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EP3994447A4 - Gas analyzer - Google Patents

Gas analyzer Download PDF

Info

Publication number
EP3994447A4
EP3994447A4 EP19942772.5A EP19942772A EP3994447A4 EP 3994447 A4 EP3994447 A4 EP 3994447A4 EP 19942772 A EP19942772 A EP 19942772A EP 3994447 A4 EP3994447 A4 EP 3994447A4
Authority
EP
European Patent Office
Prior art keywords
gas analyzer
analyzer
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP19942772.5A
Other languages
German (de)
French (fr)
Other versions
EP3994447A1 (en
Inventor
Tong Zhou WANG
Dong Li
Xiao Bo YANG
Chuan Yu Zhang
Yao Lei KANG
Jian Yong ZHANG
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of EP3994447A1 publication Critical patent/EP3994447A1/en
Publication of EP3994447A4 publication Critical patent/EP3994447A4/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • G01N21/276Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N2021/3509Correlation method, e.g. one beam alternating in correlator/sample field

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP19942772.5A 2019-08-23 2019-08-23 Gas analyzer Pending EP3994447A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2019/102333 WO2021035432A1 (en) 2019-08-23 2019-08-23 Gas analyzer

Publications (2)

Publication Number Publication Date
EP3994447A1 EP3994447A1 (en) 2022-05-11
EP3994447A4 true EP3994447A4 (en) 2023-04-19

Family

ID=74684850

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19942772.5A Pending EP3994447A4 (en) 2019-08-23 2019-08-23 Gas analyzer

Country Status (3)

Country Link
EP (1) EP3994447A4 (en)
CN (1) CN113767274A (en)
WO (1) WO2021035432A1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19911260A1 (en) * 1999-03-13 2000-09-14 Leybold Vakuum Gmbh Infrared gas analyzer and method for operating this analyzer
US20050012925A1 (en) * 2003-05-09 2005-01-20 Saptari Vidi A. Spectroscopic systems and methods
US20090168064A1 (en) * 2006-04-07 2009-07-02 Emerson Process Management Gmbh & Co Ohg Method and apparatus for measuring the optical absorption of samples
DE102012216210A1 (en) * 2012-09-12 2014-01-30 Siemens Aktiengesellschaft Non-dispersive infrared gas analyzer for analyzing zero gas, has control unit for controlling motor, such that duration and phase position of radiation through cuvettes are set by rotation angle-dependent control of angular velocity

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3731092A (en) * 1971-11-11 1973-05-01 Mine Safety Appliances Co Non-dispersive infrared gas analyzer having sample and reference beams using flow sensitive detector and with unbalanced operation
CN2218928Y (en) * 1994-08-30 1996-01-31 电力工业部南京电力环境保护科学研究所 On-line monitoring instrument for gas turbid and dust concentration
US7239594B2 (en) * 2003-02-07 2007-07-03 Imation Corp. Self-referenced holography using element formed on a holographic medium
CN100504357C (en) * 2004-07-07 2009-06-24 深圳迈瑞生物医疗电子股份有限公司 Method and apparatus for measuring gas concentration based on machinery modulation
CN101526400B (en) * 2008-03-06 2010-11-03 中国科学院西安光学精密机械研究所 Hadamard transform interference spectrum imaging method and device
US20130001412A1 (en) * 2011-07-01 2013-01-03 Mitutoyo Corporation Optical encoder including passive readhead with remote contactless excitation and signal sensing
US9030663B2 (en) * 2011-10-31 2015-05-12 Exelis Inc. Remote absorption spectroscopy by coded transmission
CN103499545B (en) * 2013-10-14 2015-09-09 北京信息科技大学 Adopt the semiconductor laser gas detecting system of gas reference chamber feedback compensation
CN104639281A (en) * 2013-11-12 2015-05-20 华为技术有限公司 Method, device and system for data transmission control
JP2015230989A (en) * 2014-06-05 2015-12-21 株式会社リコー Imaging module and imaging device
CN104764693B (en) * 2015-04-09 2018-01-05 重庆工商大学 Portable infrared gas analyzer and calibration method with automatic range calibration
US10481092B2 (en) * 2015-07-21 2019-11-19 Queen's University At Kingston Multiplexed excitation emission matrix spectroscopy
CN106352904A (en) * 2016-09-19 2017-01-25 上海未来伙伴机器人有限公司 Photoelectric encoder coded disc, photoelectric detection device, photoelectric encoder and robot
CN106596434B (en) * 2016-12-26 2020-01-03 高安水务有限公司 Water quality detection system
CN106691394B (en) * 2017-02-17 2023-04-18 浙江大学 High-resolution long-focal-depth OCT imaging system and method based on optical path coding
CN107389585B (en) * 2017-08-21 2019-11-15 湖北锐意自控系统有限公司 A kind of gas analyzer and analysis method for gases

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19911260A1 (en) * 1999-03-13 2000-09-14 Leybold Vakuum Gmbh Infrared gas analyzer and method for operating this analyzer
US20050012925A1 (en) * 2003-05-09 2005-01-20 Saptari Vidi A. Spectroscopic systems and methods
US20090168064A1 (en) * 2006-04-07 2009-07-02 Emerson Process Management Gmbh & Co Ohg Method and apparatus for measuring the optical absorption of samples
DE102012216210A1 (en) * 2012-09-12 2014-01-30 Siemens Aktiengesellschaft Non-dispersive infrared gas analyzer for analyzing zero gas, has control unit for controlling motor, such that duration and phase position of radiation through cuvettes are set by rotation angle-dependent control of angular velocity

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2021035432A1 *

Also Published As

Publication number Publication date
CN113767274A (en) 2021-12-07
WO2021035432A1 (en) 2021-03-04
EP3994447A1 (en) 2022-05-11

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