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JP2001168384A5
JP2001168384A5 JP1999349174A JP34917499A JP2001168384A5 JP 2001168384 A5 JP2001168384 A5 JP 2001168384A5 JP 1999349174 A JP1999349174 A JP 1999349174A JP 34917499 A JP34917499 A JP 34917499A JP 2001168384 A5 JP2001168384 A5 JP 2001168384A5
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layer
nitride semiconductor
light emitting
main peak
well layer
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JP1999349174A
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JP4501194B2 (en
JP2001168384A (en
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【特許請求の範囲】
【請求項1】
Inを含む窒化物半導体からなる少なくとも1つの第1の井戸層を有する第1の発光領域と、該第1の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体から成る少なくとも1つの第2の井戸層を有する第2の発光領域と、該第2の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体からなる少なくとも1つの第3の井戸層を有する第3の発光領域と、を備えた多重量子井戸構造から成る活性層を有する窒化物半導体発光素子において、
該活性層はp型窒化物半導体層側から見て、第1の発光領域、第3の発光領域、第2の発光領域の順で積層された構成を少なくとも1つ含んでなることを特徴とする窒化物半導体発光素子。
【請求項2】
Inを含む窒化物半導体からなる少なくとも1つの第1の井戸層を有する第1の発光領域と、該第1の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体から成る少なくとも1つの第2の井戸層を有する第2の発光領域と、該第2の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体からなる少なくとも1つの第3の井戸層を有する第3の発光領域と、を備えた多重量子井戸構造から成る活性層を有する窒化物半導体発光素子において、
該活性層はp型窒化物半導体層側から見て、第1の発光領域、第3の発光領域、第2の発光領域の順で積層された構成のみから成ることを特徴とする窒化物半導体発光素子。
【請求項3】
Inを含む窒化物半導体からなる少なくとも1つの第1の井戸層と、該第1の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体から成る少なくとも1つの第2の井戸層と、該第2の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体からなる少なくとも1つの第3の井戸層と、を備えた多重量子井戸構造から成る活性層を有する窒化物半導体発光素子において、
活性層はp型窒化物半導体層側から見て、障壁層、第1の井戸層、障壁層、第3の井戸層、障壁層、第2の井戸層、障壁層の順で積層された構成を少なくとも1つ含むことを特徴とする窒化物半導体発光素子。
【請求項4】
Inを含む窒化物半導体からなる少なくとも1つの第1の井戸層と、該第1の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体から成る少なくとも1つの第2の井戸層と、該第2の井戸層が発する光の主ピーク波長よりも長い主ピーク波長の光を発する、Inを含む窒化物半導体からなる少なくとも1つの第3の井戸層と、を備えた多重量子井戸構造から成る活性層を有する窒化物半導体発光素子において、
活性層はp型窒化物半導体層側から見て、障壁層、第1の井戸層、障壁層、第3の井戸層、障壁層、第2の井戸層、障壁層の順で積層された構成のみからなることを特徴とする窒化物半導体発光素子。
【請求項5】
上記第1の井戸層が発する光の主ピーク波長が400乃至480nmで、上記第2の井戸層が発する光の主ピーク波長が480乃至570nmで、上記第3の井戸層が発する光の主ピーク波長が570乃至800nmであることを特徴とする請求項1乃至請求項4のいずれかに記載の窒化物半導体発光素子。
【請求項6】
上記第1の井戸層が発する光の主ピーク波長が420乃至460nm、上記第2の井戸層が発する光の主ピーク波長が480乃至520nm、上記第3の主ピーク波長が570乃至600nmであることを特徴とする請求項1乃至請求項5のいずれか1項に記載の窒化物半導体発光素子。
【請求項7】
基板上に、n型窒化物半導体層、活性層、p型窒化物半導体層を順に有し、
前記活性層は、Inを含む窒化物半導体からなるn個(n≧4)の井戸層を備えた多重量子井戸構造からなり、第1の井戸層、第2の井戸層、・・・、第nの井戸層の順に主ピーク波長が短い窒化物半導体発光素子において、
主ピーク波長が最も短い第1の井戸層をp型窒化物半導体層の最も近くに有し、その次にp型窒化物半導体層に近い位置に、主ピーク波長が最も長い第nの井戸層を有することを特徴とする窒化物半導体発光素子。
【請求項8】
前記n型半導体層は超格子層を有することを特徴とする請求項1乃至7のいずれか1項に記載の窒化物半導体発光素子。
【請求項9】
前記超格子層は、アンドープGaNとSiドープGaNからなることを特徴とする請求項8に記載の窒化物半導体発光素子。
[Claims]
[Claim 1]
In, which emits light having a first light emitting region having at least one first well layer made of a nitride semiconductor containing In, and a main peak wavelength longer than the main peak wavelength of the light emitted by the first well layer. A second light emitting region having at least one second well layer made of a nitride semiconductor including, and In, which emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the second well layer. In a nitride semiconductor light emitting element having an active layer having a multiple quantum well structure including a third light emitting region having at least one third well layer made of a nitride semiconductor containing the light emitting region.
The active layer is characterized by including at least one structure in which a first light emitting region, a third light emitting region, and a second light emitting region are laminated in this order when viewed from the p-type nitride semiconductor layer side. Nitride semiconductor light emitting device.
2.
In, which emits light having a first light emitting region having at least one first well layer made of a nitride semiconductor containing In, and a main peak wavelength longer than the main peak wavelength of the light emitted by the first well layer. A second light emitting region having at least one second well layer made of a nitride semiconductor including, and In, which emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the second well layer. In a nitride semiconductor light emitting element having an active layer having a multiple quantum well structure including a third light emitting region having at least one third well layer made of a nitride semiconductor containing the light emitting region.
The nitride semiconductor is characterized in that the active layer is composed only of a structure in which a first light emitting region, a third light emitting region, and a second light emitting region are laminated in this order when viewed from the p-type nitride semiconductor layer side. Light emitting element.
3.
It is composed of at least one first well layer made of a nitride semiconductor containing In, and a nitride semiconductor containing In that emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the first well layer. At least one second well layer and at least one third well layer composed of an In-containing nitride semiconductor that emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the second well layer. In a nitride semiconductor light emitting element having an active layer having a multiple quantum well structure including
The active layer has a structure in which the barrier layer, the first well layer, the barrier layer, the third well layer, the barrier layer, the second well layer, and the barrier layer are laminated in this order when viewed from the p-type nitride semiconductor layer side. A nitride semiconductor light emitting device, characterized in that it contains at least one of.
4.
It is composed of at least one first well layer made of a nitride semiconductor containing In, and a nitride semiconductor containing In that emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the first well layer. At least one second well layer and at least one third well layer composed of an In-containing nitride semiconductor that emits light having a main peak wavelength longer than the main peak wavelength of the light emitted by the second well layer. In a nitride semiconductor light emitting element having an active layer having a multiple quantum well structure including
The active layer has a structure in which the barrier layer, the first well layer, the barrier layer, the third well layer, the barrier layer, the second well layer, and the barrier layer are laminated in this order when viewed from the p-type nitride semiconductor layer side. A nitride semiconductor light emitting device characterized by consisting of only a well.
5.
The main peak wavelength of the light emitted by the first well layer is 400 to 480 nm, the main peak wavelength of the light emitted by the second well layer is 480 to 570 nm, and the main peak of the light emitted by the third well layer is 480 to 570 nm. The nitride semiconductor light emitting device according to any one of claims 1 to 4, wherein the wavelength is 570 to 800 nm.
6.
The main peak wavelength of the light emitted by the first well layer is 420 to 460 nm, the main peak wavelength of the light emitted by the second well layer is 480 to 520 nm, and the third main peak wavelength is 570 to 600 nm. The nitride semiconductor light emitting device according to any one of claims 1 to 5.
7.
The n-type nitride semiconductor layer, the active layer, and the p-type nitride semiconductor layer are sequentially provided on the substrate.
The active layer has a multiple quantum well structure including n (n ≧ 4) well layers made of nitride semiconductors containing In, and has a first well layer, a second well layer, ..., First. In the nitride semiconductor light emitting device in which the main peak wavelength is shorter in the order of n well layers,
The first well layer having the shortest main peak wavelength is located closest to the p-type nitride semiconductor layer, and the nth well layer having the longest main peak wavelength is located next to the p-type nitride semiconductor layer. Nitride semiconductor light emitting device.
8.
The nitride semiconductor light emitting device according to any one of claims 1 to 7, wherein the n-type semiconductor layer has a superlattice layer.
9.
The nitride semiconductor light emitting device according to claim 8, wherein the superlattice layer is composed of undoped GaN and Si-doped GaN.

また、本発明は第1の井戸層が発する光の主ピーク波長が420乃至460nm、上記第2の井戸層が発する光の主ピーク波長が480乃至520nm、上記第3の主ピーク波長が570乃至600nmであることを特徴とする。この構成により赤色領域程度の長波長で発光する井戸層を設けることなく所望の演色性を有する白色光の発光効率の高い窒化物半導体発光素子を得ることができる。
また、本発明の窒化物半導体発光素子は、基板上に、n型窒化物半導体層、活性層、p型窒化物半導体層を順に有し、前記活性層は、Inを含む窒化物半導体からなるn個(n≧4)の井戸層を備えた多重量子井戸構造からなり、第1の井戸層、第2の井戸層、・・・、第nの井戸層の順に主ピーク波長が短い窒化物半導体発光素子において、主ピーク波長が最も短い第1の井戸層をp型窒化物半導体層の最も近くに有し、その次にp型窒化物半導体層に近い位置に、主ピーク波長が最も長い第nの井戸層を有することを特徴とする。
また、本発明の窒化物半導体発光素子は、n型半導体層に超格子層を有することを特徴とする。また、超格子層は、アンドープGaNとSiドープGaNからなることを特徴とする。
Further, in the present invention, the main peak wavelength of the light emitted by the first well layer is 420 to 460 nm, the main peak wavelength of the light emitted by the second well layer is 480 to 520 nm, and the third main peak wavelength is 570 or more. It is characterized by having a wavelength of 600 nm. With this configuration, it is possible to obtain a nitride semiconductor light emitting device having a desired color rendering property and having high luminous efficiency of white light without providing a well layer that emits light at a long wavelength of about the red region.
Further, the nitride semiconductor light emitting device of the present invention has an n-type nitride semiconductor layer, an active layer, and a p-type nitride semiconductor layer in this order on a substrate, and the active layer is made of a nitride semiconductor containing In. A nitride structure consisting of multiple quantum well structures with n (n ≧ 4) well layers, with shorter main peak wavelengths in the order of the first well layer, the second well layer, ..., The nth well layer. In a semiconductor light emitting element, the first well layer having the shortest main peak wavelength is located closest to the p-type nitride semiconductor layer, and then the first well layer having the shortest main peak wavelength is located closest to the p-type nitride semiconductor layer, and the main peak wavelength is the longest. It is characterized by having an nth well layer.
Further, the nitride semiconductor light emitting device of the present invention is characterized by having a superlattice layer in the n-type semiconductor layer. Further, the superlattice layer is characterized in that it is composed of undoped GaN and Si-doped GaN.

JP34917499A 1999-12-08 1999-12-08 Nitride semiconductor light emitting device Expired - Fee Related JP4501194B2 (en)

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JP2002176198A (en) * 2000-12-11 2002-06-21 Mitsubishi Cable Ind Ltd Multi-wavelength light emitting element
JP2003218396A (en) * 2001-11-15 2003-07-31 Mitsubishi Cable Ind Ltd Ultraviolet-ray emitting element
US6774402B2 (en) 2002-03-12 2004-08-10 Showa Denko Kabushiki Kaisha Pn-juction type compound semiconductor light-emitting device, production method thereof and white light-emitting diode
EP1667292B1 (en) * 2003-08-26 2010-11-03 Sony Corporation GaN III-V COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING SAME
JP4574417B2 (en) * 2005-03-31 2010-11-04 シャープ株式会社 Light source module, backlight unit, liquid crystal display device
JP2007214384A (en) * 2006-02-09 2007-08-23 Rohm Co Ltd Nitride semiconductor element
EP2074666B1 (en) * 2006-09-08 2012-11-14 Agency for Science, Technology and Research Tunable wavelength light emitting diode
JP5179055B2 (en) * 2006-12-26 2013-04-10 昭和電工株式会社 Group III nitride semiconductor manufacturing method, group III nitride semiconductor light emitting device manufacturing method, group III nitride semiconductor light emitting device, and lamp
WO2008155958A1 (en) * 2007-06-15 2008-12-24 Rohm Co., Ltd. Semiconductor light-emitting device and method for manufacturing semiconductor light-emitting device
US12095001B2 (en) * 2020-04-16 2024-09-17 Seoul Viosys Co., Ltd. Single chip multi band LED
CN113140657B (en) * 2021-05-13 2022-04-19 西安瑞芯光通信息科技有限公司 Ultraviolet LED epitaxial structure and preparation method thereof

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JPH08274369A (en) * 1995-03-30 1996-10-18 Furukawa Electric Co Ltd:The Light emitting device and manufacture thereof
JP3543498B2 (en) * 1996-06-28 2004-07-14 豊田合成株式会社 Group III nitride semiconductor light emitting device
JP3189723B2 (en) * 1997-02-27 2001-07-16 住友電気工業株式会社 Surface emitting semiconductor device and light emitting module using the same
JPH11121806A (en) * 1997-10-21 1999-04-30 Sharp Corp Semiconductor light emitting device
JPH11233827A (en) * 1998-02-10 1999-08-27 Furukawa Electric Co Ltd:The Semiconductor light emitting device

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