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FR2942349B1 - Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron - Google Patents

Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron

Info

Publication number
FR2942349B1
FR2942349B1 FR0950955A FR0950955A FR2942349B1 FR 2942349 B1 FR2942349 B1 FR 2942349B1 FR 0950955 A FR0950955 A FR 0950955A FR 0950955 A FR0950955 A FR 0950955A FR 2942349 B1 FR2942349 B1 FR 2942349B1
Authority
FR
France
Prior art keywords
reflectron
analysis device
mass analysis
wide angular
angular acceptance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0950955A
Other languages
English (en)
Other versions
FR2942349A1 (fr
Inventor
Mikhail Yavor
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cameca SAS
Original Assignee
Cameca SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cameca SAS filed Critical Cameca SAS
Priority to FR0950955A priority Critical patent/FR2942349B1/fr
Priority to JP2011549575A priority patent/JP2012518246A/ja
Priority to PCT/EP2010/051764 priority patent/WO2010092141A1/fr
Priority to EP20100703478 priority patent/EP2396806B1/fr
Priority to US13/201,323 priority patent/US8502139B2/en
Publication of FR2942349A1 publication Critical patent/FR2942349A1/fr
Application granted granted Critical
Publication of FR2942349B1 publication Critical patent/FR2942349B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
FR0950955A 2009-02-13 2009-02-13 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron Expired - Fee Related FR2942349B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0950955A FR2942349B1 (fr) 2009-02-13 2009-02-13 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron
JP2011549575A JP2012518246A (ja) 2009-02-13 2010-02-12 リフレクトロンを含む広い角度受け入れを有する質量分析装置
PCT/EP2010/051764 WO2010092141A1 (fr) 2009-02-13 2010-02-12 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron
EP20100703478 EP2396806B1 (fr) 2009-02-13 2010-02-12 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron
US13/201,323 US8502139B2 (en) 2009-02-13 2010-02-12 Mass analysis device with wide angular acceptance including a reflectron

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0950955A FR2942349B1 (fr) 2009-02-13 2009-02-13 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron

Publications (2)

Publication Number Publication Date
FR2942349A1 FR2942349A1 (fr) 2010-08-20
FR2942349B1 true FR2942349B1 (fr) 2012-04-27

Family

ID=41009757

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0950955A Expired - Fee Related FR2942349B1 (fr) 2009-02-13 2009-02-13 Dispositif d'analyse de masse a large acceptance angulaire comprenant un reflectron

Country Status (5)

Country Link
US (1) US8502139B2 (fr)
EP (1) EP2396806B1 (fr)
JP (1) JP2012518246A (fr)
FR (1) FR2942349B1 (fr)
WO (1) WO2010092141A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8642951B2 (en) * 2011-05-04 2014-02-04 Agilent Technologies, Inc. Device, system, and method for reflecting ions
DE112012004503B4 (de) * 2011-10-28 2018-09-20 Leco Corporation Elektrostatische Ionenspiegel
US9627190B2 (en) * 2015-03-27 2017-04-18 Agilent Technologies, Inc. Energy resolved time-of-flight mass spectrometry
US10614995B2 (en) 2016-06-27 2020-04-07 Cameca Instruments, Inc. Atom probe with vacuum differential

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56141159A (en) * 1980-04-04 1981-11-04 Shimadzu Corp Electronic energy analyzer
JPH0665022B2 (ja) * 1986-06-11 1994-08-22 株式会社島津製作所 飛行時間型質量分析計
JPH0789476B2 (ja) * 1986-12-08 1995-09-27 株式会社島津製作所 飛行時間型質量分析計
US5017780A (en) * 1989-09-20 1991-05-21 Roland Kutscher Ion reflector
JPH0815188A (ja) * 1995-07-14 1996-01-19 Hitachi Ltd 表面分析装置
US6518569B1 (en) * 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers
US7091479B2 (en) * 2000-05-30 2006-08-15 The Johns Hopkins University Threat identification in time of flight mass spectrometry using maximum likelihood
WO2001092863A2 (fr) * 2000-05-30 2001-12-06 The Johns Hopkins University Systeme portatif de spectrometrie de masse a temps de vol
JP2003014606A (ja) * 2001-07-03 2003-01-15 Jeol Ltd アトムプローブ電界イオン顕微鏡
US6717135B2 (en) * 2001-10-12 2004-04-06 Agilent Technologies, Inc. Ion mirror for time-of-flight mass spectrometer
GB2390740A (en) * 2002-04-23 2004-01-14 Thermo Electron Corp Spectroscopic analyser for surface analysis and method therefor
WO2003107387A1 (fr) * 2002-05-30 2003-12-24 The Johns Hopkins University Spectrometre de masse a temps de vol non lineaire
JP4176532B2 (ja) * 2002-09-10 2008-11-05 キヤノンアネルバ株式会社 反射型イオン付着質量分析装置
US7087897B2 (en) * 2003-03-11 2006-08-08 Waters Investments Limited Mass spectrometer
WO2005122210A1 (fr) * 2004-06-03 2005-12-22 Imago Scientific Instruments Corporation Procedes de sonde atomique laser
EP1880406B1 (fr) * 2005-05-11 2019-07-03 Imago Scientific Instruments Corporation Reflectron
WO2006120148A2 (fr) 2005-05-13 2006-11-16 Huntsman Advanced Materials (Switzerland) Gmbh Melanges de colorants
WO2006134380A2 (fr) * 2005-06-17 2006-12-21 Imago Scientific Instruments Corporation Sonde atomique
JP5032076B2 (ja) * 2006-09-12 2012-09-26 株式会社テクノフロント 質量分析装置

Also Published As

Publication number Publication date
EP2396806B1 (fr) 2015-04-29
US8502139B2 (en) 2013-08-06
WO2010092141A1 (fr) 2010-08-19
EP2396806A1 (fr) 2011-12-21
US20110303841A1 (en) 2011-12-15
JP2012518246A (ja) 2012-08-09
FR2942349A1 (fr) 2010-08-20

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Year of fee payment: 8

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Effective date: 20171031