GB1441261A - Semiconductor avalanche photodiodes - Google Patents
Semiconductor avalanche photodiodesInfo
- Publication number
- GB1441261A GB1441261A GB1444272A GB1444272A GB1441261A GB 1441261 A GB1441261 A GB 1441261A GB 1444272 A GB1444272 A GB 1444272A GB 1444272 A GB1444272 A GB 1444272A GB 1441261 A GB1441261 A GB 1441261A
- Authority
- GB
- United Kingdom
- Prior art keywords
- region
- substrate
- layer
- guard ring
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- 239000000969 carrier Substances 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 2
- 239000002184 metal Substances 0.000 abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 239000011521 glass Substances 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Abstract
1441261 Photodiodes EMI Ltd 27 June 1973 [28 March 1972] 14442/72 Heading H1K An avalanche photodiode has a shallow surface region 1 of opposite conductivity type to a surrounding epitaxial layer 6 and its supporting substrate 2, the substrate having a resistivity lower than 0.1 ohm. cm. The reverse bias and the design of the device are so chosen that at least part of the depletion region 4 associated with the junction between the region 1 and layer 6 extends to the substrate. This reduces the low-field volume of the layer and since the diffusion length of carriers formed by radiation absorbed in the substrate is low such carriers add little to the overall photocurrent of the device, which gives sharp output pulses. The device has one or two annular guard rings 3 associated with the region 1, the outer guard ring (if present) being spaced from that contiguous with the region. Preferably the lower boundaries of guard ring 3 and region 1 are coplanar, as shown, to eliminate any low field portion 5 of the layer 6 beneath the region 1. The region 1 is formed by diffusion into the surface of a pit etched in a previously diffused region which comprises guard ring 3. Fig. 5 (not shown) depicts a silicon diode of the type shown in Fig. 3 mounted on a metal and glass header welded to a metal can with an end window.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1444272A GB1441261A (en) | 1972-03-28 | 1972-03-28 | Semiconductor avalanche photodiodes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1444272A GB1441261A (en) | 1972-03-28 | 1972-03-28 | Semiconductor avalanche photodiodes |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1441261A true GB1441261A (en) | 1976-06-30 |
Family
ID=10041273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1444272A Expired GB1441261A (en) | 1972-03-28 | 1972-03-28 | Semiconductor avalanche photodiodes |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1441261A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2000373A (en) * | 1977-06-27 | 1979-01-04 | Thomson Csf | Diode capable of alternately functioning as an emitter and detector of light of the same wavelength |
US4497109A (en) * | 1979-12-21 | 1985-02-05 | Siemens Aktiengesellschaft | Method of fabricating light-controlled thyristor utilizing selective etching and ion-implantation |
US4761383A (en) * | 1981-09-28 | 1988-08-02 | Kokusai Denshin Denwa Kabushiki Kaisha | Method of manufacturing avalanche photo diode |
EP0697743A1 (en) * | 1994-08-17 | 1996-02-21 | Seiko Instruments Inc. | Avalanche photodiode joined with with an integrated circuit package and method of fabrication |
-
1972
- 1972-03-28 GB GB1444272A patent/GB1441261A/en not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2000373A (en) * | 1977-06-27 | 1979-01-04 | Thomson Csf | Diode capable of alternately functioning as an emitter and detector of light of the same wavelength |
GB2000373B (en) * | 1977-06-27 | 1982-04-07 | Thomson Csf | A diode capable of alternately functioning as an emitter and detector of light of the same wavelength |
US4497109A (en) * | 1979-12-21 | 1985-02-05 | Siemens Aktiengesellschaft | Method of fabricating light-controlled thyristor utilizing selective etching and ion-implantation |
US4761383A (en) * | 1981-09-28 | 1988-08-02 | Kokusai Denshin Denwa Kabushiki Kaisha | Method of manufacturing avalanche photo diode |
EP0697743A1 (en) * | 1994-08-17 | 1996-02-21 | Seiko Instruments Inc. | Avalanche photodiode joined with with an integrated circuit package and method of fabrication |
US5763903A (en) * | 1994-08-17 | 1998-06-09 | Seiko Instruments Inc. | Avalanche photodiode for light detection |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |