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ES2669844A1 - DEVICE FOR THE CHARACTERIZATION OF REFLECTS IN THE THERMAL INFRARED SPECTRUM - Google Patents

DEVICE FOR THE CHARACTERIZATION OF REFLECTS IN THE THERMAL INFRARED SPECTRUM Download PDF

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Publication number
ES2669844A1
ES2669844A1 ES201631520A ES201631520A ES2669844A1 ES 2669844 A1 ES2669844 A1 ES 2669844A1 ES 201631520 A ES201631520 A ES 201631520A ES 201631520 A ES201631520 A ES 201631520A ES 2669844 A1 ES2669844 A1 ES 2669844A1
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ES
Spain
Prior art keywords
dome
infrared spectrum
characterization
thermal infrared
reflects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES201631520A
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Spanish (es)
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ES2669844B1 (en
Inventor
Pablo RODRÍGUEZ GONZALVEZ
Jesús FERNANDEZ HERNÁNDEZ
Diego Gonzalez Aguilera
Manuel RODRÍGUEZ MARTÍN
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Universidad de Salamanca
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Universidad de Salamanca
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Priority to ES201631520A priority Critical patent/ES2669844B1/en
Publication of ES2669844A1 publication Critical patent/ES2669844A1/en
Application granted granted Critical
Publication of ES2669844B1 publication Critical patent/ES2669844B1/en
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Aerials With Secondary Devices (AREA)
  • Radiation Pyrometers (AREA)

Abstract

Dispositivo para la caracterización de reflejos en el espectro infrarrojo térmico. La presente invención es un dispositivo (20) que comprende una cúpula (1) que a su vez comprende una estructura de baja emisividad y una pluralidad de sensores de radiación infrarroja (2) que convierten radiación infrarroja en temperatura, una base rígida (11) vinculada con la cúpula (1), que en su parte externa lateral comprende una banda cilíndrica (13) de alta emisividad y codificada mediante signos (14) de baja emisividad. Adicionalmente, el dispositivo (20) comprende un sistema de posicionamiento angular (4) emplazado en el interior de la cúpula (1), y una unidad de control (5) vinculada con el sistema de posicionamiento angular (4) y con los sensores de radiación infrarroja (2) para caracterizar los reflejos en el espectro infrarrojo térmico.Device for the characterization of reflections in the thermal infrared spectrum. The present invention is a device (20) comprising a dome (1) which in turn comprises a low-emissivity structure and a plurality of infrared radiation sensors (2) that convert infrared radiation into temperature, a rigid base (11) linked to the dome (1), which on its external side comprises a cylindrical band (13) of high emissivity and coded by signs (14) of low emissivity. Additionally, the device (20) comprises an angular positioning system (4) located inside the dome (1), and a control unit (5) linked to the angular positioning system (4) and with the sensors of infrared radiation (2) to characterize reflections in the thermal infrared spectrum.

Description

imagen1image 1

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el sistema dentro de la escena termográfica de una forma no-invasiva, ya que no requiere de contacto con el objeto de estudio para proveer de resultados y es seguro, ya que es pasivo y no emite radiación peligrosa para los usuarios. the system within the thermographic scene in a non-invasive way, since it does not require contact with the object of study to provide results and is safe, since it is passive and does not emit dangerous radiation to users.

Finalmente, este dispositivo presenta portabilidad y autonomía dado su peso reducido y su batería lo que permite poder emplearse tanto en zonas interiores y exteriores, sin reducir su alcance, ya que pueden trabajar varios de forma conjunta. Finally, this device has portability and autonomy given its reduced weight and its battery, which allows it to be used both indoors and outdoors, without reducing its range, since several can work together.

DESCRIPCIÓN DE LOS DIBUJOS DESCRIPTION OF THE DRAWINGS

Para complementar la descripción que se está realizando y con objeto de ayudar a una mejor comprensión de las características de la invención, de acuerdo con un ejemplo preferente de realización práctica de la misma, se acompaña como parte integrante de dicha descripción, un juego de dibujos en donde con carácter ilustrativo y no limitativo, se ha representado lo siguiente: To complement the description that is being made and in order to help a better understanding of the characteristics of the invention, according to a preferred example of practical implementation thereof, a set of drawings is attached as an integral part of said description. where, for illustrative and non-limiting purposes, the following has been represented:

Figura 1.- Muestra una vista frontal de la realización preferente de la invención. Figure 1.- Shows a front view of the preferred embodiment of the invention.

Figura 2.- Muestra una vista superior de la realización preferente de la invención. Figure 2.- Shows a top view of the preferred embodiment of the invention.

Figura 3.- Muestra una vista en sección vertical de la realización preferente de la invención. Figure 3.- Shows a vertical sectional view of the preferred embodiment of the invention.

Figura 4.- Muestra una vista superior de soporte rígido de la realización preferente de la invención. Figure 4.- Shows a rigid support top view of the preferred embodiment of the invention.

Figura 5.- Muestra una vista superior de una realización preferente de la invención. Figure 5.- Shows a top view of a preferred embodiment of the invention.

REALIZACIÓN PREFERENTE DE LA INVENCIÓN PREFERRED EMBODIMENT OF THE INVENTION

La presente invención es un dispositivo (20) para la caracterización y la eliminación de reflejos en el espectro infrarrojo térmico, que comprende, tal y como se muestran en la figura 1, una cúpula (1) que a su vez comprende una estructura espacial tipo “domo geodésico” de frecuencia 2 cuya superficie está recubierta de un material de baja The present invention is a device (20) for the characterization and elimination of reflections in the thermal infrared spectrum, comprising, as shown in Figure 1, a dome (1) which in turn comprises a spatial structure type “Geodesic dome” of frequency 2 whose surface is covered with a low material

8 8

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posicionados en cinco localizaciones equi-angularmente distantes alrededor de la banda cilíndrica (13), en donde cada elemento comprende un cuerpo metálico de baja emisividad, para facilitar su detección e identificación por contraste con respecto a la banda (13). El número de elementos y su disposición permite que desde cualquier punto 5 de vista se localicen al menos 2 de ellos, lo cual, junto con la disposición que generen las señales de posicionamiento del propio sistema (4), permite obtener, por cotejo de ambas fuentes de datos (posicionamiento en la escena y señales de posicionamiento del sistema), la cuantía real del giro propio de la cúpula (1) (o giro respecto a su eje) y poder así localizar con precisión la posición relativa de la cúpula (1) con respecto al sensor positioned in five equi-angularly distant locations around the cylindrical band (13), where each element comprises a metal body of low emissivity, to facilitate its detection and identification by contrast with respect to the band (13). The number of elements and their arrangement allows at least 2 of them to be located from any point of view, which, together with the arrangement generated by the positioning signals of the system itself (4), allows obtaining, by comparison of both data sources (scene positioning and system positioning signals), the actual amount of the dome's own turn (1) (or turn relative to its axis) and thus be able to accurately locate the relative position of the dome (1 ) with respect to the sensor

10 termográfico que realice la captura de la escena. 10 thermographic that captures the scene.

De este modo y gracias a la geometría semiesférica de la cúpula, la banda de posicionamiento (13) y el sistema de posicionamiento angular (4), el dispositivo (20) se puede referenciar angularmente el vector asociado a la reflexión espuria de forma pasiva. In this way and thanks to the hemispherical geometry of the dome, the positioning band (13) and the angular positioning system (4), the device (20) can be angularly referenced the vector associated with spurious reflection passively.

15 fifteen

13 13

Claims (1)

imagen1image 1 imagen2image2 imagen3image3
ES201631520A 2016-11-28 2016-11-28 DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM Active ES2669844B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES201631520A ES2669844B1 (en) 2016-11-28 2016-11-28 DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201631520A ES2669844B1 (en) 2016-11-28 2016-11-28 DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM

Publications (2)

Publication Number Publication Date
ES2669844A1 true ES2669844A1 (en) 2018-05-29
ES2669844B1 ES2669844B1 (en) 2019-03-14

Family

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ES201631520A Active ES2669844B1 (en) 2016-11-28 2016-11-28 DEVICE FOR THE CHARACTERIZATION OF REFLECTIONS IN THE THERMAL INFRARED SPECTRUM

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090294674A1 (en) * 2005-04-06 2009-12-03 Guillaume Bathelet Method and Device for Eliminating Parasite Reflections During Inspection of Translucent or Transparent Hollow Objects
WO2010089627A1 (en) * 2009-02-05 2010-08-12 Flir Systems, Inc. A fast spectral method to measure emissivity in a partially-controlled environment using a focal plane array infrared camera
US20130093883A1 (en) * 2011-10-14 2013-04-18 Microsoft Corporation Obtaining Spatially Varying Bidirectional Reflectance Distribution Function
EP2627979A1 (en) * 2010-10-14 2013-08-21 Semi-Conductor Devices - An Elbit Systems - Rafael Partnership Dewar assembly for ir detection systems
US9066028B1 (en) * 2010-01-08 2015-06-23 The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration Methods and systems for measurement and estimation of normalized contrast in infrared thermography
US20160292826A1 (en) * 2015-04-05 2016-10-06 Hema Imaging Llc Systems and Approaches for Thermal Image Corrections

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090294674A1 (en) * 2005-04-06 2009-12-03 Guillaume Bathelet Method and Device for Eliminating Parasite Reflections During Inspection of Translucent or Transparent Hollow Objects
WO2010089627A1 (en) * 2009-02-05 2010-08-12 Flir Systems, Inc. A fast spectral method to measure emissivity in a partially-controlled environment using a focal plane array infrared camera
US9066028B1 (en) * 2010-01-08 2015-06-23 The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration Methods and systems for measurement and estimation of normalized contrast in infrared thermography
EP2627979A1 (en) * 2010-10-14 2013-08-21 Semi-Conductor Devices - An Elbit Systems - Rafael Partnership Dewar assembly for ir detection systems
US20130093883A1 (en) * 2011-10-14 2013-04-18 Microsoft Corporation Obtaining Spatially Varying Bidirectional Reflectance Distribution Function
US20160292826A1 (en) * 2015-04-05 2016-10-06 Hema Imaging Llc Systems and Approaches for Thermal Image Corrections

Also Published As

Publication number Publication date
ES2669844B1 (en) 2019-03-14

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