FR3006758B1 - Dispositif optique integre de mesure sans contact d'altitudes et d'epaisseurs - Google Patents
Dispositif optique integre de mesure sans contact d'altitudes et d'epaisseursInfo
- Publication number
- FR3006758B1 FR3006758B1 FR1301271A FR1301271A FR3006758B1 FR 3006758 B1 FR3006758 B1 FR 3006758B1 FR 1301271 A FR1301271 A FR 1301271A FR 1301271 A FR1301271 A FR 1301271A FR 3006758 B1 FR3006758 B1 FR 3006758B1
- Authority
- FR
- France
- Prior art keywords
- altitudes
- thicknesses
- optical device
- integrated optical
- contact measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005259 measurement Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1301271A FR3006758B1 (fr) | 2013-06-05 | 2013-06-05 | Dispositif optique integre de mesure sans contact d'altitudes et d'epaisseurs |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1301271A FR3006758B1 (fr) | 2013-06-05 | 2013-06-05 | Dispositif optique integre de mesure sans contact d'altitudes et d'epaisseurs |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3006758A1 FR3006758A1 (fr) | 2014-12-12 |
FR3006758B1 true FR3006758B1 (fr) | 2016-05-06 |
Family
ID=49949703
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1301271A Expired - Fee Related FR3006758B1 (fr) | 2013-06-05 | 2013-06-05 | Dispositif optique integre de mesure sans contact d'altitudes et d'epaisseurs |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR3006758B1 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109073369A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于以可变空间分辨率对晶片等对象进行2d/3d检测的共焦色差装置和方法 |
DE102021106766A1 (de) | 2021-03-19 | 2022-09-22 | Precitec Optronik Gmbh | Chromatisch-konfokales Messsystem für Hochgeschwindigkeits-Abstandsmessung |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3222964B1 (fr) * | 2016-03-25 | 2020-01-15 | Fogale Nanotech | Dispositif et procédé confocal chromatique pour l'inspection 2d/3d d'un objet tel qu'une plaquette |
EP3431918B1 (fr) * | 2017-07-20 | 2021-03-31 | Fogale Nanotech | Capteur confocal multicanal et procédé associé permettant d'inspecter un échantillon |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI432698B (zh) * | 2006-07-11 | 2014-04-01 | Camtek Ltd | 用於探針標記分析之系統及方法 |
DE102007019267A1 (de) * | 2007-04-24 | 2008-10-30 | Degudent Gmbh | Messanordnung sowie Verfahren zum dreidimensionalen Messen eines Objekts |
TWI414817B (zh) * | 2010-07-23 | 2013-11-11 | Univ Nat Taipei Technology | 線型彩色共焦顯微系統 |
-
2013
- 2013-06-05 FR FR1301271A patent/FR3006758B1/fr not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109073369A (zh) * | 2016-03-25 | 2018-12-21 | Fogale 纳米技术公司 | 用于以可变空间分辨率对晶片等对象进行2d/3d检测的共焦色差装置和方法 |
DE102021106766A1 (de) | 2021-03-19 | 2022-09-22 | Precitec Optronik Gmbh | Chromatisch-konfokales Messsystem für Hochgeschwindigkeits-Abstandsmessung |
WO2022194670A1 (fr) | 2021-03-19 | 2022-09-22 | Precitec Optronik Gmbh | Système de mesure confocale chromatique pour la mesure de distance à grande vitesse |
KR20230157493A (ko) | 2021-03-19 | 2023-11-16 | 프레시텍 옵트로닉 게엠베하 | 고속 거리 측정을 위한 색채 공초점 측정 시스템 |
Also Published As
Publication number | Publication date |
---|---|
FR3006758A1 (fr) | 2014-12-12 |
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Legal Events
Date | Code | Title | Description |
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PLFP | Fee payment |
Year of fee payment: 3 |
|
ST | Notification of lapse |
Effective date: 20150227 |
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RN | Application for restoration |
Effective date: 20150324 |
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FC | Decision of inpi director general to approve request for restoration |
Effective date: 20150414 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |
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PLFP | Fee payment |
Year of fee payment: 6 |
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PLFP | Fee payment |
Year of fee payment: 8 |
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PLFP | Fee payment |
Year of fee payment: 10 |
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PLFP | Fee payment |
Year of fee payment: 11 |
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PLFP | Fee payment |
Year of fee payment: 12 |