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FR2874262B1 - MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM. - Google Patents

MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM.

Info

Publication number
FR2874262B1
FR2874262B1 FR0451826A FR0451826A FR2874262B1 FR 2874262 B1 FR2874262 B1 FR 2874262B1 FR 0451826 A FR0451826 A FR 0451826A FR 0451826 A FR0451826 A FR 0451826A FR 2874262 B1 FR2874262 B1 FR 2874262B1
Authority
FR
France
Prior art keywords
measurement
opique
characterization
materials
implemented
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0451826A
Other languages
French (fr)
Other versions
FR2874262A1 (en
Inventor
Stephane Perquis
Sylvain Perrot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
COLORDIMENSIONS SARL
Original Assignee
COLORDIMENSIONS SARL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by COLORDIMENSIONS SARL filed Critical COLORDIMENSIONS SARL
Priority to FR0451826A priority Critical patent/FR2874262B1/en
Priority to PCT/FR2005/050660 priority patent/WO2006018588A1/en
Publication of FR2874262A1 publication Critical patent/FR2874262A1/en
Application granted granted Critical
Publication of FR2874262B1 publication Critical patent/FR2874262B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR0451826A 2004-08-10 2004-08-10 MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM. Expired - Fee Related FR2874262B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0451826A FR2874262B1 (en) 2004-08-10 2004-08-10 MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM.
PCT/FR2005/050660 WO2006018588A1 (en) 2004-08-10 2005-08-08 Measuring system for optically characterising materials and method of measurement used by said system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0451826A FR2874262B1 (en) 2004-08-10 2004-08-10 MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM.

Publications (2)

Publication Number Publication Date
FR2874262A1 FR2874262A1 (en) 2006-02-17
FR2874262B1 true FR2874262B1 (en) 2006-11-10

Family

ID=34948862

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0451826A Expired - Fee Related FR2874262B1 (en) 2004-08-10 2004-08-10 MEASUREMENT SYSTEM FOR THE OPIQUE CHARACTERIZATION OF MATERIALS AND METHOD OF MEASUREMENT IMPLEMENTED BY SAID SYSTEM.

Country Status (2)

Country Link
FR (1) FR2874262B1 (en)
WO (1) WO2006018588A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5480055B2 (en) * 2010-07-29 2014-04-23 株式会社島津製作所 Diffuse reflection measuring device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01202641A (en) * 1988-02-09 1989-08-15 Fuji Photo Film Co Ltd Method and apparatus for quantitatively measuring material existing on printing plate of lithographic printing block
CH686265A5 (en) * 1993-03-26 1996-02-15 Liconic Ag Optical surface inspection device for microelectronics ind.
JP3593375B2 (en) * 1995-02-07 2004-11-24 株式会社日立製作所 Micro defect detection method and device
US5637873A (en) * 1995-06-07 1997-06-10 The Boeing Company Directional reflectometer for measuring optical bidirectional reflectance
JPH1164788A (en) * 1997-08-27 1999-03-05 Minolta Co Ltd Illumination optical device and projection optical device
US6987568B2 (en) * 2000-11-15 2006-01-17 Rutgers, The State University Of New Jersey Apparatus and method for measuring spatially varying bidirectional reflectance distribution function
DE10143602B4 (en) * 2001-09-06 2007-08-23 Display-Messtechnik & Systeme Gmbh & Co.Kg Device for the metrological evaluation of reflective objects, in particular of reflective displays

Also Published As

Publication number Publication date
FR2874262A1 (en) 2006-02-17
WO2006018588A1 (en) 2006-02-23

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20110502