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ITTO20010349A0 - Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo. - Google Patents

Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo.

Info

Publication number
ITTO20010349A0
ITTO20010349A0 IT2001TO000349A ITTO20010349A ITTO20010349A0 IT TO20010349 A0 ITTO20010349 A0 IT TO20010349A0 IT 2001TO000349 A IT2001TO000349 A IT 2001TO000349A IT TO20010349 A ITTO20010349 A IT TO20010349A IT TO20010349 A0 ITTO20010349 A0 IT TO20010349A0
Authority
IT
Italy
Prior art keywords
optical equipment
straight profile
measuring objects
objects
measuring
Prior art date
Application number
IT2001TO000349A
Other languages
English (en)
Inventor
Enrico Maria Pirinoli
Original Assignee
Area Sistemi S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Area Sistemi S R L filed Critical Area Sistemi S R L
Priority to IT2001TO000349A priority Critical patent/ITTO20010349A1/it
Publication of ITTO20010349A0 publication Critical patent/ITTO20010349A0/it
Priority to EP02735228A priority patent/EP1379834A1/en
Priority to US10/474,737 priority patent/US7078719B2/en
Priority to CNB028020499A priority patent/CN1230661C/zh
Priority to AU2002310925A priority patent/AU2002310925A1/en
Priority to PCT/EP2002/003797 priority patent/WO2002084214A1/en
Publication of ITTO20010349A1 publication Critical patent/ITTO20010349A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT2001TO000349A 2001-04-11 2001-04-11 Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo. ITTO20010349A1 (it)

Priority Applications (6)

Application Number Priority Date Filing Date Title
IT2001TO000349A ITTO20010349A1 (it) 2001-04-11 2001-04-11 Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo.
EP02735228A EP1379834A1 (en) 2001-04-11 2002-04-05 Optical apparatus for measuring objects having a rectilinear profile
US10/474,737 US7078719B2 (en) 2001-04-11 2002-04-05 Optical apparatus for measuring objects having a rectilinear profile
CNB028020499A CN1230661C (zh) 2001-04-11 2002-04-05 测量具有直线外形物体的光学仪器
AU2002310925A AU2002310925A1 (en) 2001-04-11 2002-04-05 Optical apparatus for measuring objects having a rectilinear profile
PCT/EP2002/003797 WO2002084214A1 (en) 2001-04-11 2002-04-05 Optical apparatus for measuring objects having a rectilinear profile

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2001TO000349A ITTO20010349A1 (it) 2001-04-11 2001-04-11 Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo.

Publications (2)

Publication Number Publication Date
ITTO20010349A0 true ITTO20010349A0 (it) 2001-04-11
ITTO20010349A1 ITTO20010349A1 (it) 2002-10-11

Family

ID=11458778

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2001TO000349A ITTO20010349A1 (it) 2001-04-11 2001-04-11 Apparecchiatura ottica per la misurazione di oggetti con profilo rettilineo.

Country Status (6)

Country Link
US (1) US7078719B2 (it)
EP (1) EP1379834A1 (it)
CN (1) CN1230661C (it)
AU (1) AU2002310925A1 (it)
IT (1) ITTO20010349A1 (it)
WO (1) WO2002084214A1 (it)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20022211A1 (it) * 2002-10-18 2004-04-19 Cit Alcatel Regolazione della potenza irradiata su un telescopio di
CN100387929C (zh) * 2006-05-24 2008-05-14 长春理工大学 三棱镜高度激光非接触检测方法及装置
CN102152952B (zh) * 2011-03-07 2013-04-17 长春工业大学 一种矿热炉炉料输送带防偏检测电路及检测方法
US9542793B1 (en) 2012-11-29 2017-01-10 Softronics, Ltd. Optical sensing system
US10175036B2 (en) * 2015-07-02 2019-01-08 Rolex Sa Method of measuring at least one dimension of an object
EP3315948B1 (de) * 2016-10-26 2019-09-04 Heraeus Quarzglas GmbH & Co. KG Verfahren zur ermittlung des brechzahlprofils eines zylinderförmigen optischen gegenstandes
CN106524932A (zh) * 2016-12-29 2017-03-22 合肥工业大学 对称光桥式自稳激光测径系统及其标定方法、测量方法
CN112781488A (zh) * 2019-11-11 2021-05-11 中国计量大学 一种基于线阵ccd的工件尺寸测量装置
US11788927B2 (en) 2021-02-26 2023-10-17 Heraeus Quartz North America Llc Evaluation of preforms with non-step-index refractive-index-profile (RIP)
DE102022130848A1 (de) 2022-11-22 2024-05-23 Audi Aktiengesellschaft Messanordnung und Verfahren zum Vermessen einer Ausdehnung mindestens einer Batteriezelle

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE376966B (it) * 1973-10-12 1975-06-16 Aga Ab
US4021119A (en) * 1975-06-24 1977-05-03 Honeywell Inc. Position gauge
JPS6170436A (ja) * 1984-09-14 1986-04-11 Univ Kyoto 円柱内屈折率分布測定方法
FR2623899B1 (fr) 1987-11-26 1991-04-05 Fardeau Jean Francois Procede de mesure de diametres de fils ou de profils ou pieces circulaires par diffraction de rayons lumineux et dispositif pour la mise en oeuvre de ce procede
US4872757A (en) * 1988-04-20 1989-10-10 Ball Corporation Optical convex surface profiling and gauging apparatus and method therefor
US5608530A (en) 1994-08-08 1997-03-04 General Inspection, Inc. Inspection device for measuring a geometric dimension of a part
JPH11304441A (ja) 1998-04-20 1999-11-05 Nec Corp 三次元形状測定装置

Also Published As

Publication number Publication date
WO2002084214A8 (en) 2003-09-18
CN1463355A (zh) 2003-12-24
US20040104360A1 (en) 2004-06-03
US7078719B2 (en) 2006-07-18
ITTO20010349A1 (it) 2002-10-11
AU2002310925A1 (en) 2002-10-28
EP1379834A1 (en) 2004-01-14
WO2002084214A1 (en) 2002-10-24
WO2002084214B1 (en) 2003-03-13
CN1230661C (zh) 2005-12-07

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