the time setting unit 62 of the correction setting unit 44 is acquired. It is intended to be performed by.

Then, the judging means 76, the transmission data acquired and transmitted, and the reference piece 12 or the inspection piece 15 are used.
Compared with the received data transmitted further, if they match, it is judged as a non-defective product, and if they do not match, it is judged as a defective product, and the transmitted data is actually written in the memory 22 of the reference piece 12 and the inspection piece 15. Whether or not the communication is performed is regarded as the quality of the communication state by the data comparison.

Next, FIG. 3 shows a schematic diagram of the inspection system of FIG. In the inspection system 11A shown in FIG. 3, the roll-shaped inspection piece 81 in which the inspection piece 15 is continuously wound.
The transport drive unit 31 (not shown) (described in FIG. 4)
Thus, the sheets are sequentially conveyed onto the measuring stands 82A and 82B. The measuring bases 82A and 82B have the measuring piece 1 at the measuring position.
A gap slightly wider than the length of 5 is provided, and the reference piece 1 is provided in this gap portion in a direction perpendicular to the conveyance direction of the inspection piece 15.
A mounting table 83 on which 2 (described in FIG. 4) is mounted is arranged. A portion of the mounting table 83 on which the reference piece 12 is mounted is perforated, and is grounded and shielded together with the measuring tables 82A and 82B.

On the other hand, below the gap, a Y-direction drive mechanism 84 and a Z-direction drive mechanism 85 which constitute the antenna drive unit 32 are arranged, and the Z-direction drive mechanism 85 moves in the Y-direction together with the Y-direction drive mechanism 84. It is free. The antenna 33 is mounted on the Z-direction drive mechanism 85. Note that the inspection processing means 14 described above is omitted in FIG.

Therefore, FIG. 4 shows an explanatory view of the inspection piece to be inspected and the reference piece to be used. FIG. 4A shows an inspection piece, and FIG. 4B shows a reference piece. Figure 4
In (A), the roll-shaped inspection piece 81 in which the inspection pieces 15 are continuous is formed on the film base at predetermined intervals. For example, the antenna coil is formed in a single stroke by a printing technique to form the antenna 24. And the antenna 2
The IC module M is electrically connected to both ends of the IC card 4.

As shown in FIG. 4B, the reference piece 12 is not affected by the surrounding environment as described above. For example, glass is provided on the base 91 made of epoxy resin, and the ground G and the antenna 24 are formed by, for example, photolithography. Is formed, and the IC module M is mounted on the ground G. Then, the IC module M and the antenna 24
Both ends of are bonded by wires 92A and 92B. With such a configuration, it is possible to avoid or reduce the influence of the surrounding environment such as noise, surrounding substances, temperature, and humidity.

Further, FIG. 5 shows an explanatory view of an example of the correction table used in the inspection system of FIG. The correction table 61 shown in FIG. 5 is created in advance, and the reference piece 1
2 shows an example of the tendency of the communicable distance (R: unit is cm) for 2 and the communicable distance (L: unit is cm) for the test piece. Here, the original communicable distance of the reference piece 12 is not influenced by the surrounding environment,
The communicable distance R is changed according to the influence of the surrounding environment on the antenna 33 and the like in the inspection system. For example, the antenna 3 under a certain environment
When the reference piece 12 is measured in 3, the communicable distance R is 35
When it is cm, the inspection piece (the inspection piece prepared for creating the correction table and equivalent to the actual inspection object)
In this case, the communicable distance L under the environment is 30 cm. Further, when the communicable distance R of the reference piece 12 in the antenna 33 under another environment is, for example, 50 cm, the communicable distance L of the inspection piece under that environment is 47 cm.
If it was.

Therefore, a correction value (r: unit is cm) is derived from these tendencies, and when considering the communication distance to the inspection piece 15, the reference piece 12 for each surrounding environment.
By correcting with the correction value with reference to the communicable distance, the communication distance of each test piece can be measured at the same level even if the surrounding environment changes. For example, when the result of measuring the communicable distance to the reference piece 12 is 35 cm, the correction value of 5 cm is corrected in the next measurement of the communicable distance to the inspection piece 15.

Next, FIGS. 6 and 7 show flowcharts of the inspection method in the inspection system of FIG. In FIG. 6, first, when the conveyance drive control unit 50 conveys the target inspection strip 15 to the measurement position according to a command from the control unit 41, the antenna drive control unit 51 moves the antenna 33 downward with respect to the reference strip 12. The drive amount (Y) to be positioned at is output to the Y-direction drive mechanism 84 of the antenna drive unit 32, and
The drive amount (Z1) that determines the distance (R1) between the antenna 33 and the reference piece 12 (antenna 24) is the Z-direction drive mechanism 8.
5 (step (S) 1). In this case, the drive amount (Y) is a predetermined fixed amount, and the drive amount (Z1) is the reference data acquired by the reference data acquisition means 75 of the inspection processing unit 41 from the data memory 43.

Therefore, the transmission data acquisition means 73 in the inspection processing section 42 acquires the transmission data for the reference piece to be written in the memory 22 of the reference piece 12 from the data memory 43, modulates it by the modulation section 46 and modulates it by the power amplification section 45. The transmission data amplified by is transmitted from the antenna 33 to the reference piece 12 (S2). The reference piece 12 demodulates the radio wave received by the antenna 24 and stores the data in the memory 22. The stored data is read out and transmitted from the antenna 24. Therefore, the radio wave of the reply data from the reference piece 12 is received by the antenna 33, demodulated by the detection unit 48, converted into data, and then stored in the data memory 43. And
In the inspection processing unit 42, the received data acquisition means 72 acquires the received data from the data memory 43, the transmission data acquisition means 73 acquires the transmission data, and the determination means 76 performs matching (S3).

As a result of the matching (S4), if they do not match, the drive amount (Z (x)) of the next distance (R (x)) between the antenna 33 and the reference piece 12 in the antenna drive controller 51 as described above. ) Is output to the antenna drive unit 32 (S
5). Therefore, similarly to the above, the transmission data for the reference piece is transmitted again to the reference piece 12 (S6), the reply data from the reference piece 12 is input, and the determination means 76 determines the transmission data and the reception data as described above. Matching is performed (S7). In the matching result (S8), until the matching is S
Repeat 5 to S7.

Then, in S4 or S7, if they match as a result of the matching, the distance between the antennas 24 and 33 (which can be specified by the driving amount (Z (z)) at the time of matching is specified as the communicable distance (R). Then, it is stored in the data memory 43 (S9).

Subsequently, in FIG. 7, the processing means 71 in the inspection processing section 42 reads the distance (R) from the specified reference piece 12 from the data memory 43 and obtains the correction data based on the distance (R). The means 74 acquires the correction value (r) from the correction table 61 (S11). This correction value (r) is sent to the antenna drive controller 5 via the controller 41.
Sent to 1. In the antenna drive control unit 51, the drive amount (Y) for positioning the antenna 33 downward with respect to the inspection piece 15 according to a command from the control unit 41 is set to Y of the antenna drive unit 32.
It outputs to the direction drive mechanism 84 and the antenna 33
Distance from inspection piece 15 (antenna 24) (L = R + r)
The drive amount (Z (x)) that determines the value is output to the Z-direction drive mechanism 85 (S12).

Therefore, similarly to the above, the transmission data (identification information) for individual inspection pieces is acquired from the data memory 43 and transmitted to the inspection piece 15 (S13), and the reply data from the inspection piece 15 is received. As described above, the determination means 76 matches the transmission data and the reception data (S14).
In the matching result (S15), if they match, it is determined to be a good product (S16), and if they do not match, it is determined to be a defective product (S17).
3 (S18).

When the next inspection piece is to be measured (S19), the conveyance drive control unit 50 determines the drive amount with which the next inspection piece 15 should be positioned above the antenna 33 with respect to the conveyance drive unit 31. The data is output (S20), and the above steps S13 to S18 are repeated to determine whether all the test pieces are good or bad and store them in the data memory 43. When the quality of all the inspection pieces is stored in the data memory 43, the inspection result is appropriately displayed on the display means 53 (S21). In addition, the display of the inspection result is displayed for each inspection piece 15 or a predetermined number of inspection pieces 1
You may perform it for every 5 test results.

As described above, since the reference piece 12 is not affected by the surrounding environment, it is possible to specify how much the inspection system 11A is affected by the surrounding environment even if the inspection system 11A is affected by the surrounding environment. Since the communication distance is measured based on the correction distance, the communication distance measurement can be improved. As a result, it is possible to improve the yield without being regarded as a defective product due to the influence of the surrounding environment although it is originally a good product.

In the above-described embodiment, the case where the communication distance to the reference piece 12 shown in FIG. 6 is measured first is shown. However, at each set time of the time setting unit 62 of the correction setting unit 44. You may go and specify the distance (R) each time,
Further, the reference piece 12 may be measured each time the inspection piece 15 is determined to be defective. By doing this,
It is possible to further avoid the influence from the surrounding environment that changes with the time.

In the above embodiment, the correction table 61 is used for correction. However, the correction table 61 can be used without using the correction table. That is, after the distance (R) is specified in FIG. 6, S12-
When performing step S21 (S11 is unnecessary), S1
2 the distance between the antenna 33 and the inspection piece 15 (L =
R). This is especially the case where the reference piece 12 and the object to be the inspection piece are close to each other with no tendency in the communicable distance.

Next, FIG. 8 shows a block diagram of the inspection system in the second embodiment of the present invention. 8, the inspection system 11B is the inspection system 1 shown in FIG.
A probe 101 which is a detecting means for measuring an electric field strength as a radio wave strength is provided near the antenna 33 of the drive structure means 13 in 1A, and a setting section 102 is provided in the inspection processing means 14 in place of the correction setting section 44. The other configuration is the same as that of FIG. 1, and the description is omitted. The RF-ID shown in FIG.

The probe 101 detects the electric field strength when the transmission data is output from the inspection piece 15, and the detected value is converted into the data of "1" and "0" by the data conversion unit 49, and the data memory 43. Memorized in. The setting unit 102 includes a distance setting unit 111 and an electric field strength setting unit 112. The distance setting unit 111 sets the distance when the quality of the inspection piece 15 is determined by measuring the electric field strength while keeping the distance between the antenna 33 and the antenna 24 of the inspection piece 15 constant, and uses the electric field strength as a reference. In this case, the distance data as a criterion for determining the quality of the inspection piece 15 based on the communication distance is set.

Further, the electric field strength setting unit 112 sets the electric field strength for judging the quality of the inspection piece 15 by measuring the communication distance on the basis of the electric field strength by the data transmission from the inspection piece 15. The electric field strength data is set as a reference when judging the quality of the inspection piece 15 by measuring the electric field strength while keeping the communication distance constant.

Next, FIG. 9 shows a block diagram of an example of the inspection processing unit of FIG. Inspection processing unit 42 shown in FIG.
Is the correction data acquisition means 7 of the inspection processing unit 42 shown in FIG.
4 and the reference data acquisition means 75 are replaced with distance data acquisition means 121 and electric field strength data acquisition means 122. This distance data acquisition means 121
The electric field strength data acquisition means 1 is used to acquire reference distance data from the distance setting unit 111 of the setting unit 102.
Reference numeral 22 is for obtaining reference electric field intensity data from the electric field intensity setting unit 112.

Therefore, FIG. 10 shows a flowchart of the inspection method in the inspection system of FIG. FIG. 10 shows a case where the distance between the antenna 33 and the antenna 24 of the inspection piece 15 is kept constant and the electric field strength is measured to determine the quality of the inspection piece 15. In FIG. 10, first, in the antenna drive control unit 51, the inspection piece 15 of the antenna 33 is tested.
The distance data acquisition unit 121 reads the distance (L) from the (antenna 24) from the distance setting unit 111, and outputs the corresponding drive amount (Z (x)) to the Z-direction drive mechanism 85 (S31).

Therefore, when the transmission data (identification information) for each individual inspection piece is acquired from the data memory 43 and transmitted to the inspection piece 15 (S32) in the same manner as described above, the return data from the inspection piece 15 is received. Then, the electric field strength is measured by the probe 101 (S33). The measured electric field strength is once stored in the data memory 43. And the judging means 7
If 6 is larger than the reference field intensity read by the field intensity data acquisition means 122 from the field intensity setting unit 112, the measured field intensity is compared (S34). The inspection piece is determined as a non-defective product (S
35), if it is small, it is determined to be a defective product (S36), and these determination results are stored in the data memory 43 (S3).
7).

Then, when the next inspection piece is to be measured (S38), the drive amount for the conveyance drive control unit 50 to position the next inspection piece 15 above the antenna 33 with respect to the conveyance drive unit 31. The data is output (S39), and the above S32 to S37 are repeated to determine whether all the inspection pieces are good or bad and store them in the data memory 43. When the quality of all the inspection pieces is stored in the data memory 43, the inspection result is appropriately displayed on the display means 53 (S40). In addition, the display of the inspection result is displayed for each inspection piece 15 or a predetermined number of inspection pieces 1
You may perform it for every 5 test results.

Next, FIG. 11 shows a flowchart of another inspection method in the inspection system of FIG. Figure 11
Shows a case where the quality of the inspection piece 15 is determined by measuring the communication distance based on the electric field intensity transmitted from the inspection piece 15. In FIG. 11, first, in the antenna drive control unit 51, the distance data acquisition unit 121 reads out the first distance (L (1)) of the antenna 33 from the inspection piece 15 (antenna 24) from the distance setting unit 111, and reads it. The corresponding drive amount (Z (x)) is output to the Z-direction drive mechanism 85 (S41).

Therefore, when the transmission data (identification information) for each individual inspection piece is acquired from the data memory 43 and transmitted to the inspection piece 15 (S42), the return data from the inspection piece 15 is received as described above. Then, the electric field strength is measured by the probe 101 (S43). Then, the determination unit 76 compares the measured electric field intensity with the reference electric field intensity read by the electric field intensity data acquisition unit 122 from the electric field intensity setting unit 112 (S44). If the distance is small, the distance data acquisition unit 121 reads the next distance (L (x)) from the inspection piece 15 (antenna 24) of the antenna 33 from the distance setting unit 111, and the driving amount (Z (x) corresponding thereto is read. )) Is output to the Z-direction drive mechanism 85 (S45).

Subsequently, similarly to the above, the transmission data (identification information) for individual inspection pieces is acquired from the data memory 43 and transmitted to the inspection piece 15 (S46), and the reply data from the inspection piece 15 is received. At this time, the electric field strength is measured by the probe 101 (S47). Then, the determination unit 76 compares the reference field intensity read by the field intensity data acquisition unit 122 from the field intensity setting unit 112 with the measured field intensity (S48), and determines the reference field intensity from the set value. If it is small, S45 to S48 are repeated at all the set distances, and if the electric field strength measured at all the set distances is smaller than the reference, the inspection piece 15 is determined to be defective as described later (S52). ).

On the other hand, if the measured electric field strength is larger than the reference in S44 and S48, it is determined whether the communication distance (L (x)) at that time is set by the distance setting unit 111 and is larger than the reference distance. Is determined (S50). If the communication distance (L (x)) is larger than the reference, the inspection piece 1
5 is determined to be a non-defective product (S51), and if it is small, it is determined to be a defective product (S52), and these determination results are stored in the data memory 43 (S53).

When the next inspection strip is to be measured (S54), the transport drive control unit 50 determines the drive amount with which the next inspection strip 15 should be positioned above the antenna 33 with respect to the transport drive unit 31. The data is output (S55), and the above steps S42 to S53 are repeated to determine whether all the test pieces are good or bad and store them in the data memory 43. When the quality of all the inspection pieces is stored in the data memory 43, the inspection result is appropriately displayed on the display means 53 (S56). In addition, the display of the inspection result is displayed for each inspection piece 15 or a predetermined number of inspection pieces 1
You may perform it for every 5 test results.

As described above, since the quality of the communication state of the test piece can be determined by the relative relationship between the radio field intensity and the communication distance, the measurement of the communication distance and the yield can be improved. is there. In the second embodiment, the electric field strength is measured as one of the radio wave strengths, but the magnetic field strength may be measured.

[0054]

As described above, according to the inventions of claims 1 to 5, a reference piece which has the same structure as the inspection piece of the RF-ID to be inspected and which is not influenced by the surrounding environment is used. By identifying the first element in the communication result and determining whether or not communication is possible using the first element in the communication inspection with the inspection piece, it is possible to improve the measurement of the communication distance. The yield can be improved.

According to the fourth and sixth aspects of the invention, the second element of the radio wave intensity or communication distance that enables communication with the inspection piece is specified, and the communication distance or the radio wave strength of the inspection piece is determined. It is possible to improve the measurement of the communication distance and, in turn, the yield by determining the quality of the test piece by performing communication with the same one element and measuring the second element. is there.

[Brief description of drawings]

FIG. 1 is a block configuration diagram of an inspection system according to a first embodiment of the present invention.

FIG. 2 is a block configuration diagram of an example of an inspection processing unit in FIG.

3 is a schematic diagram of the inspection system of FIG.

FIG. 4 is an explanatory diagram of an inspection piece to be inspected and a reference piece to be used.

5 is an explanatory diagram of an example of a correction table used in the inspection system of FIG.

6 is a flowchart (1) of the inspection method in the inspection system of FIG.

7 is a flowchart (2) of the inspection method in the inspection system of FIG.

FIG. 8 is a block configuration diagram of an inspection system according to a second embodiment of the present invention.

9 is a block configuration diagram of an example of an inspection processing unit in FIG.

10 is a flowchart of an inspection method in the inspection system of FIG.

11 is a flowchart of another inspection method in the inspection system of FIG.

[Explanation of symbols]

11A, 11B RF-ID inspection system 12 standard pieces 13 Drive structure means 14 Inspection processing means 15 Inspection pieces 24, 33 antennas 41 Control unit 42 Inspection processing unit 43 data memory 44 Correction setting section 49 Data converter 50 Transport drive controller 51 Antenna drive controller 52 IF section 53 display 61 Correction table 62 hours setting section 71 processing means 76 Judgment means 81 Roll inspection piece 82A, 82B measuring table 84 Y direction drive mechanism 85 Z-direction drive mechanism 101 probe 102 setting section 111 Distance setting section 112 Electric field strength setting section

Claims (6)

[Claims] 1. A reference piece which has the same structure as an RF-ID inspection piece including an IC module and an antenna to be inspected and which is not affected by the surrounding environment is prepared, and the reference piece and the inspection piece are communicated by a transmission / reception inspection system. And a step of identifying the first element when the transmission / reception inspection system communicates with the reference piece to enable communication, and the transmission / reception inspection system A step of performing communication with the test piece based on the first element and measuring a communication state, and a step of determining pass / fail depending on whether the test piece is communicable or not based on the measurement result. An RF-ID inspection method characterized by the following. 2. The RF-ID inspection method according to claim 1, wherein the first element is a distance between the antenna of the inspection piece and the antenna of the transmission / reception inspection system, and the reference piece is previously set. A communicable state with an RF-ID as a test piece is measured, and correction distances due to mutual tendencies are created as a table. When measuring the communication state of the test piece, communication corrected with the correction distance is performed. An RF-ID inspection method, which is performed at a distance. 3. The RF-ID inspection method according to claim 1, wherein the first element is a distance between the antenna of the inspection piece and the antenna of the transmission / reception inspection system, and communication with the reference piece. An RF-ID inspection method, characterized in that the communication state of the inspection piece is measured at the distance specified in (4). 4. An inspection method for inspecting quality by performing communication with an RF-ID inspection piece having an IC module and an antenna as an inspection target by a transmission / reception inspection system, wherein the transmission / reception inspection system performs the inspection. A step of identifying a second element of a radio wave intensity or a communication distance at which communication is possible when performing communication with the piece; 1 is used as a reference to perform communication, and the second element is measured; and a step of determining pass / fail depending on whether or not the test piece is communicable with the second element of the measurement result. An RF-ID inspection method characterized by the following. 5. A reference piece having the same structure as an RF-ID inspection piece having an IC module and an antenna to be inspected, which is not affected by the surrounding environment, is prepared, and communication is performed with the reference piece and the inspection piece. An inspection system for inspecting, comprising: an antenna for communication; a drive unit for moving the antenna to communicate with the antennas of the reference piece and the inspection piece; An RF-ID inspection system, comprising: 6. An inspection system for inspecting quality by performing communication with an RF-ID inspection piece having an IC module and an antenna as an inspection target, wherein an antenna for communication and the antenna are provided. A driving unit that moves to communicate with the antenna of the inspection piece; a detection unit that detects a transmission state from the inspection piece; and a processing unit that performs quality determination by the inspection method according to claim 4. An RF-ID inspection system characterized by comprising at least.