GB2087315B - Plasma etching of aluminum - Google Patents
Plasma etching of aluminumInfo
- Publication number
- GB2087315B GB2087315B GB8130894A GB8130894A GB2087315B GB 2087315 B GB2087315 B GB 2087315B GB 8130894 A GB8130894 A GB 8130894A GB 8130894 A GB8130894 A GB 8130894A GB 2087315 B GB2087315 B GB 2087315B
- Authority
- GB
- United Kingdom
- Prior art keywords
- aluminum
- plasma etching
- etching
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 title 1
- 229910052782 aluminium Inorganic materials 0.000 title 1
- 238000001020 plasma etching Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32135—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
- H01L21/32136—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F4/00—Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Computer Hardware Design (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US19661680A | 1980-10-14 | 1980-10-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
GB2087315A GB2087315A (en) | 1982-05-26 |
GB2087315B true GB2087315B (en) | 1984-07-18 |
Family
ID=22726125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8130894A Expired GB2087315B (en) | 1980-10-14 | 1981-10-13 | Plasma etching of aluminum |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH0245714B2 (en) |
DE (1) | DE3140675A1 (en) |
GB (1) | GB2087315B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4505782A (en) * | 1983-03-25 | 1985-03-19 | Lfe Corporation | Plasma reactive ion etching of aluminum and aluminum alloys |
JPH061770B2 (en) * | 1984-01-30 | 1994-01-05 | 株式会社日立製作所 | Dry etching method |
GB2171360A (en) * | 1985-02-19 | 1986-08-28 | Oerlikon Buehrle Inc | Etching aluminum/copper alloy films |
JPS61235576A (en) * | 1985-04-10 | 1986-10-20 | Tokuda Seisakusho Ltd | Dry etching device |
JP2681058B2 (en) * | 1986-04-03 | 1997-11-19 | アネルバ株式会社 | Dry etching method |
JPH0727890B2 (en) * | 1986-09-19 | 1995-03-29 | 日本電気株式会社 | Dry etching method |
DE3821207A1 (en) * | 1988-06-23 | 1989-12-28 | Leybold Ag | ARRANGEMENT FOR COATING A SUBSTRATE WITH DIELECTRICS |
DE3940820C2 (en) * | 1989-12-11 | 1998-07-09 | Leybold Ag | Process for the treatment of workpieces by reactive ion etching |
US5397433A (en) * | 1993-08-20 | 1995-03-14 | Vlsi Technology, Inc. | Method and apparatus for patterning a metal layer |
JP6061384B2 (en) * | 2013-01-17 | 2017-01-18 | 国立大学法人静岡大学 | Manufacturing method of aluminum / resin bonded body and aluminum / resin bonded body |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54158343A (en) * | 1978-06-05 | 1979-12-14 | Hitachi Ltd | Dry etching method for al and al alloy |
US4182646A (en) * | 1978-07-27 | 1980-01-08 | John Zajac | Process of etching with plasma etch gas |
US4208241A (en) * | 1978-07-31 | 1980-06-17 | Bell Telephone Laboratories, Incorporated | Device fabrication by plasma etching |
US4256534A (en) * | 1978-07-31 | 1981-03-17 | Bell Telephone Laboratories, Incorporated | Device fabrication by plasma etching |
FR2432560A1 (en) * | 1978-08-02 | 1980-02-29 | Texas Instruments Inc | PROCESS FOR STRIPPING METALS, ESPECIALLY ALUMINUM, WITH SILICON TETRACHLORIDE PLASMA |
US4209357A (en) * | 1979-05-18 | 1980-06-24 | Tegal Corporation | Plasma reactor apparatus |
-
1981
- 1981-10-13 GB GB8130894A patent/GB2087315B/en not_active Expired
- 1981-10-13 DE DE19813140675 patent/DE3140675A1/en active Granted
- 1981-10-14 JP JP16487581A patent/JPH0245714B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB2087315A (en) | 1982-05-26 |
DE3140675C2 (en) | 1991-03-07 |
JPS57123978A (en) | 1982-08-02 |
JPH0245714B2 (en) | 1990-10-11 |
DE3140675A1 (en) | 1982-06-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19971013 |