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GB1348805A - Test board assembly for electronic components - Google Patents

Test board assembly for electronic components

Info

Publication number
GB1348805A
GB1348805A GB1588171A GB1588171A GB1348805A GB 1348805 A GB1348805 A GB 1348805A GB 1588171 A GB1588171 A GB 1588171A GB 1588171 A GB1588171 A GB 1588171A GB 1348805 A GB1348805 A GB 1348805A
Authority
GB
United Kingdom
Prior art keywords
pins
carrier
lugs
coaxial cables
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1588171A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel CIT SA
Compagnie Industrielle de Telecommunication CIT Alcatel SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel CIT SA, Compagnie Industrielle de Telecommunication CIT Alcatel SA filed Critical Alcatel CIT SA
Publication of GB1348805A publication Critical patent/GB1348805A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

1348805 Electric couplings COMPAGNIE INDUSTRIELLE DE TELECOMMUNICATIONS CIT-ALCATEL 19 May 1971 [20 May 1970] 15881/71 Heading H2E During testing of a "flat pack" integrated circuit or the like the component 2 is held safely in a carrier 30 which is then clamped against an insulating connecting board 32 through which protrude connecting pins 90 attached coaxial cables 44, 46, 48. The pins slide in bushes and are biased upwardly by a foam rubber pad 112 to contact the lugs 6 through apertures 20 in the carrier 30. The carrier is positioned accurately by two unequal locating pins 60, 62 and is pressed down by a pressure pad 64 attached resiliently to a lever 72 which may be engaged by a looking rod 82. The connecting board 32 may have printed wiring on part of its surface (Fig. 3, not shown) to earth the coaxial cables to and to supply power via several pins to several lugs while testing the component. The arrangement is stated to be applicable to components with fast response times, e.g. 1 ns.
GB1588171A 1970-05-20 1971-05-19 Test board assembly for electronic components Expired GB1348805A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7018352A FR2088118A1 (en) 1970-05-20 1970-05-20

Publications (1)

Publication Number Publication Date
GB1348805A true GB1348805A (en) 1974-03-27

Family

ID=9055792

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1588171A Expired GB1348805A (en) 1970-05-20 1971-05-19 Test board assembly for electronic components

Country Status (5)

Country Link
BE (1) BE767117A (en)
DE (1) DE2124967A1 (en)
FR (1) FR2088118A1 (en)
GB (1) GB1348805A (en)
NL (1) NL7106963A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2139019A (en) * 1983-04-29 1984-10-31 Gen Electric Co Plc Printed circuit board testers
GB2156532A (en) * 1984-03-24 1985-10-09 Plessey Co Plc Apparatus for testing a printed circuit board
GB2331408A (en) * 1997-11-18 1999-05-19 Samsung Electronics Co Ltd Probe card for testing integrated circuit chips

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4683423A (en) * 1985-10-30 1987-07-28 Precision Monolithics, Inc. Leadless chip test socket

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2139019A (en) * 1983-04-29 1984-10-31 Gen Electric Co Plc Printed circuit board testers
GB2156532A (en) * 1984-03-24 1985-10-09 Plessey Co Plc Apparatus for testing a printed circuit board
GB2331408A (en) * 1997-11-18 1999-05-19 Samsung Electronics Co Ltd Probe card for testing integrated circuit chips
GB2331408B (en) * 1997-11-18 2001-08-29 Samsung Electronics Co Ltd Probe card for testing integrated circuit chips

Also Published As

Publication number Publication date
NL7106963A (en) 1971-11-23
DE2124967A1 (en) 1971-12-09
BE767117A (en) 1971-11-16
FR2088118A1 (en) 1972-01-07

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees