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JP2002210640A - Polishing method for disk substrate - Google Patents

Polishing method for disk substrate

Info

Publication number
JP2002210640A
JP2002210640A JP2001009695A JP2001009695A JP2002210640A JP 2002210640 A JP2002210640 A JP 2002210640A JP 2001009695 A JP2001009695 A JP 2001009695A JP 2001009695 A JP2001009695 A JP 2001009695A JP 2002210640 A JP2002210640 A JP 2002210640A
Authority
JP
Japan
Prior art keywords
polishing
substrate
disk substrate
disk
rotary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001009695A
Other languages
Japanese (ja)
Inventor
Atsuya Sugano
篤哉 菅野
Masatoshi Nara
正俊 奈良
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sheet Glass Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Priority to JP2001009695A priority Critical patent/JP2002210640A/en
Publication of JP2002210640A publication Critical patent/JP2002210640A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a polishing method that can reduce a surface sag near a disk periphery. SOLUTION: The polishing method for a disk substrate 1 holds with pressure both obverse and reverse surfaces of the disk substrate 1 of an outside diameter D1 and an inside diameter D2 between a pair of rotary polishing elements opposed on both surfaces of the substrate to thus polish them simultaneously. The substrate is held by an attitude holding means and is forcibly rotated. The pair of rotary polishing elements meet a relation of a diameter D (D>D1-D2). The axis of rotation of the polishing elements is offset at (a) outside the outer circumference of the substrate to even out polishing removals between the inner and outer circumferences of the substrate.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、金属、セラミク
ス、ガラス等の円盤を、一対の回転研磨体を用いて研磨
する方法に関する。とりわけ、本発明は、ハードディス
クに用いられるガラス基板やアルミニウム合金基板に好
適な研磨方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for polishing a disk made of metal, ceramics, glass or the like using a pair of rotary abrasives. In particular, the present invention relates to a polishing method suitable for a glass substrate or an aluminum alloy substrate used for a hard disk.

【0002】[0002]

【従来の技術】ガラス円盤の表裏両面を研磨する方法と
しては、特開平6−210560号に、3つの円筒状の
回転ローラでガラス円盤を縦姿勢に保持し、そのガラス
円盤の直径よりも小さい直径を有する一対の回転研磨体
でガラス円盤を挟み付けながら、回転研磨体を回転させ
るとともに、ガラス円盤の軸心に沿う回転軸心周りに往
復運動させて、ガラス円盤の表裏両面を同時に研磨する
方法および装置が記載されている。
2. Description of the Related Art As a method of polishing both front and back surfaces of a glass disk, Japanese Patent Application Laid-Open No. Hei 6-210560 discloses a method in which a glass disk is held in a vertical position by three cylindrical rotating rollers, and is smaller than the diameter of the glass disk. While sandwiching the glass disk between a pair of rotating abrasive bodies having a diameter, the rotating abrasive body is rotated and reciprocated about a rotation axis along the axis of the glass disk to simultaneously polish both front and back surfaces of the glass disk. A method and apparatus are described.

【0003】[0003]

【発明が解決しようとする課題】ところでハードディス
クでは、その記憶容量の増大がますます求められてい
る。特にディスク基板においては、外周端ぎりぎりまで
データゾーンとして使用できることも求められきてい
る。
[0005] By the way, in a hard disk, an increase in its storage capacity is increasingly required. In particular, it is required that a disk substrate can be used as a data zone up to the outermost end.

【0004】そこでディスク基板の外周端ぎりぎりまで
利用するために、特開2000−326216に示され
た研磨装置では、対向する回転研磨体の間に、ガラス円
盤の厚みより若干薄い邪魔板を設けることが開示されて
いる。これにより、ガラス円盤の外周近傍の面ダレを低
減できるとされている。
Therefore, in order to use the disk substrate just to the outer peripheral edge, in a polishing apparatus disclosed in Japanese Patent Application Laid-Open No. 2000-326216, a baffle plate slightly thinner than the thickness of a glass disk is provided between opposing rotating polishing bodies. Is disclosed. Thereby, it is said that surface droop near the outer periphery of the glass disk can be reduced.

【0005】ところで、上述した特開平6−21056
0号や特開2000−326216に示された両頭研磨
装置および研磨方法において、ディスク基板を研磨処理
する際の、ディスク主表面の中央部分と外周近傍部分で
の研磨のメカニズムは詳しく検討されていなかった。
Incidentally, the above-mentioned Japanese Patent Application Laid-Open No. Hei 6-21056 has been disclosed.
In the double-head polishing apparatus and the polishing method disclosed in Japanese Patent Application Laid-Open No. 2000-326216 or No. 2000-326216, the mechanism of polishing in the central portion and the vicinity of the outer periphery of the main surface of the disk when polishing the disk substrate has not been studied in detail. Was.

【0006】そこで本発明は、ディスク基板の研磨方法
において、特にディスク外周近傍の面ダレを少なくでき
る研磨方法の提供を目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a method of polishing a disk substrate, in particular, a method of reducing surface sagging near the outer periphery of a disk.

【0007】またディスク基板の内周から外周にわたっ
て、研磨量を平均化できる研磨方法の提供を目的とす
る。
Another object of the present invention is to provide a polishing method capable of averaging the amount of polishing from the inner circumference to the outer circumference of the disk substrate.

【0008】[0008]

【課題を解決するための手段】上記課題を解決するため
に、本発明は、ディスク基板の内周端から外周端におけ
る研磨量を平均化することを考えた。具体的な解決方法
としては、研磨体の回転軸心をディスク基板の外周端の
外側にオフセットして、ディスク基板の内周端から外周
端において、ディスクとパッドの相対的な速度を平均化
して、研磨量を平均化した。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention has considered to equalize the polishing amount from the inner peripheral edge to the outer peripheral edge of the disk substrate. As a specific solution, the rotational axis of the polishing body is offset outside the outer peripheral edge of the disk substrate, and the relative speed between the disk and the pad is averaged from the inner peripheral edge to the outer peripheral edge of the disk substrate. The polishing amount was averaged.

【0009】すなわち、本発明は請求項1に記載の発明
として、外径D1と内径D2のディスク基板の表裏両面
を、前記基板の両面に対向させて設けた一対の回転研磨
体で挟み当てつけて、同時に研磨するディスク基板の研
磨方法において、前記基板を姿勢保持手段により保持
し、かつ強制的に回転させるとともに、前記一対の回転
研磨体は、直径Dが(D>D1−D2)の関係を満足し、
さらに前記研磨体の回転軸心を前記基板外周端の外側に
オフセットして、前記基板の内周端から外周端にわたる
研磨量を平均化したことを特徴とするディスク基板の研
磨方法である。
That is, according to the present invention, a disk substrate having an outer diameter D1 and an inner diameter D2 is sandwiched between a pair of rotary abrasive bodies provided opposite to both surfaces of the substrate. In the method of polishing a disk substrate to be polished at the same time, the substrate is held by a posture holding means and is forcibly rotated, and the pair of rotary abrasive bodies have a relationship of a diameter D (D> D1−D2). Satisfied,
A disk substrate polishing method, further comprising offsetting a rotation axis of the polishing body to an outside of an outer peripheral edge of the substrate and averaging a polishing amount from an inner peripheral edge to an outer peripheral edge of the substrate.

【0010】請求項2の発明として、請求項1に記載の
ディスク基板の研磨方法において、前記オフセット量を
最適化したディスク基板の研磨方法である。
According to a second aspect of the present invention, there is provided the disk substrate polishing method according to the first aspect, wherein the offset amount is optimized.

【0011】[0011]

【発明の実施の形態】以下に本発明を説明する。図1
は、本発明が適用できる両面研磨装置の一実施例の全体
図である。両面研磨装置50は、架台5と、この架台5
の中央部に配置されたディスク基板1を縦姿勢に保持す
る縦姿勢保持手段4と、この保持部4の両側に配置され
た回転研磨体2a、2bを含む。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below. Figure 1
1 is an overall view of an embodiment of a double-side polishing apparatus to which the present invention can be applied. The double-side polishing apparatus 50 includes a gantry 5 and the gantry 5
Vertical holding means 4 for holding the disk substrate 1 in a vertical position, which is disposed at the center of the disk drive, and rotating abrasive bodies 2a, 2b disposed on both sides of the holding section 4.

【0012】ローラ3により縦姿勢に保持されたディス
ク基板1の両面を挟むように、その回転軸心がディスク
基板1の回転軸心と平行になるように、架台5の上に一
対の回転研磨体2a、2bが配置されている。
A pair of rotary polishing members are mounted on a gantry 5 such that both sides of the disk substrate 1 held in a vertical position by the rollers 3 are sandwiched and the rotation axis thereof is parallel to the rotation axis of the disk substrate 1. The bodies 2a, 2b are arranged.

【0013】回転研磨体2aは、架台5に固定された軸
受体14aにより回転可能に支持された回転軸筒体13
aに固定されている。支持具(図示しない)により固定
された電動モータ7aの回転は、電動モータの回転軸に
取り付けられたプーリ16aと、プーリ16aと回転軸
筒体13aの端部に取り付けられたプーリ15aをつな
ぐベルト8aを介して回転研磨体2aに伝えられる。回
転軸筒体13aおよびプーリ15aの回転軸内には、貯
蔵タンク18内の研磨液17を輸送ポンプ9により回転
研磨体2a内部に供給するための研磨液供給孔6が設け
られている。
The rotary abrasive body 2a is rotatably supported by a rotary shaft cylindrical body 13 supported by a bearing body 14a fixed to the gantry 5.
a. The rotation of the electric motor 7a fixed by a support (not shown) is performed by a belt connecting the pulley 16a attached to the rotating shaft of the electric motor and the pulley 15a attached to the end of the rotating shaft cylinder 13a. It is transmitted to the rotary abrasive body 2a via 8a. A polishing liquid supply hole 6 for supplying the polishing liquid 17 in the storage tank 18 to the inside of the rotary polishing body 2a by the transport pump 9 is provided in the rotary shaft of the rotary shaft cylinder 13a and the pulley 15a.

【0014】回転研磨体2bは、架台5に設けられたレ
ール10の上を左右方向に滑りながら移動するスライダ
ー部12に支持された軸受体14bにより回転可能に支
持されている回転軸筒体13bに固定されている。電動
モータ7bの回転は、電動モータの回転軸に取り付けら
れたプーリ16bと、プーリ16bと回転軸筒体13b
の端部に取り付けられたプーリ16bをつなぐベルト8
bを介して回転研磨体2bに伝えられる。
The rotary abrasive body 2b is rotatably supported by a bearing body 14b supported by a slider portion 12 that moves while sliding in the left-right direction on a rail 10 provided on the gantry 5. It is fixed to. The electric motor 7b is rotated by a pulley 16b attached to a rotating shaft of the electric motor, a pulley 16b and a rotating shaft cylinder 13b.
8 connecting pulley 16b attached to the end of
b to the rotating abrasive body 2b.

【0015】一対の回転研磨体2a、2bの少なくとも
一方をディスク基板1に当てつける手段が設けられてい
る。この当てつけ手段は、ディスク基板1の研磨面に回
転研磨体2を所定の圧力で押し当てる機能を有するもの
であれば特に限定されない。図1においては、軸受体1
4を支えるスライダー部12と、スライダー部12を左
右方向にスライドさせるレール10と、エアーシリンダ
ーを有する押圧装置11からなるものが示されている。
押圧装置11のモータ駆動により回転研磨体2bは、デ
ィスク基板1に接近、離間が可能とされ、また適当な圧
力でディスク基板1に当てつけられる。
Means for contacting at least one of the pair of rotary abrasive bodies 2a and 2b against the disk substrate 1 is provided. The applying means is not particularly limited as long as it has a function of pressing the rotating abrasive body 2 against the polishing surface of the disk substrate 1 at a predetermined pressure. In FIG. 1, a bearing 1
4 includes a slider unit 12 for supporting the slider 4, a rail 10 for sliding the slider unit 12 in the left-right direction, and a pressing device 11 having an air cylinder.
The rotating abrasive body 2b can be moved toward and away from the disk substrate 1 by driving the motor of the pressing device 11, and is brought into contact with the disk substrate 1 with an appropriate pressure.

【0016】図1において、回転研磨体2aは左右方向
に固定され、回転研磨体2bは左右方向に当てつけ手段
により移動可能である。ディスク基板1は一対の回転さ
れている回転研磨体2により押圧状態で当てつけられ、
この押圧状態で研磨液が供給され研削加工、研磨加工が
行われる。ディスク基板1の縦姿勢保持手段4は、ディ
スク基板1を少なくとも3個のローラにより、その外周
面が挟まれて保持される。
In FIG. 1, the rotating abrasive body 2a is fixed in the left-right direction, and the rotating abrasive body 2b is movable in the left-right direction by a contact means. The disk substrate 1 is applied in a pressed state by a pair of rotating abrasive bodies 2 being rotated,
The polishing liquid is supplied in this pressed state, and the grinding and polishing are performed. The vertical posture holding means 4 of the disk substrate 1 holds the disk substrate 1 with at least three rollers sandwiching the outer peripheral surface thereof.

【0017】図2は、本発明の両面研磨装置のディスク
基板1の縦姿勢保持手段4と強制回転用モータ19の一
実施の形態を示す図である。図2には、3つの回転自在
に取り付けられたローラ3a、3b、3cと一つのディ
スク基板を強制回転するローラ3dにより保持されてい
る状態が示されている。各ローラ3の厚み(紙面に垂直
な方向)の寸法は、ディスク基板1の厚みの寸法より十
分に大きい。各ローラ3の外周面には、ディスク基板1
の厚みより若干大きい幅の溝が、ディスク基板1の保持
手段からの取り外し、または保持手段の取り付けを容易
にするために設けられてもよい。上側2つのローラ3
a、3cは、横梁42を長さ方向に沿って滑るようにし
て移動可能に取り付けられた移動金具43を介して、支
持金具44により、それぞれのローラの回転軸心が水平
になるように支持されている。下側のローラ3b、3d
は、支柱41に取り付けられている。
FIG. 2 is a view showing one embodiment of the vertical attitude holding means 4 of the disk substrate 1 and the motor 19 for forced rotation of the double-side polishing apparatus of the present invention. FIG. 2 shows a state in which three rollers 3a, 3b, and 3c rotatably mounted and a roller 3d for forcibly rotating one disk substrate are held. The thickness of each roller 3 (in the direction perpendicular to the plane of the paper) is sufficiently larger than the thickness of the disk substrate 1. A disk substrate 1 is provided on the outer peripheral surface of each roller 3.
A groove having a width slightly larger than the thickness of the disk substrate 1 may be provided to facilitate removal of the disk substrate 1 from the holding means or attachment of the holding means. Upper two rollers 3
a and 3c are supported by a supporting bracket 44 via a moving bracket 43 movably attached by sliding the cross beam 42 along the length direction so that the rotation axis of each roller is horizontal. Have been. Lower rollers 3b, 3d
Is attached to the column 41.

【0018】図3は、外径D1と内径D2とを有するディ
スク基板1と回転研磨体2の回転軸心の位置関係を説明
するための図である。図3には、ディスク基板1が、そ
の外周面で3つのローラ3a、3b、3cの外周面に挟
まれて縦姿勢に保持された状態が示されている。一方の
回転研磨体2aの回転軸心は、ディスク基板1の回転軸
心に平行に移動でき、距離aが調整可能なものとするこ
とができるようになっている。このとき本発明では、回
転研磨体2aの直径をDとしたとき、D>D1−D2であ
ることが必要である。
FIG. 3 is a diagram for explaining the positional relationship between the disk substrate 1 having the outer diameter D1 and the inner diameter D2 and the rotational axis of the rotary abrasive body 2. As shown in FIG. FIG. 3 shows a state in which the disk substrate 1 is held in a vertical position by being sandwiched between the outer peripheral surfaces of the three rollers 3a, 3b, 3c on the outer peripheral surface. The rotation axis of one of the rotary abrasive bodies 2a can move in parallel with the rotation axis of the disk substrate 1 so that the distance a can be adjusted. At this time, in the present invention, when the diameter of the rotary polishing body 2a is D, it is necessary that D> D1−D2.

【0019】回転研磨体2は、金属製またはセラミクス
製の定盤上に研磨パッドを貼りつけたものや、定盤の表
面に所定粒度のダイヤモンド砥石を貼りつけたものを用
いることができる。図4(a)、図4(b)は、本発明
に用いることのできる回転研磨体の一実施例の形態の平
面図および断面図である。図4(a)では、金属製の円
板20の片面には研磨液供給孔6につながる溝22が定
盤の外周に向かって放射状に設けられている。溝22は
渦巻き状や格子状等としてもよい。
The rotary abrasive body 2 may be a metal or ceramic surface plate with a polishing pad attached thereto, or a surface plate to which a diamond grindstone of a predetermined grain size is attached. FIGS. 4A and 4B are a plan view and a cross-sectional view of an embodiment of a rotary abrasive body that can be used in the present invention. In FIG. 4A, a groove 22 connected to the polishing liquid supply hole 6 is radially provided on one surface of the metal disk 20 toward the outer periphery of the platen. The groove 22 may have a spiral shape or a lattice shape.

【0020】定盤面には樹脂製の研磨パッド21が貼り
つけられている。研磨液供給孔6より供給される研磨液
では、研磨パッド21が定盤20の表面に加工された溝
の表面にならうようにして貼りつけられることによりで
きる溝の上に供給される。研磨パッド21は、必ずしも
定盤の溝22内面に密着させて貼りつけておく必要はな
く、定盤の溝22と研磨パッド21の間に隙間がある状
態で貼りつけてあってもよい。
A polishing pad 21 made of resin is adhered to the surface of the platen. The polishing liquid supplied from the polishing liquid supply hole 6 is supplied onto a groove formed by attaching the polishing pad 21 so as to follow the surface of the groove formed on the surface of the surface plate 20. The polishing pad 21 does not necessarily have to be adhered in close contact with the inner surface of the groove 22 of the surface plate, and may be bonded in a state where there is a gap between the groove 22 of the surface plate and the polishing pad 21.

【0021】研磨加工時においては、溝部の研磨パッド
の面には加工荷重がかからないために、溝に沿って研磨
液が供給されるからである。定盤にダイヤモンド砥石を
貼りつけて回転研磨体とする場合は、貼りつけるダイヤ
モンド砥石片を上記のような溝ができるようにするのが
よい。
This is because a polishing load is not applied to the surface of the polishing pad in the groove during the polishing process, so that the polishing liquid is supplied along the groove. When a diamond grindstone is stuck to a surface plate to form a rotary abrasive body, it is preferable that the diamond grindstone pieces to be stuck have grooves as described above.

【0022】本発明の研磨方法の実施に用いられる研磨
剤としては、平均砥粒が0.2μm〜2μm程度の酸化
セリウム、ダイヤモンド砥粒、炭化ケイ素砥粒、アルミ
ナ砥粒、ジルコニア砥粒、酸化マンガン砥粒、酸化鉄砥
粒等を純水またはアルカリ性の液に分散させたものや、
平均粒径が0.02μm〜0.2μm程度のコロイダル
シリカを用いることができる。また、ダイヤモンド砥石
等の固定砥粒を用いてもよい。
The abrasive used in the polishing method of the present invention includes cerium oxide having an average abrasive of about 0.2 μm to 2 μm, diamond abrasive, silicon carbide abrasive, alumina abrasive, zirconia abrasive, Manganese abrasive grains, iron oxide abrasive grains, etc. dispersed in pure water or alkaline liquid,
Colloidal silica having an average particle size of about 0.02 μm to 0.2 μm can be used. Further, fixed abrasive grains such as a diamond grindstone may be used.

【0023】研磨剤を保持する研磨パッドとしては、ウ
レタン製のスエードのパッド、発泡ウレタン製のパッ
ド、不織布のパッドなどのシート状のものを用いること
ができる。さらに、機械加工や熱プレスによる溝付きの
研磨パッドであってもよい。
As the polishing pad for holding the polishing agent, a sheet-like pad such as a urethane suede pad, a foamed urethane pad, or a non-woven fabric pad can be used. Further, a polishing pad having a groove formed by machining or hot pressing may be used.

【0024】(実施例)図1に示す両面研磨装置を用い
て、外径が65mm、内径が20mm、厚さ0.65m
mのアルミノシリケートガラス製のディスク基板につい
て、後述するオフセット量を変化させて研磨を行った。
その研磨条件は下記の通りである。
(Embodiment) Using the double-side polishing apparatus shown in FIG. 1, an outer diameter is 65 mm, an inner diameter is 20 mm, and a thickness is 0.65 m.
For a disk substrate made of aluminosilicate glass having a thickness of m, polishing was performed while changing the offset amount described later.
The polishing conditions are as follows.

【0025】1)回転研磨体:直径70mmのステンレ
ス製定盤に、ウレタン製のスエードの研磨パッド(第一
レース株式会社製、製品名シーガル1900)を貼りつ
けたもの。 2)定盤:図4に示すように、幅5mm、深さ0.5m
mの断面がR形状である溝を6本設けたもの。 3)研磨液の供給 軸心から溝を経て供給:回転研磨体の一方の回転軸心に
設けた研磨液供給孔から、平均粒径が約1μmの酸化セ
リウムを純水に分散させたものを、毎分3〜10mL供
給する。 4)回転研磨体の回転数:800rpm 5)ディスク基板の回転数:1000rpm 6)回転研磨体の押圧力:約5kgf 7)ディスク基板の回転中心と回転研磨体の回転軸心と
の距離:25mm 8)ディスク基板外周端から回転研磨体の回転軸心まで
の距離 (オフセット量)a:−10mm〜+10mm
1) Rotary polishing body: A polishing pad made of urethane suede (product name: Seagull 1900, manufactured by Daiichi Race Co., Ltd.) adhered to a stainless steel surface plate having a diameter of 70 mm. 2) Surface plate: As shown in FIG. 4, width 5 mm, depth 0.5 m
The one provided with six grooves each having an m-shaped cross section. 3) Supply of polishing liquid Supply through the groove from the axis: A polishing liquid supply hole provided in one of the rotation axes of the rotary polishing body is obtained by dispersing cerium oxide having an average particle size of about 1 μm in pure water. And supply 3-10 mL per minute. 4) Number of rotations of the rotary abrasive body: 800 rpm 5) Number of rotations of the disk substrate: 1000 rpm 6) Pressing force of the rotary abrasive body: about 5 kgf 7) Distance between the center of rotation of the disk substrate and the rotation axis of the rotary abrasive body: 25 mm 8) Distance from the outer edge of the disk substrate to the axis of rotation of the rotary abrasive body (offset amount) a: -10 mm to +10 mm

【0026】ディスクの半径位置による相対的な研磨量
の結果を図5に示す。なお図5の縦軸は相対研磨量であ
る。図から明らかなように、回転研磨体の回転軸心をデ
ィスク外周の外側にオフセットすることで、ディスク基
板の内周端から外周端にわたる研磨量を平均化できるこ
とがわかる。
FIG. 5 shows the result of the relative polishing amount depending on the radial position of the disk. The vertical axis in FIG. 5 is the relative polishing amount. As can be seen from the drawing, the amount of polishing from the inner peripheral edge to the outer peripheral edge of the disk substrate can be averaged by offsetting the rotation axis of the rotary abrasive body to the outside of the disk outer periphery.

【0027】つまり、上述した65×20mmのディス
ク基板における最適なオフセット量は、6mmであるこ
とがわかる。
That is, it is understood that the optimum offset amount in the above-mentioned 65 × 20 mm disk substrate is 6 mm.

【0028】さらにこの最適なオフセット量は、以下の
ように算出することが可能である。つまり、以下の手順
である。 (1)パラメータを入力する。 ・パッドの外径、・パッドの回転数、 ・ディスクの外径、・ディスクの内径、・ディスクの回
転数 ・オフセット量 (2)内径から外径におけるディスクとパッドの相対速
度差を算出する。 (3)求めた相対速度差を積算して研磨量を評価する。 (4)オフセット量を変化させて、順次研磨量を評価す
る。
Further, the optimum offset amount can be calculated as follows. That is, the following procedure is performed. (1) Input parameters. The outer diameter of the pad, the number of rotations of the pad, the outer diameter of the disk, the inner diameter of the disk, the number of rotations of the disk, the offset amount (2) The relative speed difference between the disk and the pad at the outer diameter from the inner diameter is calculated. (3) The obtained relative speed difference is integrated to evaluate the polishing amount. (4) The polishing amount is sequentially evaluated by changing the offset amount.

【0029】このようにして、オフセット量を変化させ
て、ディスクの内径から外径における研磨量との関係を
求めることによって、最適なオフセット量を求めること
ができる。
As described above, the optimum offset amount can be obtained by changing the offset amount and obtaining the relationship between the inner diameter and the outer diameter of the disk and the polishing amount.

【0030】さらに種々の内外径を有するディスク基板
においても、同様にして最適なオフセット量を求めるこ
とができる。
Further, the optimum offset amount can be similarly obtained for disk substrates having various inner and outer diameters.

【0031】[0031]

【発明の効果】本発明には、ディスク基板の研磨方法に
おいて、研磨体の回転軸心をディスク基板外周端の外側
にオフセットし、ディスク基板の内周端から外周端にわ
たる研磨量を平均化できるので、ディスク基板の外周近
傍における面ダレを防ぐことができる。
According to the present invention, in the method for polishing a disk substrate, the rotation axis of the polishing body is offset to the outside of the outer peripheral edge of the disk substrate, and the amount of polishing from the inner peripheral edge to the outer peripheral edge of the disk substrate can be averaged. Therefore, surface sagging near the outer periphery of the disk substrate can be prevented.

【0032】さらには、ディスク基板の内周端から外周
端にわたる研磨量を平均化できるので、ディスク基板の
効率的な研磨が可能となった。
Furthermore, the amount of polishing from the inner peripheral edge to the outer peripheral edge of the disk substrate can be averaged, so that the disk substrate can be efficiently polished.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の適用できる両面研磨装置の全体側面図
である。
FIG. 1 is an overall side view of a double-side polishing apparatus to which the present invention can be applied.

【図2】ディスク基板の縦姿勢保持手段と強制回転手段
の一形態を説明する図である。
FIG. 2 is a view for explaining one mode of a vertical attitude holding means and a forced rotation means of a disk substrate.

【図3】本発明の研磨方法にかかるディスク基板と回転
研磨体の位置関係を示す図である。
FIG. 3 is a diagram showing a positional relationship between a disk substrate and a rotary polishing body according to the polishing method of the present invention.

【図4】回転研磨体の一実施の形態の平面図および断面
図である。
FIG. 4 is a plan view and a cross-sectional view of an embodiment of the rotary abrasive body.

【図5】オフセット量と研磨量の関係を示すグラフであ
る。
FIG. 5 is a graph showing a relationship between an offset amount and a polishing amount.

【符号の説明】[Explanation of symbols]

1:ディスク基板 2:回転研磨体 3:ローラ 4:縦姿勢保持手段 5:架台 6:研磨液供給孔 7:電動モータ 8:ベルト 9:輸送ポンプ 10:レール 11:押圧装置 12:スライダー部 13:回転軸筒体 14:軸受体 15、16:プーリ 17:研磨液 18:貯蔵タンク 19:強制回転用モータ 20:定盤 21:研磨パッド 22:溝 41:支柱 42:横梁 43:移動金具 44:支持金具 50:研磨装置 1: Disk substrate 2: Rotary polishing body 3: Roller 4: Vertical posture holding means 5: Stand 6: Polishing liquid supply hole 7: Electric motor 8: Belt 9: Transport pump 10: Rail 11: Pressing device 12: Slider section 13 : Rotating shaft cylinder 14: Bearing body 15, 16: Pulley 17: Polishing liquid 18: Storage tank 19: Motor for forced rotation 20: Surface plate 21: Polishing pad 22: Groove 41: Post 42: Cross beam 43: Moving fitting 44 : Support bracket 50 : Polishing device

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 3C043 BC06 CC04 CC07 DD05 EE04 3C049 AA07 AA09 AA11 AA16 AA18 AB01 AB06 CA01 CB01 3C058 AA07 AA09 AA11 AA16 AA18 AB01 AB06 CB01 DA17 5D112 AA02 BA03 BA06 GA09 GA12 ──────────────────────────────────────────────────続 き Continued on the front page F-term (reference)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 外径D1と内径D2のディスク基板の表裏
両面を、前記基板の両面に対向させて設けた一対の回転
研磨体で挟み当てつけて、同時に研磨するディスク基板
の研磨方法において、 前記基板を姿勢保持手段により保持し、かつ強制的に回
転させるとともに、前記一対の回転研磨体は、直径Dが
(D>D1−D2)の関係を満足し、さらに前記研磨体の
回転軸心を前記基板外周端の外側にオフセットして、 前記基板の内周端から外周端にわたる研磨量を平均化し
たことを特徴とするディスク基板の研磨方法。
1. A method for polishing a disk substrate in which both front and rear surfaces of a disk substrate having an outer diameter D1 and an inner diameter D2 are sandwiched by a pair of rotary abrasive bodies provided opposite to both surfaces of the substrate and simultaneously polished. The substrate is held by the posture holding means and is forcibly rotated, and the pair of rotating abrasive bodies have a diameter D satisfying a relationship of (D> D1−D2), and further, the rotation axis of the abrasive body is A method for polishing a disk substrate, characterized in that the amount of polishing from the inner peripheral edge to the outer peripheral edge of the substrate is averaged, offset to the outside of the peripheral edge of the substrate.
【請求項2】 請求項1に記載のディスク基板の研磨方
法において、前記オフセット量を最適化したディスク基
板の研磨方法。
2. The disk substrate polishing method according to claim 1, wherein said offset amount is optimized.
JP2001009695A 2001-01-18 2001-01-18 Polishing method for disk substrate Pending JP2002210640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001009695A JP2002210640A (en) 2001-01-18 2001-01-18 Polishing method for disk substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001009695A JP2002210640A (en) 2001-01-18 2001-01-18 Polishing method for disk substrate

Publications (1)

Publication Number Publication Date
JP2002210640A true JP2002210640A (en) 2002-07-30

Family

ID=18877132

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001009695A Pending JP2002210640A (en) 2001-01-18 2001-01-18 Polishing method for disk substrate

Country Status (1)

Country Link
JP (1) JP2002210640A (en)

Cited By (6)

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JP2004265461A (en) * 2003-01-31 2004-09-24 Nippon Sheet Glass Co Ltd Glass substrate for information recording medium and its manufacturing method
JP2007090452A (en) * 2005-09-27 2007-04-12 Hoya Corp Manufacturing method of glass substrate for magnetic disc and manufacturing method of magnetic disc
JP2008027528A (en) * 2006-07-21 2008-02-07 Jacks:Kk Optical disk polishing device
WO2009110378A1 (en) * 2008-03-03 2009-09-11 Ntn株式会社 Swash plate of swash-plate type compressor and swash-plate type compressor
WO2011058969A1 (en) * 2009-11-10 2011-05-19 昭和電工株式会社 Method for manufacturing glass substrate for use in magnetic recording medium
JP2012089221A (en) * 2010-10-22 2012-05-10 Showa Denko Kk Method for manufacturing glass substrate for magnetic recording medium

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004265461A (en) * 2003-01-31 2004-09-24 Nippon Sheet Glass Co Ltd Glass substrate for information recording medium and its manufacturing method
JP2007090452A (en) * 2005-09-27 2007-04-12 Hoya Corp Manufacturing method of glass substrate for magnetic disc and manufacturing method of magnetic disc
JP4659696B2 (en) * 2006-07-21 2011-03-30 株式会社 ジャックス Optical disc polishing equipment
JP2008027528A (en) * 2006-07-21 2008-02-07 Jacks:Kk Optical disk polishing device
CN102037242A (en) * 2008-03-03 2011-04-27 Ntn株式会社 Swash plate of swash-plate type compressor and swash-plate type compressor
JP2009209727A (en) * 2008-03-03 2009-09-17 Ntn Corp Swash plate for swash plate type compressor, and swash plate type compressor
WO2009110378A1 (en) * 2008-03-03 2009-09-11 Ntn株式会社 Swash plate of swash-plate type compressor and swash-plate type compressor
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US9808894B2 (en) 2008-03-03 2017-11-07 Ntn Corporation Swash plate of a swash plate type compressor and the swash plate type compressor
WO2011058969A1 (en) * 2009-11-10 2011-05-19 昭和電工株式会社 Method for manufacturing glass substrate for use in magnetic recording medium
JP2012064295A (en) * 2009-11-10 2012-03-29 Showa Denko Kk Method for manufacturing glass substrate for magnetic recording medium
JP2012089221A (en) * 2010-10-22 2012-05-10 Showa Denko Kk Method for manufacturing glass substrate for magnetic recording medium
CN102554763A (en) * 2010-10-22 2012-07-11 昭和电工株式会社 Method of manufacturing glass substrate for magnetic recording media
CN102554763B (en) * 2010-10-22 2014-08-13 昭和电工株式会社 Method of manufacturing glass substrate for magnetic recording media

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