GB2468874A - Apparatus for cutting wafers using wires and abrasive slurry - Google Patents
Apparatus for cutting wafers using wires and abrasive slurry Download PDFInfo
- Publication number
- GB2468874A GB2468874A GB0905059A GB0905059A GB2468874A GB 2468874 A GB2468874 A GB 2468874A GB 0905059 A GB0905059 A GB 0905059A GB 0905059 A GB0905059 A GB 0905059A GB 2468874 A GB2468874 A GB 2468874A
- Authority
- GB
- United Kingdom
- Prior art keywords
- wires
- block
- slurry
- soft material
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000002002 slurry Substances 0.000 title claims abstract description 51
- 238000005520 cutting process Methods 0.000 title claims abstract description 45
- 235000012431 wafers Nutrition 0.000 title claims abstract description 23
- 239000000463 material Substances 0.000 claims abstract description 16
- 239000003292 glue Substances 0.000 claims abstract description 4
- 239000007779 soft material Substances 0.000 claims description 40
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 16
- 229910052710 silicon Inorganic materials 0.000 claims description 16
- 239000010703 silicon Substances 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 4
- 239000007788 liquid Substances 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000005662 Paraffin oil Substances 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 230000001050 lubricating effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000000382 optic material Substances 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 230000004936 stimulating effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D57/00—Sawing machines or sawing devices not covered by one of the preceding groups B23D45/00 - B23D55/00
- B23D57/0007—Sawing machines or sawing devices not covered by one of the preceding groups B23D45/00 - B23D55/00 using saw wires
- B23D57/0023—Sawing machines or sawing devices not covered by one of the preceding groups B23D45/00 - B23D55/00 using saw wires with a plurality of saw wires or saw wires having plural cutting zones
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D57/00—Sawing machines or sawing devices not covered by one of the preceding groups B23D45/00 - B23D55/00
- B23D57/003—Sawing machines or sawing devices working with saw wires, characterised only by constructional features of particular parts
- B23D57/0061—Sawing machines or sawing devices working with saw wires, characterised only by constructional features of particular parts of devices for guiding or feeding saw wires
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D59/00—Accessories specially designed for sawing machines or sawing devices
- B23D59/001—Measuring or control devices, e.g. for automatic control of work feed pressure on band saw blade
- B23D59/005—Measuring or control devices, e.g. for automatic control of work feed pressure on band saw blade for preventing collision of saw blades with other machine parts or workpieces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
- B24B27/0633—Grinders for cutting-off using a cutting wire
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/007—Use, recovery or regeneration of abrasive mediums
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
- B28D5/042—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools by cutting with blades or wires mounted in a reciprocating frame
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
- B28D5/045—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools by cutting with wires or closed-loop blades
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/10—Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Apparatus for cutting a multiplicity of wafers from a block comprises means to form a flat closely spaced parallel array of wires 11, and means to move the block 14 through the array, or vice versa. The apparatus also includes means 15 to apply abrasive slurry to the array before it reaches the block, in which there is provision to limit the length of wire along which there is a full supply of abrasive slurry during the start up of the cutting process into the block. The provision may comprise a cylinder shaped piece of softer material 21, which is rotatable between subsequent sawing runs. Alternatively, a separate tube or strip of softer material (23, fig 3) may be attached to the block by glue, so that the array of wires initially cuts into the softer material with little or no slurry; or a brush or scraper (26, fig 6) may be arranged to remove slurry from the array of wires. The supply of abrasive slurry to the block prior to starting the main cutting process may be reduced or eliminated. The apparatus is aimed at preventing the wires of the array from combining and so giving rise to local area thickness fluctuations.
Description
WIRE SAWING TO FORM THIN WAFERS
Technical Field of the Invention
The invention relates to wire sawing of a solid block to form a multiplicity of thin wafers.
Background of the Invention
An apparatus for producing a multiplicity of thin wafers from a block of solid material was described in UK Patent Specification 2,414,204. That apparatus was a development of machinery which used cutting wire to slice thin plates or wafers from bars or blocks of expensive and fragile semi conductor or electro-optic material. A current application of this apparatus has been the production of silicon wafers e.g. for PV panels.
However, the present invention is not limited to that particular apparatus for cutting pairs of blocks with a diversion of the cutting wire between them, and may be applied to the cutting of single blocks, as shown in Figure 3 of UK 2,414,204..
In such machinery, a high tensile steel wire is passed under tension from a supply reel, round wire guide rollers, and is taken up on a collection reel. The surface of each of the wire guide rollers has a series of closely spaced V' grooves at a pitch separation equal to the thickness of the wire plus the thickness of the required wafer. The current configuration of the rollers is such that the wire can pass round them up to 3000 times producing a flat loom or web of wires, with the wire passing around the rollers at a speed of up to 20 meters per second.
Heretofore the web has been flooded with a suspension or slurry of finely divided abrasive powder such as 10 micron silicon carbide powder in a lubricating or cooling medium such as paraffin oil or polyethylene glycol. The material to be sliced is pressed against and slowly moved through the web of wires where the fast moving wires (together with the abrasive slurry) cut a regular series of thin slots through the material. This produces a multiplicity of plates or wafers of accurate thickness with a fine surface finish. In future the wire itself may also be developed into containing the abrasive particles.
It has been found that in the struggle to make thinner wafers in order to save manufacturing cost per wafer, some new challenges have arisen. The abrasive slurry used to perform and cool the sawing process also stimulates cohesion forces (surface tension and capillary forces) between the sawing wires -and in particular before they enter the silicon block. This effect has been sufficient to draw adjacent wires together, and so jam the performance of the apparatus.
The problem has been seen to lie in the characteristics of the abrasive slurry; and the distance between the wires and the tension in the wires, as the wires move into the silicon block.
More specifically, during the start of cutting the wafers in one particular configuration, there is a continuous slurry film on the sawing wires necessarily exceeding the length of the block edge, thereby establishing a large area for cohesion forces between the wires. As soon as sawing starts, this distance is automatically reduced to less than half as the silicon block being cut interrupts the continuous liquid film between the wires. The cohesion forces in the initial phase lead to adjacent wires combining in pairs, thereby creating the problem sometimes referred to as LATF [Local Area Thickness Fluctuation] or "thick-thin" in production. (The result is that every second wafer becomes too thick and the intermediate wafers become too thin on the edges.) The forces stimulating the wires to combine are approximately proportional to the length of the continuous liquid film along the wires. In the situation prior to the potential combining into wire pairs, the wires (except at the very edges) are balanced between forces on each side, while as soon as a pair is formed, both the neighbouring wires to the pair experience a greater distance to one neighbour than the other, and the phenomenon spreads to other neighbouring wires. As a consequence, this problem frequently impacts either all wafers in a block or none.
Disclosure of the inventici
As explained above, the liquid film formed by the slurry (necessary to bring the cutting particles in contact with silicon, to transport the cut material away from the cut slit, and to lubricate and cool the cutting process) creates the problem of capillary and surface tension forces drawing the sawing wires together even before they touch the silicon block. By interrupting this liquid film before the wires cut into the silicon block, this length will be greatly reduced, and the problem mitigated. The same problem could also be reduced by using smaller wire guides just next to the silicon block, but this increases the complexity of the wafer saw itself.
The invention provides apparatus for cutting a multiplicity of wafers from a block, the apparatus comprising -means (a supply reel) to supply one or more wires, -means (a collection reel) to collect the used wire/wires, -means (roller guides) to align the wire or wires to form a flat closely spaced parallel array of wires, and -means to move the block through the wires or vice versa in a direction generally perpendicular to the plane of the array of wires, in which there is means (a manifold) to apply abrasive slurry to the wires before they reach the block, so to effect the main cutting of the block by dragging the abrasive slurry surrounding the wires into the block, and in which there is a provision to limit the length of wire along which there is a full supply of abrasive slurry during the start up of the cutting process into the block.
In one form it is preferred that there is provision to attach a separate tube or strip of softer material to the block, and the arrangement is such that the wires initially cut into this softer material with little or no slurry applied to them.
In this form it is further preferred that there is provision to remove the cut pieces of tube or strip from the block after it has passed the wires.
In another form it is preferred that at least a part of the surface of the block nearer to the array of wires is covered with a soft material, so that initial contact between the block and the wires is made through this soft material with little or no slurry on the wires, before the cutting of the block with the normal amount of abrasive slurry is started.
The soft material may be glued to the block, and the soft material may be glue.
The soft material may be planar and may cover the entire block evenly.
Alternatively, the soft material may be unevenly distributed across the block, and may be distributed in stripes.
In another form it is preferred that the soft material comprises a separate sheet of material disposed close to the surface of the block.
In yet another form, the soft material is present on the opposite side of the wire web compared to the block so that initial sawing is made into the soft material on one side with little or no slurry on the wires, before the cutting direction is reversed, while keeping the soft material and silicon block in direct contact and the application of a normal amount of abrasive slurry is started.
In this last mentioned form it is preferred that the soft material has a cylindrical shape and is rotatable to allow rotation between subsequent sawing runs or sets of sawing runs. Alternatively, the soft material may be of a regular shape such as a square, rectangle or hexagon, and is movable through a corresponding angle between subsequent sawing runs or sets of sawing runs.
The wire may initially cut into soft material completely without slurry.
Alternatively, the supply of slurry is restricted to half its normal quantity subsequent to the cutting through the soft material.
In another form, the provision limiting the length of the continuous slurry film on the wire web may be a brush or scraper arranged to remove slurry from the wires.
The invention also provides a method of cutting a multiplicity of wafers from a block, comprising the steps of moving the block through an array of fast moving closely spaced parallel wires in a direction generally perpendicular to the plane of the array, and providing a supply of abrasive slurry to the wires for the main cutting process, in which, prior to commencement of the main cutting process, the supply of abrasive slurry to the block is reduced or eliminated, so that the start up of cutting into the block is effected with the wires having only a little or no slurry on those wires.
The invention also provides a block for use as a feed stock in the apparatus or method described above, and having a portion of soft easily cut material on the side on which the sawing is to be initiated.
Brief description of the drawings
Six specific embodiments of the invention will now be described by way of example with reference to the accompanying drawings, which are diagrammatic side elevations of machinery cutting silicon blocks into a multiplicity of thin wafers.
Description of a Specific Embodiment of the Invention As shown in the diagrammatic side elevation of Fig 1, a first guide roller 10 feeds an array of abrasive cutting wires 11 to a second guide roller 12. It will be understood that in the side elevation only one wire can be shown. The wire comes from a supply reel (not shown) and is drawn onto a collection reel (also not shown).In practice, an array of closely spaced abrasive cutting wires will be used (as shown in Figure 3 of ITK 2,414,204). The guide rollers position the wires in a flat evenly spaced cutting array. (It is known to have one or a few long wire(s) going more than 1000 times around the guide rollers.) There may be several thousand wires (or different sections of one or a few wires) spaced apart at a distance of 200 microns or less when measuring between adjacent wire surfaces. A silicon block 14, having its surface near to the array of wires, is slowly moved towards the array of wires. (The silicon block is shown with its contact face parallel to the array of wires. The block may be slightly inclined, with its edge nearer to the approaching wires slightly closer to the wires than its further edge.) The apparatus has provision (not shown, but already known from other machinery) for moving the block 14 downwardly through the array of wires 11. A manifold 15 is arranged above the array of wires for the supply of abrasive slurry.
The general arrangement shown in the diagrammatic side elevations and described above is common to all embodiments.
In the embodiment of Fig. 1, a polymer rod or tube 21 is moved upwardly into the array of wires from below, so that the wires 11 initially cut into the soft material of the polymer tube 21. The tube may be circular in cross section (as shown) but it could be square, rectangular, hexagonal or any other regular shape.
The tube need not be of polymer, but must be of a material soft enough to be cut by the wires with little or no slurry.
For the initial period of the Cut (possibly no more that 0.1mm) the wires cut partially into the tube 21. Then the block 14 is lowered until it comes into contact with the semi-cut tube 21. Abrasive slurry is supplied to the wires 11 from the manifold 15 at any time after the cutting into the tube 21 has started, and block 14 is thereafter lowered through the array of wires 11. Thus the wafers are formed. For the next block, the tube 21 may be rotated, so that a new part of the soft material is initially exposed to the cutting wires. In a variant of this embodiment (Fig 2), the tube 21 is replaced by a bar 22 In a third embodiment (Fig 3), the surface of the block 14 nearer to the wires 11 has a coating of soft material 23. Initially, as the block is lowered into contact with the wires, the wires will be able to saw through this soft material (which could be of a polymer/rubber composition) with little or no slurry. After the wires have -with certainty -started cutting into the soft material (taking machine and block size tolerances into account), abrasive slurry is introduced from the manifold 15, and sawing can continue as the block is lowered through the array of wires 11.
It is advantageous to use a soft material coating which will dissolve or fall off in the subsequent washing of the wafer. For instance, the soft material coating may be a thin layer of the same glue which is used to attach the semiconductor block to the sawing substrate (not shown).
In a forth embodiment (Fig 4), a separate web of soft material 24 is disposed between the silicon block 14 and the array of wires 11. This web of soft material will be engaged by the wires 11 before the abrasive slurry contacts the surface of the silicon block 14.
In a fifth embodiment (Fig 5) there is a strip of soft material 25 preferably attached close to the entry edge of the block 14 with respect to the direction of approach of the cutting wires 11. Initially, as the block is lowered into contact with the wires, the wires cut into this soft material with little or no abrasive slurry.
Thereafter, abrasive slurry can be introduced from the manifold 15 to effect the cutting of the block into wafers.
In a sixth embodiment, (Fig 6), a brush, shaver or scraper 26 is arranged to contact the array of wires 11 from below, and to remove most of the abrasive slurry from the wires before the initial contact of the wires with the silicon block 14.
An important feature of all embodiments of the invention is to be able to initiate the sawing process with an array of dry or near dry cutting wires, which may for example (in Figs 1 to 5) be achieved by using a soft or easily cut material in the initial cutting phase.
While reference has been made to cutting wires, it will be understood that only a single (or few) cutting wire(s) isfare needed, and this/these is/are formed into a regular array (many wires across) by the guide rollers. 7.
Claims (16)
- CLAIMS1/ Apparatus for cutting a multiplicity of wafers from a block, the apparatus comprising: -means (a supply reel) to supply one or more wires, -means (a collection reel) to collect the used wire/wires, -means (roller guides) to align the wire or wires to form a flat closely spaced parallel array of wires, and -means to move the block through the wires or vice versa in a direction io generally perpendicular to the plane of the array of wires, in which there is means (a manifold) to apply abrasive slurry to the wires before they reach the block, so to effect the main cutting of the block by dragging the abrasive slurry surrounding the wires into the block, and in which there is a provision to limit the length of wire along which there is a full supply of abrasive slurry during the start up of the cutting process into the block.
- 2/ Apparatus as claimed in claim I in which there is provision to attach a separate tube or strip of softer material to the block, and the arrangement is such that the wires initially cut into this softer material with little or no slurry applied to them.
- 3/ Apparatus as claimed in claim 2, in which there is provision to remove the cut pieces of tube or strip from the block after it has passed the wires.
- 4/ Apparatus as claimed in claim 1, in which at least a part of the surface of the block nearer to the array of wires is covered with a soft material, so that initial contact between the block and the wires is made through this soft material with little or no slurry on the wires, before the cutting of the block with the normal amount of abrasive slurry is started.
- 5/ Apparatus as claimed in claim 4, in which the soft material may be glued to the block.
- 6/ Apparatus as claimed in claim 5, in which the soft material is the glue.
- 7/ Apparatus as claimed in any one of the preceding claims 4 to 6, in which the soft material is planar and covers the entire block evenly.
- 8/ Apparatus as claims in any one of claims 4 to 6, in which the soft material may be unevenly distributed across the block.
- 9/ Apparatus as claimed in claim 8, in which the soft material is distributed in stripes.
- 10/ Apparatus as claimed in claim 1 in which the soft material comprises a separate sheet of material disposed close to the surface of the block.
- 11/ Apparatus as claimed in claim 1, in which a soft material is present on the opposite side of the wire web compared to the block so that initial sawing is made intO the soft material on one side with little or no slurry on the wires, before the cutting direction is reversed, while keeping the soft material and silicon block in direct contact and the application of a normal amount of abrasive slurry is started.
- 12/ Apparatus as claimed in claim 11, in which the soft material has a cylindrical shape and is rotatable to allow rotation between subsequent sawing runs or sets of sawing runs.
- 13/ Apparatus as claimed in claim 11, in which the soft material is a regular shape such as a square, rectangle or hexagon, and is movable through a corresponding angle between subsequent sawing runs or sets of sawing runs.
- 14/ Apparatus as claimed in any one of the preceding claims, in which the wire is initially cutting into soft material completely without slurry.
- 15/ Apparatus as claims in any one of claims 4 to 13 in which the supply of slurry is restricted to half its normal quantity subsequent to the cutting through the soft material.
- 16 Apparatus as claimed in claim 1 in which the provision limiting the length of the continuous slurry film on the wire web is a brush or scraper arranged to remove slurry from the wires.17/ Method of cutting a multiplicity of wafers from a block, comprising the steps of moving the block through an array of fast moving closely spaced parallel wires in a direction generally perpendicular to the plane of the array, and providing a supply of abrasive slurry to the wires for the main cutting process, in which, prior to commencement of the main cutting process, the supply of abrasive slurry to the block is reduced or eliminated, so that the start up of cutting into the block is effected with the wires having only a little or no slurry çse wires.18/ Block for use as a feed stock in the apparatus or method as claimed in any one of the preceding claims and having a portion of soft easily cut material on the side on which the sawing is to be initiated.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0905059A GB2468874A (en) | 2009-03-24 | 2009-03-24 | Apparatus for cutting wafers using wires and abrasive slurry |
PCT/NO2010/000111 WO2010110673A1 (en) | 2009-03-24 | 2010-03-24 | Wire sawing to form thin wafers |
TW099108782A TW201107101A (en) | 2009-03-24 | 2010-03-24 | Wire sawing to form thin wafers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0905059A GB2468874A (en) | 2009-03-24 | 2009-03-24 | Apparatus for cutting wafers using wires and abrasive slurry |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0905059D0 GB0905059D0 (en) | 2009-05-06 |
GB2468874A true GB2468874A (en) | 2010-09-29 |
Family
ID=40640080
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0905059A Withdrawn GB2468874A (en) | 2009-03-24 | 2009-03-24 | Apparatus for cutting wafers using wires and abrasive slurry |
Country Status (3)
Country | Link |
---|---|
GB (1) | GB2468874A (en) |
TW (1) | TW201107101A (en) |
WO (1) | WO2010110673A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011081532A1 (en) * | 2009-12-30 | 2011-07-07 | Rec Wafer Norway As | Sawing blocks into wafers using initially bowed wires |
CN111878492A (en) * | 2020-09-24 | 2020-11-03 | 钱佳钰 | Pipeline adhesive fixing device and using method thereof |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI497067B (en) * | 2013-05-30 | 2015-08-21 | G Tech Optoelectronics Corp | Method for testing diamond cutting line |
CN104215537B (en) * | 2013-05-30 | 2016-12-07 | 正达国际光电股份有限公司 | Diamond wire testing method |
TWI641461B (en) * | 2016-09-13 | 2018-11-21 | 友達晶材股份有限公司 | Ultrasonic auxiliary wire cutting cutting method and device thereof, and wafer manufacturing method |
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JPH07136922A (en) * | 1993-11-24 | 1995-05-30 | Yasunaga:Kk | Device for preventing foreign matter from catching on roller of wire saw |
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WO2001091981A1 (en) * | 2000-05-31 | 2001-12-06 | Memc Electronic Materials, S.P.A. | Wire saw and process for slicing multiple semiconductor ingots |
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US7353818B2 (en) * | 2004-11-23 | 2008-04-08 | Siltron Inc. | Apparatus and method for slicing an ingot |
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US7306508B2 (en) * | 2003-10-27 | 2007-12-11 | Mitsubishi Denki Kabushiki Kaisha | Multi-wire saw |
JP2005153035A (en) * | 2003-11-20 | 2005-06-16 | Kyocera Corp | Wire saw device |
GB2414204B (en) | 2004-05-18 | 2006-04-12 | David Ainsworth Hukin | Abrasive wire sawing |
DE102005026546A1 (en) * | 2005-05-31 | 2006-12-07 | Technische Universität Dresden | Wire separation lapping method involves detecting operating parameters of feed rate, pendulum angle, wire tension and deflection angle and regulating one parameter during separation process, such that contact length of wire is kept constant |
JP2007173721A (en) * | 2005-12-26 | 2007-07-05 | Sharp Corp | Slicing method for silicon ingot |
WO2009153877A1 (en) * | 2008-06-19 | 2009-12-23 | 信濃電気製錬株式会社 | Fret bar for ingot slicing, ingot to which fret bar is stuck, and ingot cutting method using fret bar |
-
2009
- 2009-03-24 GB GB0905059A patent/GB2468874A/en not_active Withdrawn
-
2010
- 2010-03-24 TW TW099108782A patent/TW201107101A/en unknown
- 2010-03-24 WO PCT/NO2010/000111 patent/WO2010110673A1/en active Application Filing
Patent Citations (5)
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JPH07136922A (en) * | 1993-11-24 | 1995-05-30 | Yasunaga:Kk | Device for preventing foreign matter from catching on roller of wire saw |
JPH07308919A (en) * | 1994-05-16 | 1995-11-28 | Tokyo Seimitsu Co Ltd | Wire washing equipment for wire saw |
WO2001091981A1 (en) * | 2000-05-31 | 2001-12-06 | Memc Electronic Materials, S.P.A. | Wire saw and process for slicing multiple semiconductor ingots |
US20030047177A1 (en) * | 2001-09-11 | 2003-03-13 | Michael Christ | Method for cutting ingots for use with a wire cutting apparatus |
US7353818B2 (en) * | 2004-11-23 | 2008-04-08 | Siltron Inc. | Apparatus and method for slicing an ingot |
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WO2011081532A1 (en) * | 2009-12-30 | 2011-07-07 | Rec Wafer Norway As | Sawing blocks into wafers using initially bowed wires |
CN111878492A (en) * | 2020-09-24 | 2020-11-03 | 钱佳钰 | Pipeline adhesive fixing device and using method thereof |
Also Published As
Publication number | Publication date |
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WO2010110673A1 (en) | 2010-09-30 |
GB0905059D0 (en) | 2009-05-06 |
TW201107101A (en) | 2011-03-01 |
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