JP2002202337A - Jig for fine pitch substrate inspection - Google Patents
Jig for fine pitch substrate inspectionInfo
- Publication number
- JP2002202337A JP2002202337A JP2001032975A JP2001032975A JP2002202337A JP 2002202337 A JP2002202337 A JP 2002202337A JP 2001032975 A JP2001032975 A JP 2001032975A JP 2001032975 A JP2001032975 A JP 2001032975A JP 2002202337 A JP2002202337 A JP 2002202337A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- jig
- circuit board
- printed circuit
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims description 7
- 239000000758 substrate Substances 0.000 title 1
- 239000000523 sample Substances 0.000 claims abstract description 59
- 238000004519 manufacturing process Methods 0.000 description 6
- 125000006850 spacer group Chemical group 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、プリント基板検査器の
治具に関し、特にファインピッチと呼称される集積度の
高いプリント基板検査器用の治具の製作の簡素化と信頼
性の向上に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig for a printed circuit board inspector, and more particularly to a method for manufacturing a jig for a printed circuit board inspector having a high degree of integration called fine pitch and improving the reliability.
【0002】[0002]
【従来の技術】従来、この種のプリント基板検査機用治
具は、複数枚のベース板に対して垂直に複数個のベース
穴を開口し、その穴に垂直に差し込まれる複数個のプロ
ーブとで構成されており、プローブを押す力が加わった
再には、上記ベース板の間隔が大きく開いた部分の空間
で、プローブをたわませる事によって、プローブの動く
ストロークと、バネ性を持たせている。2. Description of the Related Art Conventionally, this type of jig for a printed circuit board inspection machine has a plurality of base holes opened perpendicularly to a plurality of base plates, and a plurality of probes inserted vertically into the holes. When the force that pushes the probe is applied, the probe moves in the space where the distance between the base plates is large, and the probe moves and the spring moves. ing.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、プロー
ブをたわませる構造上、プローブがたわむ方向によって
は、プローブが互いに接触したりぶつかり合ったりする
為、プローブがたわんで曲がる方向を制御するのが難し
く、特にプローブが密集した状態の治具は、製作が困難
であり、最初からプローブに微妙な湾曲をつけて、曲が
る方向をある程度制御してはいるものの、プローブが互
いにぶつかるのを防ぐ有効な手段が無く、プローブの表
面の絶縁処理部分が剥離してショートする可能性がある
事、従来の治具製作の上での大きなネックとなってい
た。However, due to the structure in which the probe bends, it is difficult to control the direction in which the probe bends and bends because the probes may contact or collide with each other depending on the direction in which the probe bends. In particular, jigs with densely packed probes are difficult to manufacture, and although the probe is delicately curved from the beginning to control the bending direction to some extent, it is an effective means to prevent the probes from hitting each other. There is a possibility that the insulated portion on the surface of the probe is peeled off and short-circuited, which has been a major bottleneck in the production of a conventional jig.
【0004】本発明は、従来の上記実状に鑑みてなされ
たものであり、従って本発明の目的は、従来の技術に内
在する上記欠点を解消し、より信頼性の高い治具を提供
することにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional circumstances, and an object of the present invention is to eliminate the above-mentioned disadvantages inherent in the prior art and to provide a more reliable jig. It is in.
【0008】[0008]
【課題を解決する為の手段】上記目的を解決する為に、
本発明に係わるプリント基板検査機用治具では、従来の
治具に、ガイド板を追加することで、プローブのたわむ
方向を常に一方向とし、プローブ同士が接触するのを防
いでいる。Means for Solving the Problems In order to solve the above object,
In the jig for a printed board inspection machine according to the present invention, the guide plate is added to the conventional jig so that the bending direction of the probe is always one direction, and the probes are prevented from contacting each other.
【0009】又、プローブが曲がる方向をコントロール
する為に従来のプローブには最初からわずかな湾曲が設
けられているが、この治具では中央のガイド板を常にわ
ずかに他のガイド板よりもずらして配設することで、プ
ローブに湾曲を与えている為、プローブに自体に湾曲を
設ける必要が無く、ストレートな形状で作ることが可能
となっており、プローブ製造の工数削減に貢献してい
る。Although a conventional probe is provided with a slight curvature from the beginning to control the direction in which the probe bends, this jig always shifts the center guide plate slightly from the other guide plates. Since the probe is curved by disposing it, it is not necessary to provide the probe with a curve, and it is possible to make the probe in a straight shape, contributing to a reduction in the man-hour for probe manufacturing. .
【0010】[0010]
【実施例】次に本発明をその好ましい各実施例について
図面を参照しながら具体的に説明する。Next, preferred embodiments of the present invention will be described in detail with reference to the drawings.
【0011】図1(a)は、従来例の代表的な一例を示
した実施例の正面図であり、(b)は、その側面図、
(c)は、(a)をY−Y′で切断し、矢印の方向に見
た断面図である。FIG. 1A is a front view of an embodiment showing a typical example of a conventional example, and FIG. 1B is a side view thereof.
(C) is a cross-sectional view of (a) taken along the line YY 'and viewed in the direction of the arrow.
【0012】図1(a)〜(c)を参照するに、従来の
代表的な治具では、複数の穴が開口された複数の板状の
ガイド板3〜5と、そのガイド板3、4に開口された穴
に配設されたバネ性を持つ金属製で、細長い棒状のプロ
ーブ1と、ガイド板5に開口された穴に配設され、尚且
つ前記プローブ1に電気的に接触した金属製で細長い棒
状の端子2と、ガイド板3〜5に適当な間隔を与えて固
定する為に、ガイド板3〜5の間にそれぞれ挟まれる形
で配設されるスペーサ6、7で構成される。Referring to FIGS. 1A to 1C, in a conventional typical jig, a plurality of plate-shaped guide plates 3 to 5 having a plurality of holes formed therein, The probe 1 is made of a metal having a spring property and is disposed in the hole opened in the guide plate 5 and is in electrical contact with the probe 1 disposed in the hole opened in the guide plate 5. It is composed of an elongated rod-shaped terminal 2 made of metal and spacers 6 and 7 disposed so as to be interposed between the guide plates 3 to 5 so as to be fixed at appropriate intervals to the guide plates 3 to 5. Is done.
【0013】図2(a)は、図1(c)の中央部分を拡
大した部分断面図であり、(b)は、(a)の作動状態
を示した部分断面図である。FIG. 2A is an enlarged partial cross-sectional view of the central portion of FIG. 1C, and FIG. 2B is a partial cross-sectional view showing the operation state of FIG.
【0014】図2(a)〜(b)を参照するに、従来の
代表的な治具では、(b)の様に治具に対してプリント
基板9が図2の上方向から押し付けられた再、プリント
基板9が、まずはプローブ1を図の下方向へ押し下げ
る。この時、プローブ1は、(a)の様に最初から僅か
な湾曲が与えられている為、湾曲の方向に更に曲がり、
この時に発生する反発力によって、プローブ1は、プリ
ント基板1に適当な圧力で押し付けられる事によって、
確実に電気的に接触する。この状態で端子2からプロー
ブ1を経由してプリント基板9に電流を流すことで、各
種検査を行う。Referring to FIGS. 2A and 2B, in a conventional typical jig, the printed circuit board 9 is pressed against the jig from above in FIG. 2 as shown in FIG. 2B. Again, the printed circuit board 9 first pushes the probe 1 downward in the figure. At this time, the probe 1 is slightly bent from the beginning as shown in FIG.
Due to the repulsive force generated at this time, the probe 1 is pressed against the printed circuit board 1 with an appropriate pressure,
Make reliable electrical contact. In this state, various inspections are performed by passing a current from the terminal 2 to the printed circuit board 9 via the probe 1.
【0015】しかしながら、従来の治具では、プローブ
1が湾曲する方向が正確には決められない為、プローブ
1同士が非常に密集した治具を製作すると、プローブ1
が互いに接触しやすくなり、図2(a)のX−X′の間
をプローブ1の絶縁のためにプローブ1の表面を樹脂等
の絶縁皮膜で覆っているものの、長い間の使用により、
プローブ1同士がぶつかる場所では、絶縁皮膜の剥離に
よるショートなどの事故が起こる可能性があり、従来の
治具製作の大きな問題点だった。However, in the conventional jig, the direction in which the probe 1 bends cannot be determined accurately. Therefore, if a jig in which the probes 1 are extremely dense is manufactured, the probe 1
Are easily in contact with each other, and the surface of the probe 1 is covered with an insulating film such as a resin for insulating the probe 1 between XX ′ in FIG.
In a place where the probes 1 collide with each other, there is a possibility that an accident such as a short circuit due to peeling of the insulating film may occur, which is a major problem of the conventional jig manufacturing.
【0016】図3は、本発明で使用される治具の断面図
である。FIG. 3 is a sectional view of a jig used in the present invention.
【0017】図3を参照するに、本発明で使用される治
具の従来の治具との違いは、プローブ1の長さ方向の中
央付近に配設され、ガイド板3〜5と同じ位置にプロー
ブ1が自由に移動可能な穴が開口された制御板11と、
制御版11を、プローブ1の中央付近に保持し、尚且
つ、制御板11が図3の左右方向に移動可能に配設する
為に設けられた制御板ガイド10と、制御板11の通常
状態の位置を調整する為の制御ネジ12と、プローブ1
に最初から湾曲が与えられずに、直線状となっている事
の4点のみであり、その他の構造は、従来の治具と同様
である。Referring to FIG. 3, the jig used in the present invention is different from the conventional jig in that it is disposed near the center in the longitudinal direction of the probe 1 and has the same position as the guide plates 3 to 5. A control plate 11 having an opening through which the probe 1 can freely move;
A control plate guide 10 provided for holding the control plate 11 near the center of the probe 1 and arranging the control plate 11 so as to be movable in the left-right direction in FIG. 3, and a normal state of the control plate 11 Control screw 12 for adjusting the position of
There are only four points that are not curved from the beginning and are linear, and the other structure is the same as the conventional jig.
【0018】図4(a)は、図3の中央部分を拡大した
部分断面図であり、(b)及び、(c)は、(a)の矢
印で示す部分を更に拡大した部分断面図である。FIG. 4A is an enlarged partial cross-sectional view of a central portion of FIG. 3, and FIGS. 4B and 4C are further enlarged partial cross-sectional views of a portion indicated by an arrow in FIG. is there.
【0019】図4(a)〜(c)を参照するに、本発明
におけるプローブ1の形状は、(b)の様に先端部分が
剣先形状になっているが、この先端形状は球形等、色々
な形状があり、特に限定しない。又、(c)の様に、プ
ローブ1には、従来と同様にプローブ1が治具本体から
抜け落ちない為のストッパー13が存在するが、この部
分の形状も、様々なので、特に限定しない。Referring to FIGS. 4 (a) to 4 (c), the probe 1 of the present invention has a sword tip at the tip as shown in FIG. 4 (b). There are various shapes, and there is no particular limitation. Further, as shown in (c), the probe 1 has a stopper 13 for preventing the probe 1 from falling off from the jig main body as in the related art.
【0020】図5(a)〜(c)は、図4(a)をそれ
ぞれ(a)制御板11の無調整状態、(b)制御板11
を図3で表示した制御ネジ12を使用して正規な位置に
調整した、通常状態、(c)プローブにプリント基板が
押し当てられた作動状態、を示す部分断面図である。FIGS. 5 (a) to 5 (c) show FIGS. 4 (a) as (a) the unadjusted state of the control plate 11 and (b) the control plate 11 respectively.
FIG. 4 is a partial cross-sectional view showing a normal state, in which (c) the printed circuit board is pressed against the probe, in a normal state in which is adjusted to a normal position using the control screw 12 shown in FIG. 3.
【0021】図5(a)〜(c)、を参照するに、プロ
ーブ1は、(a)の様に、従来とは違う湾曲の無いスト
レートな形状をしており、その表面には、従来のプロー
ブと同様の絶縁皮膜処理がなされている。そして、
(b)の様に、図3で示した制御ネジ12をねじ込むこ
とによって、制御ネジ12が、制御板11を図の左方向
に押し出し、すべてのプローブ1に、同じ方向への湾曲
が与えられ、この状態が、本発明における治具の通常状
態となる。Referring to FIGS. 5 (a) to 5 (c), the probe 1 has a straight shape without a curve different from the conventional one as shown in FIG. The same insulating film treatment as that of the probe is performed. And
As shown in FIG. 3B, by screwing in the control screw 12 shown in FIG. 3, the control screw 12 pushes out the control plate 11 to the left in the figure, and all the probes 1 are given a curvature in the same direction. This state is the normal state of the jig in the present invention.
【0022】そして、(c)で示すように、プリント基
板9が、プローブ1に、図の下方向へ押し当てられる
と、プローブ1が湾曲し、その際の発生する反発力によ
って、プリント基板1に適当な圧力で押し付けられる事
によって、確実に電気的に接触する。この状態で端子2
からプローブ1を経由してプリント基板9に電流を流す
ことで、各種検査を行う所までは従来の治具と同様であ
るが、この、プローブが湾曲する方向は、制御板11に
よって、すべてプローブ1が同じ方向となる為、プロー
ブ1同士の接触で絶縁皮膜の剥離が起こり、プローブ1
同士がショートする事故を防止し、治具の信頼性の向上
に大きく貢献するものである。As shown in FIG. 2C, when the printed board 9 is pressed against the probe 1 in the downward direction in the figure, the probe 1 is bent, and the repulsive force generated at that time causes the printed board 9 to be bent. By being pressed with an appropriate pressure, electrical contact is ensured. In this state, terminal 2
By passing a current through the printed circuit board 9 via the probe 1 to perform various inspections, it is the same as a conventional jig. 1 are in the same direction, peeling of the insulating film occurs due to contact between the probes 1, and the probe 1
This prevents accidents in which they are short-circuited, and greatly contributes to improving the reliability of the jig.
【0023】[0023]
【発明の効果】以上説明したように、本発明によれば、
従来のプリント基板検査機用治具に比べ、治具製作の
際、一番数を多く使用する、プローブをストレート形状
とする事で、湾曲を付ける工数を削減し、更に、制御板
の追加によって、治具の信頼性の向上に大きく貢献する
ものである。As described above, according to the present invention,
Compared to conventional jigs for printed circuit board inspection machines, when manufacturing jigs, the number of steps to bend is reduced by making the probe the straight shape, the number of steps to bend is reduced, and by adding a control plate This greatly contributes to improving the reliability of the jig.
【図1】図1(a)は、従来例の代表的な一例を示した
実施例の正面図であり、(b)は、その側面図、(c)
は、(a)をY−Y′で切断し、矢印の方向に見た断面
図である。FIG. 1A is a front view of an embodiment showing a typical example of a conventional example, FIG. 1B is a side view thereof, and FIG.
FIG. 3A is a cross-sectional view taken along the line YY ′ in FIG.
【図2】図2(a)は、図1(c)の中央部分を拡大し
た部分断面図であり、(b)は、(a)の作動状態を示
した部分断面図である。FIG. 2A is an enlarged partial cross-sectional view of a central portion of FIG. 1C, and FIG. 2B is a partial cross-sectional view showing an operation state of FIG.
【図3】図3は、本発明で使用される治具の断面図であ
る。FIG. 3 is a sectional view of a jig used in the present invention.
【図4】図4(a)は、図3の中央部分を拡大した部分
断面図であり、(b)及び、(c)は、(a)の矢印で
示す部分を更に拡大した部分断面図である。4A is a partial cross-sectional view in which a central portion of FIG. 3 is enlarged, and FIGS. 4B and 4C are partial cross-sectional views in which a portion indicated by an arrow in FIG. It is.
【図5】図5(a)〜(c)は、図4(a)をそれぞれ
(a)制御板11の無調整状態、(b)制御板11を図
3で表示した制御ネジ12を使用して正規な位置に調整
した、通常状態、(c)プローブにプリント基板が押し
当てられた作動状態、を示す部分断面図である。FIGS. 5 (a) to 5 (c) respectively show FIGS. 4 (a) using (a) a non-adjusted state of the control plate 11 and (b) using a control screw 12 shown in FIG. FIG. 9 is a partial cross-sectional view illustrating a normal state in which the printed circuit board is pressed against the probe, and a normal state where the printed circuit board is pressed against the probe.
1…プローブ 2…端子 3…ガイド板 4…ガイド板 5…ガイド板 6…スペーサ 7…スペーサ 8…固定ネジ 9…プリント基板 10…制御板ガイド 11…制御板 12…制御ネジ 13…ストッパー 14…ベース部分 DESCRIPTION OF SYMBOLS 1 ... Probe 2 ... Terminal 3 ... Guide plate 4 ... Guide plate 5 ... Guide plate 6 ... Spacer 7 ... Spacer 8 ... Fixing screw 9 ... Printed circuit board 10 ... Control plate guide 11 ... Control plate 12 ... Control screw 13 ... Stopper 14 ... Base part
Claims (1)
数枚、間隔を空け、重ねて構成されるベース部分と、そ
のベース部分に開口された穴をガイドとして、配設され
る細長い棒状のプローブと、前記プローブが軸方向から
の力を受けて、曲がる再に、前記ガイド板の内の1〜2
枚が一定方向にスライドする事で、プローブを一定方向
に、複数本のプローブが互いに接触するのを防ぎなが
ら、バネ性を持たせている事を特徴とするプリント基板
検査機用治具。1. A thin plate-shaped guide plate, a plurality of guide plates spaced apart from each other, a base portion formed by stacking the guide plates, and an elongated member provided with a hole opened in the base portion as a guide. A rod-shaped probe and one or two of the guide plates are bent when the probe is bent by receiving an axial force.
A jig for a printed circuit board inspection machine, wherein a jig is provided with a spring property by sliding a sheet in a certain direction to prevent a plurality of probes from contacting each other in a certain direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001032975A JP2002202337A (en) | 2001-01-04 | 2001-01-04 | Jig for fine pitch substrate inspection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001032975A JP2002202337A (en) | 2001-01-04 | 2001-01-04 | Jig for fine pitch substrate inspection |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002202337A true JP2002202337A (en) | 2002-07-19 |
Family
ID=18896809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001032975A Pending JP2002202337A (en) | 2001-01-04 | 2001-01-04 | Jig for fine pitch substrate inspection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2002202337A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004072661A1 (en) * | 2003-02-17 | 2004-08-26 | Kabushiki Kaisha Nihon Micronics | Electrical connection device |
JP2006226702A (en) * | 2005-02-15 | 2006-08-31 | Nidec-Read Corp | Substrate inspection tool, substrate inspection device, and inspection contactor |
JP2007165391A (en) * | 2005-12-09 | 2007-06-28 | Tsutomu Takahashi | Printed board inspection apparatus and grid conversion board therefor |
JP2008298555A (en) * | 2007-05-31 | 2008-12-11 | Hioki Ee Corp | Probe unit, probe pin and circuit board inspection device |
KR101061593B1 (en) | 2008-04-21 | 2011-09-01 | 윌테크놀러지(주) | Probe card |
KR20160074271A (en) * | 2014-12-18 | 2016-06-28 | 이채갑 | Probe device |
JP2017533446A (en) * | 2015-01-04 | 2017-11-09 | イル キム、 | Inspection contact device |
WO2018190194A1 (en) * | 2017-04-12 | 2018-10-18 | 株式会社日本マイクロニクス | Electrical connection apparatus |
KR20240160318A (en) | 2023-05-02 | 2024-11-11 | 김상한 | Probe pin assembly with vertical probe pins and its fabrication method |
-
2001
- 2001-01-04 JP JP2001032975A patent/JP2002202337A/en active Pending
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004072661A1 (en) * | 2003-02-17 | 2004-08-26 | Kabushiki Kaisha Nihon Micronics | Electrical connection device |
US7119561B2 (en) | 2003-02-17 | 2006-10-10 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
JP2006226702A (en) * | 2005-02-15 | 2006-08-31 | Nidec-Read Corp | Substrate inspection tool, substrate inspection device, and inspection contactor |
JP2007165391A (en) * | 2005-12-09 | 2007-06-28 | Tsutomu Takahashi | Printed board inspection apparatus and grid conversion board therefor |
JP2008298555A (en) * | 2007-05-31 | 2008-12-11 | Hioki Ee Corp | Probe unit, probe pin and circuit board inspection device |
KR101061593B1 (en) | 2008-04-21 | 2011-09-01 | 윌테크놀러지(주) | Probe card |
KR20160074271A (en) * | 2014-12-18 | 2016-06-28 | 이채갑 | Probe device |
KR101716803B1 (en) * | 2014-12-18 | 2017-03-15 | 이채갑 | Probe device |
JP2017533446A (en) * | 2015-01-04 | 2017-11-09 | イル キム、 | Inspection contact device |
WO2018190194A1 (en) * | 2017-04-12 | 2018-10-18 | 株式会社日本マイクロニクス | Electrical connection apparatus |
JP2018179721A (en) * | 2017-04-12 | 2018-11-15 | 株式会社日本マイクロニクス | Electrical connection device |
TWI660179B (en) * | 2017-04-12 | 2019-05-21 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
US10859599B2 (en) | 2017-04-12 | 2020-12-08 | Kabushiki Kaisha Nihon Micronics | Electrical connection apparatus |
KR20240160318A (en) | 2023-05-02 | 2024-11-11 | 김상한 | Probe pin assembly with vertical probe pins and its fabrication method |
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