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FR2240525B3 - - Google Patents

Info

Publication number
FR2240525B3
FR2240525B3 FR7427619A FR7427619A FR2240525B3 FR 2240525 B3 FR2240525 B3 FR 2240525B3 FR 7427619 A FR7427619 A FR 7427619A FR 7427619 A FR7427619 A FR 7427619A FR 2240525 B3 FR2240525 B3 FR 2240525B3
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7427619A
Other versions
FR2240525A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Original Assignee
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft zur Foerderung der Wissenschaften eV filed Critical Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Publication of FR2240525A1 publication Critical patent/FR2240525A1/fr
Application granted granted Critical
Publication of FR2240525B3 publication Critical patent/FR2240525B3/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7427619A 1973-08-09 1974-08-08 Expired FR2240525B3 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19732340372 DE2340372A1 (de) 1973-08-09 1973-08-09 Doppelfokussierendes massenspektrometer hoher eingangsapertur

Publications (2)

Publication Number Publication Date
FR2240525A1 FR2240525A1 (fr) 1975-03-07
FR2240525B3 true FR2240525B3 (fr) 1977-06-03

Family

ID=5889327

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7427619A Expired FR2240525B3 (fr) 1973-08-09 1974-08-08

Country Status (4)

Country Link
US (1) US3949221A (fr)
DE (1) DE2340372A1 (fr)
FR (1) FR2240525B3 (fr)
GB (1) GB1440727A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IE58049B1 (en) * 1985-05-21 1993-06-16 Tekscan Ltd Surface analysis microscopy apparatus
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
US4806754A (en) * 1987-06-19 1989-02-21 The Perkin-Elmer Corporation High luminosity spherical analyzer for charged particles
US6184523B1 (en) 1998-07-14 2001-02-06 Board Of Regents Of The University Of Nebraska High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use
FR2790596B3 (fr) * 1999-03-03 2001-05-18 Robert Evrard Source d'ions selective de tres grande intensite
FR2806527B1 (fr) * 2000-03-20 2002-10-25 Schlumberger Technologies Inc Colonne a focalisation simultanee d'un faisceau de particules et d'un faisceau optique
US8013290B2 (en) * 2006-07-31 2011-09-06 Bruker Daltonik Gmbh Method and apparatus for avoiding undesirable mass dispersion of ions in flight
US8642959B2 (en) * 2007-10-29 2014-02-04 Micron Technology, Inc. Method and system of performing three-dimensional imaging using an electron microscope
US7919748B2 (en) * 2009-03-31 2011-04-05 Agilent Technologies, Inc. Cylindrical geometry time-of-flight mass spectrometer
US8431887B2 (en) * 2009-03-31 2013-04-30 Agilent Technologies, Inc. Central lens for cylindrical geometry time-of-flight mass spectrometer
US8330099B2 (en) 2011-01-31 2012-12-11 Agilent Technologies, Inc. Mass spectrometer and mass analyzer comprising pulser
US8723114B2 (en) * 2011-11-17 2014-05-13 National University Of Singapore Sequential radial mirror analyser
WO2017075470A1 (fr) * 2015-10-28 2017-05-04 Duke University Spectromètres de masse à électrodes segmentées et procédés associés
CN114496715B (zh) * 2022-01-14 2024-07-19 天津大学 一种基于静电储存环的深能级光电子能谱研究装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617741A (en) * 1969-09-02 1971-11-02 Hewlett Packard Co Electron spectroscopy system with a multiple electrode electron lens
DE2031811B2 (de) * 1970-06-26 1980-09-25 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen Doppelfokussierendes stigmatisch abbildendes Massenspektrometer

Also Published As

Publication number Publication date
FR2240525A1 (fr) 1975-03-07
US3949221A (en) 1976-04-06
DE2340372A1 (de) 1975-02-20
GB1440727A (en) 1976-06-23

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Legal Events

Date Code Title Description
ST Notification of lapse