FR2240525B3 - - Google Patents
Info
- Publication number
- FR2240525B3 FR2240525B3 FR7427619A FR7427619A FR2240525B3 FR 2240525 B3 FR2240525 B3 FR 2240525B3 FR 7427619 A FR7427619 A FR 7427619A FR 7427619 A FR7427619 A FR 7427619A FR 2240525 B3 FR2240525 B3 FR 2240525B3
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19732340372 DE2340372A1 (de) | 1973-08-09 | 1973-08-09 | Doppelfokussierendes massenspektrometer hoher eingangsapertur |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2240525A1 FR2240525A1 (fr) | 1975-03-07 |
FR2240525B3 true FR2240525B3 (fr) | 1977-06-03 |
Family
ID=5889327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7427619A Expired FR2240525B3 (fr) | 1973-08-09 | 1974-08-08 |
Country Status (4)
Country | Link |
---|---|
US (1) | US3949221A (fr) |
DE (1) | DE2340372A1 (fr) |
FR (1) | FR2240525B3 (fr) |
GB (1) | GB1440727A (fr) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IE58049B1 (en) * | 1985-05-21 | 1993-06-16 | Tekscan Ltd | Surface analysis microscopy apparatus |
US4719349A (en) * | 1986-05-27 | 1988-01-12 | The United States Of America As Represented By The Department Of Health And Human Services | Electrochemical sample probe for use in fast-atom bombardment mass spectrometry |
US4806754A (en) * | 1987-06-19 | 1989-02-21 | The Perkin-Elmer Corporation | High luminosity spherical analyzer for charged particles |
US6184523B1 (en) | 1998-07-14 | 2001-02-06 | Board Of Regents Of The University Of Nebraska | High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use |
FR2790596B3 (fr) * | 1999-03-03 | 2001-05-18 | Robert Evrard | Source d'ions selective de tres grande intensite |
FR2806527B1 (fr) * | 2000-03-20 | 2002-10-25 | Schlumberger Technologies Inc | Colonne a focalisation simultanee d'un faisceau de particules et d'un faisceau optique |
US8013290B2 (en) * | 2006-07-31 | 2011-09-06 | Bruker Daltonik Gmbh | Method and apparatus for avoiding undesirable mass dispersion of ions in flight |
US8642959B2 (en) * | 2007-10-29 | 2014-02-04 | Micron Technology, Inc. | Method and system of performing three-dimensional imaging using an electron microscope |
US7919748B2 (en) * | 2009-03-31 | 2011-04-05 | Agilent Technologies, Inc. | Cylindrical geometry time-of-flight mass spectrometer |
US8431887B2 (en) * | 2009-03-31 | 2013-04-30 | Agilent Technologies, Inc. | Central lens for cylindrical geometry time-of-flight mass spectrometer |
US8330099B2 (en) | 2011-01-31 | 2012-12-11 | Agilent Technologies, Inc. | Mass spectrometer and mass analyzer comprising pulser |
US8723114B2 (en) * | 2011-11-17 | 2014-05-13 | National University Of Singapore | Sequential radial mirror analyser |
WO2017075470A1 (fr) * | 2015-10-28 | 2017-05-04 | Duke University | Spectromètres de masse à électrodes segmentées et procédés associés |
CN114496715B (zh) * | 2022-01-14 | 2024-07-19 | 天津大学 | 一种基于静电储存环的深能级光电子能谱研究装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3617741A (en) * | 1969-09-02 | 1971-11-02 | Hewlett Packard Co | Electron spectroscopy system with a multiple electrode electron lens |
DE2031811B2 (de) * | 1970-06-26 | 1980-09-25 | Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen | Doppelfokussierendes stigmatisch abbildendes Massenspektrometer |
-
1973
- 1973-08-09 DE DE19732340372 patent/DE2340372A1/de active Pending
-
1974
- 1974-08-05 GB GB3445374A patent/GB1440727A/en not_active Expired
- 1974-08-06 US US05/495,248 patent/US3949221A/en not_active Expired - Lifetime
- 1974-08-08 FR FR7427619A patent/FR2240525B3/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2240525A1 (fr) | 1975-03-07 |
US3949221A (en) | 1976-04-06 |
DE2340372A1 (de) | 1975-02-20 |
GB1440727A (en) | 1976-06-23 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |