JP2002229219A - Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developer - Google Patents
Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developerInfo
- Publication number
- JP2002229219A JP2002229219A JP2001020781A JP2001020781A JP2002229219A JP 2002229219 A JP2002229219 A JP 2002229219A JP 2001020781 A JP2001020781 A JP 2001020781A JP 2001020781 A JP2001020781 A JP 2001020781A JP 2002229219 A JP2002229219 A JP 2002229219A
- Authority
- JP
- Japan
- Prior art keywords
- developer
- insulating resin
- wiring board
- photosensitive insulating
- printed wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 238000000034 method Methods 0.000 title abstract description 17
- 230000015572 biosynthetic process Effects 0.000 title description 4
- 229920005989 resin Polymers 0.000 claims abstract description 40
- 239000011347 resin Substances 0.000 claims abstract description 40
- 239000004094 surface-active agent Substances 0.000 claims abstract description 13
- 238000011161 development Methods 0.000 abstract description 14
- 238000007796 conventional method Methods 0.000 abstract description 6
- -1 alkyl ether carboxylates Chemical class 0.000 description 15
- 235000014113 dietary fatty acids Nutrition 0.000 description 8
- 239000000194 fatty acid Substances 0.000 description 8
- 229930195729 fatty acid Natural products 0.000 description 8
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 150000004665 fatty acids Chemical class 0.000 description 5
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- 229910019142 PO4 Inorganic materials 0.000 description 3
- 229910021538 borax Inorganic materials 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 235000021317 phosphate Nutrition 0.000 description 3
- 239000004328 sodium tetraborate Substances 0.000 description 3
- 235000010339 sodium tetraborate Nutrition 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000002518 antifoaming agent Substances 0.000 description 2
- 239000013530 defoamer Substances 0.000 description 2
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- KWIUHFFTVRNATP-UHFFFAOYSA-N glycine betaine Chemical compound C[N+](C)(C)CC([O-])=O KWIUHFFTVRNATP-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 2
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- PSBDWGZCVUAZQS-UHFFFAOYSA-N (dimethylsulfonio)acetate Chemical compound C[S+](C)CC([O-])=O PSBDWGZCVUAZQS-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- 239000005995 Aluminium silicate Substances 0.000 description 1
- KXDHJXZQYSOELW-UHFFFAOYSA-N Carbamic acid Chemical class NC(O)=O KXDHJXZQYSOELW-UHFFFAOYSA-N 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical class S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229930006000 Sucrose Natural products 0.000 description 1
- ULUAUXLGCMPNKK-UHFFFAOYSA-N Sulfobutanedioic acid Chemical class OC(=O)CC(C(O)=O)S(O)(=O)=O ULUAUXLGCMPNKK-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 150000003973 alkyl amines Chemical class 0.000 description 1
- 150000004996 alkyl benzenes Chemical class 0.000 description 1
- 150000008051 alkyl sulfates Chemical class 0.000 description 1
- 229940045714 alkyl sulfonate alkylating agent Drugs 0.000 description 1
- 150000008052 alkyl sulfonates Chemical class 0.000 description 1
- 235000012211 aluminium silicate Nutrition 0.000 description 1
- 229960003237 betaine Drugs 0.000 description 1
- 150000007942 carboxylates Chemical class 0.000 description 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical class OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002462 imidazolines Chemical class 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 229940083254 peripheral vasodilators imidazoline derivative Drugs 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001522 polyglycol ester Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 102000004196 processed proteins & peptides Human genes 0.000 description 1
- 108090000765 processed proteins & peptides Proteins 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000005720 sucrose Substances 0.000 description 1
- 229940117986 sulfobetaine Drugs 0.000 description 1
- 150000003467 sulfuric acid derivatives Chemical class 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Landscapes
- Photosensitive Polymer And Photoresist Processing (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、多層プリント配線
板のバイアホール形成時に使用する現像液およびこの現
像液を用いた多層プリント配線板の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a developer used for forming via holes in a multilayer printed wiring board and a method for manufacturing a multilayer printed wiring board using the developer.
【0002】[0002]
【従来の技術】半導体チップ等の電子部品はその集積密
度が非常に高くなる傾向にあり、これを実装するプリン
ト配線板も配線間隔や接続穴間隔の狭小化により高密度
化が進められている。また、多層プリント配線板は予め
複数の基板に導体回路を形成し、これらをお互いに接合
することでさらなる高密度化を図っている。2. Description of the Related Art The integration density of electronic components such as semiconductor chips tends to be very high, and the density of printed wiring boards on which such components are mounted has been reduced by reducing the spacing between wiring and connecting holes. . Further, in the multilayer printed wiring board, a conductor circuit is formed in advance on a plurality of substrates, and these are joined to each other to achieve higher density.
【0003】この多層プリント配線板は、予め導体回路
を形成したプリント配線板をガラスクロスプリプレグで
多層化される。しかし年々要求される薄形化ファインピ
ッチ化においてプリプレグを用いた多層板ではコスト、
全体厚み等が問題となる。This multilayer printed wiring board is formed by multilayering a printed wiring board on which a conductor circuit has been formed in advance by a glass cloth prepreg. However, with the thinner and finer pitch required year by year, the cost and cost of a multilayer board using prepreg
There is a problem with the overall thickness and the like.
【0004】そこで、プリプレグではなく樹脂を用いて
多層化する手法が近年開発されている。これは内層処理
をされたプリント配線板上に絶縁樹脂を形成して多層化
し、その上に配線パターンを形成する方法である。この
方法の1つに、第1の回路が形成されたプリント配線板
上に感光性絶縁樹脂層を形成し、露光および現像により
バイアホールを形成した後、感光性絶縁樹脂層上にめっ
きを施し導体配線パターンを形成する方法(フォト法)
がある。[0004] Therefore, in recent years, a technique for forming a multilayer using a resin instead of a prepreg has been developed. This is a method in which an insulating resin is formed on a printed wiring board which has been subjected to an inner layer treatment to form a multilayer, and a wiring pattern is formed thereon. In one of the methods, a photosensitive insulating resin layer is formed on a printed wiring board on which a first circuit is formed, a via hole is formed by exposure and development, and plating is performed on the photosensitive insulating resin layer. Method of forming conductor wiring pattern (photo method)
There is.
【0005】[0005]
【発明が解決しようとする課題】前記のフォト法におけ
るバイアホールの形成は、通常、フォトマスクを介して
露光した感光性絶縁樹脂に、現像液をスプレー噴射し、
感光性絶縁樹脂を選択的に除去することにより行われ
る。このフォト法では、小径バイアホールの形成すなわ
ちバイアホール解像度の向上がプリント配線板の高密度
化の鍵となる。しかし、形成しようとするバイアホール
径が小さくなると、すなわちアスペクト比が高くなる
と、バイアホール内に現像液が流入しにくくなり、現像
が困難になる。The formation of via holes in the above-mentioned photo method usually involves spraying a developing solution onto a photosensitive insulating resin exposed through a photomask.
This is performed by selectively removing the photosensitive insulating resin. In the photo method, formation of a small-diameter via hole, that is, improvement in the resolution of the via hole is a key to increasing the density of the printed wiring board. However, when the diameter of the via hole to be formed is small, that is, when the aspect ratio is high, the developer hardly flows into the via hole, and the development becomes difficult.
【0006】本発明は、上記の現象を解決し、従来設備
および従来方法を変更することなく感光性絶縁樹脂層の
バイアホール解像度を向上させ、高密度な多層プリント
配線板の提供を可能とする現像液およびこの現像液を用
いた多層プリント配線板の製造方法を提案するものであ
る。The present invention solves the above-mentioned phenomena, improves the via hole resolution of the photosensitive insulating resin layer without changing the conventional equipment and the conventional method, and makes it possible to provide a high-density multilayer printed wiring board. A developer and a method for manufacturing a multilayer printed wiring board using the developer are proposed.
【0007】[0007]
【課題を解決するための手段】本発明は、感光性絶縁樹
脂を用いた多層プリント配線板の製造工程において、プ
リント配線板上に感光性絶縁樹脂層を形成し、露光およ
び現像によりバイアホールを形成する際、界面活性剤を
添加した現像液を使用し、現像液と感光性絶縁樹脂との
親和を高めることで、従来設備および従来方法を変更す
ることなく、バイアホール解像度の向上を可能とした。According to the present invention, in a manufacturing process of a multilayer printed wiring board using a photosensitive insulating resin, a photosensitive insulating resin layer is formed on the printed wiring board, and a via hole is formed by exposure and development. When forming, using a developer with a surfactant added, and increasing the affinity between the developer and the photosensitive insulating resin, it is possible to improve the via hole resolution without changing the conventional equipment and method. did.
【0008】[0008]
【発明の実施の形態】次に、本発明に係る現像液及びこ
の現像液を用いた多層プリント配線板の製造方法につい
て詳細に説明する。Next, a developer according to the present invention and a method for manufacturing a multilayer printed wiring board using the developer will be described in detail.
【0009】本発明において、現像液に含まれる界面活
性剤としては、特に限定されないが、現像液に対する感
光性絶縁樹脂のぬれ性を高める作用の大きいものが好ま
しく、これには、アニオン系としてはN−アシルアミノ
酸塩、アルキルエーテルカルボン酸塩、アシル化ペプチ
ドなどのカルボン酸塩、アルキルスルフォン酸塩、アル
キルベンゼンスルフォン酸塩、アルキルナフタレンスル
フォン酸塩、スルフォコハク酸塩、N−アシルスルフォ
ン酸塩、α−オレフィンスルフォン酸塩などのスルフォ
ン酸塩、アルキル硫酸塩、アルキルエーテル硫酸塩、ア
ルキルアリルエーテル硫酸塩、アルキルアミド硫酸塩な
どの硫酸エステル塩、アルキル燐酸塩、アルキルエーテ
ル燐酸塩、アルキルアリルエーテル燐酸塩などの燐酸エ
ステル塩およびフォスフォン酸塩等が、カチオン系とし
ては脂肪族アミン塩、第4級アンモニウム塩、フォスフ
ォニウム塩、スルフォニウム塩等が、両性系としては、
カルボキシベタイン、スルフォベタインなどのベタイ
ン、アミノカルボン酸塩およびイミダゾリン誘導体等
が、非イオン系としては脂肪酸モノグリセリンエステ
ル、脂肪酸ポリグリコールエステル、脂肪酸ソルビタン
エステル、脂肪酸プロピレングリコールエステル、脂肪
酸蔗糖エステルなどのエステル型、脂肪酸アルカノール
アミド、高級アルキルアミンポリエチレンオキサイド、
高級脂肪酸アミドポリエチレンオキサイドなどの含窒素
型、高級アルコールポリエチレンオキサイド、アルキル
フェノールポリエチレンオキサイドなどのエーテル型お
よび高級脂肪酸ポリエチレンオキサイドなどのエーテル
エステル型等が挙げられる。In the present invention, the surfactant contained in the developer is not particularly limited, but a surfactant having a large effect of increasing the wettability of the photosensitive insulating resin with respect to the developer is preferable. N-acyl amino acid salts, alkyl ether carboxylates, carboxylates such as acylated peptides, alkyl sulfonates, alkyl benzene sulfonates, alkyl naphthalene sulfonates, sulfosuccinates, N-acyl sulfonates, α- Sulfonates such as olefin sulfonates, alkyl sulfates, alkyl ether sulfates, alkyl allyl ether sulfates, sulfate salts such as alkyl amide sulfates, alkyl phosphates, alkyl ether phosphates, alkyl allyl ether phosphates, etc. Phosphoric acid ester salts and Sufon acid salts and the like, aliphatic amine salt as a cationic, quaternary ammonium salts, phosphonium salts, sulfonium salts and the like. Examples of the amphoteric,
Betaine such as carboxybetaine and sulfobetaine, aminocarboxylates and imidazoline derivatives, etc., and nonionic esters such as fatty acid monoglycerin ester, fatty acid polyglycol ester, fatty acid sorbitan ester, fatty acid propylene glycol ester, fatty acid sucrose ester Type, fatty acid alkanolamide, higher alkylamine polyethylene oxide,
Examples include nitrogen-containing types such as higher fatty acid amide polyethylene oxide, ether types such as higher alcohol polyethylene oxide and alkylphenol polyethylene oxide, and ether ester types such as higher fatty acid polyethylene oxide.
【0010】さらに、現像液に対する感光性絶縁樹脂の
ぬれ性は、感光性絶縁樹脂への界面活性剤を添加した現
像液の接触角が30°以下になることが特に好ましく、
接触角が30°より大きい場合、ぬれ性が不十分であり
解像性の向上は期待できない。Further, the wettability of the photosensitive insulating resin with respect to the developing solution is particularly preferably such that the contact angle of the developing solution added with the surfactant to the photosensitive insulating resin is 30 ° or less,
When the contact angle is larger than 30 °, the wettability is insufficient and the improvement in resolution cannot be expected.
【0011】選択された界面活性剤は、感光性絶縁樹脂
への界面活性剤を添加した現像液の接触角が30°以下
になるように現像液に0.001重量%から20重量
%、特に好ましくは0.01重量%から5重量%添加さ
れる。0.001重量%以下であると界面活性剤添加に
よるぬれ性向上効果が得られない等の、20重量%以上
であると現像液の現像能力を阻害する等の不具合が生じ
ることがある。The selected surfactant is added to the photosensitive insulating resin in an amount of 0.001% by weight to 20% by weight, especially 0.001% by weight, so that the contact angle of the developer added with the surfactant to the photosensitive insulating resin is 30 ° or less. Preferably, 0.01 to 5% by weight is added. If the amount is less than 0.001% by weight, the effect of improving the wettability by the addition of a surfactant may not be obtained. If the amount is more than 20% by weight, problems may occur such as impairing the developing ability of the developer.
【0012】また、本発明において、上記から選択され
た界面活性剤が添加される現像液は、感光性絶縁樹脂を
選択的に溶出するものであれば、その種類については特
に制限はなく、ネガ型またはポジ型の現像タイプにより
決定され、アルカリ現像液、準水系現像液、溶剤現像液
およびエマルジョン現像液など一般的なものを使用する
ことができ、ディップコート法、スプレー法等の常法に
より、感光性絶縁樹脂層に塗布される。In the present invention, the type of the developer to which the surfactant selected from the above is added is not particularly limited as long as it selectively elutes the photosensitive insulating resin. Determined by the development type of positive or negative type, common ones such as alkaline developer, semi-aqueous developer, solvent developer and emulsion developer can be used. Is applied to the photosensitive insulating resin layer.
【0013】また、本発明に係る現像液の起泡を抑える
ために、適宜、消泡剤を添加してもよく、アルコール
類、非イオン界面活性剤やシリコーン油等通常使用され
ているものを添加することができる。In order to suppress foaming of the developer according to the present invention, an antifoaming agent may be appropriately added, and those commonly used such as alcohols, nonionic surfactants and silicone oils may be used. Can be added.
【0014】また、本発明において、現像処理の前段階
である露光処理は、常法により行うことができる。例え
ば、光源として超高圧水銀灯や高圧水銀灯等を用い、感
光性絶縁樹脂組成物の層上にフォトマスクを通して直
接、又はポリエチレンテレフタレートフィルム等の透明
フィルムを介し、像的に露光することができる。In the present invention, the exposure treatment, which is a stage prior to the development treatment, can be performed by a conventional method. For example, an ultrahigh-pressure mercury lamp, a high-pressure mercury lamp, or the like is used as a light source, and imagewise exposure can be performed directly on a layer of the photosensitive insulating resin composition through a photomask or via a transparent film such as a polyethylene terephthalate film.
【0015】また、本発明の現像液を用いてバイアホー
ルが形成される感光性絶縁樹脂は、ラジカル重合型また
はカオチン重合型のどちらの組成でもよく、通常使用さ
れうるものであれば限定されない。また、プリント配線
板上に樹脂層を形成する前の感光性絶縁樹脂の形態も、
液状もしくはフィルム状のものなどが用いられ、例えば
感光性絶縁樹脂が液状の場合には、コンマコータ、ブレ
ードコータ、リップコータ、ロッドコータ、スクイズコ
ータ、リバースロールコータ、トランスファロールコー
タ等によってプリント配線板上に均一な厚さに塗布さ
れ、加熱・乾燥して溶剤を揮発させることで、感光性絶
縁樹脂層を形成する。フィルム状の場合には、ホットロ
ールラミネーターなどを用いて貼り合わせることで、プ
リント配線板上に感光性絶縁樹脂層を容易に形成するこ
とができる。これら感光性絶縁樹脂層の厚さについては
均一であれば特に制限はなく、通常10〜150μmの
範囲で適宜選択される。The photosensitive insulating resin in which the via hole is formed by using the developer of the present invention may be of either a radical polymerization type or a kaolin polymerization type, and is not limited as long as it can be generally used. Also, the form of the photosensitive insulating resin before forming the resin layer on the printed wiring board,
Liquid or film-like materials are used, for example, when the photosensitive insulating resin is liquid, a comma coater, a blade coater, a lip coater, a rod coater, a squeeze coater, a reverse roll coater, a transfer roll coater, etc. The photosensitive insulating resin layer is formed by applying a uniform thickness, heating and drying to evaporate the solvent. In the case of a film, the photosensitive insulating resin layer can be easily formed on the printed wiring board by bonding using a hot roll laminator or the like. The thickness of the photosensitive insulating resin layer is not particularly limited as long as it is uniform, and is usually appropriately selected in the range of 10 to 150 μm.
【0016】さらに、本発明に係る現像液を用いた多層
プリント配線板の製造方法について、上述した処理工程
以外の、洗浄、エッチング、レジスト剥離、保護膜形成
等の通常多層プリント配線板を製造する上で必要な工程
についても、従来設備および従来方法を変更することな
く多層プリント配線板を製造することが可能である。Further, in the method of manufacturing a multilayer printed wiring board using the developing solution according to the present invention, a normal multilayer printed wiring board such as cleaning, etching, resist peeling, formation of a protective film, etc., other than the above-mentioned processing steps is manufactured. Regarding the steps required above, it is possible to manufacture a multilayer printed wiring board without changing the conventional equipment and the conventional method.
【0017】以下、本発明を実施例及び比較例に基づき
さらに詳細に説明する。Hereinafter, the present invention will be described in more detail with reference to Examples and Comparative Examples.
【実施例】(実施例1) (1)感光性絶縁樹脂として、フォトビアフィルムBF-8500
(樹脂厚75μm)(日立化成工業(株)製、商品名)を使用
し、これをガラス−エポキシ樹脂銅張り積層板(積層板
厚:0.6mm、銅箔厚18μm)MCL-E-67(日立化成工業(株)
製、商品名)に銅黒化処理を施した上に、ロールラミネ
ータによりフォトビアフィルムBF-8500をラミネートす
ることにより感光性絶縁樹脂層を形成した。 (2)(1)の感光性絶縁樹脂層を形成した面に、バイアホー
ルとなる部分を遮光したフォトマスクを介して、露光量
500mJ/cm2の紫外光を照射し、下記現像液および現像条
件にて現像することにより、遮光部分を選択的に除去
し、バイアホールを形成した。 実施例1で用いた現像液組成 水 900ml/l シ゛エチレンク゛リコールモノフ゛チルエーテル 100ml/l ホウ砂 15g/l 界面活性剤 (トーホールN-207M: 東邦化学(株)製、商品名) 30g/l 消泡剤 (アンチックス#100:丸善薬品工業(株)製) 1g/l 現像条件 現像方式 スプレー現像 (スプレー圧力: 80kPa) 現像温度 30℃ 現像時間 6分 (3)(2)の現像後、80℃で30分の乾燥を行い、電子顕微鏡
によりバイアホールを観察しバイアホール解像度を評価
した。表1にこの結果を示す。 (4) 未露光のフォトビアフィルムBF-8500の感光性絶縁
樹脂面に(2)の現像液を滴下し、接触角を測定した。な
お、測定値はn=3の平均値で示した。表1にこの結果を示
す。 (5)以下の方法により、感光性絶縁樹脂の現像性の目安
となる最小現像時間を測定した。フォトビアフィルムBF
-8500を30mm×30mmに切断した後、未露光の状態でこの
サンプルの感光性絶縁樹脂面に(2)の現像液を (2)の現
像条件にてスプレー噴射し、フィルムがPETから完全に
除去されるまでの時間(最小現像時間)を測定した。な
お、測定値はn=3の平均値で示した。表1にこの結果を
示す。EXAMPLES (Example 1) (1) Photo-via film BF-8500 as photosensitive insulating resin
(Resin thickness: 75 μm) (trade name, manufactured by Hitachi Chemical Co., Ltd.), which was used as a glass-epoxy resin copper-clad laminate (laminate thickness: 0.6 mm, copper foil thickness: 18 μm) MCL-E-67 ( Hitachi Chemical Co., Ltd.
(Trade name, product name) was subjected to a copper blackening treatment, and a photo via film BF-8500 was laminated with a roll laminator to form a photosensitive insulating resin layer. (2) Exposure amount to the surface on which the photosensitive insulating resin layer of (1) was formed, through a photomask in which a portion to be a via hole is shielded
By irradiating with ultraviolet light of 500 mJ / cm 2 and developing with the following developing solution and developing conditions, a light-shielding portion was selectively removed to form a via hole. Developer composition used in Example 1 Water 900 ml / l diethylene glycol monobutyl ether 100 ml / l borax 15 g / l surfactant (Tohoru N-207M: trade name, manufactured by Toho Chemical Co., Ltd.) 30 g / l defoamer ( Antix # 100: Maruzen Pharmaceutical Co., Ltd. 1g / l Development conditions Development method Spray development (spray pressure: 80kPa) Development temperature 30 ° C Development time 6 minutes (3) (2), 30 at 80 ° C After drying, the via holes were observed with an electron microscope to evaluate the via hole resolution. Table 1 shows the results. (4) The developer of (2) was dropped on the photosensitive insulating resin surface of the unexposed photovia film BF-8500, and the contact angle was measured. In addition, the measured value was shown by the average value of n = 3. Table 1 shows the results. (5) The minimum development time, which is a measure of the developability of the photosensitive insulating resin, was measured by the following method. Photo Via Film BF
After cutting -8500 into 30 mm x 30 mm, the developer of (2) was sprayed onto the photosensitive insulating resin surface of this sample in the unexposed state under the developing conditions of (2), and the film was completely removed from PET. The time until removal (minimum development time) was measured. In addition, the measured value was shown by the average value of n = 3. Table 1 shows the results.
【0018】(実施例2)実施例2において、以下に示
す現像液を用いた以外の条件は、実施例1と同様とし、
バイアホール解像度、接触角および最小現像時間の評価
を行った。表1にこの結果を示す。 実施例2で用いた現像液組成 水 900ml/l シ゛エチレンク゛リコールモノフ゛チルエーテル 100ml/l ホウ砂 15g/l 界面活性剤 (ノナール912: 東邦化学(株)製、商品名) 30g/l 消泡剤 (アンチックス#100:丸善薬品工業(株)製) 1g/lExample 2 In Example 2, the conditions were the same as in Example 1 except that the following developer was used.
Evaluation of via hole resolution, contact angle and minimum development time was performed. Table 1 shows the results. Developer composition used in Example 2 Water 900 ml / l Diethylene glycol monobutyl ether 100 ml / l Borax 15 g / l Surfactant (Nonal 912: trade name, manufactured by Toho Chemical Co., Ltd.) 30 g / l Antifoaming agent (antix # 100: Maruzen Pharmaceutical Co., Ltd.) 1g / l
【0019】(比較例)比較例において、以下に示す現
像液を用いた以外の条件は、実施例1と同様とし、バイ
アホール解像度、接触角および最小現像時間の評価を行
った。表1にこの結果を示す。 比較例で用いた現像液組成 水 900ml/l シ゛エチレンク゛リコールモノフ゛チルエーテル 100ml/l ホウ砂 15g/l 消泡剤 (アンチックス#100:丸善薬品工業(株)製) 1g/l(Comparative Example) In Comparative Example, the same conditions as in Example 1 were used except that the following developer was used, and the evaluation of the via hole resolution, the contact angle and the minimum developing time were performed. Table 1 shows the results. Developer composition used in Comparative Examples Water 900 ml / l ethylene glycol monobutyl ether 100 ml / l borax 15 g / l defoamer (Antiox # 100: manufactured by Maruzen Pharmaceutical Co., Ltd.) 1 g / l
【0020】[0020]
【表1】 [Table 1]
【0021】表1から実施例1および2における現像液
を用いた方が、比較例の現像液を用いるより優れたバイ
アホール解像度を有するということが容易に理解されよ
う。From Table 1, it can be easily understood that the use of the developing solutions in Examples 1 and 2 has a better via hole resolution than using the developing solution of Comparative Example.
【0022】本発明は上記に複数の実施の形態を示した
が、この記載が本発明を限定するものであると理解すべ
きではない。この開示から当業者にはここでは記載して
いない様々な代替実施の形態、実施例、運用技術が明ら
かとなろう。したがって、本発明の技術的範囲は上記の
説明から妥当な特許請求に係る発明特定事項によっての
み定められるものである。Although the present invention has been described with reference to a plurality of embodiments, it should be understood that the description is not intended to limit the present invention. From this disclosure, various alternative embodiments, examples, and operation techniques not described herein will be apparent to those skilled in the art. Therefore, the technical scope of the present invention is determined only by the matters specifying the invention according to the claims that are appropriate from the above description.
【0023】[0023]
【発明の効果】以上のように、本発明による現像液を用
いることにより、従来設備および従来方法を変更するこ
となく感光性絶縁樹脂層のバイアホール解像度の向上が
実現され、小径バイアホールによる高密度多層プリント
配線板の提供が可能となった。As described above, by using the developer according to the present invention, the resolution of the via hole of the photosensitive insulating resin layer can be improved without changing the conventional equipment and the conventional method. It has become possible to provide high density multilayer printed wiring boards.
Claims (3)
性絶縁樹脂層へのバイアホール形成時に使用される現像
液であって、界面活性剤を含んでなることを特徴とする
現像液。1. A developing solution used for forming a via hole in a photosensitive insulating resin layer in the production of a multilayer printed wiring board, the developing solution comprising a surfactant.
角が30°以下となるように界面活性剤を含んでなること
を特徴とする請求項1に記載の現像液。2. The developer according to claim 1, further comprising a surfactant so that a contact angle of the developer with the photosensitive insulating resin layer is 30 ° or less.
層プリント配線板の製造方法であって、バイアホールを
形成する時に請求項1または2に記載の現像液を使用す
ることを特徴とする多層プリント配線板の製造方法。3. A method of manufacturing a multilayer printed wiring board using a photosensitive insulating resin as an insulating layer, wherein the developer according to claim 1 or 2 is used when forming a via hole. Manufacturing method of printed wiring board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001020781A JP2002229219A (en) | 2001-01-29 | 2001-01-29 | Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001020781A JP2002229219A (en) | 2001-01-29 | 2001-01-29 | Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developer |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002229219A true JP2002229219A (en) | 2002-08-14 |
Family
ID=18886442
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001020781A Pending JP2002229219A (en) | 2001-01-29 | 2001-01-29 | Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2002229219A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005006083A1 (en) * | 2003-07-14 | 2005-01-20 | Az Electronic Materials (Japan) K.K. | Developing solution for photosensitive composition and method for forming patterned resist film |
CN110268333A (en) * | 2017-02-28 | 2019-09-20 | 富士胶片株式会社 | The production method of lithographic printing plate |
-
2001
- 2001-01-29 JP JP2001020781A patent/JP2002229219A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005006083A1 (en) * | 2003-07-14 | 2005-01-20 | Az Electronic Materials (Japan) K.K. | Developing solution for photosensitive composition and method for forming patterned resist film |
CN110268333A (en) * | 2017-02-28 | 2019-09-20 | 富士胶片株式会社 | The production method of lithographic printing plate |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100780973B1 (en) | Liquid Crystal Polymers for Flexible Circuits | |
US4592787A (en) | Composition useful for stripping photoresist polymers and method | |
US4069076A (en) | Liquid lamination process | |
US20020028293A1 (en) | Liquid crystal polymers for flexible circuits | |
KR20200000700U (en) | Printed wiring board | |
JP2012182292A (en) | Resin opening method | |
JP2002229219A (en) | Developer used for formation of via hole and method for manufacturing multilayered print wiring board by using the developer | |
JP2015046519A (en) | Method for manufacturing circuit board | |
EP0490118A1 (en) | Photoimagable solder mask and photosensitive composition | |
KR20130060999A (en) | Method of forming pattern | |
KR100357292B1 (en) | Developing solution for printed wiring board and manufacturing method of printed wiring board | |
JP5639465B2 (en) | Method for producing metal pattern | |
JP5520140B2 (en) | Dry film resist thinning method | |
JPS616827A (en) | Stripper of photoresist | |
TWM573119U (en) | Apparatus for thin filming resist layer | |
TWI857112B (en) | Photoresist removal composition | |
JP4341281B2 (en) | Method for manufacturing laminated board for printed wiring board | |
JP5498871B2 (en) | Method of thinning photocrosslinkable resin layer | |
JP2017033989A (en) | Method for forming solder resist | |
JP5455696B2 (en) | Dry film resist thinning method | |
JP5537463B2 (en) | Method for producing conductive pattern | |
JP2023101962A (en) | Etching method of laminate | |
JP5537476B2 (en) | Method for producing conductive pattern | |
JP3202620U (en) | Resist layer thinning device | |
JP3186721U (en) | Dry film resist thinning equipment |