JP4663094B2
(ja)
*
|
2000-10-13 |
2011-03-30 |
株式会社半導体エネルギー研究所 |
半導体装置
|
US8160864B1
(en)
|
2000-10-26 |
2012-04-17 |
Cypress Semiconductor Corporation |
In-circuit emulator and pod synchronized boot
|
US8149048B1
(en)
|
2000-10-26 |
2012-04-03 |
Cypress Semiconductor Corporation |
Apparatus and method for programmable power management in a programmable analog circuit block
|
US6608472B1
(en)
*
|
2000-10-26 |
2003-08-19 |
Cypress Semiconductor Corporation |
Band-gap reference circuit for providing an accurate reference voltage compensated for process state, process variations and temperature
|
US6724220B1
(en)
|
2000-10-26 |
2004-04-20 |
Cyress Semiconductor Corporation |
Programmable microcontroller architecture (mixed analog/digital)
|
US7765095B1
(en)
|
2000-10-26 |
2010-07-27 |
Cypress Semiconductor Corporation |
Conditional branching in an in-circuit emulation system
|
US8176296B2
(en)
|
2000-10-26 |
2012-05-08 |
Cypress Semiconductor Corporation |
Programmable microcontroller architecture
|
US8103496B1
(en)
|
2000-10-26 |
2012-01-24 |
Cypress Semicondutor Corporation |
Breakpoint control in an in-circuit emulation system
|
US6854067B1
(en)
|
2000-10-30 |
2005-02-08 |
Cypress Semiconductor Corporation |
Method and system for interaction between a processor and a power on reset circuit to dynamically control power states in a microcontroller
|
JP4083975B2
(ja)
*
|
2000-12-11 |
2008-04-30 |
株式会社ルネサステクノロジ |
半導体装置
|
IT1316271B1
(it)
|
2000-12-28 |
2003-04-03 |
Micron Technology Inc |
Generatore di impulsi compensato in tensione e temperatura.
|
US6664843B2
(en)
*
|
2001-10-24 |
2003-12-16 |
Institute Of Microelectronics |
General-purpose temperature compensating current master-bias circuit
|
US7406674B1
(en)
|
2001-10-24 |
2008-07-29 |
Cypress Semiconductor Corporation |
Method and apparatus for generating microcontroller configuration information
|
US8078970B1
(en)
|
2001-11-09 |
2011-12-13 |
Cypress Semiconductor Corporation |
Graphical user interface with user-selectable list-box
|
US8042093B1
(en)
|
2001-11-15 |
2011-10-18 |
Cypress Semiconductor Corporation |
System providing automatic source code generation for personalization and parameterization of user modules
|
US8069405B1
(en)
|
2001-11-19 |
2011-11-29 |
Cypress Semiconductor Corporation |
User interface for efficiently browsing an electronic document using data-driven tabs
|
US7844437B1
(en)
|
2001-11-19 |
2010-11-30 |
Cypress Semiconductor Corporation |
System and method for performing next placements and pruning of disallowed placements for programming an integrated circuit
|
US7774190B1
(en)
|
2001-11-19 |
2010-08-10 |
Cypress Semiconductor Corporation |
Sleep and stall in an in-circuit emulation system
|
US6971004B1
(en)
|
2001-11-19 |
2005-11-29 |
Cypress Semiconductor Corp. |
System and method of dynamically reconfiguring a programmable integrated circuit
|
US7770113B1
(en)
|
2001-11-19 |
2010-08-03 |
Cypress Semiconductor Corporation |
System and method for dynamically generating a configuration datasheet
|
US8103497B1
(en)
|
2002-03-28 |
2012-01-24 |
Cypress Semiconductor Corporation |
External interface for event architecture
|
KR100476888B1
(ko)
*
|
2002-04-04 |
2005-03-17 |
삼성전자주식회사 |
온도보상기능을 가진 멀티비트 플래쉬메모리
|
US7308608B1
(en)
|
2002-05-01 |
2007-12-11 |
Cypress Semiconductor Corporation |
Reconfigurable testing system and method
|
US7761845B1
(en)
|
2002-09-09 |
2010-07-20 |
Cypress Semiconductor Corporation |
Method for parameterizing a user module
|
ITTO20020803A1
(it)
*
|
2002-09-16 |
2004-03-17 |
Atmel Corp |
Circuito di riferimento di corrente compensato in temperatura.
|
AU2003267183A1
(en)
*
|
2002-09-16 |
2004-04-30 |
Atmel Corporation |
Temperature-compensated current reference circuit
|
US6801454B2
(en)
*
|
2002-10-01 |
2004-10-05 |
Sandisk Corporation |
Voltage generation circuitry having temperature compensation
|
US6839281B2
(en)
*
|
2003-04-14 |
2005-01-04 |
Jian Chen |
Read and erase verify methods and circuits suitable for low voltage non-volatile memories
|
JP2005063026A
(ja)
*
|
2003-08-08 |
2005-03-10 |
Nec Micro Systems Ltd |
基準電圧発生回路
|
CN100543632C
(zh)
*
|
2003-08-15 |
2009-09-23 |
Idt-紐威技术有限公司 |
采用cmos技术中电流模式技术的精确电压/电流参考电路
|
US20050162215A1
(en)
*
|
2004-01-22 |
2005-07-28 |
Winbond Electronics Corporation |
Temperature sensing variable frequency generator
|
US7295049B1
(en)
|
2004-03-25 |
2007-11-13 |
Cypress Semiconductor Corporation |
Method and circuit for rapid alignment of signals
|
JP2005285197A
(ja)
|
2004-03-29 |
2005-10-13 |
Renesas Technology Corp |
半導体記憶装置
|
US8069436B2
(en)
|
2004-08-13 |
2011-11-29 |
Cypress Semiconductor Corporation |
Providing hardware independence to automate code generation of processing device firmware
|
US8286125B2
(en)
|
2004-08-13 |
2012-10-09 |
Cypress Semiconductor Corporation |
Model for a hardware device-independent method of defining embedded firmware for programmable systems
|
KR100568116B1
(ko)
*
|
2004-09-13 |
2006-04-05 |
삼성전자주식회사 |
전압 조절 수단을 구비한 플래시 메모리 장치
|
JP2006189711A
(ja)
*
|
2005-01-07 |
2006-07-20 |
Texas Instr Japan Ltd |
電流駆動回路
|
JP4746326B2
(ja)
*
|
2005-01-13 |
2011-08-10 |
株式会社東芝 |
不揮発性半導体記憶装置
|
US7332976B1
(en)
|
2005-02-04 |
2008-02-19 |
Cypress Semiconductor Corporation |
Poly-phase frequency synthesis oscillator
|
US7251160B2
(en)
|
2005-03-16 |
2007-07-31 |
Sandisk Corporation |
Non-volatile memory and method with power-saving read and program-verify operations
|
KR100761369B1
(ko)
*
|
2005-03-31 |
2007-09-27 |
주식회사 하이닉스반도체 |
온도변화 적응형 내부 전원 발생 장치
|
ITMI20050798A1
(it)
|
2005-05-03 |
2006-11-04 |
Atmel Corp |
Metodo e sistema per la generazi0ne di impulsi di programmazione durante la programmazione di dispositivi elettronici non volatili
|
US7400183B1
(en)
|
2005-05-05 |
2008-07-15 |
Cypress Semiconductor Corporation |
Voltage controlled oscillator delay cell and method
|
EP1729302B1
(en)
*
|
2005-05-31 |
2019-01-02 |
Micron Technology, Inc. |
A circuit for retrieving data stored in semiconductor memory cells
|
KR20060127366A
(ko)
*
|
2005-06-07 |
2006-12-12 |
주식회사 하이닉스반도체 |
내부전압 구동 회로
|
JP4801935B2
(ja)
*
|
2005-06-08 |
2011-10-26 |
株式会社東芝 |
半導体記憶装置
|
US8089461B2
(en)
|
2005-06-23 |
2012-01-03 |
Cypress Semiconductor Corporation |
Touch wake for electronic devices
|
US7274250B2
(en)
*
|
2005-06-28 |
2007-09-25 |
Intel Corporation |
Low-voltage, buffered bandgap reference with selectable output voltage
|
JP4300202B2
(ja)
*
|
2005-06-29 |
2009-07-22 |
株式会社東芝 |
半導体記憶装置
|
KR100635167B1
(ko)
*
|
2005-08-08 |
2006-10-17 |
삼성전기주식회사 |
온도 보상 바이어스 소스회로
|
JP2007060544A
(ja)
*
|
2005-08-26 |
2007-03-08 |
Micron Technol Inc |
温度係数が小さいパワー・オン・リセットを生成する方法及び装置
|
JP2007058772A
(ja)
*
|
2005-08-26 |
2007-03-08 |
Micron Technol Inc |
バンド・ギャップ基準から可変出力電圧を生成する方法及び装置
|
JP2007059024A
(ja)
|
2005-08-26 |
2007-03-08 |
Micron Technol Inc |
温度補償された読み出し・検証動作をフラッシュ・メモリにおいて生成するための方法及び装置
|
US7443732B2
(en)
*
|
2005-09-20 |
2008-10-28 |
Spansion Llc |
High performance flash memory device capable of high density data storage
|
JP2007102865A
(ja)
*
|
2005-09-30 |
2007-04-19 |
Toshiba Corp |
半導体集積回路装置
|
US8085067B1
(en)
|
2005-12-21 |
2011-12-27 |
Cypress Semiconductor Corporation |
Differential-to-single ended signal converter circuit and method
|
JP2007200233A
(ja)
*
|
2006-01-30 |
2007-08-09 |
Nec Electronics Corp |
ダイオードの非直線性を補償した基準電圧回路
|
JP2007200234A
(ja)
*
|
2006-01-30 |
2007-08-09 |
Nec Electronics Corp |
非線形カレントミラー回路で駆動する基準電圧回路
|
KR100842996B1
(ko)
*
|
2006-02-06 |
2008-07-01 |
주식회사 하이닉스반도체 |
온도에 따라 선택적으로 변경되는 워드 라인 전압을발생하는 워드 라인 전압 발생기와, 이를 포함하는 플래시메모리 장치 및 그 워드 라인 전압 발생 방법
|
US8067948B2
(en)
|
2006-03-27 |
2011-11-29 |
Cypress Semiconductor Corporation |
Input/output multiplexer bus
|
US7269092B1
(en)
|
2006-04-21 |
2007-09-11 |
Sandisk Corporation |
Circuitry and device for generating and adjusting selected word line voltage
|
US7518930B2
(en)
*
|
2006-04-21 |
2009-04-14 |
Sandisk Corporation |
Method for generating and adjusting selected word line voltage
|
JP2007299489A
(ja)
*
|
2006-05-02 |
2007-11-15 |
Micron Technology Inc |
不揮発性メモリにおける読み取り・検証動作を生成する方法及び装置
|
US7489556B2
(en)
*
|
2006-05-12 |
2009-02-10 |
Micron Technology, Inc. |
Method and apparatus for generating read and verify operations in non-volatile memories
|
US7391650B2
(en)
*
|
2006-06-16 |
2008-06-24 |
Sandisk Corporation |
Method for operating non-volatile memory using temperature compensation of voltages of unselected word lines and select gates
|
US7342831B2
(en)
*
|
2006-06-16 |
2008-03-11 |
Sandisk Corporation |
System for operating non-volatile memory using temperature compensation of voltages of unselected word lines and select gates
|
WO2007149676A2
(en)
*
|
2006-06-16 |
2007-12-27 |
Sandisk Corporation |
Method for operating non-volatile memory using temperature compensation of voltages of unselected word lines and select gates
|
US7504878B2
(en)
*
|
2006-07-03 |
2009-03-17 |
Mediatek Inc. |
Device having temperature compensation for providing constant current through utilizing compensating unit with positive temperature coefficient
|
US7436724B2
(en)
*
|
2006-08-04 |
2008-10-14 |
Sandisk Corporation |
Method and system for independent control of voltage and its temperature co-efficient in non-volatile memory devices
|
JP2008123480A
(ja)
*
|
2006-10-16 |
2008-05-29 |
Nec Electronics Corp |
基準電圧発生回路
|
JP4908149B2
(ja)
|
2006-10-18 |
2012-04-04 |
株式会社東芝 |
Nand型フラッシュメモリ
|
JP2008117215A
(ja)
*
|
2006-11-06 |
2008-05-22 |
Toshiba Corp |
基準電位発生回路
|
US7616501B2
(en)
*
|
2006-12-04 |
2009-11-10 |
Semiconductor Components Industries, L.L.C. |
Method for reducing charge loss in analog floating gate cell
|
US7447093B2
(en)
*
|
2006-12-29 |
2008-11-04 |
Sandisk Corporation |
Method for controlling voltage in non-volatile memory systems
|
US7403434B1
(en)
*
|
2006-12-29 |
2008-07-22 |
Sandisk Corporation |
System for controlling voltage in non-volatile memory systems
|
US7447079B2
(en)
*
|
2007-04-05 |
2008-11-04 |
Sandisk Corporation |
Method for sensing negative threshold voltages in non-volatile storage using current sensing
|
US8040266B2
(en)
|
2007-04-17 |
2011-10-18 |
Cypress Semiconductor Corporation |
Programmable sigma-delta analog-to-digital converter
|
US8026739B2
(en)
|
2007-04-17 |
2011-09-27 |
Cypress Semiconductor Corporation |
System level interconnect with programmable switching
|
US8516025B2
(en)
|
2007-04-17 |
2013-08-20 |
Cypress Semiconductor Corporation |
Clock driven dynamic datapath chaining
|
US9564902B2
(en)
|
2007-04-17 |
2017-02-07 |
Cypress Semiconductor Corporation |
Dynamically configurable and re-configurable data path
|
US8130025B2
(en)
|
2007-04-17 |
2012-03-06 |
Cypress Semiconductor Corporation |
Numerical band gap
|
US7737724B2
(en)
|
2007-04-17 |
2010-06-15 |
Cypress Semiconductor Corporation |
Universal digital block interconnection and channel routing
|
US8092083B2
(en)
|
2007-04-17 |
2012-01-10 |
Cypress Semiconductor Corporation |
Temperature sensor with digital bandgap
|
US9720805B1
(en)
|
2007-04-25 |
2017-08-01 |
Cypress Semiconductor Corporation |
System and method for controlling a target device
|
US8065653B1
(en)
|
2007-04-25 |
2011-11-22 |
Cypress Semiconductor Corporation |
Configuration of programmable IC design elements
|
US8266575B1
(en)
|
2007-04-25 |
2012-09-11 |
Cypress Semiconductor Corporation |
Systems and methods for dynamically reconfiguring a programmable system on a chip
|
WO2008133674A1
(en)
*
|
2007-04-27 |
2008-11-06 |
Sandisk Corporation |
Method and device for generating and adjusting selected word line voltage
|
US8049569B1
(en)
|
2007-09-05 |
2011-11-01 |
Cypress Semiconductor Corporation |
Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
|
US20090066313A1
(en)
*
|
2007-09-07 |
2009-03-12 |
Nec Electronics Corporation |
Reference voltage circuit compensated for temprature non-linearity
|
JP2009080786A
(ja)
*
|
2007-09-07 |
2009-04-16 |
Nec Electronics Corp |
温度非直線性を補償した基準電圧回路
|
JP2009098802A
(ja)
*
|
2007-10-15 |
2009-05-07 |
Toshiba Corp |
基準電圧発生回路
|
JP2009123292A
(ja)
*
|
2007-11-15 |
2009-06-04 |
Toshiba Corp |
半導体記憶装置
|
JP2009129470A
(ja)
*
|
2007-11-20 |
2009-06-11 |
Toshiba Corp |
半導体記憶装置
|
JP5361182B2
(ja)
*
|
2007-12-21 |
2013-12-04 |
株式会社東芝 |
半導体記憶装置
|
KR100924345B1
(ko)
*
|
2007-12-28 |
2009-11-02 |
주식회사 하이닉스반도체 |
내부전압 생성회로
|
US7719888B2
(en)
*
|
2008-06-18 |
2010-05-18 |
Micron Technology, Inc. |
Memory device having a negatively ramping dynamic pass voltage for reducing read-disturb effect
|
US7859911B2
(en)
*
|
2008-07-21 |
2010-12-28 |
Triune Ip Llc |
Circuit and system for programming a floating gate
|
US7755946B2
(en)
*
|
2008-09-19 |
2010-07-13 |
Sandisk Corporation |
Data state-based temperature compensation during sensing in non-volatile memory
|
US8368789B2
(en)
*
|
2008-11-26 |
2013-02-05 |
Aptina Imaging Corporation |
Systems and methods to provide reference current with negative temperature coefficient
|
JP5300446B2
(ja)
*
|
2008-12-04 |
2013-09-25 |
キヤノン株式会社 |
ヘッド基板及びインクジェット記録ヘッド
|
JP5275052B2
(ja)
*
|
2009-01-08 |
2013-08-28 |
株式会社東芝 |
不揮発性半導体記憶装置
|
JP2010262696A
(ja)
*
|
2009-04-30 |
2010-11-18 |
Toshiba Corp |
Nand型フラッシュメモリ
|
US9448964B2
(en)
|
2009-05-04 |
2016-09-20 |
Cypress Semiconductor Corporation |
Autonomous control in a programmable system
|
KR101041485B1
(ko)
*
|
2009-08-27 |
2011-06-16 |
한국기계연구원 |
전기 압력밥솥의 벨로우즈형 증기 배출밸브
|
KR20190124813A
(ko)
*
|
2009-11-20 |
2019-11-05 |
가부시키가이샤 한도오따이 에네루기 켄큐쇼 |
반도체 장치
|
US20110133719A1
(en)
*
|
2009-12-04 |
2011-06-09 |
Advance Micro Devices, Inc. |
Voltage reference circuit operable with a low voltage supply and method for implementing same
|
CN101859161A
(zh)
*
|
2010-06-17 |
2010-10-13 |
华为技术有限公司 |
低电压源带隙基准电压电路和一种集成电路
|
KR20120043522A
(ko)
*
|
2010-10-26 |
2012-05-04 |
에스케이하이닉스 주식회사 |
반도체 메모리 소자의 내부 전압 발생기
|
JP2012203931A
(ja)
*
|
2011-03-24 |
2012-10-22 |
Toshiba Corp |
半導体記憶装置
|
US8611157B2
(en)
*
|
2011-12-22 |
2013-12-17 |
Sandisk Technologies Inc. |
Program temperature dependent read
|
KR101809202B1
(ko)
|
2012-01-31 |
2017-12-14 |
삼성전자주식회사 |
불휘발성 메모리 장치 및 그것의 읽기 방법
|
WO2014072763A1
(en)
*
|
2012-11-07 |
2014-05-15 |
Freescale Semiconductor, Inc. |
Temperature coefficient factor circuit, semiconductor device, and radar device
|
JP6287025B2
(ja)
*
|
2013-10-09 |
2018-03-07 |
セイコーエプソン株式会社 |
発光装置及び電子機器
|
JP2015075623A
(ja)
*
|
2013-10-09 |
2015-04-20 |
セイコーエプソン株式会社 |
発光装置、電子機器、及び発光装置の設計方法
|
WO2015075496A1
(en)
|
2013-11-22 |
2015-05-28 |
Freescale Semiconductor, Inc. |
Apparatus and method for generating a temperature-dependent control signal
|
US9786345B1
(en)
*
|
2016-09-16 |
2017-10-10 |
Micron Technology, Inc. |
Compensation for threshold voltage variation of memory cell components
|
JP6751013B2
(ja)
|
2016-12-27 |
2020-09-02 |
旭化成エレクトロニクス株式会社 |
温度特性調整回路
|
JP2018147535A
(ja)
*
|
2017-03-07 |
2018-09-20 |
東芝メモリ株式会社 |
半導体記憶装置及びメモリシステム
|
US10424908B2
(en)
|
2017-03-21 |
2019-09-24 |
Texas Instruments Incorporated |
Electronic fuse
|
US10950658B2
(en)
*
|
2018-09-21 |
2021-03-16 |
Taiwan Semiconductor Manufacturing Company Ltd. |
Circuit and method to enhance efficiency of memory
|
CN112068626B
(zh)
*
|
2020-07-30 |
2022-04-15 |
广东美的白色家电技术创新中心有限公司 |
一种家用电器、芯片及电压源电路
|
JP2023088142A
(ja)
*
|
2021-12-14 |
2023-06-26 |
キオクシア株式会社 |
電圧発生回路
|