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FR2347677A1 - Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge - Google Patents

Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge

Info

Publication number
FR2347677A1
FR2347677A1 FR7710321A FR7710321A FR2347677A1 FR 2347677 A1 FR2347677 A1 FR 2347677A1 FR 7710321 A FR7710321 A FR 7710321A FR 7710321 A FR7710321 A FR 7710321A FR 2347677 A1 FR2347677 A1 FR 2347677A1
Authority
FR
France
Prior art keywords
measuring
film
infrared radiation
infrared
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7710321A
Other languages
English (en)
Other versions
FR2347677B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Industrial Nucleonics Corp
Original Assignee
Industrial Nucleonics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Nucleonics Corp filed Critical Industrial Nucleonics Corp
Publication of FR2347677A1 publication Critical patent/FR2347677A1/fr
Application granted granted Critical
Publication of FR2347677B1 publication Critical patent/FR2347677B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FR7710321A 1976-04-05 1977-04-05 Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge Granted FR2347677A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/673,534 US4027161A (en) 1976-04-05 1976-04-05 Minimizing wave interference effects on the measurement of thin films having specular surfaces using infrared radiation

Publications (2)

Publication Number Publication Date
FR2347677A1 true FR2347677A1 (fr) 1977-11-04
FR2347677B1 FR2347677B1 (fr) 1982-01-29

Family

ID=24703045

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7710321A Granted FR2347677A1 (fr) 1976-04-05 1977-04-05 Procede et dispositif de mesure de caracteristiques d'un film par rayonnement infrarouge

Country Status (7)

Country Link
US (1) US4027161A (fr)
CA (1) CA1080504A (fr)
DE (1) DE2714397A1 (fr)
FR (1) FR2347677A1 (fr)
GB (1) GB1573263A (fr)
IT (1) IT1076132B (fr)
SE (2) SE439376B (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2419507A1 (fr) * 1978-03-10 1979-10-05 Asahi Dow Ltd Procede et installations pour mesurer les epaisseurs des couches d'une pellicule a plusieurs couches

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5535214A (en) * 1978-09-04 1980-03-12 Asahi Chem Ind Co Ltd Method and device for film-thickness measurement making use of infrared-ray interference
GB2046432B (en) * 1979-04-09 1983-05-11 Infrared Eng Ltd Apparatus for determining the thickness moisture content or other parameter of a film or coating
JPS57101709A (en) * 1980-12-17 1982-06-24 Fuji Electric Co Ltd Film thickness gauge with infrared ray
US4422766A (en) * 1981-07-27 1983-12-27 Ppg Industries, Inc. Method of and device for reducing apparatus response time during the testing for moisture content in moving spaced plastic sheets
FI69370C (fi) * 1981-08-18 1986-01-10 Topwave Instr Oy Foerfarande foer maetning av egenskaperna hos ett plastskikt med hjaelp av infraroed straolning
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
JPS62232506A (ja) * 1986-04-01 1987-10-13 Chugai Ro Kogyo Kaisha Ltd 表面層厚測定装置
US4733078A (en) * 1986-08-25 1988-03-22 Accuray Corporation Measurement of moisture-stratified sheet material
US4823008A (en) * 1987-11-05 1989-04-18 Process Automation Business, Inc. Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper
CA2038704C (fr) * 1990-04-26 1996-01-30 Ryuji Chiba Appareil mesurant la teneur en humidite au moyen de rayons infrarouges
US5506407A (en) * 1993-12-21 1996-04-09 Minnesota Mining & Manufacturing Company High resolution high speed film measuring apparatus and method
US6043873A (en) * 1997-01-10 2000-03-28 Advanced Optical Technologies, Llc Position tracking system
US6238077B1 (en) 1996-01-23 2001-05-29 Advanced Optical Technologies, L.L.C. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US5705804A (en) * 1996-01-23 1998-01-06 Science Applications International Corporation Quadrant light detector
US5773819A (en) * 1996-01-23 1998-06-30 Advanced Optical Technologies, Llc. Single element light detector
US5733028A (en) * 1996-01-23 1998-03-31 Advanced Optical Technologies, Llc. Apparatus for projecting electromagnetic radiation with a tailored intensity distribution
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102006057727A1 (de) * 2006-12-07 2008-06-12 Brückner Maschinenbau GmbH Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung
DE102015102997A1 (de) * 2015-03-02 2016-09-08 BST ProControl GmbH Verfahren und Vorrichtung zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2821103A (en) * 1952-10-30 1958-01-28 Centre Nat Rech Scient Micro-photometry
US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3476482A (en) * 1967-09-27 1969-11-04 Conrac Corp Opacimeter for comparing light from different areas of sample sheet
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1382081A (en) * 1972-03-14 1975-01-29 Ici Ltd Transmission spectra
US3863071A (en) * 1972-06-08 1975-01-28 Infra Systems Inc Infrared measuring system with channel spectra negation
US3870884A (en) * 1973-08-24 1975-03-11 Infra Systems Inc Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2821103A (en) * 1952-10-30 1958-01-28 Centre Nat Rech Scient Micro-photometry
US3455637A (en) * 1964-08-07 1969-07-15 Giannini Controls Corp Method and apparatus for measuring the opacity of sheet material
US3476482A (en) * 1967-09-27 1969-11-04 Conrac Corp Opacimeter for comparing light from different areas of sample sheet
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2419507A1 (fr) * 1978-03-10 1979-10-05 Asahi Dow Ltd Procede et installations pour mesurer les epaisseurs des couches d'une pellicule a plusieurs couches

Also Published As

Publication number Publication date
SE7703750L (sv) 1977-10-06
SE439376B (sv) 1985-06-10
DE2714397A1 (de) 1977-10-13
SE8104527L (sv) 1981-07-24
CA1080504A (fr) 1980-07-01
FR2347677B1 (fr) 1982-01-29
US4027161A (en) 1977-05-31
SE447164B (sv) 1986-10-27
GB1573263A (en) 1980-08-20
IT1076132B (it) 1985-04-24

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Legal Events

Date Code Title Description
ST Notification of lapse