EP3281040A4 - Semiconductor x-ray detector - Google Patents
Semiconductor x-ray detector Download PDFInfo
- Publication number
- EP3281040A4 EP3281040A4 EP15888099.7A EP15888099A EP3281040A4 EP 3281040 A4 EP3281040 A4 EP 3281040A4 EP 15888099 A EP15888099 A EP 15888099A EP 3281040 A4 EP3281040 A4 EP 3281040A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- semiconductor
- ray detector
- ray
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Medical Informatics (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Animal Behavior & Ethology (AREA)
- Theoretical Computer Science (AREA)
- Optics & Photonics (AREA)
- Pathology (AREA)
- Radiology & Medical Imaging (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Surgery (AREA)
- Biophysics (AREA)
- General Health & Medical Sciences (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Pulmonology (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2015/075941 WO2016161542A1 (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP3281040A1 EP3281040A1 (en) | 2018-02-14 |
| EP3281040A4 true EP3281040A4 (en) | 2018-07-11 |
| EP3281040B1 EP3281040B1 (en) | 2021-11-24 |
Family
ID=57071683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP15888099.7A Active EP3281040B1 (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US10007009B2 (en) |
| EP (1) | EP3281040B1 (en) |
| JP (1) | JP6554554B2 (en) |
| KR (1) | KR101941898B1 (en) |
| CN (1) | CN107533146B (en) |
| IL (1) | IL254538B (en) |
| SG (1) | SG11201707508PA (en) |
| TW (1) | TWI632391B (en) |
| WO (1) | WO2016161542A1 (en) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10007009B2 (en) * | 2015-04-07 | 2018-06-26 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor X-ray detector |
| WO2016197338A1 (en) * | 2015-06-10 | 2016-12-15 | Shenzhen Xpectvision Technology Co.,Ltd. | A detector for x-ray fluorescence |
| US10705031B2 (en) * | 2015-08-27 | 2020-07-07 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray imaging with a detector capable of resolving photon energy |
| WO2018006258A1 (en) * | 2016-07-05 | 2018-01-11 | Shenzhen Xpectvision Technology Co., Ltd. | Bonding materials of dissimilar coefficients of thermal expansion |
| CN109661595B (en) * | 2016-09-23 | 2023-05-30 | 深圳帧观德芯科技有限公司 | Packaging of semiconductor X-ray detector |
| WO2018076220A1 (en) * | 2016-10-27 | 2018-05-03 | Shenzhen Xpectvision Technology Co., Ltd. | Dark noise compensation in a radiation detector |
| CN110178051B (en) | 2016-11-15 | 2023-06-13 | 深圳帧观德芯科技有限公司 | Imaging system configured to statistically determine charge sharing |
| EP3547919A4 (en) | 2016-12-05 | 2020-07-08 | Shenzhen Xpectvision Technology Co., Ltd. | Anx-ray imaging system and a method of x-ray imaging |
| WO2018112721A1 (en) | 2016-12-20 | 2018-06-28 | Shenzhen Xpectvision Technology Co.,Ltd. | Image sensors having x-ray detectors |
| EP3571529B1 (en) * | 2017-01-23 | 2023-03-15 | Shenzhen Xpectvision Technology Co., Ltd. | Methods of making semiconductor x-ray detector |
| EP3571531A4 (en) | 2017-01-23 | 2020-08-05 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detectors capable of identifying and managing charge sharing |
| EP3571527A4 (en) * | 2017-01-23 | 2020-09-09 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector |
| US10162066B2 (en) * | 2017-02-06 | 2018-12-25 | General Electric Company | Coincidence-enabling photon-counting detector |
| EP3607355B1 (en) * | 2017-04-01 | 2023-11-22 | Shenzhen Xpectvision Technology Co., Ltd. | A portable radiation detector system |
| EP3619555B1 (en) * | 2017-05-03 | 2023-11-29 | Shenzhen Xpectvision Technology Co., Ltd. | Method of making radiation detector |
| CN110892292B (en) * | 2017-07-26 | 2023-09-22 | 深圳帧观德芯科技有限公司 | Radiation detector and method for outputting data from the radiation detector |
| EP3658030A4 (en) * | 2017-07-26 | 2021-06-30 | Shenzhen Xpectvision Technology Co., Ltd. | An integrated x-ray source |
| WO2019019054A1 (en) * | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detector with built-in depolarization device |
| EP3658032A4 (en) | 2017-07-26 | 2021-03-03 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray imaging system and method of x-ray image tracking |
| EP3658033A4 (en) * | 2017-07-26 | 2021-02-24 | Shenzhen Xpectvision Technology Co., Ltd. | System with a spatially expansive x-ray source for x-ray imaging |
| EP3658963A4 (en) * | 2017-07-26 | 2021-03-03 | Shenzhen Xpectvision Technology Co., Ltd. | An x-ray detector |
| EP3701291B1 (en) * | 2017-10-26 | 2023-05-10 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detector with cooling system |
| EP3701287A4 (en) | 2017-10-26 | 2021-04-21 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector capable of noise handling |
| CN111247454B (en) | 2017-10-30 | 2023-11-10 | 深圳帧观德芯科技有限公司 | Radiation detector with MEMS switch based DC-DC converter |
| WO2019084702A1 (en) | 2017-10-30 | 2019-05-09 | Shenzhen Genorivision Technology Co. Ltd. | A lidar detector with high time resolution |
| WO2019144324A1 (en) * | 2018-01-24 | 2019-08-01 | Shenzhen Xpectvision Technology Co., Ltd. | Packaging of radiation detectors in an image sensor |
| EP3743743B1 (en) * | 2018-01-24 | 2024-03-20 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detector |
| CN111587385B (en) * | 2018-01-24 | 2024-06-18 | 深圳帧观德芯科技有限公司 | Stripe pixel detector |
| EP3743744A4 (en) * | 2018-01-25 | 2021-07-28 | Shenzhen Xpectvision Technology Co., Ltd. | Packaging of radiation detectors |
| CN111656224B (en) * | 2018-01-25 | 2024-06-18 | 深圳帧观德芯科技有限公司 | Radiation detector with quantum dot scintillator |
| EP3746813A4 (en) * | 2018-02-03 | 2021-08-11 | Shenzhen Xpectvision Technology Co., Ltd. | Methods of recovering radiation detector |
| CN111587084B (en) * | 2018-02-03 | 2024-03-15 | 深圳帧观德芯科技有限公司 | Endoscope with a lens |
| EP3793444B1 (en) | 2018-05-14 | 2023-10-11 | Shenzhen Xpectvision Technology Co., Ltd. | An apparatus for imaging the prostate |
| CN112449685B (en) * | 2018-07-12 | 2023-08-01 | 深圳帧观德芯科技有限公司 | Radiation detector |
| EP3821274A4 (en) * | 2018-07-12 | 2022-02-23 | Shenzhen Xpectvision Technology Co., Ltd. | A lidar with high time resolution |
| CN112470038B (en) | 2018-07-12 | 2024-07-12 | 深圳帧观德芯科技有限公司 | Radiation detector |
| WO2020019285A1 (en) | 2018-07-27 | 2020-01-30 | Shenzhen Xpectvision Technology Co., Ltd. | Multi-source cone beam computed tomography |
| EP3847485A4 (en) * | 2018-09-07 | 2022-04-06 | Shenzhen Xpectvision Technology Co., Ltd. | An image sensor having radiation detectors of different orientations |
| WO2020056712A1 (en) * | 2018-09-21 | 2020-03-26 | Shenzhen Xpectvision Technology Co., Ltd. | An imaging system |
| WO2020093240A1 (en) * | 2018-11-06 | 2020-05-14 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector |
| WO2020093231A1 (en) * | 2018-11-06 | 2020-05-14 | Shenzhen Xpectvision Technology Co., Ltd. | Image sensors having radiation detectors and masks |
| JP7292868B2 (en) * | 2018-12-18 | 2023-06-19 | キヤノン株式会社 | Detector |
| EP3908831A4 (en) * | 2019-01-10 | 2022-11-23 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detectors based on an epitaxial layer and methods of making |
| EP3690490A1 (en) * | 2019-02-04 | 2020-08-05 | ams International AG | X-ray detector component, x-ray detection module, imaging device and method for manufacturing an x-ray detector component |
| US10955568B2 (en) | 2019-02-08 | 2021-03-23 | International Business Machines Corporation | X-ray sensitive device to detect an inspection |
| EP3948357A4 (en) * | 2019-03-29 | 2022-11-02 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor x-ray detector |
| CN114096888A (en) * | 2019-07-26 | 2022-02-25 | 深圳帧观德芯科技有限公司 | Radiation detector with quantum dot scintillator |
| CN114072703A (en) * | 2019-07-29 | 2022-02-18 | 深圳帧观德芯科技有限公司 | Amplifier for dark noise compensation |
| CN114902081A (en) * | 2020-02-26 | 2022-08-12 | 深圳帧观德芯科技有限公司 | Radiation detector |
| EP4111237A4 (en) * | 2020-02-26 | 2023-11-01 | Shenzhen Xpectvision Technology Co., Ltd. | Semiconductor radiation detector |
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| WO2024168452A1 (en) * | 2023-02-13 | 2024-08-22 | Shenzhen Xpectvision Technology Co., Ltd. | Imaging systems and corresponding operation methods for elimination of effects of dark currents |
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-
2015
- 2015-04-07 US US15/122,456 patent/US10007009B2/en active Active
- 2015-04-07 KR KR1020177026648A patent/KR101941898B1/en active IP Right Grant
- 2015-04-07 EP EP15888099.7A patent/EP3281040B1/en active Active
- 2015-04-07 SG SG11201707508PA patent/SG11201707508PA/en unknown
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008050283A2 (en) * | 2006-10-25 | 2008-05-02 | Koninklijke Philips Electronics N.V. | Apparatus, imaging device and method for detecting x-ray radiation |
| US20110121191A1 (en) * | 2009-11-26 | 2011-05-26 | Steffen Kappler | Circuit arrangement for counting x-ray radiation x-ray quanta by way of quanta-counting detectors, and also an application-specific integrated circuit and an emitter-detector system |
| US20120223241A1 (en) * | 2011-03-04 | 2012-09-06 | Samsung Electronics Co., Ltd. | Large-Scale X-Ray Detectors |
Non-Patent Citations (1)
| Title |
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| See also references of WO2016161542A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US11009614B2 (en) | 2021-05-18 |
| CN107533146B (en) | 2019-06-18 |
| KR101941898B1 (en) | 2019-01-24 |
| IL254538B (en) | 2021-08-31 |
| US20180017686A1 (en) | 2018-01-18 |
| JP2018512596A (en) | 2018-05-17 |
| JP6554554B2 (en) | 2019-07-31 |
| TW201643468A (en) | 2016-12-16 |
| WO2016161542A1 (en) | 2016-10-13 |
| EP3281040A1 (en) | 2018-02-14 |
| US20200072986A1 (en) | 2020-03-05 |
| US10502843B2 (en) | 2019-12-10 |
| IL254538A0 (en) | 2017-11-30 |
| KR20170141196A (en) | 2017-12-22 |
| US10007009B2 (en) | 2018-06-26 |
| EP3281040B1 (en) | 2021-11-24 |
| TWI632391B (en) | 2018-08-11 |
| US20180156927A1 (en) | 2018-06-07 |
| SG11201707508PA (en) | 2017-10-30 |
| CN107533146A (en) | 2018-01-02 |
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