FR3107357B1 - Détection de perturbations d'une alimentation électrique d'un circuit électronique - Google Patents
Détection de perturbations d'une alimentation électrique d'un circuit électronique Download PDFInfo
- Publication number
- FR3107357B1 FR3107357B1 FR2001419A FR2001419A FR3107357B1 FR 3107357 B1 FR3107357 B1 FR 3107357B1 FR 2001419 A FR2001419 A FR 2001419A FR 2001419 A FR2001419 A FR 2001419A FR 3107357 B1 FR3107357 B1 FR 3107357B1
- Authority
- FR
- France
- Prior art keywords
- input
- voltage
- output
- detection
- electronic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title abstract 3
- 239000003990 capacitor Substances 0.000 abstract 1
- 230000001052 transient effect Effects 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/073—Special arrangements for circuits, e.g. for protecting identification code in memory
- G06K19/07309—Means for preventing undesired reading or writing from or onto record carriers
- G06K19/07363—Means for preventing undesired reading or writing from or onto record carriers by preventing analysis of the circuit, e.g. dynamic or static power analysis or current analysis
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/01—Frequency selective two-port networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Computer Security & Cryptography (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Theoretical Computer Science (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Un circuit de détection (10a, 10b) de perturbations de l'alimentation d'un circuit électronique, ledit circuit de détection étant connecté à une borne d'alimentation (12) fournissant une tension d'alimentation (Vcc), comprenant : - un comparateur de tension (14) comprenant une sortie (16), une première entrée (18) configurée pour recevoir une première tension de référence (Vref1) et une seconde entrée (20), - un amplificateur opérationnel à transconductance (24) comprenant une sortie (26) connectée à la seconde entrée (20), une entrée inverseuse (28) connectée à la sortie, et une entrée non-inverseuse (30) recevant une seconde tension de référence (Vref2), - un condensateur (22) en série entre une borne d'alimentation (12) et la seconde entrée (20),dans lequel un signal de détection (Vd) à la sortie (16) du comparateur de tension est représentatif du dépassement transitoire, par la tension d'alimentation (Vcc), d'une plage de variation définie par un écart en tension entre la première tension de référence et la seconde tension de référence. Figure pour l'abrégé : figure 1a
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2001419A FR3107357B1 (fr) | 2020-02-13 | 2020-02-13 | Détection de perturbations d'une alimentation électrique d'un circuit électronique |
US17/123,210 US11460515B2 (en) | 2020-02-13 | 2020-12-16 | Compact supply voltage glitch sensor with adaptive amplitude sensitivity |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2001419A FR3107357B1 (fr) | 2020-02-13 | 2020-02-13 | Détection de perturbations d'une alimentation électrique d'un circuit électronique |
FR2001419 | 2020-02-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3107357A1 FR3107357A1 (fr) | 2021-08-20 |
FR3107357B1 true FR3107357B1 (fr) | 2022-03-04 |
Family
ID=71111527
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR2001419A Active FR3107357B1 (fr) | 2020-02-13 | 2020-02-13 | Détection de perturbations d'une alimentation électrique d'un circuit électronique |
Country Status (2)
Country | Link |
---|---|
US (1) | US11460515B2 (fr) |
FR (1) | FR3107357B1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021196094A1 (fr) * | 2020-04-01 | 2021-10-07 | 深圳市汇顶科技股份有限公司 | Circuit et puce de détection d'une attaque à base de tension |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050118980A1 (en) * | 2003-12-01 | 2005-06-02 | Hung-Chuan Pai | Variable rate RC calibration circuit with filter cut-off frequency programmability |
FR2895115A1 (fr) | 2005-12-20 | 2007-06-22 | St Microelectronics Sa | Detecteur de pics parasites dans l'alimentation d'un circuit integre |
US20080061843A1 (en) * | 2006-09-11 | 2008-03-13 | Asier Goikoetxea Yanci | Detecting voltage glitches |
JP2009211667A (ja) * | 2008-02-05 | 2009-09-17 | Ricoh Co Ltd | 定電圧回路 |
US9523722B2 (en) * | 2014-06-02 | 2016-12-20 | Winbond Electronics Corporation | Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device |
FR3042876B1 (fr) | 2015-10-27 | 2017-12-15 | STMicroelectronics (Alps) SAS | Detection de perturbations d'une alimentation |
-
2020
- 2020-02-13 FR FR2001419A patent/FR3107357B1/fr active Active
- 2020-12-16 US US17/123,210 patent/US11460515B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
FR3107357A1 (fr) | 2021-08-20 |
US20210270909A1 (en) | 2021-09-02 |
US11460515B2 (en) | 2022-10-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 2 |
|
PLSC | Publication of the preliminary search report |
Effective date: 20210820 |
|
PLFP | Fee payment |
Year of fee payment: 3 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |