JP2000148138A - Effect device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enable easy audition of an effect added at the time of inputting various input signals. SOLUTION: This effect device has an effect addition means 16a for adding an effect to an input signal and outputting it, a test signal generation means 16b for generating a test signal inputted into the effect addition means 16a, an effect information memory means for memorizing plural kinds of the effect information for determining the added effect, a test signal information memory means for memorizing plural pairs of the test signal information composed by having the waveform information for determining a waveform shape of the test signal generated from the test signal generation means 16b corresponding to plural kinds of the effect information and the pronunciation mode information for determining the pronunciation mode at the time of pronouncing based on the test signal, an effect selection means for selecting a desired effect added by the effect addition means 16a by selecting plural kinds of the effect information, and a control means for controlling the test signal generation means 16b so that the test signal is generated by following the waveform information and the pronunciation aspect information of the test signal information corresponding to the effect information selected by the effect selection means.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

TECHNICAL FIELD The present invention relates to an effect device,
More specifically, the present invention relates to an effect device that adds an effect to an input signal.

[0002]

2. Description of the Related Art Conventionally, in the field of electronic musical instruments,
As an effect device for adding an effect to an input signal, that is, an input musical tone signal, for example, an effect device capable of adding various effects such as a delay effect, a reverb (reverberation) effect, and a chorus effect has been developed. .

[0003] The applicant of the present invention has disclosed in
No. 0257 “Effect device” is a test that generates a test signal for listening to the added effect in an effect device that adds various effects such as a delay effect, a reverb effect, or a chorus effect to the input signal as described above. An effect device having a signal generating means is proposed.

On the other hand, in an effect device, a plurality of algorithm information and various parameters indicating the setting state of an effect adding means for selectively adding a plurality of effects are preset and stored as preset information. By selecting these preset information by operating means, etc.,
In some cases, effects to be added by the effect device can be easily selected and set as appropriate.

[0005] However, preset information for adding various effects to selection by the effect adding means as described above includes:
The input signal to which the effect is added is set assuming to some extent.

Therefore, even if an input signal that is not assumed at all when setting the preset information is input to the effect device for adding the effect selected based on the preset information, the player expects the input signal. As much effect is not added.

For this reason, in the technical field of effect devices, there has been a strong demand for an effect device capable of easily listening to effects added when various input signals are input.

[0008]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional needs, and a purpose thereof is to be added when various input signals are input. It is an object of the present invention to provide an effect device that allows the user to easily listen to the effect.

[0009]

In order to achieve the above object, the present invention provides, as test signal information for generating a test signal used for listening to an effect, waveform information for determining a waveform shape of the test signal. And sound generation mode information for determining a sound generation mode (sound generation pattern) at the time of sound generation based on the test signal, and various waveform information and sound generation mode information are combined when generating a test signal. This makes it possible to set the generation state of the test signal.

That is, according to the first aspect of the present invention, an effect adding means for adding an effect to an input signal inputted from the outside and outputting the same, and a test signal to be inputted to the effect adding means are generated. Test signal generation means, effect information storage means storing a plurality of types of effect information that determines the effect added in the effect addition means, corresponding to the plurality of types of effect information stored in the effect information storage means, A plurality of pieces of test signal information including waveform information for determining a waveform shape of a test signal generated by the test signal generation means and sound generation mode information for determining a sound generation mode for generating a sound based on the test signal. A desired effect added by the effect adding means by selecting the test signal information storing means to be stored as a set and a plurality of kinds of effect information stored in the effect information storing means. Effect selecting means for selecting, and control means for controlling the test signal generating means to generate a test signal in accordance with waveform information and sound generation mode information of test signal information corresponding to the effect information selected by the effect selecting means; Is provided.

Therefore, according to the first aspect of the present invention, when the test signal is generated, the test signal is generated in accordance with the waveform information and the sound generation mode information of the test signal information corresponding to the selected effect information. Will be done.

According to a second aspect of the present invention, in the first aspect of the present invention, the test signal generating means stores a plurality of sampling waveform data. Means for generating a test signal based on the sampling waveform data stored in the sampling waveform data storage means, wherein the waveform information constituting the test signal information stored in the test signal information storage means is , The information for selecting the sampling waveform data stored in the sampling waveform data storage means.

According to a third aspect of the present invention, in accordance with the first aspect of the present invention, sound generation mode information constituting the test signal information stored in the test signal information storage means is provided. Is information indicating a generation pattern of a test signal generated by the test signal generation means.

According to a fourth aspect of the present invention, in accordance with the second aspect of the present invention, the tone generation mode information constituting the test signal information stored in the test signal information storage means is provided. Is information indicating a generation pattern of a test signal generated by the test signal generation means, and the test signal generation means is selected by waveform information constituting test signal information stored in the test signal information storage means. Based on the sampled waveform data, a test signal is generated in accordance with a generation pattern specified by sound generation mode information constituting the test signal information stored in the test signal information storage means.

According to a fifth aspect of the present invention, the test signal stored in the test signal information storage means in the third aspect of the present invention is provided. The pronunciation mode information constituting the information is configured to include information indicating different generation patterns between a mode in which the test signal is generated once and a mode in which the test signal is generated a plurality of times continuously in the test signal generation means. .

The invention according to claim 6 of the present invention is the invention according to claim 5 of the present invention, further comprising a sound signal constituting test signal information stored in the test signal information storage means. Regarding the aspect information, information indicating an occurrence pattern of an aspect in which the test signal generating means generates a test signal once and information indicating an occurrence pattern of an aspect in which the test signal generating means continuously generates a test signal a plurality of times. And selecting means for selecting the above.

According to a seventh aspect of the present invention, the test signal information storage means according to any one of the third, fourth, fifth and sixth aspects of the present invention is provided. The waveform information constituting the test signal information obtained is information for selecting a desired plurality of sampling waveform data from the plurality of sampling waveform data stored in the sampling waveform data storage means, and the test signal information storage means The tone generation mode information that constitutes the test signal information stored in the memory device 1 indicates a generation pattern for selectively sequentially generating a test signal based on a plurality of sampling waveform data selected by the waveform information.

The invention according to claim 8 of the present invention is the invention according to any one of claims 3, 4, 5 and 6 of the present invention, wherein the test signal information storage means stores the test signal information in the test signal information storage means. The waveform information constituting the test signal information obtained is information for selecting a desired plurality of sampling waveform data from the plurality of sampling waveform data stored in the sampling waveform data storage means, and the test signal information storage means The tone generation mode information included in the test signal information stored in the memory device 1 indicates a generation pattern for sequentially generating a test signal based on a plurality of sampling waveform data selected by the waveform information in a predetermined order.

According to a ninth aspect of the present invention, there is provided an effect adding means for adding an effect to an externally input signal and outputting the same, and storing a plurality of sampled waveform data, A test signal generating means for generating a test signal to be input to the effect adding means based on desired sampling waveform data in the sampling waveform data; and a desired sampling for determining a test signal generated by the test signal generating means. Test signal information generating means for generating test signal information comprising: waveform information for selecting waveform data; and sound generation mode information for determining a generation pattern of a test signal generated by the test signal generating means. The test signal generating means includes a plurality of test signal generators in accordance with waveform information of test signal information generated by the test signal information generating means. A desired sampling waveform data is selected from the pulling waveform data, and a test is performed based on the selected sampling waveform data in accordance with a generation pattern corresponding to the sound generation mode information of the test signal information generated by the test signal information generating means. A signal is generated.

Therefore, according to the ninth aspect of the present invention, when the test signal is generated based on the sampling waveform data, the test signal is generated according to the generation pattern corresponding to the sound generation mode information. .

According to a tenth aspect of the present invention, in the ninth aspect of the present invention, the waveform information of the test signal information generated by the test signal information generating means is a desired one. The test signal generating means selects test signal information generated by the test signal information generating means based on a desired plurality of sampling waveform data selected by the waveform information. The test signals are sequentially generated in accordance with the generation pattern corresponding to the sound generation mode information.

[0022]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of an effect device according to the present invention will be described in detail with reference to the accompanying drawings.

In the following description, an effect adding unit 16a, a test signal generating unit 16b, and an adding unit 16c, which will be described later, include a digital signal processor (DS).
P) is realized by software.

FIG. 1 is a block diagram showing a hardware configuration of an embodiment of an effect device according to the present invention. This effect device is a central processing unit for controlling the entire operation. (CPU) 10, a read-only memory (ROM) 12 storing programs and the like that the CPU 10 processes for controlling the overall operation, and preset information (for details of the preset information, see FIG. A preset memory 13 (which will be described later with reference to the drawings) (the preset memory 13 is constituted by a ROM, for example) and an area for storing various registers and flags are provided. Random access memory (RAM) 14 which is used as a working area for processing by the CPU 10
And D realizing the effect adding means 16a, the test signal generating means 16b, and the adding means 16c by software.
SP 16 and a waveform memory 18 storing a plurality of sampling waveform data (Waveform memory 18 is, for example, R
It is composed of AM. ), An operator group 20 composed of a plurality of operators for performing various settings and the like regarding the effect device, and a display device 22 for displaying the state of the operator group 20 set by operating the various operators. And

Here, the effect adding means 16a can add various effects such as a delay effect, a reverb effect or a chorus effect to the input signal.

Further, the effect adding means 16a can add not only a single effect but also an effect obtained by combining a plurality of effects.

In the effect adding means 16a, as will be described later, algorithm information and various parameters of a process for adding an effect according to the effect information set by the CPU 10 are set.
Since such a point is a known technique, a detailed description thereof will be omitted.

The test signal generating means 16b reads out the sampling waveform data stored in the waveform memory 18 and outputs a test signal.

It is assumed that the waveform memory 18 stores a plurality of sampling waveform data of various instrument sounds such as a piano and a guitar. The waveform memory 18 is operated by a sampling operator 206 described later.
A signal input to the input terminal can be sampled and stored.

FIG. 2 is a schematic structural explanatory view of an operation panel provided with a group of operators 20 and a display device 22.
It should be noted that among the operators constituting the operator group 20, those not related to the embodiment of the present invention (for example, the effect adding unit 16)
a parameter setting operator for setting the parameter a; ) Will not be shown and described.

Here, as the operators constituting the operator group 20 related to the embodiment of the present invention, effect selection operators 202-0 to 202 for selecting numbers 0 to 7, respectively.
-7 (the number 0 can be selected by operating the effect operator 202-0, the number 1 can be selected by operating the effect operator 202-1, and the number 2 can be selected by operating the effect operator 202-2. Can be selected, and the effect operator 20
The number 3 can be selected by the operation 2-3, the number 4 can be selected by the operation of the effect operator 202-4, and the number 5 can be selected by the operation of the effect operator 202-5. The number 6 can be selected by operating the effect operator 202-6, and the number 7 can be selected by operating the effect operator 202-7. ) And a preview button 204 for instructing generation of a test signal.
And a sampling operator 206 for sampling the signal input to the input terminal and storing it in the waveform memory 18 as sampling waveform data (the input signal is sampled by operating an operator such as the sampling operator 206). And R as sampling waveform data
The technique of storing the information in a memory such as an AM is a well-known technique, and a detailed description thereof will be omitted. ), And a reproduction cycle setting operator 208 for setting a reproduction cycle when a test signal is reproduced three times in succession with a sound generation pattern to be described later set to three consecutive reproductions.
It comprises a shortening operator 208-1 for shortening the reproduction cycle and an extension operator 208-2 for extending the reproduction cycle. ) And a waveform switching mode operator 2 for setting a switching mode of sampling waveform data reproduced as a test signal.
10 (a waveform switching mode control 210 is a normal control 2 for selecting a normal mode as a switching mode)
10-1, a memory order operator 210-2 for selecting a memory order mode as a switching mode, and a random operator 2 for selecting a random mode as a switching mode
10-3. The details of each operation in the normal mode, the memory order mode, and the random mode will be described later with reference to a flowchart, but in this embodiment, the initial setting is the normal mode. Shall be. ) Is set.

Next, the preset memory 13 shown in FIG.
The preset information stored in the preset memory 13 will be described with reference to an explanatory diagram schematically showing the preset information stored in the preset memory 13.

As shown in FIG. 3, the preset memory 1
3 includes areas 0 to 3 for storing preset information.
Eight areas of area 7 are set, and area 0 to area 7
The preset information is stored in each area.

The preset information stored in these areas 0 to 7 is composed of two types of information, effect information and test signal information.

First, the effect information will be described. The effect information includes algorithm information of the effect adding means 16a and various parameters.

The test signal information includes sampling waveform data set in a waveform information memory (the details of the waveform information memory will be described later with reference to FIG. 5) which is an internal memory of the test signal generating means 16b. The sound information that specifies the waveform information to be specified and the sound generation pattern to be set in the sound generation mode information memory (the details of the sound generation mode information memory will be described later with reference to FIG. 5) which is the internal memory of the test signal generation unit 16b It consists of aspect information.

In this embodiment, the sampled waveform data specified by the waveform information and set in the waveform information memory is based on the test signal generating means in accordance with the sounding pattern specified by the sounding mode information and set in the sounding mode information memory. 16b, and the test signal is generated.

In this embodiment, the tone generation pattern specified in the tone generation mode information and set in the tone generation mode information memory includes one-shot playback in which the test signal is emitted only once, and playback cycle setting. Three continuous playbacks of the test signal three times in succession are set according to the playback cycle set by the operation element 208.

Next, the test signal generating means 16b shown in FIG.
The test signal generating means 16b will be described in detail with reference to a block configuration diagram showing a detailed configuration in a hardware configuration.

That is, the test signal generating means 16b is composed of a sound source means 302 constituted by a musical sound generating means generally called a sampler or a PCM sound source, and a sound source control means 304 for controlling the sound source means 302. ing.

Here, the sound source control means 304 receives the input signal input from the input terminal and the preset information (the effect information) selected by operating the effect selection operators 202-0 to 202-7 input from the CPU 10. Selection control 20
The process of selecting the preset information by the operation of 2-0 to 202-7 will be described later with reference to a flowchart. ), A sound source control signal for controlling the sound source means 302 is generated based on the test signal information (waveform information and sound generation mode information), and this sound source control signal is output to the sound source means 302. The sound source control signal generated by the sound source control means 304 is also output to the waveform memory 18.

The sound source means 302 is provided by the sound source control means 3.
The sound source control signal output from the controller 04 is input, and the sampled waveform data is read out from the waveform memory 18 based on the input sound source control signal and output.

Next, the test signal generating means 16b shown in FIG.
The internal memory (not shown) will be described with reference to an explanatory diagram showing a data structure of an internal memory (not shown) provided therein.

First, three areas of a waveform information memory, a switching order table, and a tone generation information memory are set in an internal memory provided inside the test signal generating means 16b.

Here, 0, 1, 2 are stored in the waveform information memory.
.., N,..., Are stored with sampling waveform data (in FIG. 5, each sampling waveform data is represented as a waveform A, a waveform B, a waveform C,...). is there.

The switching order table contains 0, 1, 2,.
The switching order of the sampling waveform data stored in the waveform information memory is set for each area.

Further, the sound generation pattern information memory stores a sound generation pattern specified by the sound generation mode information. When the sound generation pattern specified by the sound generation mode information is one-shot reproduction, 0 is set. When the stored sound generation pattern specified by the sound generation mode information is three consecutive reproductions, 1 is stored.

In the above configuration, the operation of the effect device according to the present invention will be described with reference to the attached flowchart.

First, the processing in the CPU will be described with reference to the flowchart shown in FIG.

First, when the power of the effect device is turned on and this flowchart is started, an initialization process is performed (step S602). In this initialization process, the registers and flags of the RAM 14 are cleared.

When the initial setting process is completed, the process waits until one of the controls constituting the control group 20 is operated (step S604).

The effect selecting operators 202-0 to 20-20
If 2-7 has been operated (step S606), the number m of the operated effect selection operator 202-0 to 202-7 is detected (step S608). That is, when the effect selection operator 202-0 is operated, the number 0 is detected,
Number 1 when the effect selection operator 202-1 is operated
When the effect selection operator 202-7 is operated, the number 7 is detected.

Next, effect information and test signal information are read from the area m of the preset memory 13 (step S).
610), an instruction to set the read effect information to the effect adding unit 16a is issued (step S612), and an instruction to set the read test signal information, that is, the waveform information and the sound generation mode information, to the test signal generating unit 16b is issued (step S612). Step S614), the process returns to step S604, and waits until one of the operators constituting the operator group 20 is operated.

When the preview button 204 has been operated (step S606), an instruction is issued to the test signal generating means 16b (step S616), and the process returns to step S604 to form one of the operators 20. Wait until the operator is operated.

If another operator is operated (step S606), a process corresponding to the operated operator is performed (step S618), and step S604 is performed.
The process returns to step S1 and waits until one of the operators constituting the operator group 20 is operated.

Here, as the processing in step S618, for example, there is a processing when the waveform switching mode operator 210 is operated. That is, the waveform switching mode control 21
0 (a normal operator 210)
-1, when the memory order operator 210-2 and the random operator 210-3) are operated, the waveform switching mode corresponding to the operator is set in a register (not shown) of the tone generator control means 304. It becomes something.

The processing in step S618 includes, for example, processing when an operator (not shown) for setting the switching order table is operated. That is, the switching order table is set by the operation of the operator.

Further, as the processing in step S618, for example, there is a sampling processing by operating the sampling operator 206.

Next, the processing of the sound source control means 304 in the test signal generation means 16b will be described with reference to the flowchart shown in FIG.

In this flowchart, the CPU 1
Wait until there is an instruction from 0 (step S70)
2).

When a sampling instruction is given from the CPU 10 (step S704), the input signal is stored in the waveform memory 18, and the processing of this flowchart is ended.

When the CPU 10 issues a sounding instruction (step S704), the CPU 10 executes a sounding instruction process (step S708), and ends the processing of this flowchart. Note that the sound generation instruction processing in step S708 will be described later with reference to the flowchart shown in FIG.

Further, when an information setting instruction is issued from the CPU 10 (step S704), the effect information received from the CPU 10 is set in the effect adding means 16a, and the waveform information and the sound generation mode information are stored in the test signal generating means 16b. It is stored in the memory (step S718), and the processing of this flowchart ends.

Further, when another instruction is given from the CPU 10 (step S704), processing is performed according to the contents of the instruction (step S720), and the processing of this flowchart ends.

Next, the details of the sound generation instruction processing in step S708 will be described with reference to the flowchart shown in FIG.

First, in this flowchart, an initialization process is performed (step S802). In the initial setting process, the counter A and the counter C used in this flowchart are reset, and the process of setting the reproduction cycle set by the reproduction cycle setting operator 208 as the cycle information T is performed.

Next, the number n of the sampled waveform data is detected by searching the waveform information memory of the internal memory of the test signal generating means 16b (step S804).

Then, it is determined whether the waveform switching mode is normal, memory order, or random (step S806).

If it is determined that the waveform switching mode is normal, the value of the counter A is set to the value of the register B, and the flow advances to step S814.

If it is determined that the waveform switching mode is in memory order, data is read from the address A of the switching order table and set in the register B.
Proceed to 814.

Further, when it is determined that the waveform switching mode is random, the value of RND (n-1), which is a function that randomly generates an integer from 0 to n, is set in the register B, and Proceed to S814.

In step S814, it is determined whether the tone generation pattern is one-shot reproduction or three consecutive reproduction.

If it is determined that the sounding pattern is one-shot reproduction, the sound volume information V that determines the sound volume of the test signal to be sounded is set to "medium" (step S).
816), the sound source means 302 is instructed to emit the waveform at the address B of the waveform information memory with the volume information V (step S818), and waits for the period information T (step S820), and proceeds to step S840.

If it is determined that the tone generation pattern is for three consecutive reproductions, the volume information V is set to "low" and the value of the counter C is set to "0" (step S8).
22) Instruct the sound source means 302 to emit the waveform of the address B of the waveform information memory with the volume information V (step S824), and wait for the period information T (step S824).
826), the counter C is incremented by 1 (step S828), and it is determined whether or not the value of the counter C is equal to “3” (step S830).

If it is not determined in step S830 that the value of the counter C is equal to "3", the value of the counter C is determined (step S832). If it is determined to be 1, the volume information V is set to "medium" (step S8).
34), the process returns to step S824. If the value of the counter C is determined to be 2, the volume information V is set to "high" (step S836), and the process returns to step S824. is there.

On the other hand, if it is determined in step S830 that the value of counter C is equal to "3", the flow advances to step S840.

Here, in step S840, the value of the counter A is incremented by 1, and then the number n of sampling waveform data is set in the counter A (step S842), and thereafter, the process returns to step S806.

As is clear from the above-described embodiment, the combination of the waveform information and the sound generation mode information allows
When the waveform information specifies a plurality of sampled waveform data, the plurality of sampled waveform data specified by the waveform information is specified by the sound generation mode information in accordance with the sounding instruction of the test signal by operating the preview button 204. It is also possible to sequentially and selectively generate sounds according to the generated sound patterns.

In this embodiment, the preset information is fixedly set in the preset memory 13 in advance. However, the present invention is not limited to this, and the algorithm information of the effect adding means 16a is set. , An operator for setting various parameters, an operator for setting waveform information, an operator for setting sounding mode information, etc., so that algorithm information, various parameters, and waveform information of the effect adding means 16a are provided. The user may arbitrarily set pronunciation mode information and the like, store the set information as preset information in a memory such as a RAM, and use the stored preset information.

In the above-described embodiment, the sampling waveform data stored in the waveform memory 18 is specified by the waveform information. However, the present invention is not limited to this. Non-data waveform data may be stored, and such non-sampled waveform data may be designated by waveform information.

[0081]

Since the present invention is configured as described above, it has an excellent effect that the effect added when various input signals are input can be easily heard.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a hardware configuration of an example of an embodiment of an effect device according to the present invention.

FIG. 2 is a diagram illustrating a schematic configuration of an operation panel.

FIG. 3 is an explanatory diagram schematically showing preset information stored in a ROM.

FIG. 4 is a block diagram showing a detailed configuration of a test signal generation unit in a hardware configuration.

FIG. 5 is an explanatory diagram schematically showing a data configuration of an internal memory provided inside the test signal generating means.

FIG. 6 is a flowchart showing a processing routine in a CPU.

FIG. 7 is a flowchart showing a processing routine in a sound source control unit of the test signal generation unit.

8 is a flowchart showing a subroutine of a sounding instruction process in a processing routine in a sound source control unit of the test signal generation unit shown in FIG.

[Explanation of symbols]

 Reference Signs List 10 central processing unit (CPU) 12 read-only memory (ROM) 13 preset memory 14 random access memory (RAM) 16 digital signal processor (DSP) 16a effect adding means 16b test signal generating means 16c adding means 18 Waveform memory 20 Operator group 22 Display device

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (Reference) G10H 7/00 G10H 7/00 511Z 7/02 521F

Claims (10)

[Claims] 1. An effect adding means for adding an effect to an input signal input from the outside and outputting the same, a test signal generating means for generating a test signal to be input to the effect adding means, Information storing means for storing a plurality of types of effect information for determining the effect to be determined, and a waveform of a test signal generated by the test signal generating means in correspondence with the plurality of types of effect information stored in the effect information storing means. Test signal information storage means for storing a plurality of sets of test signal information including waveform information for determining a shape and sound generation mode information for determining a sound generation mode for generating sound based on the test signal; and the effect information An effect selecting unit that selects a desired effect to be added by the effect adding unit by selecting a plurality of types of effect information stored in a storage unit; Effect device and a control means for controlling said test signal generating means to generate a test signal in accordance with the waveform information of the test signal information corresponding to the effect information selected by the stage and the sound mode information. 2. The effect device according to claim 1, wherein the test signal generating means has a sampling waveform data storage means storing a plurality of sampling waveform data,
A test signal is generated based on the sampling waveform data stored in the sampling waveform data storage means, and the waveform information constituting the test signal information stored in the test signal information storage means is the sampling waveform data. An effect device that is information for selecting sampling waveform data stored in a storage unit. 3. The effect device according to claim 1, wherein the sound generation mode information included in the test signal information stored in the test signal information storage unit is a generation pattern of a test signal generated in the test signal generation unit. Effect device, which is information that indicates 4. The effect device according to claim 2, wherein the sound generation mode information constituting the test signal information stored in the test signal information storage means is a test signal generation pattern generated by the test signal generation means. The test signal generating means stores the test signal information in the test signal information storage means based on sampling waveform data selected by the waveform information constituting the test signal information stored in the test signal information storage means. An effect device for generating a test signal in accordance with a generation pattern specified by pronunciation mode information constituting the generated test signal information. 5. The effect device according to claim 3, wherein the sound generation mode information included in the test signal information stored in the test signal information storage unit is tested by the test signal generation unit. An effect device comprising information indicating a different generation pattern between a mode in which a signal is generated once and a mode in which a signal is generated a plurality of times continuously. 6. The effect apparatus according to claim 5, further comprising: generating a test signal once in said test signal generating means with respect to sound generation mode information constituting test signal information stored in said test signal information storage means. An effect apparatus comprising: information for designating a generation pattern in a mode in which the test signal is generated and information for designating a generation pattern in a mode in which the test signal is continuously generated a plurality of times by the test signal generation means. 7. One of claims 3, 4, 5, and 6
In the effect device according to the item, the waveform information constituting the test signal information stored in the test signal information storage means is a plurality of desired waveform information among a plurality of sampling waveform data stored in the sampling waveform data storage means. The information for selecting the sampling waveform data, and the sound generation mode information constituting the test signal information stored in the test signal information storage means selectively outputs a test signal based on a plurality of sampling waveform data selected by the waveform information. An effect device for indicating a generation pattern that occurs sequentially. 8. One of claims 3, 4, 5, and 6
In the effect device according to the item, the waveform information constituting the test signal information stored in the test signal information storage means is a plurality of waveform data desired from a plurality of sampling waveform data stored in the sampling waveform data storage means. The information for selecting the sampling waveform data, the sound generation mode information constituting the test signal information stored in the test signal information storage means includes a test signal based on a plurality of sampling waveform data selected by the waveform information in a predetermined order. An effect device for indicating an occurrence pattern that is sequentially generated in. 9. An effect adding means for adding an effect to an input signal input from the outside and outputting the added signal, storing a plurality of sampling waveform data, and based on a desired sampling waveform data in the plurality of sampling waveform data. Test signal generating means for generating a test signal to be input to the effect adding means; waveform information for selecting desired sampling waveform data for determining a test signal generated by the test signal generating means; Means for generating test signal information, the test signal information generating means comprising: sound generation mode information for determining a generation pattern of a test signal generated by the means. According to the waveform information of the test signal information generated by the signal information generating means, a desired sample is selected from the plurality of sampled waveform data. An effect of selecting ring waveform data and generating a test signal in accordance with a generation pattern corresponding to tone generation mode information of test signal information generated by the test signal information generating means based on the selected sampling waveform data. apparatus. 10. The effect device according to claim 9, wherein the waveform information of the test signal information generated by the test signal information generating means is information for selecting a desired plurality of sampling waveform data. The generating means sequentially generates test signals in accordance with a generation pattern corresponding to the tone generation information of the test signal information generated by the test signal information generating means, based on a plurality of desired sampling waveform data selected by the waveform information. Effect device.