JP2002313850A - Tape carrier package and its manufacturing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To propose a tape carrier package(TCP) by which anti-electrostatic measures during manufacturing can be sufficiently taken and continuity test can be performed. SOLUTION: The TCP is provided with input terminals 3 which are placed on a base film 2 carrying a driving LSI 8 and along the direction of the length of the driving LSI 8, output terminals 4 which are placed on the opposite side of the input terminals 3 across the driving LSI 8 and have a smaller width than that of the input terminals 3, first wiring 5 for connecting between the input terminals 3 and the driving LSI 8, second wiring 6 for connecting the output terminals 4 and the driving LSI 8, third wiring 7 for directly connecting between the input terminals 3 and the output terminal 4, discharge electrodes 10 and 11 which are formed on the periphery of the base film 2 and short- circuiting sections 13 for electrically connecting the third wiring 7 to the discharge electrodes 10 and 11.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tape carrier package on which a semiconductor element such as a driving LSI used for a liquid crystal display device is mounted.

[0002]

2. Description of the Related Art In general, a liquid crystal display device can be reduced in size and thickness, and thus is widely used from portable terminals to televisions. These liquid crystal display devices are required to have a narrower frame, and the liquid crystal panel is a flexible TCP (tape car).
(Driver package). A conventional TCP 50 will be described with reference to FIG. FIG. 10 shows the TCP 50 in the course of manufacture, which is cut along the dotted line (cutting line) in FIG. 10 and separated individually. Reference numeral 51 denotes a flexible polyimide-based base film. A copper foil is laminated on the base film 51 via an adhesive, and the copper foil is patterned to form the terminal portions 53 and 54 and each wiring 5.
5, 56 and 57 are formed. 53 is an input terminal connected to a PWB (printed wiring board) substrate having a control circuit, 54 is an output terminal connected to a liquid crystal panel, 55
Is a wiring connecting the input terminal of the driving LSI 58 to the input terminal 53, 56 is a wiring connecting the output terminal of the driving LSI 58 to the output terminal 54, and 57 is an output from the input terminal 53 without the intervention of the driving LSI 58. This is a wiring for directly connecting the terminal portion 54. When this TCP 50 is connected to a liquid crystal panel, control signals and data signals from the PWB substrate are
Is input to the driving LSI 58 through the
After the signal processing in step 8, the signal is output to the liquid crystal panel via the wiring 56. In addition, signals and power supplies that do not require signal processing in the driving LSI 8 are supplied from the PWB substrate to the liquid crystal panel via the wiring 57. In this conventional example, three wires 57 not connected to the driving LSI 8 are provided on both sides of the TCP 50, and the wires 57a, 57b, and 57c are sequentially provided from the outside.

FIG. 11 is an enlarged view of a region A in FIG.
FIG. 6 is an enlarged view of a main part of a tip end portion of an input terminal unit 53 connected to a wiring 57. Input terminal section 53 connected to wirings 55 and 57
Inspection terminals 6 to which the prober for inspection can contact
0 is provided, and the inspection terminals 53 are arranged in a straight line. The inspection terminal 60a is connected to the wiring 57a through the input terminal 53a, the inspection terminal 60b is connected to the wiring 57b through the input terminal 53b, and the inspection terminal 60c is connected to the input terminal 53.
The test terminal 60d is connected to the corresponding wiring 55 through the input terminal portion 53d. The input terminals 53 and the inspection terminals 60 are formed separately from each other so as not to be electrically short-circuited with the other terminals 60 and 53, and are independent from each other.

FIG. 12 is an enlarged view of a region B in FIG.
FIG. 5 is an enlarged view of a main part of a tip end portion of an output terminal portion connected to a wiring. The inspection terminal 6 is also provided at the tip of the output terminal portion 54.
1 is provided, but TCP5 used for the liquid crystal display device is provided.
In the case of 0, the number of the output terminal portions 54 is larger than that of the input terminal portions 53. Therefore, the inspection terminals 61 on the output terminal portion side are not arranged side by side on a straight line, but are arranged in a dense manner. The wiring 57 is branched and connected to the two output terminals 54, respectively. The output terminal 54a connected to the wiring 57a is an inspection terminal 61a, and the output terminal 54b connected to the wiring 57b is an output connected to the inspection terminal 61b and the wiring 57c. Terminal 54
c is connected to each of the inspection terminals 61c. The wiring 56 connected to the driving LSI 8 is connected to the corresponding one of the output terminals 54d and the inspection terminal 61d. Then, three inspection terminals 61 connected to the wirings 57a and 57b
The test terminals 61a and 61b are arranged along the extension direction of the output terminal portion 54, and the inspection terminals 61d connected to the wiring 56 are also arranged side by side in the extension direction of the output terminal portion 54 as a set of three predetermined terminals. Then, the inspection terminals 61a and 61b and the inspection terminal 61
d are arranged adjacently at an interval α, and the inspection terminal 61c of the wiring 57c is arranged between the output terminal portion 57b and the output terminal portion 57d. When conducting the continuity inspection of the wirings 55, 56, and 57, the inspection is performed with the prober applied to all the inspection terminals 60 and 61 at the same time, and it is checked whether the wiring is disconnected.

[0005] 52 is a sprocket hole formed along both ends of the base film 51, 59 is a discharge electrode formed at both ends of the base film 51 including the sprocket hole 52, the discharge electrode 59 is a wiring 55, 5
6 and 57 and the terminal portions 53 and 54 are formed of the same material. The base film 51 is easily charged with static electricity.
The static electricity generated in the manufacturing process of the CP 50 is
Is applied to the driving LSI 58 through the
8 was well destroyed. So sprocket hole 5
By providing the discharge electrode 59 around 9, the discharge electrode 59 and the driving sprocket of the transfer device come into contact during the manufacturing process, and the static electricity charged on the base film 51 through the sprocket is removed. The structure in which such a discharge electrode 59 is provided is described in, for example, JP-A-2-25047 and JP-A-3-25047.
-79053. In addition, as a countermeasure against static electricity, there is a configuration in which a terminal connected to the driving LSI 58 is electrically connected to the discharging electrode 59 so that an excessive voltage is not applied to the driving LSI 58. This is described in, for example, JP-A-5-90333, JP-A-3-129746, and JP-A-9-283572.

[0006]

However, merely providing the discharge electrodes 59 at both ends of the bale film 51 does not provide sufficient countermeasures against static electricity.
8 was destroyed in many cases. Also, the terminal portions 53 and 54 connected to the driving LSI 58 are connected to the discharge electrodes 5.
9, the wiring 55 of the terminal portions 53 and 54,
Since the wiring 56 was short-circuited through the discharge electrode 59, the continuity of the wirings 55 and 56 could not be inspected. In addition, when the connection with the discharge electrode 59 is released in order to inspect the continuity of the wirings 55 and 56, no countermeasure against static electricity can be taken in the subsequent manufacturing process.

The applicant of the present invention has analyzed the state of the driving LSI 58 destroyed by static electricity in detail, and has found that the inspection terminals 6a, 61b, 61c of the wiring 57 are close to the inspection terminals 61a, 61b, 61c.
It was found that the portion connected to the 1d wiring 56 was frequently destroyed. This is because the wiring 57 having a larger area than the other wirings 55 and 56 easily picks up static electricity, and the inspection terminals 61a, 61b and 61c of the output terminal portion 54 and the inspection terminal 61d are close to each other, so that the static electricity flowing to the wiring 57 is reduced. Is flowing to the wiring 56 via the inspection terminal 61 and the driving LSI 58 is destroyed. Of the plurality of wirings 57, the outermost wiring 57a particularly easily picks up static electricity, and the driving LSI 58
Of the failures described above, 60% or more of the failures occurred at the portion connected to the wiring 56 of the inspection terminal 61d adjacent to the inspection terminal 61a of the wiring 57a.

Accordingly, an object of the present invention is to propose a TCP capable of sufficiently performing a countermeasure against static electricity and enabling a continuity test.

[0009]

SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention provides an insulating film, a substantially rectangular semiconductor device mounted on the film, and a semiconductor device arranged along the longitudinal direction of the semiconductor device. A plurality of first terminal portions, a plurality of second terminal portions arranged on the opposite side of the first terminal portion across the semiconductor element and having a smaller terminal width than the first terminal portions, and a first terminal located inside First part for electrically connecting the part and the semiconductor element
The wiring, the second wiring electrically connecting the second terminal portion located inside and the semiconductor element, and the first terminal portion located outside and the second terminal portion located outside without the semiconductor element interposed therebetween It is characterized by comprising a third wiring for direct connection, a conductive discharge electrode formed on the periphery of the film, and a short-circuit portion for electrically connecting the third wiring to the discharge electrode.

Therefore, even if static electricity charged on the film flows through the third wiring during the manufacture of TCP, the static electricity can be removed through the discharge electrode, so that static electricity does not flow into the semiconductor element.
Destruction of the semiconductor element can be prevented. Further, since each wiring connected to the semiconductor element is separated and independent from the discharge electrode, a continuity test of each wiring can be performed during manufacturing.

Further, according to the present invention, an inspection terminal is formed at the tip of the first terminal portion and the second terminal portion, and discharge is performed to either the first terminal portion or the second terminal portion connected to the third wiring. And a short-circuit portion connected to the application electrode is provided. Therefore, the continuity inspection of the third wiring can be performed in a state where the third wiring is short-circuited with the discharge electrode, and further, a countermeasure against static electricity after the continuity inspection can be performed.

Further, according to the present invention, an inspection terminal larger than the terminal width of the second terminal portion is formed at the tip of the second terminal portion, and the inspection terminals are densely arranged for each of a plurality of inspection terminals to inspect the third wiring. In the tape carrier package in which the terminals are arranged adjacent to the inspection terminal of the second wiring, the distance between the inspection terminal of the third wiring located at the outermost position and the inspection terminal of the second wiring adjacent to the inspection terminal is changed to another. The distance between the inspection terminal of the third wiring and the inspection terminal of the second wiring adjacent to the inspection terminal is wider.

Accordingly, it is possible to prevent static electricity from flowing from the third wiring, which is most liable to pick up static electricity, to the second wiring through the inspection terminal of the second terminal portion, and to prevent destruction of the semiconductor element during manufacture.

According to the present invention, a plurality of first terminals are provided as a conductive pattern formed on an insulating film.
A plurality of second terminal portions having a terminal width smaller than the first terminal portion;
A first wiring electrically connecting the first terminal portion located inside and the semiconductor element; a second wiring electrically connecting the second terminal portion located inside and the semiconductor element; and a first wiring lying outside.
A third wiring for directly connecting the terminal to the second terminal located outside, a conductive discharge electrode formed on the periphery of the film, and an electrical connection between the third wiring and the discharge electrode; The short-circuit portion and the short-circuit portion are formed in the same step. Accordingly, the discharge electrode and the short-circuit portion can be easily formed without increasing the number of steps, and the discharge electrode and the short-circuit portion can be formed of the same material as the third wiring and each terminal portion. Electrode conduction can be ensured.

[0015]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 shows a TCP 1 according to the first embodiment.
FIG. FIG. 1 shows a state in the course of manufacture,
In the final step, cut along the dotted line in FIG.
1

Reference numeral 2 denotes a flexible base film, which is formed of a film of polyimide, polyester, or the like having a width of 35 mm and a thickness of 75 μm. An adhesive is applied on the base film 2 and then a copper foil is laminated. The copper foil is patterned by etching or the like to form arbitrary terminal portions 3 and 4 and wirings 5, 6 and 7. The wiring may be made of a material other than copper, or may be plated with aluminum or tin on a copper foil. Reference numeral 3 denotes an input terminal which is a first terminal connected to PWB boards 18 and 19 provided with an external control circuit, and 4 denotes input terminals 21 and 2 on the liquid crystal panel 15.
2 electrically connected to the second by an anisotropic conductive adhesive or the like.
An output terminal unit 5 serving as a terminal unit is a first wiring connecting the input terminal unit 3 located inside and the driving LSI 8, and a second wiring 6 connecting the output terminal unit 4 located inside and the driving LSI 8. Reference numerals 7 denote third wirings for connecting the outer input terminal 3 and the outer output terminal 4 without using the driving LSI 8.
In this embodiment, three third wires 7 for directly connecting the input terminal portion 3 and the output terminal portion 4 are provided on both sides of the TCP 1, respectively, and are referred to as 7a, 7b, and 7c from the outside. The wirings 5 and 6 are provided with gold bumps at portions connected to the driving LSI 8, and are electrically connected to connection terminals of the driving LSI 8 via the gold bumps. The wirings 5, 6, 7 are covered with a solder resist, and the connection between the driving LSI 8 and the wirings 5, 6 is covered with a sealing resin. Note that a plurality of horizontally long slits may be formed at appropriate positions on the base film 2 in order to easily bend the TCP 1.

A plurality of sprocket holes 9 are provided on both sides of the base film 2, and strip-shaped first discharge electrodes 10 are formed on both side ends of the base film 1 including the periphery of the sprocket holes 9. The second discharge electrode 11 electrically connected to the first discharge electrode 10 is a TCP1.
Are arranged at a predetermined distance from the input terminal unit 3. The discharge electrodes 10 and 11 are formed as a series of electrodes by etching a copper foil, and are formed simultaneously with the terminal portions 3 and 4 and the wirings 5, 6 and 7. Then, the sprocket of the transfer device comes into contact with the first discharge electrode 10 during the manufacture of the TCP 1, and the static electricity charged on the base film 2 is discharged through the first discharge electrode 10 and the sprocket. Note that the first discharge electrode 10 need not be present all around the sprocket hole 9 as long as it can come into contact with the sprocket. For example, a belt-like shape is formed between the sprocket hole 9 and the cutting line (dotted line in FIG. 1). May be formed.

FIG. 2 is an enlarged view of the area A in FIG.
FIG. 4 is an enlarged view of a tip portion of an input terminal unit 3 connected to a wiring 7. An inspection terminal 12 which is slightly wider than the input terminal portion 3 is formed at a tip portion of each input terminal portion 3, and an inspection prober can abut on each of them independently. Since the lengths of the input terminals 3 including the part to be cut are substantially the same, the inspection terminals 12 are arranged in a line in a direction orthogonal to the direction in which the input terminals 3 extend. Since the terminal width of the input terminal portion 3 and the interval between the terminals are limited, the inspection terminal portions may be arranged in a zigzag manner in order to make the inspection terminal 12 as large as possible within the limited area. . In this embodiment, the input terminal 3a is connected to the third wiring 7a, the input terminal 3b is connected to the third wiring 7b, the input terminal 3c is connected to the third wiring 7c, and the input terminal 3d is connected to the first wiring 5a.
Is connected to Input terminal section 3 connected to third wiring 7
a, 3b, 3c, a short-circuit portion 13 communicating with the second discharge electrode 11 is formed, and the input terminal portion 3 connected to the first wiring 5 is formed.
d is independent from the second discharge electrode. In the present invention, it is important that the third wiring 7 is electrically connected to the discharge electrodes 10 and 11.
Alternatively, a short-circuit portion may be formed between the input terminal portion 3a and the first discharge electrode 10, but if a continuity test of the third wiring 7 described later is considered, the connection between the test terminal 12a and the discharge electrodes 10 and 11 may be made. It is desirable to form a short-circuit portion 13 between them.

FIG. 3 is an enlarged view of the area B in FIG.
FIG. 3 is an enlarged view of a tip portion of an output terminal unit 4 connected to a wiring 7. An inspection terminal 14 which is considerably larger than the terminal width of the output terminal portion 4 is formed at the tip of each output terminal portion 4, and each of the inspection terminals 14 can be brought into contact with an inspection prober. Generally, in the TCP 1 used for the liquid crystal display device, the number of the output terminal portions 4 is larger than that of the input terminal portion 3, and the terminal width is correspondingly narrow. However, since the inspection terminals 14 need to be large enough to allow the inspection probers to individually contact each other, the inspection terminals 14 on the output terminal portion 4 side are arranged in a straight line like the input terminal portion 3 side. Instead, they are densely arranged several by one in the extension direction of the output terminal unit 4. In this embodiment, eight test terminals 14 are set as one set, and two test terminals 14 at the center are arranged side by side in the direction of extension of the output terminal portion 4, and six test terminals 14 located outside the two test terminals 14 are arranged. The inspection terminal 14 is disposed on the tip side of the inspection terminal 14 at the center. Of the six test terminals 14, three test terminals 14 to which the output terminal portion 4 is adjacent
Are arranged side by side in the direction in which the output terminal section 4 extends. And 8
Test terminal 1 located at the outermost position among the test terminals 14
4 are opposed to each other, and similarly, the second inspection terminals 14 from the outside and the third inspection terminals 14 from the outside are opposed to each other and approach each other.

The first wirings 5 are connected to the corresponding one of the output terminals 4, respectively, while the third wirings 7 are each branched into two and connected to the two output terminals 4. The inspection terminal 14a is connected to the third wiring 7a via the output terminal 4a.
The inspection terminal 14b is connected to the third wiring 7b via the output terminal 4b.
Further, the inspection terminal 14c is connected to the third wiring 7c via the output terminal portion 4c, and the inspection terminal 14d is connected to the second wiring 6 via the corresponding output terminal 4d. Then, the inspection terminals 14a, 14 connected to the third wirings 7a, 7b
b is adjacent to the inspection terminal 14d connected to the second wiring 6, and the distance between the inspection terminal 14a and the inspection terminal 14d of the third wiring 7a located on the outermost side is larger than the distance between the inspection terminal 14b and the inspection terminal 14d of the third wiring 7b. Is also set to be wide. In this embodiment, the inspection terminals 14b and 14d
Is the interval between the test terminals 14a and 14a.
It is effective to set the interval of d to 2α or more. Third wiring 7
Inspection terminals 14a, 14b and the inspection terminals 14 of the second wiring 6
If the distance d is small, the static electricity flowing through the third wiring 7 flows to the second wiring 6 through the adjacent inspection terminal portion.
Therefore, the second inspection terminal 14a of the third wiring 7a which is most involved in the destruction of the driving LSI 8 is connected to the driving LSI 8.
By separating the wiring 6 from the inspection terminal 14d, a countermeasure against static electricity can be effectively performed. Note that the inspection terminal 14 is used to prevent static electricity.
a and the inspection terminal 14d should be separated as much as possible. However, since the arrangement of the inspection prober is predetermined in the existing continuity inspection device, if the layout of the inspection terminal 14 is largely changed, the prober may You won't hit 14. Therefore, it is better to change the arrangement of the inspection terminals 14 within a range where the prober of the existing continuity inspection device hits.

When the continuity test of the TCP 1 is performed, a test prober is applied to all the test terminals 12 and 14 for the test. At this time, since the terminal portions 3 and 4 of the wirings 5 and 6 connected to the driving LSI 8 are independent from each other without being connected to the discharge electrodes 10 and 11, the continuity inspection of the wirings 5 and 6 becomes possible. Further, when conducting continuity inspection of the third wiring 7, for example, when conducting continuity inspection of the third wiring 7 a, the prober contacted with the inspection terminal 12 a connected to the input terminal 3 a and the test terminal 14 a connected with the output terminal 4 a. An electric current is passed between the probe and the prober to check whether the third wiring 7a is disconnected. Since the third wiring 7 is connected to the discharge electrode 11 only at the short-circuit portion 13 formed on the inspection terminal 12 on the input terminal portion 3 side, the continuity test of the third wiring 7 can be performed without cutting the short-circuit portion 13. it can. The test terminals 14 on the output terminal portion 4 side instead of the input terminal portion 3 side may be provided with a short-circuit portion to be connected to the discharge electrode 11, but the test terminals 14 on the output terminal portion 4 side are densely arranged. Therefore, the layout of each terminal is simplified when the short-circuit portion to the discharge electrode 11 is provided on the input terminal portion 3 side.

FIG. 4 shows a state when the TCP 1 is connected to the liquid crystal panel 15. The liquid crystal panel is composed of two glass substrates 1
6 and 17 are bonded together, and liquid crystal is sealed between the glass substrates 16 and 17. On one glass substrate 16, a plurality of scanning lines and a plurality of signal lines are wired in a matrix, and a TFT which is a switching element is provided at an intersection of each line, and a pixel electrode connected to the TFT is provided in a pixel surrounded by each line. Is provided. A counter electrode is formed on the entire surface of the other glass substrate 17, and the arrangement state of the liquid crystal is changed by an electric field between the pixel electrode and the counter electrode. An input terminal 21 of a signal line is provided on a long side portion of the glass substrate 16, and an input terminal 22 of a scanning line is provided on a short side portion. Each of the input terminals 21 and 22 is connected to the PWB substrate 18 via a plurality of TCPs 1. Connect to 19. Then, the image data signal is transmitted from the PWB substrate 18 to the TCP.
1 driving terminal 8 via the first input terminal 3 and the first wiring 5
After the signal is processed by the driving LSI 8, the signal is output to the signal line of the liquid crystal panel 15 via the second wiring 6 and the output terminal unit 4, and the scanning signal from the PWB substrate 19 is sent to the first of the TCP 1.
The signal is output to the scanning line of the liquid crystal panel 15 through the wiring 5, the driving LSI 8, and the second wiring 6. Further, an arbitrary voltage is supplied to the opposing electrode of the liquid crystal panel 15 through the third wiring 7 of the outermost TCP 1 among the TCPs 1 connected in a line to the liquid crystal panel 15. The third wiring 7 of the TCP 1 is mainly used for directly supplying a power supply, a signal not subjected to signal processing by the driving LSI 8 and the like from the PWB substrates 18 and 19 to the liquid crystal panel 15. Note that it is not necessary to use the third wires 7 of all the TCPs 1 connected to the liquid crystal panel 15, and a mode in which only some of the third wires 7 of the TCP 1 are used may be used.

In this embodiment, the inspection terminal 12 of the input terminal portion 3 connected to the third wiring 7 is provided with the short-circuit portion 13 connected to the discharge electrode 11, and the third outermost portion is connected to the third terminal 7.
The case where the inspection terminal 14a of the output terminal portion 4a of the wiring 7a is arranged as far as possible from the inspection terminal 14d of the output terminal portion 4d connected to the second wiring 6 has been described. Input terminal part 3 in the same form as
A sufficient effect can be obtained only by short-circuiting the inspection terminals 12a, 12b, and 12c of a, 3b, and 3c and the discharge electrode 11.
Inspection terminals 12a, 12 of input terminal portions 3a, 3b, 3c
In the case of TCP1 in which b and 12c were short-circuited to the discharge electrode 11, the driving LSI 8 was not destroyed by static electricity during manufacturing, and the yield was greatly improved. Further, in this embodiment, all of the third wirings 7 not connected to the driving LSI 8 are short-circuited to the discharge electrode 11, but even if only the outermost third wiring 7a is short-circuited to the discharge electrode 11, the present invention can be applied. The effect is obtained. This is because the outermost third wiring 7a most easily picks up static electricity and is deeply related to the cause of the destruction of the driving LSI 8, so that short-circuiting of the third wiring 7a can considerably prevent the destruction of the driving LSI 8. . In this embodiment, when the TCP 1 is connected to the liquid crystal panel 15,
In order to utilize the third wiring 7 for supplying signals and the like, T
A continuity inspection of the third wiring 7 is required during the manufacture of CP1.
Therefore, the inspection terminals 12a of the input terminal portions 3a, 3b, 3c,
By providing the short-circuit portion 13 connected to the discharge electrode 11 only in 12b and 12c, it is possible to realize the TCP 1 that can perform the continuity test of the third wiring 7 while taking the countermeasures against static electricity of the driving LSI 8.

Next, a second embodiment will be described with reference to FIG. The second embodiment differs from the first embodiment in the form of the first discharge electrode, but has the same other configuration, and the same parts are denoted by the same reference numerals as in the first embodiment. FIG. 5 shows the second
It is a top view of an embodiment. In this embodiment, a band-shaped first discharge electrode 10A is provided on one side of the base film 2, and the first discharge electrode 10A does not exist on the other side. Although the first discharge electrode 10A does not exist in the sprocket hole 9, the static electricity charged on the base film 2 by contact with the sprocket of the transfer device can be removed in the manufacturing process. This embodiment is effective when the first discharge electrode 10A cannot be provided on both sides due to the restriction of the width of the base film 2. Between each TCP1, a second discharge electrode 11A branched from the first discharge electrode 10A
Is formed, and the third wiring 7 is provided on the second discharge electrode 11A.
The inspection terminals 12 of the input terminal portions 3a, 3b, and 3c are connected by a short-circuit portion 13. Since the third wiring 7 is present on both sides of the TCP 1, the second discharge electrode 11A is present over the entire width of the input terminal portion 3 on the tip side thereof, and the third wiring 7 on both sides is provided on the second discharge electrode 11A. Short circuit in common. The discharge electrodes 10A and 11A of this embodiment are also formed in the same process as the wirings 5, 6, and 7 and the terminal portions 3 and 4 on the base film 2 as in the first embodiment. When static electricity charged on the base film 2 flows to the third wiring 7 during manufacturing, the static electricity is transferred to the second discharge electrode 1 through the short-circuit portion 13.
1A, which flows to the first discharge electrode 10A and is prevented from flowing to the driving LSI 8.

Next, a third embodiment will be described with reference to FIG. The third embodiment differs from the first embodiment in the form of the second discharge electrode, but has the same other configuration, and the same parts are denoted by the same reference numerals as in the first embodiment. FIG. 6 shows the third
It is a top view of an embodiment. This second discharge electrode 11B
Extend from the first discharge electrodes 10B at both ends of the base film 2 to the vicinity of the tips of the input terminals 3a, 3b, 3c of the third wiring 7, and the inspection terminals 12 of the input terminals 3a, 3b, 3c.
a, 12b, and 12c via a short-circuit portion 13. Therefore, when static electricity charged on the base film 2 flows through the third wiring 7 in the manufacturing process, the static electricity is discharged to the inspection terminal 12.
It can be removed by flowing to the second discharge electrode 11B and the first discharge electrode 10B via the short-circuit portion 13 of a, 12b, and 12c.
In this embodiment, the wirings 5 and 6 connected to the driving LSI 8 are used.
Since the second discharge electrode 11B does not exist at the tip of the terminal portions 3 and 4, the second discharge electrode 11B and the terminal portions 5 and 6 are short-circuited due to insufficient etching when forming the wirings 5, 6, 7 and the like. The continuity inspection of each of the wirings 3 and 4 can be reliably performed without fear of occurrence. Further, since the region where the second discharge electrode 11B is present on the base film 2 is reduced, the second discharge electrode 11B does not become an obstacle when the base film 2 is bent during manufacturing.

Next, a fourth embodiment will be described with reference to FIG. The fourth embodiment differs from the first embodiment in the arrangement of the inspection terminals 14a, 14b, and 14c of the third wiring 7 and the form of the second discharge electrode 11, but the other configurations are the same. The same reference numerals as in the first embodiment are used. FIG. 7 is a plan view of the third embodiment, and FIG. 8 is an output terminal portion 4a, 4b, 4c connected to the third wiring 7 indicated by a region B in FIG.
It is an enlarged view of the tip part of. In this embodiment, similarly to the first embodiment, three third wirings 7 which are not connected to the driving LSI 8 are provided, and the output side of each third wiring 7 branches to two output terminal portions 4a, 4b, 4c. linked. The inspection terminal 14a is connected to the third wiring 7a via the output terminal 4a.
The inspection terminal 14b is connected to the third wiring 7b via the output terminal 4b.
The inspection terminals 14c are connected to the third wirings 7c via the output terminal portions 4c. Between the inspection terminals 14a and 14b connected to the third wirings 7a and 7b and the inspection terminal 14d connected to the second wiring 6, a third discharge electrode 20 branched and extended from the second discharge electrode 11C is arranged. At this time, by setting the interval between the inspection terminals 14a, 14b and the inspection terminal 14d within a range where the prober of the existing continuity inspection device hits,
It is not necessary to change the arrangement of the prober of the continuity inspection device.

When the static electricity charged on the base film 2 flows to the third wiring 7, the input terminal 3 of the third wiring 7
Test terminal 12 and second discharge electrode 11C are short-circuited 13
, The static electricity of the third wiring 7 is discharged to the sprocket of the transfer device through the discharge electrodes 10C and 11C. Further, even if the static electricity flows to the inspection terminal 14a of the output terminal portion 4a of the third wiring 7a, the static electricity does not flow to the third discharge electrode 2a.
0 to the second discharging electrode 11C, static electricity flows from the inspection terminal 14d to the wiring 4d, and the driving LSI
8 can be prevented from being broken.

Next, a fifth embodiment will be described with reference to FIG. The fifth embodiment is different from the first embodiment in the form of the inspection terminals 12 and 14 connected to the third wiring 7, but the other configurations are the same, and the same parts are denoted by the same reference numerals as those in the first embodiment. Is attached. FIG. 9 is an enlarged view of the inspection terminals 12 and 14 connected to the third wiring 7. In this embodiment, the third
Inspection terminal 1 on output terminal portions 4a, 4b side of wires 7a, 7b
4a, 14b and the second discharge electrode 11 are electrically connected via the short-circuit part 23, and the short-circuit part 13 connected to the second discharge electrode 11 only to the inspection terminal 12c of the input terminal part 3c of the third wiring 7c. Are formed. The static electricity flowing through the third wiring 7a during manufacturing is easily transferred from the inspection terminal 14a of the output terminal portion 4a to the adjacent inspection terminal 14d, and the static electricity flows to the second wiring 6 through the inspection terminal 14d.
When static electricity is generated on the output terminal section 4a side of a, when a short-circuit section 13 is formed on the inspection terminal 12a of the input terminal section 3a, the line impedance between the place where the static electricity is generated and the short-circuit section 13 increases. Inspection terminal 14 of output terminal portion 4a
In the case where the short-circuit portion 23 is formed, the line impedance between the location where the static electricity is generated and the short-circuit portion 23 becomes small, so that the static electricity easily flows to the second discharge electrode 11 and the second wiring 6
Static electricity can be prevented from flowing through. In addition, inspection terminal 1
If the electrodes 4a and 14b are short-circuited to the second discharge electrode 11, the inspection terminal 14a does not have to be arranged apart from the inspection terminal 14d of the second wiring 6, and the inspection prober of the conventional continuity inspection device is surely inspected. The terminals can be brought into contact with the terminals 14a and 14b.

In this embodiment, the third wirings 7a, 7b
Are short-circuited to the second discharge electrode 11, but only the test terminal 14a of the third wiring 7a is short-circuited to the second discharge electrode 11, or all the third wirings 7a, 7b
The inspection terminals 14a, 14b, 14c of b, 7c may be short-circuited to the second discharge electrode. At this time, the output terminal section 4
The third wiring 7 in which the inspection terminal 14 is short-circuited is separated from the second discharge electrode 11 without forming the short-circuit portion 13 in the inspection terminal 12 of the input terminal portion 3, thereby checking the continuity of each third wiring 7. Becomes possible. In addition, the outermost inspection terminal 1
If the 4a is short-circuited to the second discharge electrode 11, the layout of the inspection terminals 14a and the short-circuit portion 23 becomes simple even when the inspection terminals 14 on the output terminal portion 4 side are densely arranged.

The third wiring 7c has the output terminal 4
c is short-circuited to the second discharge electrode 11 on the inspection terminal 14c side,
The third wires 7a, 7b may be short-circuited to the second discharge electrode 11 on the inspection terminals 12a, 12b side of the input terminal portions 3a, 3b. In this case, the third discharge electrode 20 branched from the second discharge electrode 11c of the fourth embodiment is extended to the inspection terminal 14c, and the input terminal portion 3c of the third wiring 7c is formed.
Is separated from the second discharge electrode 11c. Even if the static electricity flowing through the third wiring 7a jumps from the inspection terminal 14a, it flows to the third discharge electrode 20, so that the static electricity can be prevented from flowing to the second wiring 6.

As described above, the present invention can prevent the drive LSI from being destroyed by static electricity during manufacturing by short-circuiting the wiring not connected to the drive LSI with the discharge electrode.

It should be noted that embodiments other than the above-described embodiment are possible without departing from the gist of the present invention. For example, T
As long as the third wiring of the CP is used, this TCP can be used for a device other than the liquid crystal display device.

[0033]

According to the present invention, since the third wiring which is not connected to the driving LSI which is a semiconductor element is short-circuited to the discharge electrode, static electricity charged on the film during manufacturing flows to the third wiring. Can also be removed through the discharge electrode to prevent static electricity from flowing to the semiconductor element, thereby preventing damage to the semiconductor element. In addition, each wiring connected to the semiconductor element is separated and independent from the discharge electrode, and the third wiring is connected to the discharge electrode only at the short-circuit portion of the inspection terminal. The countermeasures against static electricity after the continuity test can be sufficiently performed, and the yield is improved.

Further, according to the present invention, the distance between the inspection terminal of the second terminal portion of the third wiring located on the outermost side and the inspection terminal of the second terminal portion of the second wiring adjacent to the inspection terminal is changed to another second terminal. Since it is larger than the distance between the inspection terminals in the terminal portion, the second wiring is easily connected through the inspection terminal in the second terminal portion from the third wiring, where the static electricity is most easily picked up.
Static electricity can be prevented from flowing through the wiring, and destruction of the semiconductor element during manufacturing can be prevented.

[Brief description of the drawings]

FIG. 1 is a plan view of a TCP according to a first embodiment of the present invention.

FIG. 2 is an enlarged view of a region A in FIG.

FIG. 3 is an enlarged view of a region B in FIG. 1;

FIG. 4 is a plan view when the TCP of the present invention is connected to a liquid crystal panel.

FIG. 5 is a plan view of a TCP according to a second embodiment of the present invention.

FIG. 6 is a plan view of a TCP according to a third embodiment of the present invention.

FIG. 7 is a plan view of a TCP according to a fourth embodiment of the present invention.

FIG. 8 is an enlarged view of a region B in FIG. 7;

FIG. 9 is an enlarged view of a test terminal of a TCP according to a fifth embodiment of the present invention.

FIG. 10 is a plan view of a conventional TCP.

FIG. 11 is an enlarged view of a region A in FIG. 9;

FIG. 12 is an enlarged view of a region B in FIG. 9;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 TCP 2 Base film 3 Input terminal part 4 Output terminal part 5 1st wiring 6 2nd wiring 7 3rd wiring 8 Driving LSI 10, 11 Discharge electrode 12 Inspection terminal 13 Short circuit part 14 Inspection terminal

Continued on front page F term (reference) 2G014 AA02 AB21 AB59 AC09 2H088 FA11 FA18 HA02 MA20 2H092 GA50 HA19 MA57 NA14 NA15 NA29 NA30 5F044 MM03 MM07 MM31 MM38 MM40 MM43

Claims (12)

[Claims] 1. An insulating film, a substantially rectangular semiconductor element mounted on the film, a plurality of first terminals arranged along a longitudinal direction of the semiconductor element, and a semiconductor element interposed therebetween. A plurality of second terminals arranged on the opposite side of the first terminal portion and having a smaller terminal width than the first terminal portion.
A terminal portion, a first wiring electrically connecting the first terminal portion located inside and the semiconductor element, and a second wiring electrically connecting the second terminal portion located inside and the semiconductor element.
A third wiring for directly connecting a wiring, the first terminal portion located outside and the second terminal portion located outside without the semiconductor element, and a conductive material formed on a peripheral portion of the film; And a short-circuit portion for electrically connecting the third wiring and the discharge electrode. 2. A test terminal is formed at a tip of the first terminal portion, and a short-circuit portion connected to the discharge electrode is provided at the test terminal of the first terminal portion connected to the third wiring. The tape carrier package according to claim 1, wherein 3. A test terminal is formed at a tip of the second terminal portion, and a short-circuit portion connected to the discharge electrode is provided at the test terminal of the second terminal portion connected to the third wiring. The tape carrier package according to claim 1, wherein 4. The tape carrier package according to claim 1, wherein a plurality of third wirings are formed, and at least an outermost third wiring is short-circuited to the discharge electrode. 5. A tape carrier package in which a plurality of third wirings are provided and an inspection terminal is formed at an end of each of the first terminal portion and the second terminal portion. 2. The tape carrier package according to claim 1, wherein a short-circuit portion connected to the discharge electrode is provided at one of the inspection terminals of the second terminal portion. 6. A test terminal larger than a terminal width of the second terminal portion is formed at a tip of the second terminal portion, and the test terminals are densely arranged for each of a plurality of third terminals. In the tape carrier package in which the inspection terminal is arranged adjacent to the inspection terminal of the second wiring, the third outermost position is located.
The distance between the inspection terminal of the wiring and the inspection terminal of the second wiring adjacent to the inspection terminal is determined by the distance between the inspection terminal of another third wiring and the inspection terminal of the second wiring adjacent to the inspection terminal. 6. The tape carrier package according to claim 1, wherein said tape carrier package is also widened. 7. The distance between the inspection terminal on the second terminal portion side of the outermost third wiring and the inspection terminal on the second terminal portion side of the second wiring adjacent to the inspection terminal is set to the other 3
7. The wiring according to claim 6, wherein the distance between the inspection terminal on the second terminal portion side of the wiring and the inspection terminal of the second terminal portion of the second wiring adjacent to the inspection terminal is at least twice as large. Tape carrier package. 8. An inspection terminal larger than a terminal width of the second terminal portion is formed at a tip of the second terminal portion, and the inspection terminals are densely arranged for each of a plurality of the plurality of third wirings. In a tape carrier package in which an inspection terminal is arranged near an inspection terminal of the second wiring, the inspection terminal of the third wiring located on the outermost side and the inspection terminal of the second wiring closest to the inspection terminal are connected to the inspection terminal of the third wiring. 6. The tape carrier package according to claim 1, further comprising an electrode electrically connected to the discharge electrode between the electrodes. 9. A plurality of sprocket holes formed at both ends of the film, a strip-shaped discharge electrode formed along the sprocket hole, and an inspection of the first terminal portion branched from the discharge electrode. A second discharge electrode arranged along the tip of the terminal; and a short-circuit portion connecting the second discharge electrode and the inspection terminal of the first terminal portion of the third wiring. 9. The tape carrier package according to claim 1, wherein 10. An insulating film, a substantially rectangular semiconductor element mounted on the film, and a plurality of first terminals arranged along a longitudinal direction of the semiconductor element;
A plurality of second terminal portions arranged on the opposite side of the first terminal portion with the semiconductor element interposed therebetween and having a smaller terminal width than the first terminal portion, and the first terminal portion located inside and the semiconductor; A first wiring for electrically connecting elements; a second wiring for electrically connecting the second terminal portion located inside and the semiconductor element; and a first wiring located outside for the first terminal portion located outside. A plurality of third wirings for directly connecting the second terminal portion without the semiconductor element therebetween, and an inspection terminal larger than a terminal width of the second terminal portion is formed at a tip of the second terminal portion. , The test terminals are densely arranged for every plural number,
In the tape carrier package in which the inspection terminal of the third wiring is arranged adjacent to the inspection terminal of the second wiring, the inspection of the inspection terminal of the third wiring located on the outermost side and the second wiring adjacent to the inspection terminal is performed. A tape carrier package, wherein the distance between the terminal and the inspection terminal of another third wiring is wider than the distance between the inspection terminal of the other third wiring and the inspection terminal of an adjacent second wiring. 11. The distance between the inspection terminal on the second terminal portion side of the outermost third wiring and the inspection terminal on the second terminal portion side of the second wiring adjacent to the inspection terminal is set to the other The distance between the inspection terminal on the second terminal portion side of the three wirings and the inspection terminal of the second terminal portion of the second wiring adjacent to the inspection terminal is at least twice as large. Tape carrier package. 12. The method for manufacturing a tape carrier package according to claim 1, wherein a plurality of conductive patterns formed on the insulating film are arranged along a longitudinal direction of the semiconductor element. A first terminal portion, a plurality of second terminal portions disposed on the opposite side of the first terminal portion with the semiconductor element interposed therebetween and having a smaller terminal width than the first terminal portion; A first wire for electrically connecting one terminal portion to the semiconductor element; a second wire for electrically connecting the second terminal portion located inside and the semiconductor element; and the first terminal located outside. A third wiring for directly connecting a portion and the outer second terminal portion without interposing the semiconductor element, a conductive discharge electrode formed in a peripheral portion of the film, and the third wiring. Electrically connect the discharge electrodes And a short-circuit portion to be formed in the same step.