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ITTO20030318A1 - Dispositivo sensore di gas a film sottile semiconduttore. - Google Patents

Dispositivo sensore di gas a film sottile semiconduttore.

Info

Publication number
ITTO20030318A1
ITTO20030318A1 IT000318A ITTO20030318A ITTO20030318A1 IT TO20030318 A1 ITTO20030318 A1 IT TO20030318A1 IT 000318 A IT000318 A IT 000318A IT TO20030318 A ITTO20030318 A IT TO20030318A IT TO20030318 A1 ITTO20030318 A1 IT TO20030318A1
Authority
IT
Italy
Prior art keywords
gas sensor
sensor device
thin film
semiconductive thin
film gas
Prior art date
Application number
IT000318A
Other languages
English (en)
Inventor
Camilla Baratto
Elisabetta Comini
Guido Faglia
Matteo Falasconi
Giorgio Sberveglieri
Original Assignee
Sacmi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sacmi filed Critical Sacmi
Priority to IT000318A priority Critical patent/ITTO20030318A1/it
Priority to EP04728860A priority patent/EP1616172B1/en
Priority to ES04728860T priority patent/ES2312993T3/es
Priority to AT04728860T priority patent/ATE409860T1/de
Priority to JP2006506505A priority patent/JP2006524326A/ja
Priority to PCT/IB2004/001221 priority patent/WO2004095013A1/en
Priority to DE602004016837T priority patent/DE602004016837D1/de
Priority to KR1020057018516A priority patent/KR20060021822A/ko
Priority to US10/830,133 priority patent/US7441440B2/en
Publication of ITTO20030318A1 publication Critical patent/ITTO20030318A1/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/14Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/12Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
IT000318A 2003-04-24 2003-04-24 Dispositivo sensore di gas a film sottile semiconduttore. ITTO20030318A1 (it)

Priority Applications (9)

Application Number Priority Date Filing Date Title
IT000318A ITTO20030318A1 (it) 2003-04-24 2003-04-24 Dispositivo sensore di gas a film sottile semiconduttore.
EP04728860A EP1616172B1 (en) 2003-04-24 2004-04-22 A thin semiconductor film gas sensor device
ES04728860T ES2312993T3 (es) 2003-04-24 2004-04-22 Dispositivo sensor de gas de pelicula semiconductora fina.
AT04728860T ATE409860T1 (de) 2003-04-24 2004-04-22 Gassensor mit einer dünnen halbleitenden schicht
JP2006506505A JP2006524326A (ja) 2003-04-24 2004-04-22 半導体薄膜ガスセンサー装置
PCT/IB2004/001221 WO2004095013A1 (en) 2003-04-24 2004-04-22 A thin semiconductor film gas sensor device
DE602004016837T DE602004016837D1 (de) 2003-04-24 2004-04-22 Gassensor mit einer dünnen halbleitenden schicht
KR1020057018516A KR20060021822A (ko) 2003-04-24 2004-04-22 반도체 박막 가스 센서 장치
US10/830,133 US7441440B2 (en) 2003-04-24 2004-04-23 Thin semiconductor film gas sensor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT000318A ITTO20030318A1 (it) 2003-04-24 2003-04-24 Dispositivo sensore di gas a film sottile semiconduttore.

Publications (1)

Publication Number Publication Date
ITTO20030318A1 true ITTO20030318A1 (it) 2004-10-25

Family

ID=33187398

Family Applications (1)

Application Number Title Priority Date Filing Date
IT000318A ITTO20030318A1 (it) 2003-04-24 2003-04-24 Dispositivo sensore di gas a film sottile semiconduttore.

Country Status (9)

Country Link
US (1) US7441440B2 (it)
EP (1) EP1616172B1 (it)
JP (1) JP2006524326A (it)
KR (1) KR20060021822A (it)
AT (1) ATE409860T1 (it)
DE (1) DE602004016837D1 (it)
ES (1) ES2312993T3 (it)
IT (1) ITTO20030318A1 (it)
WO (1) WO2004095013A1 (it)

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US7253002B2 (en) * 2003-11-03 2007-08-07 Advanced Technology Materials, Inc. Fluid storage and dispensing vessels having colorimetrically verifiable leak-tightness, and method of making same
KR100810122B1 (ko) * 2007-03-07 2008-03-06 한국에너지기술연구원 팔라듐과 백금이 분산된 타이타늄산화물 나노튜브를 적용한접촉연소식 가스 센서
US8187903B2 (en) * 2009-01-13 2012-05-29 Robert Bosch Gmbh Method of epitaxially growing piezoresistors
US8383048B2 (en) 2010-07-21 2013-02-26 Schlumberger Technology Corporation Microsensor for mercury
US9754860B2 (en) 2010-12-24 2017-09-05 Qualcomm Incorporated Redistribution layer contacting first wafer through second wafer
US8481405B2 (en) 2010-12-24 2013-07-09 Io Semiconductor, Inc. Trap rich layer with through-silicon-vias in semiconductor devices
US9624096B2 (en) 2010-12-24 2017-04-18 Qualcomm Incorporated Forming semiconductor structure with device layers and TRL
EP2656388B1 (en) 2010-12-24 2020-04-15 QUALCOMM Incorporated Trap rich layer for semiconductor devices
US8536021B2 (en) 2010-12-24 2013-09-17 Io Semiconductor, Inc. Trap rich layer formation techniques for semiconductor devices
US9553013B2 (en) 2010-12-24 2017-01-24 Qualcomm Incorporated Semiconductor structure with TRL and handle wafer cavities
US9791403B2 (en) 2012-10-05 2017-10-17 The Regents Of The University Of California Nanoparticle-based gas sensors and methods of using the same
US20140260546A1 (en) * 2013-03-15 2014-09-18 Odosodo, Inc. Combinational Array Gas Sensor
ITBO20130671A1 (it) 2013-12-02 2015-06-03 Sacmi Metodo e dispositivo per l'analisi di un campione di gas
TWI557527B (zh) * 2015-12-28 2016-11-11 財團法人工業技術研究院 具儲熱元件的微機電溫度控制系統
CN106255243A (zh) * 2016-08-17 2016-12-21 电子科技大学 一种调节温度均匀性的蛇形薄膜加热器及其调温方法
EP3315956A1 (en) * 2016-10-31 2018-05-02 Sensirion AG Multi-parametric sensor with bridge structure
USD953183S1 (en) 2019-11-01 2022-05-31 Nvent Services Gmbh Fuel sensor
US11353381B1 (en) * 2020-06-09 2022-06-07 Applied Materials, Inc. Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room

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US3503030A (en) * 1966-11-11 1970-03-24 Fujitsu Ltd Indirectly-heated thermistor
US4169369A (en) * 1978-07-24 1979-10-02 General Motors Corporation Method and thin film semiconductor sensor for detecting NOx
DE3005928A1 (de) * 1980-02-16 1981-09-10 Robert Bosch Gmbh, 7000 Stuttgart Beheizte ionenstromsonde fuer hohe zemperaturen
DE3019387C2 (de) * 1980-05-21 1986-01-23 Siemens AG, 1000 Berlin und 8000 München Dünnschicht-Halbleiter-Gassensor mit einem in den Sensoraufbau integrierten Heizelement
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JPH0320658A (ja) * 1989-03-30 1991-01-29 Ricoh Co Ltd 多ガス識別ガス検出装置
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DE19618935C2 (de) * 1996-05-10 2002-11-28 Siemens Ag Gassensor und Verfahren zur Herstellung eines Gassensors
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Also Published As

Publication number Publication date
WO2004095013A1 (en) 2004-11-04
KR20060021822A (ko) 2006-03-08
US20040211667A1 (en) 2004-10-28
ES2312993T3 (es) 2009-03-01
DE602004016837D1 (de) 2008-11-13
ATE409860T1 (de) 2008-10-15
US7441440B2 (en) 2008-10-28
EP1616172A1 (en) 2006-01-18
JP2006524326A (ja) 2006-10-26
EP1616172B1 (en) 2008-10-01

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