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JP2001349805A - Light characteristics measurement device, method and recording medium - Google Patents

Light characteristics measurement device, method and recording medium

Info

Publication number
JP2001349805A
JP2001349805A JP2000172964A JP2000172964A JP2001349805A JP 2001349805 A JP2001349805 A JP 2001349805A JP 2000172964 A JP2000172964 A JP 2000172964A JP 2000172964 A JP2000172964 A JP 2000172964A JP 2001349805 A JP2001349805 A JP 2001349805A
Authority
JP
Japan
Prior art keywords
frequency
signal
modulation
phase
amplitude
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000172964A
Other languages
Japanese (ja)
Other versions
JP4465085B2 (en
Inventor
Eiji Kimura
栄司 木村
Kenichi Nakamura
賢一 中村
Satoru Nagumo
悟 南雲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
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Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2000172964A priority Critical patent/JP4465085B2/en
Publication of JP2001349805A publication Critical patent/JP2001349805A/en
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Publication of JP4465085B2 publication Critical patent/JP4465085B2/en
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  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a device for making the frequency of signal for modulation of light source match the frequency of signal for phase detection. SOLUTION: The device comprises a power source 14 for modulation, producing a signal for modulation for giving a frequency fa for modulation used for light modulation, a power source for a frequency direction 26 producing a signal for phase detection, for giving frequency of signal to detect the phase of transmission light, a band-pass filter 16a with a pass range of a specific range from the frequency fa of the signal for modulation, where the signal for phase detection is input, a measurement part 16b for measuring the amplitude of the output results of the band-pass filter 16a, and a frequency adjusting part 18, which makes a frequency fb with the maximum amplitude of the signal for phase detection the frequency fa of the signal for modulation, based on the measurement results of the measurement part 16b. With the frequency adjustment part 18, the frequency fb of the signal for phase detection and the frequency fa of the signal for modulation of the power source can be made to match.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、光ファイバなどの
DUT(Device Under Test)の波長分散特性の測定に関す
る。
TECHNICAL FIELD The present invention relates to an optical fiber and the like.
The present invention relates to measurement of a wavelength dispersion characteristic of a DUT (Device Under Test).

【0002】[0002]

【従来の技術】光ファイバ等の被測定物(DUT)の波長
分散特性を測定するときの測定系の構成を図5に示す。
図5に示すように、測定系は光源システム10と特性測
定システム20に分かれている。光源システム10の可
変波長光源12が波長λxを変化させて光を発生する。
この光は光変調器15により変調用電源14が生成する
変調用信号の周波数faで変調されて、DUT30に入
射される。
2. Description of the Related Art FIG. 5 shows the configuration of a measurement system for measuring the wavelength dispersion characteristics of a device under test (DUT) such as an optical fiber.
As shown in FIG. 5, the measurement system is divided into a light source system 10 and a characteristic measurement system 20. The variable wavelength light source 12 of the light source system 10 changes the wavelength λx to generate light.
This light is modulated by the optical modulator 15 at the frequency fa of the modulation signal generated by the modulation power supply 14 and is incident on the DUT 30.

【0003】DUT30を透過した光は光電変換器22
により電気信号に変換される。この電気信号の位相が位
相比較器24により検出される。この位相からDUT3
0の群遅延や波長分散を求めることができる。
The light transmitted through the DUT 30 is transmitted to a photoelectric converter 22.
Is converted into an electric signal. The phase of this electric signal is detected by the phase comparator 24. From this phase, DUT3
The group delay and chromatic dispersion of 0 can be obtained.

【0004】ここで、光電変換器22が出力する電気信
号は、図6に示すように、周波数faにおいて最大振幅
をとるが、他の周波数においても、振幅が0になるわけ
ではない。そこで、位相比較器24にはバンドパスフィ
ルタを設けて、周波数fa近傍の成分のみを取り出すよ
うにしている。ここで、このバンドパスフィルタが透過
を許容する周波数の幅Δfは一定である。一方、透過を
許容する周波数の中心は外部から与える。そこで、特性
測定システム20の周波数指示用電源26が周波数fb
の位相検出用信号をバンドパスフィルタに与えている。
すなわち、周波数fbは透過を許容する周波数の中心で
ある。なお、fbはfaと等しくなるように設定してい
る。なお、図6において、斜線を引いて示した領域は、
バンドパスフィルタの通過域外である。
Here, the electric signal output from the photoelectric converter 22 has a maximum amplitude at a frequency fa as shown in FIG. 6, but the amplitude does not always become zero at other frequencies. Therefore, a band-pass filter is provided in the phase comparator 24 so as to extract only components near the frequency fa. Here, the width Δf of the frequency at which the band-pass filter allows transmission is constant. On the other hand, the center of the frequency that allows transmission is given from the outside. Therefore, the frequency indicating power supply 26 of the characteristic measuring system 20 is switched to the frequency fb
Is supplied to the band-pass filter.
That is, the frequency fb is the center of the frequency that allows transmission. Note that fb is set to be equal to fa. In FIG. 6, the hatched area indicates
It is outside the pass band of the band pass filter.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、fbと
faとは、厳密には周波数差をもっている。例えば、f
b=fa=3GHzに設定しても、10KHz程度の周
波数差が存在する。すると、図7に示すように、バンド
パスフィルタが透過を許容する周波数の帯域に、faが
含まれなくなる。特に、透過を許容する周波数の帯域が
狭い場合は、faが含まれなくなることが多い。する
と、周波数faの成分が過度に減衰し、信号感度が低下
する。透過を許容する周波数の帯域を広くすれば、周波
数faの成分が過度に減衰することを回避できるが、S
/N比(signal to noise ratio)が悪くなる。しか
も、群遅延特性や距離測定に関し、基準となる周波数が
異なってしまうため、測定された値が異なり、機器間の
個体差が発生する。
However, strictly speaking, fb and fa have a frequency difference. For example, f
Even if b = fa = 3 GHz, there is a frequency difference of about 10 KHz. Then, as shown in FIG. 7, fa is not included in the band of the frequency at which the band-pass filter allows transmission. In particular, when the band of the frequency that allows transmission is narrow, fa is often not included. Then, the component of the frequency fa is excessively attenuated, and the signal sensitivity is reduced. If the frequency band allowing transmission is widened, the component of the frequency fa can be prevented from being excessively attenuated.
/ N ratio (signal to noise ratio) becomes worse. In addition, since the reference frequency differs for the group delay characteristic and the distance measurement, the measured values differ, and individual differences between devices occur.

【0006】そこで、本発明は、光源の変調用信号の周
波数と、位相検出用信号の周波数とを一致させる装置等
を提供することを課題とする。
Accordingly, an object of the present invention is to provide an apparatus or the like for matching the frequency of a modulation signal of a light source with the frequency of a phase detection signal.

【0007】[0007]

【課題を解決するための手段】請求項1に記載の発明
は、光を透過する被測定物の特性を測定する装置であっ
て、変調に使用する変調用周波数を与える変調用信号を
生成する変調用信号生成手段と、可変波長光を変調用周
波数で変調した入射光を被測定物に供給する光変調手段
と、位相を検出すべき信号の周波数を与える位相検出用
信号を生成する位相検出用信号生成手段と、入射光が被
測定物を透過した透過光の内の、位相を検出すべき信号
の周波数成分の位相を検出する位相検出手段と、変調用
信号の周波数から所定の範囲内の周波数の、位相検出用
信号の振幅を計測する振幅計測手段と、振幅計測手段の
計測結果に基づき、位相検出用信号の振幅が最大になる
周波数を、変調用信号の周波数にする周波数合わせ手段
と、を備え、位相に基づき被測定物の特性を計測するよ
うに構成される。
According to a first aspect of the present invention, there is provided an apparatus for measuring characteristics of an object to be measured which transmits light, and generates a modulation signal for providing a modulation frequency used for modulation. Modulation signal generation means, optical modulation means for supplying incident light obtained by modulating variable wavelength light at a modulation frequency to a device under test, and phase detection for generating a phase detection signal for providing a frequency of a signal whose phase is to be detected Signal generation means, phase detection means for detecting the phase of the frequency component of the signal whose phase is to be detected, of the transmitted light whose incident light has passed through the device under test, and within a predetermined range from the frequency of the modulation signal. Amplitude measuring means for measuring the amplitude of the phase detection signal at a frequency of the frequency, and frequency adjusting means for setting the frequency at which the amplitude of the phase detection signal is maximum to the frequency of the modulation signal based on the measurement result of the amplitude measurement means And the phase Hazuki configured to measure a property of the object to be measured.

【0008】上記のように構成された光特性測定装置に
よれば、周波数合わせ手段により、位相検出用信号の周
波数と、変調用信号の周波数と、を一致させることがで
きる。
[0008] According to the optical characteristic measuring device configured as described above, the frequency of the phase detection signal and the frequency of the modulation signal can be matched by the frequency matching means.

【0009】請求項2に記載の発明は、請求項1に記載
の発明であって、振幅計測手段は、変調用信号の周波数
から所定の範囲内を通過域とし、位相検出用信号が入力
されるバンドパスフィルタと、バンドパスフィルタの出
力結果の振幅を計測する計測手段と、を備えるように構
成される。
According to a second aspect of the present invention, in the first aspect, the amplitude measuring means sets a pass band within a predetermined range from the frequency of the modulation signal, and receives the phase detection signal. And a measuring means for measuring the amplitude of the output result of the band-pass filter.

【0010】請求項3に記載の発明は、請求項1または
2に記載の発明であって、変調用信号生成手段が、変調
用信号の周波数を変化させることができるように構成さ
れる。
The invention according to claim 3 is the invention according to claim 1 or 2, wherein the modulation signal generating means is configured to be able to change the frequency of the modulation signal.

【0011】請求項4に記載の発明は、請求項3に記載
の発明であって、変調用信号の周波数の変化の幅が、変
調用信号の周波数と位相検出用信号の周波数との差分以
上であるように構成される。
The invention according to claim 4 is the invention according to claim 3, wherein the variation width of the frequency of the modulation signal is equal to or greater than the difference between the frequency of the modulation signal and the frequency of the phase detection signal. Is configured to be

【0012】請求項5に記載の発明は、光を透過する被
測定物の特性を測定する方法であって、変調に使用する
変調用周波数を与える変調用信号を生成する変調用信号
生成工程と、可変波長光を変調用周波数で変調した入射
光を被測定物に供給する光変調工程と、位相を検出すべ
き信号の周波数を与える位相検出用信号を生成する位相
検出用信号生成工程と、入射光が被測定物を透過した透
過光の内の、位相を検出すべき信号の周波数成分の位相
を検出する位相検出工程と、変調用信号の周波数から所
定の範囲内の周波数の、位相検出用信号の振幅を計測す
る振幅計測工程と、振幅計測工程の計測結果に基づき、
位相検出用信号の振幅が最大になる周波数を、変調用信
号の周波数にする周波数合わせ工程と、を備え、位相に
基づき被測定物の特性を計測するように構成される。
According to a fifth aspect of the present invention, there is provided a method for measuring characteristics of an object to be measured which transmits light, the method comprising a step of generating a modulation signal for providing a modulation frequency to be used for modulation. An optical modulation step of supplying incident light obtained by modulating the variable wavelength light with a modulation frequency to the device under test, and a phase detection signal generation step of generating a phase detection signal that gives the frequency of the signal whose phase is to be detected, A phase detecting step of detecting a phase of a frequency component of a signal whose phase is to be detected, of a transmitted light in which the incident light has transmitted through the device under test; Based on the measurement result of the amplitude measurement step for measuring the amplitude of the
A frequency adjustment step of setting the frequency at which the amplitude of the phase detection signal is maximized to the frequency of the modulation signal, so as to measure the characteristics of the device under test based on the phase.

【0013】請求項6に記載の発明は、光を透過する被
測定物の特性を測定する処理をコンピュータに実行させ
るためのプログラムを記録したコンピュータによって読
み取り可能な記録媒体であって、変調に使用する変調用
周波数を与える変調用信号を生成する変調用信号生成処
理と、可変波長光を変調用周波数で変調した入射光を被
測定物に供給する光変調処理と、位相を検出すべき信号
の周波数を与える位相検出用信号を生成する位相検出用
信号生成処理と、入射光が被測定物を透過した透過光の
内の、位相を検出すべき信号の周波数成分の位相を検出
する位相検出処理と、変調用信号の周波数から所定の範
囲内の周波数の、位相検出用信号の振幅を計測する振幅
計測処理と、振幅計測処理の計測結果に基づき、位相検
出用信号の振幅が最大になる周波数を、変調用信号の周
波数にする周波数合わせ処理と、を備え、位相に基づき
被測定物の特性を計測する記録媒体である。
According to a sixth aspect of the present invention, there is provided a computer-readable recording medium having recorded thereon a program for causing a computer to execute a process of measuring characteristics of an object through which light passes, and which is used for modulation. Signal generation processing for generating a modulation signal that provides a modulation frequency to be modulated, optical modulation processing for supplying incident light obtained by modulating variable wavelength light with the modulation frequency to the device under test, and processing of a signal whose phase is to be detected. Phase detection signal generation processing for generating a phase detection signal for giving a frequency, and phase detection processing for detecting the phase of the frequency component of the signal whose phase is to be detected in the transmitted light whose incident light has passed through the device under test An amplitude measurement process for measuring the amplitude of the phase detection signal at a frequency within a predetermined range from the frequency of the modulation signal, and an amplitude of the phase detection signal based on the measurement result of the amplitude measurement process. The frequency at which the large, and a frequency adjustment process of the frequency of the modulation signal, a recording medium for measuring the characteristics of the object to be measured based on the phase.

【0014】[0014]

【発明の実施の形態】以下、本発明の実施の形態を図面
を参照して説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0015】図1は、本発明の実施形態にかかる光特性
測定装置の構成を示すブロック図である。本発明の実施
形態にかかる光特性測定装置は、DUT30の一端に接
続される光源システム10と、DUT30の他端に接続
される特性測定システム20と、を有する。DUT30
は、光を透過するものであって、例えば光ファイバであ
る。
FIG. 1 is a block diagram showing a configuration of an optical characteristic measuring device according to an embodiment of the present invention. The optical characteristic measuring device according to the embodiment of the present invention includes a light source system 10 connected to one end of the DUT 30 and a characteristic measuring system 20 connected to the other end of the DUT 30. DUT30
Is a device that transmits light, and is, for example, an optical fiber.

【0016】光源システム10は、可変波長光源12、
変調用電源14、光変調器15、振幅計測部16、周波
数合わせ部18を備える。可変波長光源12は、波長を
変化させられる可変波長光を生成する。可変波長光源1
2によって、可変波長光の波長λxを掃引することがで
きる。変調用電源14は、光変調器15に、可変波長光
を変調すべき周波数(変調用周波数)faの変調用信号
を与える。変調用電源14は、変調用周波数faを掃引
し、変化させることができる。光変調器15は、可変波
長光を変調用周波数faで変調して、DUT30に入射
する。光変調器15は、リチウム・ナイオベート(L
N)を有することが一般的であるが、光の強度を変調で
きるものであれば、LNを含んでいなくてもよい。
The light source system 10 includes a variable wavelength light source 12,
A power supply for modulation 14, an optical modulator 15, an amplitude measuring unit 16, and a frequency adjusting unit 18 are provided. The variable wavelength light source 12 generates variable wavelength light whose wavelength can be changed. Variable wavelength light source 1
2, the wavelength λx of the variable wavelength light can be swept. The modulation power supply 14 supplies the optical modulator 15 with a modulation signal having a frequency (modulation frequency) fa at which the variable wavelength light is to be modulated. The modulation power supply 14 can sweep and change the modulation frequency fa. The optical modulator 15 modulates the variable wavelength light at the modulation frequency fa and makes the light enter the DUT 30. The optical modulator 15 includes a lithium niobate (L
N) is common, but LN need not be included as long as the light intensity can be modulated.

【0017】振幅計測部16は、バンドパスフィルタ1
6aと、計測部16bと、を有する。バンドパスフィル
タ16aは、その通過域が変調用電源14の変調用周波
数faから所定の範囲内、例えば±Δf/2である。バ
ンドパスフィルタ16aの通過域を、センター周波数か
ら±Δf/2にすることが一般的であり、センター周波
数を変調用周波数faに厳密に一致させることが可能で
ある。なお、入力される信号の周波数が変調用周波数f
aから所定の範囲を超えれば、出力信号が大きく減衰す
る。バンドパスフィルタ16aには、後述する周波数指
示用電源26の出力する電気信号が入力される。バンド
パスフィルタ16aは、周波数指示用電源26の出力す
る電気信号の内、通過域内の周波数成分を主に出力す
る。計測部16bは、バンドパスフィルタ16aから出
力される電気信号の最大値と、この電気信号が最大値を
とるときの周波数とを計測して、周波数合わせ部18に
出力する。
The amplitude measuring section 16 includes the band-pass filter 1
6a and a measuring unit 16b. The bandpass filter 16a has a passband within a predetermined range from the modulation frequency fa of the modulation power supply 14, for example, ± Δf / 2. Generally, the pass band of the band-pass filter 16a is set to ± Δf / 2 from the center frequency, and the center frequency can be strictly matched with the modulation frequency fa. Note that the frequency of the input signal is the modulation frequency f
If a exceeds a predetermined range from a, the output signal is greatly attenuated. The bandpass filter 16a receives an electric signal output from a power supply 26 for frequency instruction, which will be described later. The band-pass filter 16a mainly outputs the frequency components in the pass band among the electric signals output from the frequency indicating power supply 26. The measuring unit 16b measures the maximum value of the electric signal output from the bandpass filter 16a and the frequency at which the electric signal takes the maximum value, and outputs the measured value to the frequency matching unit 18.

【0018】周波数合わせ部18は、周波数指示用電源
26の出力する電気信号(位相検出用信号)の振幅が最
大になる周波数に、変調用電源14の変調用周波数fa
を合わせる。周波数指示用電源26は位相を検出すべき
信号の周波数fbの位相検出用信号を発生するようにし
ている。しかし、図3(a)に示すように、他の周波数
成分の電気信号が混合された形で、バンドパスフィルタ
16aに入力される。ここで、周波数指示用電源26の
生成する位相検出用信号は周波数fbにおいて振幅が最
大になる。よって、周波数合わせ部18は、周波数fb
に、変調用電源14の変調用周波数faを合わせること
になる。
The frequency adjusting section 18 adjusts the modulation frequency fa of the modulation power supply 14 to a frequency at which the amplitude of the electric signal (phase detection signal) output from the frequency indicating power supply 26 becomes maximum.
To match. The frequency indicating power supply 26 generates a phase detection signal having a frequency fb of a signal whose phase is to be detected. However, as shown in FIG. 3A, electric signals of other frequency components are input to the band-pass filter 16a in a mixed form. Here, the amplitude of the phase detection signal generated by the frequency indicating power supply 26 becomes maximum at the frequency fb. Therefore, the frequency matching unit 18 determines the frequency fb
Then, the modulation frequency fa of the modulation power supply 14 is adjusted.

【0019】DUT30に入射した光は、DUT30を
透過する。DUT30を透過した光を透過光という。
Light incident on the DUT 30 passes through the DUT 30. Light transmitted through the DUT 30 is called transmitted light.

【0020】特性測定システム20は、光電変換器2
2、位相検出器24、周波数指示用電源26を備える。
The characteristic measuring system 20 includes the photoelectric converter 2
2. It has a phase detector 24 and a power supply 26 for frequency indication.

【0021】光電変換器22は、透過光を電気信号に変
換する。位相検出器24は、バンドパスフィルタ24a
と、位相比較器24bと、を有する。バンドパスフィル
タ24aは、その通過域が周波数指示用電源26の生成
する位相検出用信号の周波数fbから所定の範囲内、例
えば±Δf/2である。なお、入力される信号の周波数
が周波数fbから所定の範囲を超えれば、出力信号が大
きく減衰する。バンドパスフィルタ24aには、光電変
換器22の出力する電気信号が入力される。バンドパス
フィルタ24aは、光電変換器22の出力する電気信号
の内、通過域内の周波数成分を主に出力する。位相比較
器24bは、バンドパスフィルタ24aの出力する電気
信号の位相を、基準となる電気信号の位相と比較して、
それらの位相差を検出する。基準となる電気信号とは、
例えば、DUT30において波長分散が最小となる波長
の光を入射したときの透過光を光電変換したものであ
る。周波数指示用電源26は、バンドパスフィルタ16
aおよびバンドパスフィルタ24aに周波数fbの位相
検出用信号を与える。
The photoelectric converter 22 converts the transmitted light into an electric signal. The phase detector 24 includes a band-pass filter 24a
And a phase comparator 24b. The pass band of the band-pass filter 24a is within a predetermined range, for example, ± Δf / 2 from the frequency fb of the phase detection signal generated by the frequency indicating power supply 26. If the frequency of the input signal exceeds a predetermined range from the frequency fb, the output signal is greatly attenuated. An electric signal output from the photoelectric converter 22 is input to the bandpass filter 24a. The band-pass filter 24a mainly outputs the frequency components in the pass band among the electric signals output from the photoelectric converter 22. The phase comparator 24b compares the phase of the electric signal output from the bandpass filter 24a with the phase of the reference electric signal,
The phase difference between them is detected. The reference electric signal is
For example, the transmission light when the light having the wavelength with the minimum chromatic dispersion is incident on the DUT 30 is photoelectrically converted. The frequency indicating power supply 26 is connected to the bandpass filter 16.
a and a band-pass filter 24a are supplied with a phase detection signal having a frequency fb.

【0022】次に、本発明の実施形態の動作を図2のフ
ローチャートを用いて説明する。
Next, the operation of the embodiment of the present invention will be described with reference to the flowchart of FIG.

【0023】光源システム10の可変波長光源12が波
長を変化させて光を発生する。この光は光変調器15に
より電源14の生成する変調用信号の変調用周波数fa
で変調されて、DUT30に入射される。
The variable wavelength light source 12 of the light source system 10 changes the wavelength to generate light. This light is modulated by the optical modulator 15 at the modulation frequency fa of the modulation signal generated by the power supply 14.
And is incident on the DUT 30.

【0024】DUT30を透過した光は光電変換器22
により電気信号に変換される。この電気信号がバンドパ
スフィルタ24aに入力されて、周波数指示用電源26
の生成する位相検出用信号の周波数fb近傍の成分のみ
が取り出される。そして、位相比較器24bによって、
バンドパスフィルタ24aの出力信号と、基準となる電
気信号との位相差が計測される。よって、faとfbと
が一致していれば、位相比較器24bによる位相差の計
測が正確になる。位相差から、DUT30の群遅延、波
長分散などを求めるので、faとfbとが一致していれ
ば、DUT30の波長分散などを正確に求められる。
The light transmitted through the DUT 30 is transmitted to the photoelectric converter 22
Is converted into an electric signal. This electric signal is input to the band-pass filter 24a, and the power
Only the components near the frequency fb of the phase detection signal generated by are extracted. Then, by the phase comparator 24b,
The phase difference between the output signal of the bandpass filter 24a and the reference electric signal is measured. Therefore, if fa and fb match, the phase difference measurement by the phase comparator 24b becomes accurate. Since the group delay, chromatic dispersion, and the like of the DUT 30 are obtained from the phase difference, if fa and fb match, the chromatic dispersion of the DUT 30 can be accurately obtained.

【0025】ここで、faとfbとを一致させるための
手順を説明する。まず、周波数指示用電源26の生成す
る位相検出用信号の周波数fbを固定しておき、振幅計
測部16のバンドパスフィルタ16aに入力する(S1
0)。バンドパスフィルタ16aに入力される電気信号
の波形は図3(a)に示すように、周波数指示用電源2
6の生成する位相検出用信号の周波数fbにおいて最大
値Amaxをとるが、周波数fb以外の周波数成分も含む。
Here, a procedure for matching fa and fb will be described. First, the frequency fb of the phase detection signal generated by the frequency indicating power supply 26 is fixed and input to the band-pass filter 16a of the amplitude measuring unit 16 (S1).
0). The waveform of the electric signal input to the band-pass filter 16a is, as shown in FIG.
Although the maximum value Amax is obtained at the frequency fb of the phase detection signal generated by No. 6, frequency components other than the frequency fb are also included.

【0026】次に、変調用電源14の生成する変調用信
号の変調用周波数faを掃引するものとし、掃引を完了
したかを判定する(S12)。掃引が完了していなけれ
ば(S12、No)、変調用周波数faを掃引する(S
14)。変調用周波数faの掃引は、図3(b)に示す
ように、変調用周波数faを大きくするようにする。こ
こで、変調用faを掃引する下限(初期値f0)と上限
(最終値f1)とが決められているものとする。なお、
掃引の方法は、本実施形態のように単調増加に限らず、
単調減少あるいは減少と増加を組み合わせるなど任意で
ある。また、変調用電源14の発生する変調用信号の周
波数の変化の幅f1―f0は、faとfbとの差異より
も、わずかに多めにする。例えば、faとfbとを1GH
zに設定してあれば、f1―f0=30kHz程度にしてお
く。また、バンドパスフィルタ16aは、センター周波
数と厳密に一致する変調用周波数faから±Δf/2を
通過域としているので、変調用周波数faを掃引すれ
ば、バンドパスフィルタ16aの通過域も変化する。な
お、図3(b)において斜線を引いて示した領域は、バ
ンドパスフィルタ16aの通過域外である。
Next, it is assumed that the modulation frequency fa of the modulation signal generated by the modulation power supply 14 is swept, and it is determined whether the sweep is completed (S12). If the sweep has not been completed (S12, No), the modulation frequency fa is swept (S12).
14). In the sweeping of the modulation frequency fa, the modulation frequency fa is increased as shown in FIG. Here, it is assumed that a lower limit (initial value f0) and an upper limit (final value f1) for sweeping the modulation fa are determined. In addition,
The sweep method is not limited to monotonic increase as in the present embodiment,
It is arbitrary such as monotonically decreasing or combining decreasing and increasing. Further, the width f1-f0 of the change in the frequency of the modulation signal generated by the modulation power supply 14 is slightly larger than the difference between fa and fb. For example, if fa and fb are 1GH
If it is set to z, f1−f0 = about 30 kHz. Further, since the bandpass filter 16a has a passband of ± Δf / 2 from the modulation frequency fa that exactly matches the center frequency, if the modulation frequency fa is swept, the passband of the bandpass filter 16a also changes. . Note that the hatched region in FIG. 3B is outside the pass band of the bandpass filter 16a.

【0027】そして、計測部16bは、バンドパスフィ
ルタ16aの通過域におけるバンドパスフィルタ16a
の出力信号の振幅の最大値および振幅が最大値をとると
きの周波数を計測する(S16)。図3(a)と図3
(b)とを重ね合わせると、図3(c)になる。図3
(c)に示すような場合では、通過域内では、周波数が
fa+Δf/2のときに振幅が最大になる。なお、fa
がfbよりも充分に大きくなれば、周波数がfa−Δf
/2のときに振幅が最大になる。また、図3(d)に示
すように、faがfbとほぼ等しくなれば、周波数がf
bのときに振幅が最大になる。
Then, the measuring section 16b performs the operation of the band-pass filter 16a in the pass band of the band-pass filter 16a.
Then, the maximum value of the amplitude of the output signal and the frequency at which the amplitude takes the maximum value are measured (S16). FIG. 3 (a) and FIG.
FIG. 3C is obtained by superimposing (b). FIG.
In the case shown in (c), the amplitude becomes maximum when the frequency is fa + Δf / 2 in the pass band. Note that fa
Becomes sufficiently larger than fb, the frequency becomes fa−Δf
At / 2, the amplitude becomes maximum. Also, as shown in FIG. 3D, if fa becomes substantially equal to fb, the frequency becomes f
The amplitude becomes maximum at b.

【0028】なお、計測部16bは、バンドパスフィル
タ16aの通過域におけるバンドパスフィルタ16aの
出力信号の振幅の最大値等を周波数合わせ部18に記録
する。記録の様式を図4に示す。変調用周波数faは初
期値f0から最終値f1まで掃引され、掃引の途中にf
bの近傍f’をとる。fa=f0のときは、f0+Δf
/2にて最大値をとる。fa=f1のときは、f1―Δ
f/2にて最大値をとる。fa=f’のときは、fbに
て最大値Amaxをとる。
The measuring section 16b records in the frequency matching section 18 the maximum value of the amplitude of the output signal of the band-pass filter 16a in the pass band of the band-pass filter 16a. The format of the recording is shown in FIG. The modulation frequency fa is swept from the initial value f0 to the final value f1, and during the sweep, f
Take the neighborhood f ′ of b. When fa = f0, f0 + Δf
/ 2 takes the maximum value. When fa = f1, f1−Δ
It takes the maximum value at f / 2. When fa = f ', the maximum value Amax is taken at fb.

【0029】図2に戻り、計測された最大値等は、周波
数合わせ部18に記録される。そして、掃引完了の判定
(S12)に戻る。
Returning to FIG. 2, the measured maximum value and the like are recorded in the frequency matching unit 18. Then, the process returns to the determination of the completion of the sweep (S12).

【0030】掃引が完了すれば(S12、Yes)、周
波数合わせ部18は、変調用電源14の変調用周波数f
aが掃引された全領域(f0からf1まで)において、
バンドパスフィルタ16aの振幅が最大になる周波数fa
_maxを求める(S18)。図4に示すように、faを掃
引していった時の振幅の最大値が周波数合わせ部18に
記録されているので、振幅の最大値のなかで最も大きい
値Amaxをとる時の周波数がfa_maxである。
When the sweep is completed (S12, Yes), the frequency adjusting unit 18 sets the modulation frequency f
In the entire region (from f0 to f1) where a has been swept,
Frequency fa at which the amplitude of the band-pass filter 16a becomes maximum
_max is obtained (S18). As shown in FIG. 4, since the maximum value of the amplitude when sweeping fa is recorded in the frequency matching unit 18, the frequency at which the maximum value Amax among the maximum values of the amplitude is taken is fa_max. It is.

【0031】そして、周波数合わせ部18は、faをfa
_maxに合わせる(S20)。fa_maxはfbであるので、
faとfbとが一致することになる。
Then, the frequency adjusting unit 18 sets fa to fa.
_max (S20). Since fa_max is fb,
fa and fb match.

【0032】なお、変調用電源14の変調用周波数fa
が掃引された全領域(f0からf1まで)において、バ
ンドパスフィルタ16aの振幅が最大になる周波数fa_m
axを求めることができれば、他の方法によっても構わな
い。例えば、変調用周波数faを掃引していったときの
振幅の微分値を求めておき、0になったときの周波数を
fa_maxとしてもよい。
The modulation frequency fa of the modulation power supply 14
Is the frequency fa_m at which the amplitude of the band-pass filter 16a becomes maximum in the entire area (from f0 to f1) where
As long as ax can be obtained, another method may be used. For example, the differential value of the amplitude when the modulation frequency fa is swept is obtained, and the frequency when the amplitude becomes 0 is calculated.
It may be fa_max.

【0033】本実施形態によれば、faとfbとを一致
させることができる。よって、バンドパスフィルタ16
aに、通過域が狭いバンドパスフィルタ、例えば1Hz
程度のものを使用することができ、位相差、群遅延等の
計測誤差を小さくすることができる。しかも、群遅延特
性や距離測定に関し、基準となる周波数を一致させられ
るため、測定された値が一致し、機器間の個体差が無く
なる。
According to this embodiment, fa and fb can be matched. Therefore, the bandpass filter 16
a, a bandpass filter having a narrow pass band, for example, 1 Hz
It is possible to use those of the order, and it is possible to reduce measurement errors such as a phase difference and a group delay. In addition, since the reference frequencies for the group delay characteristics and the distance measurement can be matched, the measured values match, and individual differences between devices are eliminated.

【0034】また、上記の実施形態は、以下のようにし
て実現できる。CPU、ハードディスク、メディア(フ
ロッピー(登録商標)ディスク、CD−ROMなど)読
み取り装置を備えたコンピュータのメディア読み取り装
置に、上記の各部分を実現するプログラムを記録したメ
ディアを読み取らせて、ハードディスクにインストール
する。このような方法でも、上記の機能を実現できる。
The above embodiment can be realized as follows. The CPU, hard disk, and media (floppy (registered trademark) disk, CD-ROM, etc.) having a reader for reading a medium having a program for realizing the above parts are read by a media reader of a computer equipped with the reader and installed on the hard disk. I do. Even with such a method, the above function can be realized.

【0035】[0035]

【発明の効果】本発明によれば、光源の変調周波数と、
周波数合わせ手段により、位相検出用信号の周波数と、
変調用信号の周波数と、を一致させることができる。
According to the present invention, the modulation frequency of the light source,
By the frequency matching means, the frequency of the phase detection signal,
The frequency of the modulation signal can be matched.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施形態にかかる光特性測定装置の構
成を示すブロック図である。
FIG. 1 is a block diagram showing a configuration of an optical characteristic measuring device according to an embodiment of the present invention.

【図2】本発明の実施形態の動作を示すフローチャート
である。
FIG. 2 is a flowchart showing the operation of the embodiment of the present invention.

【図3】バンドパスフィルタ16aへの入力信号(図3
(a))、バンドパスフィルタ16aの通過域(図3
(b))、バンドパスフィルタ16aによるフィルタリ
ング(図3(c)(d))を示す図である。
FIG. 3 shows an input signal to the band-pass filter 16a (FIG. 3)
(A)), the pass band of the band-pass filter 16a (FIG. 3)
FIG. 3B is a diagram illustrating filtering by the bandpass filter 16a (FIGS. 3C and 3D).

【図4】周波数合わせ部18に記録されるバンドパスフ
ィルタ16aの通過域におけるバンドパスフィルタ16
aの出力信号の振幅の最大値等の記録様式を示す図であ
る。
FIG. 4 shows a bandpass filter 16 in a pass band of a bandpass filter 16a recorded in a frequency matching unit 18.
FIG. 6 is a diagram illustrating a recording format such as a maximum value of the amplitude of the output signal of FIG.

【図5】従来技術における光ファイバ等の被測定物(DU
T)の波長分散特性を測定するときの測定系の構成を示
すブロック図である。
FIG. 5 shows an object to be measured (DU) such as an optical fiber in the prior art.
It is a block diagram which shows the structure of the measurement system when measuring the wavelength dispersion characteristic of T).

【図6】従来技術における光電変換器22が出力する電
気信号を示す図である。
FIG. 6 is a diagram showing an electric signal output by a photoelectric converter 22 according to the related art.

【図7】従来技術におけるバンドパスフィルタが透過を
許容する周波数の帯域と、変調周波数との差異を示す図
である。
FIG. 7 is a diagram illustrating a difference between a modulation frequency and a band of a frequency in which a band-pass filter according to the related art allows transmission.

【符号の説明】[Explanation of symbols]

10 光源システム 12 可変波長光源 14 変調用電源 15 光変調器 16 振幅計測部 18 周波数合わせ部 20 特性測定システム 22 光電変換器 24 位相検出器 26 周波数指示用電源 30 DUT Reference Signs List 10 light source system 12 variable wavelength light source 14 power supply for modulation 15 optical modulator 16 amplitude measuring unit 18 frequency matching unit 20 characteristic measuring system 22 photoelectric converter 24 phase detector 26 power supply for frequency indication 30 DUT

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】光を透過する被測定物の特性を測定する装
置であって、 変調に使用する変調用周波数を与える変調用信号を生成
する変調用信号生成手段と、 可変波長光を前記変調用周波数で変調した入射光を前記
被測定物に供給する光変調手段と、 位相を検出すべき信号の周波数を与える位相検出用信号
を生成する位相検出用信号生成手段と、 前記入射光が前記被測定物を透過した透過光の内の、位
相を検出すべき信号の周波数成分の位相を検出する位相
検出手段と、 前記変調用信号の周波数から所定の範囲内の周波数の、
前記位相検出用信号の振幅を計測する振幅計測手段と、 前記振幅計測手段の計測結果に基づき、前記位相検出用
信号の振幅が最大になる周波数を、前記変調用信号の周
波数にする周波数合わせ手段と、 を備え、 前記位相に基づき前記被測定物の特性を計測する光特性
測定装置。
1. An apparatus for measuring characteristics of an object to be measured which transmits light, comprising: a modulation signal generating means for generating a modulation signal for providing a modulation frequency to be used for modulation; Optical modulation means for supplying incident light modulated at a frequency for use to the device under test; phase detection signal generating means for generating a phase detection signal for providing a frequency of a signal whose phase is to be detected; and Of the transmitted light transmitted through the device under test, phase detection means for detecting the phase of the frequency component of the signal whose phase is to be detected, and a frequency within a predetermined range from the frequency of the modulation signal,
Amplitude measuring means for measuring the amplitude of the signal for phase detection; and frequency matching means for setting the frequency at which the amplitude of the signal for phase detection becomes maximum to the frequency of the signal for modulation based on the measurement result of the amplitude measuring means. And an optical characteristic measuring device for measuring characteristics of the device under test based on the phase.
【請求項2】前記振幅計測手段は、 前記変調用信号の周波数から所定の範囲内を通過域と
し、前記位相検出用信号が入力されるバンドパスフィル
タと、 前記バンドパスフィルタの出力結果の振幅を計測する計
測手段と、 を備えた請求項1に記載の光特性測定装置。
2. A band-pass filter to which a pass range is set within a predetermined range from the frequency of the modulation signal, wherein the amplitude detection means receives the phase detection signal, and an amplitude of an output result of the band-pass filter. The optical characteristic measuring apparatus according to claim 1, further comprising: a measuring unit configured to measure the optical characteristic.
【請求項3】前記変調用信号生成手段が、前記変調用信
号の周波数を変化させることができる請求項1または2
に記載の光特性測定装置。
3. The modulation signal generating means can change the frequency of the modulation signal.
The optical characteristic measuring device according to 1.
【請求項4】前記変調用信号の周波数の変化の幅が、前
記変調用信号の周波数と前記位相検出用信号の周波数と
の差分以上である、請求項3に記載の光特性測定装置。
4. The optical characteristic measuring apparatus according to claim 3, wherein a variation width of the frequency of the modulation signal is equal to or larger than a difference between the frequency of the modulation signal and the frequency of the phase detection signal.
【請求項5】光を透過する被測定物の特性を測定する方
法であって、 変調に使用する変調用周波数を与える変調用信号を生成
する変調用信号生成工程と、 可変波長光を前記変調用周波数で変調した入射光を前記
被測定物に供給する光変調工程と、 位相を検出すべき信号の周波数を与える位相検出用信号
を生成する位相検出用信号生成工程と、 前記入射光が前記被測定物を透過した透過光の内の、位
相を検出すべき信号の周波数成分の位相を検出する位相
検出工程と、 前記変調用信号の周波数から所定の範囲内の周波数の、
前記位相検出用信号の振幅を計測する振幅計測工程と、 前記振幅計測工程の計測結果に基づき、前記位相検出用
信号の振幅が最大になる周波数を、前記変調用信号の周
波数にする周波数合わせ工程と、 を備え、 前記位相に基づき前記被測定物の特性を計測する光特性
測定方法。
5. A method for measuring characteristics of an object to be measured which transmits light, comprising: a modulation signal generating step of generating a modulation signal for providing a modulation frequency used for modulation; A light modulation step of supplying incident light modulated at a frequency for use to the device under test, a phase detection signal generating step of generating a phase detection signal for providing a frequency of a signal whose phase is to be detected, Of the transmitted light transmitted through the device under test, a phase detection step of detecting the phase of the frequency component of the signal whose phase is to be detected, and a frequency within a predetermined range from the frequency of the modulation signal,
An amplitude measuring step of measuring the amplitude of the phase detection signal; and a frequency matching step of setting a frequency at which the amplitude of the phase detection signal is maximum to a frequency of the modulation signal based on the measurement result of the amplitude measurement step. And an optical characteristic measuring method for measuring characteristics of the device under test based on the phase.
【請求項6】光を透過する被測定物の特性を測定する処
理をコンピュータに実行させるためのプログラムを記録
したコンピュータによって読み取り可能な記録媒体であ
って、 変調に使用する変調用周波数を与える変調用信号を生成
する変調用信号生成処理と、 可変波長光を前記変調用周波数で変調した入射光を前記
被測定物に供給する光変調処理と、 位相を検出すべき信号の周波数を与える位相検出用信号
を生成する位相検出用信号生成処理と、 前記入射光が前記被測定物を透過した透過光の内の、位
相を検出すべき信号の周波数成分の位相を検出する位相
検出処理と、 前記変調用信号の周波数から所定の範囲内の周波数の、
前記位相検出用信号の振幅を計測する振幅計測処理と、 前記振幅計測処理の計測結果に基づき、前記位相検出用
信号の振幅が最大になる周波数を、前記変調用信号の周
波数にする周波数合わせ処理と、 を備え、 前記位相に基づき前記被測定物の特性を計測する記録媒
体。
6. A computer-readable recording medium having recorded thereon a program for causing a computer to execute a process of measuring characteristics of an object to be measured that transmits light, wherein the modulation is for providing a modulation frequency to be used for modulation. Signal generation processing for generating an optical signal, optical modulation processing for supplying incident light obtained by modulating variable wavelength light with the modulation frequency to the device under test, and phase detection for providing the frequency of a signal whose phase is to be detected Phase detection signal generation processing for generating a signal for use, phase detection processing for detecting the phase of the frequency component of the signal whose phase is to be detected, of the transmitted light in which the incident light has passed through the device under test, Of a frequency within a predetermined range from the frequency of the modulation signal,
An amplitude measurement process for measuring the amplitude of the phase detection signal; and a frequency matching process for setting a frequency at which the amplitude of the phase detection signal is maximum to a frequency of the modulation signal based on a measurement result of the amplitude measurement process. And a recording medium for measuring characteristics of the device under test based on the phase.
JP2000172964A 2000-06-09 2000-06-09 Optical characteristic measuring apparatus, method, and recording medium Expired - Fee Related JP4465085B2 (en)

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