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JP2001255252A - Sample conveyance device - Google Patents

Sample conveyance device

Info

Publication number
JP2001255252A
JP2001255252A JP2000067856A JP2000067856A JP2001255252A JP 2001255252 A JP2001255252 A JP 2001255252A JP 2000067856 A JP2000067856 A JP 2000067856A JP 2000067856 A JP2000067856 A JP 2000067856A JP 2001255252 A JP2001255252 A JP 2001255252A
Authority
JP
Japan
Prior art keywords
holding member
sample
sample holding
attaching
rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000067856A
Other languages
Japanese (ja)
Inventor
Takaaki Amakusa
貴昭 天草
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP2000067856A priority Critical patent/JP2001255252A/en
Publication of JP2001255252A publication Critical patent/JP2001255252A/en
Withdrawn legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)

Abstract

PROBLEM TO BE SOLVED: To lower the height of a member arranged over the sample replacement position. SOLUTION: This sample conveyance device is equipped with a sample holding member support device 4 having a sample holding member locking part and arranged on the sample observation position P1, a wire W wound on a wire hoist 11 arranged over the sample replacement position P2 over the sample observation position P1, a sample holding member SH connected to the lower end of the wire W and having a member to be locked movable between the locking position locked by the sample holding member locking part and the uncoupling position uncoupled from the sample holding member locking part, a sample holding member removing rod support member 14 arranged over the sample replacement position P2 and supported movably, and a sample holding member removal rod 21 supported on the upper end thereof by the sample holding member removing rod support member 14, for moving the member to be locked between the locking position and the uncoupling position when the sample holding member removing rod support member 14 is moved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、走査型プローブ顕
微鏡の試料を保持した試料保持部材を試料交換位置とそ
の下方の試料観察位置との間で搬送し、前記試料観察位
置に配置された試料保持部材支持装置に前記試料保持部
材を着脱させることが可能な試料搬送装置に関する。本
発明は、STM(Scanning Tunneling Microscope、走
査型トンネル顕微鏡)、AFM(Atomic Force Microsc
ope、原子間力顕微鏡)、UHV(Ulutra High Vacuu
m)−STM(超高真空走査型トンネル顕微鏡)、UH
V(Ulutra High Vacuum)−AFM(超高真空原子間
力顕微鏡)等の走査型プローブ顕微鏡等で、使用するこ
とができる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for transporting a sample holding member holding a sample of a scanning probe microscope between a sample exchange position and a sample observation position below the sample exchange position. The present invention relates to a sample transfer device capable of attaching and detaching the sample holding member to and from a holding member support device. The present invention relates to STM (Scanning Tunneling Microscope, scanning tunneling microscope), AFM (Atomic Force Microsc
ope, atomic force microscope), UHV (Ulutra High Vacuu)
m) -STM (Ultra High Vacuum Scanning Tunneling Microscope), UH
It can be used with a scanning probe microscope such as V (Ulutra High Vacuum) -AFM (ultra high vacuum atomic force microscope).

【0002】[0002]

【従来の技術】前記走査型プローブ顕微鏡において、ク
ライオスタット(冷却容器)を用いたUHV冷却装置の
UHV(Ultra High Vacuum)チャンバ内で試料を冷却
した状態で観察する場合、UHVチャンバの底部の観察
位置とその上方の試料交換位置との間で試料を保持した
試料保持部材(例えば、STMステージ等)を搬送する
必要がある。その場合、試料を保持する前記試料保持部
材は、MGL(Magnetic Loader)の搬送ロッドや、ベ
ルト式搬送ロッド等を用いて、UHVチャンバ底部の観
察位置に搬送され、熱接触をとるために、ステージ支持
部材に着脱可能に装着(固定)される。
2. Description of the Related Art In the above-mentioned scanning probe microscope, when observing a sample cooled in a UHV (Ultra High Vacuum) chamber of a UHV cooling device using a cryostat (cooling vessel), an observation position at the bottom of the UHV chamber. It is necessary to transport a sample holding member (for example, an STM stage or the like) holding a sample between the sample and a sample exchange position thereabove. In this case, the sample holding member for holding the sample is transported to the observation position at the bottom of the UHV chamber using a transport rod of MGL (Magnetic Loader), a belt-type transport rod, or the like. It is detachably attached (fixed) to the support member.

【0003】前記MGL(Magnetic Loader)の搬送ロ
ッドや、ベルト式搬送ロッド等を用いた試料搬送装置と
しては、次の従来技術(1),(2)が公知である。 (1)図9に示す技術 図9は試料搬送装置の従来例の説明図で、図9Aは試料
保持部材が試料交換位置にある状態を示す図、図9Bは
試料保持部材が試料観察位置にある状態を示す図ある。
図9において、除振部材01を介して支持されたクライ
オスタット02内部のUHV(Ultra High Vacuum)イ
ンナチャンバ03底部の試料観察位置P1にはSTMセ
ル支持装置(試料保持部材支持装置)04が配置されて
いる。STMセル支持装置04は、STMセル(試料を
保持したSTMステージ)SHを固定支持するための装
置である。前記UHVインナチャンバ03の上方のUH
Vチャンバ内に設定された試料交換位置P2の上方には
円筒状の搬送ロッド収容部06が上下方向に延びて設け
られている。円筒状の搬送ロッド収容部06内にはMG
L搬送ロッド(試料搬送部材)07がスライド可能且つ
回転可能に支持され、搬送ロッド収容部06の外側には
MGLマグネット08がスライド可能且つ回転可能に支
持されている。前記MGLマグネット08をスライド移
動させることにより、MGL搬送ロッド07下端に保持
したSTMセル(試料保持部材)SHを試料交換位置P
2(図9A参照)からUHVインナチャンバ03底部の
試料観察位置P1に搬送(図9B参照)する。STMセ
ルSHがSTMセル支持装置04に搬送された状態で、
MGLマグネット08を回転させて前記MGL搬送ロッ
ド07を回転させると、STMセルSHがSTMセル支
持装置04に固定される。
[0003] The following prior arts (1) and (2) are known as sample transfer devices using a transfer rod of the MGL (Magnetic Loader), a belt-type transfer rod, and the like. (1) Technique shown in FIG. 9 FIG. 9 is an explanatory view of a conventional example of a sample transfer device, FIG. 9A is a diagram showing a state in which a sample holding member is at a sample exchange position, and FIG. FIG. 3 is a diagram showing a certain state.
In FIG. 9, an STM cell support device (sample holding member support device) 04 is disposed at a sample observation position P1 at the bottom of a UHV (Ultra High Vacuum) inner chamber 03 inside a cryostat 02 supported via a vibration isolation member 01. ing. The STM cell support device 04 is a device for fixedly supporting an STM cell (STM stage holding a sample) SH. UH above the UHV inner chamber 03
Above the sample exchange position P2 set in the V chamber, a cylindrical transport rod housing 06 is provided extending in the vertical direction. MG in the cylindrical transfer rod housing 06
An L transport rod (sample transport member) 07 is slidably and rotatably supported, and an MGL magnet 08 is slidably and rotatably supported outside the transport rod housing 06. By sliding the MGL magnet 08, the STM cell (sample holding member) SH held at the lower end of the MGL transport rod 07 is moved to the sample exchange position P.
2 (see FIG. 9A) to the sample observation position P1 at the bottom of the UHV inner chamber 03 (see FIG. 9B). In a state where the STM cell SH is transported to the STM cell support device 04,
When the MGL transport rod 07 is rotated by rotating the MGL magnet 08, the STM cell SH is fixed to the STM cell support device 04.

【0004】(2)図10に示す技術 図10は試料搬送装置の他の従来例の説明図で、図10
Aは試料保持部材が試料交換位置にある状態を示す図、
図10Bは試料保持部材が試料観察位置にある状態を示
す図ある。図10の説明において前記図9の構成要素と
同一の構成要素には同一の符号を付して重複する詳細な
説明は省略する。図10において、下端にSTMセルS
Hを連結した搬送ロッド07は、ベルト011に連結さ
れている。ベルト回転用回転導入機012によりベルト
011を回転させると、前記搬送ロッド07は上下移動
して、前記STMセルSHが前記試料観察位置のSTM
セル支持装置04に搬送される。STMセルSHがST
Mセル支持装置04に搬送された状態で、ロッド回転用
回転導入機013により前記搬送ロッド07を回転させ
ると、STMセルSHがSTMセル支持装置04に固定
される。
(2) Technique shown in FIG. 10 FIG. 10 is an explanatory view of another conventional example of the sample transfer apparatus.
A is a diagram showing a state where the sample holding member is at the sample exchange position,
FIG. 10B is a diagram illustrating a state where the sample holding member is at the sample observation position. In the description of FIG. 10, the same components as those of FIG. 9 are denoted by the same reference numerals, and overlapping detailed description will be omitted. In FIG. 10, an STM cell S is provided at the lower end.
The transport rod 07 to which H is connected is connected to the belt 011. When the belt 011 is rotated by the rotation introducing device 012 for belt rotation, the transport rod 07 moves up and down, and the STM cell SH moves to the STM at the sample observation position.
It is transported to the cell support device 04. STM cell SH is ST
When the transport rod 07 is rotated by the rod rotation rotation introducing device 013 while being transported to the M cell support device 04, the STM cell SH is fixed to the STM cell support device 04.

【0005】[0005]

【発明が解決しようとする課題】前記図9または図10
に示すように、クライオスタット02は高さがあるた
め、その中にあるUHVインナチャンバ03はクライオ
スタット02の高さに応じた長さが必要になる。長いU
HVインナチャンバ03の底部の観察位置に試料ステー
ジや試料ホルダ等を搬送するためには、搬送ロッド07
の長さは、そのUHVインナチャンバ03の長さと同等
の長さが必要となる。したがって、クライオスタット0
2の上部に前記搬送ロッド07の長さに応じた長さの搬
送ロッド収容部06が必要となる。このため、前記搬送
ロッド収容部06はクライオスタット02の上部に高く
延びることになる。このため、装置全体の高さが高くな
り、一般的な設置室に収まらないことが多い。このた
め、設置室を別に設けたり、設置室を改造したりする必
要が生じてくる。また、STM等のように原子、分子レ
ベルの分解能を要する装置においては、装置の高さが除
振台から上方に高くなるほど、振動等が増幅され易く、
分解能を落としてしまう。
FIG. 9 or FIG.
As shown in (1), since the cryostat 02 has a height, the UHV inner chamber 03 in the cryostat 02 needs to have a length corresponding to the height of the cryostat 02. Long U
In order to transport the sample stage, the sample holder, and the like to the observation position at the bottom of the HV inner chamber 03, the transport rod 07 is required.
Needs to be the same length as the length of the UHV inner chamber 03. Therefore, cryostat 0
A transport rod housing 06 having a length corresponding to the length of the transport rod 07 is required on the upper part of the transport rod 07. For this reason, the transport rod accommodation portion 06 extends high above the cryostat 02. For this reason, the height of the whole apparatus becomes high, and it often cannot be accommodated in a general installation room. For this reason, it becomes necessary to provide a separate installation room or to modify the installation room. In an apparatus such as an STM that requires resolution at the atomic or molecular level, vibrations and the like are easily amplified as the height of the apparatus increases from the vibration isolation table.
The resolution is reduced.

【0006】本発明は前述の事情に鑑み、下記(O01)
の記載内容を課題とする。(O01)試料観察位置に設け
た試料保持部材支持装置とその上方に設定された試料交
換位置との間で試料保持部材を搬送し且つ試料保持部材
を前記試料保持部材支持装置に着脱可能に装着する試料
搬送装置において、前記試料交換位置の上方に配置する
部材の高さを低くすること。
In view of the above circumstances, the present invention provides the following (O01)
Is the subject of the description. (O01) The sample holding member is transported between the sample holding member support device provided at the sample observation position and the sample exchange position set above the sample holding member support device, and the sample holding member is detachably attached to the sample holding member support device. The height of a member disposed above the sample exchange position is reduced in the sample transport device.

【0007】[0007]

【課題を解決するための手段】次に、前記課題を解決し
た本発明を説明するが、本発明の要素には、後述の実施
例の要素との対応を容易にするため、実施例の要素の符
号をカッコで囲んだものを付記する。また、本発明を後
述の実施例の符号と対応させて説明する理由は、本発明
の理解を容易にするためであり、本発明の範囲を実施例
に限定するためではない。
Means for Solving the Problems Next, the present invention which has solved the above-mentioned problems will be described. Elements of the present invention include elements of the embodiments to facilitate correspondence with the elements of the embodiments described later. The sign of parentheses is added in parentheses. The reason why the present invention is described in correspondence with the reference numerals of the embodiments described below is to facilitate understanding of the present invention and not to limit the scope of the present invention to the embodiments.

【0008】(本発明)前記課題を解決するために、本
発明の試料搬送装置は、下記の要件(A01)〜(A05)
を備えたことを特徴とする、(A01)試料保持部材係止
部(9b)を有し且つ試料観察位置(P1)に配置され
た試料保持部材支持装置(4)、(A02)試料観察位置
(P1)に搬送された状態で、前記試料保持部材係止部
(9b)に係止される係止位置と前記試料保持部材係止
部(9b)から離脱した離脱位置との間で移動可能な被
係止部材(29)を有する試料保持部材(SH)、(A
03)前記試料観察位置(P1)の上方の試料交換位置
(P2)の上方に配置され、移動可能に支持された試料
保持部材着脱用ロッド支持部材(14)、(A04)上端
が前記試料保持部材着脱用ロッド支持部材(14)に支
持されるとともに前記試料保持部材着脱用ロッド支持部
材(14)の移動時に前記被係止部材(29)を前記係
止位置と前記離脱位置との間で移動させる試料保持部材
着脱ロッド(21)、(A05)前記試料保持部材着脱用
ロッド支持部材(14)の下方に配置されるとともに、
前記試料観察位置(P1)とその上方の試料交換位置
(P2)との間で前記試料保持部材(SH)を搬送する
試料保持部材搬送装置(11+W)。
(The present invention) In order to solve the above-mentioned problems, the sample transport apparatus of the present invention has the following requirements (A01) to (A05)
(A01) a sample holding member support device (4) having a sample holding member locking portion (9b) and arranged at a sample observation position (P1), (A02) a sample observation position While being transported to (P1), it is movable between a locking position where it is locked by the sample holding member locking portion (9b) and a detached position where it is detached from the sample holding member locking portion (9b). Sample holding member (SH) having a simple locked member (29), (A)
03) A rod support member (14) for mounting and dismounting a sample holding member, which is disposed above the sample exchange position (P2) above the sample observation position (P1) and movably supported, and (A04) the upper end of which holds the sample. The locked member (29) is supported by the member attaching / detaching rod support member (14) and moves the locked member (29) between the locked position and the detached position when the sample holding member attaching / detaching rod support member (14) moves. A sample holding member attaching / detaching rod (21) to be moved, (A05) being disposed below the sample holding member attaching / detaching rod support member (14);
A sample holding member transfer device (11 + W) for transferring the sample holding member (SH) between the sample observation position (P1) and a sample exchange position (P2) above the sample observation position (P1);

【0009】(本発明の作用)前記構成を備えた本発明
の試料搬送装置では、試料保持部材係止部(9b)を有
する試料保持部材支持装置(4)は試料観察位置(P
1)に配置される。試料保持部材搬送装置(11+W)
は、試料交換位置(P2)の上方の試料保持部材着脱用
ロッド支持部材(14)の下方に配置されており、前記
試料観察位置(P1)とその上方の試料交換位置(P
2)との間で試料保持部材(SH)を搬送する。前記試
料保持部材(SH)は、前記試料保持部材係止部(9
b)に係止される係止位置と前記試料保持部材係止部
(9b)から離脱した離脱位置との間で移動可能な被係
止部材(29)を有する。前記試料交換位置(P2)の
上方に配置された試料保持部材着脱用ロッド支持部材
(14)は、移動可能に支持される。上端が前記試料保
持部材着脱用ロッド支持部材(14)に上端が支持され
た試料保持部材着脱ロッド(21)は、前記試料保持部
材着脱用ロッド支持部材(14)の移動時に前記被係止
部材(29)を前記係止位置と前記離脱位置との間で移
動させる。前記試料保持部材(SH)の被係止部材(2
9)が前記試料保持部材支持装置(4)の試料保持部材
係止部(9b)に係止される係止位置に移動した状態で
は、試料保持部材(SH)は試料保持部材支持装置
(4)に固定された状態となる。したがって、本発明で
は、試料保持部材(SH)の移動は試料保持部材搬送装
置(11+W)によって行われ、試料保持部材支持装置
(4)に対する試料保持部材(SH)の着脱は試料保持
部材着脱ロッド(21)によって行われる。
(Operation of the present invention) In the sample transporting apparatus of the present invention having the above-described configuration, the sample holding member supporting device (4) having the sample holding member locking portion (9b) is located at the sample observation position (P
1). Sample holding member transfer device (11 + W)
Are arranged below the sample holding member attaching / detaching rod support member (14) above the sample exchange position (P2), and the sample observation position (P1) and the sample exchange position (P
The sample holding member (SH) is conveyed to and from 2). The sample holding member (SH) is provided with the sample holding member locking portion (9).
a locking member (29) movable between a locking position locked to b) and a detached position separated from the sample holding member locking portion (9b). The sample holding member attaching / detaching rod support member (14) disposed above the sample exchange position (P2) is movably supported. The sample holding member attaching / detaching rod (21), the upper end of which is supported by the sample holding member attaching / detaching rod supporting member (14), holds the locked member when the sample holding member attaching / detaching rod supporting member (14) moves. (29) is moved between the locking position and the release position. The locked member (2) of the sample holding member (SH)
In a state in which the sample holding member (SH) is moved to a locking position where the sample holding member is locked by the sample holding member locking portion (9b) of the sample holding member supporting device (4), the sample holding member (SH) is moved to the sample holding member supporting device (4). ). Therefore, in the present invention, the movement of the sample holding member (SH) is performed by the sample holding member transport device (11 + W), and the attachment and detachment of the sample holding member (SH) to and from the sample holding member support device (4) are performed. This is performed according to (21).

【0010】前記試料保持部材搬送装置(11+W)
は、試料保持部材(SH)を搬送する機能のみがあれば
良いので、ワイヤ(W)やベルト等の部材を使用して構
成することが可能である。その場合、試料保持部材搬送
装置(11+W)を上方に高く延びるように構成する必
要がなくなる。また、試料保持部材着脱ロッド(21)
は、剛性が必要なためその移動距離に応じた高さが必要
となるが、試料保持部材(SH)を搬送する機能は必要
ではないため、必要な移動距離は少ない。すなわち、前
記試料保持部材着脱ロッド(21)は、試料保持部材支
持装置(4)に対する試料保持部材(SH)の着脱を行
うために必要な移動距離だけ移動すればよい。このた
め、試料保持部材着脱ロッド(21)が上方に移動した
状態でも、試料保持部材着脱ロッド(21)が上方に高
く延びることがない。このため、前記本発明の試料搬送
装置がクライオスタット(冷却容器)内の真空チャンバ
で使用される場合には、真空チャンバ内で移動する試料
保持部材着脱ロッド(21)の収容部を上方に高く形成
する必要がなくなる。したがって、試料搬送装置を収容
した部屋の天井を高くする必要がなくなる。
[0010] The sample holding member transfer device (11 + W)
Need only have a function of transporting the sample holding member (SH), and can be configured using members such as a wire (W) and a belt. In this case, it is not necessary to configure the sample holding member transfer device (11 + W) to extend upward and high. Also, a sample holding member attaching / detaching rod (21)
Requires a rigidity, and therefore requires a height corresponding to the moving distance. However, since the function of transporting the sample holding member (SH) is not required, the necessary moving distance is small. That is, the sample holding member attaching / detaching rod (21) may be moved by a moving distance necessary for attaching / detaching the sample holding member (SH) to / from the sample holding member supporting device (4). For this reason, even when the sample holding member attaching / detaching rod (21) is moved upward, the sample holding member attaching / detaching rod (21) does not extend high upward. For this reason, when the sample transport device of the present invention is used in a vacuum chamber in a cryostat (cooling vessel), the accommodation portion of the sample holding member attaching / detaching rod (21) moving in the vacuum chamber is formed to be higher. You don't have to. Therefore, it is not necessary to raise the ceiling of the room accommodating the sample transport device.

【0011】[0011]

【発明の実施の形態】次に図面を参照しながら、本発明
の試料搬送装置の実施の形態の具体例(実施例)を説明
するが、本発明は以下の実施例に限定されるものではな
い。 (実施例1)図1は本発明の実施例1の試料搬送装置の
全体説明図である。図2は同実施例1の試料搬送装置全
体の作用説明図で、図2Aは試料保持部材を試料交換位
置から下方の試料観察位置の試料保持部材支持装置へ搬
送する途中の状態を示す図、図2Bは試料保持部材を試
料保持部材支持装置に搬送し且つ試料保持部材を試料保
持部材支持装置に着脱させる試料保持部材着脱用ロッド
を着脱位置の上方に移動させた状態を示す図、図2Cは
試料保持部材着脱用ロッドを前記図2Bの位置から下方
に移動させた状態を示す図である。図3は試料保持部材
の説明図で、図3Aは正面図、図3Bは前記図3Aの矢
印IIIBから見た図、図3Cは前記図3AのIIIC−III
C線から見た図、図3Dは前記図3AのIIID−IIID線
断面図、図3Eは前記図3Dに示す着脱用レバーの斜視
図、図3Fは前記図3Dに示すレバー支持部材の斜視図
である。図4は試料保持部材支持装置への試料保持部材
の装着方法の説明図で、図4Aは試料保持部材を試料保
持部材支持装置に搬送した状態を示す図、図4Bは試料
保持部材を試料保持部材着脱用ロッドで試料保持部材支
持装置に押圧した状態を示す図、図4Cは試料保持部材
着脱用ロッドを回転させて試料保持部材を試料保持部材
支持装置に装着した状態を示す図、図4Dは試料保持部
材着脱用ロッドを上方に離脱させた状態を示す図、図4
Eは前記図4AのIVE−IVE線から見た図、図4Fは
前記図4AのIVF−IVF線断面図、図4Gは前記図4
CのIVG−IVG線から見た図、図4Hは前記図4Dの
IVH−IVH線断面図、である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, specific examples (embodiments) of embodiments of the sample transport apparatus of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments. Absent. (Embodiment 1) FIG. 1 is an overall explanatory view of a sample transport apparatus according to Embodiment 1 of the present invention. FIG. 2 is an operation explanatory view of the entire sample transporting apparatus of the first embodiment, and FIG. 2A is a diagram showing a state in which the sample holding member is being transported from a sample exchange position to a sample holding member supporting device at a sample observation position below, FIG. 2B is a view showing a state in which the sample holding member is transported to the sample holding member support device and a sample holding member attaching / detaching rod for attaching and detaching the sample holding member to and from the sample holding member support device is moved above the attachment / detachment position; FIG. 3B is a diagram showing a state in which the sample holding member attaching / detaching rod has been moved downward from the position shown in FIG. 2B. 3 is an explanatory view of the sample holding member, FIG. 3A is a front view, FIG. 3B is a view from the arrow IIIB of FIG. 3A, and FIG. 3C is IIIC-III of FIG. 3A.
3D is a sectional view taken along the line IIID-IIID in FIG. 3A, FIG. 3E is a perspective view of the detachable lever shown in FIG. 3D, and FIG. 3F is a perspective view of the lever support member shown in FIG. 3D. It is. 4A and 4B are explanatory views of a method of mounting the sample holding member on the sample holding member support device. FIG. 4A is a diagram showing a state where the sample holding member is transported to the sample holding member support device. FIG. FIG. 4C is a diagram illustrating a state in which the sample attaching / detaching rod is pressed against the sample holding member supporting device, and FIG. 4C is a diagram illustrating a state where the sample attaching / detaching rod is rotated to attach the sample holding member to the sample holding member supporting device. FIG. 4 is a view showing a state in which the sample holding member attaching / detaching rod is detached upward;
FIG. 4E is a view from the line IVE-IVE of FIG. 4A, FIG. 4F is a cross-sectional view of the line IVF-IVF of FIG. 4A, and FIG.
FIG. 4H is a view from the line IVG-IVG of FIG.
It is an IVH-IVH line sectional view.

【0012】図1において、複数の除振部材1を介して
支持されたクライオスタット2の内部のUHV(Ultra
High Vacuum)インナチャンバ(すなわち、真空チャン
バ)3底部の試料観察位置P1にはSTMセル支持装置
(試料保持部材支持装置)4が配置されている。STM
セル支持装置4は、STMセル(試料を保持したSTM
ステージ)のような試料保持部材SHを着脱可能に装着
(固定支持)するための装置である。図4、図3におい
て、STMセル支持装置4は、円筒状のケース6と、ケ
ース6の上端に固定された支持装置側端子プレート7
と、支持装置側端子プレート7の上面に設けた円筒部材
8と、その上面に設けた上端プレート9とを有してい
る。
In FIG. 1, a UHV (Ultra Ultra) inside a cryostat 2 supported via a plurality of vibration isolation members 1 is shown.
An STM cell support device (sample holding member support device) 4 is disposed at the sample observation position P1 at the bottom of the high vacuum (inner vacuum chamber) 3. STM
The cell support device 4 includes an STM cell (an STM holding a sample).
This is a device for detachably mounting (fixing and supporting) a sample holding member SH such as a stage. 4 and 3, the STM cell support device 4 includes a cylindrical case 6 and a support device side terminal plate 7 fixed to an upper end of the case 6.
And a cylindrical member 8 provided on the upper surface of the support device side terminal plate 7 and an upper end plate 9 provided on the upper surface thereof.

【0013】前記ケース6は円筒状内周面を有する試料
保持部材収容部6aを有している。前記支持装置側端子
プレート7は前記試料保持部材収容部6aよりやや小径
の円形孔7aを有しており、その上面には前記円形孔7
aの直径方向の両側の外側部分にそれぞれ複数の電気接
続端子7bが形成されている。前記円筒部材8の内周面
8aは前記円形孔7aよりも大径であり、前記電気接続
端子7bの上方には空間が形成されている。前記上端プ
レート9は長円孔9aを有しており、長円孔9aの長径
は前記円筒部材8の内周面8aと同径(図4E〜図4H
参照)で、前記電気接続端子7bの上方が外部に開口す
るように(上端プレート9の上方から電気接続端子7b
が見えるように)形成されている。上端プレート9の下
面には長円孔9aの短径方向の両側部分に、前記円筒部
材8の内周面8aよりも内方に突出する試料保持部材係
止部9bが設けられている。
The case 6 has a sample holding member housing 6a having a cylindrical inner peripheral surface. The support-device-side terminal plate 7 has a circular hole 7a having a diameter slightly smaller than that of the sample holding member accommodating portion 6a.
A plurality of electrical connection terminals 7b are formed on outer portions on both sides in the diameter direction of a. The inner peripheral surface 8a of the cylindrical member 8 has a larger diameter than the circular hole 7a, and a space is formed above the electric connection terminal 7b. The upper end plate 9 has an oblong hole 9a, and the major diameter of the oblong hole 9a is the same as the inner peripheral surface 8a of the cylindrical member 8 (FIGS. 4E to 4H).
(See above) so that the upper part of the electrical connection terminal 7b is open to the outside (from the upper part of the upper end plate 9).
Is formed). On the lower surface of the upper end plate 9, sample holding member locking portions 9b projecting inward from the inner peripheral surface 8a of the cylindrical member 8 are provided on both sides in the minor diameter direction of the oblong hole 9a.

【0014】図1において、前記UHVインナチャンバ
3の上方のUHVチャンバ内に設定された試料交換位置
P2は前記試料観察位置P1の上方位置に設定されてい
る。前記試料交換位置P2は試料保持部材(STMセ
ル)SHに保持する試料やプローブ(探針)を交換する
位置である。前記試料交換位置P2の上方にはワイヤ巻
上機11が配置されている。図3A,図3Bにおいてワ
イヤ巻上機11は一対のドラム11a,11aを有して
おり、各ドラム11a,11aにはワイヤW,Wが巻き
付けられている。前記各ワイヤWの下端には前記試料保
持部材SHが連結されている。前記ワイヤ巻上機11お
よびワイヤWにより試料保持部材搬送装置(11+W)
が構成されている。前記ワイヤ巻上機11は外部の巻上
機操作ハンドル12(図2参照)を回転させることによ
り、前記ワイヤW,Wを巻き上げたり、繰り出したりし
て、前記ワイヤW,Wの下端に連結された試料保持部材
SHを上下方向に搬送可能である。
In FIG. 1, the sample exchange position P2 set in the UHV chamber above the UHV inner chamber 3 is set at a position above the sample observation position P1. The sample exchange position P2 is a position for exchanging a sample or a probe (probe) held in the sample holding member (STM cell) SH. A wire hoist 11 is disposed above the sample exchange position P2. 3A and 3B, the wire hoist 11 has a pair of drums 11a, 11a, and the wires W, W are wound around the respective drums 11a, 11a. The sample holding member SH is connected to a lower end of each of the wires W. Sample holding member transport device (11 + W) by the wire hoist 11 and the wire W
Is configured. The wire hoist 11 is connected to the lower ends of the wires W, W by winding and unwinding the wires W, W by rotating an external hoist operating handle 12 (see FIG. 2). The sample holding member SH can be transported vertically.

【0015】図1、図2において、前記ワイヤ巻上機1
1の上方には上端固定フランジ13が設けられており、
前記上端固定フランジ13の上方には、可動フランジ
(試料保持部材着脱用ロッド支持部材)14を鉛直方向
に移動させる昇降ナット15がスクリューシャフト16
aにより昇降可能に支持されている。昇降ナット15
は、昇降用ハンドル16によりスクリューシャフト16
aを回転させると上下方向に位置調節される。フランジ
ガイド17は下方に延びるスライドロッド17aを有し
ており、スライトロッド17aは上端固定フランジ13
の上面に設けたガイド部材により上下にスライド可能に
支持されている。前記フランジガイド17は前記可動フ
ランジ14を水平方向に移動可能に支持し且つ鉛直方向
に相対移動不可能に連結されている。
In FIG. 1 and FIG. 2, the wire hoist 1
An upper end fixing flange 13 is provided above 1.
Above the upper end fixing flange 13, an elevating nut 15 for vertically moving a movable flange (rod supporting member for attaching and detaching a sample holding member) 14 is provided on a screw shaft 16.
a so as to be able to move up and down. Lifting nut 15
The screw shaft 16 is moved by the lifting handle 16.
When a is rotated, the position is adjusted in the vertical direction. The flange guide 17 has a slide rod 17a extending downward, and the slide rod 17a is
Are slidably supported up and down by a guide member provided on the upper surface. The flange guide 17 supports the movable flange 14 so as to be movable in the horizontal direction, and is connected to the movable flange 14 so as not to be relatively movable in the vertical direction.

【0016】前記昇降ナット15に螺合しかつ昇降ナッ
ト15を水平に貫通するスクリューシャフト18aの一
端部は前記可動フランジ14に螺合している。したがっ
て、前記昇降用ハンドル16によりスクリューシャフト
16aを回転させて昇降ナット15を昇降させると、昇
降ナット15およびスクリューシャフト18aが昇降す
るので、スクリューシャフト18aの一端部が螺合する
可動フランジ14も昇降する。その際、可動フランジ1
4に鉛直方向の相対移動不可能に連結されたフランジガ
イド17およびスライドロッド17aも昇降する。前記
スクリューシャフト18aの他端部には左右移動用ハン
ドル18が設けられている。前記左右移動用ハンドル1
8によりスクリューシャフト18aを回転させると、フ
ランジガイド17に水平方向に移動可能に支持された可
動フランジ14が左右方向に移動し、左右方向に位置調
節される。
One end of a screw shaft 18a screwed to the lifting nut 15 and horizontally passing through the lifting nut 15 is screwed to the movable flange 14. Therefore, when the screw 16a is rotated by the lifting handle 16 to raise and lower the lifting nut 15, the lifting nut 15 and the screw shaft 18a are raised and lowered, so that the movable flange 14 to which one end of the screw shaft 18a is screwed is also raised and lowered. I do. At that time, the movable flange 1
The flange guide 17 and the slide rod 17a, which are connected to the rail 4 so that they cannot move relative to each other in the vertical direction, also move up and down. A left-right moving handle 18 is provided at the other end of the screw shaft 18a. Said left / right movement handle 1
When the screw shaft 18a is rotated by 8, the movable flange 14 supported by the flange guide 17 so as to be movable in the horizontal direction moves in the left-right direction, and the position is adjusted in the left-right direction.

【0017】前記可動フランジ14の下面と前記上端固
定フランジ13の上面との間には金属製のベローズ19
が連結されている。前記可動フランジ14には、下方に
延びる試料保持部材着脱ロッド21の上端が連結されて
おり、試料保持部材着脱ロッド21は可動フランジ14
上面に支持された回転ハンドル22により回転可能であ
る。試料保持部材着脱ロッド21の下端部は前記試料観
察位置P1の上端部付近に延びており、前記下端部には
水平ピン21aが固定されている。
A metal bellows 19 is provided between the lower surface of the movable flange 14 and the upper surface of the upper fixed flange 13.
Are connected. The upper end of a sample holding member attaching / detaching rod 21 extending downward is connected to the movable flange 14.
It is rotatable by a rotating handle 22 supported on the upper surface. The lower end of the sample holding member attaching / detaching rod 21 extends near the upper end of the sample observation position P1, and a horizontal pin 21a is fixed to the lower end.

【0018】図3、図4において試料保持部材(STM
セル)SHは、円筒状のステージ収容ケース26と、そ
の上端に設けた平面図で長円形の保持部材側端子プレー
ト27と、保持部材側端子プレート27の上面に設けた
レバー支持部材28と、前記レバー支持部材28に回転
可能に支持された着脱用レバー29(被係止部材、図3
E参照)とを有している。前記長円形の保持部材側端子
プレート27の長手方向両端部の下面にそれぞれ複数の
導電性の弾性部材を介して電気接続端子27aが設けら
れている。図4A、図4Bにおいて、保持部材側端子プ
レート27は前記STMセル支持装置4の上端プレート
9の長円孔9aおよび円筒部材8を上側から下側に通過
して、支持装置側端子プレート7上面に支持される。そ
のとき、支持装置側端子プレート7上面の電気接続端子
7bおよび保持部材側端子プレート27の電気接続端子
27aが接続されるようになっている。
3 and 4, the sample holding member (STM)
The cell SH includes a cylindrical stage housing case 26, a holding member side terminal plate 27 provided at the upper end thereof, which is oblong in plan view, a lever supporting member 28 provided on the upper surface of the holding member side terminal plate 27, The detachable lever 29 (locked member, FIG. 3) rotatably supported by the lever support member 28.
E). Electrical connection terminals 27a are provided on the lower surface of both ends in the longitudinal direction of the elliptical holding member side terminal plate 27 via a plurality of conductive elastic members. 4A and 4B, the holding member side terminal plate 27 passes through the oblong hole 9a and the cylindrical member 8 of the upper end plate 9 of the STM cell support device 4 from the upper side to the lower side, and the upper surface of the support device side terminal plate 7 Supported by At this time, the electric connection terminals 7b on the upper surface of the support device side terminal plate 7 and the electric connection terminals 27a of the holding member side terminal plate 27 are connected.

【0019】図3において、レバー支持部材28は、前
記着脱用レバー29を鉛直軸回りに90°の範囲で回転
可能に支持する下側部分28a(図3F参照)と、下側
部分28aに支持された前記着脱用レバー29の上方へ
の抜け止めのために前記下側部分28aの上面に固定さ
れたドーナツ状の上側部分28bとを有している。前記
着脱用レバー29は図3Eに示すように、中央円形部2
9aとその両側に突出する突出部29b,29bとを有
している。前記中央円形部29aにはピン挿入孔29c
が形成されており、前記突出部29b,29bには傾斜
面29d,29dが形成されている。したがって、試料
保持部材SHの保持部材側端子プレート27を前記試料
保持部材支持装置4の支持装置側端子プレート7に載せ
た状態(図4A参照)で、前記試料保持部材着脱ロッド
21の水平ピン21aを着脱用レバー29のピン挿入孔
29cに挿入して図4Bに示す状態とし、試料保持部材
着脱ロッド21を回転させる(図4C参照)と、前記着
脱用レバー29の突出部29b,29bの各傾斜面29
dが試料保持部材係止部9b下面により下方に押圧され
るようになっている。
In FIG. 3, a lever supporting member 28 supports a lower portion 28a (see FIG. 3F) that rotatably supports the detachable lever 29 in a range of 90 ° around a vertical axis, and a lower portion 28a. And a donut-shaped upper portion 28b fixed to the upper surface of the lower portion 28a to prevent the detachable lever 29 from being pulled upward. As shown in FIG. 3E, the attachment / detachment lever 29
9a and protrusions 29b, 29b protruding on both sides thereof. The center circular portion 29a has a pin insertion hole 29c.
Are formed, and the projecting portions 29b, 29b are formed with inclined surfaces 29d, 29d. Therefore, in a state where the holding member side terminal plate 27 of the sample holding member SH is placed on the supporting device side terminal plate 7 of the sample holding member supporting device 4 (see FIG. 4A), the horizontal pin 21a of the sample holding member attaching / detaching rod 21 is attached. 4B is inserted into the pin insertion hole 29c of the attachment / detachment lever 29 and the sample holding member attachment / detachment rod 21 is rotated (see FIG. 4C), and each of the protrusions 29b, 29b of the attachment / detachment lever 29 is rotated. Inclined surface 29
d is pressed downward by the lower surface of the sample holding member locking portion 9b.

【0020】(実施例1の作用)図4において、前記構
成を備えた実施例1の試料搬送装置では、試料保持部材
係止部9bを有するSTMセル支持装置(試料保持部材
支持装置)4は、クライオスタット2内部のUHV(Ul
tra High Vacuum)インナチャンバ(すなわち、真空チ
ャンバ)3底部の試料観察位置P1に配置されている。
前記試料観察位置P1の上方の真空チャンバ3内の試料
交換位置P2上方のワイヤ巻上機11を作動させること
により、ワイヤ巻上機11に巻かれたワイヤW,Wの下
端に連結された試料保持部材SHを、前記試料観察位置
P1と試料交換位置P2との間で搬送することができ
る。
(Operation of the First Embodiment) In FIG. 4, in the sample transporting apparatus of the first embodiment having the above-described configuration, the STM cell supporting device (sample holding member supporting device) 4 having the sample holding member locking portion 9b is , UHV inside the cryostat 2 (Ul
The tra High Vacuum is located at the sample observation position P1 at the bottom of the inner chamber (that is, the vacuum chamber) 3.
By operating the wire hoist 11 above the sample exchange position P2 in the vacuum chamber 3 above the sample observing position P1, the sample W connected to the lower ends of the wires W, W wound on the wire hoist 11 is operated. The holding member SH can be transported between the sample observation position P1 and the sample exchange position P2.

【0021】前記試料保持部材SHを試料観察位置P1
に搬送した状態(図2B、図4A参照)で、左右移動用
ハンドル18および昇降用ハンドル16を作動させるこ
とにより、前記試料交換位置P2の上方に配置された可
動フランジ14を水平方向および鉛直方向に移動させる
ことができる。そのとき、可動フランジ14に上端が支
持された試料保持部材着脱ロッド21の下端の水平ピン
21aは、前記着脱用レバー(被係止部材)29のピン
挿入孔29cに係合する位置と離脱した位置との間で移
動させることができる。
The sample holding member SH is moved to the sample observation position P1.
2B and 4A, the movable flange 14 disposed above the sample exchange position P2 is moved in the horizontal and vertical directions by operating the left / right moving handle 18 and the elevating handle 16. Can be moved. At this time, the horizontal pin 21a at the lower end of the sample holding member attaching / detaching rod 21 whose upper end is supported by the movable flange 14 has separated from the position where it is engaged with the pin insertion hole 29c of the attaching / detaching lever (locked member) 29. Can be moved to and from positions.

【0022】前記水平ピン21aがピン挿入孔29cに
係合した状態(図2B、図4B参照)で、回転ハンドル
22(図1、図2参照)により試料保持部材着脱ロッド
21を回転させると、水平ピン21aおよび着脱用レバ
ー29が図4Bの状態から図4Cの状態に回転する。こ
のとき、前記試料保持部材SHの着脱用レバー(被係止
部材)29の傾斜面29d,29dが前記試料保持部材
支持装置4の試料保持部材係止部(上端プレート9の長
円孔9aの短径方向の両側部分下面)9bに押圧される
(係止される)係止位置に移動する。この状態では、試
料保持部材SHは試料保持部材支持装置4に固定された
状態となる。その状態で、昇降用ハンドル16(図1、
図2参照)を回転して、図4Dに示すように試料保持部
材着脱ロッド21を上昇させて、水平ピン21aをピン
挿入孔29cから離脱させて、図2Aの位置に移動させ
ることができる。したがって、本発明では、試料保持部
材SHの移動はワイヤWによって行われ、試料保持部材
支持装置4に対する試料保持部材SHの着脱は試料保持
部材着脱ロッド21によって行われる。
When the sample holding member attaching / detaching rod 21 is rotated by the rotating handle 22 (see FIGS. 1 and 2) in a state where the horizontal pin 21a is engaged with the pin insertion hole 29c (see FIGS. 2B and 4B). The horizontal pin 21a and the attachment / detachment lever 29 rotate from the state of FIG. 4B to the state of FIG. 4C. At this time, the inclined surfaces 29d and 29d of the attachment / detachment lever (locked member) 29 of the sample holding member SH are connected to the sample holding member locking portion of the sample holding member support device 4 (the oblong hole 9a of the upper end plate 9). It moves to the locking position where it is pressed (locked) by the short-side direction lower surfaces 9b). In this state, the sample holding member SH is fixed to the sample holding member support device 4. In this state, the lifting handle 16 (FIG. 1,
By rotating the sample holding member attaching / detaching rod 21 as shown in FIG. 4D, the horizontal pin 21a is disengaged from the pin insertion hole 29c, and can be moved to the position shown in FIG. 2A. Therefore, in the present invention, the movement of the sample holding member SH is performed by the wire W, and the attachment and detachment of the sample holding member SH with respect to the sample holding member support device 4 is performed by the sample holding member attaching / detaching rod 21.

【0023】このため、試料保持部材着脱ロッド21
は、試料保持部材支持装置4に対する試料保持部材SH
の着脱を行うために必要な移動距離だけ移動すればよ
い。前記真空チャンバ3での試料保持部材着脱ロッド2
1の移動距離が小さいので、真空チャンバ3内で移動す
る試料保持部材着脱ロッド21の収容部を上方に高く形
成する必要がなくなる。したがって、試料搬送装置を収
容した部屋の天井を高くする必要がなくなる。
For this reason, the sample holding member attaching / detaching rod 21
Is a sample holding member SH for the sample holding member support device 4.
What is necessary is just to move by the moving distance required for attaching and detaching. Sample holding member attaching / detaching rod 2 in the vacuum chamber 3
Since the moving distance of the sample holding member 1 is small, it is not necessary to form the accommodating portion of the sample holding member attaching / detaching rod 21 that moves in the vacuum chamber 3 high. Therefore, it is not necessary to raise the ceiling of the room accommodating the sample transport device.

【0024】(実施例2)図5は本発明の実施例2の試
料搬送装置の全体説明図で、前記実施例1の図1に対応
する図である。図6は同実施例2の試料搬送装置全体の
作用説明図で前記実施例1の図2に対応する図であり、
図6Aは試料保持部材を試料交換位置から下方の試料観
察位置の試料保持部材支持装置へ搬送する途中の状態を
示す図、図6Bは試料保持部材を試料保持部材支持装置
に搬送し且つ試料保持部材を試料保持部材支持装置に着
脱させる試料保持部材着脱用ロッドを着脱位置の上方に
移動する途中の状態を示す図、図6Cは試料保持部材着
脱用ロッドを着脱位置に移動させ、その位置から下方に
移動させた状態を示す図である。図7は前記図5の矢印
VIIから見た図である。図8は試料ホルダ保持部材着脱
ロッドの移動機構の説明図である。なお、この実施例2
の説明において、前記実施例1の構成要素に対応する構
成要素には同一の符号を付して、その詳細な説明を省略
する。この実施例2は、下記の点で前記実施例1と相違
しているが、他の点では前記実施例1と同様に構成され
ている。
(Embodiment 2) FIG. 5 is an overall explanatory view of a sample transfer apparatus according to a second embodiment of the present invention, and corresponds to FIG. 1 of the first embodiment. FIG. 6 is a view for explaining the operation of the entire sample transporting apparatus of the second embodiment, and corresponds to FIG. 2 of the first embodiment.
6A is a diagram showing a state in which the sample holding member is being transported from the sample exchange position to the sample holding member support device at the sample observation position below, and FIG. 6B is a diagram showing the state in which the sample holding member is transported to the sample holding member support device and the sample is held. FIG. 6C is a view showing a state in which a sample holding member attaching / detaching rod for attaching / detaching a member to / from the sample holding member supporting device is being moved above the attaching / detaching position, and FIG. It is a figure showing the state where it was moved below. FIG. 7 is a view as seen from the arrow VII in FIG. FIG. 8 is an explanatory diagram of a moving mechanism of the sample holder holding member attaching / detaching rod. Note that the second embodiment
In the description, the same reference numerals are given to the components corresponding to the components of the first embodiment, and the detailed description thereof will be omitted. The second embodiment differs from the first embodiment in the following points, but has the same configuration as the first embodiment in other points.

【0025】図5〜図8において、可動フランジ14を
水平方向にガイドするフランジガイド15は1本のスク
リューシャフト16aと3本のロッド状ガイド17′に
より上下移動可能に支持されており、昇降用ハンドル1
6を回転させることにより上下位置が調節可能である。
また、ベローズ19の上端が連結された可動フランジ1
4は、フランジガイド15により水平方向に移動自在に
支持されている。可動フランジ14の上面には回転ハン
ドル22が支持されている。真空チャンバ3内部に配置
された試料保持部材着脱ロッド21の上端部は前記可動
フランジ14を回転可能に貫通しており、その上端は前
記回転ハンドル22と一体的に回転するように回転ハン
ドル22に連結されている。図8において前記試料保持
部材着脱ロッド21には長手方向に所定間隔で複数のリ
ンク連結部材31が回転可能に装着されている。また、
真空チャンバ3内部には前記試料保持部材着脱ロッド2
1と平行に固定ロッド32が配置されており、固定ロッ
ド32には複数の平行なレバー33の一端が上下方向に
回転可能に連結されている。レバー33の他端は前記リ
ンク連結部材31に回転可能に連結されている。
In FIGS. 5 to 8, a flange guide 15 for guiding the movable flange 14 in the horizontal direction is supported by one screw shaft 16a and three rod-shaped guides 17 'so as to be able to move up and down. Handle 1
By rotating 6, the vertical position can be adjusted.
The movable flange 1 to which the upper end of the bellows 19 is connected.
4 is supported by a flange guide 15 so as to be movable in the horizontal direction. A rotating handle 22 is supported on the upper surface of the movable flange 14. The upper end of the sample holding member attaching / detaching rod 21 arranged inside the vacuum chamber 3 rotatably penetrates the movable flange 14, and the upper end thereof is attached to the rotating handle 22 so as to rotate integrally with the rotating handle 22. Are linked. In FIG. 8, a plurality of link connecting members 31 are rotatably mounted on the sample holding member attaching / detaching rod 21 at predetermined intervals in the longitudinal direction. Also,
Inside the vacuum chamber 3, the sample holding member attaching / detaching rod 2 is provided.
A fixed rod 32 is arranged in parallel with 1, and one end of a plurality of parallel levers 33 is connected to the fixed rod 32 so as to be rotatable in the vertical direction. The other end of the lever 33 is rotatably connected to the link connecting member 31.

【0026】(実施例2の作用)前記構成を備えた実施
例2では、前記昇降用ハンドル16を回転させてフラン
ジガイド15を昇降させるとそれに伴って、回転ハンド
ル22およびそれに連結された試料保持部材着脱ロッド
21が昇降する。前記試料保持部材着脱ロッド21の昇
降により、レバー33が固定ロッド32との連結部を支
点にして上下方向に回動する。このため、前記試料保持
部材着脱ロッド21は昇降と同時に水平方向に移動す
る。そして試料保持部材着脱ロッド21の水平方向の移
動に伴って、可動フランジ14および回転ハンドル22
も水平方向に移動する。したがって、図6Aの状態か
ら、昇降用ハンドル16によりフランジガイド15を下
降させると、フランジガイド15および試料保持部材着
脱ロッド21は図6Bの状態を経て図6Cの状態に変化
する。このとき、試料保持部材着脱ロッド21の下端の
水平ピン21aはピン挿入孔29cに自動的に係合す
る。その状態は前記実施例1の図4Bの状態と同じであ
る。
(Operation of the Second Embodiment) In the second embodiment having the above-described structure, when the raising / lowering handle 16 is rotated to move the flange guide 15 up and down, the rotating handle 22 and the sample holder connected thereto are held. The member attaching / detaching rod 21 moves up and down. As the sample holding member attaching / detaching rod 21 is moved up and down, the lever 33 rotates in the up and down direction with the connecting portion with the fixed rod 32 as a fulcrum. Therefore, the sample holding member attaching / detaching rod 21 moves in the horizontal direction at the same time as the vertical movement. Then, as the sample holding member attaching / detaching rod 21 moves in the horizontal direction, the movable flange 14 and the rotating handle 22 are moved.
Also move horizontally. Therefore, when the flange guide 15 is lowered by the lifting handle 16 from the state of FIG. 6A, the flange guide 15 and the sample holding member attaching / detaching rod 21 change to the state of FIG. 6C via the state of FIG. 6B. At this time, the horizontal pin 21a at the lower end of the sample holding member attaching / detaching rod 21 automatically engages with the pin insertion hole 29c. The state is the same as the state of FIG. 4B of the first embodiment.

【0027】その状態で回転ハンドル22を回転させる
と、前記図4Cで説明した場合と同様に着脱用レバー2
9が回転して試料保持部材係止部(上端プレート9の長
円孔9aの短径方向の両側部分下面)9bに押圧され、
係止される。この状態では試料保持部材SHは試料保持
部材支持装置4に固定される。その状態で前記昇降用ハ
ンドル16によりフランジガイド15を上昇させると試
料保持部材着脱ロッド21が上昇し水平ピン21aはピ
ン挿入孔29cから離脱する。したがって、この実施例
2では、昇降用ハンドル16の回転操作だけで、試料保
持部材着脱ロッド21の水平方向および鉛直方向の移動
を行うことができる。このため、前記実施例1の図1、
図2に示す左右移動用ハンドル18を省略することがで
きる。
When the rotary handle 22 is rotated in this state, as in the case described with reference to FIG.
9 rotates and is pressed by the sample holding member locking portion (the lower surface on both sides in the short diameter direction of the oblong hole 9a of the upper end plate 9) 9b,
Locked. In this state, the sample holding member SH is fixed to the sample holding member support device 4. When the flange guide 15 is raised by the lifting handle 16 in this state, the sample holding member attaching / detaching rod 21 is raised, and the horizontal pin 21a is separated from the pin insertion hole 29c. Therefore, in the second embodiment, the horizontal movement and the vertical movement of the sample holding member attaching / detaching rod 21 can be performed only by rotating the lifting handle 16. For this reason, FIG.
The left-right movement handle 18 shown in FIG. 2 can be omitted.

【0028】(変更例)以上、本発明の実施例を詳述し
たが、本発明は、前記実施例に限定されるものではな
く、特許請求の範囲に記載された本発明の要旨の範囲内
で、種々の変更を行うことが可能である。 (H01)試料保持部材SHを試料観察位置P1および試
料交換位置P2の間で移動させる手段として、ワイヤW
を使用する代わりにベルトを使用可能である。
(Modifications) Although the embodiments of the present invention have been described in detail, the present invention is not limited to the above-described embodiments, but falls within the scope of the present invention described in the appended claims. Thus, various changes can be made. (H01) As means for moving the sample holding member SH between the sample observation position P1 and the sample exchange position P2, a wire W
Instead of using a belt, a belt can be used.

【0029】[0029]

【発明の効果】前述の本発明の試料搬送装置は、下記の
効果を奏することができる。 (E01)試料観察位置に設けた試料保持部材支持装置と
その上方に設定された試料交換位置との間で試料保持部
材を搬送し且つ試料保持部材を前記試料保持部材支持装
置に着脱可能に装着する試料搬送装置において、前記試
料交換位置の上方に配置する部材の高さを低くすること
ができる。 (E02)STM等のように原子、分子レベルの分解能を
要する装置においては、装置の高さが除振台から上方に
高くなるほど、振動等が増幅され易く、分解能を落とし
てしまうが、本発明では装置の高さを低くすることがで
きるので、振動の影響を受け難く、高分解能の走査型プ
ローブ顕微鏡装置を提供することが可能となる。
The sample transport apparatus of the present invention has the following advantages. (E01) The sample holding member is transported between the sample holding member support device provided at the sample observation position and the sample exchange position set above the sample holding member support device, and the sample holding member is detachably attached to the sample holding member support device. In the sample transport apparatus, the height of a member disposed above the sample exchange position can be reduced. (E02) In an apparatus such as an STM which requires resolution at the atomic or molecular level, as the height of the apparatus increases from the vibration isolation table, vibrations and the like are easily amplified and the resolution is reduced. Since the height of the apparatus can be reduced, it is possible to provide a high-resolution scanning probe microscope apparatus which is hardly affected by vibration and has high resolution.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 図1は本発明の実施例1の試料搬送装置の全
体説明図である。
FIG. 1 is an overall explanatory diagram of a sample transport device according to a first embodiment of the present invention.

【図2】 図2は同実施例1の試料搬送装置全体の作用
説明図で、図2Aは試料保持部材を試料交換位置から下
方の試料観察位置の試料保持部材支持装置へ搬送する途
中の状態を示す図、図2Bは試料保持部材を試料保持部
材支持装置に搬送し且つ試料保持部材を試料保持部材支
持装置に着脱させる試料保持部材着脱用ロッドを着脱位
置の上方に移動させた状態を示す図、図2Cは試料保持
部材着脱用ロッドを前記図2Bの位置から下方に移動さ
せた状態を示す図である。
FIG. 2 is a diagram illustrating the operation of the entire sample transfer apparatus according to the first embodiment. FIG. 2A is a state in which a sample holding member is being transferred from a sample exchange position to a sample holding member support device at a sample observation position below the sample exchange position. FIG. 2B shows a state in which the sample holding member is transported to the sample holding member support device, and the sample holding member attaching / detaching rod for attaching and detaching the sample holding member to / from the sample holding member support device is moved above the attaching / detaching position. FIG. 2C is a view showing a state in which the sample holding member attaching / detaching rod is moved downward from the position shown in FIG. 2B.

【図3】 図3は試料保持部材の説明図で、図3Aは正
面図、図3Bは前記図3Aの矢印IIIBから見た図、図
3Cは前記図3AのIIIC−IIIC線から見た図、図3D
は前記図3AのIIID−IIID線断面図、図3Eは前記図
3Dに示す着脱用レバーの斜視図、図3Fは前記図3D
に示すレバー支持部材の斜視図である。
3 is an explanatory view of a sample holding member, FIG. 3A is a front view, FIG. 3B is a view from the arrow IIIB in FIG. 3A, and FIG. 3C is a view from the line IIIC-IIIC in FIG. 3A. , FIG. 3D
3D is a sectional view taken along the line IIID-IIID of FIG. 3A, FIG. 3E is a perspective view of the attaching / detaching lever shown in FIG. 3D, and FIG.
It is a perspective view of the lever support member shown in FIG.

【図4】 図4は試料保持部材支持装置への試料保持部
材の装着方法の説明図で、図4Aは試料保持部材を試料
保持部材支持装置に搬送した状態を示す図、図4Bは試
料保持部材を試料保持部材着脱用ロッドで試料保持部材
支持装置に押圧した状態を示す図、図4Cは試料保持部
材着脱用ロッドを回転させて試料保持部材を試料保持部
材支持装置に装着した状態を示す図、図4Dは試料保持
部材着脱用ロッドを上方に離脱させた状態を示す図、図
4Eは前記図4AのIVE−IVE線から見た図、図4F
は前記図4AのIVF−IVF線断面図、図4Gは前記図
4CのIVG−IVG線から見た図、図4Hは前記図4D
のIVH−IVH線断面図、である。
FIG. 4 is an explanatory view of a method of mounting the sample holding member on the sample holding member support device. FIG. 4A is a diagram showing a state where the sample holding member is transported to the sample holding member support device, and FIG. FIG. 4C is a diagram illustrating a state in which the member is pressed against the sample holding member supporting device with the sample holding member mounting / dismounting rod, and FIG. 4C illustrates a state where the sample holding member mounting / dismounting rod is rotated to mount the sample holding member on the sample holding member supporting device. FIG. 4D is a view showing a state in which the sample holding member attaching / detaching rod is detached upward, FIG. 4E is a view from the line IVE-IVE of FIG. 4A, and FIG.
4G is a sectional view taken along the line IVF-IVF in FIG. 4A, FIG. 4G is a view as seen from the line IVG-IVG in FIG. 4C, and FIG.
FIG. 4 is a cross-sectional view taken along line IVH-IVH of FIG.

【図5】 図5は本発明の実施例2の試料搬送装置の全
体説明図で、前記実施例1の図1に対応する図である。
FIG. 5 is an overall explanatory view of a sample transporting apparatus according to a second embodiment of the present invention, and corresponds to FIG. 1 of the first embodiment.

【図6】 図6は同実施例2の試料搬送装置全体の作用
説明図で前記実施例1の図2に対応する図であり、図6
Aは試料保持部材を試料交換位置から下方の試料観察位
置の試料保持部材支持装置へ搬送する途中の状態を示す
図、図6Bは試料保持部材を試料保持部材支持装置に搬
送し且つ試料保持部材を試料保持部材支持装置に着脱さ
せる試料保持部材着脱用ロッドを着脱位置の上方に移動
する途中の状態を示す図、図6Cは試料保持部材着脱用
ロッドを着脱位置に移動させ、その位置から下方に移動
させた状態を示す図である。
FIG. 6 is an explanatory view of the operation of the entire sample transporting apparatus of the second embodiment, corresponding to FIG. 2 of the first embodiment;
FIG. 6A is a diagram showing a state in which the sample holding member is being transported from the sample exchange position to the sample holding member support device at the sample observation position below, and FIG. 6B is a diagram showing the state in which the sample holding member is transported to the sample holding member support device; FIG. 6C is a view showing a state in which the sample holding member attaching / detaching rod for moving the sample holding member attaching / detaching member to / from the sample holding member supporting device is being moved above the attaching / detaching position, and FIG. It is a figure showing the state where it was moved to.

【図7】 図7は前記図5の矢印VIIから見た図であ
る。
FIG. 7 is a view as seen from the arrow VII in FIG. 5;

【図8】 図8は試料ホルダ保持部材着脱ロッドの移動
機構の説明図である。
FIG. 8 is an explanatory view of a moving mechanism of a sample holder holding member attaching / detaching rod.

【図9】 図9は試料搬送装置の従来例の説明図で、図
9Aは試料保持部材が試料交換位置にある状態を示す
図、図9Bは試料保持部材が試料観察位置にある状態を
示す図ある。
FIG. 9 is an explanatory view of a conventional example of a sample transporting apparatus. FIG. 9A shows a state in which a sample holding member is at a sample exchange position, and FIG. 9B shows a state in which the sample holding member is at a sample observation position. There is a figure.

【図10】 図10は試料搬送装置の他の従来例の説明
図で、図10Aは試料保持部材が試料交換位置にある状
態を示す図、図10Bは試料保持部材が試料観察位置に
ある状態を示す図ある。
FIG. 10 is an explanatory view of another conventional example of the sample transport device. FIG. 10A is a view showing a state where the sample holding member is at a sample exchange position, and FIG. 10B is a state where the sample holding member is at a sample observation position. FIG.

【符号の説明】[Explanation of symbols]

P1…試料観察位置、P2…試料交換位置、SH…試料
保持部材(STMセル)、W…ワイヤ、4…試料保持部
材支持装置(STMセル支持装置)、9b…試料保持部
材係止部、11…ワイヤ巻上機、14…試料保持部材着
脱用ロッド支持部材(可動フランジ)、21…試料保持
部材着脱ロッド、29…被係止部材(着脱用レバー)、
P1: sample observation position, P2: sample exchange position, SH: sample holding member (STM cell), W: wire, 4: sample holding member support device (STM cell support device), 9b: sample holding member engaging portion, 11 ... wire hoisting machine, 14 ... rod supporting member (movable flange) for attaching / detaching sample holding member, 21 ... rod attaching / detaching rod for sample holding member, 29 ... member to be locked (lever for attaching / detaching),

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 下記の構成要件(A01)〜(A05)を備
えたことを特徴とする試料搬送装置、(A01)試料保持
部材係止部を有し且つ試料観察位置に配置された試料保
持部材支持装置、(A02)試料観察位置に搬送された状
態で、前記試料保持部材係止部に係止される係止位置と
前記試料保持部材係止部から離脱した離脱位置との間で
移動可能な被係止部材を有する試料保持部材、(A03)
前記試料観察位置の上方の試料交換位置の上方に配置さ
れ、移動可能に支持された試料保持部材着脱用ロッド支
持部材、(A04)上端が前記試料保持部材着脱用ロッド
支持部材に支持されるとともに前記試料保持部材着脱用
ロッド支持部材の移動時に前記被係止部材を前記係止位
置と前記離脱位置との間で移動させる試料保持部材着脱
ロッド、(A05)前記試料保持部材着脱用ロッド支持部
材の下方に配置されるとともに、前記試料観察位置とそ
の上方の試料交換位置との間で前記試料保持部材を搬送
する試料保持部材搬送装置。
1. A sample transport device comprising the following constitutional requirements (A01) to (A05): (A01) a sample holding member having a sample holding member engaging portion and arranged at a sample observation position. Member support device, (A02) moving between a locking position locked by the sample holding member locking portion and a detached position separated from the sample holding member locking portion while being transported to the sample observation position. Sample holding member having a possible locked member, (A03)
(A04) a sample holding member attaching / detaching rod support member that is movably supported and disposed above the sample exchanging position above the sample observation position, and (A04) an upper end is supported by the sample holding member attaching / detaching rod supporting member. A sample holding member attaching / detaching rod for moving the locked member between the locked position and the detached position when the sample holding member attaching / detaching rod supporting member moves, (A05) the sample holding member attaching / detaching rod supporting member. A sample holding member transfer device that is arranged below the sample holding member and transfers the sample holding member between the sample observation position and a sample replacement position above the sample observation position.
JP2000067856A 2000-03-10 2000-03-10 Sample conveyance device Withdrawn JP2001255252A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000067856A JP2001255252A (en) 2000-03-10 2000-03-10 Sample conveyance device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000067856A JP2001255252A (en) 2000-03-10 2000-03-10 Sample conveyance device

Publications (1)

Publication Number Publication Date
JP2001255252A true JP2001255252A (en) 2001-09-21

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000067856A Withdrawn JP2001255252A (en) 2000-03-10 2000-03-10 Sample conveyance device

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Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012520987A (en) * 2009-03-16 2012-09-10 オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド Cryogen-free cooling device and method
JP2022504221A (en) * 2018-10-05 2022-01-13 キウトラ、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング Systems and methods for inserting samples into the chamber

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012520987A (en) * 2009-03-16 2012-09-10 オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド Cryogen-free cooling device and method
EP3620732B1 (en) 2009-03-16 2022-02-16 Oxford Instruments Nanotechnology Tools Limited Cryogen free cooling apparatus and method
EP4027081B1 (en) 2009-03-16 2022-12-21 Oxford Instruments Nanotechnology Tools Limited Cryogen free cooling apparatus and method
JP2022504221A (en) * 2018-10-05 2022-01-13 キウトラ、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング Systems and methods for inserting samples into the chamber
JP7305759B2 (en) 2018-10-05 2023-07-10 キウトラ、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング Systems and methods for inserting a sample into a chamber

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