GB2153589B - Thin film transistor - Google Patents
Thin film transistorInfo
- Publication number
- GB2153589B GB2153589B GB08502348A GB8502348A GB2153589B GB 2153589 B GB2153589 B GB 2153589B GB 08502348 A GB08502348 A GB 08502348A GB 8502348 A GB8502348 A GB 8502348A GB 2153589 B GB2153589 B GB 2153589B
- Authority
- GB
- United Kingdom
- Prior art keywords
- thin film
- film transistor
- transistor
- thin
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78633—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a light shield
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78663—Amorphous silicon transistors
- H01L29/78669—Amorphous silicon transistors with inverted-type structure, e.g. with bottom gate
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1676384A JPS60160173A (en) | 1984-01-30 | 1984-01-30 | Thin film transistor |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8502348D0 GB8502348D0 (en) | 1985-02-27 |
GB2153589A GB2153589A (en) | 1985-08-21 |
GB2153589B true GB2153589B (en) | 1988-10-12 |
Family
ID=11925260
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08502348A Expired GB2153589B (en) | 1984-01-30 | 1985-01-30 | Thin film transistor |
GB08723748A Expired GB2197985B (en) | 1984-01-30 | 1987-10-09 | Liquid crystal display |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08723748A Expired GB2197985B (en) | 1984-01-30 | 1987-10-09 | Liquid crystal display |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS60160173A (en) |
DE (1) | DE3502911A1 (en) |
GB (2) | GB2153589B (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8952377B2 (en) | 2011-07-08 | 2015-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US9142570B2 (en) | 2009-07-31 | 2015-09-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9166055B2 (en) | 2011-06-17 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US9214474B2 (en) | 2011-07-08 | 2015-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
US9224870B2 (en) | 2009-07-31 | 2015-12-29 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor device |
US9362416B2 (en) | 2009-07-31 | 2016-06-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor wearable device |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2593327B1 (en) * | 1986-01-23 | 1988-10-28 | Commissariat Energie Atomique | METHOD FOR MANUFACTURING A THIN FILM TRANSISTOR USING TWO OR THREE LEVELS OF MASKING |
JPH0766253B2 (en) * | 1986-06-20 | 1995-07-19 | 松下電器産業株式会社 | Matrix type image display device |
FR2605442B1 (en) * | 1986-10-17 | 1988-12-09 | Thomson Csf | ELECTROOPTIC VISUALIZATION SCREEN WITH CONTROL TRANSISTORS AND METHOD FOR PRODUCING THE SAME |
JPS63166236A (en) * | 1986-12-26 | 1988-07-09 | Toshiba Corp | Electronic device |
JPH01173650A (en) * | 1987-12-26 | 1989-07-10 | Seikosha Co Ltd | Manufacture of amorphous silicon thin-film transistor |
EP0408653A4 (en) * | 1988-03-31 | 1991-10-16 | Solarex Corporation | Gate dielectric for a thin film field effect transistor |
FR2631743A1 (en) * | 1988-05-23 | 1989-11-24 | Gen Electric | STRUCTURE WITH NON-COPLANAR ELECTRODES FOR LIQUID CRYSTAL MATRIX DISPLAY WITH AMORPHOUS SILICON THIN FILM TRANSISTORS AND MANUFACTURING METHOD |
JPH0283981A (en) * | 1988-09-21 | 1990-03-26 | Fuji Xerox Co Ltd | Thin film transistor |
JPH0348463A (en) * | 1989-03-01 | 1991-03-01 | Mitsubishi Electric Corp | Thin film transistor |
DE69107101T2 (en) | 1990-02-06 | 1995-05-24 | Semiconductor Energy Lab | Method of making an oxide film. |
DE69125886T2 (en) * | 1990-05-29 | 1997-11-20 | Semiconductor Energy Lab | Thin film transistors |
EP0535979A3 (en) * | 1991-10-02 | 1993-07-21 | Sharp Kabushiki Kaisha | A thin film transistor and a method for producing the same |
JP3369055B2 (en) * | 1996-09-06 | 2003-01-20 | シャープ株式会社 | Thin film semiconductor device and method of manufacturing the same |
US5814530A (en) * | 1996-09-27 | 1998-09-29 | Xerox Corporation | Producing a sensor with doped microcrystalline silicon channel leads |
US5959312A (en) * | 1996-09-27 | 1999-09-28 | Xerox Corporation | Sensor with doped microcrystalline silicon channel leads with bubble formation protection means |
JP3683463B2 (en) | 1999-03-11 | 2005-08-17 | シャープ株式会社 | Active matrix substrate, manufacturing method thereof, and image sensor using the substrate |
JP3916823B2 (en) | 1999-04-07 | 2007-05-23 | シャープ株式会社 | Active matrix substrate, manufacturing method thereof, and flat panel image sensor |
CN105097946B (en) * | 2009-07-31 | 2018-05-08 | 株式会社半导体能源研究所 | Semiconductor device and its manufacture method |
WO2011013502A1 (en) | 2009-07-31 | 2011-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101073543B1 (en) * | 2009-09-04 | 2011-10-17 | 삼성모바일디스플레이주식회사 | Organic light emitting diode display |
KR102254731B1 (en) | 2012-04-13 | 2021-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Semiconductor device |
US10304859B2 (en) | 2013-04-12 | 2019-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having an oxide film on an oxide semiconductor film |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3840695A (en) * | 1972-10-10 | 1974-10-08 | Westinghouse Electric Corp | Liquid crystal image display panel with integrated addressing circuitry |
GB2064866A (en) * | 1979-11-30 | 1981-06-17 | Gen Electric Co Ltd | Field effect semiconductor device |
JPS5679472A (en) * | 1979-12-04 | 1981-06-30 | Toshiba Corp | Preparing method of mos-type semiconductor device |
US4389481A (en) * | 1980-06-02 | 1983-06-21 | Xerox Corporation | Method of making planar thin film transistors, transistor arrays |
JPS58147069A (en) * | 1982-02-25 | 1983-09-01 | Sharp Corp | Thin film transistor |
-
1984
- 1984-01-30 JP JP1676384A patent/JPS60160173A/en active Pending
-
1985
- 1985-01-29 DE DE19853502911 patent/DE3502911A1/en not_active Ceased
- 1985-01-30 GB GB08502348A patent/GB2153589B/en not_active Expired
-
1987
- 1987-10-09 GB GB08723748A patent/GB2197985B/en not_active Expired
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9142570B2 (en) | 2009-07-31 | 2015-09-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9224870B2 (en) | 2009-07-31 | 2015-12-29 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor device |
US9293601B2 (en) | 2009-07-31 | 2016-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US9362416B2 (en) | 2009-07-31 | 2016-06-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor wearable device |
US9515192B2 (en) | 2009-07-31 | 2016-12-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9166055B2 (en) | 2011-06-17 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8952377B2 (en) | 2011-07-08 | 2015-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US9196745B2 (en) | 2011-07-08 | 2015-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US9214474B2 (en) | 2011-07-08 | 2015-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
US9530897B2 (en) | 2011-07-08 | 2016-12-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
Also Published As
Publication number | Publication date |
---|---|
GB2197985A (en) | 1988-06-02 |
DE3502911A1 (en) | 1985-08-01 |
GB8723748D0 (en) | 1987-11-11 |
JPS60160173A (en) | 1985-08-21 |
GB8502348D0 (en) | 1985-02-27 |
GB2153589A (en) | 1985-08-21 |
GB2197985B (en) | 1988-10-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE20 | Patent expired after termination of 20 years |
Effective date: 20050129 |