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FR2337329A1 - Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point - Google Patents

Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point

Info

Publication number
FR2337329A1
FR2337329A1 FR7539971A FR7539971A FR2337329A1 FR 2337329 A1 FR2337329 A1 FR 2337329A1 FR 7539971 A FR7539971 A FR 7539971A FR 7539971 A FR7539971 A FR 7539971A FR 2337329 A1 FR2337329 A1 FR 2337329A1
Authority
FR
France
Prior art keywords
optical
tested object
reference point
projects
grid patterns
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7539971A
Other languages
French (fr)
Other versions
FR2337329B1 (en
Inventor
Dimitri Paraskevas
Pierre Couderc
Alain L Hermite
Jacques Guinet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Electro Mecanique SA
Original Assignee
Compagnie Electro Mecanique SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Electro Mecanique SA filed Critical Compagnie Electro Mecanique SA
Priority to FR7539971A priority Critical patent/FR2337329A1/en
Priority to DE19762648772 priority patent/DE2648772A1/en
Priority to SU762428504A priority patent/SU677683A3/en
Priority to JP15610476A priority patent/JPS5283247A/en
Priority to DD19665976A priority patent/DD127764A5/en
Publication of FR2337329A1 publication Critical patent/FR2337329A1/en
Application granted granted Critical
Publication of FR2337329B1 publication Critical patent/FR2337329B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
  • Control Of Position, Course, Altitude, Or Attitude Of Moving Bodies (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Images of two grid patterns are produced on the tested object by two light beams (13,14) and two optical systems in a fixed position w.r.t. a reference point which defines the reference object position. The optical axes converge towards the reference object (2). The second grid pattern (8) is the image of the first pattern produced by the first optical system on the reference object, and projected from there on the tested object (9) by the second optical system. The first grid pattern (5) consists of opaque zones arranged in a chess-board pattern. Two light beams of different colours are used and kept separated by corresponding filters (11,12).
FR7539971A 1975-12-29 1975-12-29 Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point Granted FR2337329A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR7539971A FR2337329A1 (en) 1975-12-29 1975-12-29 Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point
DE19762648772 DE2648772A1 (en) 1975-12-29 1976-10-27 METHOD AND DEVICE FOR OPTICAL COMPARISON OF THE SPACE COORDINATES OF SURFACE POINTS OF SEVERAL THREE-DIMENSIONAL BODIES
SU762428504A SU677683A3 (en) 1975-12-29 1976-12-16 Method of determining the shape of a monitored object
JP15610476A JPS5283247A (en) 1975-12-29 1976-12-24 Optically comparing method and device
DD19665976A DD127764A5 (en) 1975-12-29 1976-12-28 METHOD AND DEVICE FOR THE OPTICAL COMPARISON OF THE ROOM COORDINATES OF SURFACES OF SEVERAL THREE-DIMENSIONAL KOERPERS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7539971A FR2337329A1 (en) 1975-12-29 1975-12-29 Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point

Publications (2)

Publication Number Publication Date
FR2337329A1 true FR2337329A1 (en) 1977-07-29
FR2337329B1 FR2337329B1 (en) 1978-07-28

Family

ID=9164259

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7539971A Granted FR2337329A1 (en) 1975-12-29 1975-12-29 Optical comparator for spatial coordinates - projects two grid patterns on surface of tested object from optical systems fixed w.r.t. reference point

Country Status (5)

Country Link
JP (1) JPS5283247A (en)
DD (1) DD127764A5 (en)
DE (1) DE2648772A1 (en)
FR (1) FR2337329A1 (en)
SU (1) SU677683A3 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2491614A1 (en) * 1980-10-08 1982-04-09 Couturier Alain METHOD FOR POSITIONING REFERENCE POINTS ON AN ADJUSTABLE TEMPLATE
EP0078062A1 (en) * 1981-10-28 1983-05-04 Tokyo Kogaku Kikai Kabushiki Kaisha Curvature measuring apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL9200071A (en) * 1992-01-15 1993-08-02 Stichting Science Park Maastri DEVICE FOR DETERMINING THE TOPOGRAPHY OF A CURVED SURFACE.

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5256558A (en) * 1975-11-04 1977-05-10 Nippon Telegr & Teleph Corp <Ntt> Three-dimentional object measuring system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2491614A1 (en) * 1980-10-08 1982-04-09 Couturier Alain METHOD FOR POSITIONING REFERENCE POINTS ON AN ADJUSTABLE TEMPLATE
EP0078062A1 (en) * 1981-10-28 1983-05-04 Tokyo Kogaku Kikai Kabushiki Kaisha Curvature measuring apparatus

Also Published As

Publication number Publication date
FR2337329B1 (en) 1978-07-28
SU677683A3 (en) 1979-07-30
JPS5283247A (en) 1977-07-12
DD127764A5 (en) 1977-10-12
DE2648772A1 (en) 1977-07-14

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Legal Events

Date Code Title Description
GC Lien (pledge) constituted
TP Transmission of property
ST Notification of lapse