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ES551152A0 - Metodo para formar un calibrador de la deformacion. - Google Patents

Metodo para formar un calibrador de la deformacion.

Info

Publication number
ES551152A0
ES551152A0 ES551152A ES551152A ES551152A0 ES 551152 A0 ES551152 A0 ES 551152A0 ES 551152 A ES551152 A ES 551152A ES 551152 A ES551152 A ES 551152A ES 551152 A0 ES551152 A0 ES 551152A0
Authority
ES
Spain
Prior art keywords
film
strain
calibrator
deformation
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES551152A
Other languages
English (en)
Other versions
ES8802344A1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia Spain SA
Original Assignee
Alcatel Standard Electrics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Standard Electrics SA filed Critical Alcatel Standard Electrics SA
Publication of ES8802344A1 publication Critical patent/ES8802344A1/es
Publication of ES551152A0 publication Critical patent/ES551152A0/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/24—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/12—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/12—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • G01L1/125—Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress by using magnetostrictive means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Fire-Detection Mechanisms (AREA)
ES551152A 1985-01-23 1986-01-23 Metodo para formar un calibrador de la deformacion. Expired ES8802344A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19853502008 DE3502008A1 (de) 1985-01-23 1985-01-23 Dehnungsaufnehmer

Publications (2)

Publication Number Publication Date
ES8802344A1 ES8802344A1 (es) 1988-05-01
ES551152A0 true ES551152A0 (es) 1988-05-01

Family

ID=6260453

Family Applications (1)

Application Number Title Priority Date Filing Date
ES551152A Expired ES8802344A1 (es) 1985-01-23 1986-01-23 Metodo para formar un calibrador de la deformacion.

Country Status (7)

Country Link
US (2) US4782705A (es)
EP (1) EP0189825B1 (es)
JP (1) JPS61181902A (es)
AT (1) ATE74205T1 (es)
CA (1) CA1255922A (es)
DE (2) DE3502008A1 (es)
ES (1) ES8802344A1 (es)

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US4979395A (en) * 1987-12-22 1990-12-25 Allied-Signal Inc. Apparatus and method of forming a magnetic domain strain gage
JPH01212301A (ja) * 1988-02-19 1989-08-25 Toshiba Corp ひずみセンサ
US5136883A (en) * 1990-08-24 1992-08-11 Jannotta Louis J Liquid level gage system
US5654900A (en) * 1991-01-10 1997-08-05 Ratner; Leah Method of and apparatus for optimization of structures
SE9102122D0 (sv) * 1991-07-08 1991-07-08 Skf Nova Ab Sensor respektive foerfarande foer maetning av vridmoment och/eller krafter
DE4203124A1 (de) * 1992-02-04 1992-08-13 Siemens Ag Taktiler sensor
US5681998A (en) * 1992-06-09 1997-10-28 Yazaki Corporation Load measuring device for a vehicle
US5493220A (en) * 1993-03-05 1996-02-20 Northeastern University Magneto-optic Kerr effect stress sensing system
US5631559A (en) * 1993-03-05 1997-05-20 Northeastern University Method and apparatus for performing magnetic field measurements using magneto-optic kerr effect sensors
DE4408762C2 (de) * 1993-03-16 1999-02-11 Yazaki Corp Fahrzeuglastmeßvorrichtung
FR2714478B1 (fr) * 1993-12-23 1996-01-26 Thomson Csf Détecteur de champ magnétique en couches minces.
US5589770A (en) * 1994-06-27 1996-12-31 Matsushita Electric Industrial Co., Ltd. Mechanical sensor for detecting stress or distortion with high sensitivity
US5505093A (en) * 1994-11-21 1996-04-09 Brewer Science, Inc. Homogeneously conductive polymer films as strain gauges
US5856617A (en) * 1997-09-02 1999-01-05 International Business Machines Corporation Atomic force microscope system with cantilever having unbiased spin valve magnetoresistive strain gauge
US6134971A (en) * 1998-08-27 2000-10-24 University Of Hawaii Stress induced voltage fluctuation for measuring stress and strain in materials
US6579612B1 (en) 1999-06-24 2003-06-17 International Business Machines Corporation Magnetostrictive sensor structure
US6889555B1 (en) * 1999-07-20 2005-05-10 Fidelica Microsystems, Inc. Magnetoresistive semiconductor pressure sensors and fingerprint identification/verification sensors using same
US6694822B1 (en) * 1999-07-20 2004-02-24 Fidelica Microsystems, Inc. Use of multi-layer thin films as stress sensor
DE10023838C2 (de) * 2000-05-16 2002-11-28 Siemens Ag Vorrichtung zum Messen einer Wegänderung zwischen Abschnitten eines Bauteils und Verwendung dieser Vorrichtung
DE10063535C2 (de) * 2000-12-20 2003-08-14 Deutsch Zentr Luft & Raumfahrt Verfahren zur Bestimmung von veränderlichen Zustandsgrößen eines elastischen Systems
GB0107182D0 (en) * 2001-03-22 2001-05-09 Secr Defence Stress sensor
ATE476628T1 (de) * 2001-03-23 2010-08-15 Gvp Ges Zur Vermarktung Der Po Verfahren und vorrichtung zur einstellung der luftzahl
US6794862B2 (en) * 2001-05-08 2004-09-21 Ramot At Tel-Aviv University Ltd. Magnetic thin film sensor based on the extraordinary hall effect
US20040164840A1 (en) * 2003-02-21 2004-08-26 Brown University Research Foundation Extraordinary hall effect sensors and arrays
DE102004032484B3 (de) 2004-07-05 2005-11-24 Infineon Technologies Ag Sensor und Verfahren zum Herstellen eines Sensors
DE102004032482B4 (de) 2004-07-05 2008-01-31 Infineon Technologies Ag Sensor und Verfahren zum Erfassen einer Verformung
DE102004034277B4 (de) * 2004-07-15 2009-12-03 Infineon Technologies Ag Vorrichtung, insbesondere in einer integrierten Schaltungsanordnung, und Verfahren zur Erfassung eines mechanischen Stresszustands in einem Halbleitersubstrat
DE102005005354A1 (de) * 2005-02-05 2006-08-10 Bosch Rexroth Aktiengesellschaft Kraftmessvorrichtung und Dehnungsmesselement
WO2010111230A1 (en) * 2009-03-24 2010-09-30 Direct Measurements Inc. Directly applied read and transmit - digital strain encoder and digital load cell
JP5680513B2 (ja) * 2011-09-22 2015-03-04 住友重機械工業株式会社 歪センサの取り付け構造及び歪測定装置
US9394853B2 (en) 2011-10-12 2016-07-19 Orbital Atk, Inc. Strain measurement device, a solid rocket motor including same, and related methods
US9557164B2 (en) 2015-04-15 2017-01-31 General Electric Company Data acquisition devices, systems and method for analyzing strain sensors and monitoring turbine component strain
US10697760B2 (en) 2015-04-15 2020-06-30 General Electric Company Data acquisition devices, systems and method for analyzing strain sensors and monitoring component strain
US9909860B2 (en) 2015-04-15 2018-03-06 General Electric Company Systems and methods for monitoring component deformation
US9932853B2 (en) 2015-04-28 2018-04-03 General Electric Company Assemblies and methods for monitoring turbine component strain
US9933321B2 (en) * 2015-05-14 2018-04-03 Vishay Measurements Group, Inc. High gage factor strain gage
US9846933B2 (en) 2015-11-16 2017-12-19 General Electric Company Systems and methods for monitoring components
US9953408B2 (en) 2015-11-16 2018-04-24 General Electric Company Methods for monitoring components
US10012552B2 (en) * 2015-11-23 2018-07-03 General Electric Company Systems and methods for monitoring component strain
US9967523B2 (en) 2015-12-16 2018-05-08 General Electric Company Locating systems and methods for components
US9879981B1 (en) 2016-12-02 2018-01-30 General Electric Company Systems and methods for evaluating component strain
US10132615B2 (en) 2016-12-20 2018-11-20 General Electric Company Data acquisition devices, systems and method for analyzing passive strain indicators and monitoring turbine component strain
US10126119B2 (en) 2017-01-17 2018-11-13 General Electric Company Methods of forming a passive strain indicator on a preexisting component
US10872176B2 (en) 2017-01-23 2020-12-22 General Electric Company Methods of making and monitoring a component with an integral strain indicator
US11313673B2 (en) 2017-01-24 2022-04-26 General Electric Company Methods of making a component with an integral strain indicator
US10345179B2 (en) 2017-02-14 2019-07-09 General Electric Company Passive strain indicator
US10502551B2 (en) 2017-03-06 2019-12-10 General Electric Company Methods for monitoring components using micro and macro three-dimensional analysis
US10451499B2 (en) 2017-04-06 2019-10-22 General Electric Company Methods for applying passive strain indicators to components
CN108955969B (zh) * 2018-08-31 2021-03-02 纳恩博（北京）科技有限公司 电阻应变片、感应组件、力传感器和滑板

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JPS4218911B1 (es) * 1965-04-12 1967-07-26
US3807223A (en) * 1972-04-20 1974-04-30 Lignes Telegraph Telephon Stress sensor with digital output
US3943481A (en) * 1972-06-10 1976-03-09 Denki Onkyo Co., Ltd. Galvano-magnetic effect device
US3774134A (en) * 1972-12-01 1973-11-20 Honeywell Inc Antisotropic thin film plated wire magnetostrictive transducer
US3858138A (en) * 1973-03-05 1974-12-31 Rca Corp Tuneable thin film inductor
US3838595A (en) * 1973-03-16 1974-10-01 Lignes Telegraph Telephon Data acquisition circuit for a magnetostrictive digital thin film sensor
SE376077B (es) * 1973-09-13 1975-05-05 Asea Ab
US4138783A (en) * 1973-10-09 1979-02-13 Soletanche Method for measuring stresses or forces
JPS5442166A (en) * 1977-09-10 1979-04-03 Toshiba Corp Pressure transmitter
JPS54113379A (en) * 1978-02-23 1979-09-04 Nec Corp Pressure gauge
ATE7737T1 (de) * 1980-02-06 1984-06-15 Hans W. Dipl.-Phys. Keller Piezoresistive zylinderdosenartige druckmesszelle.
JPS56154637A (en) * 1980-04-30 1981-11-30 Toshiba Corp Temperature compensating circuit for pressure converter
JPS5737233A (en) * 1980-08-18 1982-03-01 Matsushita Electric Ind Co Ltd Tension sensor
US4374665A (en) * 1981-10-23 1983-02-22 The United States Of America As Represented By The Secretary Of The Navy Magnetostrictive devices
JPS5884477A (ja) * 1981-11-13 1983-05-20 Victor Co Of Japan Ltd プレ−ナ・ホ−ル素子
CA1214660A (en) * 1982-09-30 1986-12-02 Koichiro Inomata Torque sensor and method for manufacturing the same
US4763030A (en) * 1982-11-01 1988-08-09 The United States Of America As Represented By The Secretary Of The Navy Magnetomechanical energy conversion
JPS59181575A (ja) * 1983-03-31 1984-10-16 Toshiba Corp トルクセンサ
JPS5961732A (ja) * 1983-06-06 1984-04-09 Toshiba Corp トルクセンサの製造方法
US4561314A (en) * 1983-10-27 1985-12-31 General Electric Company Magnetoelastic force/pressure sensor
DE3346643A1 (de) * 1983-12-23 1985-07-04 Standard Elektrik Lorenz Ag, 7000 Stuttgart Sensor fuer magnetisierbare materialien

Also Published As

Publication number Publication date
CA1255922A (en) 1989-06-20
US4884453A (en) 1989-12-05
EP0189825A2 (de) 1986-08-06
ES8802344A1 (es) 1988-05-01
EP0189825B1 (de) 1992-03-25
EP0189825A3 (en) 1989-07-26
US4782705A (en) 1988-11-08
ATE74205T1 (de) 1992-04-15
JPS61181902A (ja) 1986-08-14
DE3684488D1 (de) 1992-04-30
DE3502008A1 (de) 1986-07-24

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20031122