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GB0311693D0 - Calibration device - Google Patents

Calibration device

Info

Publication number
GB0311693D0
GB0311693D0 GBGB0311693.6A GB0311693A GB0311693D0 GB 0311693 D0 GB0311693 D0 GB 0311693D0 GB 0311693 A GB0311693 A GB 0311693A GB 0311693 D0 GB0311693 D0 GB 0311693D0
Authority
GB
United Kingdom
Prior art keywords
calibration device
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0311693.6A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Trade and Industry
Original Assignee
UK Secretary of State for Trade and Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Trade and Industry filed Critical UK Secretary of State for Trade and Industry
Priority to GBGB0311693.6A priority Critical patent/GB0311693D0/en
Publication of GB0311693D0 publication Critical patent/GB0311693D0/en
Priority to GB0319460A priority patent/GB2401945B/en
Priority to US10/557,275 priority patent/US20060267596A1/en
Priority to EP04733589A priority patent/EP1625349A2/en
Priority to PCT/GB2004/002134 priority patent/WO2004104516A2/en
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38Probes, their manufacture, or their related instrumentation, e.g. holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/32Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/62Manufacturing, calibrating, or repairing devices used in investigations covered by the preceding subgroups
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q40/00Calibration, e.g. of probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003Generation of the force
    • G01N2203/005Electromagnetic means
    • G01N2203/0051Piezoelectric means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/0202Control of the test
    • G01N2203/021Treatment of the signal; Calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0286Miniature specimen; Testing on microregions of a specimen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0288Springs
    • G01N2203/029Leaf spring
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0288Springs
    • G01N2203/0292Coil spring
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/067Parameter measured for estimating the property
    • G01N2203/0676Force, weight, load, energy, speed or acceleration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/067Parameter measured for estimating the property
    • G01N2203/0682Spatial dimension, e.g. length, area, angle

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Engineering & Computer Science (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GBGB0311693.6A 2003-05-21 2003-05-21 Calibration device Ceased GB0311693D0 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
GBGB0311693.6A GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device
GB0319460A GB2401945B (en) 2003-05-21 2003-08-19 Calibration Device
US10/557,275 US20060267596A1 (en) 2003-05-21 2004-05-18 Spring constant calibration device
EP04733589A EP1625349A2 (en) 2003-05-21 2004-05-18 Spring constant calibration device
PCT/GB2004/002134 WO2004104516A2 (en) 2003-05-21 2004-05-18 Spring constant calibration device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0311693.6A GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device

Publications (1)

Publication Number Publication Date
GB0311693D0 true GB0311693D0 (en) 2003-06-25

Family

ID=9958510

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0311693.6A Ceased GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device
GB0319460A Expired - Fee Related GB2401945B (en) 2003-05-21 2003-08-19 Calibration Device

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0319460A Expired - Fee Related GB2401945B (en) 2003-05-21 2003-08-19 Calibration Device

Country Status (1)

Country Link
GB (2) GB0311693D0 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0423780D0 (en) * 2004-10-26 2004-12-01 Trade & Industry Sec Dep For Lateral calibration device
CN104793019B (en) * 2014-01-18 2017-09-29 天津大学 The source tracing method of micro-cantilever elastic constant is demarcated on AFM

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
JP3713695B2 (en) * 1997-04-01 2005-11-09 株式会社島津製作所 Scanning probe microscope
DE19919030A1 (en) * 1999-04-27 2000-11-16 Bosch Gmbh Robert Determination of material properties, such as Young's Modulus, of micro-structures with dimensions less than around 2 mm by deflection of a test element and measurement of a representative value before and during deflection
US7066005B2 (en) * 2001-02-28 2006-06-27 Asylum Research Corporation Noncontact sensitivity and compliance calibration method for cantilever-based insturments
US6545495B2 (en) * 2001-04-17 2003-04-08 Ut-Battelle, Llc Method and apparatus for self-calibration of capacitive sensors
US6690179B2 (en) * 2001-08-24 2004-02-10 Symyx Technologies, Inc. High throughput mechanical property testing of materials libraries using capacitance

Also Published As

Publication number Publication date
GB0319460D0 (en) 2003-09-17
GB2401945B (en) 2007-01-03
GB2401945A (en) 2004-11-24

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)