JP2000171483A - Manufacture of semiconductor inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To collectively inspect the electrode pads having a large area of a wafer to be inspected by forming such a beam or diaphragm structure that probes are changed by pressing forces in a substrate on which the probes are formed and pressing or fixing the wafer in which the electrode pads are formed. SOLUTION: A plurality of probes 13 is formed in an inspection wafer 11 by forming a coating film on the surface of a silicon substrate and, after the film is patterned by photolithography, a plurality of probes 13 by etching. Then, after the coating film is removed, diaphragms 12 are formed at every probe 13 in the same process. In the same process, in addition, through holes 14 are formed correspondingly to the probes 13 and wiring 16 is formed from the probes 13 to secondary-side electrode pads 17 through the through holes 14. The electrode pads 17 are connected to POGO pins 25 and the wafer 11 fixed to a pressing mechanism supporting substrate 23 is pressed against a wafer 21 to be inspected on a wafer fixing stage 22. Therefore, the probes 13 can evenly inspect the primary-side electrode pads 23 of the wafer 21 for electric characteristics, because the probes 13 come into contact with the electrodes pads 23, resulting in the deformation of the diaphragms 12, and a fixed load is applied between the probes 13 and electrode pads 23.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting a semiconductor element or a semiconductor device formed on a wafer, and more particularly to an inspection apparatus for measuring electrical characteristics in a semiconductor manufacturing process such as a probing inspection and a burn-in inspection.

[0002]

2. Description of the Related Art In a semiconductor device such as an IC (integrated circuit) or an LSI (large-scale integrated circuit), a pre-process until a circuit is formed on the surface of a silicon wafer, and the silicon wafer is cut into individual chips and resin or It is roughly divided into a post-process until sealing with ceramic or the like. In these semiconductor devices, an electrical characteristic test of each circuit is performed at a predetermined stage in a previous process, and a non-defective product and a defective product are determined for each chip. The above electrical characteristics inspection is divided into probing inspection to determine the quality of conduction between circuits and burn-in inspection to apply thermal and electrical stress to circuits at a high temperature of about 150 ° C to accelerate and sort out defects. it can.

In both the probing inspection and the burn-in inspection, the basic connection means between the wafer to be inspected and an external inspection system is substantially the same. That is, several tens to several hundreds of μm are patterned on the test wafer at a pitch of several tens to several hundreds of μm.
A method of mechanically pressing individual conductive fine probes against individual aluminum alloy or other alloy electrode pads having an m square and a thickness of about 1 μm is employed.

FIGS. 13 and 14 show the structure of a conventionally used probe.

In FIG. 13, each probe 141 is a fine needle mainly made of tungsten and having a tip diameter of several tens of μm and a length of several tens of mm. It is fixed or molded on the insulating jig 143.

In FIG. 14, each probe 151 is a hemispherical metal protrusion formed mainly by stacking plating or a pyramid-shaped metal protrusion formed by forming an anisotropically etched hole in a silicon substrate as a plating die. This aggregate is formed on the surface of the organic thin film 152.

As means for solving the problems of the above-mentioned two examples described later, JP-A-6-123746, JP-A-7-7052, JP-A-8-50146, and JP-A-9-243663. A gazette has been published.

In Japanese Patent Application Laid-Open No. Hei 6-123746, a plurality of probe needles which can be individually elastically deformed are formed uniformly by making cuts in an elastically deformable card, and a semiconductor element is provided at the tip of each of the plurality of probe needles. And a plurality of contacts that can contact the electrodes.

Japanese Patent Application Laid-Open No. 7-7052 discloses a cantilever structure composed of at least one of single crystal silicon, silicon oxide, silicon nitride, polysilicon, and a metal layer, and a metal film for conduction is formed on the surface thereof. Further, this cantilever structure is held by an insulating substrate on which a conductive wiring pattern is formed to form a probe for measuring electrical characteristics.

On the other hand, Japanese Patent Application Laid-Open No. 9-243663 discloses a method for processing a silicon substrate into a diaphragm shape, filling a diaphragm portion having a structure in which a plurality of contact probes are formed on a contact surface with an elastomer, and measuring electric characteristics. Forming a probe.

[0011]

The method of testing a semiconductor device as described in the prior art has the following problems.

In the probe structure shown in FIG. 13, it takes a lot of time to position and fix each probe with high accuracy, and it has been difficult to mass-produce the probe structure at low cost. In addition, since many areas for positioning and fixing individual probes were required, it was difficult to arrange more probes in the substrate, and the number of electrode pads or chips that could be tested at one time was limited. .
Furthermore, since the length of each probe is as large as about several tens of millimeters, the regulated capacity in each probe is large, and it is virtually impossible to inspect a high-speed device of about 100 MHz or more.

In addition, since the radius of curvature of the tip of each probe is large and an insulating natural oxide film formed on the surface of the electrode pad of the test wafer is broken, a large pressing load and scribe (scribe) are applied to the surface of the electrode pad. ), The probe tip wears faster, the life of the probe (the number of service tests) is shortened, and the dust on the electrode pads generated by scribing contaminates the environment in semiconductor device manufacturing. Was.

In the probe structure shown in FIG.
Probes are arranged at a fine pitch corresponding to the electrode pads of the wafer under test on the surface of an organic thin film such as polyimide, so that the probe and the corresponding electrode pads caused by warpage of the wafer under test and variations in the height of the probes It has been difficult to absorb variations in distance independently. In addition, since the substrate is made of an organic thin film such as polyimide having a significantly different linear expansion coefficient from the test wafer, a large difference in thermal expansion between the test wafer and the test wafer occurs in a burn-in test performed at a high temperature of about 150 ° C. In the case of a probe located away from the center, a positional shift between the electrode pad and the probe may occur.

In Japanese Patent Application Laid-Open No. Hei 6-123746, since the card is made of synthetic resin or metal,
It has been difficult to arrange probes at a fine pitch corresponding to the electrode pad positions of the test wafer, that is, to form a plurality of probe needles that can be individually elastically deformed.

In Japanese Patent Application Laid-Open No. 7-7052, an individual cantilever probe formed of a silicon-based material is newly bonded to another insulating substrate surface, which lowers the production yield. There was a problem that the height was uneven.

Japanese Patent Application Laid-Open No. 9-243663 describes that a diaphragm formed in a silicon substrate is deformed along with the distortion of a wafer to be tested by using an elastomer (elastic material). If the variation in the thickness of the diaphragm is not taken into account and the diaphragm having the undulation or the variation in the thickness is deformed, the height of the contact probe cannot be controlled. For this reason, since the depth direction of the electrical characteristic measuring pad of the test wafer cannot be controlled, if the pressing force is insufficient, a portion that does not contact the electrical characteristic measuring pad portion of the test wafer appears. Further, when the pressing force is excessively applied, there is a problem that the test wafer is deeply immersed in the electric characteristic measuring pad portion of the test wafer and destroys the test wafer.

In any of the above probe structures, the wiring for electrical connection between the tip of the probe and the external inspection system is formed on the same surface as the probe forming surface in the substrate. The connection terminals must be formed in the vicinity of the outer periphery of the base material, and the area where the external connection terminals can be formed is limited, and it is difficult to electrically connect many probes to the outside. It has been difficult to perform a large-area simultaneous inspection such as inspecting all the electrode pads of the inspection wafer at once.

SUMMARY OF THE INVENTION An object of the present invention is to solve many of the problems described above, and to improve the electrical characteristics of a semiconductor device.
For example, it is possible to perform a large area simultaneous inspection such as a simultaneous inspection of all electrode pads of a wafer to be inspected, thereby improving a manufacturing yield, reducing a manufacturing cost, and obtaining an inexpensive and highly reliable semiconductor device. is there.

[0020]

In order to achieve the above object, in a method of inspecting a semiconductor device while electrically connecting the semiconductor device with an inspection device and electrically connecting the semiconductor device to the inspection device, a probe is formed on a substrate on which a probe is formed. A beam structure or a diaphragm structure which can be changed by pressing force is formed, and a mechanism for pressing or fixing a test wafer on which an electrode pad of a semiconductor element for inspection is formed or a probe of the substrate or a peripheral portion of the probe is pressed. This can be achieved by providing a mechanism. In addition, the probe is formed of silicon or metal or a composite material thereof using silicon for the substrate on which the probe is formed, and wiring is performed to the rear surface side of the probe forming substrate by wiring using a conductive material via an insulator. It is good to use the structure which has been done. Also,
By having a flat portion at the tip of the probe, the probe height can be formed uniformly and with high precision.

It is preferable that the probe is formed in an independent and double-supported beam, and the probe is formed in the center plane.
A structure in which a beam is formed in a swastika shape around the periphery may be used. Anisotropic etching or dry etching is used for processing the structure including these beams. ICP-RIE (Inductively) is used for the dry etching.
Coupled Plasma-Reactive Io
By using an n-etching apparatus, it is possible to form a narrow space between beams, and it is possible to cope with a narrow pitch of devices.

Wiring is performed by penetrating the substrate by using anisotropic etching or dry etching on the inspection wafer, and electrically connecting the probe forming surface of the substrate and the back surface thereof by sputtering, vapor deposition or plating. Is used.
Further, it is preferable to form the through-hole of the inspection wafer by using dry etching. Further, semiconductor devices or electronic components inspected using the above structure and method can be provided at very low cost.

[0023]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view showing a practical example of the structure of an inspection wafer of a semiconductor inspection apparatus according to the present invention.

The inspection wafer 11 includes a doubly supported beam or diaphragm 12 (hereinafter, referred to as a diaphragm), a probe 13, and a through hole 14. A probe 13 is formed on the diaphragm 12, and the probe 13 protrudes from the bottom surface of the inspection wafer 11 by several μm to several tens μm. The same number of through holes 14 as the probes 13 are formed, and the entire surface of the inspection wafer 11 is covered with the silicon oxide film 1.
5 coated. The probe 13 and the wiring 16 are formed on the silicon oxide film 15. The wirings 16 are formed from the individual probes 13 to the secondary electrode pads 17 formed on the opposite side of the inspection wafer 11 through the respective through holes 14.

FIG. 2 is a sectional view showing an embodiment of the structure of the semiconductor inspection apparatus according to the present invention.

The wafer 21 to be tested is XY (not shown).
Vacuum suction is applied to a wafer fixed stage 22 that can move in the Zθ direction. The wafer fixing stage 22 can connect the probe 13 formed on the inspection wafer 11 described in FIG. 1 with the primary-side electrode pad 23 formed on the test wafer 21 with high precision.

The inspection wafer 1 is placed on the pressing mechanism support substrate 24.
In order to electrically connect the secondary-side electrode pad 17 formed in 1 with an external terminal, a connection terminal generally called a pogo pin 25 having an elastic structure and an internal wiring 26 are formed.
The pressing mechanism support substrate 24 and the inspection wafer 11 are fixed after the pogo pins 25 and the secondary electrode pads 23 are aligned and connected. Next, the test wafer 11 fixed to the pressing mechanism support substrate 24 is pressed against the test wafer 21 adsorbed on the wafer fixing stage 22.

As a result, the primary electrode pad 23 and the probe 13 come into contact with each other, the diaphragm 12 is deformed, a constant load is applied between the probe 13 and the primary electrode pad 23, and a uniform electrical characteristic test is performed for all the probes. Will be possible. Here, XYZ is attached to the wafer fixing stage 22.
Although the description has been given of the configuration having the θ-direction moving mechanism, the moving mechanism may be added to the pressing mechanism supporting substrate 24 or both the wafer fixing stage 22 and the pressing mechanism supporting substrate 24.

In the above description, the secondary electrode pads 17 formed on the inspection wafer 11 are connected to the external electrodes using the pogo pins 25. However, a structure using solder bumps instead of the pogo pins 25 may be used.

FIG. 3 is a sectional view of a structure in which a pressing mechanism is further added to the semiconductor inspection apparatus described in FIG.

When a sufficient pressing force is not applied to the diaphragm 12 only by the pogo pins 25 or the solder bumps, elastomers 41 and 42 are provided to press the diaphragm 12 and other parts. However, elastomer 4
Elastic structures other than 1 and 42 may be provided. 2 and 3, the silicon oxide film 15 covering the entire surface of the inspection wafer 11 is omitted.

FIG. 4 is a sectional view showing a processing step of the inspection wafer of the present invention.

(A) It is preferable that the silicon wafer 11 serving as a substrate has a diameter of 8 inches and a thickness of 600 μm and has the same shape as the wafer 21 to be tested. Thereby, it is possible to reduce the manufacturing cost and save the space for the inspection device. For example, when the test wafer 21 has a diameter of 8 inches,
The inspection wafer 11 also preferably has a diameter of 8 inches.

(B) A 0.7 μm thick silicon oxide film 15 is formed on the surface of the silicon wafer 11. afterwards,
A pattern for silicon etching is formed by a photolithography process. That is, a photoresist is applied to the surface of the silicon oxide film 15, and exposed, developed, and etched using a photomask on which the pattern is drawn, whereby the silicon oxide film 15 is partially removed to form a pattern having an opening. Form. Next, anisotropic etching is performed with a 35% aqueous solution of potassium hydroxide at 80 ° C., and the silicon wafer 11 is eroded from the opening of the silicon oxide pattern to form a probe 13 having a height of 50 μm.

Here, the silicon oxide film 15 is used as a pattern for etching the silicon wafer 11,
Instead, a silicon nitride film may be used. Further, although an aqueous solution of potassium hydroxide was used as an etchant for the silicon wafer 11, other anisotropic etchants, for example, tetramethylammonium hydroxide, ethylenediamine pyrocatechol, hydrazine and the like may be used.

(C) removing the silicon oxide film pattern,
Again, a silicon oxide film 15 is formed on the entire surface of the silicon wafer 11 to a thickness of 1 μm. As in (b), a pattern for silicon etching is formed by a photolithography process, and a diaphragm 12 having a thickness of 100 μm and a length of 2 mm is formed by anisotropic etching.

(D) removing the silicon oxide film pattern,
A silicon oxide film 15 is formed on the entire surface of the silicon wafer 11. A pattern for silicon etching is formed by a photolithography process, and RIE (Reactive) is performed.
The through hole 14 is formed by an ion etching (Ion Etching) apparatus. At this time, the through hole 14 has a diameter of 100 μm. However, the size of the through hole may be any other size as long as the number of electrode pads can be formed within the size of each semiconductor chip.

(E) removing the silicon oxide film pattern;
A silicon oxide film 15 is formed on the entire surface of the silicon wafer
5 μm is formed. This silicon oxide film 15 is used for the probe 1
Since the current flowing through the wiring 16 connecting the third electrode pad 3 and the secondary-side electrode pad 17 is prevented from leaking into the inside of the inspection wafer, it may be formed with a thickness other than this. Further, instead of a silicon oxide film, another insulating film may be formed as long as the film is not melted at 150 ° C. or higher.

(F) After forming a photoresist pattern on the surface of the silicon oxide film 15 by a photolithography process, a chromium film is firstly formed to a thickness of 0.1 μm on the entire surface of the silicon wafer 11 by using a sputtering apparatus, and then a nickel film is formed. Is formed to 1 μm. Thereafter, the photoresist, the chromium film and the nickel film on the photoresist are removed by a lift-off method, and the wiring 16 and the secondary electrode pads 17 are removed.
To form

The film forming device for the wiring 16 and the secondary electrode pad 17 is not limited to the sputtering device, but may be a vapor deposition device or a CV
D (Chemical Vapor Deposition)
n) An apparatus may be used. The method of forming the wiring 16 and the secondary-side electrode pad 17 is not limited to the lift-off method. An insulating film is formed on the entire surface of the inspection wafer 11, a thin film for wiring is formed on the entire surface, and etching is performed by a photolithography process. It may be formed. The etching at this time may be either wet etching using an etchant or dry etching using an ion milling device or the like. Further, the wiring material does not melt at 150 ° C. or higher, has conductivity, and is a material capable of forming a thin film, for example, gold,
Copper, platinum, titanium, cobalt, molybdenum, tungsten, or the like may be used.

FIG. 5 is a side view and a plan view showing the shape of the probe according to the present invention.

FIG. 4A shows a probe 13 formed on the diaphragm 12 by anisotropic wet etching.
Anisotropic wet etching is a processing method that utilizes the fact that the etching rate varies depending on the crystal face of silicon in an alkaline etching solution. For this reason,
In the case of a silicon wafer having a (100) plane, a pyramid-shaped probe 13 surrounded by the (100) plane and the (111) plane is formed.

(B) shows the probe in a state where the etching has progressed further than in (a). (100)
Many crystal planes other than the (100) plane and the (111) plane appear at the ridge where the plane and the (100) plane and the (100) plane and the (111) plane cross each other. Therefore, (11
(100) plane and (111) plane such as (0) plane and (311) plane
The shape is such that a crystal plane having a higher etch rate than the plane appears.

(C) is a method in which cylindrical projections are formed by dry etching using an RIE apparatus or the like.
This is a probe formed by forming a mask pattern of silicon oxide or the like on the surface and the tip of a cylinder, tilting the silicon wafer, and performing dry etching with an ion milling device or the like to form a cone. At this time, it is better to perform the dry etching while rotating and revolving the inclined silicon wafer.

(D) is a probe formed into a columnar shape having the same diameter as the tip by dry etching using an RIE apparatus or the like. (E) and (f) are probes formed by combined etching of anisotropic wet etching and dry etching. (E) is a combination of (a) and (d), (f)
Is a combination of (c) and (d). As described above, the shape of the probe 13 is not particularly limited. However, when the height of the probe 13 is determined, in the methods (a) to (c), the probe in contact with the diaphragm 12 is compared with the tip area of the probe 13. Since the area of the probe 13 is large, the pitch between the probes cannot be reduced too much.

When the inter-probe pitch is narrow, the shapes shown in (d) to (f) are good, but the strength is inferior to those in (a) to (c). Therefore, it is better to determine the shape of the probe 13 in consideration of the pitch of the primary electrode pad, the pressing force, the deflection amount of the beam or the diaphragm, the probe height, and the like.

On the other hand, in the probe 13 of (a) to (f), a flat portion which is not etched at the time of forming the probe 13 is preferably formed in a portion in contact with the primary electrode at the tip. If a sharp shape is formed without providing a flat portion at the tip of the probe 13 by anisotropic wet etching, the mask disappears at the moment of the sharpness. Although anisotropic wet etching is performed, unless the temperature of the etching solution is precisely controlled, a variation of several percent occurs in the silicon wafer due to etching, so that the height of the tip of the probe 13 becomes uneven.

However, when a flat portion is formed at the tip of the probe 13, the height of the probe 13 becomes uniform. Therefore, when the primary electrode pads 23 of the test wafer 21 and the probes 13 of the test wafer 11 are connected, the displacement amounts of all the diaphragms 12 of the test wafer 11 become constant. Accordingly, since the load of all the probes 13 on the inspection wafer 11 is constant, uniform and high-precision inspection can be performed on all the primary electrode pads 23 on the wafer 21 to be inspected. The shape of the flat portion 61 at the tip of the probe 13 is not limited to a square or a circle, but may be another polygon.

FIG. 6 shows the arrangement of primary electrode pads formed on a semiconductor chip.

The pad arrangement includes (a) an electrode pad 72 substantially linearly arranged along a center line of a semiconductor chip 71 like a DRAM (read only memory element);
(B) It can be roughly classified into those in which electrode pads 74 are arranged linearly around the semiconductor chip 73 like a microcomputer. Both (a) and (b) are individual electrode pads 72, 7
The dimension of No. 3 is several tens μm square to several hundred μm square, and the pitch between the pads is also several tens μm to several hundred μm.

FIG. 7 is a plan view showing the structure of a beam or a diaphragm according to the present invention.

(A), (b) and (c) are for a semiconductor chip aligned straight at the center. (A) is a doubly supported beam structure according to the present invention. One probe 13 is formed for each doubly supported beam 12 formed on the inspection wafer 11. The pitch between the probes is opposed to the pitch between the primary-side electrode pads, but the beam width, beam length, and beam thickness are the same for all probes, and the load applied to the probes is kept constant.

(B) is a diaphragm structure according to the present invention. Slits 81 are formed in the direction in which the probes 13 are arranged, and the amount of deflection of the diaphragm 12 is made uniform so that the load applied to each probe 13 is made constant. This is effective when the pitch between the pads of the primary electrode is narrow or when it is desired to increase the probe load in the same space as the doubly supported structure.

FIG. 7C shows a structure in which slits 81 are provided in four directions. Although the pitch between the pads of the primary electrode is narrow and a doubly supported beam cannot be formed, it is effective when the probe load is desired to be reduced. (D), (e) and (f) are for a semiconductor chip arranged in a straight line in the peripheral portion, and (d) is for (a), (e) is for (b), and (f) is for (c). This is an application example. Especially (f)
Has a structure in which a doubly supported beam 12 that connects a central portion where the probe 13 is arranged and a peripheral portion is formed in a swastika shape, and the displacement amount of the probe 13 is increased. The displacement amount of the probe can be further increased by adopting a structure in which the beam length is increased, for example, a spiral type, not limited to the swastika type.

FIG. 8 is a sectional view and a plan view showing the structure of a doubly supported beam according to the present invention.

The root portions 91 and 9 of the doubly supported beam 12 are subjected to dry etching using an RIE device or isotropic etching using a mixed solution of hydrofluoric acid, nitric acid and acetic acid.
By forming roundness in 2, the rigidity and durability of the doubly supported beam 12 can be increased, and the reliability in repeated inspection can be improved. Forming roundness is an effective means not only for a double-supported beam but also for a diaphragm or a cantilever.

FIG. 9 is a plan view and a cross-sectional view showing the shape of the through hole by the etching method. In each of (a), (b) and (c), X = 2 mm, Y = 2 mm, and Z = 600 μm (1)
A through hole of d = 100 μm is formed in the silicon wafer of the (00) plane, and L is set so that the through holes do not overlap each other.
= Formed at intervals of 100 μm.

(A) shows a through hole 102 formed from one side of a silicon wafer 101 by anisotropic wet etching. In the anisotropic wet etching, four (111) planes 103 having a slope of about 54.7 ° are used.
An inverted quadrangular pyramid-shaped through hole 102 surrounded by is formed. At this time, D1 = 2Z / tan 54.7 ° + d = 949 μ
m, P1 = D1 + L = 1,049 μm, and only four through holes 102 can be formed in the silicon wafer 101 of 2 mm square.

(B) shows through holes 104 formed from both sides of the silicon wafer 101 by anisotropic wet etching, and has a drum-like shape in which through holes of inverted quadrangular pyramid shape are connected. At this time, D2 = Z / tan 54.7 °
+ D = 524 μm, P2 = D2 + L = 624 μm, and nine through holes 104 can be formed in the silicon wafer 101 of 2 mm square.

In both (a) and (b), the through holes 102 and 104 are provided.
When the dimension d is reduced, there is no change in the quantity that can be formed on the 2 mm silicon wafer 101, and there is a processing limit in anisotropic wet etching.

On the other hand, (c) shows through holes 105 in the silicon wafer 101 by dry etching such as RIE.
Is formed. Due to the dry etching, the through hole 105 has a substantially vertical shape which is substantially the same as the mask pattern. Therefore, D3 = d = 100 μm, P3 = D
3 + L = 200 μm, and 100 through-holes 105 are formed in the silicon wafer 101 of □ 2 mm.

The processing limit of the RIE apparatus may be represented by an aspect ratio (processing depth / processing width). Especially ICP
It is said that the aspect ratio in the case of the RIE apparatus is 15 to 20. Silicon wafer 101 having a thickness of 600 μm
Is processed from one side, the minimum processing size of the through hole 105 is 30 μm to 40 μm. Furthermore, when processing from both sides, the minimum processing dimension of the through hole 105 is 15 μm to 20 μm. Therefore, several thousand silicon wafers 101 of 2 mm square can be formed. Therefore, the same number of through holes as the electrode pads formed on each semiconductor chip can be formed directly above each semiconductor chip. Thereby, the wiring can be shortened, and the wiring resistance can be reduced.

FIG. 10 is a perspective view showing an overall outline of a test wafer and an inspection wafer according to the present invention. Hundreds of semiconductor chips 111 are formed on the test wafer 21, and tens to hundreds of tens of electrode pads 23 are formed on each semiconductor chip 111. In addition, the same number or more of dozens of beams or diaphragms 12 are formed on the inspection wafer 11 as the semiconductor chips 111 of the wafer 21 to be tested. Each doubly supported beam or diaphragm 12 has electrodes formed on the semiconductor chips 111. A probe is formed facing the pad 23. Further, the inspection wafer 11 has a respective doubly supported beam or diaphragm 12.
Are formed in the periphery of the wire, and wiring from each probe is taken out from the through hole 14.

FIG. 11 is a sectional view showing the structure of a burn-in inspection pack according to the present invention. The inspection wafer 11 has a doubly supported beam 12 or a diaphragm 12 which is easily deformed, and the probe 13 is formed on the doubly supported beam 12 or the diaphragm 12. The inspection wafer is formed into the same size as or smaller than the test wafer through the processing steps described with reference to FIG. Also, for example, it is possible to cut and combine an inspection wafer having a diameter of 6 inches with a wafer having an inspection diameter of 8 inches, and collectively inspect the inspection wafer having a diameter of 8 inches. This takes into account the yield and the like. For example, even if a part of the inspection wafer is damaged, it can be easily replaced to reduce the manufacturing cost.

Further, in the burn-in inspection, electrical measurement is performed at a high temperature of about 150 ° C. for a long time. Also does not occur. The test wafer 21 is fixed to a wafer fixing stage 22 by a vacuum chuck. Further, the inspection wafer 11 is fixed to the pressing mechanism support substrate 24. The wafer fixing stage 22 can move in the XYZθ directions, whereby the test wafer 21 and the test wafer 11 can be positioned with high accuracy. After the alignment, the whole is fixed with the burn-in inspection pack 121. The material of the burn-in inspection pack 121 preferably has a small thermal deformation at 150 ° C. or higher and a small difference in thermal expansion coefficient from silicon such as aluminum nitride and invar.

However, the burn-in inspection pack 121 has terminals 122 for taking out wirings 26 for electrical measurement between the electrode pads 23 formed on the test wafer 21 and the probes 13 formed on the test wafer 11. Is formed. In general, in the burn-in inspection, it is necessary to connect probes formed on the inspection wafer to all tens of thousands of electrode pads formed on hundreds of chips formed on the test wafer. The use of the test pack facilitates electrical measurement.

FIG. 12 is a sectional view schematically showing a peripheral device of a burn-in inspection pack according to the present invention. In the burn-in inspection apparatus 131, there is a thermostat 132,
A plurality of burn-in inspection packs 121 are arranged in 32. The temperature control of the thermostat 132 is performed by the temperature control device 1.
33. Burn-in inspection pack 1
Tens of thousands of wirings 134 are connected to 21, and are connected to a tester circuit 136 via a high-speed switching circuit 135. The high-speed switching circuit 135 is connected to the wiring 13
4 for switching, and the number of input wirings of the tester circuit 136 can be reduced.

Since the high-speed switching circuit 135 is made of silicon, the burn-in test pack 121
A high-speed switching circuit may be formed on the inspection wafer 11 in the above-described configuration, so that the wiring from the burn-in inspection pack 121 may be significantly reduced.

The technology of the burn-in inspection pack can be applied to a probing inspection device. Therefore, the inspection can be performed at the wafer level, and the cost can be reduced by shortening the inspection time. Further, not only the same number as the individual semiconductor chips 111 formed on the test wafer 21 formed on the test wafer 11 but also more may be formed. As a result, even if the probe 13 formed on the test wafer 11 becomes unusable due to its life or the like, the test wafer batch inspection can be performed again simply by changing the positions of the test wafer 11 and the test wafer 21.

When the present invention as described above is applied to a probing inspection device and a burn-in inspection device, the contact resistance of the wiring 16 of the inspection wafer is 0.5Ω or less, and the test frequency is 200
A result of not less than MHz was obtained. The life of the probe 13 at that time was 300,000 times or more. Further, since the present invention can reliably perform inspection of an electrode pad of a wafer to be inspected, it can be used for an electrode for an LSI and a connector for drawing out or connecting a fine pattern. Further, in the present invention, since silicon is used for the probe forming substrate, it is possible to incorporate or form a resistor or a circuit at the time of processing the probe forming substrate.

[0071]

According to the present invention, a large area batch inspection of an electrode pad of a subject can be performed in an electrical characteristic inspection step which is a step of a semiconductor device manufacturing step.

[Brief description of the drawings]

FIG. 1 is a sectional view of an inspection wafer according to an embodiment of the present invention.

FIG. 2 is a sectional view of a test object structure according to an embodiment of the present invention.

FIG. 3 is a cross-sectional view of a test object structure according to another embodiment of the present invention.

FIG. 4 is a sectional view of an inspection wafer processing step according to one embodiment of the present invention.

FIG. 5 is a side view and a plan view of a probe according to an embodiment of the present invention.

FIG. 6 is a plan view showing an arrangement of electrode pads of a semiconductor chip.

FIG. 7 is a plan view showing a beam and a diaphragm according to an embodiment of the present invention.

FIG. 8 is a cross-sectional view and a plan view according to an embodiment of the present invention.

9A and 9B are a plan view and a cross-sectional view according to one embodiment of the present invention.

FIG. 10 is a perspective view related to one embodiment of the present invention.

FIG. 11 is a cross-sectional view related to one embodiment of the present invention.

FIG. 12 is a cross-sectional view related to one embodiment of the present invention.

FIG. 13 is a cross-sectional view related to the prior art.

FIG. 14 is a cross-sectional view related to another related art.

[Sign clear]

11: inspection wafer, 12: doubly supported beam or diaphragm, 13: probe, 14: through hole, 15: insulating film, 1
Reference numeral 6: wiring, 17: secondary electrode pad, 21: wafer to be tested, 22: wafer fixed stage, 23: primary electrode pad, 24: pressing mechanism support substrate, 25: pogo pin, 26 ...
Internal wiring, 31 solder ball, 41, 42 elastomer, 61 flat portion, 71 semiconductor chip, 72 electrode pad, 73 semiconductor chip, 74 electrode pad, 81
Slit, 91, 92 roundness, 101 silicon wafer, 102 through hole, 103 (111) plane, 105
Through hole, 111: semiconductor element, 121: burn-in inspection pack, 122: terminal, 131: burn-in inspection device, 132: constant temperature bath, 133: temperature control device, 134 ...
Wiring, 135: High-speed switching circuit, 136: Tester circuit, X: Horizontal dimension of silicon wafer, Y: Vertical dimension of silicon wafer, Z: Height dimension of silicon wafer, P1, P
2, P3: pitch between through holes, d, D1, D2, D3: opening width of through hole, L: interval between through holes.

 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Ryuji Kono 502, Kandate-cho, Tsuchiura-shi, Ibaraki Pref.Mechanical Research Laboratory, Inc. Within the Machinery Research Laboratory (72) Inventor Akihiko Ariga 5-2-1, Kamimizuhonmachi, Kodaira-shi, Tokyo Inside Semiconductor Division, Hitachi, Ltd. (72) Inventor Naoto Ban 5-2-1, Kamimizuhonmachi, Kodaira-shi, Tokyo No. Inside the Semiconductor Division, Hitachi, Ltd. (72) Hideyuki Aoki Inventor 5--20-1, Kamisumihonmachi, Kodaira-shi, Tokyo F-term, Inside the Semiconductor Division, Hitachi, Ltd. 2G011 AA16 AA21 AB06 AB08 AC14 AE03 4M106 AA01 AA02 BA01 BA14 CA56 DD01 DD03 DD04 DD09 DD10 DD11

Claims (5)

[Claims] A plurality of probes formed on one surface of the silicon substrate; a plurality of electrodes formed on the other surface of the silicon substrate; and a plurality of probes and the plurality of electrodes. Forming a coating on the surface of a silicon substrate, forming a plurality of pyramidal or conical probes by etching after patterning by photolithography, and forming the coating on a surface of a silicon substrate. After the removal, a film is formed again on the surface of the silicon substrate, a step of forming a beam or a diaphragm for each probe by etching after patterning by photolithography, and after removing the film, a film is formed again on the surface of the silicon substrate, After patterning by photolithography, through holes corresponding to the probe by etching Forming a film, removing the film, forming an insulating film on the surface of the silicon substrate again, forming a metal film on the surface of the insulating film, patterning by photolithography, and forming a wiring by etching. A method for manufacturing a semiconductor inspection device, which is characterized in that: 2. The method according to claim 1, wherein the probe has a flat portion at a tip thereof. 3. The method according to claim 1, wherein the beam structure is a doubly supported beam. 4. A probe formed on one main surface of a silicon substrate, an electrode formed on a surface opposite to the one main surface of the silicon substrate, and means for electrically connecting the probe to the electrode. Using an inspection wafer having a, pressing the probe to a predetermined position of the inspection target wafer by a pressing substrate,
A semiconductor inspection apparatus for performing an electrical continuity inspection of a wafer to be inspected, wherein connection and pressing of the pressing substrate with the inspection wafer are performed using pogo pins of the same number or more as the number of electrodes of the wafer to be tested. Inspection equipment. 5. The semiconductor inspection apparatus according to claim 4, wherein the connection and pressing of the pressing substrate with the inspection wafer are performed using the same number or more solder balls as the number of electrodes of the wafer to be tested.