GB2256279B - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number: GB2256279B
Authority: GB; United Kingdom
Prior art keywords: memory device; semiconductor memory; semiconductor; memory
Prior art date: 1988-08-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

GB9213630A

Other versions

GB2256279A (en

GB9213630D0 (en

Inventor

Kazutami Arimoto

Kazuyasu Fujishima

Yoshio Matsuda

Tsukasa Ooishi

Masaki Tsukude

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Mitsubishi Electric Corp

Original Assignee

Mitsubishi Electric Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-08-30

Filing date

1992-06-26

Publication date

1993-05-12

1989-05-31 Priority claimed from JP1137972A external-priority patent/JPH0748319B2/en

1989-08-17 Priority claimed from GB8918830A external-priority patent/GB2222461B/en

1992-06-26 Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp

1992-08-12 Publication of GB9213630D0 publication Critical patent/GB9213630D0/en

1992-12-02 Publication of GB2256279A publication Critical patent/GB2256279A/en

1993-05-12 Application granted granted Critical

1993-05-12 Publication of GB2256279B publication Critical patent/GB2256279B/en

2012-06-26 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/26—Accessing multiple arrays
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices

GB9213630A 1988-08-30 1992-06-26 Semiconductor memory device Expired - Lifetime GB2256279B (en)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
JP21710988		1988-08-30
JP1137972A JPH0748319B2 (en)	1988-08-30	1989-05-31	Semiconductor memory device
GB8918830A GB2222461B (en)	1988-08-30	1989-08-17	On chip testing of semiconductor memory devices

Publications (3)

Publication Number	Publication Date
GB9213630D0 GB9213630D0 (en)	1992-08-12
GB2256279A GB2256279A (en)	1992-12-02
GB2256279B true GB2256279B (en)	1993-05-12

Family

ID=27264642

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
GB9213630A Expired - Lifetime GB2256279B (en)	1988-08-30	1992-06-26	Semiconductor memory device
GB9223130A Expired - Lifetime GB2259594B (en)	1988-08-30	1992-11-04	Semiconductor memory device

Family Applications After (1)

Application Number	Title	Priority Date	Filing Date
GB9223130A Expired - Lifetime GB2259594B (en)	1988-08-30	1992-11-04	Semiconductor memory device

Country Status (1)

Country	Link
GB (2)	GB2256279B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
KR940006676B1 (en) *	1991-10-14	1994-07-25	삼성전자 주식회사	Semiconductor ic having test cirucit for memory
KR100212420B1 (en) *	1995-09-25	1999-08-02	김영환	Cash static ram having a test circuit
KR100197554B1 (en) *	1995-09-30	1999-06-15	윤종용	Speedy test method of semiconductor memory device
JPH09161476A (en) *	1995-10-04	1997-06-20	Toshiba Corp	Semiconductor memory, its testing circuit and data transfer system
KR100494281B1 (en) *	1996-10-31	2005-08-05	텍사스 인스트루먼츠 인코포레이티드	Integrated circuit memory device having current-mode data compression test mode

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP0262867A2 (en) *	1986-10-02	1988-04-06	AT&T Corp.	Integrated circuit with memory self-test

1992
- 1992-06-26 GB GB9213630A patent/GB2256279B/en not_active Expired - Lifetime
- 1992-11-04 GB GB9223130A patent/GB2259594B/en not_active Expired - Lifetime

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP0262867A2 (en) *	1986-10-02	1988-04-06	AT&T Corp.	Integrated circuit with memory self-test

Also Published As

Publication number	Publication date
GB2259594B (en)	1993-06-30
GB2259594A (en)	1993-03-17
GB9223130D0 (en)	1992-12-16
GB2256279A (en)	1992-12-02
GB9213630D0 (en)	1992-08-12

Publication	Publication Date	Title
GB2215913B (en)	1991-05-15	Semiconductor memory device
GB2227109B (en)	1993-10-13	Semiconductor memory device
KR930009541B1 (en)	1993-10-06	Semiconductor memory device
GB2238637B (en)	1994-03-30	Semiconductor memory device
GB2239558B (en)	1993-08-18	Semiconductor memory device
EP0352193A3 (en)	1990-08-29	Semiconductor memory device
EP0407173A3 (en)	1992-01-08	Semiconductor memory device
KR960008449B1 (en)	1996-06-26	Semiconductor memory device
EP0430426A3 (en)	1991-06-12	Semiconductor memory device
EP0283019A3 (en)	1990-01-10	Semiconductor memory device
GB2239534B (en)	1993-12-01	Semiconductor memory device
EP0408057A3 (en)	1992-07-15	Semiconductor memory device
EP0319691A3 (en)	1990-12-27	Semiconductor memory device
EP0432509A3 (en)	1992-09-30	Semiconductor memory device
GB2239556B (en)	1993-08-25	Semiconductor memory device
EP0423825A3 (en)	1992-03-04	Semiconductor memory device
EP0294840A3 (en)	1989-11-29	Semiconductor memory device
EP0352111A3 (en)	1990-09-12	Semiconductor memory device
EP0421447A3 (en)	1992-06-17	Semiconductor memory device
GB2224162B (en)	1992-07-15	Semiconductor memory device
EP0284985A3 (en)	1990-12-27	Semiconductor memory device
EP0418794A3 (en)	1991-08-28	Semiconductor memory device
EP0405576A3 (en)	1991-11-27	Semiconductor memory device
EP0427284A3 (en)	1992-03-04	Semiconductor memory device
EP0282023A3 (en)	1989-05-17	Semiconductor memory device

Legal Events

Date	Code	Title	Description
1995-09-13	746	Register noted 'licences of right' (sect. 46/1977)	Effective date: 19950809
2009-09-09	PE20	Patent expired after termination of 20 years	Expiry date: 20090816