FR1505821A - Micro-conducteur-coaxial - Google Patents
Micro-conducteur-coaxialInfo
- Publication number
- FR1505821A FR1505821A FR8214A FR06008214A FR1505821A FR 1505821 A FR1505821 A FR 1505821A FR 8214 A FR8214 A FR 8214A FR 06008214 A FR06008214 A FR 06008214A FR 1505821 A FR1505821 A FR 1505821A
- Authority
- FR
- France
- Prior art keywords
- coaxial
- conductor
- micro
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US516465A US3361865A (en) | 1965-12-27 | 1965-12-27 | Coaxial micro probe |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1505821A true FR1505821A (fr) | 1967-12-15 |
Family
ID=24055723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8214A Expired FR1505821A (fr) | 1965-12-27 | 1966-12-08 | Micro-conducteur-coaxial |
Country Status (3)
Country | Link |
---|---|
US (1) | US3361865A (fr) |
FR (1) | FR1505821A (fr) |
GB (1) | GB1145558A (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1291076A (en) * | 1969-12-10 | 1972-09-27 | Beta Instr Company Ltd | A rotary high current pick-off |
US3806801A (en) * | 1972-12-26 | 1974-04-23 | Ibm | Probe contactor having buckling beam probes |
FR2498818B1 (fr) * | 1981-01-27 | 1985-07-26 | Electricite De France | Composant electronique inductif pour hautes frequences |
DE3620947A1 (de) * | 1986-06-23 | 1988-01-07 | Feinmetall Gmbh | Kontaktelement fuer pruefkarten |
US4812745A (en) * | 1987-05-29 | 1989-03-14 | Teradyne, Inc. | Probe for testing electronic components |
WO2011072286A1 (fr) * | 2009-12-11 | 2011-06-16 | Keith Leonard March | Fils de dispositif biomédical implantable comprenant des conducteurs liquides |
-
1965
- 1965-12-27 US US516465A patent/US3361865A/en not_active Expired - Lifetime
-
1966
- 1966-12-08 FR FR8214A patent/FR1505821A/fr not_active Expired
- 1966-12-16 GB GB56372/66A patent/GB1145558A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US3361865A (en) | 1968-01-02 |
GB1145558A (en) | 1969-03-19 |
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